Intel Computer Drive SSDSC1NB080G401 User Manual

®
Intel Solid-State Drive DC S3500 Series  
Product Specification  
Capacity:  
2.5-inch: 80/120/160/240/300/480/600/800 GB  
Power Management  
2.5 inch: 5 V or 12 V SATA Supply Rail7  
1.8 inch: 3.3 V SATA Supply Rail  
SATA Interface Power Management  
OS-aware hot plug/removal  
1.8-inch: 80/240/400/800 GB  
Components:  
Intel® 20nm NAND Flash Memory  
Multi-Level Cell (MLC)  
Enhanced power-loss data protection  
Form Factor: 2.5–inch and 1.8-inch  
Power  
Read and Write IOPS1,2 (Full LBA Range,  
Iometer* Queue Depth 32)  
Active: Up to 5.0 W (TYP)  
Idle: 650 mW8  
Random 4 KB3 Reads: Up to 75,000 IOPS  
Random 4 KB Writes: Up to 11,500 IOPS  
Random 8 KB3 Reads: Up to 47,500 IOPS  
Random 8 KB Writes: Up to 5,500 IOPS  
Bandwidth Performance1  
Weight:  
2.5-inch 80-240 GB: 70 grams ± 2 grams  
2.5-inch 300-800 GB: 72 grams ± 2 grams  
1.8-inch 80 GB: 35 grams ± 2 grams  
1.8-inch 240-800 GB: 37 grams ± 2 grams  
Sustained Sequential Read: Up to 500 MB/s4  
Sustained Sequential Write: Up to 450 MB/s  
Latency (average sequential)  
Read: 50 µs (TYP)  
Temperature  
Operating: 0° C to 70° C  
Non-Operating9: -55° C to 95° C  
Temperature monitoring and logging  
Thermal throttling  
Write: 65 µs (TYP)  
Quality of Service5, 6  
Shock (operating and non-operating):  
1,000 G/0.5 msec  
Read/Write: 500 µs / 5 ms (99.9%)  
Vibration  
AES 256-bit Encryption  
Operating: 2.17 GRMS (5-700 Hz)  
Compliance  
: 3.13 GRMS (5-800 Hz)  
Non-Operating  
SATA Revision 3.0; compatible with SATA 6Gb/s,  
3Gb/s and 1.5Gb/s interface rates  
ATA8-ACS2; includes SCT (Smart Command  
Transport) and device statistics log support  
Enhanced SMART ATA feature set  
Native Command Queuing (NCQ) command set  
Data set management Trim command  
Compatibility  
Altitude (simulated)  
Operating: -1,000 to 10,000ft  
: -1,000 to 40,000ft  
Non-Operating  
Reliability  
Uncorrectable Bit Error Rate (UBER):  
1 sector per 1017 bits read  
Mean Time Between Failures (MTBF):  
Windows 7 and Windows 8  
Windows Server 2012  
Windows Server 2008 Enterprise 32/64bit SP2  
Windows Server 2008 R2 SP1  
2,000,000 hours  
End-to-End data protection  
Endurance Rating10:  
80 GB: 45 TBW  
160 GB: 100 TBW  
– 120 GB: 70 TBW  
– 240 GB: 140 TBW  
Windows Server 2003 Enterprise R2 64bit SP2  
Red Hat Enterprise Linux* 5.5, 5.6, 6.1, 6.3  
SUSE* Linux Enterprise Server 10, 11 SP1  
CentOS 64bit 5.7, 6.3  
300 GB: 170 TBW – 400 GB: 225 TBW  
480 GB: 275 TBW – 600 GB: 330 TBW  
800 GB: 450 TBW  
Certifications and Declarations  
UL*, CE*, C-Tick*, BSMI*, KCC*, Microsoft* WHCK,  
VCCI*, SATA-IO  
Intel® SSD Toolbox with Intel® SSD Optimizer  
Product Ecological Compliance  
RoHS*  
1.  
2.  
3.  
4.  
5.  
Performance values vary by capacity and form factor  
Performance specifications apply to both compressible and incompressible data  
4 KB = 4,096 bytes; 8 KB = 8,192 bytes  
MB/s = 1,000,000 bytes/second.  
Based on Random 4KB QD=1 workload, measured as the time taken for 99.9 percentile of commands to finish the round-trip from host to drive  
and back to host  
6.  
Measurement taken once the workload has reached steady state but including all background activities required for normal operation and data  
reliability  
7.  
8.  
Defaults to 12V, if both 12V and 5V are present  
Based on 5V supply  
9.  
10.  
Please contact your Intel representative for details on the non-operating temperature range  
Based on JESD218 standard  
December 2013  
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Intel® Solid-State Drive DC S3500  
Contents  
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Intel® Solid-State Drive DC S3500  
Revision History  
Date  
Revision Description  
April 2013  
001  
002  
Initial release.  
1.  
2.  
3.  
Random write IOPS consistency changes from 75% to 80%  
June 2013  
Added read power in table 8, 9 and 11  
Added X,Y, Z dimension in section 3.0  
1.  
2.  
3.  
Updated Section 5.4.1 Timed Workload Endurance Indicators with user notes  
December 2013  
003  
Updated Table 6 notes  
Updated Table 23  
Terms and Acronyms  
Term  
Definition  
ATA  
Advanced Technology Attachment  
CRC  
DAS  
DMA  
ECC  
Cyclic Redundancy Check  
Device Activity Signal  
Direct Memory Access  
Error Correction Code  
Extended  
EXT  
FPDMA  
First Party Direct Memory Access  
Gigabyte  
Note: The total usable capacity of the SSD may be less than the total physical capacity because a small  
portion of the capacity is used for NAND flash management and maintenance purposes.  
GB  
Gb  
Gigabit  
HDD  
HET  
KB  
Hard Disk Drive  
High Endurance Technology  
Kilobyte  
I/O  
Input/Output  
IOPS  
ISO  
LBA  
MB  
Input/Output Operations Per Second  
International Standards Organization  
Logical Block Address  
Megabyte (1,000,000 bytes)  
Multi-level Cell  
MLC  
MTBF  
NCQ  
NOP  
PB  
Mean Time Between Failures  
Native Command Queuing  
No Operation  
Petabyte  
PCB  
PIO  
Printed Circuit Board  
Programmed Input/Output  
Reliability Demonstration Test  
Root Mean Square  
RDT  
RMS  
SATA  
SCT  
Serial Advanced Technology Attachment  
SMART Command Transport  
Product Specification  
4
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Intel® Solid-State Drive DC S3500  
Term  
Definition  
Self-Monitoring, Analysis and Reporting Technology  
An open standard for developing hard drives and software systems that automatically monitors the  
health of a drive and reports potential problems.  
SMART  
SSD  
TB  
Solid-State Drive  
Terabyte  
TYP  
UBER  
Typical  
Uncorrectable Bit Error Rate  
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Intel® Solid-State Drive DC S3500  
1.0  
Overview  
This document describes the specifications and capabilities of the Intel® SSD DC S3500.  
The Intel® SSD DC S3500 delivers leading performance and Quality of Service combined  
with world-class reliability for Serial Advanced Technology Attachment (SATA)-based  
computers in nine capacities: 80 GB, 120 GB, 160 GB, 240 GB, 300 GB, 400 GB, 480 GB,  
600 GB and 800 GB.  
By combining 20nm Intel® NAND Flash Memory technology with SATA 6Gb/s interface  
support, the Intel® SSD DC S3500 delivers sequential read speeds of up to 500 MB/s and  
sequential write speeds of up to 450 MB/s. Intel SSD DC S3500 delivers Quality of  
Service of 500 us for random 4KB reads measured at a queue depth of 1.  
The industry-standard 2.5-inch and 1.8-inch form factors enable interchangeability with  
existing hard disk drives (HDDs) and native SATA HDD drop-in replacement with the  
enhanced performance, reliability, ruggedness, and power savings offered by an SSD.  
Intel SSD DC S3500 offers these key features:  
Standard Endurance Technology  
High I/O and throughput performance  
Consistent I/O latency  
Enhanced power-loss data protection  
End-to-End data protection  
Thermal throttling  
Temperature Sensor  
Inrush current management  
Low power  
High reliability  
Enhanced ruggedness  
Temperature monitor and logging  
Power loss protection capacitor self-test  
Product Specification  
6
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Intel® Solid-State Drive DC S3500  
2.0  
Product Specifications  
2.1  
Capacity  
Table 1.  
User Addressable Sectors  
Unformatted Capacity  
Intel SSD DC S3500  
(Total User Addressable Sectors in LBA Mode)  
80 GB  
120 GB  
160 GB  
240 GB  
300 GB  
400 GB  
480 GB  
600 GB  
800 GB  
156,301,488  
234,441,648  
312,581,808  
468,862,128  
586,072,368  
781,422,768  
937,703,088  
1,172,123,568  
1,562,824,368  
Notes: 1 GB = 1,000,000,000 bytes; 1 sector = 512 bytes.  
LBA count shown represents total user storage capacity and will remain the same throughout the life of the drive.  
The total usable capacity of the SSD may be less than the total physical capacity because a small portion of the capacity is  
used for NAND flash management and maintenance purposes.  
2.2  
Performance  
Table 2.  
Random Read/Write Input/Output Operations Per Second (IOPS)  
Intel SSD DC S3500  
Specification1  
Unit  
80 GB  
(2.5/  
1.8”)  
240 GB  
(2.5”/  
1.8”)  
800 GB  
(2.5”/  
1.8”)  
400 GB  
(1.8”)  
480  
/600 GB  
120 GB  
160 GB  
300 GB  
Random 4 KB Read (up to)2  
Random 4 KB Write (up to)  
Random 8 KB Read (up to)3  
Random 8 KB Write (up to)  
IOPS  
IOPS  
IOPS  
IOPS  
70,000  
7,000  
75,000  
4,600  
75,000  
7,500  
75,000  
7,500  
75,000  
9,000  
75,000  
11,000  
47,500  
5,500  
75,000  
11,000  
47,500  
5,500  
75,000  
11,500  
47,500  
5,500  
39,000  
47,000  
47,500  
47,500  
47,500  
3,700  
2,300  
3,800  
3,800  
4,400  
Notes:  
1. Performance measured using Iometer* with Queue Depth 32. Measurements are performed on a full Logical Block  
Address (LBA) span of the drive.  
2. 4 KB = 4,096 bytes  
3. 8 KB = 8,192 bytes  
4. Performance consistency measured using Iometer* based on Random 4KB QD=32 workload, measured as the  
the 99.9th percentile slowest 1-second interval)/(average IOPS during the test). Measurements are performed on a full  
Logical Block Address (LBA) span of the drive once the workload has reached steady state but including all background  
activities required for normal operation and data reliability  
(IOPS in  
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Intel® Solid-State Drive DC S3500  
Table 3.  
Random Read/Write IOPS Consistency  
Intel SSD DC S3500  
Specification4  
Unit  
80GB  
(2.5/  
1.8”)  
240GB  
(2.5”/  
1.8”)  
800GB  
(2.5”/  
1.8”)  
400GB  
(1.8”)  
480 /  
600 GB  
120GB  
160GB  
300GB  
Random 4 KB Read (up to)2  
Random 4 KB Write (up to)  
Random 8 KB Read (up to)3  
Random 8 KB Write (up to)  
%
%
%
%
90  
80  
90  
80  
90  
80  
90  
80  
90  
80  
90  
80  
90  
80  
90  
80  
90  
80  
90  
80  
90  
80  
90  
80  
90  
80  
90  
80  
90  
80  
90  
80  
Notes:  
1. Performance measured using Iometer* with Queue Depth 32. Measurements are performed on a full Logical Block  
Address (LBA) span of the drive.  
2. 4 KB = 4,096 bytes  
3. 8 KB = 8,192 bytes  
4. Performance consistency measured using Iometer* based on Random 4KB QD=32 workload, measured as the  
in the 99.9th percentile slowest 1-second interval)/(average IOPS during the test). Measurements are performed on a  
full Logical Block Address (LBA) span of the drive once the workload has reached steady state, including all background  
activities required for normal operation and data reliability  
(IOPS  
Table 4.  
Sequential Read and Write Bandwidth  
Intel SSD DC S3500  
Specification  
Unit  
80GB  
(2.5/  
1.8”)  
240GB  
(2.5”/  
1.8”)  
480  
/600  
GB  
800GB  
(2.5”/  
1.8”)  
400GB  
(1.8”)  
120GB  
160GB  
300GB  
Sequential Read (SATA  
6Gb/s)1  
MB/s  
MB/s  
340  
100  
445  
135  
475  
175  
500  
260  
500  
315  
500  
380  
500  
410  
500  
450  
Sequential Write (SATA  
6Gb/s)1  
Notes: 1. Performance measured using Iometer* with 128 KB (131,072 bytes) of transfer size with Queue Depth 32.  
Table 5.  
Latency  
Intel SSD DC S3500  
Specification  
80GB (2.5/1.8”), 120GB, 160GB, 240GB (2.5”/1.8”),  
300GB, 400GB (1.8”), 480GB, 600 GB  
800GB (2.5”/1.8”)  
Latency1 (TYP)  
Read  
50 µs  
65 µs  
2.0 s  
50 µs  
65 µs  
3.0 s  
Write  
Power On to Ready2  
Product Specification  
8
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Intel® Solid-State Drive DC S3500  
Table 6.  
Quality of Service  
Intel SSD DC S3500  
Queue Depth=32  
Queue Depth=1  
Specification  
Unit  
80/120/160/ 300/400/480/  
80/120/160/  
300/400/480/  
600/800 GB  
240 GB  
600/800 GB  
240 GB  
Quality of Service3, 4 (99.9%)  
Reads  
ms  
ms  
0.5  
5
0.5  
2
2
2
Writes  
20  
10  
Quality of Service3,4 (99.9999%)  
Reads  
Writes  
ms  
ms  
10  
10  
5
10  
30  
5
10  
30  
Notes:  
1.  
2.  
3.  
Device measured using Iometer. Latency measured using 4 KB (4,096 bytes) transfer size with Queue Depth equal to 1 on a  
sequential workload.  
Power On To Ready time assumes proper shutdown. Time varies if shutdown is not preceded by STANDBY IMMEDIATE command.  
For 95% of the time, the maximum time for power on to ready will be less than 10 seconds.  
Device measured using Iometer. Quality of Service measured using 4 KB (4,096 bytes) transfer size on a random workload on a  
full Logical Block Address (LBA) span of the drive once the workload has reached steady state but including all background  
activities required for normal operation and data reliability.  
4.  
Based on Random 4KB QD=1, 32 workloads, measured as the time taken for 99.9(or 99.9999) percentile of commands to finish  
the round-trip from host to drive and back to host.  
2.3  
Electrical Characteristics  
Table 7.  
Operating Voltage for 2.5-inch Form Factor  
Intel SSDDC S3500  
Electrical Characteristics  
80 GB, 120 GB, 160 GB, 240 GB, 300 GB, 480 GB, 600 GB, 800 GB  
5 V Operating Characteristics:  
Operating Voltage range  
Rise time (Max/Min)  
Fall time (Min)2  
5 V (±5%)  
1 s / 1 ms  
1 ms  
Noise level  
500 mV pp 10 Hz – 100 KHz  
50 mV pp 100 KHz – 20 MHz  
500 ms  
Min Off time3  
Inrush Current (Typical Peak) 1  
1.0 A, < 1 s  
12 V Operating Characteristics:  
Operating Voltage range  
Rise time (Max/Min)  
Fall time (Min)2  
12 V (±10%)  
1 s / 1 ms  
1 ms  
Noise level  
1000 mV pp 10 Hz – 100 KHz  
100 mV pp 100 KHz – 20 MHz  
500 ms  
Min Off time3  
Inrush Current (Typical Peak) 1  
1.0 A, < 1 s  
Notes:  
1.  
2
3.  
Measured from initial device power supply application.  
Fall time needs to be equal or better than minimum in order to guarantee full functionality of enhanced power loss management.  
The drive needs to be powered off for at least 500msec before powering on.  
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Intel® Solid-State Drive DC S3500  
Table 8.  
Power Consumption for 2.5-inch Form Factor (5V Supply)  
Intel SSD DC S3500  
Specification  
Unit  
80 GB 120 GB 160 GB 240 GB 300 GB 480 GB 600 GB 800 GB  
1
Active Write - RMS Average  
W
W
W
W
W
1.8  
2.0  
2.0  
2.4  
2.3  
2.7  
2.9  
3.2  
3.5  
3.9  
4.3  
5.2  
4.5  
5.5  
5.0  
7.3  
2
Active Write - RMS Burst  
3
1.5  
1.8  
0.6  
1.5  
2.2  
0.6  
1.6  
2.5  
0.6  
1.6  
2.8  
0.6  
1.6  
3.0  
0.6  
1.6  
3.3  
0.6  
1.6  
3.4  
0.6  
1.6  
3.5  
0.6  
Active Read - RMS Average  
4
Active Read - RMS Burst  
Idle  
Notes:  
1.  
2.  
3.  
4.  
The workload equates 128 KB (131,072 bytes) Queue Depth equal to 32 sequential writes. Root Mean Squared (RMS) average  
power is measured using scope trigger over a 100 ms sample period.  
The workload equates 128 KB (131,072 bytes) Queue Depth equal to 32 sequential writes. Root Mean Squared (RMS) burst power  
is measured using scope trigger over a 500 us sample period.  
The workload equates 128 KB (131,072 bytes) Queue Depth equal to 32 sequential reads. Root Mean Squared (RMS) average  
power is measured using scope trigger over a 100 ms sample period.  
The workload equates 128 KB (131,072 bytes) Queue Depth equal to 32 sequential reads. Root Mean Squared (RMS) burst power  
is measured using scope trigger over a 500 us sample period.  
Table 9.  
Power Consumption for 2.5-inch Form Factor (12V Supply)  
Intel SSD DC S3500  
Specification1  
Unit  
80 GB 120 GB 160 GB 240 GB 300 GB 480 GB 600 GB 800 GB  
Active Write - RMS Average1  
Active Write - RMS Burst2  
Active Read - RMS Average3  
Active Read - RMS Burst4  
Idle  
W
W
W
W
W
2.0  
2.2  
1.6  
2.1  
0.8  
2.3  
2.5  
1.6  
2.3  
0.8  
2.5  
2.8  
1.7  
2.6  
0.9  
3.1  
3.4  
1.7  
3.2  
0.9  
3.5  
4.2  
1.7  
3.6  
0.9  
4.3  
5.5  
1.7  
3.6  
0.9  
4.5  
6.8  
1.7  
3.6  
0.9  
5.0  
7.8  
1.8  
6.4  
0.9  
Notes:  
1.  
2.  
3.  
4.  
The workload equates 128 KB (131,072 bytes) Queue Depth equal to 32 sequential writes. Root Mean Squared (RMS) average  
power is measured using scope trigger over a 100 ms sample period.  
The workload equates 128 KB (131,072 bytes) Queue Depth equal to 32 sequential writes. Root Mean Squared (RMS) burst power  
is measured using scope trigger over a 500 us sample period.  
The workload equates 128 KB (131,072 bytes) Queue Depth equal to 32 sequential reads. Root Mean Squared (RMS) average  
power is measured using scope trigger over a 100 ms sample period.  
The workload equates 128 KB (131,072 bytes) Queue Depth equal to 32 sequential reads. Root Mean Squared (RMS) burst power  
is measured using scope trigger over a 500 us sample period.  
Product Specification  
10  
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Intel® Solid-State Drive DC S3500  
Table 10.  
Operating Voltage and Power Consumption for 1.8-inch Form Factor  
Intel SSD DC S3500  
240 GB 400 GB  
Electrical Characteristics  
80 GB  
800 GB  
Operating Voltage for 3.3 V (±5%)  
Min  
3.13 V  
3.47 V  
Max  
Rise time (Max/Min)  
Fall time (Min)2  
Noise level  
1 s / 1 ms  
1 ms  
300 mV pp 10 Hz – 100 KHz  
500 mV pp 100 KHz – 20 MHz  
500 ms  
Min Off time3  
Inrush Current (Typical Peak) 1  
1.2 A, < 1 s  
Notes:  
1.  
2.  
3.  
Measured from initial device power supply application.  
Fall time needs to be equal or better than minimum in order to guarantee full functionality of enhanced power loss management.  
The drive needs to be powered off for at least 500msec before powering on.  
Table 11.  
Power Consumption for 1.8-inch Form Factor  
Intel SSD DC S3500  
Specification1  
Unit  
80 GB  
240 GB  
3.5  
400 GB  
4.5  
800 GB  
5.2  
Active Write - RMS Average @ 3.3V  
Active Write - RMS Burst @ 3.3V  
Active Read - RMS Average @ 3.3V  
Active Read - RMS Burst @ 3.3V  
W
W
W
W
W
2.0  
2.2  
1.3  
1.8  
0.6  
3.8  
5.0  
7.5  
1.4  
1.4  
1.4  
2.6  
3.0  
3.0  
Idle @ 3.3V  
0.6  
0.6  
0.6  
Notes:  
1.  
The workload equates 128 KB (131,072 bytes) Queue Depth equal to 32 sequential writes. Root Mean Squared (RMS) power  
is measured using scope trigger over a 100 ms sample period.  
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Intel® Solid-State Drive DC S3500  
2.4  
Environmental Conditions  
Table 12.  
Temperature, Shock, Vibration  
Temperature  
Range  
Case Temperature  
Operating  
0 – 70 oC  
-55 – 95 oC  
Non-operating1  
Temperature Gradient2  
Operating  
30 oC/hr (Typical)  
30 oC/hr (Typical)  
Non-operating  
Humidity  
Operating  
5 – 95 %  
5 – 95 %  
Non-operating  
Shock and Vibration  
Range  
Shock3  
Operating  
Non-operating  
1,000 G (Max) at 0.5 msec  
1,000 G (Max) at 0.5 msec  
Vibration4  
Operating  
2.17 GRMS (5-700 Hz) Max  
3.13 GRMS (5-800 Hz) Max  
Non-operating  
Notes:  
1.  
2.  
3.  
Please contact your Intel representative for details on the non-operating temperature range.  
Temperature gradient measured without condensation.  
Shock specifications assume the SSD is mounted securely with the input vibration applied to the drive-mounting screws. Stimulus  
may be applied in the X, Y or Z axis. Shock specification is measured using Root Mean Squared (RMS) value.  
Vibration specifications assume the SSD is mounted securely with the input vibration applied to the drive-mounting screws.  
Stimulus may be applied in the X, Y or Z axis. Vibration specification is measured using RMS value.  
4.  
2.5  
Product Regulatory Compliance  
Intel SSD DC S3500 meets or exceeds the regulatory or certification requirements  
Table 13.  
Product Regulatory Compliance Specifications  
Region For Which  
Conformity Declared  
Title  
Description  
TITLE 47-Telecommunications CHAPTER 1— FEDERAL  
COMMUNMICATIONS COMMISSION PART 15 — RADIO  
FREQUENCY DEVICES  
FCC Part 15B Class B  
USA  
CA/CSA-CEI/IEC CISPR 22:02. This is CISPR  
22:1997 with Canadian Modifications  
ICES-003, Issue 4 Interference-Causing Equipment  
Standard Digital Apparatus  
Canada  
IEC 55024 Information Technology Equipment —  
Immunity characteristics— Limits and methods of  
measurement CISPR24:2010  
EN-55024: 1998 and its amendments  
EN-55022: 2006 and its amendments  
European Union  
IEC 55022 Information Technology Equipment — Radio  
disturbance Characteristics— Limits and methods of  
measurement CISPR24:2008 (Modified)  
European Union  
USA/Canada  
Information Technology Equipment — Safety  
— Part 1: General Requirements  
EN-60950-1 2nd Edition  
Information Technology Equipment — Safety  
— Part 1: General Requirements  
UL/CSA EN-60950-1 2nd Edition  
USA/Canada  
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Intel® Solid-State Drive DC S3500  
2.6  
Reliability  
Intel SSD DC S3500 meets or exceeds SSD endurance and data retention requirements  
as specified in the JESD218 standard. Reliability specifications are listed in the table  
below:  
Table 14.  
Reliability Specifications  
Parameter  
Value  
Uncorrectable Bit Error Rate (UBER)  
Uncorrectable bit error rate will not exceed one sector in the  
specified number of bits read. In the unlikely event of a  
non-recoverable read error, the SSD will report it as a read failure to  
the host; the sector in error is considered corrupt and is not returned  
to the host.  
< 1 sector per 1017 bits read  
Mean Time Between Failures (MTBF)  
2,000,000 hours  
Mean Time Between Failures is estimated based on Telcordia*  
methodology and demonstrated through Reliability Demonstration  
Test (RDT).  
Power On/Off Cycles  
24 per day  
Power On/Off Cycles is defined as power being removed from the  
SSD, and then restored. Most host systems remove power from the  
SSD when entering suspend and hibernate as well as on a system  
shutdown.  
Insertion Cycles  
50 on SATA cable  
500 on backplane  
SATA/power cable insertion/removal cycles.  
Data Retention  
3 months power-off retention once SSD  
reaches rated write endurance at 40 °C  
The time period for retaining data in the NAND at maximum rated  
endurance.  
80 GB: 45 TBW  
Endurance Rating  
120 GB:70 TBW  
160 GB: 100 TBW  
240 GB: 140 TBW  
300 GB: 170 TBW  
400 GB: 225 TBW  
480 GB: 275 TBW  
600 GB: 330 TBW  
800 GB: 450 TBW  
Based on JESD219 workload.  
while running JESD218 standard1  
1.  
Refer to JESD218 standard table 1 for UBER, FFR and other Enterprise SSD requirements  
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Intel® Solid-State Drive DC S3500  
2.7  
Temperature Sensor  
The Intel SSD DC S3500 has an internal temperature sensor with an accuracy of +/-2C  
over a range of -20C to +80C which can be monitored using two SMART attributes:  
Airflow Temperature (BEh) and Device Internal Temperature (C2h).  
For more information on supported SMART attributes, see “SMART Attributes” on page  
18.  
2.8  
2.9  
Power Loss Capacitor Test  
The Intel SSD DC S3500 supports testing of the power loss capacitor, which can be  
monitored using the following SMART attribute: (175, AFh).  
Hot Plug Support  
Hot Plug insertion and removal is supported in the presence of a proper connector and  
appropriate operating system (OS), as described in the SATA 3.0 specification.  
This product supports asynchronous signal recovery and issues an unsolicited COMINIT  
when first mated with a powered connector to guarantee reliable detection by a host  
system without hardware device detection.  
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Intel® Solid-State Drive DC S3500  
3.0  
Mechanical Information  
Figures 1 and 2 show the physical package information for the Intel SSD DC S3500 in the  
2.5- and 1.8-inch form factors. All dimensions are in millimeters.  
Figure 1:  
Intel SSD DC S3500 2.5-inch Dimensions  
X – Length -- *  
100.45 Max  
Y - Width  
Z - Height  
69.85 +/- 0.25  
7.0 +0/-0.5  
* - does not include 0.3 connector protrusion  
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Intel® Solid-State Drive DC S3500  
Figure 2:  
Intel SSD DC S35001.8-inch Dimensions  
X - Length  
Y - Width  
Z - Height  
78.50 +/- 0.60  
54.0 +/- 0.25  
5.0 +/- 0.35  
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Intel® Solid-State Drive DC S3500  
4.0  
Pin and Signal Descriptions  
4.1  
2.5-inch Form Factor Pin Locations  
Figure 3:  
Layout of 2.5-inch Form Factor Signal and Power Segment Pins  
Note:  
2.5-inch connector supports built in latching capability.  
4.2  
1.8-inch Form Factor Pin Locations  
Figure 4:  
Layout of 1.8-inch Form Factor Signal and Power Segment Pins  
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Intel® Solid-State Drive DC S3500  
4.3  
Connector Pin Signal Definitions  
Table 15. Serial ATA Connector Pin Signal Definitions—2.5-inch and 1.8-inch Form  
Factors  
Pin  
Function  
Definition  
S1  
S2  
S3  
S4  
S5  
S6  
S7  
Ground  
A+  
1st mate  
Differential signal pair A  
1st mate  
A-  
Ground  
B-  
Differential signal pair B  
1st mate  
B+  
Ground  
Note:  
Key and spacing separate signal and power segments.  
4.4  
Power Pin Signal Definitions  
Table 16. Serial ATA Power Pin Definitions—2.5-inch Form Factors  
Pin1  
Function  
Definition  
Mating Order  
P12  
P22  
Not connected  
(3.3 V Power)  
(3.3 V Power)  
--  
Not connected  
Not connected  
Ground  
Ground  
Ground  
V5  
--  
P32  
(3.3 V Power; pre-charge)  
2nd Mate  
1st Mate  
1st Mate  
1st Mate  
1st Mate  
2nd Mate  
2nd Mate  
1st Mate  
2nd Mate  
1st Mate  
1st Mate  
2nd Mate  
2nd Mate  
P43,4  
P53  
Ground  
Ground  
P63  
Ground  
P73,5  
P83,5  
P93,5  
P103  
P116  
P123,4  
P137  
P147  
P157  
5 V Power  
V5  
5 V Power  
V5  
5 V Power  
Ground  
DAS/DSS  
Ground  
V12  
Ground  
Device Activity Signal/Disable Staggered Spin-up  
Ground  
12 V Power  
12 V Power  
12 V Power  
V12  
V12  
Notes:  
1. All pins are in a single row, with a 1.27 mm (0.050-inch) pitch.  
2. Pins P1, P2 and P3 are connected together, although they are not connected internally to the device. The host may put 3.3 V on  
these pins.  
3. The mating sequence is:  
ground pins P4-P6, P10, P12 and the 5V power pin P7  
signal pins and the rest of the 5V power pins P8-P9  
4. Ground connectors P4 and P12 may contact before the other 1st mate pins in both the power and signal connectors to  
discharge ESD in a suitably configured backplane connector.  
5. Power pins P7, P8, and P9 are internally connected to one another within the device.  
6. The host may ground P11 if it is not used for Device Activity Signal (DAS).  
7. Pins P13, P14 and P15 are internally connected to one another within the device. The host may put 12 V on these pins.  
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Intel® Solid-State Drive DC S3500  
Table 17. Serial ATA Power Pin Definitions—1.8-inch Form Factors  
Pin  
Function  
Definition  
Mating Order1  
P12  
P22  
P33  
P43  
P54  
P64  
P75  
Key  
P86  
P96  
V33  
3.3 V Power  
2nd Mate  
2nd Mate  
1st Mate  
1st Mate  
1st Mate  
2nd Mate  
2nd Mate  
NC  
V33  
3.3 V Power, per-charge  
Ground  
Ground  
V5  
--  
--  
5 V Power; not connected.  
5 V Power; not connected.  
Device Activity Signal/Disable Staggered Spin-up  
NC  
V5  
DAS/DSS  
Key  
Optional  
Optional  
Manufacturing Test Pin  
2nd Mate  
2nd Mate  
Manufacturing Test Pin  
Notes:  
1. All mate sequences assume zero angular offset between connectors.  
2. P1 and P2 are internally connected to one another within the device.  
3. Ground connectors P3 and P4 may contact before the other 1st mate pins in both the power and signal connectors to dis-  
charge ESD in a suitably configure backplane connector.  
4. Pins P5 and P6 are not connected internally to the device but there is an option to connect through a zero ohm stuffing  
resistor. The host may put 5V on these pins.  
5. The host may ground P7 if it is not used for Device Activity Signal (DAS).  
6. P8 and P9 should not be connected by the host.  
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Intel® Solid-State Drive DC S3500  
5.0  
Supported Command Sets  
Intel SSD DC S3500 supports all mandatory ATA (Advanced Technology Attachment)  
commands defined in the ATA8-ACS specification described in this section.  
5.1  
ATA General Feature Command Set  
The Intel SSD DC S3500 supports the ATA General Feature command set (non- PACKET),  
which consists of:  
EXECUTE DEVICE DIAGNOSTIC  
SET FEATURES  
IDENTIFY DEVICE  
Note: See Appendix A, “IDENTIFY DEVICE Command Data” on page 27 for details on  
the sector data returned after issuing an IDENTIFY DEVICE command.  
Intel SSD DC S3500 also supports the following optional commands:  
READ DMA  
WRITE DMA  
READ SECTOR(S)  
READ VERIFY SECTOR(S)  
READ MULTIPLE  
SEEK  
SET FEATURES  
WRITE SECTOR(S)  
SET MULTIPLE MODE1  
WRITE MULTIPLE  
FLUSH CACHE  
READ BUFFFER  
WRITE BUFFER  
NOP  
DOWNLOAD MICROCODE  
WRITE UNCORRECTABLE EXT  
1. The only multiple supported will be multiple 1  
5.2  
5.3  
Power Management Command Set  
Intel SSD DC S3500 supports the Power Management command set, which consists of:  
CHECK POWER MODE  
IDLE  
IDLE IMMEDIATE  
SLEEP  
STANDBY  
STANDBY IMMEDIATE  
Security Mode Feature Set  
Intel SSD DC S3500 supports the Security Mode command set, which consists of:  
SECURITY SET PASSWORD  
SECURITY UNLOCK  
SECURITY ERASE PREPARE  
SECURITY ERASE UNIT  
SECURITY FREEZE LOCK  
SECURITY DISABLE PASSWORD  
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Intel® Solid-State Drive DC S3500  
5.4  
SMART Command Set  
Intel SSD DC S3500 supports the SMART command set, which consists of:  
SMART READ DATA  
SMART READ ATTRIBUTE THRESHOLDS  
SMART ENABLE/DISABLE ATTRIBUTE AUTOSAVE  
SMART SAVE ATTRIBUTE VALUES  
SMART EXECUTE OFF-LINE IMMEDIATE  
SMART READ LOG SECTOR  
SMART WRITE LOG SECTOR  
SMART ENABLE OPERATIONS  
SMART DISABLE OPERATIONS  
SMART RETURN STATUS  
SMART ENABLE/DISABLE AUTOMATIC OFFLINE  
5.4.1  
SMART Attributes  
Table 18 lists the SMART attributes supported by the Intel SSD DC S3500 and the  
corresponding status flags and threshold settings.  
Table 18.  
SMART Attributes  
Status Flags  
ID  
Attribute  
Threshold  
SP  
EC  
ER  
PE  
OC  
PW  
Re-allocated Sector Count  
Raw value: shows the number of retired blocks since  
05h  
leaving the factory (grown defect count).  
1
1
0
0
1
0
0 (none)  
Normalized value: beginning at 100, shows the percent  
remaining of allowable grown defect count.  
Power-On Hours Count  
Raw value: reports power-on time, cumulative over the life  
of the SSD, integer number in hour time units.  
09h  
1
1
0
0
1
0
0 (none)  
Normalized value: always 100.  
Power Cycle Count  
Raw value: reports the cumulative number of power cycle  
events over the life of the device.  
0Ch  
AAh  
ABh  
1
1
1
1
1
1
0
0
0
0
0
0
1
1
1
0
1
0
0 (none)  
10  
Normalized value: always 100.  
Available Reserved Space (See Attribute E8)  
Program Fail Count  
Raw value: shows total count of program fails.  
Normalized value: beginning at 100, shows the percent  
0 (none)  
remaining of allowable program fails.  
Erase Fail Count  
Raw value: shows total count of erase fails.  
Normalized value: beginning at 100, shows the percent  
remaining of allowable erase fails.  
ACh  
AEh  
1
1
1
1
0
0
0
0
1
1
0
0
0 (none)  
0 (none)  
Unexpected Power Loss  
Also known as “Power-off Retract Count” per magnet-  
ic-drive terminology.  
Raw value: reports number of unclean shutdowns, cumu-  
lative over the life of the SSD.  
An “unclean shutdown” is the removal of power without  
STANDBY IMMEDIATE as the last command (regardless of  
PLI activity using capacitor power).  
Normalized value: always 100.  
Power Loss Protection Failure  
Last test result as microseconds to discharge cap, saturates  
at max value. Also logs minutes since last test and lifetime  
number of tests.  
AFh  
1
1
0
0
1
1
10  
Raw value:  
Bytes 0-1: Last test result as microseconds to discharge  
cap, saturates at max value. Test result expected in range  
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Table 18.  
SMART Attributes  
Status Flags  
Threshold  
ID  
Attribute  
SP  
EC  
ER  
PE  
OC  
PW  
25 <= result <= 5000000, lower indicates specific error  
code.  
Bytes 2-3: Minutes since last test, saturates at max  
value.  
Bytes 4-5: Lifetime number of tests, not incremented on  
power cycle, saturates at max value.  
Normalized value: set to 1 on test failure or 11 if the  
capacitor has been tested in an excessive temperature  
condition, otherwise 100.  
SATA Downshift Count  
Raw value: reports number of times SATA interface  
selected lower signaling rate due to error.  
B7h  
B8h  
1
1
1
1
0
0
0
0
1
1
0
0
0 (none)  
0 (none)  
Normalized value: always 100.  
End-to-End Error Detection Count  
Raw value: reports number of End-to-End detected and  
corrected errors by hardware.  
Normalized value: always 100.  
Uncorrectable Error Count  
Raw value: shows the number of errors that could not  
be recovered using Error  
BBh  
BEh  
1
1
1
0
0
0
0
0
1
1
0
0
0 (none)  
0 (none)  
Correction Code (ECC).  
Normalized value: always 100.  
Temperature - Airflow Temperature (Case)  
Raw value: reports SSD case temperature statistics.  
Bytes 0-1: Current case temperature, Celsius  
Byte 2: Recent min case temperature, Celsius  
Byte 3: Recent max case temperature, Celsius  
Bytes 4-5: Over temperature counter. Number of times  
sampled temperature exceeds drive max operating tem-  
perature specification.  
Normalized value: 100 – case temperature in C degrees.  
Power-Off Retract Count (Unsafe Shutdown Count)  
Raw value: reports the cumulative number of unsafe  
(unclean) shutdown events over the life of the device. An  
unsafe shutdown occurs whenever the device is powered  
off without STANDBYIMMEDIATE being the last command.  
C0h  
C2h  
1
1
1
0
0
0
0
0
1
1
0
0
0 (none)  
0 (none)  
Normalized value: always 100.  
Temperature - Device Internal Temperature  
Raw value: Reports internal temperature of the SSD in  
degrees Celsius. Temperature reading is the value direct  
from the printed circuit board (PCB) sensor without offset.  
Normalized value: 150 – device temperature in C degrees,  
100 if device temperature less than 50.  
Pending Sector Count  
Raw value: number of current unrecoverable read errors  
that will be re-allocated on next write.  
C5h  
C7h  
0
1
1
1
0
0
0
0
1
1
0
0
0 (none)  
0 (none)  
Normalized value: always 100.  
CRC Error Count  
Raw value: shows total number of encountered SATA  
interface cyclic redundancy check (CRC) errors.  
Normalized value: always 100.  
Host Writes  
Raw value: reports total number of sectors written by the  
host system. The raw value is increased by 1 for every  
65,536 sectors (32MB) written by the host.  
E1h  
1
1
0
0
1
0
0 (none)  
Normalized value: always 100.  
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Table 18.  
SMART Attributes  
Status Flags  
ID  
Attribute  
Threshold  
SP  
EC  
ER  
PE  
OC  
PW  
Timed Workload Media Wear  
Raw value: measures the wear seen by the SSD (since  
reset of the workload timer, attribute E4h), as a  
percentage of the maximum rated cycles. Divide the raw  
value by 1024 to derive the percentage with 3 decimal  
points.  
E2h  
E3h  
1
1
0
0
1
0
0 (none)  
Normalized value: always 100.  
Timed Workload Host Read/Write Ratio  
Raw value: shows the percentage of I/O operations that  
are read operations (since reset of the workload timer,  
attribute E4h). Reported as integer percentage from 0 to  
100.  
1
1
0
0
1
0
0 (none)  
Normalized value: always 100.  
Timed Workload Timer  
Raw value: measures the elapsed time (number of  
minutes since starting this workload timer).  
E4h  
E8h  
1
1
1
1
0
0
0
0
1
1
0
1
0 (none)  
Normalized value: always 100.  
Available Reserved Space  
Raw value: reports number of reserve blocks remaining.  
10  
Normalized value: begins at 100 , which corresponds to  
100 percent availability of the reserved space. The  
threshold value for this attribute is 10 percent availability.  
Media Wearout Indicator  
Raw value: always 0.  
Normalized value: reports the number of cycles the NAND  
media has undergone. Declines linearly from 100 to 1 as the  
average erase cycle count increases from 0 to the  
maximum rated cycles.  
E9h  
1
1
0
0
1
0
0 (none)  
Once the normalized value reaches 1, the number will not  
decrease, although it is likely that significant additional  
wear can be put on the device.  
Thermal Throttle Status  
Raw value: reports Percent Throttle Status and Count of  
events  
Byte 0: Throttle status reported as integer percentage.  
Bytes 1-4: Throttling event count. Number of times  
thermal throttle has activated. Preserved over power cy-  
cles.  
EAh  
1
1
0
0
1
0
0 (none)  
Byte 5: Reserved.  
Normalized value: always 100.  
Total LBAs Written  
Raw value: reports the total number of sectors written by  
the host system. The raw value is increased by 1 for every  
65,536 sectors (32MB) written by the host.  
F1h  
F2h  
1
1
1
1
0
0
0
0
1
1
0
0
0 (none)  
0 (none)  
Normalized value: always 100.  
Total LBAs Read  
Raw value: reports the total number of sectors read by the  
host system. The raw value is increased by 1 for every  
65,536 sectors (32MB) read by the host.  
Normalized value: always 100.  
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Table 19. SMART Attribute Status Flags  
Status Flag  
Description  
Value = 0  
Value = 1  
SP  
EC  
ER  
PE  
Self-preserving attribute  
Event count attribute  
Error rate attribute  
Not a self-preserving attribute  
Not an event count attribute  
Not an error rate attribute  
Not a performance attribute  
Self-preserving attribute  
Event count attribute  
Error rate attribute  
Performance attribute  
Online collection attribute  
Performance attribute  
Collected only during offline activity Collected during both offline and  
online activity  
OC  
PW  
Pre-fail warranty attribute  
Advisory  
Pre-fail  
5.4.1  
Timed Workload Endurance Indicators  
Timed Workload Media Wear Indicator — ID E2h  
This attribute tracks the drive wear seen by the device during the last wear timer loop, as  
a percentage of the maximum rated cycles. The raw value tracks the percentage up to 3  
decimal points. This value should be divided by 1024 to get the percentage.  
For example: if the raw value is 4450, the percentage is 4450/1024 = 4.345%. The raw  
value is held at FFFFh until the wear timer (attribute E4h) reaches 60 (minutes) after a  
SMART EXECUTE OFFLINE IMMEDIATE (B0h/D4h) subcommand 40h to the SSD. The  
normalized value is always set to 100 and should be ignored.  
Timed Workload Host Reads Percentage — ID E3h  
This attribute shows the percentage of I/O operations that are read operations during the  
last workload timer loop. The raw value tracks this percentage and is held at FFFFh until  
the workload timer (attribute E4h) reaches 60 (minutes). The normalized value is always  
set to 100 and should be ignored.  
Workload Timer — ID E4h  
This attribute is used to measure the time elapsed during the current workload. The  
attribute is reset when a SMART EXECUTE OFFLINE IMMEDIATE (D4h) subcommand 40h  
is issued to the drive. The raw value tracks the time in minutes and has a maximum value  
of 232 = 4,294,967,296 minutes (8,171 years). The normalized value is always set to  
100 and should be ignored.  
User Notes  
Sending a SMART EXECUTE OFFLINE IMMEDIATE (B0h/D4h) subcommand 40h to the  
SSD resets and starts all three attributes (Media Wear Indicator, Attribute E2h, Host  
Reads Percentage, Attribute E3h, and the Workload timer, Attribute E4h) to FFFFh.  
The Attribute raw values are held at FFFFh until the Workload timer (Attribute E4h)  
reaches a total of 60 (minutes) of power on time. After 60 minutes, the Timed  
Workload data is made available.  
After the Workload timer (E4h) reaches 60 (minutes), the Timed Workload data is  
saved every minute so only 59 seconds of data is lost if power is removed without  
receiving ATA STANDBY IMMEDIATE. Accumulated data is not reset due to power  
loss.  
Upon power up, the attributes hold a snapshot of their last saved values for 59  
seconds and live data is available after 60 seconds, once the initial one hour interval  
is completed.  
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Example Use Cases  
The Timed Workload Endurance attributes described in this section are intended to be  
used to measure the amount of media wear that the drive is subjected to during a timed  
workload.  
Ideally, the system that the drive is being used in should be capable of issuing SMART  
commands. Otherwise, provisions have been provided to allow the media wear attributes  
to be persistent so the drive can be moved to a SMART capable system to read out the  
drive wear attribute values.  
Use Case 1 – With a System Capable of SMART Commands  
1. On a SMART capable system, issue the SMART EXECUTE OFF-LINE IMMEDIATE  
(D4h) sub-command 40h to reset the drive wear attributes.  
2. Run the workload to be evaluated for at least 60 minutes. Otherwise the drive  
wear attributes will not be available.  
3. Read out the drive wear attributes with the SMART READ DATA (D0h) command.  
Use Case 2 – With a System Not Capable of SMART Commands  
1. On a SMART capable system, issue the SMART EXECUTE OFF-LINE IMMEDIATE  
(D4h) sub-command 40h to reset the the drive wear attributes.  
2. Move the drive to the system where the workload will be measured (and not  
capable of SMART commands).  
3. Run the workload to be evaluated for at least 60 minutes. Otherwise the drive  
wear attributes will not be available.  
4. Do a clean system power down by issuing the ATA STANDBY IMMEDIATE  
command prior to shutting down the system. This will store all the drive wear  
SMART attributes to persistent memory within the drive.  
5. Move the drive to a SMART capable system.  
6. Read out the drive wear attributes with the SMART READ DATA (D0h) command  
within 60 minutes after power-up.  
Example Calculation of Drive Wear  
The following is an example of how the drive wear attributes can be used to evaluate the  
impact of a given workload. The Host Writes SMART attribute (E1h) can also be used to  
calculate the amount of data written by the host during the workload by reading this  
attribute before and after running the workload. This example assumes that the steps  
shown in “Example Use Cases” on page 18 were followed to obtain the following attribute  
values:  
Timed Workload Media Wear (E2h) has a raw value of 16. Therefore, the per-  
centage wear = 16/1024 = 0.016%.  
Timed Workload Host Read/Write Ratio (E3h) has a normalized value of 80, in-  
dicating that 80% of operations were reads.  
Workload Timer (E4h) has a raw value of 500. Therefore the workload ran for 500  
minutes.  
Host Writes Count (E1h) had a raw value of 100,000 prior to running the workload  
and a value of 130,000 at the end of the workload. Therefore, the number of  
sectors written by the host during the workload was 30,000 * 65,535 =  
1,966,050,000 sectors or 1,966,050,000 * 512/1,000,000,000 = 1,007 GB.  
The following conclusions can be made for this example case:  
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The workload took 500 minutes to complete with 80% reads and 20% writes. A total of  
1,007 GB of data was written to the device, which increased the media wear in the drive  
by 0.016%. At this point in time, this workload is causing a wear rate of 0.016% for every  
500 minutes, or 0.00192%/hour.  
5.4.2  
SMART Logs  
Intel SSD DC S3500 implements the following Log Addresses: 00h, 02h, 03h, 06h, and  
07h.  
DC S3500 implements host vendor specific logs (addresses 80h-9Fh) as read and write  
scratchpads, where the default value is zero (0). Intel SSD DC S3500 does not write any  
specific values to these logs unless directed by the host through the appropriate  
commands.  
DC S3500 also implements a device vendor specific log at address A9h as a read-only log  
area with a default value of zero (0).  
5.5  
Device Statistics  
In addition to the SMART attribute structure, statistics pertaining to the operation and  
health of the Intel SSD DC S3500 can be reported to the host on request through the  
Device Statistics log as defined in the ATA specification.  
The Device Statistics log is a read-only GPL/SMART log located at read log address 0x04  
and is accessible using READ LOG EXT, READ LOG DMA EXT or SMART READ LOG  
commands.  
Table 20 lists the Device Statistics supported by the Intel SSD DC S3500.  
Table 20. Device Statistics Log  
Equivalent SMART  
attribute (if  
Page  
Offset  
Description  
applicable)  
0x00  
--  
List of Supported Pages  
--  
0x08  
0x10  
0x18  
Power Cycle Count  
Power-On Hours  
0Ch  
09h  
E1h  
Logical Sectors Written  
Num Write Commands – incremented by one  
for every host write  
0x01 – General Statistics  
0x20  
0x28  
0x30  
--  
F2h  
--  
Logical Sectors Read  
Num Read Commands – incremented by one  
for every host read  
0x08  
0x10  
Num Reported Uncorrectable Errors  
BBh  
--  
0x04 – General Error Statistics  
Num Resets Between Command Acceptance  
and Completion  
0x00  
0x08  
0x10  
0x18  
0x20  
0x28  
0x30  
0x38  
Device Statistics Information Header  
Current Temperature  
--  
--  
--  
--  
--  
--  
--  
--  
Average Short Term Temperature  
Average Long Term Temperature  
Highest Temperature  
0x05 – Temperature Statistics  
Lowest Temperature  
Highest Average Short Term Temperature  
Lowest Average Short Term Temperature  
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Table 20. Device Statistics Log  
Equivalent SMART  
attribute (if  
Page  
Offset  
Description  
applicable)  
0x40  
0x48  
0x50  
0x58  
0x60  
0x68  
0x08  
0x10  
0x18  
Highest Average Long Term Temperature  
Lowest Average Long Term Temperature  
Time in Over-Temperature  
--  
--  
--  
--  
--  
--  
--  
--  
Specified Maximum Operating Temperature  
Time in Under-Temperature  
Specified Minimum Operating Temperature  
Number of Hardware Resets  
0x06 – Transport Statistics  
Number of ASR Events  
Number of Interface CRC Errors  
--  
E9h  
0x07 – Solid State Device Statistics  
0x08  
Percentage Used Endurance Indicator  
Note: This device statistic  
counts from 1 to 150  
5.6  
SMART Command Transport (SCT)  
With SMART Command Transport (SCT), a host can send commands and data to an SSD  
and receive status and data from an SSD using standard write/read commands to  
manipulate two SMART Logs:  
Log Address E0h ("SCT Command/Status") — used to send commands and retrieve status  
Log Address E1h ("SCT Data Transfer") — used to transport data  
Intel SSD DC S3500 supports the following standard SCT actions:  
Write Same — DC S3500 implements this action code as described in the ATA specification  
Error Recovery Control — DC S3500 accepts this action code, and will store and return  
error-recovery time limit values  
Feature Control - DC S3500 supports feature code 0001h (write cache) feature code 0002h  
(write cache reordering), and feature code 0003h (time interval for temperature logging). It  
also supports D000h(Power Safe Write Cache capacitor test interval), (D001h(read/write power  
governor mode), D002h(read thermal governor mode), D003h(read power governor burst  
power), D004h(read power governor average power)  
Data table command - DC S3500 supports data table command as specified in ATA8-ACS2. This  
will read out temperature logging information in table ID 0002h  
Read Status Support - DC S3500 supports read status log  
5.7  
5.8  
Data Set Management Command Set  
Intel SSD DC S3500 supports the Data Set Management command set Trim attribute,  
which consists of:  
DATA SET MANAGEMENT  
Host Protected Area Command Set  
Intel SSD DC S3500 supports the Host Protected Area command set, which consists of:  
READ NATIVE MAX ADDRESS  
SET MAX ADDRESS  
READ NATIVE MAX ADDRESS EXT  
SET MAX ADDRESS EXT  
Intel SSD DC S3500 also supports the following optional commands:  
SET MAX SET PASSWORD  
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Intel® Solid-State Drive DC S3500  
SET MAX LOCK  
SET MAX FREEZE LOCK  
SET MAX UNLOCK  
5.9  
48-Bit Address Command Set  
Intel SSD DC S3500 supports the 48-bit Address command set, which consists of:  
FLUSH CACHE EXT  
READ DMA EXT  
READ NATIVE MAX ADDRESS EXT  
READ SECTOR(S) EXT  
READ VERIFY SECTOR(S) EXT  
SET MAX ADDRESS EXT  
WRITE DMA EXT  
WRITE MULTIPLE EXT  
WRITE SECTOR(S) EXT  
WRITE MULTIPLE FUA EXT  
WRITE DMA FUA EXT  
5.10  
5.11  
General Purpose Log Command Set  
Intel SSD DC S3500 supports the General Purpose Log command set, which consists of:  
READ LOG EXT  
WRITE LOG EXT  
Native Command Queuing  
Intel SSD DC S3500 supports the Native Command Queuing (NCQ) command set, which  
includes:  
READ FPDMA QUEUED  
WRITE FPDMA QUEUED  
Note:  
With a maximum Queue Depth set to 32.  
5.12  
Software Settings Preservation  
Intel SSD DC S3500 supports the SET FEATURES parameter to enable/disable the  
preservation of software settings.  
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Intel® Solid-State Drive DC S3500  
6.0  
Certifications and Declarations  
Table 21 describes the Device Certifications supported by the Intel SSD DC S3500.  
Table 21.  
Device Certifications and Declarations  
Certification  
Description  
Low Voltage DIRECTIVE 2006/95/EC OF THE EUROPEAN PARLIAMENT AND OF THE COUNCIL  
CE Compliant  
UL Recognized  
of 12 December 2006, and EMC Directive 2004/108/EC OF THE EUROPEAN PARLIAMENT AND OF THE  
COUNCIL of 15 December 2004.  
Underwriters Laboratories, Inc. Bi-National Component Recognition; UL 60950-1, 2nd Edition,  
2007-03-27 (Information Technology Equipment - Safety - Part 1: General Requirements)  
CSA C22.2 No. 60950-1-07, 2nd Edition, 2007-03 (Information Technology Equipment - Safety - Part  
1: General Requirements)  
Compliance with the Australia/New Zealand Standard AS/NZS3548 and Electromagnetic  
Compatibility (EMC) Framework requirements of the Australian Communication Authority (ACA).  
C-Tick Compliant  
BSMI Compliant  
Compliance to the Taiwan EMC standard CNS 13438: Information technology equipment - Radio  
disturbance Characteristics - limits and methods of measurement, as amended on June 1, 2006, is  
harmonized with CISPR 22: 2005.04.  
Compliance with paragraph 1 of Article 11 of the Electromagnetic Compatibility Control Regulation  
and meets the Electromagnetic Compatibility (EMC) Framework requirements of the Radio Research  
Laboratory (RRL) Ministry of Information and Communication Republic of Korea.  
KCC  
Voluntary Control Council for Interface to cope with disturbance problems caused by personal  
computers or facsimile.  
VCCI  
RoHS Compliant  
WEEE  
Restriction of Hazardous Substance Directive  
Directive on Waste Electrical and Electronic Equipment  
7.0  
References  
Table 22 identifies the standards information referenced in this document.  
Table 22.  
Standards References  
Date  
Title  
Location  
Solid-State Drive (SSD) Requirements and Endurance Test Method http://www.jedec.org/standards-docume  
July 2012  
Solid-State Drive (SSD) Requirements and Endurance Test Method http://www.jedec.org/standards-docume  
Sept 2010  
Dec 2008  
(JESD218)  
nts/docs/jesd218/  
VCCI  
June 2009  
RoHS  
Click Search MDDS Database and search  
for material description datasheet  
August 2009  
June 2009  
May 2006  
ACS-2-ATA/ATAPI Command Set 2 Specification  
Serial ATA Revision 3.0  
SFF-8223, 2.5-inch Drive w/Serial Attachment Connector  
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Table 22.  
Standards References  
Date  
Title  
Location  
May 2005  
SFF-8201, 2.5-inch drive form factor  
International Electrotechnical Commission EN 61000  
4-2 (Electrostatic discharge immunity test)  
1995  
1996  
1995  
1995  
1997  
1994  
4-3 (Radiated, radio-frequency, electromagnetic field immunity test)  
4-4 (Electrical fast transient/burst immunity test)  
4-5 (Surge immunity test)  
4-6 (Immunity to conducted disturbances, induced by radio-  
frequency fields)  
4-11 (Voltage Variations, voltage dips, short interruptions and  
voltage variations immunity tests)  
1995  
ENV 50204  
radimmun.htm/  
(Radiated electromagnetic field from digital radio telephones)  
Appendix A: IDENTIFY DEVICE Command Data  
Table 23. Returned Sector Data  
Word  
F = Fixed  
V = Variable  
X = Both  
Default Value  
Description  
0
1
2
3
X
X
V
X
X
X
V
X
F
0040h  
General configuration bit-significant information  
Obsolete - Number of logical cylinders (16,383)  
Specific configuration  
3FFFh  
C837h  
0010h  
0h  
Obsolete - Number of logical heads (16)  
Retired  
4-5  
6
003Fh  
0h  
Obsolete - Number of logical sectors per logical track (63)  
Reserved for assignment by the CompactFlash* Association (CFA)  
Retired  
7-8  
9
0h  
10-19  
20-21  
22  
varies  
0h  
Serial number (20 ASCII characters)  
Retired  
X
X
F
0h  
Obsolete  
23-26  
27-46  
varies  
varies  
Firmware revision (8 ASCII characters)  
Model number (Intel® Solid-State Drive)  
F
7:0—Maximum number of sectors transferred per interrupt on multiple  
commands  
47  
F
F
F
F
X
F
X
X
X
X
F
8001h  
4000h  
2F00h  
4000h  
0h  
48  
Trusted Computing Feature Set  
49  
Capabilities  
50  
Capabilities  
51-52  
53  
Obsolete  
0007h  
3FFFh  
0010h  
003Fh  
FC1000FBh  
BF01  
Words 88 and 70:64 valid  
54  
Obsolete - Number of logical cylinders (16,383)  
Obsolete - Number of logical heads (16)  
Obsolete - Number of logical sectors per logical track (63)  
Obsolete  
55  
56  
57-58  
59  
Number of sectors transferred per interrupt on multiple commands  
0950F8B0h  
60-61  
V
120GB: 0DF94BB0h  
160GB: 0FFFFFFFh  
240GB: 0FFFFFFFh  
300GB: 0FFFFFFFh  
Total number of user-addressable sector for 28-bit commands  
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Table 23. Returned Sector Data  
Word  
F = Fixed  
V = Variable  
X = Both  
Default Value  
Description  
400GB: 0FFFFFFFh  
480GB: 0FFFFFFFh  
600GB: 0FFFFFFFh  
800GB: 0FFFFFFFh  
0h  
62  
X
X
F
F
F
F
F
F
F
F
F
F
F
F
V
F
F
F
F
Obsolete  
63  
64  
65  
66  
67  
68  
69  
70  
71-74  
75  
76  
77  
78  
79  
80  
81  
82  
83  
0007h  
0003h  
0078h  
0078h  
0078h  
0078h  
4030h  
0000h  
0h  
Multi-word DMA modes supported/selected  
PIO modes supported  
Minimum multiword DMA transfer cycle time per word  
Manufacturer’s recommended multiword DMA transfer cycle time  
Minimum PIO transfer cycle time without flow control  
Minimum PIO transfer cycle time with IORDY flow control  
Additional Supported  
Reserved  
Reserved for IDENTIFY PACKET DEVICE command  
Queue depth  
001Fh  
850Eh  
0006h  
0040h  
0040h  
03FCh  
0110h  
746Bh  
7501h  
Serial ATA capabilities  
Reserved for future Serial ATA definition  
Serial ATA features supported  
Serial ATA features enabled  
Major version number  
Minor version number  
Command set supported  
Command sets supported  
84  
85  
86  
87  
88  
89  
90  
91  
92  
F
6163h  
7469h  
B401h  
6163h  
407Fh  
0002h  
0002h  
0h  
Command set/feature supported extension  
Command set/feature enabled  
X
X
X
X
F
Command set/feature enabled  
Command set/feature default  
Ultra DMA Modes  
Time required for security erase unit completion  
Time required for enhanced security erase completion  
Current advanced power management value  
Master Password Revision Code  
F
V
V
0FFFEh  
Hardware reset result: the contents of bits (12:0) of this word shall  
change only during the execution of a hardware reset  
93  
X
V
F
0h  
0h  
0h  
0h  
0h  
0h  
94  
Vendor’s recommended and actual acoustic management value  
Stream minimum request size  
95  
96  
V
V
F
Streaming transfer time - DMA  
97  
Streaming access latency - DMA and PIO  
Streaming performance granularity  
98-99  
80GB: 0950F8B0h  
120GB: 0DF94BB0h  
160GB: 12A19EB0h  
240GB: 1BF244B0h  
300GB: 22EEC130h  
400GB: 2E9390B0h  
480GB: 37E436B0h  
600GB: 45DD2FB0h  
800GB: 5D26CEB0h  
100-103  
V
Maximum user LBA for 48-bit address feature set  
104  
105  
V
V
0h  
Streaming transfer time - PIO  
0004h  
Maximum number of 512-byte blocks of LBA Range Entries per DATA  
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Table 23. Returned Sector Data  
Word  
F = Fixed  
V = Variable  
X = Both  
Default Value  
Description  
SET MANAGEMENT command  
106  
F
6003h  
Physical sector size / logical sector size  
Inter-seek delay for ISO-7779 acoustic testing in microseconds  
Unique ID  
107  
F
0h  
108-111  
112-115  
116  
F
varies  
0h  
F
Reserved for world wide name extension to 128 bits  
Reserved for technical report  
V
F
0h  
117-118  
119  
0h  
Words per logical sector  
F
405Ch  
401Ch  
0h  
Supported settings  
120  
X
F
Command set/feature enabled/supported  
Reserved  
121-126  
127  
X
X
V
X
X
X
X
X
X
X
F
0h  
Removable Media Status Notification feature set support  
Security status  
128  
0021h  
001Ch  
0h  
129  
Vendor-specific  
130-139  
140-149  
150-159  
160  
Vendor-specific  
0h  
Disable Logical Error Field  
0h  
Vendor-specific  
0h  
CompactFlash Association (CFA) power mode 1  
Reserved for assignment by the CFA  
Reserved for assignment by the CFA  
Data set management Trim attribute support  
Reserved for assignment by the CFA  
Current media serial number  
161-167  
168  
0h  
0003h  
0001h  
0h  
169  
170-175  
176-205  
206  
V
X
F
Varies  
003Dh  
0000h  
4000h  
0000h  
0000h  
SCT Command Transport  
207-208  
209  
Reserved  
X
V
F
Alignment of logical blocks within a physical block  
Write-Read-Verify Sector Count Mode 3 (DWord)  
Write-Read-Verify Sector Count Mode 2 (DWord)  
210-211  
212-213  
214  
X
V
F
0000h  
0000h  
0001h  
0000h  
0000h  
0000h  
0000h  
101Fh  
0000h  
0000h  
0000h  
NV Cache Capabilities  
215-216  
217  
NV Cache Size in Logical Blocks (DWord)  
Nominal media rotation rate  
Reserved  
218  
V
F
219  
NV Cache Options  
220  
V
X
F
Write-Read-Verify feature set  
Reserved  
221  
222  
Transport major version number  
Transport minor version number  
Reserved  
223  
F
224-229  
230-233  
F
X
Extended Number of User Addressable Sectors (QWord)  
Minimum number of 512-byte data blocks per DOWNLOAD MICROCODE  
command for mode 03h  
234  
F
0001h  
Maximum number of 512-byte data blocks per DOWNLOAD MICROCODE  
command for mode 03h  
235  
F
FFFFh  
0000h  
Varies  
236-254  
255  
X
V
Reserved  
Integrity word  
Notes: F = Fixed. The content of the word is fixed and does not change. For removable media devices, these values may change  
when media is removed or changed.  
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V = Variable. The state of at least one bit in a word is variable and may change depending on the state of the device or the  
commands executed by the device.  
X = F or V. The content of the word may be fixed or variable.  
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