HP Hewlett Packard Network Card 37717C User Manual

HP 37717C communications  
performance analyzer  
New dual  
SONET/SDH  
and DS1/DS3  
capability  
Configuration guide  
Effective from February 1998  
New capabilit y  
Dual st andar d SONET/SDH  
DS1, DS3 int er faces  
STS-1, STS-3 elect r ical  
OC-1, OC-3, OC-12 opt ical  
OC-12c and STM-4c  
STM-0, STM-1, STM-4 opt ical  
Pr ot ect ion swit ch t imes  
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Int r oduct ion  
Your choice of t est capabilit y  
The HP 37717C communications performance analyzer supports  
comprehensive functional test and jitter capability to help you test  
your PDH/DSn, SONET/SDH and ATM networks or network  
equipment. The analyzer comprises a mainframe with large color  
display and integral floppy disk drive, optional 80-column graphics  
printer, and includes power cord and operating manuals. You add  
the test capability you require by selecting from the optional test  
modules.  
To meet your specific test needs, just order the capability you  
require. Simply order the HP 37717C analyzer and choose the  
application orientated options you require, from the tables in the  
pages that follow. Remember, you can configure your analyzer to  
simultaneously include PDH/DSn, SONET/SDH, ATM and jitter, or  
you can configure it to contain PDH/DSn only, SDH only, SONET/  
SDH only, ATM only or almost any combination.  
HP 37717C communicat ions  
per for mance analyzer  
with color display, floppy disk  
drive as standard and optional  
integrated printer.  
All the power you need for  
comprehensive performance  
testing.  
Select optional PDH/DSn, SONET/SDH, ATM cell layer, ATM services  
and jitter modules from an expanding range of options:  
ATM services layer testing with/without native LAN connectivity  
ATM cell layer generation and measurement  
SONET/SDH electrical interfaces  
SONET/SDH optical interfaces (1310 and 1550 nm)  
SONET/SDH binary interfaces  
PDH and SDH jitter/wander Tx and Rx  
DSn testing (DS1, DS3, E1, E3 structured)  
Multiple PDH outputs  
PDH testing (704 kb/s to 140 Mb/s)  
PDH binary interfaces with external clock input  
Printer/remote interfaces  
Graphics printer.  
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Example configurat ions  
Option  
code  
Slots  
used  
1. STM-4o/STM-1o plus jitter  
1. PDH/DSn and ATM test and interfaces option UKJ  
2
2
1
2
Example user r equir ement s  
2. SONET/SDH test and interfaces option  
3. Wander and jitter generation option  
4. Wander and jitter measurement option  
5. ATM services layer test option  
6. PDH binary interfaces option  
A3R  
A3K  
A3N  
PDH (2, 8, 34, 140 Mb/s) – mux/demux capability  
STM-1e (155 Mb/s) electrical interfaces  
STM-4o/STM-1o (1310 nm) optical interfaces  
Optical power measurement  
7. Optical interfaces option  
131  
Reserved  
Jitter and wander generation  
8. SONET/SDH binary interfaces option  
9. Multiple PDH interfaces option  
Jitter measurement (at all above interface rates)  
Graphics printer  
10. Remote-control/external-printer  
interfaces option  
Reserved  
FC/PC optical adapters.  
11. Printer option  
UKX  
UH4  
12. Optical adaptor option  
Option  
code  
Slots  
used  
2. ATM services and jitter  
1. PDH/DSn and ATM test and interfaces option UKZ  
2
2
1
2
1
Example user r equir ement s  
2. SONET/SDH test and interfaces option  
3. Wander and jitter generation option  
4. Wander and jitter measurement option  
5. ATM services layer test option  
6. PDH binary interfaces option  
A1T  
A3K  
A3V  
0YK  
STM-1/OC-3c optical interfaces (1310 nm)  
DS1, DS3, E1, E3, STM-1e electrical interfaces  
ATM cell layer testing  
ATM Channel View, rate history, graphical CDV  
Jitter and wander generation (E1, E3, STM-1)  
Jitter measurement (E1, E3, STM-1)  
Screen dumps to printer  
7. Optical interfaces option  
UH1  
Reserved  
8. SONET/SDH binary interfaces option  
9. Multiple PDH interfaces option  
10. Remote-control/external-printer  
interfaces option  
A3B  
Reserved  
LAN remote control  
FC/PC optical adapters.  
11. Printer option  
UKX  
UH4  
12. Optical adaptor option  
Option  
code  
Slots  
used  
3. OC-12c, DS3 structured, HP-IB  
1. PDH/DSn and ATM test and interfaces option  
2. SONET/SDH test and interfaces option  
3. Wander and jitter generation option  
4. Wander and jitter measurement option  
5. ATM services layer test option  
6. PDH binary interfaces option  
110  
120  
2
2
Example user r equir ement s  
PDH (DS1, DS3, E1, E3) – mux/demux capability  
STS-1/STS-3 (52/155 Mb/s) electrical interfaces  
OC-12c (for clear channel testing)  
OC-12c/OC-3/OC-1 (1310 nm) optical interfaces  
Optical power measurement.  
7. Optical interfaces option  
131  
Reserved  
Reserved  
8. SDH binary interfaces option  
RS-232-C/HP-IB remote control  
9. Multiple PDH interfaces option  
Remote PC operation  
(needs HP E4540A distributed network analyzer  
software).  
10. Remote-control/external-printer  
interfaces option  
A3D  
11. Printer option  
FC/PC optical adapters.  
12. Optical adaptor option  
Distributed network analyzer firmware  
UH4  
USS  
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Configuring t he HP 37717C  
communicat ions performance analyzer  
There are reserved slots for optical interfacing and remote-control  
modules. In addition, you have a maximum of eight user-  
configurable slots to add PDH/DSn, SONET/SDH, ATM and jitter  
capability. Ensure that the number of slots used does not exceed  
eight.  
1 2  
3
4
5 6  
7
8
St ep 1  
St ep 2  
Review sections 1 to 12 in the following pages to determine the  
capability you require. In each section, select one option as required  
and tick the option box.  
Enter the option code and slots used in the table below. Confirm  
slots used does not exceed eight slots.  
Opt ion No. of Slot s  
code  
slot s  
used  
1. PDH/DSn and ATM test  
and interfaces option  
2
2. SONET/SDH test and interfaces option  
3. Wander and jitter generation option  
4. Wander and jitter measurement option  
5. ATM services layer test option  
6. PDH binary interfaces option  
2
1
1 or 2  
1 or 2  
1
1
7. Optical interfaces option  
Reserved  
Reserved  
8. SONET/SDH binary interfaces option  
9. Multiple PDH interfaces option  
1
10. Remote-control/external-printer  
interfaces option  
11. Printer option  
12. Optical adaptor options  
Tot al number of slot s used  
St ep 3  
Check that you have specified both test and interfacing for all  
required capabilities.  
Your local HP sales representative will be happy to help you  
configure the HP 37717C analyzer to match your specific needs.  
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Module int erworking sect ion  
The following three tables indicate which modules are capable of networking with  
each other. Choose one from each category (if required)†  
PDH/SDH and ATM cell layer suppor t ed configur at ions  
J it t er , wander and slips  
t est ing – gener at ion  
PDH/ATM cell t est  
and PDH int er faces  
STM-0e/STM-1e t est  
and int er faces  
Opt ical  
int er faces  
Opt ion A3K  
PDH and SDH jitter and  
wander generation.  
Page 9  
Opt ion UKK  
Page 8  
Unstructured PDH: 0.7, 2, 8,  
34 and 140 Mb/s.  
Opt ion A3R  
Page 8  
STM-0e (52 Mb/s) and STM-1e  
(155 Mb/s) electrical  
Opt ion UH1  
155 Mb/s (1310 nm).  
Page 10  
Opt ion 130  
Page 10  
interface: STM-0/STM-1  
overhead access, thru mode  
and pointer sequences ,  
TU-12, TU-2, VC-3 and VC-4  
mappings.  
Opt ion 140  
PDH and SDH jitter  
generation.  
Page 9  
Opt ion UKJ  
Structured PDH: 2, 8, 34 and  
140 Mb/s.  
Page 8  
622/155/52 Mb/s (1310 and  
1550 nm), optical power  
measurement.  
Opt ion UKN  
Page 8  
Opt ion 131  
622/155/52 Mb/s (1310 nm),  
optical power measurement.  
Page 10  
J it t er , wander and slips  
t est ing – measur ement  
ATM cell: 2, 34 and 140 Mb/s  
(includes all capability of  
option UKJ).  
Opt ion UHN  
PDH jitter measurement: 2, 8,  
34 and 140 Mb/s.  
Page 9  
Opt ion 0YH†  
Page 10  
Opt ion UH3†  
Page 9  
622/155/52 Mb/s binary (NRZ)  
interfaces. Must also order  
option 130 or 131.  
Binary (NRZ) clock and data  
plus external clock input.  
Must also order option UKK,  
UKJ or UKN.  
Opt ion A3L  
Page 9  
STM-1e line and PDH jitter  
measurement: 2, 8, 34, 140  
and 155 Mb/s.  
Opt ion UHC†  
Page 11  
Opt ion A3V  
Page 9  
Three additional 2, 8, 34 and  
140 Mb/s outputs. Must also  
order option UKK, UKJ or  
UKN.  
STM-1o, STM-1e line and PDH  
jitter measurement: 2, 8, 34,  
140 Mb/s and 155 Mb/s.  
Opt ion A3N  
Page 9  
STM-4o, STM-1o, STM-1e line  
and PDH jitter measurement:  
2, 8, 34, 140 Mb/s, 155 Mb/s  
and 622 Mb/s.  
Dual st andar d SONET/SDH and DSn/PDH suppor t ed configur at ions  
PDH/DSn int er faces  
SONET/SDH  
t est and int er faces  
Opt ical  
int er faces  
J it t er , wander and slips  
t est ing – gener at ion*  
Opt ion 110  
Page 8  
Structured PDH: DS1, DS3,  
E1, E3.  
Opt ion 120  
Page 8  
Opt ion UH1  
155 Mb/s (1310 nm).  
Page 10  
Opt ion A3K  
PDH, 155 Mb/s, 622 Mb/s  
jitter and wander generation.  
Page 9  
STS-1/STM-0e (52 Mb/s) and  
STS-3/STM-1e (155 Mb/s)  
electrical interface:  
Overhead access, thru mode  
and pointer sequences.  
VT1.5/TU-11, VT2/TU-12,  
VT6/TU-2, VC-3/STS-1 SPE  
and VC-4/STS-3c SPE  
mappings.  
Opt ion 130  
Page 10  
Opt ion UKK  
Unstructured PDH: 0.7, 2, 8,  
34 and 140 Mb/s.  
Page 8  
622/155/52 Mb/s optical  
interface (1310 and  
1550 nm), optical power  
measurement.  
Opt ion 140  
As option A3K, but without  
wander generation.  
Page 9  
Opt ion UKJ  
Structured PDH: 2, 8, 34 and  
140 Mb/s.  
Page 8  
J it t er , wander and slips  
t est ing – measur ement *  
Opt ion 131  
Page 10  
622/155/52 Mb/s optical  
interface (1310 nm), optical  
power measurement.  
Opt ion UHN  
PDH jitter measurement.  
Page 9  
Opt ion UKN  
Page 8  
ATM cell: 2, 34 and 140 Mb/s  
(includes all capability of  
option UKJ).  
Opt ion A3L  
155 Mb/s electrical and PDH  
jitter measurement.  
Page 9  
Opt ion 0YH†  
Page 10  
622/155/52 Mb/s binary  
(NRZ) interfaces. Must also  
order option 130 or 131.  
Opt ion UH3†  
Page 9  
Binary (NRZ) clock and data  
plus external clock input.  
Must also order option UKK,  
UKJ, UKN or 110.  
Opt ion A3V  
155 Mb/s optical, electrical  
and PDH jitter measurement.  
Page 9  
Opt ion A3N  
Page 9  
622 Mb/s and 155 Mb/s  
optical, electrical and PDH  
jitter measurement.  
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Br oadband ATM ser vices suppor t ed configur at ions  
J it t er , wander and slips  
t est ing – gener at ion*  
ATM cell t est  
int er faces  
STM-1e t est  
and int er faces  
Opt ical  
int er faces  
Opt ion UKN1  
Page 8  
Opt ion A1T  
Page 8  
Opt ion UH1  
Page 10  
Opt ion A3K  
Page 9  
PDH, 155 Mb/s, 622 Mb/s  
jitter and wander generation.  
ATM cell generation and  
analysis: 2, 34 and 140 Mb/s  
(includes all capability of  
option UKJ structured PDH).  
STM-1e (155 Mb/s) electrical  
interface. Overhead access,  
thru mode and pointer  
sequences. TU-12, TU-2, VC-3  
and VC-4 mappings.  
(Provides STM-1o output  
when option UKN and optical  
interface option are selected.  
STM-1o and OC-3c are  
provided when option UKZ  
and an optical interface  
option are selected).  
155 Mb/s (1310 nm).  
Opt ion USN  
Page 10  
Opt ion 140  
Page 9  
622/155 Mb/s (1310 and  
1550 nm), optical power  
measurement.  
As option A3K but without  
wander generation.  
Opt ion UKZ2  
Page 8  
Generation and measurement  
of ATM payloads: 1.544 (DS1),  
44.736 (DS3), 2.048 (E1) and  
34.368 (E3) Mb/s.  
Opt ion UKT  
Page 10  
J it t er , wander and slips  
t est ing – measur ement *  
622/155 Mb/s (1310 nm),  
optical power measurement.  
Opt ion UHN  
Page 9  
1 ITU-T  
PDH jitter measurement.  
2 ANSI/ITU-T  
Opt ion A3L  
Page 9  
155 Mb/s electrical and PDH  
jitter measurement.  
ATM ser vices  
layer t est  
Opt ion A3V  
155 Mb/s optical, electrical  
and PDH jitter measurement.  
Page 9  
Opt ion 0YK  
Page 9  
Adds Channel View, graphical  
display of CDV, AAL analysis,  
rate history, benchmark traffic  
generation. Must also order  
option UKN or UKZ,  
Opt ion A3N  
622 Mb/s, 155 Mb/s optical,  
electrical and PDH jitter.  
Page 9  
Opt ion USL  
Page 9  
Adds Ethernet LAN  
connectivity testing plus all  
features of option 0YK. Must  
also order option UKN or UKZ.  
† Where specified two modules may be ordered from certain categories (ie. UH3, UHC, 0YH).  
* NB Jitter generation and measurement does not include DS1, DS3 and 52 Mb/s. PDH jitter depends on options fitted.  
If option UKK/UKJ/UKN fitted then PDH jitter generation and measurement is provided at E1/E2/E3/E4.  
If option 110 fitted then PDH jitter generation and measurement capability is provided at E1 and E3. 622 Mb/s  
and 155 Mb/s jitter presented in ITU-T terminology as is specified in the HP 37717B/C communications performance  
analyzer technical specifications (publication number 5966-0892E).  
For compliance to Bellcore standards, please contact you local Hewlett-Packard representative for details.  
Please cont act your local sales  
office if you require module  
int erworking capabilit y not  
specified here.  
All modules work wit h UKX  
( print er) , A3B/A3D ( remot e  
cont rol) and USS ( dist ribut ed  
net work analyzer soft ware) .  
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Opt ion  
code  
No of  
slot s  
Tick  
one  
1. PDH/DSn and ATM t est and int er faces opt ions  
Choose one option (if required). All options provide PDH interfaces and  
PDH test capability.  
Unstructured PDH testing: 0.7, 2, 8, 34 and 140 Mb/s interfaces plus an error output. ................. UKK  
Structured PDH testing: 2, 8, 34 and 140 Mb/s interfaces (64 kb/s and n × 64 kb/s testing). ......... UKJ  
2
2
2
ATM cell generation and analysis: 2, 34 and 140 Mb/s interfaces† ...................................................... UKN  
– includes all capability of option UKJ (structured PDH testing).  
Structured DSn/PDH testing: DS1, DS3, E1 and E3 interfaces ............................................................... 110  
(64 kb/s, 56 kb/s, n x 64 kb/s and n x 56 kb/s testing)  
2
2
ATM cell generation and analysis: DS1, DS3, E1 and E3 interfaces ................................................... UKZ*  
(equivalent to 1.5 Mb/s, 45 Mb/s, 2 Mb/s, 34 Mb/s)‡.  
If you need ATM cell generation and analysis at STM-1, then also order STM-0e/STM-1e  
option A3R (section 2).  
If you need OC-3c, then also order STM-1e option A1T (section 2) and appropriate  
optical interfaces and adaptor options (sections 7 and 12).  
* Option UKZ does not support option A3R or 120 at present.  
Please refer to module interworking section (pages 6 and 7).  
Opt ion  
code  
No of  
slot s  
Tick  
one  
2. SONET/SDH t est and int er faces opt ions  
Choose one option (if required). These options provide SDH electrical interfacing  
and SDH test capability.  
SDH test module: STM-0e (52 Mb/s) and STM-1e (155 Mb/s) electrical interfaces, ........................ A3R*  
STM-0/STM-1 overhead access,thru mode and pointer sequence generation, TU-12,  
TU-2, VC-3 and VC-4 mappings plus frequency offset generation, alarm and error  
generation/detection plus an error output, SDH alarm and BIP scan, tributary scan  
and protection switch times.  
2
2
SONET/SDH test module: STS-1/STM-0e (52 Mb/s) and STS-3/STM-1e (155 Mb/s) .......................... 120†  
electrical interfaces, overhead access,thru mode and pointer sequence  
generation, VT1.5/TU-11, VT2/TU-12, VT6/TU-2, STS-1/VC-3 SPE and STS-3c/VC-4 SPE  
mappings plus frequency offset generation, alarm and error generation/detection  
plus an error output, offset generation and BIP scan, tributary scan and protection switch times  
plus frequency and BIP scan.  
* Option A3R does not support option UKZ at present.  
Please refer to module interworking section (pages 6 and 7).  
Option 120 does not support option UKZ and UHC at present.  
Please refer to module interworking section (pages 6 and 7).  
STM-1e (155 Mb/s) electrical interface: As per option A3R but without ..................................... A1T  
2
STM-0e (52 Mb/s)capability, and without an error output.  
Opt ion  
code  
No of  
slot s  
Tick  
one  
3. Wander and jit t er gener at ion opt ions  
Choose on option (if required). For PDH jitter generation, also order PDH/DSn  
option (section 1). For SDH jitter generation, also order SONET/SDH option (section 2)  
plus appropriate optical interfaces and adaptor options (sections 7 and 12).  
PDH jitter generation: 2, 8, 34 and 140 Mb/s up to 80 UI (2 Mb/s). ....................................................... 140†  
1
1
SDH jitter generation: STM-1 (155 Mb/s) and STM-4 (622 Mb/s) up to 200 UI (STM-4).  
All the capability of option 140 plus wander generation: 2 Mb/s, STM-1 (155 Mb/s) ....................... A3K  
and STM-4 (622 Mb/s) up to 14400 UI (STM-4).  
† 8 and 140 Mb/s jitter generation requires a PDH option with 8 and 140 Mb/s  
interface to be fitted  
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Opt ion  
code  
No of  
slot s  
Tick  
one  
4. Wander and jit t er measur ement opt ions  
Choose one option (if required). If you need PDH jitter  
measurement then also order PDH/DSn interface option (section 1).  
PDH (tributary) jitter and wander measurement: 2, 8, 34, 140 Mb/s, with HP1, HP2 and............... UHN  
LP filters to ITU-T O.171 plus 2 Mb/s wander and estimated frame slip measurement.  
1
2
STM-1e line jitter and PDH (tributary) jitter; rms, peak-to-peak, auto jitter transfer ...................... A3L  
and wander measurement: 155 Mb/s electrical interface with HP1, HP2, LP and 12 kHz HP  
filters to ITU-T O.171/G.825.  
STM-1o/STM-1e, plus all the capability of option A3L. ............................................................................. A3V  
STM-4o/STM-1o/STM-1e, plus all the capability of option A3L. ............................................................ A3N  
2
2
† 8 and 140 Mb/s jitter measurement requires a PDH option with 8 and 140 Mb/s  
interface to be fitted  
Opt ion  
code  
No of  
slot s  
Tick  
one  
5. ATM ser vices layer t est opt ions  
Choose one option (if required). As these modules use the interfacing provided by a  
PDH/DSn and ATM test option, must also order ATM option UKN or UKZ (section 1).  
Provides ATM and AAL capabilities including Channel View, rate history,....................................... 0YK†  
graphical CDV, benchmark traffic.  
1
2
As per option 0YK (but occupying two slots) plus native Ethernet LAN .......................................... USL†  
connectivity tests.  
† Option 0YK and USL do not support options A3R and 120 at present.  
Please refer to module interworking section (pages 6 and 7).  
Opt ion  
code  
No of  
slot s  
Tick  
one  
6. PDH binar y int er faces opt ions  
Choose one option (if required). Must also order a PDH and ATM test option (section 1).  
(Option UH3 does not support options UKZ, 0YK or USL at present.)  
PDH NRZ interfaces: Adds binary Tx clock and data, binary Rx clock and data, ........................... UH3†  
plus external clock input.  
1
3
PDH synthesized BER testing bundle : Includes UH3 (binary clock and data), ................................ 200  
UKK (unstructured BER module) and HP 8647A synthesizer.  
† Option UH3 does not support options UKZ, 0YK and USL at present.  
Please refer to module interworking section (pages 6 and 7).  
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Opt ion  
code  
Tick  
one  
7. Opt ical int er faces opt ions  
Choose one option (if required). All optical interfaces receive at 1310 and  
1550 nm.  
Provides optical interfaces. Must also order STM-0e/STM-1e option A3R (section 2),  
and appropriate optical adaptor options (section 12).  
STM-1 opt ical int er faces only (for testing STM-1 only)*  
155 Mb/s optical interface: 1310 nm, 9 dBm output............................................................................... UH1  
reserved  
optical  
slot  
STM-4/OC-12c t est and opt ical int er faces  
Provides optical interfaces, plus optical power measurement and STM-4 test  
functionality, ie, for STM-4 overhead access. Must also order 52/155 Mb/s  
option A3R or 120 (section 2), and appropriate optical adaptor options (section 12).  
622/155/52 Mb/s optical interfaces: Dual wavelength at 1310 nm, 10 dBm ...................................... 130†  
output plus 1550 nm, 1 dBm output; includes STM-4/OC-12c, overhead access,  
thru mode and optical power measurement.  
622/155/52 Mb/s optical interfaces: 1310 nm, 10 dBm output; includes ........................................... 131†  
STM-4c/OC-12c, overhead access, thru mode and optical power measurement.  
† Option 130/131 does not support option UKZ at present.  
Please refer to module interworking section (pages 6 and 7).  
STM-4 test and optical interfaces  
Provides optical interfaces. Must also order STM-1e option A1T (section 2),  
and appropriate optical adaptor options (section 12).  
622/155 Mb/s optical interfaces: Dual wavelength at 1310 nm, 1550 nm ...................................... USN*  
10 dBm output plus 1550 nm, 1 dBm output; includes overhead access,  
thru mode and optical power measurement.  
622/155 Mb/s optical interfaces: 1310 nm, 10 dBm output;........................................................... UKT*  
includes overhead access, thru mode and optical power measurement  
(easily upgradeable to dual wavelength).  
* Available with ATM options 0YK, USL, UKZ only. When option UKZ (and A1T)  
are present, these interfaces also provide OC-3c capability.  
Opt ion  
code  
No of  
slot s  
Tick if  
r equir ed  
8. SONET/SDH binar y int er faces opt ion  
Choose if required. Must also order STM-4 test and optical interfaces  
option 130 or 131 (section 7).  
622/155 Mb/s NRZ interfaces. 50 ohm ECL Tx data and Tx clock outputs, plus................................ 0YH  
1
Rx data and Rx clock inputs.  
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Opt ion  
code  
No of  
slot s  
Tick if  
r equir ed  
9. Mult iple PDH int er faces opt ion  
Choose if required. Must also order a PDH and ATM test and interface option  
UKK, UKJ or UKN (section 1).  
Three additional 2, 8, 34 and 140 Mb/s outputs. ......................................................................................... UHC  
1
Opt ion  
code  
Tick  
one  
10. Remot e-cont r ol/ext er nal-pr int er int er faces opt ions  
Choose one option (if required).  
RS-232-C and HP-IB remote-control/external-printer interfaces. ......................................................... A3D  
reserved  
remote  
slot  
LAN remote control, RS-232-C and HP-IB remote-control/external-printer interfaces. ..................A3B  
Opt ion  
code  
Tick if  
r equir ed  
11. Pr int er opt ion  
Choose if required.  
Integrated, full-width, 80-column graphics printer (for printing of graphics, ................................... UKX  
Uses lid  
results and screen dumps).  
Opt ion  
code  
Tick as  
r equir ed  
12. Opt ical adapt or opt ions  
If specifying an SDH optical interface and/or wander and jitter measurements,  
choose the connector adaptor type(s) to suit your particular requirements:  
FC/PC ................................................................................................................................................................... UH4  
DIN47526 ............................................................................................................................................................. UH5  
ST .......................................................................................................................................................................... UH6  
Biconic ................................................................................................................................................................. UH7  
NEC D4 ................................................................................................................................................................ UH8  
SC .......................................................................................................................................................................... UKP  
HMS-10/HP .......................................................................................................................................................... UKQ  
Not  
applicable  
Opt ion  
code  
Tick if  
r equir ed  
13. DNA  
Choose if required. Must also order a remote-control/external printer interface  
(see section 10).  
Allows the instrument to be used with HP E4540A distributed network analyzer ...........................USS  
software* for Windows®. Software allows remote, interactive control for  
centralized testing.  
Not  
applicable  
* For full details of centralized testing using the HP 37717C analyzer and other  
telecom testers from HP, please ask your local HP representative for  
brochure 5964-2240E (distributed network analyzer software).  
11  
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Ot her opt ions and accessories  
For more information about Hewlett-  
Packard test & measurement products,  
applications, services, and for a current  
sales office listing, visit our web site,  
contact one of the following centers and  
ask for a test and measurement sales  
representative.  
Opt ical coupler  
Gr aphics pr int er paper  
HP15744A: Optical coupler.*  
Pr int er paper : Part number 9270-1360.  
*Order the appropriate option. For full  
details of the HP 15744A optical  
coupler, please ask your local HP  
representative for a brochure.  
The optical coupler and graphics  
printer (option UKX) cannot both be  
fitted at the same time.  
Warrant y  
3-year warranty as standard.  
United States:  
Hewlett-Packard Company  
Test and Measurement Call Center  
P.O. Box 4026  
Englewood, CO 80155-4026  
1 800 452 4844  
Manuals and calibr at ion  
cer t ificat e  
HP 15722A: Telephone handset for  
options UKJ or UKN.  
Opt ion AVA: Calibration manual.  
Opt ion OB2: One additional operating  
manual.  
Opt ion OBF: One additional remote  
operation manual.  
Canada:  
Hewlett-Packard Canada Ltd.  
5150 Spectrum Way  
Mississauga, Ontario  
L4W 5G1  
Fiber opt ic cable  
HP E4545A: 3 m fiber optic cable  
(FC/PC connectors).  
Opt ion UK6: Calibration certificate.  
(905) 206 4725  
Europe:  
St andar ds confor mance  
Hewlett-Packard  
European Marketing Centre  
P. O. Box 999  
1180 AZ Amstelveen  
The Netherlands  
(31 20) 547 9900  
Car r ying cases and r ack  
mount kit  
CE mar k:* The HP 37717C  
communications performance analyzer  
has full CE mark compliance and meets  
the following standards:  
HP 15910B: Soft, vinyl carrying case.  
HP 15772B: Hard, robust transit case.  
HP 15770A: Rack mount kit.  
J apan:  
ESD/mains fast transients/radiated  
susceptibility: meets EN50082-1 (1991).  
Radiation emissions/conducted  
emissions: meets EN55011 (1991).  
Hewlett-Packard Japan Ltd.  
Measurement Assistance Center  
9-1, Takakura-Cho, Hachioji-Shi  
Tokyo 192, Japan  
HP 15777C upgr ade kit  
Enhance the capabilities of the  
HP 37717C analyzer at a later date.  
To order HP 15777C upgrade kit options,  
contact your local HP sales  
representative.  
Tel: (81) 426 56-7832  
Fax: (81) 426 56-7840  
Pr oduct safet y: The HP 37717C  
communications performance analyzer  
meets the following safety standards:  
Latin America:  
Hewlett-Packard  
IEC 348/EN61010.  
Latin American Region Headquarters  
5200 Blue Lagoon Drive  
9th Floor  
Miami, Florida 33126  
USA  
* All products sold in EC and ETSI  
countries must have the CE mark.  
(305) 267 4245/4220  
Fax: (305) 267-4288  
Australia/New Zealand:  
Hewlett-Packard Australia Ltd.  
31-41 Joseph Street  
Blackburn, Victoria 3130  
Australia  
Tel: 1 800 629 485 (Australia)  
Tel: (0800) 738 378 (New Zealand)  
Fax: (61 3) 9210 5489  
Asia Pacific:  
Hewlett-Packard Asia Pacific Ltd.  
17-21/F Shell Tower, Times Square  
1 Matheson Street, Causeway Bay  
Hong Kong  
Tel: (852) 2599 7777  
Fax: (852) 2506 9285  
MS Windows is a US trademark of Microsoft Corporation.  
HP manufactures the HP 37717C communications performance analyzer under  
a quality system approved to the international standard ISO 9001 plus TickIT  
(BSI Registration Certificate No FM 10987).  
© Hewlett-Packard Limited 1997  
Printed in USA  
Data subject to change  
5966-4163E (02/98)  
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