Agilent 35670A Service Guide
Agilent Part Number 35670-90066
Printed in Malaysia
Print Date: March 2001
Copyright © Agilent Technologies, Inc., 1992-1995,2000, 2001.
All rights reserved.
8600 Soper Hill Road Everett, Washington 98205-1209 U.S.A.
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Agilent 35670A Front Panel
1-Use the softkeys to select items from the current menu. A softkey’s function is indicated by a video label on the analyzer’s screen.
Throughout this book, softkeys are printed like this: [
].
FFT ANALYSIS
Hardkeys are front-panel buttons whose functions are always the same. They have a label printed directly on the key itself.
Throughout this book, hardkeys are printed like this: [ ].
Inst Mode
2-The analyzer’s screen is divided into the menu area and the display area. The menu area displays video labels for the softkeys. The
data area displays measurement data and information about the parameter settings.
3-The [
] key returns the menu to the previous level.
Rtn
4 -The POWER switch turns on the analyzer.
5 -Use the SYSTEM keys to control various system-level functions. These functions include saving files, plotting measurement data,
and accessing online help.
6 -Use the disk drive to save your work on 3.5 inch flexible disks.
7-The knob moves the markers and the cursor. It also steps through numeric values and scrolls through online help.
8 -Use the DISPLAY keys to control what appears on the analyzer’s traces. They only affect how data is displayed; DISPLAY keys
do not change measurement parameters. You can press keys in the DISPLAY menus without losing measurement parameters.
9 -Use the MARKER keys to select a variety of marker features.
10-Use the MEASUREMENT keys to control the analyzer’s source and inputs. They also control measurement parameters. You
must make a new measurement if you change a MEASUREMENT parameter.
11-Use the numeric-entry keys to enter a numeric value.
12-The microphone power connector provides power (8 Vdc) for the Microphone Adapter Kit (Option UK4).
13-The connector area of the front panel has two different configurations. The standard analyzer has a source output connector and
two input connectors. The 4-channel analyzer (Option AY6) has four input connectors.
Range indicators are located next to each input connector. The upper LED is the over-range indicator (the signal level exceeds the
current range setting). The lower LED is the half range indicator (the signal level exceeds half the current range setting).
14-A source on/off indicator is located at the left edge of the connector area.
The standard Agilent 35670A (2-channel) has a source connector on the front panel.
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The Agilent 35670A at a Glance (Rear Panel)
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Agilent 35670A Rear Panel
1-The GPIB connector links the Agilent 35670A to other GPIB devices. GPIB parameters are set in the [
] and
Local/GPIB
[
] menus.
Plot/Print
2-The SERIAL PORT and the PARALLEL PORT link the analyzer to plotters and printers. These parameters are set in the
] menu.
[
Plot/Print
3-The SOURCE connector outputs the analyzer’s source signal. An LED on the front panel indicates if the source is on or off. The
source parameters are set in the [ ] menu.
Source
The standard Agilent 35670A (2-channel) also has a source connector on the front panel.
4-The EXT TRIG connector links the analyzer to an external trigger signal. The external trigger parameters are set in the [
menu.
]
Trigger
5-The TACH connector links the analyzer to a tachometer. The tachometer parameters are set in the [
6-The KEYBOARD connector attaches an optional keyboard to the analyzer.
7-The DC POWER connector accepts DC power levels from 12 - 28 Vdc (nominal).
8-The AC POWER connector accept a wide range of ac voltage levels.
] menu.
Input
9-The POWER SELECT switch determines whether the analyzer is powered via the AC POWER connector or the DC POWER
connector.
10-The EXT MONITOR port links the analyzer to multi-sync monitors.
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Saftey Summary
The following general safety precautions must be observed during all phases of
operation of this instrument. Failure to comply with these precautions or with
specific warnings elsewhere in this manual violates safety standards of design,
manufacture, and intended use of the instrument. Agilent Technologies, Inc.
assumes no liability for the customer’s failure to comply with these
requirements.
GENERAL
This product is a Safety Class 1 instrument (provided with a protective earth
terminal). The protective features of this product may be impaired if it is used in
a manner not specified in the operation instructions.
All Light Emitting Diodes (LEDs) used in this product are Class 1 LEDs as per
IEC 60825-1.
ENVIRONMENTAL CONDITIONS
This instrument is intended for indoor use in an installation category II, pollution
degree 2 environment. It is designed to operate at a maximum relative humidity
of 95% and at altitudes of up to 2000 meters. Refer to the specifications tables
for the ac mains voltage requirements and ambient operating temperature range.
BEFORE APPLYING POWER
Verify that the product is set to match the available line voltage, the correct fuse
is installed, and all safety precautions are taken. Note the instrument’s external
markings described under Safety Symbols.
GROUND THE INSTRUMENT
To minimize shock hazard, the instrument chassis and cover must be connected
to an electrical protective earth ground. The instrument must be connected to
the ac power mains through a grounded power cable, with the ground wire
firmly connected to an electrical ground (safety ground) at the power outlet.
Any interruption of the protective (grounding) conductor or disconnection of
the protective earth terminal will cause a potential shock hazard that could
result in personal injury.
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FUSES
Only fuses with the required rated current, voltage, and specified type (normal
blow, time delay, etc.) should be used. Do not use repaired fuses or
short-circuited fuse holders. To do so could cause a shock or fire hazard.
DO NOT OPERATE IN AN EXPLOSIVE ATMOSPHERE
Do not operate the instrument in the presence of flammable gases or fumes.
DO NOT REMOVE THE INSTRUMENT COVER
Operating personnel must not remove instrument covers. Component
replacement and internal adjustments must be made only by qualified service
personnel.
Instruments that appear damaged or defective should be made inoperative and
secured against unintended operation until they can be repaired by qualified
service personnel.
WARNING
Caution
The WARNING sign denotes a hazard. It calls attention to a procedure,
practice, or the like, which, if not correctly performed or adhered to,
could result in personal injury. Do not proceed beyond a WARNING
sign until the indicated conditions are fully understood and met.
The CAUTION sign denotes a hazard. It calls attention to an operating
procedure, or the like, which, if not correctly performed or adhered to, could
result in damage to or destruction of part or all of the product. Do not proceed
beyond a CAUTION sign until the indicated conditions are fully understood and
met.
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Safety Symbols
Warning, risk of electric shock
Caution, refer to accompanying documents
Alternating current
Both direct and alternating current
Earth (ground) terminal
Protective earth (ground) terminal
Frame or chassis terminal
Terminal is at earth potential.
Standby (supply). Units with this symbol are not completely disconnected from ac mains when
this switch is off
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Accessories
The accessories listed in the following table are supplied with the
Agilent 35670A.
Supplied Accessories
Part Number
Line Power Cable
See page 2-4
Standard Data Format Utilities
HP 5061-8042
Agilent 35670A Operator’s Guide
Agilent 35670A Quick Start
Agilent 35670-90053
Agilent 35670-90056
Agilent 35670-90054
Agilent 35670-90057
Agilent 5960-5708
Agilent 35670-90048
Agilent 35670A Installation and Verification Guide
Agilent 35670A GPIB Command Reference
GPIB Programmer’s Guide
Agilent 35670A GPIB Commands: Quick Reference
The accessories listed in the following table are available for the
Agilent 35670A.
Available Accessories
Part Number
HP 35250A
HP 35251A
HP 92192A
Agilent 35670-90049
HP E2083-90000
HP 2225A
DC Power Cable, 3 meter
DC Power Cable with Cigarette Lighter Adapter
Box of ten 3.5-inch double-sided, double-density disks
Using Instrument BASIC with the Agilent 35670A
Instrument BASIC User’s Handbook
HP Thinkjet Printer
HP Quietjet Printer
HP 2227A
HP Jet Paper, 2500 sheets
HP 92261N
HP 10833A
HP 10833B
HP 10833C
HP 10833D
GPIB Cable, 1 meter
GPIB Cable, 2 meter
GPIB Cable, 4 meter
GPIB Cable, 0.5 meter
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In This Book
This guide provides instructions for installing, verifying performance, and repairing
the Agilent 35670A Dynamic Signal Analyzer.
Chapter 1, ‘’Specifications,’’ lists the specifications for the Agilent 35670A and the
specifications for the required test equipment.
Chapter 2, ‘’Preparing the Analyzer for Use,’’ provides step-by-step instructions for
getting the analyzer ready to use and instructions on cleaning the screen, storing, and
transporting.
Chapter 3, ‘’Verifying Specifications,’’ provides step-by-step instructions for
installing and running the semiautomated performance test software. This chapter also
provides illustrations that show the equipment set up for each test and a copy of the
test records.
Chapter 4, ‘’Troubleshooting the Analyzer,’’ provides step-by-step instructions for
isolating most failures to the faulty assembly.
Chapter 5, ‘’Adjusting the Analyzer,’’ provides step-by-step instructions for adjusting
the analyzer.
Chapter 6, ‘’Replacing Assemblies,’’ provides step-by-step instructions to follow
before and after replacing an assembly. This chapter also provides step-by-step
instructions for disassembling the analyzer.
Chapter 7, ‘’Replaceable Parts,’’ provides ordering information and lists the
replaceable parts.
Chapter 8, ‘’Circuit Descriptions,’’ provides the overall instrument description and
individual assembly descriptions.
Chapter 9, ‘’Voltages and Signals,’’ shows where the signals and voltages are used in
the analyzer and describes each signal.
Chapter 10, ‘’Internal Test Descriptions,’’ describes the power-on test, calibration
routine, fault log messages, and self tests.
Chapter 11, ‘’Backdating,’’ provides information necessary to modify this manual for
instruments that differ from those currently being produced.
Chapter 12, ‘’Quick Reference,’’ shows assembly locations, cable connections, and all
the block diagrams.
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Table of Contents
1 Specifications
Frequency 1-3
Single Channel Amplitude 1-4
FFT Dynamic Range 1-5
Input Noise 1-6
Window Parameters 1-6
Single Channel Phase 1-6
Cross Channel Amplitude 1-7
Cross Channel Phase 1-7
Input 1-8
Time Domain 1-9
Trigger 1-9
Tachometer 1-10
Source Output 1-11
Digital Interfaces 1-12
General Specifications 1-13
Order Tracking — Option 1D0 1-14
Swept Sine Measurements —Option 1D2 1-15
Arbitrary Waveform Source—Option 1D4 1-15
Real Time Octave Analysis — Option 1D1 1-16
Recommended Test Equipment 1-17
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2 Preparing the Analyzer for Use
To do the incoming inspection 2-5
To install the analyzer 2-7
To connect the analyzer to a dc power source 2-8
To change the fuses 2-10
To connect the analyzer to a serial device 2-11
To connect the analyzer to a parallel device 2-11
To connect the analyzer to an GPIB device 2-12
To connect the analyzer to an external monitor 2-13
To connect the optional keyboard 2-14
To connect the microphone adapter 2-16
To clean the screen 2-17
To store the analyzer 2-17
To transport the analyzer 2-18
If the analyzer will not power up 2-19
If the analyzer operates intermittently on dc power 2-20
3 Verifying Specifications
To load the program 3-7
To run the program in semiautomated mode 3-8
To run the program without a printer 3-10
To run the program in manual mode 3-12
To set up the self test 3-13
To set up the dc offset test 3-14
To set up the noise test 3-15
To set up the spurious signals test 3-16
To set up the amplitude accuracy test 3-17
To set up the flatness test 3-18
To set up the amplitude linearity test 3-19
To set up the A-weight filter test 3-20
To set up the channel match test 3-21
To set up the frequency accuracy test 3-22
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To set up the anti-alias filter test 3-23
To set up the input coupling test 3-24
To set up the harmonic distortion test 3-25
To set up the intermodulation distortion test 3-28
To set up the cross talk test 3-30
To set up the single channel phase accuracy test 3-34
To set up the external trigger test 3-35
To set up the tach function test 3-37
To set up the input resistance test 3-39
To set up the ICP supply test 3-41
To set up the source amplitude accuracy test 3-45
To set up the source output resistance test 3-46
To set up the source dc offset test 3-48
To set up the source flatness test 3-49
To set up the source distortion test 3-50
Measurement Uncertainty 3-56
Performance Test Record - Two Channel 1 of 14
Performance Test Record - Four Channel 1 of 20
Operation Verification Test Record - Two Channel 1 of 10
Operation Verification Test Record - Four Channel 1 of 15
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4 Troubleshooting the Analyzer
How to troubleshoot the analyzer 4-4
To perform initial verification 4-5
To troubleshoot the power supply 4-11
To troubleshoot power-up failures 4-15
To troubleshoot CPU, memory, and buses failures 4-18
To troubleshoot display failures 4-22
To troubleshoot IIC bus failures 4-25
To troubleshoot fast bus failures 4-29
To perform self tests 4-31
To troubleshoot self-test lockup failures 4-37
To troubleshoot intermittent failures 4-40
To troubleshoot performance test failures 4-42
To troubleshoot source and calibrator failures 4-45
To troubleshoot input and ADC failures 4-51
To troubleshoot input failures on four channel analyzers 4-54
To troubleshoot distortion failures 4-56
To troubleshoot disk drive failures 4-57
To troubleshoot auto-range failures 4-59
To troubleshoot DIN connector failures 4-61
To troubleshoot trigger failures 4-62
To troubleshoot memory battery failures 4-67
To troubleshoot microphone power and adapter failures 4-69
To troubleshoot tachometer failures 4-70
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5 Adjusting the Analyzer
To adjust the frequency reference 5-5
To adjust the source 5-6
To adjust the ADC gain, offset and reference 5-7
To adjust the input dc offset 5-10
To adjust common mode rejection 5-13
To adjust filter flatness 5-17
To adjust the display voltage 5-21
6 Replacing Assemblies
What to do before replacing the CPU assembly 6-3
What to do after replacing an assembly 6-4
To remove cover 6-6
To remove rear panel 6-7
To remove front panel 6-8
To remove disk drive 6-10
To remove CPU 6-11
To remove NVRAM 6-12
To remove memory 6-13
To remove power supply 6-14
To remove motherboard 6-16
To remove dc-dc converter 6-18
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7 Replaceable Parts
Ordering Information 7-2
Assemblies 7-4
Cables 7-6
Instrument Covers and Handles 7-7
Assembly Covers and Brackets 7-8
Front Panel Parts 7-9
Rear Panel Parts 7-10
Chassis Parts 7-11
Screws, Washers, and Nuts 7-12
Miscellaneous Parts 7-12
Option UK4 Parts 7-13
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8 Circuit Descriptions
Overall Instrument Description 8-2
A1 Input 8-6
A2 Input 8-12
A5 Analog 8-18
A6 Digital 8-22
A7 CPU 8-25
A8 Memory 8-30
A9 NVRAM 8-32
A10 Rear Panel 8-33
A11 Keyboard Controller 8-35
A12 BNC 8-36
A13 Primary Keypad 8-37
A14 Secondary Keypad 8-37
A15 Primary Keypad 8-37
A22 BNC 8-37
A90 Fan 8-38
A98 Power Supply 8-38
A99 Motherboard 8-39
A100 Disk Drive 8-39
A101 Display 8-39
A102 DC-DC Converter 8-39
Option UK4 Microphone Adapter and Power Supply 8-40
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9 Voltages and Signals
Assembly Locations and Connections 9-3
Power Supply Voltage Distribution 9-6
A1 Input 9-7
A2 Input 9-7
A8 Memory 9-8
A9 NVRAM 9-12
A10 Rear Panel 9-14
A11 Keyboard Controller 9-18
A12 BNC 9-20
A13 Primary Keypad 9-21
A14 Secondary Keypad 9-23
A22 BNC 9-24
A99 Motherboard 9-25
A100 Disk Drive 9-34
A101 Display 9-36
A102 DC-DC Converter 9-37
10 Internal Test Descriptions
Power-on Test Description 10-2
Calibration Routine Description 10-5
Fault Log Messages 10-9
Self-Test Descriptions 10-10
11 Backdating
12 Quick Reference
Index
Guide to Agilent 35670A Documentation
Need Assistance?
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1
Specifications
1-1
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Specifications
This chapter contains the specifications for the Agilent 35670A Dynamic
Signal Analyzer and the critical specifications for the equipment required to
test the Agilent 35670A.
Instrument specifications apply after 15 minutes warm-up and within 2 hours of
the last self-calibration. When the internal cooling fan has been turned OFF,
specifications apply within 5 minutes of the last self-calibration. All
specifications are with 400 line frequency resolution unless stated otherwise.
Four channel instruments are unspecified in the one channel mode where alias
protection filters are not connected.
Abbreviations
dBVrms = dB relative to 1 Volt rms.
dBfs = dB relative to full scale amplitude range. Full scale is approximately 2 dB below ADC
overload.
FS or fs Full scale; synonymous with input range.
Real Time or Online = Refer to the collecting and displaying of information with no dropouts
or missing information.
Rload = Load resistance connected to the analyzer’s source.
Typical = Typical, non-warranted, performance specification included to provide general
product information.
Vpk = Peak of the ac voltage.
1-2
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Agilent 35670A
Specifications
Frequency
Frequency
Maximum range
1 channel mode
2 channel mode
4 channel mode (option AY6 only)
102.4 kHz, 51.2 kHz (option AY6†)
51.2 kHz
25.6 kHz
Spans
1 channel mode
2 channel mode
4 channel mode (option AY6 only)
195.3 mHz to 102.4 kHz
97.7 mHz to 51.2 kHz
48.8 mHz to 25.6 kHz
Minimum resolution
1 channel mode
2 channel mode
4 channel mode (option AY6 only)
122 mHz (1600 line display)
61 mHz (1600 line display)
61 mHz (800 line display)
Maximum real-time bandwidth (FFT span for continuous data acquistion) (preset, fast averaging)
1 channel mode
2 channel mode
4 channel mode (option AY6 only)
25.6 kHz
12.8 kHz
6.4 kHz
Measurement rate (typical) (preset, fast averaging)
1 channel mode
≥70 averages/second (≥170 with 100 line display)
≥33 averages/second
≥15 averages/second
2 channel mode
4 channel mode (option AY6 only)
Display update rate (typical)
(preset, fast average off)
5 updates/second
9 updates/second (single channel, single display,
undisplayed traces set with static data: e.g., data
register)
Accuracy
30 ppm ( 0.003%)
† Option AY6 single channel maximum range extends to 102.4 kHz without anti-alias filter protection.
1-3
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Specifications
Agilent 35670A
Single Channel Amplitude
Single Channel Amplitude
Absolute amplitude accuracy (FFT)
(A combination of full scale accuracy, full
scale flatness, and amplitude linearity.)
2.92% (0.25 dB) of reading
0.025% of full scale
FFT full scale accuracy at 1 kHz (0 dBfs)
0.15 dB (1.74%)
0.2 dB (2.33%)
FFT full scale flatness (0 dBfs) relative to 1
kHz
FFT amplitude linearity at 1 kHz
Measured on +27 dBVrms range with time
average, 0 to −80 dBfs.
0.58% (0.05 dB) of reading
0.025% of full scale
Amplitude resolution (16 bits less 2 dB over-range) 0.0019% of full scale (typical)
with averaging
Residual dc response
FFT mode frequency display
(excludes A-weight filter)
<−30 dBfs or -66dBVdc (0.5 mVdc) (whichever is
greater)
1-4
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Agilent 35670A
Specifications
FFT Dynamic Range
FFT Dynamic Range
Spurious free dynamic range
<−80 dBfs (90 dB typical)
(Includes spurs, harmonic distortion,
intermodulation distortion, alias products)
Excludes alias responses at extremes of span.
Source impedance = 50 Ω
FFT noise floor (typical)
Flat top window, 64 RMS averages
Harmonic distortion
<−80 dBfs
<−80 dBfs
Single tone (in band), ≤0 dBfs
Post-filter harmonic distortion (alias
responses) of a single tone ≤102.4 kHz, ≤0
dBfs
Intermodulation distortion
<−80 dBfs
<−80 dBfs
Two tones (in-band), each ≤−6.02 dBfs
Spurious and residual responses
Source impedance = 50 Ω
Frequency alias responses
Single tone (out of displayed range),
≤0 dBfs, ≤1 MHz (≤200 kHz with ICP on)
2.5% to 97.5% of the frequency span
Lower and upper 2.5% of frequency span
<−80 dBfs
<−65 dBfs
1-5
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Specifications
Input Noise
Agilent 35670A
Input Noise
Input noise level
Flat top window, −51 dBVrms range, source impedance = 50 Ω, 32 rms averages
—
Above 1280 Hz
160 Hz to 1.28 kHz (6.4 kHz span)
<–140 dBVrms/√Hz
—
<–130 dBVrms/√Hz< % 0
>
Note: To calculate noise as dB below full scale:
Noise [dBfs] = Noise [dBVrms/ Hz] + 10LOG(NEBW) – Range [dBVrms].
See ‘’Window Parameters,’’ below, for noise equivalent bandwidths (NEBW).
Window Parameters
Uniform
Hann
Flat Top
0.125% of span 0.185% of span 0.450% of span
0.125% of span 0.1875% of span 0.4775% of span
−3 dB bandwidth †
Noise equivalent bandwidth †
4.0 dB
716
1.5 dB
9.1
0.01 dB
2.6
Attenuation at 1/2 bin
Shape factor (−60 dB BW/−3 dB BW)
† For 800 line displays. With 400, 200, or 100 line displays, multiply bandwidths by 2, 4, and 8,
respectively. With 1600 line displays (only available in 1 or 2 channel mode), divide bandwidths by 2.
Single Channel Phase
Phase accuracy relative to external trigger
16 RMS averages, center of bin, dc coupled,
0 dBfs to −50 dBfs, 0 Hz < freq ≤ 10.24 kHz only
4.0 degree
For Hann and flat top windows, phase is referenced to a cosine wave at the center of the time
record. For the uniform, force, and exponential windows, phase is referenced to a cosine wave
at the beginning of the time record.
1-6
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Agilent 35670A
Specifications
Cross Channel Amplitude
Cross Channel Amplitude
FFT cross channel gain accuracy
Frequency response mode, same amplitude range
(AC coupled, Peroidic Chirp, Uniform Window, > =4Hz)
At full scale: Tested with 10 rms averages
on the −11 to +27 dBvrms ranges, and 100 rms
averages on the −51 dBVrms range
0.04 dB (0.46%)
At −20 dBfs: Tested with 200 rms averages on
the −11 to +27 dBVrms ranges, and 2000 rms
averages on the −51 dBVrms range
0.08 dB (0.92%)
Cross Channel Phase
Cross channel phase accuracy
(same conditions as cross-channel amplitude
>=12Hz)
0.5 degree
1-7
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Specifications
Input
Agilent 35670A
Input
Input ranges
(full scale) (auto-range capability)
+27 dBVrms (31.7 Vpk) to −51 dBVrms
(3.99 mVpk) in 2 dB steps
Maximum input levels
Input impedance
42 Vpk
1 MΩ 10%, 90 pF nominal
Low side to chassis impedance
Floating mode
Grounded mode
1 MΩ 30%, <0.010 µF (typical)
≤100 Ω
AC coupling rolloff
<3 dB rolloff at 1 Hz
Common mode rejection ratio
Single tone at or below 1 kHz
–51 dBVrms to –11 dBVrms ranges
–9 dBVrms to +9 dBVrms ranges
+11 dBVrms to +27 dBVrms ranges
>75 dB typical
>60 dB typical
>40 dB typical
Note: CM dBfs = CM signal input [dBVrms] − CMRR [dB] − range [dBVrms]
Common mode range (floating mode)
Amplitude over-range detection
ICP signal conditioning
4 Vpk
+3 dB typical
Current source
Open circuit voltage
4.25 1.5 mA
+26 to +32 Vdc
A-weight filter
Conforms to ANSI Standard S1.4-1983; and
to IEC 651-1979; 10 Hz to 25.6 kHz
Type 0 Tolerance
Crosstalk <–135 dB below signal or <–80 dBfs of
Between input channels, and source-to-input receiving channel, whichever response is
greater in amplitude
(receiving channel source impedance = 50 Ω)
1-8
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Agilent 35670A
Specifications
Time Domain
Time Domain
Specifications apply in histogram/time mode, unfiltered time display
DC amplitude accuracy
5.0 % fs
<11.4 ms
<16 ms to 1%
<3 %
Rise time of −1 V to 0 V test pulse
Settling time of −1 V to 0 V test pulse
Pulse aberrations (peak overshoot)
of −1 V to 0 V test pulse
Peak aberration relative to the mode-to-mode
difference (most common values)
Sampling period
1 channel mode
2 channel mode
4 channel mode (option AY6 only)
3.815 ms (1/262144 Hz) to 2 s in 2× steps
7.629 ms (1/131072 Hz) to 4 s in 2× steps
15.26 ms (1/65536 Hz) to 8 s in 2× steps
Trigger
Trigger modes
Internal trigger
External trigger
Source trigger
GPIB trigger
Maximum trigger delay
Post trigger
Pre trigger
8191 seconds
8191 sample periods
No two channels can be further than 7168 samples
from each other.
External trigger maximum input
42 Vpk
External trigger range
Low range
High range
−2 V to +2 V
−10 V to +10 V
External trigger resolution
Low range
High range
15.7 mV
78 mV
1-9
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Specifications
Tachometer
Agilent 35670A
Tachometer
Pulses per revolution
RPM accuracy
0.5 to 2048
100 ppm (0.01%) (typical)
Tachometer level range
Low range
High range
–4 V to +4 V
–20 V to +20 V
Tachometer level resolution
Low range
High range
100 mV
500 mV
Tachometer level accuracy (as a % of
tachometer range setting)
10% of range
Maximum tachometer input level
Minimum tachometer pulse width
Maximum tachometer pulse rate
42 Vpk
600 ns
400 kHz
1-10
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Agilent 35670A
Specifications
Source Output
Source Output
Source types
Sine, random noise, chirp, pink noise, burst
random, burst chirp
Amplitude range
ac: 5 V peak †
dc: 10 V †
† Vacpk + |Vdc| ≤10 V
AC amplitude resolution
2.5 mVpk
0.25 mVpk
Voltage ≥ 0.2 Vrms
Voltage < 0.2 Vrms
DC offset accuracy
15 mV 3% of ( |Vdc| +Vacpk) settings
Pink noise adder
Add 600 mV typical when using pink noise
Output impedance
< 5 Ω
Maximum loading
Current
Capacitance
20 mA peak
0.01 mF
Sine amplitude accuracy at 1 kHz
4% (0.34 dB) of setting
Rload >250 Ω
0.1 Vpk to 5 Vpk
Sine flatness (relative to 1 kHz)
1 dB
0.1 V to 5 V peak, 0 Hz to 102.4 kHz
Harmonic and sub-harmonic distortion and spurious signals (in band)
0.1 Vpk to 5 Vpk sine wave
Fundamental <30 kHz
Fundamental ≥30 kHz
<−60 dBc
<−40 dBc
1-11
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Specifications
Agilent 35670A
Digital Interfaces
Digital Interfaces
External keyboard
Compatible with PC-style 101-key keyboard
model number HP C1405A (#ABA) (DIN
connector) and HP keyboard cable part
number 5081-2249.
GPIB
Conforms to the following standards: IEEE
488.1 (SH1, AH1, T6, TEO, L4, LE0, RS1,
RL1, PP0, DC1, DT1, C1, C2, C3, C12, E2)
IEEE 488.2-1987
Complies with SCPI 1992
Factory set address: 11
Data transfer rate
(REAL 64 Format)
<45 ms for a 401 point trace
300 baud to 9600 baud
Serial port (printing, plotting)
Parallel port (printing, plotting)
1-12
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Agilent 35670A
Specifications
General Specifications
General Specifications
Safety Standards
CSA Certified for Electronic Test and
Measurement Equipment per CSA C22.2, No.
231
This product is designed for compliance to:
UL1244, Fourth Edition
IEC 348, Second Edition, 1978
EMI/RFI Standards
Acoustics
CISPR 11
LpA <55 dB (cooling fan at high speed
setting)
<45 dB (auto speed setting at 25° C)
Fan speed setting of high, automatic, and off are available. The fan off setting can be enabled
for a short period of time, except at higher ambient temperatures where the fan will stay on.
Environmental operating restrictions Operating:
disk in drive
Operating: Storage and
no disk in drive transport
Ambient temperature
4° to 45° C
0° to 55° C
–40° to 70° C
Relative humidity (non-condensing)
minimum
maximum
20%
80% at 32° C
15%
95% at 40° C
5%
95% at 50° C
Vibration (5 - 500 Hz)
Shock
0.6 Grms
5 G
(10 ms 1/2 sine) (10 ms 1/2 sine) (3 ms 1/2 sine)
2.1 Grms
5 G
3.41 Grms
40 G
Maximum altitude
AC power
4600 meters (15,000 feet)
90 Vrms to 264 Vrms (47 to 440 Hz)
350 VA maximum
DC power
12 Vdc to 28 Vdc nominal
200 VA maximum
DC current at 12 V (typical)
10 A (standard)
12 A (4 channel, option AY6)
Warm-up time
Weight
15 minutes
15 kg (33 lb) net
29 kg (64 lb) shipping
Dimensions
(Excluding bail handle and impact cover)
Height: 190 mm (7.5 in)
Width: 340 mm (13.4 in)
Depth: 465 mm (18.3 in)
IEC 801-3 (Radiated Immunity) Performance degradation may occur at Severity Level 2.
1-13
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Specifications
Agilent 35670A
Order Tracking — Option 1D0
Order Tracking — Option 1D0
Max Order×Max RPM
60
≤
Real time (online)
1 channel mode
2 channel mode
4 channel mode
25,600 Hz
12,800 Hz
6,400 Hz
Capture playback †
1 channel mode
2 channel mode
4 channel mode
102,400 Hz
51,200 Hz
25,600 Hz
Specified for
5 ≤ RPM ≤ 60,000 (online), 5 ≤ RPM ≤ 491,519 (capture playback); and
number of orders ≤ 200
† Signals are captured online and then postprocessed in capture playback mode.
Delta order
1/128 to 1/1
Resolution
(maximum order)/(delta order)
≤200
Maximum RPM ramp rate
1000 to 10,000 RPM run up
maximum order = 10
delta order = 0.1
750 RPM/second (typical for real time)
RPM step = 30 (1 channel)
= 60 (2 channel)
= 120 (4 channel)
Order track amplitude accuracy
1 dB (typical)
1-14
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Agilent 35670A
Specifications
Swept Sine Measurements —Option 1D2
Swept Sine Measurements —Option 1D2
Dynamic range
130 dB typical
Default span: 51.2 Hz to 51.2 kHz
Fast average ON, 101 point log sweep
Tested with 11 dBVrms source level at 100 ms
integration (approximately 60 second sweep)
Arbitrary Waveform Source—Option 1D4
Amplitude Range
Arb: 5 Vpk †
dc: 10 V †
† Vpk +|Vdc| ≤10 V
Record Length
Depends on measurement resolution (100,
200, 400, 800, and 1600 lines)
# of points = 2.56 x lines of resolution, or # of
complex points = 1.28 x lines of resolution
Point spacing
Matches the measurement sample rate.
DAC Resolution
0.2828 Vpk to 5 Vpk
<0.2828 Vpk
2.5 mV
0.25 mV
1-15
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Specifications
Agilent 35670A
Real Time Octave Analysis — Option 1D1
Real Time Octave Analysis — Option 1D1
Standards
Conforms to ANSI Standard S1.11 - 1986,
Order 3, Type 1-D, Extended and Optional
Frequency Ranges
Conforms to IEC 651-1979 Type 0 Impulse,
and ANSI S1.4
Frequency ranges (at centers)
Online (real time)
1 channel
2 channel
4 channel
1/1 octave 0.063 Hz to 16 kHz
1/3 octave 0.08 Hz to 40 kHz
1/12 octave 0.0997 Hz to 12.338 kHz 0.0997 Hz to 6.169 kHz 0.0997 Hz to 3.084 kHz
0.063 Hz to 8 kHz
0.08 Hz to 20 kHz
0.063 Hz to 4 kHz
0.08 Hz to 10 kHz
Capture playback
1 channel
2 channel
4 channel
1/1 octave 0.063 Hz to 16 kHz
1/3 octave 0.08 Hz to 31.5 kHz
0.063 Hz to 16 kHz
0.08 Hz to 31.5 kHz
1/12 octave 0.0997 Hz to 49.35 kHz 0.0997 Hz to 49.35 kHz 0.0997 Hz to 49.35 kHz
0.063 Hz to 16 kHz
0.08 Hz to 31.5 kHz
1 to 12 octaves can be measured and
displayed.
1/1, 1/3, and 1/12 octave true center frequencies related by the formula:
(
)
f i+1
( )
f i
= 21 n ;n =1, 3 or 12;
(1/24)
Where 1000 Hz is the reference for 1/1, 1/3 octave, and 1000 x2
1/12 octave. The marker returns the ANSI standard preferred frequencies.
Hz is the reference for
Accuracy
1 second stable average
single tone at band center
0.2 dB
Readings are taken from the linear total power spectrum bin. It is derived from sum of each
filter.
1/3 octave dynamic range
2 second stable average, limited by input noise
level
>80 dB (typical) per ANSI S1.11 - 1986
1-16
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Agilent 35670A
Specifications
Recommended Test Equipment
Recommended Test Equipment
The following table lists the recommended equipment needed to test the performance
of the Agilent 35670A Dynamic Signal Analyzer. The table on page 1-20 lists
additional equipment needed to adjust and troubleshoot the analyzer. Other equipment
may be substituted for the recommended model if it meets or exceeds the listed critical
specifications. When substitutions are made, you may have to modify the procedures
to accommodate the different operating characteristics.
Recommended Test Equipment
Instrument
Critical Specifications
Recommended Model
AC Calibrator
10 Hz to 102.4 kHz; 1 mV to 10 V
Amplitude
Fluke 5700A †
Alternate
Fluke 5200A †
Datron 4200, 4700, or 4708 ‡
HP 745A
Amplitude Accuracy: 0.1% phase locking
capability
Frequency
Synthesizer
Frequency Range: 10 Hz to 1 MHz
Frequency Accuracy: ≤5 ppm
Amplitude Accuracy:
HP 3326A
Alternate
(2) HP 3325A/B Opt 001
0.2 dB from 1 Hz to 100 kHz
1 dB from 100 kHz to 1 MHz
Harmonic Distortion: ≤–70 dBc
Spurious: ≤–70 dBc
< 1 deg phase shift between output and
sync
Low Distortion Frequency Range: 10 Hz to 100 kHz
Oscillator
HP 339A ††
Alternate
Harmonic Distortion: ≤–93 dB, 10 Hz to
20 kHz
HP 3326A with notch filter ††
HP 3325A/B with notch
filter††
Digital
Multimeter
5 1/2 digit True rms ac Voltage:
30 Hz to 100 kHz; 0.1 to 500 V; 0.1%;
≥1 MΩ input impedance dc Voltage:
1 V to 300 V; 0.1%
HP 3458A
Alternate
HP 3456A , HP 3455A
HP 3478A
Feedthrough
Termination (2)
(4 for option
AY6)
Pomona Elect Model 4119-50
‡‡
Alternate
50 Ω: 2% at dc
HP 11048C, HP 10100C
† John Fluke Manufacturing Co., Inc., PO Box C9090, Everett, WA 98206 U.S.A. (206) 347-6100
‡ Wavetek, 5808 Churchman Bypass, Indianapolis, IN 46203 U.S.A.
†† This equipment is not required for Operation Verification. The parts and schematic for the notch
filter are shown on page 1-19.
‡‡ ITT Pomona Electronics, 1500 East Ninth Street, Pomona, CA 91769 U.S.A. (714) 469-2900
FAX (206) 629-3317
1-17
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Specifications
Agilent 35670A
Recommended Test Equipment
Recommended Test Equipment (continued)
Instrument
Critical Specifications
Recommended Model
Cables
BNC-to-Dual Banana
(6) BNC-to-BNC 30 cm
BNC-to-BNC 122 cm
HP 11001-60001
HP 8120-1838
HP 8120-1840
Adapters
BNC(m)-to-Dual Banana Plug
BNC(f)-to-Dual Banana Plug
BNC(f)-to-BNC (f)
HP 10110B
HP 1251-2277
HP 1250-0080
HP 1250-0781
(4) BNC Tee (m)(f)(f)
Resistor (2)†
HP 0757-0280
Value: 1 kΩ
Accuracy: 1%
Power: 0.25W
† See the following for suggested assembly.
Suggested Assembly for Series Resistor
The following is a suggested assembly for the 1 kΩ series resistor. Two 1 kΩ
series resistors are required for the Intermodulation Distortion performance
test.
• Cut resistor leads to 12 mm on each end.
• Solder one resistor lead to the center conductor of the BNC female connector.
• Solder the conductor center pin to the other lead of the resistor.
• Screw the sleeve and the BNC male connector into place. Tighten securely.
1-18
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Agilent 35670A
Specifications
Recommended Test Equipment
Schematic and Parts List for Notch Filter
The Harmonic Distortion performance test requires either an HP 339A or an
HP 3326A or HP 3325A/B with notch filter. The following shows the schematic and
parts list for the notch filter.
Reference
Description
Agilent Part
Number
C1 - C4
R1 - R2
R3
HP 0160-6809
HP 0698-4421
HP 0698-4407
HP 2100-3409
0.025 µF 2.5%, 100 V polypropelene-metalized
249 Ω 1% metal film, 0.125 W
118 Ω 1% metal film, 0.125 W
20 Ω trimmer, 1 turn
R4 - R6
1-19
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Specifications
Agilent 35670A
Recommended Test Equipment
Additional Recommended Test Equipment
Instrument
Critical Specifications
Recommended Model
Frequency Counter
Frequency Range: 0 Hz to 100 MHz
Frequency Accuracy: 7.5 ppm or better
at 20 MHz
HP 5350B
Alternate
HP 5351B, HP 5335A
Oscilloscope
Bandwidth: >50 MHz
Two Channel; External Trigger; 1 MΩ
Input
HP 54111D
Alternate
HP 1980B, HP 1740
Oscilloscope Probe
HP 10431A
HP 10438A
Impedance: ≥1 MΩ
Division Ratio: 10:1
Maximum Voltage: ≥20 Vdc
Oscilloscope Probe
Spectrum Analyzer
Impedance: ≥ 1 MΩ
Division Ratio: 1:1
Frequency Range: 10 Hz to 100 kHz
HP 3562A
Alternate
Dynamic Range: ≥70 dB
HP 3561A, HP
3585A/B
Logic Probe
TTL
HP 545A
Alternate
HP 5006A,
HP5005A/B
Patch Cord
Cable
Minigrabber test clips
BNC(m)-to-SMB(f)
SMB(m)-to-SMB(m)
Pomona 3781-8-7
HP 03585-61616
HP 1250-0669
Adapter
1-20
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Preparing the Analyzer for Use
This chapter contains instructions for inspecting and installing the
Agilent 35670A Dynamic Signal Analyzer. This chapter also includes
instructions for cleaning the screen, transporting and storing the analyzer.
DC Power Requirements
The analyzer can operate from a dc power source supplying a true range of 10.8
to 30.8 Vdc. With all options installed, power consumption is less than
200 VA. The following table shows typical current requirements at different
operating voltages for the standard two-channel analyzer and for the optional
four-channel analyzer.
Operating
Voltage
Typical Current
Standard 2 channel
Agilent 35670A
Optional 4 channel Agilent 35670A
12 Vdc
24 Vdc
8.0 amps
4.0 amps
11.0 amps
5.5 amps
AC Power Requirements
The analyzer can operate from a 47 to 440 Hz, single-phase, ac power source
supplying 90 to 264 Vrms. With all options installed, power consumption is
less than 350 VA.
Warning
Only a qualified service person, aware of the hazards involved, should measure
the line voltage.
2-2
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Agilent 35670A
Preparing the Analyzer for Use
DC Power Cable and Grounding Requirements
The negative side of the dc input connector is not connected to chassis ground.
In dc mode operation, the chassis will float. The chassis ground lug on the rear
panel and the negative side of the dc input connector should both be connected
to a known reference potential.
Two dc power cables are available—the HP 35250A dc power cable and the
HP 35251A dc power cable with cigarette lighter adapter. Both cables contain
a 30 amp, 32 volt fuse (HP 2110-0920).
Warning
The tip of the cigarette lighter adapter may get hot during use. After unpluging
the adapter, be careful of the heat from the adapter’s tip.
Caution
Although shorter cables may reduce dc voltage loss, use the standard cables. The dc
inrush current may pit the connector contacts in shorter cables.
AC Power Cable and Grounding Requirements
On the GPIB connector, pin 12 and pins 18 through 24 are tied to chassis
ground and the GPIB cable shield. The instrument frame, chassis, and covers
are connected to chassis ground. The input BNCs are floating unless ground
mode is selected.
The analyzer is equipped with a three-conductor power cord that grounds the
analyzer when plugged into an appropriate receptacle. The type of power cable
plug shipped with each analyzer depends on the country of destination. The
following figure shows available power cables and plug configurations.
2-3
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Preparing the Analyzer for Use
Agilent 35670A
*The number shown for the plug is the industry identifier for the plug only, the number shown for the
cable is an HP part number for a complete cable including the plug.
**UL listed for use in the United States of America.
Warning
The power cable plug must be inserted into an outlet provided with a protective
earth terminal. Defeating the protection of the grounded analyzer cabinet can
subject the operator to lethal voltages.
2-4
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Agilent 35670A
Preparing the Analyzer for Use
To do the incoming inspection
To do the incoming inspection
The Agilent 35670A Dynamic Signal Analyzer was carefully inspected both
mechanically and electrically before shipment. It should be free of marks or scratches,
and it should meet its published specifications upon receipt.
• Inspect the analyzer for physical damage incurred in transit. If the analyzer
was damaged in transit, do the following:
• Save all packing materials.
• File a claim with the carrier.
• Call your Agilent Technologies sales and service office.
Warning
If the analyzer is mechanically damaged, the integrity of the protective earth
ground may be interrupted. Do not connect the analyzer to power if it is
damaged.
• Check that the POWER SELECT switch on the analyzer’s rear panel is set to
the AC position.
The switch is in the AC position when in the ‘’in’’ position.
2-5
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Preparing the Analyzer for Use
To do the incoming inspection
Agilent 35670A
• Check that the correct fuses are installed in the fuse holders.
An 8 amp, 250 volt, normal blow fuse is required for ac operation. A 30 amp, 32 volt,
normal blow fuse is required for dc operation. Both fuses are installed at the factory.
For instructions on removing the fuses or fuse part numbers, see ‘’To change the
fuses.’’
• Using the supplied power cord, connect the analyzer to an appropriate
receptacle.
The analyzer is shipped with a three-conductor power cord that grounds the analyzer
when plugged into an appropriate receptacle. The type of power cable plug shipped
with each analyzer depends on the country of destination.
• Set the analyzer’s power switch to on.
Press the switch located on the analyzer’s lower left-hand corner. The switch is in the
on ( l ) position when in the ‘’in’’ position. The analyzer requires about 20 seconds to
complete its power-on routine.
• Test the electrical performance of the analyzer using the operation verification
or the performance tests in chapter 3, ‘’Verifying Specifications.’’
The operation verification tests verify the basic operating integrity of the analyzer;
these tests take about11 2 hours to complete and are a subset of the performance tests.
The performance tests verify that the analyzer meets all the performance
specifications; these tests take about 21 2 hours to complete.
2-6
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Agilent 35670A
Preparing the Analyzer for Use
To install the analyzer
To install the analyzer
The analyzer is shipped with rubber feet and bail handle in place, ready for use as a
portable or bench analyzer.
• Install the analyzer to allow free circulation of cooling air.
Cooling air enters the analyzer through the right side and exhausts through the left side
and rear panel.
• To install the analyzer in an equipment cabinet, follow the instructions shipped with
the rack mount kit.
Warning
To prevent potential fire or shock hazard, do not expose the analyzer to rain or
other excessive moisture.
• Protect the analyzer from moisture and temperatures or temperature changes that cause
condensation within the analyzer.
The operating environment specifications for the analyzer are listed in chapter 1,
‘’Specifications.’’
• Protect the analyzer’s disk drive from dirt and dust.
Remove the screw to the right of the disk drive and use it to attach the supplied disk
drive cover. The disk drive cover is located inside the front-panel impact cover.
Caution
Use of the equipment in an environment containing dirt, dust, or corrosive substances
will drastically reduce the life of the disk drive and the flexible disks. To minimize
damage, use the disk drive cover and store the flexible disks in a dry, static-free
environment.
2-7
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Preparing the Analyzer for Use
Agilent 35670A
To connect the analyzer to a dc power source
To connect the analyzer to a dc power source
In applications requiring a portable dc power source, use a properly protected dc
power system. The dc system should contain a deep cycle battery rather than a
standard automobile battery. A standard automobile battery will fail prematurely if
repeatedly discharged. Also, select a battery that provides the best compromise
between operation time and portability.
• Set the analyzer’s power switch to off ( O ).
• Set the analyzer’s POWER SELECT switch to the DC position.
The switch is in the DC position when in the ‘’out’’ position.
• Connect the dc power cable to the dc power source.
Using the dc power cable (HP 35250A), attach the black cable to the common terminal
and the red cable to the positive terminal of the dc power source. Using the dc power
cable with cigarette lighter adapter (HP 35251A), plug the cigarette lighter adapter into
an automotive cigarette lighter receptacle.
• Connect the analyzer’s ground terminal to the same reference potential as the
common terminal of the dc power source.
Using a wire, connect the analyzer’s GROUND terminal to the common terminal of
the dc source. If you are using the dc power cable with cigarette lighter adapter,
connect the GROUND terminal to the automobile chassis.
• Plug the dc power cable into the analyzer’s DC POWER receptacle. Make sure
to align the red dot on the plug with the red dot on the receptacle.
2-8
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Agilent 35670A
Preparing the Analyzer for Use
To connect the analyzer to a dc power source
• Turn on the dc power source.
If the dc power source is supplied by an automobile, start the automobile. The
automobile must be running to provide adequate dc power.
Warning
The tip of the cigarette lighter adapter may get hot during use. After unpluging
the adapter, be careful of the heat from the adapter’s tip.
• Set the analyzer’s power switch to on ( l ).
If the analyzer will not power up or operates intermittently on dc power, see ‘’If the
analyzer will not power up’’ or ‘’If the analyzer operates intermittently on dc power’’
at the end of this chapter.
2-9
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Preparing the Analyzer for Use
To change the fuses
Agilent 35670A
To change the fuses
Both fuses are installed at the factory.
• Unplug the power cord from the analyzer.
• Press in and turn the appropriate fuse holder cap counter-clockwise (use a
small screw driver for the ac fuse). Remove when the fuse cap is free from the
housing.
• Pull the fuse from the fuse holder cap.
• To reinstall, select the proper fuse and place in the fuse holder cap.
DC Fuse
AC Fuse
HP 2110-0920 30 A 32 V Normal Blow
HP 2110-0342 8 A 250 V Normal Blow
• Place the fuse holder cap in the housing. Press in and turn clockwise.
2-10
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Agilent 35670A
Preparing the Analyzer for Use
To connect the analyzer to a serial device
To connect the analyzer to a serial device
The Serial Port is a 9-pin, EIA-574 port that is only available using option 1C2,
Instrument Basic. The total allowable transmission path length is 50 feet.
• Connect the analyzer’s rear panel SERIAL PORT to a serial device using a 9-pin
female to 25-pin RS-232-C cable.
Part Number
HP 24542G
HP 24542H
Cable Description
9-pin female to 25-pin male RS-232
9-pin female to 25-pin female RS-232
For additional information, see chapter 9 in the Agilent 35670A Service Guide.
To connect the analyzer to a parallel device
The Parallel Port is a 25-pin, Centronics port. The Parallel Port can interface with
PCL printers or HP-GL plotters.
• Connect the analyzer’s rear panel PARALLEL PORT connector to a plotter or printer
using a Centronics interface cable.
Part Number
HP 92284A
HP C2912B
Cable Description
25-pin male to 36-pin male 2-meter Centronics
25-pin male to 36-pin male 3-meter Centronics
For additional information, see chapter 9 in the Agilent 35670A Service Guide.
2-11
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Preparing the Analyzer for Use
Agilent 35670A
To connect the analyzer to an GPIB device
To connect the analyzer to an GPIB device
The analyzer is compatible with the Agilent Technologies Interface Bus (GPIB). The
GPIB is Agilent Technologies’s implementation of IEEE Standard 488.1. Total
allowable transmission path length is 2 meters times the number of devices or 20
meters, whichever is less. Operating distances can be extended using an GPIB
Extender.
GPIB peripherals include HP-GL plotters, PCL printers, and SS-80 external disks.
• Connect the analyzer’s rear panel GPIB connector to an GPIB device using an
GPIB interface cable.
Caution
The analyzer contains metric threaded GPIB cable mounting studs as opposed to
English threads. Use only metric threaded GPIB cable lockscrews to secure the cable
to the analyzer. Metric threaded fasteners are black, while English threaded fasteners
are silver.
For GPIB programming information, see the Agilent 35670A GPIB Programming
Reference.
2-12
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Agilent 35670A
Preparing the Analyzer for Use
To connect the analyzer to an external monitor
To connect the analyzer to an external monitor
The External Monitor connector is a 9-pin D female miniature connector that can
interface with an external, multisync monitor. The monitor must be compatible with
the 24.8 kHz line rate, 55 Hz frame rate, and TTL signals provided by the
Agilent 35670A. A SONY CPD-1302 monitor and a NEC Multisync 3D monitor with
EZPIXpc† driver has been checked and found compatible with the Agilent 35670A
external monitor mode operation.
• Set the analyzer’s power switch to on ( l ).
• Set the monitor’s power switch to on and configure the input and timing mode
if necessary.
See the manual supplied with the monitor for information on configuring the monitor’s
input and timing mode.
• Connect the external monitor’s input cable to the analyzer’s rear panel EXT
MONITOR connector.
A cable with a 9-pin connector option or an adapter to a 9-pin connector is required to
connect the monitor to the Agilent 35670A.
• Press the following keys to enable external mode:
[ Disp Format ]
[ MORE ]
[ MORE ]
[ EXT MON ON OFF ]
Pin Number
Signal Name
Pin Number
Signal Name
HSYNC
VSYNC
GND
3
4
5
R
G
B
8
9
1, 2, 6
† The EZPIXpc driver converts TTL video signals into RGB analog signals, drives 75 ohm coax cable,
provides RGB composite sync or RGB sync on green, for monitors with RGB input capability. EZPIXpc,
Covid, Inc., 1725 West 17th St, Tempe, Arizona 85281, 800-638-6104
2-13
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Preparing the Analyzer for Use
To connect the optional keyboard
Agilent 35670A
To connect the optional keyboard
The analyzer may be connected to an optional external keyboard. The keyboard
remains active even when the analyzer is not in alpha entry mode. This means that
you can operate the analyzer using the external keyboard rather than the front panel.
Pressing the appropriate keyboard key does the same thing as pressing a hardkey or a
softkey on the analyzer’s front panel.
• Set the power switch to off ( O ).
Caution
Do not connect or disconnect the keyboard cable with the line power turned on ( l ).
Connecting or disconnecting the keyboard while power is applied may damage the
keyboard or the analyzer.
• Connect the round plug on the keyboard cable to the KEYBOARD connector
on the analyzer’s rear panel. Make sure to align the plug with the connector
pins.
2-14
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Agilent 35670A
Preparing the Analyzer for Use
To connect the optional keyboard
• Connect the other end of the keyboard cable to the keyboard.
Caution
In addition to the U.S. English keyboard, the Agilent 35670A Dynamic Signal
Analyzer supports U.K. English, German, French, Italian, Spanish, and Swedish. Use
only the Agilent Technologies approved keyboard for this product. Agilent
Technologies does not warrant damage or performance loss caused by a non-approved
keyboard. See the beginning of this guide for part numbers of approved Agilent
Technologies keyboards.
• To configure your analyzer for a keyboard other than U.S. English, press
[
] [
]. Then press the appropriate softkey to
KEYBOARD SETUP
System Utility
select the language.
Configuring your analyzer to use a keyboard other than U.S. English only ensures that
the analyzer recognizes the proper keys for that particular keyboard. Configuring your
analyzer to use another keyboard does not localize the on-screen annotation or the
analyzer’s online HELP facility.
2-15
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Preparing the Analyzer for Use
Agilent 35670A
To connect the microphone adapter
To connect the microphone adapter
The Microphone Adapter and Power Supply (option UK4) simplifies microphone
connections. The mic connector on the analyzer’s front panel provides 8 Vdc to power
the adapter. The adapter’s internal power supply uses a step-up converter to provide
28 V and 200 V on the seven-pin input connectors. The 28 V pins power the
microphone pre-amplifiers. The 200 V pins polarize the condenser microphone
cartridges.
• Flip the bail handle down to support the front of the analyzer.
• Insert the threaded ends of the adapter’s two knurled knobs into the standoffs
on the bottom of the analyzer’s case, then tighten the knobs with your fingers.
• Attach the adapter’s mic cable to mic connector on the analyzer’s front panel.
• Connect the adapter’s BNCs to the corresponding BNCs on the analyzer’s
front panel.
Standard 2 channel Agilent 35670A
Agilent 35670A
Optional 4 channel
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Agilent 35670A
Preparing the Analyzer for Use
To clean the screen
To clean the screen
The analyzer’s display is covered with a plastic diffuser screen (this is not removable
by the operator). Under normal operating conditions, the only cleaning required will
be an occasional dusting. However, if a foreign material adheres itself to the screen,
do the following:
• Set the power switch to off ( O ).
• Remove the power cord.
• Dampen a soft, lint-free cloth with a mild detergent mixed in water.
• Carefully wipe the screen.
Caution
Do not apply any water mixture directly to the screen or allow moisture to go behind
the front panel. Moisture behind the front panel will severely damage the instrument.
To prevent damage to the screen, do not use cleaning solutions other than the above.
To store the analyzer
• Store the analyzer in a clean, dry, and static free environment.
For other requirements, see environmental specifications in chapter 1,
‘’Specifications.’’
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Preparing the Analyzer for Use
To transport the analyzer
Agilent 35670A
To transport the analyzer
• Package the analyzer using the original factory packaging or packaging identical to the
factory packaging.
Containers and materials identical to those used in factory packaging are available
through Agilent Technologies offices.
• If returning the analyzer to Agilent Technologies for service, attach a tag describing
the following:
• Type of service required
• Return address
• Model number
• Full Serial number
• In any correspondence, refer to the analyzer by model number and full serial
number
• Mark the container FRAGILE to ensure careful handling.
• If necessary to package the analyzer in a container other than original packaging,
observe the following (use of other packaging is not recommended):
• Snap the impact cover in place to protect the front panel.
• Wrap the analyzer in heavy paper or anti-static plastic.
• Use a double-wall carton made of at least 350-pound test material.
• Cushion the analyzer to prevent damage.
Caution
Do not use styrene pellets in any shape as packing material for the analyzer. The
pellets do not adequately cushion the analyzer and do not prevent the analyzer from
shifting in the carton. In addition, the pellets create static electricity which can
damage electronic components.
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Agilent 35670A
Preparing the Analyzer for Use
If the analyzer will not power up
If the analyzer will not power up
Check that the power cord is connected to the Agilent 35670A and to a live power
source.
Check that the front-panel switch is on ( l ).
Check that the rear-panel AC/DC power select switch is properly set.
Check that the fuse is good.
See ‘’To change the fuses’’ on page 2-10.
Check that the analyzer’s air circulation is not blocked.
Cooling air enters the analyzer through the right side and exhausts through the left side
and rear panel. If the analyzer’s air circulation is blocked, the analyzer powers down
to prevent damage from excessive temperatures. The analyzer remains off until it
cools down and its power switch is set to off ( O ) then to on ( l ).
Obtain Agilent service, if necessary. See ‘’Need Assistance?’’ at the end of this guide.
2-19
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Preparing the Analyzer for Use
Agilent 35670A
If the analyzer operates intermittently on dc power
If the analyzer operates intermittently on dc power
The analyzer powers down when operating on dc power if no measurement has been
made within 30 minutes.
Check that the dc power source can supply the required power.
The dc power source must have a true range of 10.8 to 30.8 Vdc. At the minimum
voltage of 10.8 Vdc, the dc power source must be able to supply approximately
8.7 amps for a two-channel analyzer and 12.2 amps for a four-channel analyzer. The
voltage loss through an automotive cigarette lighter system can cause the dc voltage to
go below 10.8 Vdc.
Check that power transients are not causing the dc voltage to go below 10.8 Vdc.
The dc voltage provided by an automobile is susceptible to power transients. For
example, power transients may occur when lights or fans turn on or off, when power
door locks engage or disengage, and when windshield wipers operate. If the dc supply
voltage falls below 10.8 V, the analyzer automatically turns off. However, the
analyzer is not affected by power transients that occur within the range of 10.8 to 30.8
Vdc.
Check that the cable connections are not loose.
Obtain Agilent service, if necessary. See ‘’Need Assistance?’’ at the end of this guide.
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3
Verifying Specifications
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Verifying Specifications
This chapter tells you how to use the Agilent 35670A Semiautomated Performance
Test Disk. The performance test disk contains a program that semiautomates the
operation verification tests and performance tests.
After you review this chapter, follow the directions in ‘’To load the program’’
then continue with one of the following:
• ‘’To run the program in semiautomated mode’’
• ‘’To run the program without a printer’’
• ‘’To run the program in manual mode’’
Caution
Before applying line power to the analyzer or testing its electrical performance, see
chapter 2, ‘’Preparing the Analyzer for Use.’’
Overview
The Semiautomated Performance Test Disk contains a program (ITM_35670A)
and two procedure files (OP_VERIFY and PERFORMAN). ITM_35670A is
the test manager program. OP_VERIFY is the operation verification procedure
file and PERFORMAN is performance test procedure file. The procedure files
contain an ordered list of tests, and each test contains one or more
measurements. Since ITM_35670A reads the procedure files, the disk must
remain in the disk drive during testing.
If you do not have a keyboard connected to the analyzer, use the numeric key
pad and the alpha keys when the program prompts you to type in information.
See the analyzer’s help text for a description of the alpha keys.
If a test fails, contact your local Agilent Technologies sales and service office
or have a qualified service technician see chapter 4, ‘’Troubleshooting the
Analyzer,’’ in the Agilent 35670A Service Guide.
3-2
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Agilent 35670A
Verifying Specifications
Features of the Program
• The program can automatically create a printout similar to the test records at the
back of this chapter.
• The program can beep when equipment connections need to be changed.
• The program can start the test sequence at any test in the operation verification or
performance test list.
• The program can stop after each measurement or alternatively, only if a failure
occurs.
• The program can be run in manual mode.
Test Duration
In semiautomated mode, the operation verification tests require approximately
11 hours and the performance tests require approximately 21 hours.
2
2
Calibration Cycle
To verify the Agilent 35670A Dynamic Signal Analyzer is meeting its
published specifications, do the performance tests every 12 months.
Recommended Test Equipment
The equipment needed for operation verification and performance tests is listed
model if it meets or exceeds the listed critical specifications.
Also, if you want the test record to be automatically printed, you need an GPIB
printer. If you want the printer to automatically leave top and bottom margins
on every page, enable perforation skip mode (see your printer’s manual for
directions). If you do not have an GPIB printer you must record the results of
each test in the test records. These test records may be reproduced without
written permission of Agilent Technologies.
3-3
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Verifying Specifications
Agilent 35670A
Program Controlled Test Equipment
This program automatically controls the instruments listed in the following
table using GPIB commands. If you use a test instrument other than those
shown in the table, the program prompts you to set the instrument state during
testing.
Test Equipment
Program Controlled Model
AC Calibrator
Fluke 5700A
Alternate
Fluke 5200A
Datron 4200, 4707, 4708
Frequency Synthesizer
Digital Multimeter
HP 3326A
Alternate
(2) HP 3325A/B
HP 3458A
Alternate
HP 3455A
HP 3456A
HP 3478A
Measurement Uncertainty
each performance test using the recommended test equipment. Except for the
External Trigger test, the ratios listed for the recommended test equipment
meet or exceed the measurement uncertainty ratio required by U.S.
MIL-STD-45662A. The table also provides a place to record the measurement
uncertainty and ratio for each performance test using equipment other than the
recommended test equipment. The table may be reproduced without written
permission of Agilent Technologies.
Operation Verification and Performance Tests
The operation verification tests give a high confidence level (>90%) that the
Agilent 35670A Dynamic Signal Analyzer is operating properly and within
specifications. The operation verification tests are a subset of the performance
tests. The operation verification tests should be used for incoming and
after-repair inspections. The performance tests provide the highest level of
confidence and are used to verify that the Agilent 35670A Dynamic Signal
Analyzer conforms to its published specifications. Some repairs require a
performance test to be done after the repair (see chapter 6, ‘’Replacing
Assemblies’’ in the Agilent 35670A Service Guide for this information). The
following table lists the operation verification and performance tests.
3-4
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Agilent 35670A
Verifying Specifications
Operation Verification Tests
Self Test
Performance Tests
Self Test
DC Offset
DC Offset
Noise
Noise
Spurious Signals
Amplitude Accuracy
Flatness
Spurious Signals
Amplitude Accuracy
Flatness
Amplitude Linearity
A-Weight Filter
Channel Match
Amplitude Linearity
A-Weight Filter
Channel Match
Frequency Accuracy
Anti-Alias Filter
Input Coupling
Harmonic Distortion
Intermodulation Distortion
Cross Talk
Frequency Accuracy
Single Channel Phase Accuracy
Tach Function
ICP Supply
Source Amplitude Accuracy
Source Flatness
Source Distortion
Single Channel Phase Accuracy
External Trigger
Tach Function
Input Resistance
ICP Supply
Source Amplitude Accuracy
Source Output Resistance
Source DC Offset
Source Flatness
Source Distortion
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Verifying Specifications
Agilent 35670A
Specifications and Performance Tests
The following table lists specifications and the performance test or tests that verify
each specification.
Specification
Performance Test
Frequency
Accuracy
Frequency Accuracy
Single Channel Amplitude
Residual dc response
DC Offset
FFT full scale accuracy at 1 kHz
FFT full scale flatness
FFT amplitude linearity at 1 kHz
Amplitude Accuracy
Flatness
Amplitude Linearity
FFT Dynamic Range
Frequency alias responses
Harmonic distortion
Anti-Alias Filter
Harmonic Distortion
Intermodulation Distortion
Spurious Signals
Intermodulation distortion
Spurious and residual responses
Input Noise
Noise
Single Channel Phase
Cross Channel Amplitude
Cross Channel Phase
Single Channel Phase Accuracy
Channel Match
Channel Match
Input
ac coupling rolloff
Cross talk
Input Coupling
Cross Talk
Input impedance
ICP signal conditioning
A-weight filter
Input Resistance
ICP Supply
A-Weight Filter
Trigger
External trigger
External Trigger
Tach Function
Tachometer
Tachometer level accuracy
Source Output
Sine flatness
Source Flatness
Source Distortion
Harmonic and sub-harmonic distortion
Sine amplitude accuracy at 1 kHz
Resistance
Source Amplitude Accuracy
Source Output Resistance
Source DC Offset
dc offset accuracy
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Agilent 35670A
Verifying Specifications
To load the program
To load the program
For information about the program’s softkeys, see the menu descriptions starting on
page 3-51.
• Set the Agilent 35670A Dynamic Signal Analyzer’s power switch to off ( O ),
then connect the analyzer, test instruments, and printer using GPIB cables.
• If you have the PC Style Keyboard, option 1CL, connect the keyboard to the
analyzer using the keyboard cable (see ‘’To connect the optional keyboard’’ in
chapter 2).
• Insert the Semiautomated Performance Test Disk into the analyzer’s disk drive,
then set the power switch to on ( l ).
• After the analyzer finishes its power-up calibration routine, press the following
keys:
[ Local/GPIB ]
[ SYSTEM CONTROLLR ]
[ System Utility ]
[ MEMORY USAGE ]
[ REMOVE WATERFALL ]
[ CONFIRM REMOVE ]
[ RETURN ]
[ MORE ]
[ SERVICE TESTS ]
[ PERFRMANC TEST ]
• Now go to one of the following procedures to continue:
• ‘’To run the program in semiautomated mode’’
• ‘’To run the program without a printer’’
• ‘’To run the program in manual mode’’
3-7
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Verifying Specifications
Agilent 35670A
To run the program in semiautomated mode
To run the program in semiautomated mode
You must have an GPIB printer connected to your system to run the program in
semiautomated mode. If you do not have a printer, see ‘’To run the program without a
printer’’ later in this chapter.
• Press the following keys and when the program prompts you, type in the
information for the title page of the test record and press [ ENTER ]:
[ TITLE PAGE ]
[ TEST FACILITY ]
[ FACILITY ADDRESS ]
[ TESTED BY ]
[ REPORT NUMBER ]
[ CUSTOMER ]
[ MORE ]
[ TEMP ]
[ HUMIDITY ]
[ LINE FREQUENCY ]
[ RETURN ]
• Press the following keys and when the program prompts you, type in the
equipment configuration information:
[ EQUIP CONFIG ]
[ AC CALIBRATO ]
[ SYNTH. 1 ]
[ SYNTH. 2 ] (If needed)
[ LOW-D OSCILLATO ] (If needed)
[ MULTIMETER ]
[ RETURN ]
The GPIB address is 100 x (interface select code) + (primary address). The interface
select code for the test equipment and printer is 7 (for example, if the primary address
is 8, the GPIB address is 708).
When entering the calibration due date, only four characters are displayed on the
screen. However, you can enter up to nine characters and they will be printed.
3-8
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Agilent 35670A
Verifying Specifications
To run the program in semiautomated mode
• Press the following keys and type in the printer address when the program
prompts you:
[ TEST CONFIG ]
[ PRINTER ADDRESS ]
[ PROCEDURE ]
[ OP_VERIFY ] or [ PERFORMAN ]
[ STOP AFTER ]
[ LIMIT FAILURE ] or [ NONE ]
[ RETURN ]
• Press the following keys to start the test:
[ START TESTING ]
[ START BEGINNING ]
When you select [ START BEGINNING ], the data is written to a file on the disk and
printed only after all tests are done. When you select [ START MIDDLE ] or
[ ONE TEST ], the data is printed immediately after each measurement.
• Follow the directions on the display.
Warning
During the test, the program prompts you to change the test equipment
connections. Always turn the ac calibrator output to OFF or STANDBY before
changing test equipment connections. The ac calibrator can produce output
voltages that could result in injury to personnel.
The directions on the display briefly tell you how to connect test equipment. For
detailed illustrations of equipment setup, see the setup illustrations starting on page
If you want to pause the program and return the Agilent 35670A Dynamic Signal
Analyzer to front panel control, press [ BASIC ]. To continue the program, press
[ BASIC ] [ DISPLAY SETUP ] [ LOWER ] [ RETURN ] [ CONTINUE ]. If you changed
any instrument setup states, press [ RESTART TEST ] instead of [ CONTINUE ]to
ensure accurate measurement results.
3-9
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Verifying Specifications
Agilent 35670A
To run the program without a printer
To run the program without a printer
Use this procedure if you do not have an GPIB printer connected to yout system.
• Write in the information needed on the title page of the selected test record.
The test records are located near the back of this chapter and may be copied without
written permission of Agilent Technologies.
• Press the following keys and when the program prompts you, type in the model
number and GPIB address:
[ EQUIP CONFIG ]
[ AC CALIBRATO ]
[ SYNTH. 1 ]
[ SYNTH. 2 ] (If needed)
[ LOW-D OSCILLATO ] (If needed)
[ MULTIMETER ]
[ RETURN ]
The GPIB addresses equals 100 (interface select code) + (primary address). The
interface select code for the test equipment is 7 (for example, if the primary address is
8, the GPIB address is 708).
• Press the following keys:
[ TEST CONFIG ]
[ PROCEDURE ]
[ OP_VERIFY ] or [ PERFORMAN ]
[ STOP AFTER ]
[ EACH MEASUREMENT ]
[ RETURN ]
• Press the following keys to start the test:
[ START TESTING ]
[ START BEGINNING ]
3-10
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Agilent 35670A
Verifying Specifications
To run the program without a printer
• Now follow the directions on the display and record every measurement result
in the selected test record.
Warning
During the test, the program prompts you to change the test equipment
connections. Always turn the ac calibrator output to OFF or STANDBY before
changing test equipment connections. The ac calibrator can produce output
voltages that could result in injury to personnel.
The directions on the display briefly tell you how to connect test equipment. For
detailed illustrations of equipment setup, see the setup illustrations starting on page
If you want to pause the program and return the Agilent 35670A Dynamic Signal
Analyzer to front panel control, press [ BASIC ]. To continue the program, press
[ BASIC ] [ DISPLAY SETUP ] [ LOWER ] [ RETURN ] [ CONTINUE ]. If you changed
any instrument setup states, press [ RESTART TEST ] instead of [ CONTINUE ] to
ensure accurate measurement results.
3-11
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Verifying Specifications
Agilent 35670A
To run the program in manual mode
To run the program in manual mode
Use this procedure if you want to run the program in manual mode. You will be
prompted to set up all test equipment and you can check the analyzer’s setup state after
each measurement.
• Write in the information needed on the title page of the selected test record.
The test records are located near the back of this chapter and may be copied without
written permission of Agilent Technologies.
• Press the following keys and when the program prompts you, set all GPIB
addresses to 0:
[ EQUIP CONFIG ]
[ AC CALIBRATO ]
[ SYNTH. 1 ]
[ SYNTH. 2 ] (If needed)
[ LOW-D OSCILLATO ] (If needed)
[ MULTIMETER ]
[ RETURN ]
• Press the following keys:
[ TEST CONFIG ]
[ PROCEDURE ]
[ OP_VERIFY ] or [ PERFORMAN ]
[ STOP AFTER ]
[ EACH MEASUREMENT ]
[ RETURN ]
• Press the following keys to start the test:
[ START TESTING ]
[ START BEGINNING ]
• Now follow the directions on the display and record the measurement result in
the selected test record after every measurement.
If you want to view the analyzer’s setup state, press [ BASIC ] [ Disp Format ]
[ MEASURMNT STATE ] or [ INPUT STATE ]. To continue the program, press
[ BASIC ] [ DISPLAY SETUP ] [ LOWER ] [ RETURN ] [ CONTINUE ]. If you changed
any instrument setup states, press [ RESTART TEST ] instead of [ CONTINUE ] to
ensure accurate measurement results.
Warning
During the test, the program prompts you to change the test equipment
connections. Always turn the ac calibrator output to OFF or STANDBY before
changing test equipment connections. The ac calibrator can produce output
voltages that could result in injury to personnel.
The directions on the display briefly tell you how to connect test equipment. For
detailed illustrations of equipment setup, see the setup illustrations starting on the next
page.
3-12
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Agilent 35670A
Verifying Specifications
To set up the self test
To set up the self test
Performance Test and Operation Verification
This test checks the measurement hardware in the Agilent 35670A. No
performance tests should be attempted until the analyzer passes this test. This test
takes approximately one minute to complete, and requires no external equipment.
1
3-13
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Verifying Specifications
Agilent 35670A
To set up the dc offset test
To set up the dc offset test
Performance Test and Operation Verification
This test verifies that the Agilent 35670A meets its single channel amplitude
specification for residual dc responses. In this test, the Agilent 35670A measures
its internal residual dc offset at two amplitudes.
1
1
2 ch
4 ch
3-14
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Agilent 35670A
Verifying Specifications
To set up the noise test
To set up the noise test
Performance Test and Operation Verification
This test verifies that the Agilent 35670A meets its input noise specification. In
this test, the Agilent 35670A measures its internal noise level.
1
1
2 ch
4 ch
3-15
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Verifying Specifications
Agilent 35670A
To set up the spurious signals test
To set up the spurious signals test
Performance Test and Operation Verification
This test verifies that the Agilent 35670A meets its FFT dynamic range
specification for spurious and residual responses. In this test, the Agilent 35670A
measures its internal spurious signals. The test records at the end of this chapter list
the frequencies that are checked.
1
1
2 ch
4 ch
3-16
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Agilent 35670A
Verifying Specifications
To set up the amplitude accuracy test
To set up the amplitude accuracy test
Performance Test and Operation Verification
This test verifies that the Agilent 35670A meets its single channel amplitude
specification for FFT full scale accuracy at 1 kHz. In this test, an ac calibrator
outputs a 1 kHz signal with an exact amplitude to all channels. This test checks
amplitude accuracy at 27, 19, 9, 1, −11, −27, −35, −43, and −51 dBVrms.
1
2 ch
1
4 ch
3-17
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Verifying Specifications
Agilent 35670A
To set up the flatness test
To set up the flatness test
Performance Test and Operation Verification
This test verifies that the Agilent 35670A meets its single channel amplitude
specification for FFT full scale flatness relative to 1 kHz. In this test, the ac
calibrator outputs a signal with an exact amplitude to all channels. The test records
at the end of this chapter list the amplitudes and frequencies that are checked.
1
2 ch
1
4 ch
3-18
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Agilent 35670A
Verifying Specifications
To set up the amplitude linearity test
To set up the amplitude linearity test
Performance Test and Operation Verification
This test verifies that the Agilent 35670A meets its single channel amplitude
specification for FFT amplitude linearity at 1 kHz. In this test, the ac calibrator
outputs a 1 kHz signal with an an exact amplitude to all channels. This test checks
amplitude linearity at 27, 13, −1, −15, −29, −43, and −53 dBVrms.
1
2 ch
1
4 ch
3-19
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Verifying Specifications
Agilent 35670A
To set up the A-weight filter test
To set up the A-weight filter test
Performance Test and Operation Verification
This test verifies that the Agilent 35670A meets its input specification for A-weight
filter. In this test, an ac calibrator outputs a 1 dBVrms signal with an exact
amplitude to all channels. The test records at the end of this chapter list the
frequencies that are checked.
1
1
2 ch
4 ch
3-20
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Agilent 35670A
Verifying Specifications
To set up the channel match test
To set up the channel match test
Performance Test and Operation Verification
This test verifies that the Agilent 35670A meets its cross channel amplitude and
cross channel phase specification. In this test, the Agilent 35670A’s source outputs
an identical signal to all channels. The Agilent 35670A measures the amplitude
and phase of the signal and compares the values measured on one channel to the
values measured on another channel.
1
1
2 ch
4 ch
3-21
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Verifying Specifications
Agilent 35670A
To set up the frequency accuracy test
To set up the frequency accuracy test
Performance Test and Operation Verification
This test verifies that the Agilent 35670A meets its frequency accuracy
specification. In this test, the analyzer measures the frequency of an accurate
50 kHz signal.
1
2 ch
1
4 ch
3-22
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Agilent 35670A
Verifying Specifications
To set up the anti-alias filter test
To set up the anti-alias filter test
Performance Test only
This test verifies that the Agilent 35670A meets its FFT dynamic range
specification for frequency alias responses. In this test, a frequency synthesizer
outputs a −9 dBVrms signal known to cause an alias frequency to all channels. The
Agilent 35670A then measures the alias frequency to determine how well the alias
frequency was rejected. The test records at the end of this chapter list the
frequencies that are checked.
1
1
2 ch
4 ch
3-23
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Verifying Specifications
Agilent 35670A
To set up the input coupling test
To set up the input coupling test
Performance Test only
This test verifies that the Agilent 35670A meets its input specification for ac
coupling rolloff. In this test, a frequency synthesizer outputs a 1 Hz signal to all
channels. The signal is measured in both ac and dc coupled modes. The value
measured in ac coupled mode is subtracted from the value measured in dc coupled
mode to determine the ac coupling rolloff.
1
1
2 ch
4 ch
3-24
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Agilent 35670A
Verifying Specifications
To set up the harmonic distortion test
To set up the harmonic distortion test
Performance Test only
This test verifies that the Agilent 35670A meets its FFT dynamic range
specification for harmonic distortion. In this test, a low distortion oscillator or a
frequency synthesizer and 24.5 kHz notch filter outputs a signal to all channels.
The second, third, fourth, or fifth harmonic is then measured. If the harmonic falls
outside the analyzer’s frequency range, the analyzer measures the alias frequencies.
The test records at the end of this chapter list the fundamental frequencies. If you
are using the synthesizer and notch filter, the frequencies listed in the test record are
approximate.
1
2 ch Using an HP339A
1
4 ch Using an HP 339A
3-25
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Verifying Specifications
Agilent 35670A
To set up the harmonic distortion test
1A 2 ch Using a synthesizer and notch filter
2A
2 ch Using a synthesizer and notch filter
1A 4 ch Using a synthesizer and notch filter
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Agilent 35670A
Verifying Specifications
To set up the harmonic distortion test
2A 4 ch Using a synthesizer and notch filter
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Verifying Specifications
Agilent 35670A
To set up the intermodulation distortion test
To set up the intermodulation distortion test
Performance Test only
This test verifies that the Agilent 35670A meets its FFT dynamic range
specification for intermodulation distortion. In this test, two signals are combined
to provide a composite signal to all channels. The intermodulation products are
found at the sum (F1 + F2) and difference (F1 − 2F2) frequencies. The analyzer
measures the amplitude of each intermodulation product.
1
1
2 ch Using an HP 3326A
4 ch Using an HP 3326A
3-28
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Agilent 35670A
Verifying Specifications
To set up the intermodulation distortion test
1A 2 ch Using 2 HP 3325’s
1A 4 ch Using 2 HP 3325’s
3-29
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Verifying Specifications
Agilent 35670A
To set up the cross talk test
To set up the cross talk test
Performance Test only
This test verifies that the Agilent 35670A meets its input specification for
channel-to-channel and channel-to-source cross talk. In this test, the
Agilent 35670A measures the amount of energy induced from the source or input
channel to another input channel. For source-to-channel crosstalk, the analyzer’s
source is set for 25.6 kHz, 9 dBVrms and the signal level at the input channels is
measured. For channel-to-channel crosstalk, the frequency synthesizer outputs a
25.6 kHz or 51.2 kHz, 9 dBVrms signal to all but one input channel and the signal
level at the unused input channel is measured.
1
2 ch
2
2 ch
3-30
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Agilent 35670A
Verifying Specifications
To set up the cross talk test
3
2 ch
1
2
4 ch
4 ch
3-31
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Verifying Specifications
Agilent 35670A
To set up the cross talk test
3
4 ch
4
4 ch
3-32
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Agilent 35670A
Verifying Specifications
To set up the cross talk test
5
4 ch
3-33
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Verifying Specifications
Agilent 35670A
To set up the single channel phase accuracy test
To set up the single channel phase accuracy test
Performance Test and Operation Verification
This test verifies that the Agilent 35670A meets its single channel phase accuracy
specification. In this test, a frequency synthesizer outputs an identical square wave
to all channels and a synchronized TTL-level signal to the trigger input. The phase
difference between the trigger and each channel is measured to determine phase
accuracy.
1
2 ch
1
4 ch
3-34
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Agilent 35670A
Verifying Specifications
To set up the external trigger test
To set up the external trigger test
Performance Test only
This test verifies that the Agilent 35670A meets its trigger specification for external
trigger level accuracy. In this test, a frequency synthesizer outputs a 1 kHz signal
to the external trigger input and a 12.8 kHz signal to channel 1. The analyzer
makes an accurate triggered measurement on channel 1 to verify the trigger level
and slope.
1
1
2 ch Using an HP 3326A
4 ch Using an HP 3326A
3-35
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Verifying Specifications
Agilent 35670A
To set up the external trigger test
1A
2 ch Using two HP 3325’s
1A
4 ch Using two HP 3325’s
3-36
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Agilent 35670A
Verifying Specifications
To set up the tach function test
To set up the tach function test
Performance Test and Operation Verification
This test is only for Agilent 35670A’s with option 1D0, computed order tracking.
This test verifies that the Agilent 35670A meets its tachometer specification for
trigger level accuracy. In this test, a frequency synthesizer outputs a signal to the
tachometer input and to channel 1. The analyzer makes an accurate order
measurement on channel 1 to verify the trigger level and slope.
1
1
2 ch Using an HP 3326A
4 ch Using an HP 3326A
3-37
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Verifying Specifications
Agilent 35670A
To set up the tach function test
1A
2 ch Using two HP 3325’s
1A
4 ch Using two HP 3325’s
3-38
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Agilent 35670A
Verifying Specifications
To set up the input resistance test
To set up the input resistance test
Performance Test only
This test verifies that the Agilent 35670A meets its input resistance specification.
In this test, a digital multimeter directly measures the input resistance of each
channel. The digital multimeter is set to the 1 MΩ range.
1
2 ch
2
1
2 ch
4 ch
3-39
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Verifying Specifications
Agilent 35670A
To set up the input resistance test
2
3
4
4 ch
4 ch
4 ch
3-40
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Agilent 35670A
Verifying Specifications
To set up the ICP supply test
To set up the ICP supply test
Performance Test and Operation Verification
This test verifies that the Agilent 35670A meets its input specification for ICP
signal conditioning. In this test, a digital multimeter directly measures the open
circuit voltage of each channel. The digital multimeter measures the current souce
of each channel by measuring the voltage across a 50 Ω feedthrough termination.
The digital multimeter is set to the 100 V range to measure open circuit voltage and
set to the 1 V range to measure the current source.
1
2
2 ch
2 ch
3-41
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Verifying Specifications
Agilent 35670A
To set up the ICP supply test
3
2 ch
4
2 ch
1
2
4 ch
4 ch
3-42
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Agilent 35670A
Verifying Specifications
To set up the ICP supply test
3
4
5
4 ch
4 ch
4 ch
6
4 ch
3-43
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Verifying Specifications
Agilent 35670A
To set up the ICP supply test
7
4 ch
8
4 ch
3-44
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Agilent 35670A
Verifying Specifications
To set up the source amplitude accuracy test
To set up the source amplitude accuracy test
Performance Test and Operation Verification
This test verifies that the Agilent 35670A meets its source output specification for
sine amplitude accuracy at 1 kHz. In this test, a digital multimeter measures the
amplitude accuracy of the source. Source amplitude accuracy is checked at
0.1 Vpk with the digital multimeter set to the 100 mVrms range and at 3.0 and
5.0 Vpk with the digital multimeter set to the 10 Vrms range. For the standard two
channel analyzer, the digital multimeter is connected to the rear panel source
connector instead of the front panel source connector. This is the only test that
verifies the rear panel source port on the standard two channel analyzer.
1
2 ch
1
4 ch
3-45
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Verifying Specifications
Agilent 35670A
To set up the source output resistance test
To set up the source output resistance test
Performance Test only
This test verifies that the Agilent 35670A meets its source output specification for
resistance. In this test, a digital multimeter measures the 50 Ω feedthrough
termination. The channel 1 input then measures the source output across the
feedthrough termination, then in an open circuit condition. The resistance is
calculated using the following formula:
Rs = R1((Vopen - Vload)/Vload)
Note: Use the same 50 Ω feedthrough termination for steps 1 and 2.
1
2
2 ch
2 ch
3-46
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Verifying Specifications
Agilent 35670A
To set up the source dc offset test
To set up the source dc offset test
Performance Test only
This test verifies that the Agilent 35670A meets its source output specification for
dc offset accuracy. In this test, a digital multimeter measures the dc offset voltage
of the source with and without an ac component. The frequency of the ac
component is 96 kHz. The test records at the end of this chapter list the voltages
that are checked.
1
1
2 ch
4 ch
3-48
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Agilent 35670A
Verifying Specifications
To set up the source flatness test
To set up the source flatness test
Performance Test and Operation Verification
This test verifies that the Agilent 35670A meets its source output specification for
sine flatness. In this test, the analyzer’s channel 1 input measures the flatness of its
source.
1
1
2 ch
4 ch
3-49
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Verifying Specifications
Agilent 35670A
To set up the source distortion test
To set up the source distortion test
Performance Test and Operation Verification
This test verifies that the Agilent 35670A meets its source output specification for
harmonic and sub-harmonic distortion and spurious signals. In this test, the
analyzer’s source is connected to its channel 1 input. The source is set for a
maximum output level (5 Vpk) and the input range is set equal to the source level.
The fundamental and harmonic is measured. The test records at the end of this
chapter list the fundamental frequencies that are checked.
1
2 ch
1
4 ch
3-50
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Agilent 35670A
Verifying Specifications
ITM_35670A Main Menu Descriptions
If you do not have a keyboard connected Displays the test configuration and a
to the analyzer, use the numeric key pad menu that allows you to enter the
and the alpha keys to enter names or
numbers. See the analyzer’s help text
for a description of the alpha keys.
procedure, stop conditions, beeper
prompt, and GPIB address for the
analyzer and printer.
Load and run the ITM_35670A program [ EQUIP CONFIG ]
to display the following softkeys:
Displays the test equipment
configuration and a menu that allows
you to enter the model number,
calibration due date, serial number, and
GPIB address for each test instrument.
[ START TESTING ]
Displays a menu that allows you to start
testing with any test or to select just one
test in the list. Before pressing this
softkey, use [ TEST CONFIG ] and
[ EQUIP CONFIG ].
[ TITLE PAGE ]
Displays the test record title page
information and a menu that allows you
to enter information for the analyzer.
[ TEST CONFIG ]
[ STOP ITM ]
Stops the ITM_35670A program.
3-51
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Verifying Specifications
Agilent 35670A
Start Testing Menu Descriptions
Press [ START TESTING ] to display the Returns to the ITM_35670A main
following softkeys:
menu.
[ START BEGINNING ]
Start a test to display the following
softkeys:
Prints the test record title page
information and starts the selected test
procedure at the beginning. When you
select [ START BEGINNING ], the data
is written to a file on the disk and
printed only after all tests are done.
[ STOP TESTING ]
Stops the test and returns to the
ITM_35670A main menu.
[ RESTART TEST ]
[ START MIDDLE ]
Starts the current test over. Any
connection prompts are repeated.
Displays a list of all the tests in the
selected procedure. Testing starts with
the test you select and continues through
the remainder of the tests in the list.
When you select [ START MIDDLE ],
the data is printed immediately after
each measurement.
[ RESTART MEAS ]
Starts the current measurement over.
The following softkeys also appear
when the program is waiting for you to
press [ CONTINUE ]:
[ ONE TEST ]
Displays all the tests in the selected
procedure. The test you select is the
only test performed. When you select [
ONE TEST ], the data is printed
[ STOP BEEPING ]
Turns off the beeper prompt for the
remainder of this measurement.
immediately after each measurement.
[ CONTINUE ]
[ RETURN ]
Continues the test. Press this key after
following the directions on the display.
3-52
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Agilent 35670A
Verifying Specifications
Test Configuration Menu Descriptions
Press [ TEST CONFIG ] to display the
test configuration and the following
softkeys:
Prompts you to select the operation
verification procedure (OP_VERIFY) or
the performance test procedure
(PERFORMAN).
[ Agilent 35670A ADDRESS ]
[ BEEPER ]
Prompts you to enter the GPIB address
for the Agilent 35670A Dynamic Signal Toggles the beeper on and off. When
Analyzer.
the beeper is on, the program beeps
approximately every 2 minutes while
waiting for you to follow the directions
on the display and press [ CONTINUE ].
The GPIB addresses equals 100
(interface select code) + (primary
address). The interface select code for
the printer and test equipment is 7 (for
example, if the primary address is 8, the
GPIB address is 708).
[ RETURN ]
Returns to the ITM_35670A main
menu.
[ PRINTER ADDRESS ]
[ STOP AFTER ]
Prompts you to enter the GPIB address
for the printer. To disable the printer,
set the printer address to 0.
Prompts you to select stop after limit
failure, stop after each measurement, or
do not stop after a limit failure or
measurement. If [ Limit Failure ] is
selected, the program stops after the
failing measurement is displayed but
before it is printed. At this point you
can continue on and print the failing
measurement or restart the
[ PROCEDURE ]
measurement.
3-53
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Verifying Specifications
Agilent 35670A
Equipment Configuration Menu Descriptions
Press [ EQUIP CONFIG ] to display the
test equipment configuration and the
following softkeys:
[ LOW-D. OSCILLATO ]
Prompts you to enter the model, serial
number, and calibration due date for the
low-distortion oscillator. If you have a
24.5 kHz notch filter or if you are only
performing the operation verification
tests, you do not need a low-distortion
oscillator.
[ AC CALIBRATO ]
Prompts you to enter the model, serial
number, GPIB address, and calibration
due date for the ac calibrator.
If you select [ Other ] for model, the
program prompts you to type in a
model, serial number, and calibration
due date but not an GPIB address.
[ MULTIMETER ]
Prompts you to enter the model, serial
number, GPIB address, and calibration
due date for the multimeter.
When entering the calibration due date,
only four characters are displayed on the
screen. However, you can enter up to
nine characters and they will be printed.
[ SAVE SETUP ]
Saves the current equipment
configuration to a file for future recall.
[ SYNTH. 1 ]
[ RECALL SETUP ]
Prompts you to enter the model, serial
number, GPIB address, and calibration
due date for the synthesizer.
Recalls an equipment configuration that
was previously saved using [ SAVE
SETUP ].
[ SYNTH. 2 ]
[ RETURN ]
Prompts you to enter the model, serial
number, GPIB address, and calibration
due date for the second synthesizer. If
the first synthesizer is an Agilent 3326A
or if you are only performing the
Returns to the ITM_35670A main
menu.
operation verification tests, you do not
need a second synthesizer.
3-54
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Agilent 35670A
Verifying Specifications
Title Page Menu Descriptions
Press [ TITLE PAGE ] to display the title [ RETURN ]
page information and the following
Returns to the ITM_35670A main
menu.
softkeys:
[ TEST FACILITY ]
[ OPTIONS ]
Prompts you to enter the name or
number of the testing entity.
Prompts you to enter the analyzer’s
options.
[ FACILITY ADDRESS ]
[ DATE ]
Prompts you to enter the address of the
testing entity.
Prompts you to enter the test date.
[ TEMP ]
[ TESTED BY ]
Prompts you to enter the temperature of
the environment during the test.
Prompts you to enter the name or
number of the person performing the
test.
[ HUMIDITY ]
[ REPORT NUMBER ]
Prompts you to enter the humidity of the
environment during the test.
Prompts you to enter the analyzer’s
report number.
[ LINE FREQUENCY ]
[ CUSTOMER ]
Prompts you to enter the power line
frequency.
Prompts you to enter the name or
number of the person requesting the test.
[ MORE ]
[ SERIAL NUMBER ]
Displays the first page.
[ RETURN ]
Prompts you to enter the analyzer’s
serial number.
Returns to the ITM_35670A main
menu.
[ MORE ]
Displays the next page.
The title page information is printed at
the beginning of the test procedure.
3-55
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Verifying Specifications
Measurement Uncertainty
Agilent 35670A
Measurement Uncertainty
The following table lists the measurement uncertainty and ratio for each performance
test using the recommended test equipment. Except for the External Trigger test, the
ratios listed for the recommended test equipment meet or exceed the measurement
uncertainty ratio required by U.S. MIL-STD-45662A.
• If you are using equipment other than the recommended test equipment, you may
calculate and record the measurement uncertainty and ratio for each performance test.
The table may be reproduced without written permission of Agilent Technologies.
Performance Test
Using Recommended Test
Using Other Test Equipment
Equipment
Measurement Uncertainty Ratio
Measurement Uncertainty Ratio
Self Test
NA
NA
NA
NA
NA
NA
NA
NA
NA
NA
NA
NA
NA
NA
NA
NA
DC Offset
Noise
Spurious Signals
Amplitude Accuracy
−51 dBVrms
−43 dBVrms
−35 dBVrms
−27 dBVrms
−11 dBVrms
1 dBVrms
7.7:1
>10:1
>10:1
>10:1
>10:1
>10:1
>10:1
>10:1
>10:1
0.020 dB
0.0084 dB
0.004 dB
0.003 dB
0.001 dB
0.0008 dB
0.001 dB
9 dBVrms
19 dBVrms
27 dBVrms
0.00081 dB
0.00117 dB
Flatness
25.6 kHz, 27 dBVrms
25.6 kHz, 9 dBVrms
25.6 kHz, −11 dBVrms
51.2 kHz, 27 dBVrms
51.2 kHz, 9 dBVrms
51.2 kHz, −11 dBVrms
99.84 kHz, 27 dBVrms
99.84 kHz, 9 dBVrms
99.84 kHz, −11 dBVrms
>10:1
>10:1
>10:1
10:1
0.01487 dB
0.01277 dB
0.01277 dB
0.02025 dB
0.01460 dB
0.01583 dB
0.02025 dB
0.01460 dB
0.01583 dB
>10:1
>10:1
10:1
>10:1
>10:1
NA (not applicable) internal test
3-56
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Agilent 35670A
Verifying Specifications
Measurement Uncertainty
Performance Test
Using Recommended Test
Equipment
Using Other Test Equipment
Ratio
Ratio
Measurement Uncertainty
Measurement Uncertainty
Amplitude Linearity
13 dBVrms
−1 dBVrms
−15 dBVrms
−29 dBVrms
−43 dBVrms
−53 dBVrms
>10:1
>10:1
>10:1
>10:1
>10:1
>10:1
0.0020 dB
0.0020 dB
0.0026 dB
0.0046 dB
0.0096 dB
0.0255 dB
A-Weight Filter
10 Hz
0.016 dB
0.012 dB
0.012 dB
0.011 dB
0.011 dB
0.012 dB
>10:1
>10:1
>10:1
>10:1
>10:1
>10:1
31.62 Hz
100 Hz
1 kHz
10 kHz
25.120 kHz
Channel Match
magnitude
phase
>10:1
>10:1
0.00001 dB
0.01 mdeg
Frequency Accuracy
4.8:1
6.25 ppm
Anti-Alias Filter
<100 kHz
<1 MHz
>10:1
>10:1
0.1 dB
0.3 dB
Input Coupling
>10:1
0.001 dB
Harmonic Distortion
using HP 339A
using HP 3326A with filter
4.46:1
10:1
0.184 dB
0.92 dB
Intermodulation Distortion
10:1
0.83 dB
Cross Talk
channel to channel
source to input
>10:1
6:1
0.1 dB
1.34 dB
Single Channel Phase Accuracy
External Trigger
>10:1
3.6:1 ‡
6:1
0.25 deg †
280 mVpk
330 mV
17Ω
Tach Function
Input Resistance
>10:1
ICP Supply
oven circuit voltage
current
17Ω
320 mV
>10:1
>10:1
132<M > mA
3-57
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Verifying Specifications
Agilent 35670A
Measurement Uncertainty
† The sync output to signal output phase error was determined to be less than 0.25 degrees.
‡ If measured value is within 3% of specification, verify synthesizer level accuracy. Note: Without 50 Ω termination, observed levels
are twice the setting into high impedance.
Performance Test
Using Recommended Test
Using Other Test Equipment
Equipment
Ratio
Ratio
Measurement
Uncertainty
Measurement
Uncertainty
Source Amplitude Accuracy
0.1 Vpk
3.0 Vpk
5.0 Vpk
9.83 mVpk
492.9 mVpk
633.0 mVpk
>10:1
>10:1
>10:1
Source Output Resistance
>10:1
0.15 Ω
Source DC Offset
0 Vdc, 0 Vac-pk
10 Vdc, 0 Vac-pk
0 Vdc, 5 Vac-pk
5 Vdc, 5 Vac-pk
238 nV
84 mV
>10:1
>10:1
>10:1
>10:1
2.123 mV
43 mV
Source Flatness
5.24:1
0.2 dB
Source Distortion
fundamental <30 kHz
fundamental ≥30 kHz
0.5 dB
0.5 dB
6.3:1
>10:1
3-58
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Agilent 35670A
Verifying Specifications
Performance Test Record - Two Channel
Performance Test Record - Two Channel
Test Facility ___________________________________________________________
Facility Address ________________________________________________________
Tested By _____________________________________________________________
Report Number_________________________________________________________
Customer Name________________________________________________________
Serial Number__________________________________________________________
Installed Options _______________________________________________________
Date _________________________________________________________________
Temperature___________________________________________________________
Humidity _____________________________________________________________
Power Line Frequency ___________________________________________________
Test Instruments Used
Instrument
Model
ID or Serial Number
Calibration Due
AC Calibrator
Synthesizer 1
Synthesizer 2
Low-D Oscillator
Multimeter
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Verifying Specifications
Agilent 35670A
Performance Test Record - Two Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Self Test
Measurement
Lower Limit
Upper Limit
Measured Value
Pass/Fail
Long Confidence
DC Offset
Measurement
Lower Limit
Upper Limit
(dBfs)
Measured Value
(dBfs)
Pass/Fail
−51 dBVrms, Ch 1
−51 dBVrms, Ch 2
−35 dBVrms, Ch 1
−35 dBVrms, Ch 2
−15
−15
−30
−30
Noise
Measurement
Lower Limit
Upper Limit
dBV
Measured Value
dBV
Pass/Fail
(
)
(
)
Hz
Hz
Two Ch, 6.4 kHz Span, Ch 1
Two Ch, 6.4 kHz Span, Ch 2
Two Ch, 51.2 kHz Span, Ch 1
Two Ch, 51.2 kHz Span, Ch 2
One Ch, 102.4 kHz Span, Ch 1
−130
−130
−140
−140
−140
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Agilent 35670
Verifying Specifications
Performance Test Record - Two Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Spurious Signals
Two Ch, 0 Hz Start, Ch 1
−80
Two Ch, 0 Hz Start, Ch 2
−80
Two Ch, 200 Hz Start, Ch 1
−80
Two Ch, 200 Hz Start, Ch 2
−80
Two Ch, 400 Hz Start, Ch 1
−80
Two Ch, 400 Hz Start, Ch 2
−80
Two Ch, 600 Hz Start, Ch 1
−80
Two Ch, 600 Hz Start, Ch 2
−80
Two Ch, 800 Hz Start, Ch 1
−80
Two Ch, 800 Hz Start, Ch 2
−80
Two Ch, 1000 Hz Start, Ch 1
−80
Two Ch, 1000 Hz Start, Ch 2
−80
Two Ch, 1200 Hz Start, Ch 1
−80
Two Ch, 1200 Hz Start, Ch 2
−80
Two Ch, 1400 Hz Start, Ch 1
−80
Two Ch, 1400 Hz Start, Ch 2
−80
Two Ch, 1600 Hz Start, Ch 1
−80
Two Ch, 1600 Hz Start, Ch 2
−80
Two Ch, 3200 Hz Start, Ch 1
−80
Two Ch, 3200 Hz Start, Ch 2
−80
Two Ch, 4800 Hz Start, Ch 1
−80
Two Ch, 4800 Hz Start, Ch 2
−80
Two Ch, 6400 Hz Start, Ch 1
−80
Two Ch, 6400 Hz Start, Ch 2
−80
Two Ch, 8000 Hz Start, Ch 1
−80
Two Ch, 8000 Hz Start, Ch 2
−80
Two Ch, 9600 Hz Start, Ch 1
−80
Two Ch, 9600 Hz Start, Ch 2
−80
Two Ch, 11200 Hz Start, Ch 1
−80
Two Ch, 11200 Hz Start, Ch 2
−80
Two Ch, 12800 Hz Start, Ch 1
−80
Two Ch, 12800 Hz Start, Ch 2
−80
Two Ch, 14400 Hz Start, Ch 1
−80
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Verifying Specifications
Agilent 35670A
Performance Test Record - Two Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Two Ch, 14400 Hz Start, Ch 2
−80
Two Ch, 16000 Hz Start, Ch 1
−80
Two Ch, 16000 Hz Start, Ch 2
−80
Two Ch, 17600 Hz Start, Ch 1
−80
Two Ch, 17600 Hz Start, Ch 2
−80
Two Ch, 19200 Hz Start, Ch 1
−80
Two Ch, 19200 Hz Start, Ch 2
−80
Two Ch, 20800 Hz Start, Ch 1
−80
Two Ch, 20800 Hz Start, Ch 2
−80
Two Ch, 22400 Hz Start, Ch 1
−80
Two Ch, 22400 Hz Start, Ch 2
−80
Two Ch, 24000 Hz Start, Ch 1
−80
Two Ch, 24000 Hz Start, Ch 2
−80
Two Ch, 25600 Hz Start, Ch 1
−80
Two Ch, 25600 Hz Start, Ch 2
−80
Two Ch, 27200 Hz Start, Ch 1
−80
Two Ch, 27200 Hz Start, Ch 2
−80
Two Ch, 28800 Hz Start, Ch 1
−80
Two Ch, 28800 Hz Start, Ch 2
−80
Two Ch, 30400 Hz Start, Ch 1
−80
Two Ch, 30400 Hz Start, Ch 2
−80
Two Ch, 32000 Hz Start, Ch 1
−80
Two Ch, 32000 Hz Start, Ch 2
−80
Two Ch, 33600 Hz Start, Ch 1
−80
Two Ch, 33600 Hz Start, Ch 2
−80
Two Ch, 35200 Hz Start, Ch 1
−80
Two Ch, 35200 Hz Start, Ch 2
−80
Two Ch, 36800 Hz Start, Ch 1
−80
Two Ch, 36800 Hz Start, Ch 2
−80
Two Ch, 38400 Hz Start, Ch 1
−80
Two Ch, 38400 Hz Start, Ch 2
−80
Two Ch, 40000 Hz Start, Ch 1
−80
Two Ch, 40000 Hz Start, Ch 2
−80
Two Ch, 41600 Hz Start, Ch 1
−80
Two Ch, 41600 Hz Start, Ch 2
−80
4 of 14
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Agilent 35670A
Verifying Specifications
Performance Test Record - Two Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Two Ch, 43200 Hz Start, Ch 1
−80
Two Ch, 43200 Hz Start, Ch 2
−80
Two Ch, 44800 Hz Start, Ch 1
−80
Two Ch, 44800 Hz Start, Ch 2
−80
Two Ch, 46400 Hz Start, Ch 1
−80
Two Ch, 46400 Hz Start, Ch 2
−80
Two Ch, 48000 Hz Start, Ch 1
−80
Two Ch, 48000 Hz Start, Ch 2
−80
Two Ch, 49600 Hz Start, Ch 1
−80
Two Ch, 49600 Hz Start, Ch 2
−80
One Ch, 79200 Start, Ch 1
−80
One Ch, 80800 Start, Ch 1
−80
One Ch, 85600 Start, Ch 1
−80
One Ch, 87200 Start, Ch 1
−80
5 of 14
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Verifying Specifications
Agilent 35670A
Performance Test Record - Two Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Spurious Signals (continued)
Measurement
Lower Limit
Upper Limit
(dBfs)
Measured Value
(dBfs)
Pass/Fail
One Ch, 88800 Start, Ch 1
−80
−80
−80
−80
−80
One Ch, 97000 Start, Ch 1
One Ch, 98600 Start, Ch 1
One Ch, 100200 Start, Ch 1
One Ch, 101800 Start, Ch 1
Amplitude Accuracy
Measurement
Lower Limit
(dBVrms)
Upper Limit
(dBVrms)
Measured Value
(dBVrms)
Pass/Fail
−51 dBVrms, Ch 1
−51 dBVrms, Ch 2
−43 dBVrms, Ch 1
−43 dBVrms, Ch 2
−35 dBVrms, Ch 1
−35 dBVrms, Ch 2
−27 dBVrms, Ch 1
−27 dBVrms, Ch 2
−11 dBVrms, Ch 1
−51.15
−51.15
−43.15
−43.15
−35.15
−35.15
−27.15
−27.15
−11.15
−11.15
0.85
−50.85
−50.85
−42.85
−42.85
−34.85
−34.85
−26.85
−26.85
−10.85
−10.85
1.15
−11 dBVrms, Ch 2
1 dBVrms, Ch 1
1 dBVrms, Ch 2
9 dBVrms, Ch 1
9 dBVrms, Ch 2
19 dBVrms, Ch 1
19 dBVrms, Ch 2
27 dBVrms, Ch 1
27 dBVrms, Ch 2
0.85
1.15
8.85
9.15
8.85
9.15
18.85
18.85
26.85
26.85
19.15
19.15
27.15
27.15
Flatness
Measurement
Lower Limit
(dB)
Upper Limit
(dB)
Measured Value
(dB)
Pass/Fail
27 dBVrms, 99.84 kHz, One Ch, Ch 1
9 dBVrms, 99.84 kHz, One Ch, Ch 1
0.2
0.2
−0.2
−0.2
6 of 14
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Agilent 35670A
Verifying Specifications
Performance Test Record - Two Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Measurement
Lower Limit
(dB)
Upper Limit
(dB)
Measured Value
(dB)
Pass/Fail
0.2
0.2
0.2
0.2
0.2
0.2
0.2
−11 dBVrms, 99.84 kHz, One Ch, Ch 1
27 dBVrms, 51.2 kHz, Two Ch, Ch 1
27 dBVrms, 51.2 kHz, Two Ch, Ch 2
9 dBVrms, 51.2 kHz, Two Ch, Ch 1
9 dBVrms, 51.2 kHz, Two Ch, Ch 2
−0.2
−0.2
−0.2
−0.2
−0.2
−0.2
−0.2
−11 dBVrms, 51.2 kHz, Two Ch, Ch 1
−11 dBVrms, 51.2 kHz, Two Ch, Ch 2
Amplitude Linearity
Measurement
Lower Limit
(dB)
Upper Limit
(dB)
Measured Value
(dB)
Pass/Fail
13 dBVrms, Ch 1
13 dBVrms, Ch 2
−1 dBVrms, Ch 1
−1 dBVrms, Ch 2
−15 dBVrms, Ch 1
−15 dBVrms, Ch 2
−29 dBVrms, Ch 1
−29 dBVrms, Ch 2
−43 dBVrms, Ch 1
−43 dBVrms, Ch 2
−53 dBVrms, Ch 1
−53 dBVrms, Ch 2
0.061
0.061
0.104
0.104
0.318
0.318
1.316
1.316
5.088
5.088
10.896
10.896
−0.0615
−0.0615
−0.105
−0.105
−0.33
−0.33
−1.551
−1.551
−13.823
−13.823
−30.116
−30.116
7 of 14
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Verifying Specifications
Agilent 35670A
Performance Test Record - Two Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
A-Weight Filter
Measurement
Lower Limit
(dB)
Upper Limit
(dB)
Measured Value
(dB)
Pass/Fail
Ch 1, 10 Hz
2
2
−5
−5
Ch 2, 10 Hz
Ch 1, 31.62 Hz
Ch 2, 31.62 Hz
Ch 1, 100 Hz
Ch 2, 100 Hz
Ch 1, 1000 Hz
Ch 2, 1000 Hz
Ch 1, 10000 Hz
Ch 2, 10000 Hz
Ch 1, 25120 Hz
Ch 2, 25120 Hz
1
−1
1
−1
0.7
0.7
0.7
0.7
2
−0.7
−0.7
−0.7
−0.7
−3
2
−3
2.4
2.4
−4.5
−4.5
Channel Match
Measurement
Lower Limit
−0.04 dB
−0.5 deg
−0.04 dB
−0.5 deg
−0.04 dB
−0.5 deg
−0.08 dB
−0.5 deg
Upper Limit
0.04 dB
0.5 deg
Measured Value
Pass/Fail
Two Ch, 2/1, 7 dBV FS Mag
Two Ch, 2/1, 7 dBV FS Phs
Two Ch, 2/1, −13 dBV FS Mag
Two Ch, 2/1, −13 dBV FS Phs
Two Ch, 2/1, −33 dBV FS Mag
Two Ch, 2/1, −33 dBV FS Phs
Two Ch, 2/1, 7 dBV −20dBfs Mag
Two Ch, 2/1, 7 dBV −20dBfs Phs
dB
deg
dB
0.04 dB
0.5 deg
deg
dB
0.04 dB
0.5 deg
deg
dB
0.08 dB
0.5 deg
deg
8 of 14
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Agilent 35670A
Verifying Specifications
Performance Test Record - Two Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Frequency Accuracy
Measurement
Lower Limit
(kHz)
Upper Limit
(kHz)
Measured Value
(kHz)
Pass/Fail
50 kHz
49.9985
50.0015
Anti-Alias Filter
Measurement
Lower Limit
Upper Limit
(dBfs)
Measured Value
(dBfs)
Pass/Fail
One Ch, Ch 1, 102.4 kHz
Two Ch, Ch 1, 51.2 kHz
Two Ch, Ch 2, 51.2 kHz
−80
−80
−80
Input Coupling
Measurement
Lower Limit
Upper Limit
(dB)
Measured Value
(dB)
Pass/Fail
dc - ac, Ch 1
dc - ac, Ch 2
3
3
9 of 14
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Verifying Specifications
Agilent 35670A
Performance Test Record - Two Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Harmonic Distortion
Measurement
Lower Limit
Upper Limit
(dBfs)
Measured Value
(dBfs)
Pass/Fail
Single, 12.25 kHz 2nd, Ch 1
Two Ch, 12.25 kHz 2nd, Ch 1
Two Ch, 12.25 kHz 2nd, Ch 2
Single, 8.167 kHz 3rd, Ch 1
Two Ch, 8.167 kHz 3rd, Ch 1
Two Ch, 8.167 kHz 3rd, Ch 2
Single, 6.125 kHz 4th, Ch 1
Two Ch, 6.125 kHz 4th, Ch 1
Two Ch, 6.125 kHz 4th, Ch 2
Single, 4.9 kHz 5th, Ch 1
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
Two Ch, 4.9 kHz 5th, Ch 1
Two Ch, 4.9 kHz 5th, Ch 2
10 of 14
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Agilent 35670A
Verifying Specifications
Performance Test Record - Two Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Intermodulation Distortion
Measurement
Lower Limit
Upper Limit
(dBfs)
Measured Value
(dBfs)
Pass/Fail
One Ch, F1+F2, 102.4 kHz, Ch 1
One Ch, F1+F2, 64.096 kHz, Ch 1
One Ch, F1-2F2, 99.096 kHz, Ch 1
Two Ch, F1+F2, 1952 Hz, Ch 1
Two Ch, F1+F2, 1952 Hz, Ch 2
Two Ch, F1-2F2, 1048 Hz, Ch 1
Two Ch, F1-2F2, 1048 Hz, Ch 2
Two Ch, F1+F2, 48.048 kHz, Ch 1
Two Ch, F1+F2, 48.048 kHz, Ch 2
Two Ch, F1+F2, 33.024 kHz, Ch 1
Two Ch, F1+F2, 33.024 kHz, Ch 2
Two Ch, F1-2F2, 49.096 kHz, Ch 1
Two Ch, F1-2F2, 49.096 kHz, Ch 2
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
Cross Talk
Measurement
Lower Limit
Upper Limit
(dBVrms)
Measured Value
(dBVrms)
Pass/Fail
Source-to-Ch 1
−126
−126
−126
−126
Source-to-Ch 2
Receiver Ch 1, Driver Ch 2
Receiver Ch 2, Driver Ch 1
11 of 14
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Verifying Specifications
Agilent 35670A
Performance Test Record - Two Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Single Ch Phase Accuracy
Measurement
Lower Limit
(deg)
Upper Limit
(deg)
Measured Value
(deg)
Pass/Fail
Pass/Fail
Pass/Fail
Positive slope, Ch 1
4
4
4
4
−4
−4
−4
−4
Positive slope, Ch 2
Negative slope, Ch 1
Negative slope, Ch 2
External Trigger
Measurement
Lower Limit
(%)
Upper Limit
(%)
Measured Value
(%)
8 V Pos
8 V Neg
−8 V Pos
−8 V Neg
10
10
10
10
−10
−10
−10
−10
Tach Function (option D01 only)
Measurement
Lower Limit
Upper Limit
(%)
Measured Value
(%)
(%)
−10
−10
−10
−10
Trigger level +8V Pos
10
10
10
10
Trigger level +8V Neg
Trigger level −8V Pos
Trigger level −8V Neg
12 of 14
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Agilent 35670A
Verifying Specifications
Performance Test Record - Two Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Input Resistance
Measurement
Lower Limit
(%)
Upper Limit
(%)
Measured Value
(%)
Pass/Fail
27 dBVrms, Ch 1
9 dBVrms, Ch 1
10
10
10
10
10
10
−10
−10
−10
−10
−10
−10
−11 dBVrms, Ch 1
27 dBVrms, Ch 2
9 dBVrms, Ch 2
−11 dBVrms, Ch 2
ICP Supply
Measurement
Lower Limit
26 Vdc
Upper Limit
32 Vdc
Measured Value
Pass/Fail
Ch 1 Open Circuit Voltage
Ch 2 Open Circuit Voltage
Ch 1 Current
Vdc
Vdc
mA
mA
26 Vdc
32 Vdc
2.75 mA
2.75 mA
5.75 mA
5.75 mA
Ch 2 Current
Source Amplitude Accuracy
Measurement
Lower Limit
(%)
Upper Limit
(%)
Measured Value
(%)
Pass/Fail
1 kHz, 0.1 Vpk
1 kHz, 3.0 Vpk
1 kHz, 5.0 Vpk
4
4
4
−4
−4
−4
Source Output Resistance
Measurement
Lower Limit
Upper Limit
(ohm)
Measured Value
(ohm)
Pass/Fail
Resistance
5
13 of 14
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Verifying Specifications
Agilent 35670A
Performance Test Record - Two Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Source DC Offset
Measurement
Lower Limit
(mVdc)
Upper Limit
(mVdc)
Measured Value
(mVdc)
Pass/Fail
0 Vdc, 0 Vac(pk)
15
−15
315
315
315
315
165
−10 Vdc, 0 Vac(pk)
−315
−315
−315
−315
−165
+10 Vdc, 0 Vac(pk)
−5 Vdc, 5 Vac(pk)
+5 Vdc, 5 Vac(pk)
0 Vdc, 5 Vac(pk)
Source Flatness
Measurement
Lower Limit
(dB)
Upper Limit
(dB)
Measured Value
(dB)
Pass/Fail
12.8 kHz
25.6 kHz
51.2 kHz
102.4 kHz
1
1
1
1
−1
−1
−1
−1
Source Distortion
Measurement
Lower Limit
Upper Limit
(dBc)
Measured Value
(dBc)
Pass/Fail
12.8 kHz
51.2 kHz
102.4 kHz
−60
−40
−40
14 of 14
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Agilent 35670A
Verifying Specifications
Performance Test Record - Four Channel
Performance Test Record - Four Channel
Test Facility ___________________________________________________________
Facility Address ________________________________________________________
Tested By _____________________________________________________________
Report Number_________________________________________________________
Customer Name________________________________________________________
Serial Number__________________________________________________________
Installed Options _______________________________________________________
Date _________________________________________________________________
Temperature___________________________________________________________
Humidity _____________________________________________________________
Power Line Frequency ___________________________________________________
Test Instruments Used
Instrument
Model
ID or Serial Number
Calibration Due
AC Calibrator
Synthesizer 1
Synthesizer 2
Low-D Oscillator
Multimeter
1 of 20
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Verifying Specifications
Agilent 35670A
Performance Test Record - Four Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Self Test
Measurement
Lower Limit
Upper Limit
Measured Value
Pass/Fail
Long Confidence
DC Offset
Measurement
Lower Limit
Upper Limit
(dBfs)
Measured Value
(dBfs)
Pass/Fail
−51 dBVrms, Ch 1
−51 dBVrms, Ch 2
−51 dBVrms, Ch 3
−51 dBVrms, Ch 4
−35 dBVrms, Ch 1
−35 dBVrms, Ch 2
−35 dBVrms, Ch 3
−35 dBVrms, Ch 4
−15
−15
−15
−15
−30
−30
−30
−30
Noise
Measurement
Lower Limit
Upper Limit
dBV
Measured Value
dBV
Pass/Fail
(
)
(
)
Hz
Hz
Four Ch, 6.4 kHz Span, Ch 1
Four Ch, 6.4 kHz Span, Ch 2
Four Ch, 6.4 kHz Span, Ch 3
Four Ch, 6.4 kHz Span, Ch 4
Four Ch, 25.6 kHz Span, Ch 1
Four Ch, 25.6 kHz Span, Ch 2
Four Ch, 25.6 kHz Span, Ch 3
Four Ch, 25.6 kHz Span, Ch 4
Two Ch, 51.2 kHz Span, Ch 1
Two Ch, 51.2 kHz Span, Ch 2
−130
−130
−130
−130
−140
−140
−140
−140
−140
−140
2 of 20
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Agilent 35670A
Verifying Specifications
Performance Test Record - Four Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Spurious Signals
Measurement
Lower Limit
Upper Limit
(dBfs)
Measured Value
(dBfs)
Pass/Fail
Four Ch, 0 Hz Start, Ch 1
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
Four Ch, 0 Hz Start, Ch 2
Four Ch, 0 Hz Start, Ch 3
Four Ch, 0 Hz Start, Ch 4
Four Ch, 200 Hz Start, Ch 1
Four Ch, 200 Hz Start, Ch 2
Four Ch, 200 Hz Start, Ch 3
Four Ch, 200 Hz Start, Ch 4
Four Ch, 400 Hz Start, Ch 1
Four Ch, 400 Hz Start, Ch 2
Four Ch, 400 Hz Start, Ch 3
Four Ch, 400 Hz Start, Ch 4
Four Ch, 600 Hz Start, Ch 1
Four Ch, 600 Hz Start, Ch 2
Four Ch, 600 Hz Start, Ch 3
Four Ch, 600 Hz Start, Ch 4
Four Ch, 800 Hz Start, Ch 1
Four Ch, 800 Hz Start, Ch 2
Four Ch, 800 Hz Start, Ch 3
Four Ch, 800 Hz Start, Ch 4
Four Ch, 1000 Hz Start, Ch 1
Four Ch, 1000 Hz Start, Ch 2
Four Ch, 1000 Hz Start, Ch 3
Four Ch, 1000 Hz Start, Ch 4
Four Ch, 1200 Hz Start, Ch 1
Four Ch, 1200 Hz Start, Ch 2
Four Ch, 1200 Hz Start, Ch 3
Four Ch, 1200 Hz Start, Ch 4
Spurious Signals (continued)
Four Ch, 1400 Hz Start, Ch 1
−80
−80
−80
−80
Four Ch, 1400 Hz Start, Ch 2
Four Ch, 1400 Hz Start, Ch 3
Four Ch, 1400 Hz Start, Ch 4
3 of 20
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Verifying Specifications
Agilent 35670A
Performance Test Record - Four Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Four Ch, 1600 Hz Start, Ch 1
−80
Four Ch, 1600 Hz Start, Ch 2
−80
Four Ch, 1600 Hz Start, Ch 3
−80
Four Ch, 1600 Hz Start, Ch 4
−80
Four Ch, 3200 Hz Start, Ch 1
−80
Four Ch, 3200 Hz Start, Ch 2
−80
Four Ch, 3200 Hz Start, Ch 3
−80
Four Ch, 3200 Hz Start, Ch 4
−80
Four Ch, 4800 Hz Start, Ch 1
−80
Four Ch, 4800 Hz Start, Ch 2
−80
Four Ch, 4800 Hz Start, Ch 3
−80
Four Ch, 4800 Hz Start, Ch 4
−80
Four Ch, 6400 Hz Start, Ch 1
−80
Four Ch, 6400 Hz Start, Ch 2
−80
Four Ch, 6400 Hz Start, Ch 3
−80
Four Ch, 6400 Hz Start, Ch 4
−80
Four Ch, 8000 Hz Start, Ch 1
−80
Four Ch, 8000 Hz Start, Ch 2
−80
Four Ch, 8000 Hz Start, Ch 3
−80
Four Ch, 8000 Hz Start, Ch 4
−80
Four Ch, 9600 Hz Start, Ch 1
−80
Four Ch, 9600 Hz Start, Ch 2
−80
Four Ch, 9600 Hz Start, Ch 3
−80
Four Ch, 9600 Hz Start, Ch 4
−80
Four Ch, 11200 Hz Start, Ch 1
−80
Four Ch, 11200 Hz Start, Ch 2
−80
Four Ch, 11200 Hz Start, Ch 3
−80
Four Ch, 11200 Hz Start, Ch 4
−80
Four Ch, 12800 Hz Start, Ch 1
−80
Four Ch, 12800 Hz Start, Ch 2
−80
Four Ch, 12800 Hz Start, Ch 3
−80
Four Ch, 12800 Hz Start, Ch 4
−80
Four Ch, 14400 Hz Start, Ch 1
−80
Four Ch, 14400 Hz Start, Ch 2
−80
4 of 20
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Agilent 35670A
Verifying Specifications
Performance Test Record - Four Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Four Ch, 14400 Hz Start, Ch 3
−80
Four Ch, 14400 Hz Start, Ch 4
−80
Four Ch, 16000 Hz Start, Ch 1
−80
Four Ch, 16000 Hz Start, Ch 2
−80
Four Ch, 16000 Hz Start, Ch 3
−80
Four Ch, 16000 Hz Start, Ch 4
−80
Four Ch, 17600 Hz Start, Ch 1
−80
Four Ch, 17600 Hz Start, Ch 2
−80
Four Ch, 17600 Hz Start, Ch 3
−80
Four Ch, 17600 Hz Start, Ch 4
−80
Four Ch, 19200 Hz Start, Ch 1
−80
Four Ch, 19200 Hz Start, Ch 2
−80
Four Ch, 19200 Hz Start, Ch 3
−80
Four Ch, 19200 Hz Start, Ch 4
−80
Four Ch, 20800 Hz Start, Ch 1
−80
Four Ch, 20800 Hz Start, Ch 2
−80
5 of 20
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Verifying Specifications
Agilent 35670A
Performance Test Record - Four Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Spurious Signals (continued)
Four Ch, 20800 Hz Start, Ch 3
−80
Four Ch, 20800 Hz Start, Ch 4
−80
Four Ch, 22400 Hz Start, Ch 1
−80
Four Ch, 22400 Hz Start, Ch 2
−80
Four Ch, 22400 Hz Start, Ch 3
−80
Four Ch, 22400 Hz Start, Ch 4
−80
Four Ch, 24000 Hz Start, Ch 1
−80
Four Ch, 24000 Hz Start, Ch 2
−80
Four Ch, 24000 Hz Start, Ch 3
−80
Four Ch, 24000 Hz Start, Ch 4
−80
Two Ch, 25600 Hz Start, Ch 1
−80
Two Ch, 25600 Hz Start, Ch 2
−80
Two Ch, 27200 Hz Start, Ch 1
−80
Two Ch, 27200 Hz Start, Ch 2
−80
Two Ch, 28800 Hz Start, Ch 1
−80
Two Ch, 28800 Hz Start, Ch 2
−80
Two Ch, 30400 Hz Start, Ch 1
−80
Two Ch, 30400 Hz Start, Ch 2
−80
Two Ch, 32000 Hz Start, Ch 1
−80
Two Ch, 32000 Hz Start, Ch 2
−80
Two Ch, 33600 Hz Start, Ch 1
−80
Two Ch, 33600 Hz Start, Ch 2
−80
Two Ch, 35200 Hz Start, Ch 1
−80
Two Ch, 35200 Hz Start, Ch 2
−80
Two Ch, 36800 Hz Start, Ch 1
−80
Two Ch, 36800 Hz Start, Ch 2
−80
Two Ch, 38400 Hz Start, Ch 1
−80
Two Ch, 38400 Hz Start, Ch 2
−80
Two Ch, 40000 Hz Start, Ch 1
−80
Two Ch, 40000 Hz Start, Ch 2
−80
Two Ch, 41600 Hz Start, Ch 1
−80
Two Ch, 41600 Hz Start, Ch 2
−80
Two Ch, 43200 Hz Start, Ch 1
−80
Two Ch, 43200 Hz Start, Ch 2
−80
6 of 20
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Agilent 35670A
Verifying Specifications
Performance Test Record - Four Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Two Ch, 44800 Hz Start, Ch 1
−80
Two Ch, 44800 Hz Start, Ch 2
−80
Two Ch, 46400 Hz Start, Ch 1
−80
Two Ch, 46400 Hz Start, Ch 2
−80
Two Ch, 48000 Hz Start, Ch 1
−80
Two Ch, 48000 Hz Start, Ch 2
−80
Two Ch, 49600 Hz Start, Ch 1
−80
Two Ch, 49600 Hz Start, Ch 2
−80
Amplitude Accuracy
Measurement
Lower Limit
(dBVrms)
Upper Limit
(dBVrms)
Measured Value
(dBVrms)
Pass/Fail
−51 dBVrms, Ch 1
−51 dBVrms, Ch 2
−51 dBVrms, Ch 3
−51 dBVrms, Ch 4
−43 dBVrms, Ch 1
−43 dBVrms, Ch 2
−43 dBVrms, Ch 3
−43 dBVrms, Ch 4
−35 dBVrms, Ch 1
−51.15
−51.15
−51.15
−51.15
−43.15
−43.15
−43.15
−43.15
−35.15
−50.85
−50.85
−50.85
−50.85
−42.85
−42.85
−42.85
−42.85
−34.85
7 of 20
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Verifying Specifications
Agilent 35670A
Performance Test Record - Four Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Amplitude Accuracy (continued)
Measurement
Lower Limit
Upper Limit
(dBfs)
Measured Value
(dBfs)
Pass/Fail
−35 dBVrms, Ch 2
−35 dBVrms, Ch 3
−35 dBVrms, Ch 4
−27 dBVrms, Ch 1
−27 dBVrms, Ch 2
−27 dBVrms, Ch 3
−27 dBVrms, Ch 4
−11 dBVrms, Ch 1
−11 dBVrms, Ch 2
−11 dBVrms, Ch 3
−35.15
−35.15
−35.15
−27.15
−27.15
−27.15
−27.15
−11.15
−11.15
−11.15
−11.15
0.85
−34.85
−34.85
−34.85
−26.85
−26.85
−26.85
−26.85
−10.85
−10.85
−10.85
−10.85
1.15
−11 dBVrms, Ch 4
1 dBVrms, Ch 1
1 dBVrms, Ch 2
1 dBVrms, Ch 3
1 dBVrms, Ch 4
9 dBVrms, Ch 1
9 dBVrms, Ch 2
9 dBVrms, Ch 3
9 dBVrms, Ch 4
19 dBVrms, Ch 1
19 dBVrms, Ch 2
19 dBVrms, Ch 3
19 dBVrms, Ch 4
27 dBVrms, Ch 1
27 dBVrms, Ch 2
27 dBVrms, Ch 3
27 dBVrms, Ch 4
0.85
1.15
0.85
1.15
0.85
1.15
8.85
9.15
8.85
9.15
8.85
9.15
8.85
9.15
18.85
18.85
18.85
18.85
26.85
26.85
26.85
26.85
19.15
19.15
19.15
19.15
27.15
27.15
27.15
27.15
8 of 20
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Agilent 35670A
Verifying Specifications
Performance Test Record - Four Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Flatness
Measurement
Lower Limit
(dB)
Upper Limit
(dB)
Measured Value
(dB)
Pass/Fail
27 dBVrms, 51.2 kHz, One Ch, Ch 1
9 dBVrms, 51.2 kHz, One Ch, Ch 1
0.2
0.2
0.2
0.2
0.2
0.2
0.2
0.2
0.2
0.2
0.2
0.2
0.2
0.2
0.2
0.2
0.2
0.2
0.2
0.2
0.2
−0.2
−0.2
−0.2
−0.2
−0.2
−0.2
−0.2
−0.2
−0.2
−0.2
−0.2
−0.2
−0.2
−0.2
−0.2
−0.2
−0.2
−0.2
−0.2
−0.2
−0.2
−11 dBVrms, 51.2 kHz, One Ch, Ch 1
27 dBVrms, 51.2 kHz, Two Ch, Ch 1
27 dBVrms, 51.2 kHz, Two Ch, Ch 2
9 dBVrms, 51.2 kHz, Two Ch, Ch 1
9 dBVrms, 51.2 kHz, Two Ch, Ch 2
−11 dBVrms, 51.2 kHz, Two Ch, Ch 1
−11 dBVrms, 51.2 kHz, Two Ch, Ch 2
27 dBVrms, 25.6 kHz, Four Ch, Ch 1
27 dBVrms, 25.6 kHz, Four Ch, Ch 2
27 dBVrms, 25.6 kHz, Four Ch, Ch 3
27 dBVrms, 25.6 kHz, Four Ch, Ch 4
9 dBVrms, 25.6 kHz, Four Ch, Ch 1
9 dBVrms, 25.6 kHz, Four Ch, Ch 2
9 dBVrms, 25.6 kHz, Four Ch, Ch 3
9 dBVrms, 25.6 kHz, Four Ch, Ch 4
−11 dBVrms, 25.6 kHz, Four Ch, Ch 1
−11 dBVrms, 25.6 kHz, Four Ch, Ch 2
−11 dBVrms, 25.6 kHz, Four Ch, Ch 3
−11 dBVrms, 25.6 kHz, Four Ch, Ch 4
9 of 20
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Verifying Specifications
Agilent 35670A
Performance Test Record - Four Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Amplitude Linearity
Measurement
Lower Limit
(dB)
Upper Limit
(dB)
Measured Value
(dB)
Pass/Fail
13 dBVrms, Ch 1
13 dBVrms, Ch 2
13 dBVrms, Ch 3
13 dBVrms, Ch 4
−1 dBVrms, Ch 1
−1 dBVrms, Ch 2
−1 dBVrms, Ch 3
−1 dBVrms, Ch 4
−15 dBVrms, Ch 1
−15 dBVrms, Ch 2
−15 dBVrms, Ch 3
−15 dBVrms, Ch 4
−29 dBVrms, Ch 1
−29 dBVrms, Ch 2
−29 dBVrms, Ch 3
−29 dBVrms, Ch 4
−43 dBVrms, Ch 1
−43 dBVrms, Ch 2
−43 dBVrms, Ch 3
−43 dBVrms, Ch 4
−53 dBVrms, Ch 1
−53 dBVrms, Ch 2
−53 dBVrms, Ch 3
−53 dBVrms, Ch 4
0.061
0.061
0.061
0.061
0.104
0.104
0.104
0.104
0.318
0.318
0.318
0.318
1.316
1.316
1.316
1.316
5.088
5.088
5.088
5.088
10.896
10.896
10.896
10.896
−0.0615
−0.0615
−0.0615
−0.0615
−0.105
−0.105
−0.105
−0.105
−0.33
−0.33
−0.33
−0.33
−1.551
−1.551
−1.551
−1.551
−13.823
−13.823
−13.823
−13.823
−30.116
−30.116
−30.116
−30.116
10 of 20
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Agilent 35670A
Verifying Specifications
Performance Test Record - Four Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
A-Weight Filter
Measurement
Lower Limit
(dB)
Upper Limit
(dB)
Measured Value
(dB)
Pass/Fail
Ch 1, 10 Hz
2
2
−5
−5
Ch 2, 10 Hz
Ch 3, 10 Hz
2
−5
Ch 4, 10 Hz
2
−5
Ch 1, 31.62 Hz
Ch 2, 31.62 Hz
Ch 3, 31.62 Hz
Ch 4, 31.62 Hz
Ch 1, 100 Hz
Ch 2, 100 Hz
Ch 3, 100 Hz
Ch 4, 100 Hz
Ch 1, 1000 Hz
Ch 2, 1000 Hz
Ch 3, 1000 Hz
Ch 4, 1000 Hz
Ch 1, 10000 Hz
Ch 2, 10000 Hz
Ch 3, 10000 Hz
Ch 4, 10000 Hz
Ch 1, 25120 Hz
Ch 2, 25120 Hz
Ch 3, 25120 Hz
Ch 4, 25120 Hz
1
−1
1
−1
1
−1
1
−1
0.7
0.7
0.7
0.7
0.7
0.7
0.7
0.7
2
−0.7
−0.7
−0.7
−0.7
−0.7
−0.7
−0.7
−0.7
−3
2
−3
2
−3
2
−3
2.4
2.4
2.4
2.4
−4.5
−4.5
−4.5
−4.5
11 of 20
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Verifying Specifications
Agilent 35670A
Performance Test Record - Four Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Channel Match
Two Ch, 2/1, 7 dBV FS Mag
0.04
0.5
−0.04
−0.5
Two Ch, 2/1, 7 dBV FS Phs
0.04
0.5
Two Ch, 2/1, −13 dBV FS Mag
Two Ch, 2/1, −13 dBV FS Phs
Two Ch, 2/1, −33 dBV FS Mag
Two Ch, 2/1, −33 dBV FS Phs
Two Ch, 2/1, 7 dBV −20 dBfs Mag
Two Ch, 2/1, 7 dBV −20 dBfs Phs
Four Ch, 2/1, 7 dBV FS Mag
Four Ch, 2/1, 7 dBV FS Phs
−0.04
−0.5
0.04
0.5
−0.04
−0.5
0.08
0.5
−0.08
−0.5
0.04
0.5
−0.04
−0.5
0.04
0.5
Four Ch, 2/1, −13 dBV FS Mag
Four Ch, 2/1, −13 dBV FS Phs
Four Ch, 2/1, −33 dBV FS Mag
Four Ch, 2/1, −33 dBV FS Phs
Four Ch, 2/1, 7 dBV −20 dBfs Mag
Four Ch, 2/1, 7 dBV −20 dBfs Phs
Four Ch, 3/1, 7 dBV FS Mag
Four Ch, 3/1, 7 dBV FS Phs
−0.04
−0.5
0.04
0.5
−0.04
−0.5
0.08
0.5
−0.08
−0.5
0.04
0.5
−0.04
−0.5
0.04
0.5
Four Ch, 3/1, −13 dBV FS Mag
Four Ch, 3/1, −13 dBV FS Phs
Four Ch, 3/1, −33 dBV FS Mag
Four Ch, 3/1, −33 dBV FS Phs
Four Ch, 3/1, 7 dBV −20 dBfs Mag
Four Ch, 3/1, 7 dBV −20 dBfs Phs
Four Ch, 4/1, 7 dBV FS Mag
Four Ch, 4/1, 7 dBV FS Phs
−0.04
−0.5
0.04
0.5
−0.04
−0.5
0.08
0.5
−0.08
−0.5
0.04
0.5
−0.04
−0.5
0.04
0.5
Four Ch, 4/1, −13 dBV FS Mag
Four Ch, 4/1, −13 dBV FS Phs
Four Ch, 4/1, −33 dBV FS Mag
Four Ch, 4/1, −33 dBV FS Phs
Four Ch, 4/1, 7 dBV −20 dBfs Mag
Four Ch, 4/1, 7 dBV −20 dBfs Phs
Four Ch, 4/3, 7 dBV FS Mag
−0.04
−0.5
0.04
0.5
−0.04
−0.5
0.08
0.5
−0.08
−0.5
0.04
−0.04
12 of 20
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Agilent 35670A
Verifying Specifications
Performance Test Record - Four Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Four Ch, 4/3, 7 dBV FS Phs
Four Ch, 4/3, −13 dBV FS Mag
Four Ch, 4/3, −13 dBV FS Phs
Four Ch, 4/3, −33 dBV FS Mag
Four Ch, 4/3, −33 dBV FS Phs
Four Ch, 4/3, 7 dBV −20 dBfs Mag
Four Ch, 4/3, 7 dBV −20 dBfs Phs
0.5
0.04
0.5
−0.5
−0.04
−0.5
0.04
0.5
−0.04
−0.5
0.08
0.5
−0.08
−0.5
13 of 20
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Verifying Specifications
Agilent 35670A
Performance Test Record - Four Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Frequency Accuracy
Measurement
Lower Limit
(kHz)
Upper Limit
(kHz)
Measured Value
(kHz)
Pass/Fail
50 kHz
49.9985
50.0015
Anti-Alias Filter
Measurement
Lower Limit
Upper Limit
(dBfs)
Measured Value
(dBfs)
Pass/Fail
One Ch, Ch 1, 51.2 kHz
Two Ch, Ch 1, 51.2 kHz
Two Ch, Ch 2, 51.2 kHz
Four Ch, Ch 1, 25.6 kHz
Four Ch, Ch 2, 25.6 kHz
Four Ch, Ch 3, 25.6 kHz
Four Ch, Ch 4, 25.6 kHz
−80
−80
−80
−80
−80
−80
−80
Input Coupling
Measurement
Lower Limit
Upper Limit
(dB)
Measured Value
(dB)
Pass/Fail
dc - ac, Ch 1
dc - ac, Ch 2
dc - ac, Ch 3
dc - ac, Ch 4
3
3
3
3
14 of 20
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Agilent 35670A
Verifying Specifications
Performance Test Record - Four Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Harmonic Distortion
Measurement
Lower Limit
Upper Limit
(dBfs)
Measured Value
(dBfs)
Pass/Fail
Two Ch, 12.25 kHz 2nd, Ch 1
Two Ch, 12.25 kHz 2nd, Ch 2
Four Ch, 12.25 kHz 2nd, Ch 1
Four Ch, 12.25 kHz 2nd, Ch 2
Four Ch, 12.25 kHz 2nd, Ch 3
Four Ch, 12.25 kHz 2nd, Ch 4
Two Ch, 8.167 kHz 3rd, Ch 1
Two Ch, 8.167 kHz 3rd, Ch 2
Four Ch, 8.167 kHz 3rd, Ch 1
Four Ch, 8.167 kHz 3rd, Ch 2
Four Ch, 8.167 kHz 3rd, Ch 3
Four Ch, 8.167 kHz 3rd, Ch 4
Two Ch, 6.125 kHz 4th, Ch 1
Two Ch, 6.125 kHz 4th, Ch 2
Four Ch, 6.125 kHz 4th, Ch 1
Four Ch, 6.125 kHz 4th, Ch 2
Four Ch, 6.125 kHz 4th, Ch 3
Four Ch, 6.125 kHz 4th, Ch 4
Two Ch, 4.9 kHz 5th, Ch 1
Two Ch, 4.9 kHz 5th, Ch 2
Four Ch, 4.9 kHz 5th, Ch 1
Four Ch, 4.9 kHz 5th, Ch 2
Four Ch, 4.9 kHz 5th, Ch 3
Four Ch, 4.9 kHz 5th, Ch 4
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
15 of 20
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Verifying Specifications
Agilent 35670A
Performance Test Record - Four Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Intermodulation Distortion
Measurement
Lower Limit
Upper Limit
(dBfs)
Measured Value
(dBfs)
Pass/Fail
Two Ch, F1+F2, 1952 Hz, Ch 1
Two Ch, F1+F2, 1952 Hz, Ch 2
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
Two Ch, F1−2F2, 1048 Hz, Ch 1
Two Ch, F1−2F2, 1048 Hz, Ch 2
Two Ch, F1+F2, 48.048 kHz, Ch 1
Two Ch, F1+F2, 48.048 kHz, Ch 2
Two Ch, F1+F2, 33.024 kHz, Ch 1
Two Ch, F1+F2, 33.024 kHz, Ch 2
Two Ch, F1−2F2, 49.096 kHz, Ch 1
Two Ch, F1−2F2, 49.096 kHz, Ch 2
Four Ch, F1+F2, 1952 Hz, Ch 1
Four Ch, F1+F2, 1952 Hz, Ch 2
Four Ch, F1+F2, 1952 Hz, Ch 3
Four Ch, F1+F2, 1952 Hz, Ch 4
Four Ch, F1−2F2, 1048 Hz, Ch 1
Four Ch, F1−2F2, 1048 Hz, Ch 2
Four Ch, F1−2F2, 1048 Hz, Ch 3
Four Ch, F1−2F2, 1048 Hz, Ch 4
Four Ch, F1+F2, 24048 Hz, Ch 1
Four Ch, F1+F2, 24048 Hz, Ch 2
Four Ch, F1+F2, 24048 Hz, Ch 3
Four Ch, F1+F2, 24048 Hz, Ch 4
Four Ch, F1+F2, 17488 Hz, Ch 1
Four Ch, F1+F2, 17488 Hz, Ch 2
Four Ch, F1+F2, 17488 Hz, Ch 3
Four Ch, F1+F2, 17488 Hz, Ch 4
Four Ch, F1−2F2, 24096 Hz, Ch 1
Four Ch, F1−2F2, 24096 Hz, Ch 2
Four Ch, F1−2F2, 24096 Hz, Ch 3
Four Ch, F1−2F2, 24096 Hz, Ch 4
−80
16 of 20
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Agilent 35670A
Verifying Specifications
Performance Test Record - Four Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Cross Talk
Measurement
Lower Limit
Upper Limit
(dBVrms)
Measured Value
(dBVrms)
Pass/Fail
Source-to-Ch 1
Source-to-Ch 2
Source-to-Ch 3
Source-to-Ch 4
−126
−126
−126
−126
−126
−126
−126
−126
Receiver Ch 1, Driver Ch 2, 3, 4
Receiver Ch 2, Driver Ch 1, 3, 4
Receiver Ch 3, Driver Ch 1, 2, 4
Receiver Ch 4, Driver Ch 1, 2, 3
Single Ch Phase Accuracy
Measurement
Lower Limit
(deg)
Upper Limit
(deg)
Measured Value
(deg)
Pass/Fail
Positive slope, Ch 1
Positive slope, Ch 2
Positive slope, Ch 3
Positive slope, Ch 4
Negative slope, Ch 1
Negative slope, Ch 2
Negative slope, Ch 3
Negative slope, Ch 4
4
4
4
4
4
4
4
4
−4
−4
−4
−4
−4
−4
−4
−4
17 of 20
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Verifying Specifications
Agilent 35670A
Performance Test Record - Four Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
External Trigger
Measurement
Lower Limit
(%)
Upper Limit
(%)
Measured Value
(%)
Pass/Fail
Pass/Fail
Pass/Fail
8 V Pos
8 V Neg
−8 V Pos
−8 V Neg
10
10
10
10
−10
−10
−10
−10
Tach Function (option D01 only)
Measurement
Lower Limit
Upper Limit
(%)
Measured Value
(%)
(%)
−10
−10
−10
−10
Trigger level +8V Pos
10
10
10
10
Trigger level +8V Neg
Trigger level −8V Pos
Trigger level −8V Neg
Input Resistance
Measurement
Lower Limit
(%)
Upper Limit
(%)
Measured Value
(%)
27 dBVrms, Ch 1
9 dBVrms, Ch 1
10
10
10
10
10
10
10
10
10
10
10
10
−10
−10
−10
−10
−10
−10
−10
−10
−10
−10
−10
−10
−11 dBVrms, Ch 1
27 dBVrms, Ch 2
9 dBVrms, Ch 2
−11 dBVrms, Ch 2
27 dBVrms, Ch 3
9 dBVrms, Ch 3
−11 dBVrms, Ch 3
27 dBVrms, Ch 4
9 dBVrms, Ch 4
−11 dBVrms, Ch 4
ICP Supply
Measurement
Lower Limit
26 Vdc
Upper Limit
32 Vdc
Measured Value
Pass/Fail
Ch 1 Open Circuit Voltage
Ch 2 Open Circuit Voltage
Ch 31 Open Circuit Voltage
Ch 4 Open Circuit Voltage
Ch 1 Current
Vdc
Vdc
Vdc
Vdc
mA
26 Vdc
32 Vdc
26 Vdc
32 Vdc
26 Vdc
32 Vdc
2.75 mA
5.75 mA
18 of 20
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Agilent 35670A
Verifying Specifications
Performance Test Record - Four Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Measurement
Lower Limit
2.75 mA
Upper Limit
5.75 mA
Measured Value
Pass/Fail
Ch 2 Current
Ch 3 Current
Ch 4 Current
mA
mA
mA
2.75 mA
5.75 mA
2.75 mA
5.75 mA
Source Amplitude Accuracy
Measurement
Lower Limit
(%)
Upper Limit
(%)
Measured Value
(%)
Pass/Fail
1 kHz, 0.1 Vpk
1 kHz, 3.0 Vpk
1 kHz, 5.0 Vpk
4
4
4
−4
−4
−4
Source Output Resistance
Measurement
Lower Limit
Upper Limit
(ohm)
Measured Value
(ohm)
Pass/Fail
Resistance
5
19 of 20
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Verifying Specifications
Agilent 35670A
Performance Test Record - Four Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Source DC Offset
Measurement
Lower Limit
(mVdc)
Upper Limit
(mVdc)
Measured Value
(mVdc)
Pass/Fail
0 Vdc, 0 Vac(pk)
15
−15
315
315
315
315
165
−10 Vdc, 0 Vac(pk)
−315
−315
−315
−315
−165
+10 Vdc, 0 Vac(pk)
−5 Vdc, 5 Vac(pk)
+5 Vdc, 5 Vac(pk)
0 Vdc, 5 Vac(pk)
Source Flatness
Measurement
Lower Limit
(dB)
Upper Limit
(dB)
Measured Value
(dB)
Pass/Fail
12.8 kHz
25.6 kHz
51.2 kHz
1
1
1
−1
−1
−1
Source Distortion
Measurement
Lower Limit
Upper Limit
(dBc)
Measured Value
(dBc)
Pass/Fail
12.8 kHz
51.2 kHz
−60
−40
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Agilent 35670A
Verifying Specifications
Operation Verification Test Record - Two Channel
Operation Verification Test Record - Two Channel
Test Facility ___________________________________________________________
Facility Address ________________________________________________________
Tested By _____________________________________________________________
Report Number_________________________________________________________
Customer Name________________________________________________________
Serial Number__________________________________________________________
Installed Options _______________________________________________________
Date _________________________________________________________________
Temperature___________________________________________________________
Humidity _____________________________________________________________
Power Line Frequency ___________________________________________________
Test Instruments Used
Instrument
Model
ID or Serial Number
Calibration Due
AC Calibrator
Synthesizer 1
Synthesizer 2
Low-D Oscillator
Multimeter
1 of 10
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Verifying Specifications
Agilent 35670A
Operation Verification Test Record - Two Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Self Test
Measurement
Lower Limit
Upper Limit
Measured Value
Pass/Fail
Long Confidence
DC Offset
Measurement
Lower Limit
Upper Limit
(dBfs)
Measured Value
(dBfs)
Pass/Fail
−51 dBVrms, Ch 1
−51 dBVrms, Ch 2
−35 dBVrms, Ch 1
−35 dBVrms, Ch 2
−15
−15
−30
−30
Noise
Measurement
Lower Limit
Upper Limit
dBV
Measured Value
dBV
Pass/Fail
(
)
(
)
Hz
Hz
Two Ch, 6.4 kHz Span, Ch 1
Two Ch, 6.4 kHz Span, Ch 2
Two Ch, 51.2 kHz Span, Ch 1
Two Ch, 51.2 kHz Span, Ch 2
One Ch, 102.4 kHz Span, Ch 1
−130
−130
−140
−140
−140
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Agilent 35670A
Verifying Specifications
Operation Verification Test Record - Two Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Spurious Signals
Two Ch, 0 Hz Start, Ch 1
−80
Two Ch, 0 Hz Start, Ch 2
−80
Two Ch, 200 Hz Start, Ch 1
−80
Two Ch, 200 Hz Start, Ch 2
−80
Two Ch, 400 Hz Start, Ch 1
−80
Two Ch, 400 Hz Start, Ch 2
−80
Two Ch, 600 Hz Start, Ch 1
−80
Two Ch, 600 Hz Start, Ch 2
−80
Two Ch, 800 Hz Start, Ch 1
−80
Two Ch, 800 Hz Start, Ch 2
−80
Two Ch, 1000 Hz Start, Ch 1
−80
Two Ch, 1000 Hz Start, Ch 2
−80
Two Ch, 1200 Hz Start, Ch 1
−80
Two Ch, 1200 Hz Start, Ch 2
−80
Two Ch, 1400 Hz Start, Ch 1
−80
Two Ch, 1400 Hz Start, Ch 2
−80
Two Ch, 1600 Hz Start, Ch 1
−80
Two Ch, 1600 Hz Start, Ch 2
−80
Two Ch, 3200 Hz Start, Ch 1
−80
Two Ch, 3200 Hz Start, Ch 2
−80
Two Ch, 4800 Hz Start, Ch 1
−80
Two Ch, 4800 Hz Start, Ch 2
−80
Two Ch, 6400 Hz Start, Ch 1
−80
Two Ch, 6400 Hz Start, Ch 2
−80
Two Ch, 8000 Hz Start, Ch 1
−80
Two Ch, 8000 Hz Start, Ch 2
−80
Two Ch, 9600 Hz Start, Ch 1
−80
Two Ch, 9600 Hz Start, Ch 2
−80
Two Ch, 11200 Hz Start, Ch 1
−80
Two Ch, 11200 Hz Start, Ch 2
−80
Two Ch, 12800 Hz Start, Ch 1
−80
Two Ch, 12800 Hz Start, Ch 2
−80
Two Ch, 14400 Hz Start, Ch 1
−80
3 of 10
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Verifying Specifications
Agilent 35670A
Operation Verification Test Record - Two Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Two Ch, 14400 Hz Start, Ch 2
−80
Two Ch, 16000 Hz Start, Ch 1
−80
Two Ch, 16000 Hz Start, Ch 2
−80
Two Ch, 17600 Hz Start, Ch 1
−80
Two Ch, 17600 Hz Start, Ch 2
−80
Two Ch, 19200 Hz Start, Ch 1
−80
Two Ch, 19200 Hz Start, Ch 2
−80
Two Ch, 20800 Hz Start, Ch 1
−80
Two Ch, 20800 Hz Start, Ch 2
−80
Two Ch, 22400 Hz Start, Ch 1
−80
Two Ch, 22400 Hz Start, Ch 2
−80
Two Ch, 24000 Hz Start, Ch 1
−80
Two Ch, 24000 Hz Start, Ch 2
−80
Two Ch, 25600 Hz Start, Ch 1
−80
Two Ch, 25600 Hz Start, Ch 2
−80
Two Ch, 27200 Hz Start, Ch 1
−80
Two Ch, 27200 Hz Start, Ch 2
−80
Two Ch, 28800 Hz Start, Ch 1
−80
Two Ch, 28800 Hz Start, Ch 2
−80
Two Ch, 30400 Hz Start, Ch 1
−80
Two Ch, 30400 Hz Start, Ch 2
−80
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Agilent 35670A
Verifying Specifications
Operation Verification Test Record - Two Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Spurious Signals (continued)
Two Ch, 32000 Hz Start, Ch 1
−80
Two Ch, 32000 Hz Start, Ch 2
−80
Two Ch, 33600 Hz Start, Ch 1
−80
Two Ch, 33600 Hz Start, Ch 2
−80
Two Ch, 35200 Hz Start, Ch 1
−80
Two Ch, 35200 Hz Start, Ch 2
−80
Two Ch, 36800 Hz Start, Ch 1
−80
Two Ch, 36800 Hz Start, Ch 2
−80
Two Ch, 38400 Hz Start, Ch 1
−80
Two Ch, 38400 Hz Start, Ch 2
−80
Two Ch, 40000 Hz Start, Ch 1
−80
Two Ch, 40000 Hz Start, Ch 2
−80
Two Ch, 41600 Hz Start, Ch 1
−80
Two Ch, 41600 Hz Start, Ch 2
−80
Two Ch, 43200 Hz Start, Ch 1
−80
Two Ch, 43200 Hz Start, Ch 2
−80
Two Ch, 44800 Hz Start, Ch 1
−80
Two Ch, 44800 Hz Start, Ch 2
−80
Two Ch, 46400 Hz Start, Ch 1
−80
Two Ch, 46400 Hz Start, Ch 2
−80
Two Ch, 48000 Hz Start, Ch 1
−80
Two Ch, 48000 Hz Start, Ch 2
−80
Two Ch, 49600 Hz Start, Ch 1
−80
Two Ch, 49600 Hz Start, Ch 2
−80
One Ch, 79200 Start, Ch 1
−80
One Ch, 80800 Start, Ch 1
−80
One Ch, 85600 Start, Ch 1
−80
One Ch, 87200 Start, Ch 1
−80
One Ch, 88800 Start, Ch 1
−80
One Ch, 97000 Start, Ch 1
−80
One Ch, 98600 Start, Ch 1
−80
One Ch, 100200 Start, Ch 1
−80
One Ch, 101800 Start, Ch 1
−80
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Verifying Specifications
Agilent 35670A
Operation Verification Test Record - Two Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Amplitude Accuracy
Measurement
Lower Limit
(dBVrms)
Upper Limit
(dBVrms)
Measured Value
(dBVrms)
Pass/Fail
−51 dBVrms, Ch 1
−51 dBVrms, Ch 2
−43 dBVrms, Ch 1
−43 dBVrms, Ch 2
−35 dBVrms, Ch 1
−35 dBVrms, Ch 2
−27 dBVrms, Ch 1
−27 dBVrms, Ch 2
−11 dBVrms, Ch 1
−51.15
−51.15
−43.15
−43.15
−35.15
−35.15
−27.15
−27.15
−11.15
−11.15
0.85
−50.85
−50.85
−42.85
−42.85
−34.85
−34.85
−26.85
−26.85
−10.85
−10.85
1.15
−11 dBVrms, Ch 2
1 dBVrms, Ch 1
1 dBVrms, Ch 2
9 dBVrms, Ch 1
9 dBVrms, Ch 2
19 dBVrms, Ch 1
19 dBVrms, Ch 2
27 dBVrms, Ch 1
27 dBVrms, Ch 2
0.85
1.15
8.85
9.15
8.85
9.15
18.85
18.85
26.85
26.85
19.15
19.15
27.15
27.15
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Agilent 35670A
Verifying Specifications
Operation Verification Test Record - Two Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Flatness
Measurement
Lower Limit
(dB)
Upper Limit
(dB)
Measured Value
(dB)
Pass/Fail
27 dBVrms, 99.84 kHz, One Ch, Ch 1
9 dBVrms, 99.84 kHz, One Ch, Ch 1
0.2
0.2
0.2
0.2
0.2
0.2
0.2
0.2
0.2
−0.2
−0.2
−0.2
−0.2
−0.2
−0.2
−0.2
−0.2
−0.2
−11 dBVrms, 99.84 kHz, One Ch, Ch 1
27 dBVrms, 51.2 kHz, Two Ch, Ch 1
27 dBVrms, 51.2 kHz, Two Ch, Ch 2
9 dBVrms, 51.2 kHz, Two Ch, Ch 1
9 dBVrms, 51.2 kHz, Two Ch, Ch 2
−11 dBVrms, 51.2 kHz, Two Ch, Ch 1
−11 dBVrms, 51.2 kHz, Two Ch, Ch 2
Amplitude Linearity
Measurement
Lower Limit
(dB)
Upper Limit
(dB)
Measured Value
(dB)
Pass/Fail
13 dBVrms, Ch 1
13 dBVrms, Ch 2
−1 dBVrms, Ch 1
−1 dBVrms, Ch 2
−15 dBVrms, Ch 1
−15 dBVrms, Ch 2
−29 dBVrms, Ch 1
−29 dBVrms, Ch 2
−43 dBVrms, Ch 1
−43 dBVrms, Ch 2
−53 dBVrms, Ch 1
−53 dBVrms, Ch 2
0.061
0.061
0.104
0.104
0.318
0.318
1.316
1.316
5.088
5.088
10.896
10.896
−0.0615
−0.0615
−0.105
−0.105
−0.33
−0.33
−1.551
−1.551
−13.823
−13.823
−30.116
−30.116
A Weight Filter
Measurement
Lower Limit
(dB)
Upper Limit
(dB)
Measured Value
(dB)
Pass/Fail
Ch 1, 10 Hz
2
2
1
1
−5
−5
−1
−1
Ch 2, 10 Hz
Ch 1, 31.62 Hz
Ch 2, 31.62 Hz
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Verifying Specifications
Agilent 35670A
Operation Verification Test Record - Two Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Measurement
Lower Limit
(dB)
Upper Limit
(dB)
Measured Value
(dB)
Pass/Fail
Ch 1, 100 Hz
0.7
0.7
0.7
0.7
2
−0.7
−0.7
−0.7
−0.7
−3
Ch 2, 100 Hz
Ch 1, 1000 Hz
Ch 2, 1000 Hz
Ch 1, 10000 Hz
Ch 2, 10000 Hz
Ch 1, 25120 Hz
Ch 2, 25120 Hz
2
−3
2.4
2.4
−4.5
−4.5
Channel Match
Measurement
Lower Limit
−0.04 dB
−0.5 deg
−0.04 dB
−0.5 deg
−0.04 dB
−0.5 deg
−0.08 dB
−0.5 deg
Upper Limit
0.04 dB
0.5 deg
Measured Value
Pass/Fail
Two Ch, 2/1, 7 dBV FS Mag
Two Ch, 2/1, 7 dBV FS Phs
Two Ch, 2/1, −13 dBV FS Mag
Two Ch, 2/1, −13 dBV FS Phs
Two Ch, 2/1, −33 dBV FS Mag
Two Ch, 2/1, −33 dBV FS Phs
Two Ch, 2/1, 7 dBV −20dBfs Mag
Two Ch, 2/1, 7 dBV −20dBfs Phs
dB
deg
dB
0.04 dB
0.5 deg
deg
dB
0.04 dB
0.5 deg
deg
dB
0.08 dB
0.5 deg
deg
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Agilent 35670A
Verifying Specifications
Operation Verification Test Record - Two Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Frequency Accuracy
Measurement
Lower Limit
(kHz)
Upper Limit
(kHz)
Measured Value
(kHz)
Pass/Fail
50 kHz
49.9985
50.0015
Single Ch Phase Accuracy
Measurement
Lower Limit
(deg)
Upper Limit
(deg)
Measured Value
(deg)
Pass/Fail
Positive slope, Ch 1
Positive slope, Ch 2
Negative slope, Ch 1
Negative slope, Ch 2
4
4
4
4
−4
−4
−4
−4
Tach Function (option D01 only)
Measurement
Lower Limit
Upper Limit
(%)
Measured Value
(%)
Pass/Fail
(%)
−10
−10
−10
−10
Trigger level +8V Pos
10
10
10
10
Trigger level +8V Neg
Trigger level −8V Pos
Trigger level −8V Neg
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Verifying Specifications
Agilent 35670A
Operation Verification Test Record - Two Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
ICP Supply
Measurement
Ch 1 Open Circuit Voltage
Lower Limit
26 Vdc
Upper Limit
32 Vdc
Measured Value
Pass/Fail
Vdc
Vdc
mA
mA
Ch 2 Open Circuit Voltage
Ch 1 Current
26 Vdc
32 Vdc
2.75 mA
2.75 mA
5.75 mA
5.75 mA
Ch 2 Current
Source Amplitude Accuracy
Measurement
Lower Limit
(%)
Upper Limit
(%)
Measured Value
(%)
Pass/Fail
1 kHz, 0.1 Vpk
1 kHz, 3.0 Vpk
1 kHz, 5.0 Vpk
4
4
4
−4
−4
−4
Source Flatness
Measurement
Lower Limit
(dB)
Upper Limit
(dB)
Measured Value
(dB)
Pass/Fail
12.8 kHz
25.6 kHz
51.2 kHz
102.4 kHz
1
1
1
1
−1
−1
−1
−1
Source Distortion
Measurement
Lower Limit
Upper Limit
(dBc)
Measured Value
(dBc)
Pass/Fail
12.8 kHz
51.2 kHz
102.4 kHz
−60
−40
−40
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Agilent 35670A
Verifying Specifications
Operation Verification Test Record - Four Channel
Operation Verification Test Record - Four Channel
Test Facility ___________________________________________________________
Facility Address ________________________________________________________
Tested By _____________________________________________________________
Report Number_________________________________________________________
Customer Name________________________________________________________
Serial Number__________________________________________________________
Installed Options _______________________________________________________
Date _________________________________________________________________
Temperature___________________________________________________________
Humidity _____________________________________________________________
Power Line Frequency ___________________________________________________
Test Instruments Used
Instrument
Model
ID or Serial Number
Calibration Due
AC Calibrator
Synthesizer 1
Synthesizer 2
Low-D Oscillator
Multimeter
1 of 15
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Verifying Specifications
Agilent 35670A
Operation Verification Test Record - Four Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Self Test
Measurement
Lower Limit
Upper Limit
Measured Value
Pass/Fail
Long Confidence
DC Offset
Measurement
Lower Limit
Upper Limit
(dBfs)
Measured Value
(dBfs)
Pass/Fail
−51 dBVrms, Ch 1
−51 dBVrms, Ch 2
−51 dBVrms, Ch 3
−51 dBVrms, Ch 4
−35 dBVrms, Ch 1
−35 dBVrms, Ch 2
−35 dBVrms, Ch 3
−35 dBVrms, Ch 4
−15
−15
−15
−15
−30
−30
−30
−30
Noise
Measurement
Lower Limit
Upper Limit
dBV
Measured Value
dBV
Pass/Fail
(
)
(
)
Hz
Hz
Four Ch, 6.4 kHz Span, Ch 1
Four Ch, 6.4 kHz Span, Ch 2
Four Ch, 6.4 kHz Span, Ch 3
Four Ch, 6.4 kHz Span, Ch 4
Four Ch, 25.6 kHz Span, Ch 1
Four Ch, 25.6 kHz Span, Ch 2
Four Ch, 25.6 kHz Span, Ch 3
Four Ch, 25.6 kHz Span, Ch 4
Two Ch, 51.2 kHz Span, Ch 1
Two Ch, 51.2 kHz Span, Ch 2
−130
−130
−130
−130
−140
−140
−140
−140
−140
−140
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Agilent 35670A
Verifying Specifications
Operation Verification Test Record - Four Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Spurious Signals
Measurement
Lower Limit
Upper Limit
(dBfs)
Measured Value
(dBfs)
Pass/Fail
Four Ch, 0 Hz Start, Ch 1
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
−80
Four Ch, 0 Hz Start, Ch 2
Four Ch, 0 Hz Start, Ch 3
Four Ch, 0 Hz Start, Ch 4
Four Ch, 200 Hz Start, Ch 1
Four Ch, 200 Hz Start, Ch 2
Four Ch, 200 Hz Start, Ch 3
Four Ch, 200 Hz Start, Ch 4
Four Ch, 400 Hz Start, Ch 1
Four Ch, 400 Hz Start, Ch 2
Four Ch, 400 Hz Start, Ch 3
Four Ch, 400 Hz Start, Ch 4
Four Ch, 600 Hz Start, Ch 1
Four Ch, 600 Hz Start, Ch 2
Four Ch, 600 Hz Start, Ch 3
Four Ch, 600 Hz Start, Ch 4
Four Ch, 800 Hz Start, Ch 1
Four Ch, 800 Hz Start, Ch 2
Four Ch, 800 Hz Start, Ch 3
Four Ch, 800 Hz Start, Ch 4
Four Ch, 1000 Hz Start, Ch 1
Four Ch, 1000 Hz Start, Ch 2
Four Ch, 1000 Hz Start, Ch 3
Four Ch, 1000 Hz Start, Ch 4
Four Ch, 1200 Hz Start, Ch 1
Four Ch, 1200 Hz Start, Ch 2
Four Ch, 1200 Hz Start, Ch 3
Four Ch, 1200 Hz Start, Ch 4
Four Ch, 1400 Hz Start, Ch 1
Four Ch, 1400 Hz Start, Ch 2
Four Ch, 1400 Hz Start, Ch 3
Four Ch, 1400 Hz Start, Ch 4
−80
−80
−80
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Verifying Specifications
Agilent 35670A
Operation Verification Test Record - Four Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Four Ch, 1600 Hz Start, Ch 1
−80
Four Ch, 1600 Hz Start, Ch 2
−80
Four Ch, 1600 Hz Start, Ch 3
−80
Four Ch, 1600 Hz Start, Ch 4
−80
Four Ch, 3200 Hz Start, Ch 1
−80
Four Ch, 3200 Hz Start, Ch 2
−80
Four Ch, 3200 Hz Start, Ch 3
−80
Four Ch, 3200 Hz Start, Ch 4
−80
Four Ch, 4800 Hz Start, Ch 1
−80
Four Ch, 4800 Hz Start, Ch 2
−80
Four Ch, 4800 Hz Start, Ch 3
−80
Four Ch, 4800 Hz Start, Ch 4
−80
Four Ch, 6400 Hz Start, Ch 1
−80
Four Ch, 6400 Hz Start, Ch 2
−80
Four Ch, 6400 Hz Start, Ch 3
−80
Four Ch, 6400 Hz Start, Ch 4
−80
Four Ch, 8000 Hz Start, Ch 1
−80
Four Ch, 8000 Hz Start, Ch 2
−80
Four Ch, 8000 Hz Start, Ch 3
−80
Four Ch, 8000 Hz Start, Ch 4
−80
Four Ch, 9600 Hz Start, Ch 1
−80
Four Ch, 9600 Hz Start, Ch 2
−80
Four Ch, 9600 Hz Start, Ch 3
−80
Four Ch, 9600 Hz Start, Ch 4
−80
Four Ch, 11200 Hz Start, Ch 1
−80
Four Ch, 11200 Hz Start, Ch 2
−80
Four Ch, 11200 Hz Start, Ch 3
−80
Four Ch, 11200 Hz Start, Ch 4
−80
Four Ch, 12800 Hz Start, Ch 1
−80
Four Ch, 12800 Hz Start, Ch 2
−80
Four Ch, 12800 Hz Start, Ch 3
−80
Four Ch, 12800 Hz Start, Ch 4
−80
Four Ch, 14400 Hz Start, Ch 1
−80
Four Ch, 14400 Hz Start, Ch 2
−80
4 of 15
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Agilent 35670A
Verifying Specifications
Operation Verification Test Record - Four Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Four Ch, 14400 Hz Start, Ch 3
−80
Four Ch, 14400 Hz Start, Ch 4
−80
Four Ch, 16000 Hz Start, Ch 1
−80
Four Ch, 16000 Hz Start, Ch 2
−80
Four Ch, 16000 Hz Start, Ch 3
−80
Four Ch, 16000 Hz Start, Ch 4
−80
Four Ch, 17600 Hz Start, Ch 1
−80
Four Ch, 17600 Hz Start, Ch 2
−80
Four Ch, 17600 Hz Start, Ch 3
−80
Four Ch, 17600 Hz Start, Ch 4
−80
Four Ch, 19200 Hz Start, Ch 1
−80
Four Ch, 19200 Hz Start, Ch 2
−80
Four Ch, 19200 Hz Start, Ch 3
−80
Four Ch, 19200 Hz Start, Ch 4
−80
Four Ch, 20800 Hz Start, Ch 1
−80
Four Ch, 20800 Hz Start, Ch 2
−80
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Verifying Specifications
Agilent 35670A
Operation Verification Test Record - Four Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Spurious Signals (continued)
Four Ch, 20800 Hz Start, Ch 3
−80
Four Ch, 20800 Hz Start, Ch 4
−80
Four Ch, 22400 Hz Start, Ch 1
−80
Four Ch, 22400 Hz Start, Ch 2
−80
Four Ch, 22400 Hz Start, Ch 3
−80
Four Ch, 22400 Hz Start, Ch 4
−80
Four Ch, 24000 Hz Start, Ch 1
−80
Four Ch, 24000 Hz Start, Ch 2
−80
Four Ch, 24000 Hz Start, Ch 3
−80
Four Ch, 24000 Hz Start, Ch 4
−80
Two Ch, 25600 Hz Start, Ch 1
−80
Two Ch, 25600 Hz Start, Ch 2
−80
Two Ch, 27200 Hz Start, Ch 1
−80
Two Ch, 27200 Hz Start, Ch 2
−80
Two Ch, 28800 Hz Start, Ch 1
−80
Two Ch, 28800 Hz Start, Ch 2
−80
Two Ch, 30400 Hz Start, Ch 1
−80
Two Ch, 30400 Hz Start, Ch 2
−80
Two Ch, 32000 Hz Start, Ch 1
−80
Two Ch, 32000 Hz Start, Ch 2
−80
Two Ch, 33600 Hz Start, Ch 1
−80
Two Ch, 33600 Hz Start, Ch 2
−80
Two Ch, 35200 Hz Start, Ch 1
−80
Two Ch, 35200 Hz Start, Ch 2
−80
Two Ch, 36800 Hz Start, Ch 1
−80
Two Ch, 36800 Hz Start, Ch 2
−80
Two Ch, 38400 Hz Start, Ch 1
−80
Two Ch, 38400 Hz Start, Ch 2
−80
Two Ch, 40000 Hz Start, Ch 1
−80
Two Ch, 40000 Hz Start, Ch 2
−80
Two Ch, 41600 Hz Start, Ch 1
−80
Two Ch, 41600 Hz Start, Ch 2
−80
Two Ch, 43200 Hz Start, Ch 1
−80
Two Ch, 43200 Hz Start, Ch 2
−80
6 of 15
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Agilent 35670A
Verifying Specifications
Operation Verification Test Record - Four Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Two Ch, 44800 Hz Start, Ch 1
−80
Two Ch, 44800 Hz Start, Ch 2
−80
Two Ch, 46400 Hz Start, Ch 1
−80
Two Ch, 46400 Hz Start, Ch 2
−80
Two Ch, 48000 Hz Start, Ch 1
−80
Two Ch, 48000 Hz Start, Ch 2
−80
Two Ch, 49600 Hz Start, Ch 1
−80
Two Ch, 49600 Hz Start, Ch 2
−80
Amplitude Accuracy
Measurement
Lower Limit
(dBVrms)
Upper Limit
(dBVrms)
Measured Value
(dBVrms)
Pass/Fail
−51 dBVrms, Ch 1
−51 dBVrms, Ch 2
−51 dBVrms, Ch 3
−51 dBVrms, Ch 4
−43 dBVrms, Ch 1
−43 dBVrms, Ch 2
−43 dBVrms, Ch 3
−43 dBVrms, Ch 4
−35 dBVrms, Ch 1
−51.15
−51.15
−51.15
−51.15
−43.15
−43.15
−43.15
−43.15
−35.15
−50.85
−50.85
−50.85
−50.85
−42.85
−42.85
−42.85
−42.85
−34.85
7 of 15
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Verifying Specifications
Agilent 35670A
Operation Verification Test Record - Four Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Amplitude Accuracy (continued)
Measurement
Lower Limit
Upper Limit
(dBfs)
Measured Value
(dBfs)
Pass/Fail
−35 dBVrms, Ch 2
−35 dBVrms, Ch 3
−35 dBVrms, Ch 4
−27 dBVrms, Ch 1
−27 dBVrms, Ch 2
−27 dBVrms, Ch 3
−27 dBVrms, Ch 4
−11 dBVrms, Ch 1
−11 dBVrms, Ch 2
−11 dBVrms, Ch 3
−35.15
−35.15
−35.15
−27.15
−27.15
−27.15
−27.15
−11.15
−11.15
−11.15
−11.15
0.85
−34.85
−34.85
−34.85
−26.85
−26.85
−26.85
−26.85
−10.85
−10.85
−10.85
−10.85
1.15
−11 dBVrms, Ch 4
1 dBVrms, Ch 1
1 dBVrms, Ch 2
1 dBVrms, Ch 3
1 dBVrms, Ch 4
9 dBVrms, Ch 1
9 dBVrms, Ch 2
9 dBVrms, Ch 3
9 dBVrms, Ch 4
19 dBVrms, Ch 1
19 dBVrms, Ch 2
19 dBVrms, Ch 3
19 dBVrms, Ch 4
27 dBVrms, Ch 1
27 dBVrms, Ch 2
27 dBVrms, Ch 3
27 dBVrms, Ch 4
0.85
1.15
0.85
1.15
0.85
1.15
8.85
9.15
8.85
9.15
8.85
9.15
8.85
9.15
18.85
18.85
18.85
18.85
26.85
26.85
26.85
26.85
19.15
19.15
19.15
19.15
27.15
27.15
27.15
27.15
8 of 15
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Agilent 35670A
Verifying Specifications
Operation Verification Test Record - Four Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Flatness
Measurement
Lower Limit
(dB)
Upper Limit
(dB)
Measured Value
(dB)
Pass/Fail
27 dBVrms, 51.2 kHz, One Ch, Ch 1
9 dBVrms, 51.2 kHz, One Ch, Ch 1
0.2
0.2
0.2
0.2
0.2
0.2
0.2
0.2
0.2
0.2
0.2
0.2
0.2
0.2
0.2
0.2
0.2
0.2
0.2
0.2
0.2
−0.2
−0.2
−0.2
−0.2
−0.2
−0.2
−0.2
−0.2
−0.2
−0.2
−0.2
−0.2
−0.2
−0.2
−0.2
−0.2
−0.2
−0.2
−0.2
−0.2
−0.2
−11 dBVrms, 51.2 kHz, One Ch, Ch 1
27 dBVrms, 51.2 kHz, Two Ch, Ch 1
27 dBVrms, 51.2 kHz, Two Ch, Ch 2
9 dBVrms, 51.2 kHz, Two Ch, Ch 1
9 dBVrms, 51.2 kHz, Two Ch, Ch 2
−11 dBVrms, 51.2 kHz, Two Ch, Ch 1
−11 dBVrms, 51.2 kHz, Two Ch, Ch 2
27 dBVrms, 25.6 kHz, Four Ch, Ch 1
27 dBVrms, 25.6 kHz, Four Ch, Ch 2
27 dBVrms, 25.6 kHz, Four Ch, Ch 3
27 dBVrms, 25.6 kHz, Four Ch, Ch 4
9 dBVrms, 25.6 kHz, Four Ch, Ch 1
9 dBVrms, 25.6 kHz, Four Ch, Ch 2
9 dBVrms, 25.6 kHz, Four Ch, Ch 3
9 dBVrms, 25.6 kHz, Four Ch, Ch 4
−11 dBVrms, 25.6 kHz, Four Ch, Ch 1
−11 dBVrms, 25.6 kHz, Four Ch, Ch 2
−11 dBVrms, 25.6 kHz, Four Ch, Ch 3
−11 dBVrms, 25.6 kHz, Four Ch, Ch 4
9 of 15
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Verifying Specifications
Agilent 35670A
Operation Verification Test Record - Four Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Amplitude Linearity
Measurement
Lower Limit
(dB)
Upper Limit
(dB)
Measured Value
(dB)
Pass/Fail
13 dBVrms, Ch 1
13 dBVrms, Ch 2
13 dBVrms, Ch 3
13 dBVrms, Ch 4
−1 dBVrms, Ch 1
−1 dBVrms, Ch 2
−1 dBVrms, Ch 3
−1 dBVrms, Ch 4
−15 dBVrms, Ch 1
−15 dBVrms, Ch 2
−15 dBVrms, Ch 3
−15 dBVrms, Ch 4
−29 dBVrms, Ch 1
−29 dBVrms, Ch 2
−29 dBVrms, Ch 3
−29 dBVrms, Ch 4
−43 dBVrms, Ch 1
−43 dBVrms, Ch 2
−43 dBVrms, Ch 3
−43 dBVrms, Ch 4
−53 dBVrms, Ch 1
−53 dBVrms, Ch 2
−53 dBVrms, Ch 3
−53 dBVrms, Ch 4
0.061
0.061
0.061
0.061
0.104
0.104
0.104
0.104
0.318
0.318
0.318
0.318
1.316
1.316
1.316
1.316
5.088
5.088
5.088
5.088
10.896
10.896
10.896
10.896
−0.0615
−0.0615
−0.0615
−0.0615
−0.105
−0.105
−0.105
−0.105
−0.33
−0.33
−0.33
−0.33
−1.551
−1.551
−1.551
−1.551
−13.823
−13.823
−13.823
−13.823
−30.116
−30.116
−30.116
−30.116
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Agilent 35670A
Verifying Specifications
Operation Verification Test Record - Four Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
A Weight Filter
Measurement
Lower Limit
(dB)
Upper Limit
(dB)
Measured Value
(dB)
Pass/Fail
Ch 1, 10 Hz
2
2
−5
−5
Ch 2, 10 Hz
Ch 3, 10 Hz
2
−5
Ch 4, 10 Hz
2
−5
Ch 1, 31.62 Hz
Ch 2, 31.62 Hz
Ch 3, 31.62 Hz
Ch 4, 31.62 Hz
Ch 1, 100 Hz
Ch 2, 100 Hz
Ch 3, 100 Hz
Ch 4, 100 Hz
Ch 1, 1000 Hz
Ch 2, 1000 Hz
Ch 3, 1000 Hz
Ch 4, 1000 Hz
Ch 1, 10000 Hz
Ch 2, 10000 Hz
Ch 3, 10000 Hz
Ch 4, 10000 Hz
Ch 1, 25120 Hz
Ch 2, 25120 Hz
Ch 3, 25120 Hz
Ch 4, 25120 Hz
1
−1
1
−1
1
−1
1
−1
0.7
0.7
0.7
0.7
0.7
0.7
0.7
0.7
2
−0.7
−0.7
−0.7
−0.7
−0.7
−0.7
−0.7
−0.7
−3
2
−3
2
−3
2
−3
2.4
2.4
2.4
2.4
−4.5
−4.5
−4.5
−4.5
11 of 15
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Verifying Specifications
Agilent 35670A
Operation Verification Test Record - Four Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Channel Match
Two Ch, 2/1, 7 dBV FS Mag
0.04
0.5
−0.04
−0.5
Two Ch, 2/1, 7 dBV FS Phs
0.04
0.5
Two Ch, 2/1, −13 dBV FS Mag
Two Ch, 2/1, −13 dBV FS Phs
Two Ch, 2/1, −33 dBV FS Mag
Two Ch, 2/1, −33 dBV FS Phs
Two Ch, 2/1, 7 dBV −20 dBfs Mag
Two Ch, 2/1, 7 dBV −20 dBfs Phs
Four Ch, 2/1, 7 dBV FS Mag
Four Ch, 2/1, 7 dBV FS Phs
−0.04
−0.5
0.04
0.5
−0.04
−0.5
0.08
0.5
−0.08
−0.5
0.04
0.5
−0.04
−0.5
0.04
0.5
Four Ch, 2/1, −13 dBV FS Mag
Four Ch, 2/1, −13 dBV FS Phs
Four Ch, 2/1, −33 dBV FS Mag
Four Ch, 2/1, −33 dBV FS Phs
Four Ch, 2/1, 7 dBV −20 dBfs Mag
Four Ch, 2/1, 7 dBV −20 dBfs Phs
Four Ch, 3/1, 7 dBV FS Mag
Four Ch, 3/1, 7 dBV FS Phs
−0.04
−0.5
0.04
0.5
−0.04
−0.5
0.08
0.5
−0.08
−0.5
0.04
0.5
−0.04
−0.5
0.04
0.5
Four Ch, 3/1, −13 dBV FS Mag
Four Ch, 3/1, −13 dBV FS Phs
Four Ch, 3/1, −33 dBV FS Mag
Four Ch, 3/1, −33 dBV FS Phs
Four Ch, 3/1, 7 dBV −20 dBfs Mag
Four Ch, 3/1, 7 dBV −20 dBfs Phs
Four Ch, 4/1, 7 dBV FS Mag
Four Ch, 4/1, 7 dBV FS Phs
−0.04
−0.5
0.04
0.5
−0.04
−0.5
0.08
0.5
−0.08
−0.5
0.04
0.5
−0.04
−0.5
0.04
0.5
Four Ch, 4/1, −13 dBV FS Mag
Four Ch, 4/1, −13 dBV FS Phs
Four Ch, 4/1, −33 dBV FS Mag
Four Ch, 4/1, −33 dBV FS Phs
Four Ch, 4/1, 7 dBV −20 dBfs Mag
Four Ch, 4/1, 7 dBV −20 dBfs Phs
Four Ch, 4/3, 7 dBV FS Mag
−0.04
−0.5
0.04
0.5
−0.04
−0.5
0.08
0.5
−0.08
−0.5
0.04
−0.04
12 of 15
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Agilent 35670A
Verifying Specifications
Operation Verification Test Record - Four Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Four Ch, 4/3, 7 dBV FS Phs
Four Ch, 4/3, −13 dBV FS Mag
Four Ch, 4/3, −13 dBV FS Phs
Four Ch, 4/3, −33 dBV FS Mag
Four Ch, 4/3, −33 dBV FS Phs
Four Ch, 4/3, 7 dBV −20 dBfs Mag
Four Ch, 4/3, 7 dBV −20 dBfs Phs
0.5
0.04
0.5
−0.5
−0.04
−0.5
0.04
0.5
−0.04
−0.5
0.08
0.5
−0.08
−0.5
Frequency Accuracy
Measurement
Lower Limit
(kHz)
Upper Limit
(kHz)
Measured Value
(kHz)
Pass/Fail
50 kHz
49.9985
50.0015
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Verifying Specifications
Agilent 35670A
Operation Verification Test Record - Four Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Single Ch Phase Accuracy
Measurement
Lower Limit
(deg)
Upper Limit
(deg)
Measured Value
(deg)
Pass/Fail
Positive slope, Ch 1
4
4
4
4
4
4
4
4
−4
−4
−4
−4
−4
−4
−4
−4
Positive slope, Ch 2
Positive slope, Ch 3
Positive slope, Ch 4
Negative slope, Ch 1
Negative slope, Ch 2
Negative slope, Ch 3
Negative slope, Ch 4
Tach Function (option D01 only)
Measurement
Lower Limit
Upper Limit
(%)
Measured Value
(%)
Pass/Fail
(%)
−10
−10
−10
−10
Trigger level +8V Pos
10
10
10
10
Trigger level +8V Neg
Trigger level −8V Pos
Trigger level −8V Neg
ICP Supply
Measurement
Lower Limit
26 Vdc
Upper Limit
32 Vdc
Measured Value
Pass/Fail
Ch 1 Open Circuit Voltage
Ch 2 Open Circuit Voltage
Ch 3 Open Circuit Voltage
Ch 4 Open Circuit Voltage
Ch 1 Current
Vdc
Vdc
Vdc
Vdc
mA
mA
mA
mA
26 Vdc
32 Vdc
26 Vdc
32 Vdc
26 Vdc
32 Vdc
2.75 mA
2.75 mA
2.75 mA
2.75 mA
5.75 mA
5.75 mA
5.75 mA
5.75 mA
Ch 2 Current
Ch 3 Current
Ch 4 Current
14 of 15
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Agilent 35670A
Verifying Specifications
Operation Verification Test Record - Four Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Source Amplitude Accuracy
Measurement
Lower Limit
(%)
Upper Limit
(%)
Measured Value
(%)
Pass/Fail
Pass/Fail
Pass/Fail
1 kHz, 0.1 Vpk
1 kHz, 3.0 Vpk
1 kHz, 5.0 Vpk
4
4
4
−4
−4
−4
Source Flatness
Measurement
Lower Limit
(dB)
Upper Limit
(dB)
Measured Value
(dB)
12.8 kHz
25.6 kHz
51.2 kHz
1
1
1
−1
−1
−1
Source Distortion
Measurement
Lower Limit
Upper Limit
(dBc)
Measured Value
(dBc)
12.8 kHz
51.2 kHz
−60
−40
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4
Troubleshooting the
Analyzer
4-1
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Troubleshooting the Analyzer
This chapter contains troubleshooting tests that can isolate most failures to the
faulty assembly. The section ‘’How to troubleshoot the analyzer’’ tells you
which test to start with based on the failure. The test you start with will either
isolate the faulty assembly or send you to another test to continue
troubleshooting.
Safety Considerations
The Agilent 35670A Dynamic Signal Analyzer is a Safety Class 1 instrument
(provided with a protective earth terminal). Although the instrument has been
designed in accordance with international safety standards, this manual
contains information, cautions, and warnings that must be followed to ensure
safe operation and retain the instrument in safe operating condition. Service
must be performed by trained service personnel who are aware of the hazards
involved (such as fire and electrical shock).
Warning
Any interruption of the protective (grounding) conductor inside or outside the
analyzer, or disconnection of the protective earth terminal can expose operators
to potentially dangerous voltages.
Under no circumstances should an operator remove any covers, screws, shields or
in any other way access the interior of the Agilent 35670A Dynamic Signal
Analyzer. There are no operator controls inside the analyzer.
Only fuses with the required current rating and of the specified type should be
used for replacement. The use of repaired fuses or short circuiting the fuse
holder is not permitted. Whenever it is likely that the protection offered by the
fuse has been impaired, the analyzer must be made inoperative and secured
against any unintended operation.
When power is removed from the Agilent 35670A Dynamic Signal Analyzer,
+225 volts are present in the display for approximately 5 seconds. Be extremely
careful when working in proximity to this area during this time. The high voltage
can cause serious personal injury if contacted.
Caution
Do not connect or disconnect ribbon cables with the power switch set to on ( l ).
Power transients caused by connecting or disconnecting a cable can damage circuit
assemblies.
4-2
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Agilent 35670A
Troubleshooting the Analyzer
Equipment Required
recommended equipment. Any equipment which meets the critical specifications
given in the tables may be substituted for the recommended model.
Troubleshooting Hints
• Incorrect bias supply voltages can cause false diagnostic messages. In most
troubleshooting procedures, the power supply voltages are not checked. If you
suspect incorrect supply voltages to an assembly, use the ‘’Voltages and Signals’’
chapter to check the voltages at the assembly.
• Cables can cause intermittent hardware failures.
• Noise or spikes in the power supply can cause the analyzer to fail.
• Measurements in this chapter are only approximate (usually 1 dB or 10%) unless
stated otherwise.
• Use chassis ground for all measurements in this chapter unless stated otherwise.
• To determine your firmware version code, press [ System Utility ] [ MORE ]
[ S/N VERSION ].
• Logic levels in this chapter are either TTL level high or TTL level low unless stated
otherwise. Toggling signal levels continually change from one TTL level to the
other.
• The troubleshooting tests in this chapter assume only one independent failure.
Multiple failures can cause false results.
• The troubleshooting procedures do not isolate failures to cables or connectors. If
you suspect a cable or connector failure, check the device for continuity.
• If you abort a self test before the self test is finished, the analyzer may fail its
calibration routine. To prevent this from happening press [ Preset ] [ DO PRESET ]
or cycle power after you abort the self test.
4-3
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Troubleshooting the Analyzer
Agilent 35670A
How to troubleshoot the analyzer
How to troubleshoot the analyzer
• Review ‘’Safety Considerations’’ and ‘’Troubleshooting Hints.’’
Warning
Service must be performed by trained service personnel who are aware of the
hazards involved (such as fire and electrical shock).
• See chapter 6, ‘’Replacing Assemblies,’’ to determine how to disassemble and
assemble the analyzer.
• Determine initial test by comparing the analyzer’s symptoms to the symptoms
in the following table.
Symptom
Troubleshooting Test
Screen blank †
Screen defective
Initial verification, page
After power up, >3 minutes before keys active
No response when key is pressed
Incorrect response when key is pressed
Error messages
Calibration fails
Self tests, page 4-31
Performance test fails
Intermittent failure
GPIB fails
Mic pwr fails
Serial port fails
Parallel port fails
External monitor does not work
External keyboard does not work
DIN connector, page
External trigger fails
Trigger, page 4-62
Nonvolatile states not saved after power cycled
Date display is ‘’Date: 01-01-BL’’
Memory battery, page
† If the analyzer is failing, the grid may not appear for two minutes. Wait two minutes before assuming
that a low level failure occurred.
• Follow the recommended troubleshooting test until you locate the faulty
assembly.
• Replace the faulty assembly and follow the directions in ‘’What to do after
replacing an assembly’’ in chapter 6, ‘’Replacing Assemblies.’’
4-4
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Agilent 35670A
Troubleshooting the Analyzer
To perform initial verification
To perform initial verification
Use this test to check signals that are vital to the operation of the analyzer.
Step 1. Check the power select switch and fuse.
• Check that the POWER SELECT switch on the rear of the analyzer is set to
the AC position.
• Check that the correct line fuse is installed in the rear panel fuse holder.
For information on the power select switch and line fuse, see ‘’To do the incoming
Step 2. If the grid appears after power up but there is no response when keys are
pressed, ckeck that the calibration routine is not locking up the analyzer.
• Set the power switch to off ( O ).
• Set the power switch to on ( l ) and as soon as Booting System appears on the
display, disable the calibration routine by holding [ Preset ] until Uncalibrated
data appears.
failures.’’
Step 3. If the analyzer powers up with failure messages, then locks up, but the grid
4-5
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Troubleshooting the Analyzer
To perform initial verification
Agilent 35670A
Step 4. If the analyzer powers up normally with no error messages (see the following
illustration), the screen is continually updating, but the analyzer does not respond to
key presses, use the following table to determine the probable faulty assembly.
Symptom
Probable Faulty Assembly
SYSTEM keys function but MARKER, DISPLAY,
MEASUREMENT, or number keys do not function correctly
A13 or A15 Primary Keypad
MARKER, DISPLAY, MEASUREMENT, and number keys A14 Secondary Keypad
function but SYSTEM keys do not function correctly
No keys function correctly
A11 Keyboard Controller
4-6
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Agilent 35670A
Troubleshooting the Analyzer
To perform initial verification
Step 5. Check the power supply LED and fan.
• Set the power switch to off ( O ) and disconnect the power cord from the
rear panel.
• Remove the cover.
See ‘’To remove cover’’ on page 6-6.
• Connect the power cord and set the power switch to on ( l ).
the power supply.’’
• Check that the fan is turning at a moderate speed for normal room
temperature.
The fan is very quiet. Check air flow before determining that the fan is not turning.
supply.’’
4-7
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Troubleshooting the Analyzer
To perform initial verification
Agilent 35670A
Step 6. Check the following TTL clock signals using an oscilloscope and a
1 MΩ 10:1 probe.
Signal Name
FREQ REF
G20MHz
VCLK
Test Location
A7 TP1
Frequency
19.923 MHz
19.923 MHz
20 MHz
Probable Faulty Assembly
A7 CPU
A7 J3 pin 32C
A7 P2 pin 13
A6 TP105
A7 CPU
A7 CPU
SYSCLK
10 MHz
A6 Digital
4-8
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Agilent 35670A
Troubleshooting the Analyzer
To perform initial verification
A7 Component Locator, Circuit Side
4-9
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Troubleshooting the Analyzer
To perform initial verification
Agilent 35670A
Step 7. Check signals required for power up.
• Using a logic probe, check the following signals.
Signal Name
PVALID
RSTn
Test Location
A7 P8 pin 3
A7 P8 pin 5
A7 P7 pin 3
A7 P7 pin 4
A7 P7 pin 7
A7 P6 pin 10
TTL State
High
Probable Faulty Assembly
A98 Power Supply
A7 CPU
High
CASn
Toggling
Toggling
Toggling
Toggling
A7 CPU
RASn
A7 CPU
VDATA
ASn
A7 CPU
A7 CPU
• Using a logic probe, check that the following TTL signals are toggling just
after power up.
The signals may stop toggling when the CPU assembly finishes the bootrom self
tests.
Signal Name
PASn
Test Location
A7 P8 pin 7
A7 P8 pin 8
A7 P8 pin 9
A7 P8 pin 10
A7 P8 pin 11
A7 P8 pin 12
A7 P8 pin 13
PDSACK1n
PDSACK0n
PRW
PDSn
PA(26)
PA(16)
• If the signals are not correct, the A7 CPU assembly is probably faulty.
• Using a logic probe, check that A7 P7 pin 2 (SCL) and A7 P7 pin 1 (SDA)
toggle TTL states at least twice just after power up.
• If the signals are not correct, the A7 CPU assembly is probably faulty.
failures.’’
4-10
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Agilent 35670A
Troubleshooting the Analyzer
To troubleshoot the power supply
To troubleshoot the power supply
Use this test to check the Power Supply and Fan assemblies. This test can also isolate
the assembly causing the Power Supply to shut down.
Step 1. Check the power supply LED.
• Set the power switch to off ( O ).
• Disconnect the ribbon cable from the A98 Power Supply assembly.
• Set the power switch to on ( l ).
• If the green power supply LED is not lit, the A98 Power Supply assembly is
probably faulty.
• Set the power switch to off ( O ).
• Reconnect the ribbon cable to the Power Supply assembly.
• Set the power switch to on ( l ).
• If the power supply LED is on but the fan is not turning, go to Step 7.
A thermistor on the A10 Rear Panel assembly controls the power to the A90 Fan
assembly. As the analyzer’s temperature increases, the fan speed increases. Since
the fan is very quiet, check air flow before determining that the fan is not turning.
4-11
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Troubleshooting the Analyzer
Agilent 35670A
To troubleshoot the power supply
Step 2. Determine if the Digital, Analog, or Input assemblies are causing the Power
Supply assembly to shut down.
• Set the power switch to off ( O ).
• Pull the following assemblies out of the card nest about 1 inch:
A6 Digital
A5 Analog
A2 Input (optional)
A1/A2 Input
• Set the power switch to on ( l ).
• If the power supply LED is still off, set the power switch to off ( O ),
reconnect the above assemblies, and go to Step 4.
Step 3. Repeat the following until the assembly causing the Power Supply assembly to
shut down is located.
• Set the power switch to off ( O ).
• Reconnect one assembly at a time in the following order.
A6 Digital
A5 Analog
A2 Input (optional)
A1/A2 Input
• Set the power switch to on ( l ).
• If the green power supply LED is off, the assembly just reconnected is
probably faulty.
The A5 Analog assembly provides over-temperature protection which shuts down
the power supply if the analyzer’s internal temperature becomes excessive. Before
replacing the A5 Analog assembly, check that the fan is turning when the green
power supply LED is on and that the air flow is not restricted (cooling air enters
from the right side and exhausts through the left side and rear panel). Since the fan
is very quiet, check air flow to determine that the fan is turning.
Step 4. Determine if the CPU assembly or one of the assemblies connected to the
CPU assembly is causing the power supply to shut down.
4-12
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Agilent 35670A
Troubleshooting the Analyzer
To troubleshoot the power supply
• Remove the A7 CPU assembly.
See ‘’To remove CPU’’ on page 6-11.
• Set the power switch to on ( l ).
• If the power supply LED is still off, set the power switch to off ( O ),
reconnect the CPU assembly, and go to Step 6.
Step 5. Repeat the following steps until the assembly causing the Power Supply
assembly to shut down is located.
• Set the power switch to off ( O ).
• Reconnect one assembly at a time in the following order:
A7 CPU (A7 P10 to A99 J7)
A8 Memory (A8 P1 to A7 J3)
A102 DC-DC Converter (cable to A7 P2)
A11 Keyboard Controller (cable to A7 P1)
A100 Disk Drive (cable to A7 P3)
• Set the power switch to on ( l ).
• If the green power supply LED is off, the assembly just reconnected is
probably faulty.
A7 Component Locator, Circuit Side
4-13
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Troubleshooting the Analyzer
Agilent 35670A
To troubleshoot the power supply
Step 6. Determine if the Motherboard, Fan, or Rear Panel assembly is causing the
Power Supply to shut down.
• Disconnect the fan cable from A99 P90.
• Set the power switch to on ( l ).
• If the power supply LED is now on, the A90 Fan assembly is probably
faulty.
• Set the power switch to off ( O ).
• Reconnect the fan cable.
• Remove the rear panel and disconnect the cable from A10 P100.
See ‘’To remove rear panel’’ on page 6-7.
• Set the power switch to on ( l ).
• If the power supply LED is now on, the A10 Rear Panel assembly is
probably faulty.
• If the Fan or Rear Panel assembly is not causing the Power Supply assembly
to shut down, then the A99 Motherboard is probably faulty.
Step 7. Check the Fan assembly.
• Set the power switch to off ( O ).
• Remove the A7 CPU assembly.
See ‘’To remove CPU’’ on page 6-11.
• Disconnect the fan power cable from A99 P90 (red and black cable).
• Connect 5 Vdc to the fan cable. The fan should be turning slowly.
• Increase the voltage to 10 Vdc. The fan should turn faster as the voltage
increases.
• If the fan did not respond correctly, the A90 Fan assembly is probably
faulty.
• If the fan responded correctly, the A10 Rear Panel assembly is probably
faulty.
4-14
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Agilent 35670A
Troubleshooting the Analyzer
To troubleshoot power-up failures
To troubleshoot power-up failures
Use this test when the screen is defective, when the analyzer does not respond
correctly to the keyboard, or when it takes more than 3 minutes for the keyboard to
become active. Any of the following conditions may cause a power-up failure:
• A defective CPU or Memory assembly.
• A defective assembly connected to the CPU assembly causing a bus failure.
• A defective cable between the CPU assembly and another assembly.
• A defective control line.
Step 1. Compare the power-up failure messages to the following table.
• Set the power switch to on ( l ).
• If the screen is blank or no power-up failure messages are displayed, go to
Step 2.
• Determine the probable faulty assembly or next test by comparing the
power-up test result to the following table.
If the power-up failure messages match more than one entry in the table, use the
entry closest to the beginning of the table.
Failing Power-up Message
Probable Faulty Assembly or Next Test
LEDs
A7 CPU
MC68030 Processor
MC68882 Coprocessor
Bootrom
Display
Main RAM
Program ROM
CPU, memory, DSP, and buses failures,
page 4-18
DSP
A7 CPU
Fast bus
IIC Bus failures, page 4-25
A7 CPU
MFP
GPIB keypress detected, booting to GPIB Monitor
A14 Secondary Keypad
A11 Keyboard Controller
Front Panel failure information:
keyboard IIC chip fails:
IIC: No Device Acknowledge
key stuck: 32
Front Panel failure information:
key stuck: number
A14 Secondary Keypad
where number is 13, 14, 16, 20, 21, 24, 33,
35, 36, 37, 38, 40, 43, 52, 53, or 54
Front Panel failure information:
key stuck: number
all other numbers not listed above
A13 or A15 Primary Keypad
4-15
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Troubleshooting the Analyzer
Agilent 35670A
To troubleshoot power-up failures
Step 2. Determine if the power-on test passed or failed.
• Set the power switch to off ( O ).
• Set the power switch to on ( l ) while watching the power-on LEDs.
The power-on LEDs are on the A7 CPU assembly and are visible through the rear
panel. To see the LEDs easier, remove the seven screws holding the rear panel to
the analyzer and lean the rear panel back. This also gives you access to reset switch
SW2.
• If the power-on LEDs responded as follows, the power-on test passed.
• All power-on LEDs are on momentarily.
• DS1 (yellow, +5 LED) remains on as long as power is applied to the assembly.
• DS10 (green, run LED) comes on just after DS1.
• DS5, DS4, DS3, DS2, DS6, DS7, DS8, and DS9 sequence through the codes listed
in the following table.
4-16
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Agilent 35670A
Troubleshooting the Analyzer
To troubleshoot power-up failures
Binary
Hexa-
~Time LEDs Description
(DS5) (DS9)
decimal
Visible
1111 1111
0000 0000
FF
00
200 ms on
200 ms off
A7 flashes LEDs
0000 1000
0000 0010
0001 0100
0001 0110
0001 1100
0000 0000
1010 0000
1010 0001
1010 0010
0101 1110
1111 1111
08
†
starting A7 test
02
†
A8 RAM DSACK test
starting A8 RAM test
starting A8 refresh test
starting A8 program ROM test
clear LEDs
14
†
16
†
1C
00
4s
4s
A0
A1
A2
AE
FF
†
A7 MFP test
†
starting A7 DSP test
fast bus test
†
200 ms
Remain on
front panel test
0 = LED off
1 = LED on
† When no failure occurs, these codes appear for only a very short time and probably won’t be visible.
• If the power-on LEDs display a code for more than 4 seconds, a failure
occurred in the core assemblies or on the buses.
For additional information on the power-on test, see the ‘’Power-on Test
Descriptions’’ on page 10-3.
Step 3. Determine the next step by comparing the power-on test results to the
following table.
Power-on LEDs
Next Test
LEDs stop and display a fail code.
A7 DS101 (green, run LED) is off.
CPU, memory, and
buses, page 4-18
LEDs pass, but the screen is defective.
Display, 4-22
LEDs pass and screen appears normal, but keys do not function.
4-17
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Troubleshooting the Analyzer
Agilent 35670A
To troubleshoot CPU, memory, and buses failures
To troubleshoot CPU, memory, and buses failures
Use this test to isolate the failure when the power-on LEDs show a fail code or the
analyzer locks up during the power-up tests.
Step 1. Compare the LED fail code to the following table.
• Set the power switch to off ( O ).
• Set the power switch to on ( l ) while watching the power-on LEDs.
The power-on LEDs are on the A7 CPU assembly and are visible through the rear
panel. To see the LEDs easier, remove the seven screws holding the rear panel to
the analyzer and lean the rear panel back. This also gives you access to reset switch
SW2.
• Determine the probable faulty assembly by comparing the power-on LEDs
fail code to the following table.
The power-on LEDs are showing a fail code when the LEDs display a code for
more than 4 seconds.
4-18
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Agilent 35670A
Troubleshooting the Analyzer
To troubleshoot CPU, memory, and buses failures
Binary
Hexadecimal
Probable Faulty Assembly
(DS5) (DS9)
0000 0100
1111 1111
0001 0011
0000 0001
0001 0111
0001 1000
0000 1001
0000 1011
0001 1010
0001 1001
0000 1000
0001 0010
1010 0000
04
FF
13
01
17
18
09
0B
1A
19
08
12
A0
A7 CPU
0000 0010
0001 1011
0001 0100
0001 0110
0001 1100
02
1B
14
16
1C
A8 Memory
0 = LED off
1 = LED on
Step 2. Determine if the CPU assembly is causing the failure.
• Set the power switch to off ( O ).
• Pull the following assemblies out of the card nest about 1 inch:
A6 Digital
A5 Analog
A2 Input (optional)
A1 or A2 Input
4-19
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Troubleshooting the Analyzer
Agilent 35670A
To troubleshoot CPU, memory, and buses failures
• Disconnect the A7 CPU assembly from the Motherboard, Memory
assembly, and cables.
• Reconnect the CPU assembly to the Motherboard (do not connect the
Memory assembly or cables to the CPU assembly).
A7 Component Locator, Circuit Side
• Set the power switch to on ( l ) while watching the power-on LEDs.
• If the LEDs did not display hexadecimal FF (1111 1111) then hexadecimal
02 (0000 0010), the A7 CPU assembly is probably faulty.
4-20
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Agilent 35670A
Troubleshooting the Analyzer
To troubleshoot CPU, memory, and buses failures
Step 3. Determine if the Memory or Display assembly is causing the failure.
• Set the power switch to off ( O ).
• Reconnect the Memory assembly to the CPU assembly.
• Set the power switch to on ( l ) while watching the power-on LEDs.
The LEDs should sequence through 00 (clear LEDs) with 00 remaining on the
LEDs.
• Set the power switch to off ( O ).
• Reconnect the display cable to A7 P2.
• Set the power switch to on ( l ) while watching the power-on LEDs.
The LEDs should sequence through 00 (clear LEDs) with 00 remaining on the
LEDs. The following is an example of the messages displayed when the CPU and
memory power-on tests pass. The numbers in the messages will most likely be
different in your analyzer.
Copyright 1988, 1990, 1991, 1992, 1993,
Agilent Technologies Company,
All rights reserved.
LEDs
MC68030 Processor
MC68882 Coprocessor
Bootrom revision A.01.17
Main RAM
Testing 8388608 bytes at 0x06c00000
Program ROM
Copyright 1991, 1992, 1993, Agilent Technologies Company
Booting System
failures.’’
troubleshoot power-up failures’’ procedure to determine the probable faulty
assembly.
failures.’’
4-21
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Troubleshooting the Analyzer
To troubleshoot display failures
Agilent 35670A
To troubleshoot display failures
Use this test to isolate display failures to the A101 Display assembly, A102 DC-DC
Converter assembly, or A7 CPU assembly.
Step 1. Check the DC-DC Converter assembly.
• Set the power switch to off ( O ).
• Connect the voltmeter to A102 TP1.
• Set the power switch to on ( l ).
• Check that the voltage reads is 210 10 Vdc.
Caution
The Display assembly will be damaged if the voltage is at or above 235 Vdc.
• If the voltage is incorrect, the A102 DC-DC Converter assembly is probably
faulty.
4-22
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Agilent 35670A
Troubleshooting the Analyzer
To troubleshoot display failures
Step 2. Check the CPU signals to the Display assembly.
• Set the power switch to on ( l ).
• Using a logic probe, check that the following TTL signals are toggling.
Test Location
A7 P2(9)
Signal Name
VSYNCEL
HSYNCELn
VCLK
In/Out
A7 Out
A7 Out
A7 Out
A7 Out
A7 P2(11)
A7 P2(13)
A7 P2(15)
VID
• If the signals are incorrect, do the following:
• Set the power switch to off ( O ).
• Disconnect the display cable from A7 P2.
• Set the power switch to on ( l ).
• Check the signals again.
• If the signals are now correct, the A101 Display assembly is probably faulty.
A7 Component Locator, Circuit Side
4-23
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Troubleshooting the Analyzer
To troubleshoot display failures
Agilent 35670A
Step 3. Determine the probable faulty assembly by comparing the analyzer’s
symptoms to the following table.
Symptom
Probable Faulty Assembly
Vertical and horizontal scanning is occurring
Part of information is missing, for example only half letters
Blocks of information are missing
CPU
Information on the screen is scrambled or mixed up
Vertical or horizontal stripes appear across the screen
Screen is blank
Screen is tilted, compressed, or distorted
Line across the screen
Display
4-24
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Agilent 35670A
Troubleshooting the Analyzer
To troubleshoot IIC bus failures
To troubleshoot IIC bus failures
Use this test to isolate IIC (Inter-IC) bus failures to one of the following assemblies:
• A7 CPU
• A1/A2 Input
• A5 Analog
• A10 Rear Panel
• A11 Keyboard Controller
Step 1. Disconnect all assemblies connected to the CPU assembly’s IIC bus.
• Set the power switch to off ( O ).
• Remove the rear panel and disconnect the cable from A10 P100.
• Pull the following assemblies out of the card nest about 1 inch:
A5 Analog
A2 Input (optional)
A1/A2 Input
• Disconnect the keyboard cable from A7 P1.
4-25
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Troubleshooting the Analyzer
To troubleshoot IIC bus failures
Agilent 35670A
Step 2. Check the serial clock (SCL).
• Attach a logic probe to A7 P7 pin 2 (SCL).
• Set the power switch to on ( l ).
• Press SW2 (reset switch) while monitoring A7 P7 pin 2 (SCL), the power-on
LEDs, and the display.
The TTL logic level should toggle when 00 is displayed and toggle continuously
when Booting System is displayed. The following failure message should be
displayed after Booting System and the display grid should appear about 2 minutes
after power up.
Front Panel failure information:
keyboard IIC chip fails:
IIC: No Device Acknowledge
key stuck: 32
A power-on test has failed. Refer
servicing to qualified personnel.
Press Start key to attempt to continue
power-up.
4-26
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Agilent 35670A
Troubleshooting the Analyzer
To troubleshoot IIC bus failures
• If the signal does not toggle after SW2 is pressed, the A7 CPU assembly is
probably faulty.
• If no error messages are displayed after Booting System or A7 DS101 (green
Step 3. Check the serial data line (SDA).
• Attach the logic probe to A7 P7 pin 1 (SDA).
• Press SW2 while monitoring A7 P7 pin 1 (SDA), the power-on LEDs, and
the display.
The TTL logic level should toggle when 00 is displayed and toggle continuously
when Booting System is displayed. The following failure message should be
displayed after Booting System and the display grid should appear about 2 minutes
after power up.
Front Panel failure information:
keyboard IIC chip fails:
IIC: No Device Acknowledge
key stuck: 32
A power-on test has failed. Refer
servicing to qualified personnel.
Press Start key to attempt to continue
power-up.
• If the signal does not toggle after SW2 is pressed or the failure message is
not displayed, the A7 CPU assembly is probably faulty.
4-27
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Troubleshooting the Analyzer
To troubleshoot IIC bus failures
Agilent 35670A
Step 4. Check the assemblies on the IIC bus by repeating the following steps for each
assembly.
• Set the power switch to off ( O ).
• Reconnect one assembly at a time in the following order.
A11 Keyboard Controller (cable to A7 P1)
A10 Rear Panel (cable to A10 P100)
A5 Analog
A1/A2 Input (lower slot)
A2 Input (upper slot)
• Set the power switch to on ( l ).
• After the softkey menu appears, (about one minute after power up) press
any key.
• If the analyzer does not respond correctly, the assembly just reconnected is
probably faulty.
failures.’’
4-28
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Agilent 35670A
Troubleshooting the Analyzer
To troubleshoot fast bus failures
To troubleshoot fast bus failures
Use this test to isolate Fast Bus failures to the A7 CPU assembly or A6 Digital
assembly.
• Set the power switch to off ( O ).
• Set the power switch to on ( l ) while holding in the [ System Utility ] key.
The screen displays Fast Bus Diagnostic Test ... and the power-on LEDs are flashing.
• If the analyzer did not respond correctly, the A7 CPU assembly is probably
faulty.
• Using a logic probe, check the following signals.
A7 P10 Pin
Signal Name
FA1 to FA5
ECLK
TTL Logic State In Test Mode
64, 114, 65, 115, 66
Toggling
Toggling
Toggling
Low
72
74
FSELAn
BRESETn
FRW
112
119
123
124
Toggling
High
FIFOENn
FSELSn
GND
Toggling
Low
7-11, 21-45, 59, 71, 109,
118, 120, 122, 147, 149
• If the signals are correct, the A6 Digital assembly is probably faulty.
• If any signal is incorrect, the A7 CPU assembly is probably faulty.
This is only a partial check of the fast bus signals between the A7 CPU assembly
and the A6 Digital assembly.
4-29
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Troubleshooting the Analyzer
Agilent 35670A
To troubleshoot fast bus failures
4-30
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Agilent 35670A
Troubleshooting the Analyzer
To perform self tests
To perform self tests
Use this test when one of the following occurs:
• Performance test fails
• Calibration fails
• Trigger fails
• GPIB fails
• Microphone power fails
• Serial port fails
• Parallel port fails
• Failure is intermittent
Step 1. Run all the functional self tests.
• Connect the rear panel SOURCE output to the rear panel TACH input
using a BNC cable.
• Remove all cables from the front panel input connectors.
Caution
The ICP self test outputs approximately 30 Vdc on the input connectors. Before
starting the self tests, disconnect all devices connected to the input connectors.
Devices left connected during the ICP self test may be damaged.
• Set the power switch to on ( l ).
• After calibration is complete, press the following keys:
[ Input ]
[ ALL CHANNELS ]
[ CH* FIXED RANGE ]
[ System Utility ]
[ CALIBRATN ]
[ AUTO CAL OFF ]
[ Rtn ]
[ MORE ]
[ SELF TEST ]
[ FUNCTIONL TESTS ]
[ ALL ]
[ CONTINUE ]
4-31
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Troubleshooting the Analyzer
To perform self tests
Agilent 35670A
Step 2. Compare the analyzer’s self-test results to the following table.
• When the tests have finished, press the following keys:
[ Rtn ]
[ TEST LOG ]
• Press the [ PREVIOUS PAGE ] softkey until the first page of test log is
displayed.
To print the test log to a GPIB printer, press the following keys:
[ Local/GPIB ]
[ SYSTEM CONTROLLR ]
[ PRINTER ADDRESS ]
(printer address)
[ ENTER ]
[ System Utility ]
[ MORE ]
[ SELF TEST ]
[ TEST LOG ]
[ Plot/Print ]
[ <F"Times""P10 >PLOT/PRNT DEVICE ]
(device type)
[ Rtn ]
[ PLOT/PRNT DESTINATN ]
[ OUTPUT TO GPIB ]
[ Rtn ]
[ START PLOT/PRNT ]
‘’To troubleshoot self-test lockup failures.’’
• If the failure is intermittent and the analyzer passed all self tests, go to page
4-40 ‘’To troubleshoot intermittent failures.’’
• If the analyzer completed the tests, compare the analyzer’s test log to the
following table.
If the analyzer’s test log matches more than one entry on the table, use the entry
closest to the beginning of the table. The table lists the probable faulty assembly or
assemblies and any recommended adjustment or troubleshooting procedure to do
before replacing the assembly. If both an adjustment and a test are recommended,
do the adjustment first.
For additional information on the self tests, see ‘’Self-Test Descriptions’’ on page
4-32
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Agilent 35670A
Troubleshooting the Analyzer
To perform self tests
Self-Test Troubleshooting Guide
Failing Self Test
Probable Faulty Assembly
Adjustment
Troubleshooting Test
Interrupt
A7 CPU
CPU, Memory, and Buses,
page 4-18.
Mult Fctn Peripheral
Front Panel
A7 CPU
A11 Keyboard Controller
A10 Rear Panel
A7 CPU
GPIB
Disk Controller
Disk FIFO
A7 CPU
IIC Bus (If only one
assembly is failing)
Assembly failing. See Test
Log
IIC Bus (If multiple
assemblies are failing)
See Test Log
IIC bus, page 4-25
Fast bus, page 4-29
Fast Bus
A7 CPU
A6 Digital
Trigger Gate Array
LO Gate Array
Digital Filter Gate Array
FIFO
A6 Digital †
A6 Digital
A6 Digital
A6 Digital
A5 Analog
Baseband Zoom
ADC Gate Array
All other self tests pass
Baseband
Zoom
All other self tests pass
A6 Digital
Baseband
A5 Analog
A6 Digital
Source and calibrator,
page 4-45
Zoom
A5 Analog
A6 Digital
Source and calibrator,
page 4-45
Source through DSP
Source LO
A6 Digital
A6 Digital
A6 Digital
Source to CPU
† Analyers with firmware revision A.00.00 may fail the Trigger Gate Array test when the A1/A2 Input or
determine the probable faulty assembly.
4-33
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Troubleshooting the Analyzer
To perform self tests
Agilent 35670A
Self-Test Troubleshooting Guide (continued)
Failing Self Test
Probable Faulty Assembly
Adjustment
Troubleshooting Test
Source With LO fails and
Source Without LO passes
A6 Digital
Source Without LO
one channel
A1/A2 Input
A5 Analog
Input and ADC, page 4-51
Four channel, page 4-54
Source Without LO
channel 1 and 3 or
channel 2 and 4
A2 Input
Source With LO
one channel
A1/A2 Input
A5 Analog
Input and ADC, page 4-51
Four channel, page 4-54
Source With LO
channel 1 and 3 or
channel 2 and 4
A2 Input
Input Offset
A1/A2 Input
Input dc offset, page 5-10
one channel or
channel 1 and 3 or
channel 2 and 4
ADC Gate Array
A5 Analog
A6 Digital
ADC gain, offset, and
reference, page 5-10
Source and calibrator,
page 4-45
Source Without LO
all channels
A5 Analog
A6 Digital
Source and calibrator,
page 4-45
Source With LO
all channels
A5 Analog
A6 Digital
Source and calibrator,
page 4-45
Input Offset
all channels
A5 Analog
ADC gain, offset, and
reference, page 5-7
Input Distortion
one channel
A1/A2 Input
A5 Analog
Input and ADC, page 4-51
Four channel, page 4-54
Input Distortion
channel 1 and 3 or
channel 2 and 4
A2 Input
Input Distortion
all channels
A5 Analog
A6 Digital
ADC Gain, offset, and
reference, page 5-7
Source and calibrator,
page 4-45
Input Trigger
A5 Analog
one or more channels fail,
but at least one channel
passes
Input Trigger
A5 Analog
A6 Digital
Trigger, page 4-62
4-34
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Agilent 35670A
Troubleshooting the Analyzer
To perform self tests
Self-Test Troubleshooting Guide (continued)
Failing Self Test
Probable Faulty Assembly
Adjustment
Troubleshooting Test
Input A-Wt Filter
one channel or channel 1 and
3 or channel 2 and 4
A1/A2 Input
Input A-Wt Filter
all channels
A6 Digital
Input AAF/Bypass
one channel or
A1/A2 Input
Filter flatness, page 5-17
channel 1 and 3 or
channel 2 and 4
Input AAF/Bypass
all channels
A6 Digital
Input ICP Source †
one channel or
A1/A2 Input
channel 1 and 3 or
channel 2 and 4
Tachometer ‡
A6 Digital
A10 Rear Panel
Tachometer, page 4-24
Source Filter
Source DC
A5 Analog
A5 Analog
Quick Confidence
A1/A2 Input
A5 Analog
A6 Digital
Input dc offset, page 5-10
ADC gain, offset, and
reference, page 5-7
Performance test, page 4-42
Filter flatness, page 5-17
All self tests pass
Next Step
† This test fails if a device is connected to the front panel input connectors.
‡ This test fails if the Source output is not connected to the Tachometer input.
4-35
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Troubleshooting the Analyzer
To perform self tests
Agilent 35670A
Step 3. Determine the probable faulty assembly and next test by comparing the
analyzer’s symptoms to the following table.
Failure
Probable Faulty Assembly
Next Test
Disk drive
A100 Disk Drive
Flexible disk
Disk drive cable
A7 CPU
Disk drive, page 4-57
GPIB
A10 Rear Panel †
A10 Rear Panel †
A10 Rear Panel †
Serial port
Parallel
External trigger
A10 Rear Panel
A5 Analog
Trigger failures, page 4-62
Tachometer, page 4-24
Tachometer
Source
A10 Rear Panel
A6 Digital
A5 Analog
A6 Digital
Source and calibrator, page 4-45
Auto-range, page 4-59
Autorange
Overrange
A1/A2 Input
A5 Analog
External keyboard
A10 F200 fuse
External Keyboard
A10 Rear Panel
DIN connector, page 4-61
External monitor
A7 CPU
Microphone power
Microphone adapter
A77 Microphone
A5 Analog
Microphone power, page 4-69
Performance test
Performance test, page 4-42
Intermittent, page 4-40
Intermittent failure
† The circuits for the output ports are located on the A10 Rear Panel assembly except for a few output
buffers on the A7 CPU assembly. If replacing the A10 Rear Panel assembly does not fix the failure, the
A7 CPU assembly is probably faulty.
For additional information on the self tests, see ‘’Self-Test Descriptions’’ starting on page 10-10.
4-36
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Agilent 35670A
Troubleshooting the Analyzer
To troubleshoot self-test lockup failures
To troubleshoot self-test lockup failures
Use this test to continue troubleshooting if the analyzer locked up while running the
functional test ALL.
Step 1. Check the clock signal.
• Set the power switch to on ( l ).
• Using an oscilloscope and a 1 M 10:1 probe, check the following signal.
Oscilloscope Setup
Parameters
Waveform
Connect CH1 to A6 TP105
Time
Duty Cycle
CH1 V/div
Input Impedance
CH1 Coupling
Probe Atten
Display Mode
Averaging
Time/div
2.0 V/div
1 MΩ
dc
10
Repetitive
8
20 ns/div
Trg’d
Sweep
Chan1
Trigger
Trig Src
• If the signal is incorrect, the A6 Digital assembly is probably faulty.
4-37
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Troubleshooting the Analyzer
Agilent 35670A
To troubleshoot self-test lockup failures
Step 2. Run the IIC and fast bus self tests.
• Press the following keys:
[ System Utility ]
[ CALIBRATN ]
[ AUTO CAL OFF ]
[ Input ]
[ ALL CHANNELS ]
[ CH* FIXED RANGE ]
1
[ Vpk ]
[ System Utility ]
[ MORE ]
[ SELF TEST ]
[ TEST LOG ]
[ Rtn ]
[ FUNCTIONL TESTS ]
[ I/O ]
[ IIC BUS ]
• If the keyboard is not active, or the analyzer locks up when a key is pressed,
• Press the [ FAST BUS ] softkey.
• If the analyzer locks up or the digital processor failed the fast bus self test,
4-38
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Agilent 35670A
Troubleshooting the Analyzer
To troubleshoot self-test lockup failures
Step 4. Run the remaining self tests.
• Connect the rear panel SOURCE output to the rear panel TACH input
using a BNC cable.
• Remove all cables from the front panel input connectors.
Caution
The ICP self test outputs approximately 30 Vdc on the input connectors. Before
starting the self tests, disconnect all devices connected to the input connectors.
Devices left connected during the ICP self test may be damaged.
• Until a test fails or the analyzer locks up, press the following keys allowing
enough time for each test to complete before pressing the next key :
[ Rtn ]
[ OTHER ]
[ INTER RUPT ]
[ MULT FCTN PERIPHERL ]
[ MAIN RAM ]
[ CONTINUE ]
[ Rtn ]
[ DIGITAL PROCESSOR ]
[ ALL ]
[ Rtn ]
[ SOURCE ]
[ SOU RCE LO ]
[ SOURCE TO CPU ]
[ CONTINUE ]
[ Rtn ]
[ ADC GATE ARRAY ]
[ INPUTS ]
[ <F “Times”>Times"P10ALL ]
[ CONTINUE<| >]
[ Rtn ]
[ TACHOMETR ]
[ CO NTINUE ]
A failure may cause the self tests to run very slow. If the analyzer does not
complete a self test within a few minutes (analyzer locks up during the test),
consider it equivalent to displaying FAILS in the test log.
• If any of these self tests fail, locate the test that failed in the ‘’Self-Test
Troubleshooting Guide’’ on page 4-33.
and calibrator failures.’’
4-39
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Troubleshooting the Analyzer
Agilent 35670A
To troubleshoot intermittent failures
To troubleshoot intermittent failures
Use this test to isolate intermittent failures to the assembly.
• Determine if your intermittent failure is caused by one of the following
common causes.
Common Reasons Troubleshooting Procedure
Loose screws
and cables
Check that the screws in the analyzer are tight and that the cables are
firmly in their sockets. This is especially important since grounding for
the analyzer depends on the cables and screws.
Motherboard
connectors
Remove each assembly connected to the Motherboard and check the
connectors for loose or bent pins.
Power supply
voltages
Check for correct power-supply voltages. See ‘’To perform initial
verification’’ on page 4-5.
Out-of-adjustment
Low level noise
Do the adjustments for the analyzer in chapter 5.
Do ‘’To troubleshoot distortion failures’’ on page 4-56.
Air flow
restricted
Cooling air enters from the right side and exhausts through the left side
and rear panel. Check that the air flow was not restricted in these areas
when the failure occurred.
External voltage
Verify that the line voltage is within the electrical specification for the
analyzer. See chapter 2.
• Connect the rear panel SOURCE output to the rear panel TACH input using a
BNC cable. Remove all cables from the front panel input connectors.
Caution
The ICP self test outputs approximately 30 Vdc on the input connectors. Before
starting the self tests, disconnect all devices connected to the input connectors.
Devices left connected during the ICP self test may be damaged.
• Set the power switch to on ( l ).
4-40
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Agilent 35670A
Troubleshooting the Analyzer
To troubleshoot intermittent failures
• Press the following keys:
[ Preset ]
[ DO PRESET ]
[ System Utility ]
[ CALIBRATN ]
[ AUTO CAL OFF ]
[ Input ]
[ ALL CHANNELS ]
[ CH* FIXED RANGE ]
1
[ Vpk ]
[ System Utility ]
[ MORE ]
[ SELF TEST ]
[ TEST LOG ]
[ CLEAR TEST LOG ]
[ Rtn ]
[ LOOP MODE ON ]
[ FUNCTIONL TESTS ]
[ ALL ]
[ C ONTINUE ]
• After this test detects a failure, press the following keys:
[ Rtn ]
[ LOOP MODE OFF ]
• Compare the analyzer’s test log to the ‘’Self Test Troubleshooting Guide’’
starting on page 4-33.
If the analyzer’s test log matches more than one entry in the table, use the entry closest
to the beginning of the table. The table lists the probable faulty assembly or
assemblies and any recommended adjustment or troubleshooting procedure to do
before replacing the assembly. If both an adjustment and a test are recommended, do
the adjustment first.
All pass and fail messages are displayed on the test log along with the number of times
a test passes or fails. When loop mode is activated, the analyzer continually repeats a
test until power is cycled or loop mode is aborted by pressing the [ LOOP MODE
OFF ] softkey. During some tests, the keyboard is not active and loop mode cannot be
turned off. If this occurs, wait for the test to finish.
If you abort a self test before the self test is finished, the analyzer may fail its
calibration routine. To prevent this from happening, press [ Preset ] [ DO PRESET ] or
cycle power after you abort a self test.
To run a specific self test in loop mode, press the keys listed in step 4 except select the
specific self test instead of [ ALL ].
4-41
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Troubleshooting the Analyzer
Agilent 35670A
To troubleshoot performance test failures
To troubleshoot performance test failures
With the exception of the Quick Confidence test, all functional self tests must pass
before the following table is valid.
Step 1. If the analyzer failed a performance test, compare the failing performance test
to the following table.
If more than one performance test is failing, use the entry that is closest to the
beginning of the table. The table lists the probable faulty assembly or assemblies and
any recommended adjustment or troubleshooting procedure to do before replacing the
assembly. If both an adjustment and a test are recommended, do the adjustment first.
Failing Performance Test Troubleshooting Guide
Failing Performance Test
Probable Faulty Assembly
(in order of probabilty)
Adjustment
Troubleshooting Test
DC offset
A1/A2 Input
A5 Analog
Input dc offset, page 5-10
ADC gain, offset, and
reference, page 5-7
one channel or
channel 1 and 3 or
channel 2 and 4
DC offset
all channels
Input dc offset, page 5-10
ADC gain, offset, and
reference, page 5-7
Amplitude accuracy
one channel
A1/A2 Input
A5 Analog
Input dc offset, page 5-10
ADC gain, offset, and
reference, page 5-7
Input and ADC, page 4-51
Four channel, page 4-54
Amplitude accuracy
channel 1 and 3 or
channel 2 and 4
A2 Input
Input dc offset, page 5-10
Amplitude accuracy
all channels
A5 Analog
Input dc offset, page 5-10
ADC gain, offset, and
reference, page 5-7
Flatness
one channel
A1/A2 Input
A5 Analog
Input dc offset, page 5-10
ADC gain, offset, and
reference, page 5-7
Input and ADC, page 4-51
Four channel, page 4-54
Flatness
channel 1 and 3 or
channel 2 and 4
A2 Input
Input dc offset, page 5-10
Flatness
all channels
A5 Analog
Input dc offset, page 5-10
ADC gain, offset, and
reference, page 5-7
4-42
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Agilent 35670A
Troubleshooting the Analyzer
To troubleshoot performance test failures
Failing Performance Test
Probable Faulty Assembly
Adjustment
Troubleshooting Test
(in order of probabilty)
Amplitude linearity
one channel
A1/A2 Input
A5 Analog
Input dc offset, page 5-10
ADC gain, offset, and
reference, page 5-7
Input and ADC, page 4-51
Four channel, page 4-54
Amplitude linearity
channel 1 and 3 or
channel 2 and 4
A2 Input
Input dc offset, page 5-10
Amplitude linearity
all channels
A5 Analog
Input dc offset, page 5-10
ADC gain, offset, and
reference, page 5-7
Amp_phase match
A1/A2 Input
A5 Digital
A6 Digital
Source and calibrator,
page 4-45
A-weight filter
A1/A2 Input
A1/A2 Input
A7 CPU
Anti-alias filter
Filter flatness, page 5-17
Frequency accuracy
Input coupling
Frequency reference, page 5-5
A1/A2 Input
Single ch phase accuracy
A10 Rear Panel
A5 Analog
A6 Digital
Trigger, page 4-62
Trigger, page 4-62
External trigger
A10 Rear Panel
A5 Analog
Input resistance
A1/A2 Input
A1/A2 Input
Input capacitance
Harmonic distortion
one channel
A1/A2 Input
A5 Analog
Input and ADC, page 4-51
Four channel, page 4-54
Harmonic distortion
channel 1 and 3 or
channel 2 and 4
A2 Input
Harmonic distortion
all channels
A5 Analog
ADC gain, offset, and
reference, page 5-7
Intermodulation distortion
one channel
A1/A2 Input
A5 Analog
Input and ADC, page 4-51
Four channel, page 4-54
Intermodulation distortion
channel 1 and 3 or
channel 2 and 4
A2 Input
Intermodulation distortion
all channels
A5 Analog
ADC gain, offset, and
reference, page 5-7
4-43
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Troubleshooting the Analyzer
Agilent 35670A
To troubleshoot performance test failures
Failing Performance Test Troubleshooting Guide
Failing Performance Test
Probable Faulty Assembly
(in order of probabilty)
Adjustment
Troubleshooting Test
Spurious signals
one channel
A1/A2 Input
A5 Analog
Input and ADC, page 4-51
Four channel, page 4-54
Spurious signals
channel 1 and 3 or
channel 2 and 4
A2 Input
Spurious signals
all channels
A5 Analog
mechanical
A6 Digital
ADC gain, offset, and
reference, page 5-7
Distortion, page 4-56
Noise
one channel
A1/A2 Input
A5 Analog
Input and ADC, page 4-51
Four channel, page 4-54
Noise
channel 1 and 3 or
channel 2 and 4
A2 Input
Noise
all channels
A5 Analog
mechanical
ADC gain, offset, and
reference, page 5-7
Distortion, page 4-56
Distortion, page 4-56
Cross talk
A1/A2 Input
A1/A2 Input
A5 Analog
A5 Analog
A5 Analog
A5 Analog
A5 Analog
ICP supply
Source dc offset
Source amplitude accuracy
Source flatness
Source distortion
Source output resistance
4-44
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Agilent 35670A
Troubleshooting the Analyzer
To troubleshoot source and calibrator failures
To troubleshoot source and calibrator failures
Use this test to isolate source and calibrator failures to the A6 Digital assembly, the
A5 Analog assembly, the A1/A2 Input assembly, the A12 BNC assembly, or the
A10 Rear Panel assembly.
Step 1. Check the sine wave output.
• Set the power switch to on ( l ).
• Connect an oscilloscope to the analyzer’s SOURCE connector using a BNC
cable.
• Set the oscilloscope as follows:
CH1 V/div
400 mV/div
50 Ω
dc
Input Impedance
CH1 Coupling
Probe Attenuation
Display Mode
Time/div
1
Repetitive
20 µs/div
Trg’d Sweep
Chan1
0 V
Trigger
Trig Src
Trigger Level
• Press the following keys:
[ System Utility ]
[ CALIBRATN ]
[ AUTO CAL OFF ]
[ Source ]
[ SOURCE ON ]
[ LEVEL ]
1
[ Vpk ]
• If the oscilloscope displays a 10.2 kHz, 2 Vp-p sine wave with no dc offset, go
to Step 2.
This is only a quick check of the source sine wave. If the source is suspected of
failing at a specific frequency or amplitude, check the source sine wave at the
failing frequency or amplitude.
• Using an oscilloscope and a 1:1 probe, check that the signal at A5 TP8 is a
10.2 kHz, 2 Vp-p sine wave with no dc offset.
• If the signal is correct at A5 TP8 and incorrect at the analyzer’s front panel
SOURCE connector, the A12 BNC assembly is probably faulty.
• If the signal is correct at A5 TP8 and incorrect at the analyzer’s rear panel
SOURCE connector, the A10 Rear Panel assembly is probably faulty.
• If the signal is incorrect, the A5 Analog assembly is probably faulty.
4-45
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Troubleshooting the Analyzer
Agilent 35670A
To troubleshoot source and calibrator failures
Step 2. Check the dc offset.
• Connect the voltmeter to A5 TP3.
• Press the following keys:
[ LEVEL ]
0
[ Vpk ]
[ DC OFFSET ]
• Rotate the RPG knob while monitoring the voltmeter.
• If the voltmeter’s voltage does not change from +2.3 to 2.3 as the dc offset
value is varied between 10 and +10 Vdc, the A5 Analog assembly is
probably faulty.
4-46
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Agilent 35670A
Troubleshooting the Analyzer
To troubleshoot source and calibrator failures
Step 3. Check the periodic chirp output.
• Press the following keys:
[ DC OFFSET ]
0
[ V ]
[ LEVEL ]
1
[ Vpk ]
[ PERIODIC CHIRP ]
• Using an an oscilloscope and a 1:1 probe, check the following signal.
Oscilloscope Setup
Parameters
Waveform
Connect CH1 to A5 TP8
Amplitude
Time
CH1 V/div
Input Impedance
CH1 Coupling
Probe Atten
Display Mode
Averaging
Time/div
300 V/div
Duty Cycle
Pulse shape
Time
50 Ω
dc
1
Relationship
Repetitive
off
10 µs/div
Trg’d
Sweep
Chan1
Trigger
Trig Src
Periodic Chirp
• If the signal is incorrect, the A5 Analog assembly is probably faulty.
4-47
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Troubleshooting the Analyzer
Agilent 35670A
To troubleshoot source and calibrator failures
Step 4. Check the calibrator output.
• Set the power switch to off ( O ).
• Remove the A1/A2 Input assembly and attach a test clip patch cord to TP
17. Connect a 10:1 oscilloscope probe to the patch cord and TP 8 (ground).
• Reinstall the Input assembly in the card nest with patch cord and probe
attacted.
• Set the power switch to on ( l ).
4-48
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Agilent 35670A
Troubleshooting the Analyzer
To troubleshoot source and calibrator failures
• Press the following keys:
[ System Utility ]
[ CALIBRATN ]
[ AUTO CAL OFF ]
[ Input ]
[ ALL CHANNELS ]
[ CH* FIXED RANGE ]
1
[ Vpk ]
[ Source ]
[ SOURCE ON ]
[ LEVEL ]
1
[ Vpk ]
[ System Utility ]
[ MORE ]
[ SERVICE TESTS ]
[ SPCL TEST MODES ]
[ HIGH LEVEL CAL ]
• If the signal does not look like the following figure, the A5 Analog assembly is
probably faulty.
Oscilloscope Setup
Parameters
Waveform
Connect CH1 to A1/A2 TP 17
Amplitude
Time
CH1 V/div
Input
2 V/div
1 M Ω
dc
Impedance
CH1 Coupling
Probe Atten
Display Mode
Averaging
Time/div
10
Repetitive
8
20 ms/div
Trg’d Sweep
Chan1
Trigger
High Level Calibrator
Trig Src
• Press [ LOW LEVEL CAL ].
• If the signal does not look like the following figure, the A5 Analog assembly
is probably faulty.
Oscilloscope Setup
Parameters
Waveform
Connect CH1 to A1/A2 TP 17
Amplitude
Time
CH1 V/div
Input
200 mV/div
1 M Ω
dc
Impedance
CH1 Coupling
Probe Atten
Display Mode
Averaging
Time/div
10
Repetitive
8
20 ms/div
Trg’d Sweep
Chan1
Trigger
Low Level Calibrator
Trig Src
4-49
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Troubleshooting the Analyzer
Agilent 35670A
To troubleshoot source and calibrator failures
❑ Step 5. Check the Input assembly.
• Using an oscilloscope and a 10:1 probe, check the following signal.
Oscilloscope Setup
Parameters
Waveform
Connect CH1 to A1/A2 TP 300 Amplitude
Time
CH1 V/div
Input
200 mV/div
Distortion
1 M Ω
dc
10
Impedance
CH1 Coupling
Probe Atten
Display Mode
Averaging
Time/div
Repetitive
8
20 ms/div
Trg’d Sweep
Chan1
Trigger
Channel 1 Output
Trig Src
• If the signal is incorrect, the A1/A2 Input assembly is probably faulty.
❑ Step 6. Compare the analyzer’s self-test results to the following table.
• Press the following keys:
[ System Utility ]
[ MORE ]
[ SELF TEST ]
[ FUNCTIONL TESTS ]
[ DIGITAL PROCESSOR ]
[ ALL ]
[ Rtn ]
[ ADC GATE ARRAY ]
• Determine the probable faulty assembly by comparing the analyzer’s
self-test results to the following table.
Self-Test Results
Probable Faulty Assembly
A6 Digital
Trigger Gate Array fails and ADC Gate Array passes
Baseband fails, Zoom fails, and ADC Gate Array passes
ADC Gate Array fails
A6 Digital
A5 Analog
All self tests pass through the ADC Gate Array
A5 Analog
This test does not check all the signals from the A6 Digital assembly to the A5 Analog
and A1/A2 Input assemblies. All the functions of the A6 Digital assembly are checked
by the self tests except for a few output buffers. If replacing the A5 Analog assembly
does not fix the failure, the A6 Digital assembly is probably faulty.
4-50
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Agilent 35670A
Troubleshooting the Analyzer
To troubleshoot input and ADC failures
To troubleshoot input and ADC failures
Use this test to isolate input failures in two channel analyzers to the A1 Input
assembly, A5 Analog assembly, or A12 BNC assembly.
Step 1. Check the input path.
• Set the frequency synthesizer as follows:
Frequency
Amplitude
Function
10 kHz
2 Vp-p
Sine Wave
• Set the oscilloscope as follows:
CH1 V/div
400 mV/div
Input Impedance
CH1 coupling
Time/div
1 MΩ
dc
20 ns/div
1
Probe Atten
• Press the following keys:
[ System Utility ]
[ CALIBRATN ]
[ AUTO CAL OFF ]
[ Input ]
[ ALL CHANNELS ]
[ CH* FIXED RANGE ]
1
[ Vpk ]
• Connect the frequency synthesizer to the failing channel’s input connector
using a BNC cable.
• Using the oscilloscope, BNC-to-SMB cable, and SMB-to-SMB adapter,
check the following signals for the failing channel:
Test Location
Probable Faulty
Assembly
Amplitude ( 10%)
Channel 1
A12 P31 (connected to A1 P100) 2 Vp-p
A12 BNC
A1 Input
A1 P200
2.83 Vp-p
Channel 2
A12 P41 (connected to A1 P600) 2 Vp-p
A12 BNC
A1 Input
A1 P700
2.83 Vp-p
4-51
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Troubleshooting the Analyzer
Agilent 35670A
To troubleshoot input and ADC failures
This is only a quick check of the Input assembly. If the Input assembly’s amplitude
is still suspected of failing, set the analyzer to the failing range, impedance, and
frequency. Connect a signal equal to the range setting to the failing channel. When
the input level equals the range level, A1 P200 (channel 1) or A1 P700 (channel 2)
should be 2.83 0.28 Vp-p.
4-52
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Agilent 35670A
Troubleshooting the Analyzer
To troubleshoot input and ADC failures
Step 2. Check the dc offset DAC.
• Using the BNC-to-SMB cable, connect the oscilloscope to A1 P200 to check
channel 1 or to A1 P700 to check channel 2.
If you changed the input signal or range, set the input signal to 2 Vp-p and the
range to 1 Vpk.
• Set the oscilloscope to 700 mV/div.
• Press the following keys:
[ System Utility ]
[ MORE ]
[ SERVICE TESTS ]
[ SPCL TEST MODES ]
[ MORE SPCL MODES ]
[ CHANNEL 1 SPCL MODE ] or [ CHANNEL 2 SPCL MODE ]
[ OFFSET DAC ]
0
[ ENTER ]
• Note the dc offset voltage of the sine wave displayed on the oscilloscope.
• Enter numbers between 127 and +128.
The sine wave dc offset voltage should change about 780 mV for a −127 entry and
−780 mV for a +127 entry.
• If the dc offset function is incorrect, the A1 Input assembly is probably
faulty.
• If the dc offset function is correct, the A5 Analog assembly is probably
faulty.
4-53
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Troubleshooting the Analyzer
Agilent 35670A
To troubleshoot input failures on four channel analyzers
To troubleshoot input failures on four channel analyzers
Use this test to isolate the failure when one channel fails in a four channel analyzer.
Step 1. Run the input and quick confidence self tests.
• Set the power switch to on ( l ).
• When the power-up tests are completed, press the following keys:
[ System Utility ]
[ CALIBRATN ]
[ AUTO CAL OFF ]
[ Input ]
[ ALL CHANNELS ]
[ CH* FIXED RANGE ]
1
[ Vpk ]
[ System Utility ]
[ MORE ]
[ SELF TEST ]
[ TEST LOG ]
[ Rtn ]
[ FUNCTIONL TESTS ]
[ INPUTS ]
[ ALL ]
[ CONTINUE ]
[ Rtn ]
[ Rtn ]
[ QUICK CONF TEST ]
• If the self tests fail but do not lockup the analyzer, note the failure messages
and go to Step 2.
• If the analyzer locks up on the Quick Confidence self test but not on the
input self tests, note the failure messages and go to Step 2 but don’t run the
Quick Confidence self test.
• If the analyzer locks up on the input self tests, go to Step 2 to determine if
exchanging the Input assemblies will allow the self tests to run.
This is most likely to occur when channel 1 and 3 are failing.
• If the self tests pass, go to Step 2 but substitute the failure symptom for the
self tests.
If the exact failure symptom is not known, use the performance test procedures to
isolate the failure symptom.
4-54
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Agilent 35670A
Troubleshooting the Analyzer
To troubleshoot input failures on four channel analyzers
Step 2. Exchange the Input assemblies.
• Set the power switch to off ( O ).
• Exchange the Input assembly in the lower slot with the Input assembly in
the upper slot.
• Reconnect the cables to the A5 Analog assembly.
• Set the power switch to on ( l ).
• Press the following keys:
[ System Utility ]
[ CALIBRATN ]
[ AUTO CAL OFF ]
[ Input ]
[ ALL CHANNELS ]
[ CH* FIXED RANGE ]
1
[ Vpk ]
[ System Utility ]
[ MORE ]
[ SELF TEST ]
[ TEST LOG ]
[ Rtn ]
[ FUNCTIONL TESTS ]
[ INPUTS ]
[ ALL ]
[ CONTINUE ]
[ Rtn ]
[ Rtn ]
[ QUICK CONF TEST ]
• If the same channel fails as failed before the exchange, the A5 Analog
assembly is probably faulty.
• If a different channel now fails, the A2 Input assembly for the failing
channel is probably faulty.
The Input assembly for channel 1 and 3 is in the lower slot. The Input assembly for
channel 2 and 4 is in the upper slot.
4-55
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Troubleshooting the Analyzer
Agilent 35670A
To troubleshoot distortion failures
To troubleshoot distortion failures
Use this test to isolate distortion failures to the A1/A2 Input assembly, the A5 Analog
assembly, or to mechanical failures.
Step 1. Check mechanical ground connections.
• Check that the Digital assembly, Input assembly, and Analog assembly are
completely in the card nest and making good contact with the grounding
guides at the sides of the card nest.
• Check that the screws in the sides, back, and top of the analyzer are tight.
When grounding is inadequate, feedback from the line power frequency and
internal clock frequencies may appear as distortion on the Input assemblies.
Step 2. Check the analyzer’s clock signals.
Noisy clock signals can cause noise or spurious signals in the analyzer. To check the
Step 3. Do the “Spurious signals” and ‘’Noise’’ performance tests.
• Run the “Spurious signals” and ‘’Noise’’ performance tests in chapter 3,
‘’Verifying Specifications.’’
• If all channels fail, the A5 Analog assembly is probably out of adjustment or
faulty.
the assembly.
• If only one channel, or channel 1 and 3, or channel 2 and 4 fails, the Input
assembly that failed is probably faulty.
• If the ‘’Spurious signals’’ and ‘’Noise’’ performance tests pass, but the
analyzer appears to power up with a high noise floor, an auto-range circuit
may be failing.
To check the auto-range function and isolate a failure, see ‘’To troubleshoot
auto-range failures’’ on page 4-59.
4-56
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Agilent 35670A
Troubleshooting the Analyzer
To troubleshoot disk drive failures
To troubleshoot disk drive failures
This test isolates disk drive failures to the A7 CPU, the A100 Disk Drive assembly, or
the flexible disk.
Step 1. Check the disk controller on the A7 CPU assembly.
• Press the following keys:
[ System Utility ]
[ MORE ]
[ SELF TEST ]
[ TEST LOG ]
[ Rtn ]
[ FUNCTIONL TESTS ]
[ I/O ]
[ INTERNAL DISK ]
[ DISK CONTROLLR ]
[ DISK FIFO ]
• If the disk controller test aborts and displays the message Mass Storage Unit
not Present!!, the Disk Drive assembly, or the cable to the Disk Drive assembly
is probably faulty. The A7 CPU assembly could also be faulty but it is less
probable.
• If the disk controller or disk FIFO test fails, the A7 CPU assembly is
probably faulty.
Step 2. Check the Disk Drive assembly.
• Insert a formatted flexible disk into the Disk Drive assembly and press the
following keys:
[ RESTORE ]
[ RANDOM SEEK ]
[ SEEK RECORD ]
(any number between 1 and 2771)
[ READ ]
[ READ/WRITE ]
• If any of the self tests failed, insert a new formatted disk and repeat the
previous step.
• If the disk drive self tests still fail, the A100 Disk Drive assembly is probably
faulty.
If the self test aborts and displays the message Bad or unformatted media, the most
likely cause of the failure is a bad flexible disk. The analyzer can use either LIF
(Logical Interchange Format) or a DOS formatted flexible disk.
4-57
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Troubleshooting the Analyzer
Agilent 35670A
To troubleshoot disk drive failures
Step 3. Check that the Disk Drive assembly can read and write to all sectors of a
flexible disk.
The read/write self test can take up to 40 minutes to complete if there are no
failures.
• Press the [ READ/WRITE ALL ] softkey.
• If the self test aborts and displays the message Bad or unformatted media, insert
a new formatted disk and repeat the previous step.
• If the self test fails a second time, the Disk Drive assembly is probably
faulty.
• If the self test passes, the Disk Drive assembly and flexible disk are
functioning correctly.
4-58
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Agilent 35670A
Troubleshooting the Analyzer
To troubleshoot auto-range failures
To troubleshoot auto-range failures
Use this test to check the auto-range and overload detector circuits on the A1/A2 Input
assembly. This test assumes that calibration and all self tests passed.
• Set the power switch to on ( l ).
• Press the following keys:
[ System Utility ]
[ CALIBRATN ]
[ AUTO CAL OFF ]
[ Inst Mode ]
[ CHANNELS 4 ] or [ CHANNELS 2 ]
[ Input ]
[ ALL CHANNELS ]
[ CH* FIXED RANGE ]
1
[ dBVrms ]
[ Source ]
[ SOURCE ON ]
[ LEVEL ]
1
[ dBVrms ]
[ System Utility ]
[ MORE ]
[ SERVICE TESTS ]
[ SPCL TEST MODES ]
[ SOURCE LEVEL ]
The Half range LEDs for all channels should be on and the Over range LEDs
should be off.
• Press the following keys:
[ Source ]
[ LEVEL]
5
[ dBVrms ]
The Half range and Over range LEDs for all channels should be on.
• Press the following keys:
[ Input ]
[ CH* AUTO RANGE ]
After the auto-range routine is finished, the Half range LEDs should be on and the
Over range LEDs should be off.
4-59
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Troubleshooting the Analyzer
Agilent 35670A
To troubleshoot auto-range failures
• Press the following keys:
[ CHANNEL 1 ]
[ CHANNEL 1 RANGE ]
The range should be set to 5 dBVrms.
• Press [ Rtn ].
• Repeat steps 5 and 6 for each channel.
• If only one channel, or channel 1 and 3, or channel 2 and 4 are failing, the
A1/A2 Input assembly is probably faulty.
In the two channel analyzer, the A1 Input assembly provides the circuits for
channel 1 and 2. In the four channel analyzer, the A2 Input assembly in the lower
slot provides the circuits for channel 1 and 3, and the A2 Input assembly in the
upper slot provides the circuits for channel 2 and 4.
• If all channels are failing, the A5 Analog assembly is probably faulty.
4-60
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Agilent 35670A
Troubleshooting the Analyzer
To troubleshoot DIN connector failures
To troubleshoot DIN connector failures
Use this test to determine if the fuse for the DIN connector is failing before replacing
the A10 Rear Panel assembly.
• Set the power switch to on ( l ).
• Check the voltage on pin 2 of the DIN connector for +5V.
• If the voltage is correct, the A10 Rear Panel assembly is probably faulty.
• If the voltage is incorrect, replace A10 F200.
4-61
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Troubleshooting the Analyzer
To troubleshoot trigger failures
Agilent 35670A
To troubleshoot trigger failures
Use this test when the trigger mode is suspected of failing or the Input Trigger self test
fails on all channels.
Step 1. Check trigger modes.
• Set the power switch to on ( l ).
• Press the following keys:
[ System Utility ]
[ CALIBRATN ]
[ AUTO CAL OFF ]
[ Input ]
[ ALL CHANNELS ]
[ CH* FIXED RANGE ]
1
[ Vpk ]
[ Source ]
[ SOURCE ON ]
[ LEVEL ]
1
[ Vpk ]
[ FIXED SINE ]
[ 1 ]
[ kHz ]
[ Inst Mode ]
[ 4 CHANNEL ] or [ 2 CHANNEL ]
[ ACTIVE TRACE ]
[ A B C D ] or [ A B ]
[ Meas Data ]
[ ALL CHANNELS ]
[ TIME CHANNEL ]
[ System Utility ]
[ MORE ]
[ SERVICE TESTS ]
[ SPCL TEST MODES ]
[ SOURCE LEVEL ]
[ Trigger ]
[ SOURCE TRIGGER ]
• If the analyzer is not triggering and the message WAITING FOR SOURCE
TRIGGER is displayed, the A6 Digital assembly is probably faulty.
Fixed sine wave source triggering occurs at a consistent (but not predictable) point
within the time record.
• Set the frequency synthesizer as follows:
Frequency
Amplitude
Function
1 kHz
6 Vp-p
Square Wave
4-62
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Agilent 35670A
Troubleshooting the Analyzer
To troubleshoot trigger failures
• Connect the frequency synthesizer to the analyzer’s rear panel EXT TRIG
connector using a BNC cable.
• Press the following keys allowing enough time for the analyzer to trigger
before pressing the next key. Note which trigger modes are failing:
[ CHANNEL 1 ]
[ CHANNEL 2 ]
[ CHANNEL 3 ] (option AY6 only)
[ CHANNEL 4 ] (option AY6 only)
[ TRIGGER SETUP ]
[ CHANNEL LEVEL ]
200
[ mV ]
[ SLOPE NEG ]
[ ALL CHANNELS ]
[ CHANNEL DELAY ]
100
[ mS ]
[ 0 ]
[ S ]
[ Rtn ]
[ ARM SETUP ]
[ MANUAL ARM ]
[ Rtn ]
[ ARM ]
[ ARM SETUP ]
[ AUTOMATIC ARM ]
[ Rtn ]
[ EXTERNAL TRIGGER ]
[ TRIGGER SETUP ]
[ EXT LEVEL TTL ]
[ EXT LEVEL USER ]
[ USER EXT LEVEL ]
200
[ mV ]
[ EXT RANGE +/− 10 ]
[ USER EXT LEVEL ]
0
[ V ]
The message WAITING FOR mode TRIGGER is displayed when the analyzer is not
triggering.
• Change the frequency synthesizer’s amplitude to 0.3 Vp-p.
• Press [ EXT RANGE +/ 2 ].
The analyzer should now trigger.
4-63
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Troubleshooting the Analyzer
To troubleshoot trigger failures
Agilent 35670A
Step 2. Determine the probable faulty assembly or next step by comparing the trigger
failure to the following table.
If the trigger failure matches more than one entry in the table, use the entry closest to
the beginning of the table.
Trigger Mode Failing
Probable Faulty
Assembly or Next Step
All channels and external trigger fail all trigger modes
All channels trigger but external trigger fails all trigger modes
At least one channel or external trigger functions correctly
Step 3
Step 4
A5 Analog
A5 Analog
Channel level fails
Arm fails
External trigger fails user level or TTL level
External trigger fails EXT RANGE
Trigger delay fails
A10 Rear Panel
A6 Digital
Step 3. Check trigger signal to Digital assembly.
• Set the power switch to off ( O ).
• Remove the A5 Analog assembly and attach a test clip patch cord to TP 204.
• Connect a logic probe to the patch cord and TP 160 (ground).
• Reinstall the Analog assembly in the card nest with patch cord and probe
attached.
• Set the power switch to on ( l ).
• Press the following keys:
[ System Utility ]
[ CALIBRATN ]
[ AUTO CAL OFF ]
[ Input ]
[ ALL CHANNELS ]
[ CH* FIXED RANGE ]
1
[ Vpk ]
[ Source ]
[ SOURCE ON ]
[ LEVEL ]
[ 1 ]
[ Vpk ]
[ System Utility ]
[ MORE ]
[ SERVICE TESTS ]
[ SPCL TEST MODES ]
[ SOURCE LEVEL ]
[ Trigger ]
[ CHANNEL 1 ]
4-64
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Agilent 35670A
Troubleshooting the Analyzer
To troubleshoot trigger failures
• If the signal at A5 TP 204 is toggling, the A6 Digital assembly is probably
faulty.
• If the signal at A5 TP 204 is not toggling, the A5 Analog assembly is
probably faulty.
4-65
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Troubleshooting the Analyzer
To troubleshoot trigger failures
Agilent 35670A
Step 4. Check external trigger signal to the Analog assembly.
• Set the power switch to off ( O ).
• Remove the seven screws holding the rear panel to the analyzer and lean the
rear panel back until the A10 Rear Panel assembly is visible. Keep the
cables connected.
• Set the power switch to on ( l ).
• Change the frequency synthesizer’s amplitude to 2 Vp-p.
• Set the oscilloscope as follows:
CH1 V/div
100 mV/div
1 MΩ
dc
Input Impedance
CH1 Coupling
Time/div
200 µs/div
10
Probe Atten
• Connect the oscilloscope to A10 TP2 using a 10:1 probe.
• Press the following keys:
[ Trigger ]
[ EXTERNAL TRIGGER ]
[ TRIGGER SETUP ]
[ EXT LEVEL USER ]
[ EXT RANGE +/− 10 ]
The oscilloscope should display a 370 40 mVp-p square wave.
• If the signal is incorrect, the A10 Rear Panel assembly is probably faulty.
• Set the oscilloscope to 300 mV/div.
• Press [ EXT RANGE +/ 2 ].
The oscilloscope should display a 1.9 0.2 Vp-p square wave.
• If the signal is incorrect, the A10 Rear Panel assembly is probably faulty.
• If the external trigger signals are correct, the A5 Analog assembly is
probably faulty.
4-66
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Agilent 35670A
Troubleshooting the Analyzer
To troubleshoot memory battery failures
To troubleshoot memory battery failures
Use this test when battery-backed-up memory is suspected of failing. This test
separates Memory assembly failures from memory battery failures.
• Press the following keys:
[ Preset ]
[ DO PRESET ]
[ System Utility ]
[ CLOCK SETUP ]
[ DATE MMDDYY ]
010101
[ ENTER ]
• Set the power switch to off ( O ), then to on ( l ).
• Press the following keys:
[ System Utility ]
[ CLOCK SETUP ]
[ DATE MMDDYY ]
• If the date is 01-01-01, the battery-backed-up memory is functioning
to continue troubleshooting.
• If the date is incorrect, remove the Memory assembly.
See ‘’To remove memory’’ on page 6-13.
• Check that the voltage at TP200 is 3.5 1V.
• If the voltage is correct, the Memory assembly is probably faulty.
• If the voltage is incorrect, replace the battery (B200).
Caution
There is danger of explosion if battery is incorrectly replaced. Replace the battery
according to the battery manufacturer’s instructions.
4-67
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Troubleshooting the Analyzer
Agilent 35670A
To troubleshoot memory battery failures
4-68
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Agilent 35670A
Troubleshooting the Analyzer
To troubleshoot microphone power and adapter failures
To troubleshoot microphone power and adapter failures
Use this test to isolate Microphone failures to the A5 Analog assembly or option UK4,
Microphone Adapter and Power Supply.
Step 1. Check mic pwr on the analyzer’s front panel.
• Set the power switch to on ( l ).
• Check the voltage on pin 2 of the mic pwr connector for +8 0.5 Vdc.
• If the voltage is incorrect, the A5 Analog assembly is probably faulty.
Step 2. Check the power from the Microphone Adapter and Power Supply.
• Connect the mic cable to the analyzer’s mic pwr connector.
• Check the voltage on pins 5 and 6 of each microphone connector for
28 2.8 Vdc.
• If the voltage is incorrect, the A77 Microphone assemby in the Microphone
Adapter and Power Supply is probably faulty.
• Set the switch for each microphone connector to off.
• Check the voltage on pin 3 of each connector for 0 Vdc.
• Set the switch for each microphone connector to on.
• Check the voltage on pin 3 of each connector for 200 15 Vdc.
• If the voltage is incorrect, the A77 Microphone assembly in the Microphone
Adapter and Power Supply is probably faulty.
4-69
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Troubleshooting the Analyzer
Agilent 35670A
To troubleshoot tachometer failures
To troubleshoot tachometer failures
Use this test to isolate tachometer failures to the A10 Rear Panel assembly or A6
Digital assembly.
Step 1. Check the rear panel tachometer input.
• Set the power switch to off ( O ).
• Remove the seven screws holding the rear panel to the analyzer and lean the
rear panel back until the A10 Rear panel assembly is visible. Keep the
cables connected.
• Connect the SOURCE output to the TACH input on the rear panel using a
BNC cable.
• Set the power switch to on ( l ).
• Press the following keys:
[ System Utility ]
[ CALIBRATN ]
[ AUTO CAL OFF ]
[ Rtn ]
[ MORE ]
[ SELF TEST ]
[ LOOP MODE ON ]
[ FUNCTIONL TESTS ]
[ TACHOMETR ]
[ CONTINUE ]
• Using an oscilloscope and 1 M 10:1 probe, check the following signal.
The signal should be displayed while the self test is running. Each time the self test
restarts, the source output to the tachometer input will be interrupted.
Oscilloscope Setup
Parameters
Waveform
Connect CH1 to A10 TP1
Amplitude
Time
CH1 V/div
1 V/div
1 M Ω
dc
Duty Cycle
Pulse shape
Input Impedance
CH1 Coupling
Probe Atten
Display Mode
Time/div
10
Real Time
2 ms/div
Auto
Trigger
• If the signal is incorrect, the A10 Rear Panel assembly is probably faulty.
4-70
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Agilent 35670A
Troubleshooting the Analyzer
To troubleshoot tachometer failures
Step 2. Check the tachometer range function.
• Set the oscilloscope for 20 s/div.
• Press the following keys:
[ Rtn ]
[ LOOP MODE OFF ]
[ Rtn ]
[ SERVICE TESTS ]
[ SPCL TEST MODES ]
[ SOURCE LEVEL ]
[ Source ]
[ SOURCE ON ]
[ LEVEL ]
500
[ mVpk ]
[ Trigger ]
[ TACHOMETR SETUP ]
[ TRG RANGE +/− 20 ]
• Check that the oscilloscope displays a dc voltage of approximately 4 Vdc.
• Press [ TRG RANGE +/ 4 ].
• Check that the oscilloscope displays a 4 0.4 Vp-p, 10.24 kHz sine wave,
with 2 0.2 Vdc offset.
• If the signal is incorrect, the A10 Rear Panel assembly is probably faulty.
• If the signal is correct, the A6 Digital assembly is probably faulty.
4-71
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Adjusting the Analyzer
This chapter contains the adjustment procedures for the Agilent 35670A
Dynamic Signal Analyzer. Use these adjustments if the analyzer does not meet
its specifications or if instructed in chapter 4, ‘’Troubleshooting the Analyzer,’’
or chapter 6, ‘’Replacing Assemblies,’’ to perform these adjustments. These
adjustments are not required for routine maintenance.
Allow the Agilent 35670A analyzer to warm up for an hour before doing any of
the adjustments.
During many of these adjustment procedures, an adjustment message appears
on the screen. The instructions on the screen are not as complete as the
instructions in this guide. When an adjustment message appears on the screen,
continue to follow the instructions in this guide. Failure to follow the
instructions in this guide may result in an incorrect adjustment, which would
appear as a hardware failure.
The following table shows the assembly and components adjusted during each
adjustment procedure.
Adjustment
Assembly
A7 CPU
Component
Frequency reference
Source
A7 C85
A5 Analog
A5 R48
A5 R59
ADC gain, offset and
reference
A5 Analog
A5 R407
A5 R405
A5 R431
Input dc offset
A1/A2 Input
A1/A2 Input
A1/A2 Input
A1/A2 R39
A1/A2 R539
Common mode rejection
Filter flatness
A1/A2 R43
A1/A2 R543
A1/A2 R115
A1/A2 R235
A1/A2 R615
Display voltage
A102 DC-DC Converter
A102 R25
5-2
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Agilent 35670A
Adjusting the Analyzer
Safety Considerations
Although the Agilent 35670A analyzer is designed in accordance with international
safety standards, this guide contains information, cautions, and warnings that must be
followed to ensure safe operation and to keep the unit in safe condition. Adjustments
in this chapter are performed with power applied and protective covers removed.
These adjustments must be performed by trained service personnel who are aware of
the hazards involved (such as fire and electrical shock).
Warning
Any interruption of the protective (grounding) conductor inside or outside the
unit, or disconnection of the protective earth terminal can expose operators to
potentially dangerous voltages.
Under no circumstances should an operator remove any covers, screws, shields or
in any other way access the interior of the Agilent 35670A analyzer. There are no
operator controls inside the analyzer.
Equipment Required
See chapter 1, ‘’Specifications,’’ for tables listing recommended test equipment. Any
equipment which meets the critical specifications given in the tables may be
substituted for the recommended model.
5-3
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Adjusting the Analyzer
Agilent 35670A
Remote Operation
Adjustments can be set up using the remote operation capability of the
Agilent 35670A analyzer. The following table lists the adjustments and corresponding
GPIB codes. See the Agilent 35670A GPIB Programmer’s Guide for general
information on remote operation.
Adjustment
GPIB Code
Source DC Offset
Source Filter DC Offset
DIAG:SERV:ADJ:SOUR:OFFS
DIAG:SERV:ADJ:SOUR:FILT:OFF
S
ADC Second Pass Gain
DIAG:SERV:ADJ:ADC:GAIN
DIAG:SERV:ADJ:ADC:OFFS
DIAG:SERV:ADJ:OFFS1
DIAG:SERV:ADJ:OFFS2
DIAG:SERV:ADJ:OFFS3
DIAG:SERV:ADJ:OFFS4
DIAG:SERV:ADJ:CMRR1
DIAG:SERV:ADJ:CMRR2
ADC Offset
Channel 1 Offset
Channel 2 Offset
Channel 3 Offset (option AY6 only)
Channel 4 Offset (option AY6 only)
Channel 1 Common Mode Rejection
Channel 2 Common Mode Rejection
Channel 3 Common Mode Rejection (option AY6 only) DIAG:SERV:ADJ:CMRR3
Channel 4 Common Mode Rejection (option AY6 only) DIAG:SERV:ADJ:CMRR4
Channel 1 Flatness at 100 kHz
DIAG:SERV:ADJ:FLAT1:FULL
DIAG:SERV:ADJ:FLAT1:FULL
DIAG:SERV:ADJ:FLAT1:CENT
DIAG:SERV:ADJ:FLAT1:CENT
DIAG:SERV:ADJ:FLAT2:FULL
DIAG:SERV:ADJ:FLAT2:CENT
DIAG:SERV:ADJ:FLAT3:FULL
DIAG:SERV:ADJ:FLAT4:FULL
SYST:PRES
Channel 1 Flatness at 50 kHz (option AY6 only)
Channel 1 Flatness at 50 kHz
Channel 1 Flatness at 25 kHz (option AY6 only)
Channel 2 Flatness at 50 kHz
Channel 2 Flatness at 25 kHz (option AY6 only)
Channel 3 Flatness at 25 kHz (option AY6 only)
Channel 4 Flatness at 25 kHz (option AY6 only)
Preset
5-4
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Agilent 35670A
Adjusting the Analyzer
To adjust the frequency reference
To adjust the frequency reference
This procedure adjusts the 19.923 MHz (or, to be exact, 19.922944 MHz) frequency
reference circuit on the A7 CPU assembly. This circuit is the source of the timing
reference for the A1/A2 Input and A5 Analog assemblies.
Equipment Required: Frequency Counter
10:1 Oscilloscope Probe
• Set the power switch to off ( O ).
• Connect the counter to the 20 MHz test point on A7 using a 10:1 oscilloscope
probe. Attach the probe ground clip to the instrument chassis (ground).
• Set the power switch to on ( I ).
• Adjust A7 C85 for a counter reading of 19.922944 MHz 200 Hz.
The analyzer may lock up if C85’s plates touch each other during the adjustment. If
the analyzer locks up, cycle power.
5-5
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Adjusting the Analyzer
To adjust the source
Agilent 35670A
To adjust the source
This procedure adjusts the source dc offset on the A5 Analog assembly.
Equipment Required: Multimeter
BNC-to-Dual Banana Cable
• Connect the multimeter to the analyzer’s rear-panel SOURCE connector.
• Press the following keys:
[ System Utility ]
[ MORE ]
[ SERVICE TESTS ]
[ ADJUSTMTS ]
[ SOURCE ADJUSTMNT ]
[ DC OFFSET ]
• Adjust A5 R48 for 0 Vdc 1 mV.
• Press the [ FILTER DC OFFSET ] softkey.
• Adjust A5 R59 for 0 Vdc 1 mV.
5-6
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Agilent 35670A
Adjusting the Analyzer
To adjust the ADC gain, offset and reference
To adjust the ADC gain, offset and reference
This procedure adjusts the second-pass gain, the first-pass offset, and the reference
voltage for the ADC on the A5 Analog assembly. This prevents nonlinear
Analog-to-Digital Converter (ADC) operation near the Digital-to-Analog Converter
(DAC) transition levels.
Equipment Required: Oscilloscope
1:1 Oscilloscope Probe
Capacitive Load
BNC-to-BNC Cable
• Set the power switch to off ( O ).
• Connect the capacitive load (from the service kit) to the oscilloscope input.
Connect the 1:1 oscilloscope probe to the capacitive load. Attach the probe to
A5 TP400 and the probe ground clip to the instrument chassis.
• Connect the oscilloscope’s external trigger connector to the analyzer’s
SOURCE connector using a BNC cable.
5-7
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Adjusting the Analyzer
Agilent 35670A
To adjust the ADC gain, offset and reference
• Set the oscilloscope as follows:
Channel 1
Volts/Div
Offset
Coupling
20 mV/div
0V
1 MΩ ac
Channel 2
Volts/Div
Offset
Coupling
500 mV/div
0V
1 MΩ ac
Time Base
Trigger
Time/Div
Sweep
1.0 ms/div
Triggered
Source
Level
Slope
Mode
Channel 2
500 mV
Positive
Edge
Display
Mode
Repetitive
On
Averaging
No. of Avg.
Screen
8
Single
• Remove the cable from A5 P4. Connect a jumper from A5 TP8 to A5 TP300.
• Press [ Preset ] while setting the power switch to on ( I ).
• Press the following keys:
[ System Utility ]
[ MORE ]
[ SERVICE TESTS ]
[ ADJUSTMTS ]
[ ADC ADJUSTMNT ]
[ SECOND PASS GAIN ]
Wait for the analyzer to set up the adjustment. The analyzer is ready when the
adjustment message appears on the screen.
• Adjust A5 R407 for a flat trace on the oscilloscope.
• Set the power switch to off ( O ).
• Disconnect the capacitive load and connect the 1:1 oscilloscope probe directly
to the oscilloscope input. Attach the probe to A5 TP402 and the probe ground
clip to the instrument chassis.
• Change the set up for the oscilloscope as follows:
Channel 1
Volts/Div
Coupling
115 mV/div
1 MΩ dc
Channel 2
Coupling
Time/Div
1 MΩ dc
Time Base
500 ms/div
Display
Averaging
Display time
off
2.00 s
• Set the power switch to on ( I ).
5-8
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Agilent 35670A
Adjusting the Analyzer
To adjust the ADC gain, offset and reference
• Press the following keys:
[ System Utility ]
[ MORE ]
[ SERVICE TESTS ]
[ ADJUSTMTS ]
[ ADC ADJUSTMNT ]
[ OFFSET ]
Wait for the analyzer to set up the adjustment. The analyzer is ready when the
adjustment message appears on the screen.
• If the oscilloscope display looks like the following figure, go to step 17.
The following describes the signals shown on the oscilloscope display:
‘’
A’’ A straight, horizontal trace in the upper half of the display.
‘’B’’ A “noisy” flat trace at the center of the sine wave trace.
‘’C’’ A clean sine wave in the lower half of the display.
A
B
C
R431 and R405 Correctly Adjusted
• If trace ‘’B’’ is not flat, adjust A5 R431.
• If trace ‘’C’’ is not centered over trace ‘’B,’’ adjust A5 R405.
• Set the power switch to off ( O ).
• Disconnect the jumper from A5 TP8 and A5 TP300. Reconnect the cable to
A5 P4.
5-9
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Adjusting the Analyzer
Agilent 35670A
To adjust the input dc offset
To adjust the input dc offset
This procedure minimizes the residual dc response of the A1/A2 Input assemblies.
The standard two channel analyzer has one A1 Input assembly. The optional four
channel analyzer has two A2 Input assemblies: channel 1 and 3 are routed to the A2
Input assembly in the lower slot and channel 2 and 4 are routed to the A2 Input
assembly in the upper slot.
Equipment Required: None
5-10
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Agilent 35670A
Adjusting the Analyzer
To adjust the input dc offset
For the standard two channel analyzer, do the following to adjust input dc offset:
• Set the power switch to on ( I ).
• Press the following keys:
[ System Utility ]
[ MORE ]
[ SERVICE TESTS ]
[ ADJUSTMTS ]
[ CHANNEL 1 ADJUSTMNT ]
[ OFFSET ]
Wait for the analyzer to set up the adjustment. The analyzer is ready when
the adjustment message appears on the screen.
• Adjust A1 R39 for a Y: reading of 90 dBVrms or less.
• Press the following keys:
[ Rtn ]
[ CHANNEL 2 ADJUSTMNT ]
[ OFFSET ]
Wait for the analyzer to set up the adjustment. The analyzer is ready when
the adjustment message appears on the screen.
• Adjust A1 R539 for a Y: reading of 90 dBVrms or less.
5-11
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Adjusting the Analyzer
Agilent 35670A
To adjust the input dc offset
For the optional four channel analyzer, do the following to adjust input dc offset:
• Set the power switch to on ( I ).
• Press the following keys:
[ System Utility ]
[ MORE ]
[ SERVICE TESTS ]
[ ADJUSTMTS ]
[ CHANNEL 1 ADJUSTMNT ]
[ OFFSET ]
Wait for the analyzer to set up the adjustment. The analyzer is ready when
the adjustment message appears on the screen.
• Adjust A2 R39 in the lower slot for a Y: reading of 90 dBVrms or less.
• Press the following keys:
[ Rtn ]
[ CHANNEL 2 ADJUSTMNT ]
[ OFFSET ]
Wait for the analyzer to set up the adjustment. The analyzer is ready when
the adjustment message appears on the screen.
• Adjust A2 R39 in the upper slot for a Y: reading of 90 dBVrms or less.
• Press the following keys:
[ Rtn ]
[ CHANNEL 3 ADJUSTMNT ]
[ OFFSET ]
Wait for the analyzer to set up the adjustment. The analyzer is ready when
the adjustment message appears on the screen.
• Adjust A2 R539 in the lower slot for a Y: reading of 90 dBVrms or less.
• Press the following keys:
[ Rtn ]
[ CHANNEL 4 ADJUSTMNT ]
[ OFFSET ]
Wait for the analyzer to set up the adjustment. The analyzer is ready when
the adjustment message appears on the screen.
• Adjust A2 R539 in the upper slot for a Y: reading of 90 dBVrms or less.
5-12
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Agilent 35670A
Adjusting the Analyzer
To adjust common mode rejection
To adjust common mode rejection
This procedure optimizes the common mode rejection of the A1/A2 Input assemblies.
The standard two channel analyzer has one A1 Input assembly. The optional four
channel analyzer has two A2 Input assemblies: channel 1 and 3 are routed to the A2
Input assembly in the lower slot and channel 2 and 4 are routed to the A2 Input
assembly in the upper slot.
Equipment Required: BNC-to-BNC Cable
BNC(f)-to-Minigrabber Adapter
5-13
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Adjusting the Analyzer
Agilent 35670A
To adjust common mode rejection
For the standard two channel analyzer, do the following to adjust common mode
rejection:
• Set the power switch to off ( O ).
• Connect the BNC(f)-to-minigrabber adapter to the BNC cable. Connect
both minigrabber clips (signal and ground) to A5 TP8 and the BNC
connector to the analyzer’s CH 1 connector.
• Set the power switch to on ( I ).
• Press the following keys:
[ System Utility ]
[ MORE ]
[ SERVICE TESTS ]
[ ADJUSTMTS ]
[ CHANNEL 1 ADJUSTMNT ]
[ CMRR ]
Wait for the analyzer to set up the adjustment. The analyzer is ready when
the adjustment message appears on the screen.
• While monitoring the Y: value, adjust A1 R43 for a minimum marker value.
• Disconnect the BNC cable from the analyzer’s CH 1 connector and connect
to the CH 2 connector.
• Press the the following keys:
[ Rtn ]
[ CHANNEL 2 ADJUSTMNT ]
[ CMRR ]
Wait for the analyzer to set up the adjustment. The analyzer is ready when
the adjustment message appears on the screen.
• While monitoring the Y: value, adjust A1 R543 for a minimum marker
value.
5-14
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Agilent 35670A
Adjusting the Analyzer
To adjust common mode rejection
For the optional four channel analyzer, do the following to adjust common mode
rejection:
• Set the power switch to off ( O ).
• Connect the BNC(f)-to-minigrabber adapter to the BNC cable. Connect
both minigrabber clips (signal and ground) to A5 TP8 and the BNC
connector to the analyzer’s CH 1 connector.
• Set the power switch to on ( I ).
• Press the following keys:
[ System Utility ]
[ MORE ]
[ SERVICE TESTS ]
[ ADJUSTMTS ]
[ CHANNEL 1 ADJUSTMNT ]
[ CMRR ]
Wait for the analyzer to set up the adjustment. The analyzer is ready when
the adjustment message appears on the screen.
• While monitoring the Y: value, adjust A2 R43 in the lower slot for a
minimum marker value.
• Disconnect the BNC cable from the analyzer’s CH 1 connector and connect
to the CH 2 connector.
• Press the the following keys:
[ Rtn ]
[ CHANNEL 2 ADJUSTMNT ]
[ CMRR ]
Wait for the analyzer to set up the adjustment. The analyzer is ready when
the adjustment message appears on the screen.
• While monitoring the Y: value, adjust A2 R43 in the upper slot for a
minimum marker value.
• Disconnect the BNC cable from the analyzer’s CH 2 connector and connect
to the CH 3 connector.
• Press the the following keys:
[ Rtn ]
[ CHANNEL 3 ADJUSTMNT ]
[ CMRR ]
Wait for the analyzer to set up the adjustment. The analyzer is ready when
the adjustment message appears on the screen.
5-15
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Adjusting the Analyzer
Agilent 35670A
To adjust common mode rejection
• While monitoring the Y: value, adjust A2 R543 in the lower slot for a
minimum marker value.
• Disconnect the BNC cable from the analyzer’s CH 3 connector and connect
to the CH 4 connector.
• Press the the following keys:
[ Rtn ]
[ CHANNEL 4 ADJUSTMNT ]
[ CMRR ]
Wait for the analyzer to set up the adjustment. The analyzer is ready when
the adjustment message appears on the screen.
• While monitoring the Y: value, adjust A2 R543 in the upper slot for a
minimum marker value.
• Set the power switch to off ( O ) and disconnect the minigrabber clips from
A5 TP8.
5-16
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Agilent 35670A
Adjusting the Analyzer
To adjust filter flatness
To adjust filter flatness
This procedure adjusts the anti-alias filter on the A1/A2 Input assemblies. The
standard two channel analyzer has one A1 Input assembly. The optional four channel
analyzer has two A2 Input assemblies: channel 1 and 3 are routed to the A2 Input
assembly in the lower slot and channel 2 and 4 are routed to the A2 Input assembly in
the upper slot.
Equipment Required: None
5-17
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Adjusting the Analyzer
To adjust filter flatness
Agilent 35670A
For the standard two channel analyzer, do the following to adjust filter flatness:
• Set the power switch to on ( I ).
• Press the following keys:
[ System Utility ]
[ MORE ]
[ SERVICE TESTS ]
[ ADJUSTMTS ]
[ CHANNEL 1 ADJUSTMNT ]
[ 50 kHz ]
Wait for the analyzer to set up the adjustment. The analyzer is ready when
the adjustment message appears on the screen.
• While monitoring the Yr: value, adjust A1 R115 for a marker value of
0 0.1 dB.
• Press the [ 100 kHz FLATNESS ] softkey.
Wait for the analyzer to set up the adjustment. The analyzer is ready when
the adjustment message appears on the screen.
• While monitoring the Yr: value, adjust A1 R235 for a marker value of
0 0.1 dB.
• Press the following keys:
[ Rtn ]
[ CHANNEL 2 ADJUSTMNT ]
[ 50 kHz FLATNESS ]
Wait for the analyzer to set up the adjustment. The analyzer is ready when
the adjustment message appears on the screen.
• While monitoring the Yr: value, adjust A1 R615 for a marker value of
0 0.1 dB.
5-18
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Agilent 35670A
Adjusting the Analyzer
To adjust filter flatness
For the optional four channel analyzer, do the following to adjust filter flatness:
• Set the power switch to on ( I ).
• Press the following keys:
[ System Utility ]
[ MORE ]
[ SERVICE TESTS ]
[ ADJUSTMTS ]
[ CHANNEL 1 ADJUSTMNT ]
[ 25 kHz ]
Wait for the analyzer to set up the adjustment. The analyzer is ready when
the adjustment message appears on the screen.
• While monitoring the Yr: value, adjust A2 R115 in the lower slot for a
marker value of 0 0.1 dB.
• Press the [ 50 kHz FLATNESS ] softkey.
Wait for the analyzer to set up the adjustment. The analyzer is ready when
the adjustment message appears on the screen.
• While monitoring the Yr: value, adjust A2 R235 in the lower slot for a
marker value of 0 0.1 dB.
• Press the following keys:
[ Rtn ]
[ CHANNEL 2 ADJUSTMNT ]
[ 25 kHz FLATNESS ]
Wait for the analyzer to set up the adjustment. The analyzer is ready when
the adjustment message appears on the screen.
• While monitoring the Yr: value, adjust A2 R115 in the upper slot for a
marker value of 0 0.1 dB.
• Press the [ 50 kHz FLATNESS ] softkey.
Wait for the analyzer to set up the adjustment. The analyzer is ready when
the adjustment message appears on the screen.
• While monitoring the Yr: value, adjust A2 R235 in the upper slot for a
marker value of 0 0.1 dB.
5-19
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Adjusting the Analyzer
To adjust filter flatness
Agilent 35670A
• Press the following keys:
[ Rtn ]
[ CHANNEL 3 ADJUSTMNT ]
[ 25 kHz FLATNESS ]
Wait for the analyzer to set up the adjustment. The analyzer is ready when
the adjustment message appears on the screen.
• While monitoring the Yr: value, adjust A2 R615 in the lower slot for a
marker value of 0 0.1 dB.
• Press the following keys:
[ Rtn ]
[ CHANNEL 4 ADJUSTMNT ]
[ 25 kHz FLATNESS ]
Wait for the analyzer to set up the adjustment. The analyzer is ready when
the adjustment message appears on the screen.
• While monitoring the Yr: value, adjust A2 R615 in the upper slot for a
marker value of 0 0.1 dB.
5-20
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Agilent 35670A
Adjusting the Analyzer
To adjust the display voltage
To adjust the display voltage
This procedure adjusts the A102 DC-DC Converter assembly’s display voltage to
match the voltage required by the A101 Display assembly. This adjustment is only
required when the DC-DC Converter assembly or the Display assembly is replaced.
Equipment Required: Multimeter
Warning
The display voltage is +210 Vdc 10 Vdc nominal. Use caution when performing
this adjustment to avoid personal injury.
• Set the power switch to off ( O ).
• Record the V(ALL ON): voltage.
The V(ALL ON): voltage is printed on a sticker on the component side of the Display
assembly. The V(ALL ON): voltage is normally between +200 Vdc and +220 Vdc.
Caution
Do not adjust the display voltage above +230 Vdc. The Display assembly can be
damaged if the voltage is adjusted above +230 Vdc.
• Turn A102 R25 clockwise to its stop.
• Set the multimeter to a range greater than 220 Vdc and connnect to A102 TP1
using a shielded test clip.
• Set the power switch to on (I ).
• Using a non-metalic flat-edge adjustment tool, adjust A102 R25 for the voltage
recorded in step 2.
• Set the power switch to off.
5-21
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Replacing Assemblies
This chapter tells you what to do before and after you replace an assembly and
shows you how to disassemble the analyzer.
Warning
Disconnect the power cord from the rear panel before disassembly or assembly of
the Agilent 35670A.
Even with power removed, there can be sufficient stored energy in some circuits
to cause personal injury. These voltages will discharge to a relatively safe level
approximately five seconds after the power cord is disconnected.
Caution
Do not connect or disconnect cables from circuit assemblies with the line power turned
on ( l ).
To protect circuits from static discharge, remove or replace assemblies only at
static-protected work stations.
6-2
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Agilent 35670A
Replacing Assemblies
What to do before replacing the CPU assembly
What to do before replacing the CPU assembly
The analyzer’s serial number and firmware options are stored in EEPROM (U27) on
the A7 CPU assembly. Before replacing the CPU assembly, remove A7 U27 from the
faulty assembly and insert into the new assembly.
Caution
All firmware options will be lost if A7 U27 is not removed from the faulty assembly
and inserted into the new assembly.
6-3
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Replacing Assemblies
Agilent 35670A
What to do after replacing an assembly
What to do after replacing an assembly
• Reinstall all assemblies and cables that were removed during troubleshooting.
• Do the required adjustments listed in the following table.
• Do the required performance tests listed in the following table.
Assembly Replaced Required Adjustment
Required Performance Test
A1 Input
A2 Input
A5 Analog
Input dc offset, page 5-10
Noise
Common mode rejection, page 5-13
Filter flatness, page 5-17
Spurious signals
Amplitude accuracy
Flatness
Amplitude linearity
A-weight filter
Channel match
ICP supply
Noise
Input dc offset, page 5-10
Common mode rejection, page 5-13
Filter flatness, page 5-17
Spurious signals
Amplitude accuracy
Flatness
Amplitude linearity
A-weight filter
Channel match
ICP supply
Source, page 5-6
ADC, page 5-7
Input dc offset, page 5-10
DC offset
Noise
Spurious signals
Amplitude accuracy
Flatness
Amplitude linearity
Channel match
Single channel phase
accuracy
External trigger
Source amplitude accuracy
Source flatness
Source distortion
A6 Digital
Source amplitude accuracy
Source dc offset
Source flatness
6-4
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Agilent 35670A
Replacing Assemblies
What to do after replacing an assembly
Assembly Replaced
A7 CPU
Required Adjustment
Required Performance Test
Frequency reference, page 5-5
Frequency accuracy
A8 Memory
A9 NVRAM
A10 Rear Panel
Tach function (option 1D0 only)
External trigger
A11 Keyboard
Controller
A12 BNC
A13 Primary Keypad
A14 Secondary
Keypad
A22 BNC
A90 Fan
A98 Power Supply
A99 Motherboard
A100 Disk Drive
A101 Display
Display voltage, page 5-21
Display voltage, page 5-21
A102 DC-DC
Converter
6-5
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Replacing Assemblies
To remove cover
Agilent 35670A
To remove cover
1 Place the analyzer on its front panel. Using a
4 mm hex driver, loosen the four corner screws.
2
Slide the cover straight up.
6-6
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Agilent 35670A
Replacing Assemblies
To remove rear panel
To remove rear panel
1
Remove cover (see ‘’To remove cover’’).
2 Using a T-15 torx driver, remove the seven
screws from the rear panel. Pull the rear panel
straight off.
3 Disconnect the ribbon cable and the coaxial
cable from the A10 Rear Panel assembly.
6-7
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Replacing Assemblies
To remove front panel
Agilent 35670A
To remove front panel
1
Remove cover (see ‘’To remove cover’’).
2
Remove assembly retainer bracket.
3 Slide A5 Analog assembly part way out and
disconnect gray mic cable.
4 Using a T-15 torx driver, remove the two
screws on each side of the front panel.
6-8
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Agilent 35670A
Replacing Assemblies
To remove front panel
5
Pull the top of the front panel out of the frame.
6 Disconnect the ribbon cables from the front
panel. Disconnect the coaxial cables connected to
the A12/A22 BNC assembly.
6-9
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Replacing Assemblies
To remove disk drive
Agilent 35670A
To remove disk drive
1
Remove cover (see ‘’To remove cover’’).
2
Disconnect the disk drive cable.
3 Using a T-10 torx driver, loosen the three
screws at the back of the disk drive bracket.
4
Slide the disk drive back and lift up.
6-10
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Agilent 35670A
Replacing Assemblies
To remove CPU
To remove CPU
1
Remove cover (see ‘’To remove cover’’).
2
Using a T-10 torx driver, remove the nine
screws from the A7 CPU assembly. Lift the
assembly up, unpluging the A7 CPU assembly from
the A8 Memory assembly and A99 Motherboard.
3
Disconnect the ribbon cables from the A7
CPU assembly.
4 The analyzer’s serial number and firmware
options are stored in EEPROM (U27) on the A7
CPU assembly. Before replacing the CPU
assembly, remove A7 U27 from the faulty assembly
and insert into the new assembly. See ‘’What to do
before replacing the CPU assembly’’ on page 6-3.
6-11
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Replacing Assemblies
To remove NVRAM
Agilent 35670A
To remove NVRAM
1
Remove A7 CPU assembly (see ‘’To remove
CPU’’).
2 Using a T-10 torx driver, remove the four
screws from the A9 NVRAM assembly.
6-12
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Agilent 35670A
Replacing Assemblies
To remove memory
To remove memory
1 Remove A7 CPU assembly (see ‘’To remove
CPU’’). Remove optional A9 NVRAM assembly
(see ‘’To remove NVRAM’’).
2 Using a T-10 torx driver, remove the eight
screws from the A8 Memory assembly.
6-13
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Replacing Assemblies
Agilent 35670A
To remove power supply
To remove power supply
1
Remove rear panel (see ‘’To remove rear
panel’’).
2 Disconnect the ribbon cable from the A98
Power Supply assembly.
3 Using a T-15 torx driver, remove the six
screws from the A98 Power Supply assembly.
4 Set the front panel power switch in the
off ( O ) position (switch in the out position).
6-14
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Agilent 35670A
Replacing Assemblies
To remove power supply
5 Using a straight-edge screw driver, hold the
power switch rod in position and lift the A98 Power
Supply to disengage it from the power switch rod.
6
Lift the A98 Power Supply assembly straight
up.
6-15
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Replacing Assemblies
Agilent 35670A
To remove motherboard
To remove motherboard
1 Remove A98 Power Supply assembly (see
‘’To remove power supply’’). Remove A7 CPU
assembly (see ‘’To remove CPU’’).
2
Disconnect the fan cable from the A99
Motherboard.
3
Remove assembly retainer bracket.
4
Unplug all assemblies from the A99
Motherboard. )
6-16
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Agilent 35670A
Replacing Assemblies
To remove motherboard
5 Using a 5 mm open-ended wrench, remove the
two screws from the EXT MONITOR connector.
6 Using T-10 torx driver, remove the twelve
screws in A99 Motherboard.
6-17
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Replacing Assemblies
Agilent 35670A
To remove dc-dc converter
To remove dc-dc converter
1 Remove front panel (see ‘’To remove front
panel’’). Remove A7 CPU assembly (see ‘’To
remove CPU’’).
2 Using a T-10 torx driver, remove the five
screws from the front wall.
4 Using a T-10 torx driver, remove the four
screws from the A102 DC-DC Converter assembly.
3 Using a T-10 torx driver, remove the four
screws from the shield. Unplug ribbon cables.
6-18
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7
Replaceable Parts
7-1
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Replaceable Parts
This chapter contains information for ordering replacement parts for the
Agilent 35670A Dynamic Signal Analyzer.
Ordering Information
Replacement parts are listed in the following ten tables:
• Assemblies
• Cables
• Instrument Covers and Handles
• Assembly Covers and Brackets
• Front Panel Parts
• Rear Panel Parts
• Chassis Parts
• Card Nest Parts
• Screws, Washers, and Nuts
• Miscellaneous Parts
To order a part listed in one of the tables, quote the Agilent Technologies part number
(HP Part Number), the check digit (CD), indicate the quantity required, and address
the order to the nearest Agilent Technologies sales and service office (see the inside
back cover of this guide). The check digit verifies that an order has been transmitted
correctly, ensuring accurate and timely processing of the order. The first time a part is
listed in the table, the quantity column (Qty) lists the total quantity of the part used in
the analyzer. For definitions of the abbreviations and the corresponding name and
address of the manufacturers’ codes shown in the tables, see ‘’Code Numbers.’’
Caution
Many of the parts listed in this chapter are static sensitive. Use the appropriate
precautions when removing, handling, and installing all parts to avoid unnecessary
damage.
Non-Listed Parts
To order a part that is NOT listed in the replaceable parts tables, indicate the
instrument model number, instrument serial number, description and function of the
part, and the quantity of the part required. Address the order to the nearest Agilent
Technologies sales and service office (see the inside back cover of this guide).
7-2
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Agilent 35670A
Replaceable Parts
Ordering Information
Direct Mail Order System
Within the U.S.A., Agilent Technologies can supply parts through a direct mail order
system. Advantages of the Direct Mail Order System are:
• Direct ordering and shipment from the Agilent Parts Center.
• No maximum or minimum on any mail order. There is a minimum order for parts
ordered through a local Agilent sales and service office when the orders require
billing and invoicing.
• Transportation charges are prepaid. A small handling charge is added to each order.
• No invoicing. A check or money order must accompany each order.
• Mail order forms and specific ordering information are available through your local
Agilent Technologies sales and service office. See the inside back cover of this
guide for a list of Agilent Technologies sales and service office locations and
addresses.
Code Numbers
The following table provides the name and address for the manufacturers’ code
numbers (Mfr Code) listed in the replaceable parts tables.
Mfr No.
00268
00779
00955
05791
09353
10421
11919
12690
24931
28480
30817
34785
56501
57003
71400
73734
75915
76381
Mfr Name
Address
LEMO USA, Inc.
Santa Rosa, CA 95406 U.S.A.
Harrisburg, PA 17105 U.S.A.
South Bend, IN 46624 U.S.A.
Burbank, CA 91505 U.S.A.
Newton, MA 02158 U.S.A.
Dallas, TX 75284 U.S.A.
Chicago, IL 60693 U.S.A.
Nagoya-Shi Japan
Amp Inc.
Koszegi Industries Inc.
Lyn-Tron Inc
C & K Components Inc
Epson America Inc.
Computer Products Inc.
Fuji Polymer Industries Co. Inc.
Specialty Connector Co
Agilent Technologies Company
Instrument Specialties Co. Inc.
Dek Inc.
Franklin, IN 46131 U.S.A.
Palo Alto, CA 94304 U.S.A.
Placentia, CA 92670 U.S.A.
St Charles, IL 60174 U.S.A.
Bridgewater, NJ 08807 U.S.A
Carson, CA 90745 U.S.A.
St Louis, MO 63178 U.S.A.
Chicago, IL 60618 U.S.A.
Des Plaines, IL 60016 U.S.A.
Seattle, WA 98124 U.S.A.
Thomas & Betts Corp
Chomerics Shielding Technology
Cooper Industries Inc
Federal Screw Products Co.
Littelfuse Inc.
3M Co.
7-3
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Replaceable Parts
Assemblies
Agilent 35670A
Assemblies
After replacing an assembly, see ‘’What to do after replacing an assembly’’ in chapter
6 for required adjustments and performance tests.
The reference designator for the screws that fasten the A90 Fan assembly is MP600.
The reference designator for the screws that fasten the A98 Power Supply assembly is
MP603. The reference designator for the screws that fasten all other assemblies is
MP601.
7-4
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Agilent 35670A
Replaceable Parts
Assemblies
Ref
Des
Agilent Part
Number
Mfr
Code
Mfr Part
Number
CD Qty
Description
A1
35670-69501
35670-69502
35670-69505
35670-69506
35670-69507
9
0
3
4
5
1
2
1
1
1
INPUT ASSEMBLY - 2 CHANNEL
INPUT ASSEMBLY - 4 CHANNEL
ANALOG ASSEMBLY
28480
28480
28480
28480
28480
35670-69501
35670-69502
35670-69505
35670-69506
35670-69507
A2
A5
A6
A7
DIGITAL ASSEMBLY
CPU ASSEMBLY †
A8
35670-66508
35670-66509
35670-66510
35670-66511
35670-66512
6
7
4
5
6
1
1
1
1
1
MEMORY ASSEMBLY
28480
28480
28480
28480
28480
35670-66508
35670-66509
35670-66510
35670-66511
35670-66512
A9
NVRAM ASSEMBLY
A10
A11
A12
REAR PANEL ASSEMBLY
KEYBOARD CONTROLLER
BNC ASSEMBLY- 2 CHANNEL
A13
35670-66513
7
1
PRIMARY KEYPAD ASSEMBLY - 2
CHANNEL
28480
35670-66513
A14
A15
35670-64300
35670-66515
6
9
1
1
SECONDARY KEYPAD ASSEMBLY
28480
28480
35670-64300
35670-66515
PRIMARY KEYPAD ASSEMBLY - 4
CHANNEL
A22
A90
35670-66522
03585-68501
8
6
1
1
BNC ASSEMBLY - 4 CHANNEL
FAN ASSEMBLY
28480
28480
35670-66522
03585-68501
A98
0950-2357
35670-66599
0950-2141
2090-0340
0950-2335
9
9
9
9
3
1
1
1
1
1
POWER SUPPLY ASSEMBLY
MOTHERBOARD
11919
28480
10421
28480
28480
NFS177-7630
35670-66599
SMD-340
A99
A100
A101
A102
DISK DRIVE ASSEMBLY
DISPLAY ASSEMBLY
2090-0340
0950-2335
DC-DC CONVERTER ASSEMBLY
† The analyzer’s serial number and firmware options are stored in EEPROM (U27) on the A7 CPU
assembly. Before replacing the CPU assembly, remove A7 U27 from the faulty assembly and insert into
the new assembly. See ‘’What to do before replacing the CPU assembly’’ on page 6-3.
7-5
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Replaceable Parts
Cables
Agilent 35670A
Cables
Ref
Des
Agilent Part
Number
Mfr
Code
Mfr Part
Number
CD Qty
Description
W1
W2
W3
W4
W5
03585-61603
03585-61604
03586-61678
35665-61601
8120-6243
5
6
5
7
9
2
3
2
1
1
CBL-ASM CXL FSMB/FSMB 100MM OR
CBL-ASM CXL FSMB/FSMB 177MM YL
CBL-ASM CXL FSMB/FSMB 205MM GY
CBL-ASM CDIN/FHSG 80MM MULT
CBL-POWER 60POS RIBBON 75MM LG
28480
28480
28480
28480
28480
03585-61603
03585-61604
03586-61678
35665-61601
8120-6243
W6
W7
W8
W9
W10
8120-6236
8120-6242
8120-6241
8120-6240
03586-61677
0
8
7
6
4
2
1
1
1
2
CBL-KEYBOARD 16POS RIBBON
CBL - REAR PANEL 60POS RIBBON
CBL-DISC DRIVE 34POS RIBBON
CBL-DISPLAY 20POS RIBBON
28480
28480
28480
28480
28480
8120-6236
8120-6242
8120-6241
8120-6240
03586-61677
CBL-ASM CXL FSMB/FSMB 265MM BL
W11
W12
35670-61620
35670-61621
7
8
1
1
CBL-FRT PNL ADAPTER 4-CON LEMO
CBL-ADAPTER PLUG 4-COND W/LEMO
28480
28480
35670-61620
35670-61621
7-6
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Agilent 35670A
Replaceable Parts
Instrument Covers and Handles
Instrument Covers and Handles
Ref
Des
Agilent Part
Number
Mfr
Code
Mfr Part
Number
CD Qty
Description
MP1
35670-64101
5021-5483
5062-4806
35670-64102
1540-0292
5
4
9
6
9
1
2
1
1
1
SHTF ASSY-COVER ALV
COVER LATCHES
28480
28480
28480
28480
00955
35670-64101
5021-5483
5062-4806
35670-64102
1051-B-2
MP2
MP4
MOLD BUMPER SET 4PC FF CORNRS
IMPACT COVER - 35670A
PKG-CASE ACCESSORY
MP10
MP12
MP13
MP15
1530-0272
8160-0689
4
9
1
2
VIEWING HOOD
28480
30817
1530-0272
STMP RFI GASKET.228LNG BECUZN
0097-954-15
7-7
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Replaceable Parts
Agilent 35670A
Assembly Covers and Brackets
Assembly Covers and Brackets
Ref
Des
Agilent Part
Number
Mfr
Code
Mfr Part
Number
CD Qty
Description
MP100 35670-00605
MP101 35670-01203
MP102 35670-01204
MP103 35670-01205
MP104 35670-04102
0
6
7
8
0
1
1
1
1
1
SHTF SHIELD DISP PWR SUPPLY
SHTF BRKT,PCB RETAINER
SHTF BRACKET-FAN AL
SHTF DISC BRKT
28480
28480
28480
28480
28480
35670-00605
35670-01203
35670-01204
35670-01205
35670-04102
SHTF SLOT PLUG
MP105 35670-44701
MP106 4040-2321
9
2
2
1
GSKT FAN MOUNT W/SLUGS
DUST COVER DISC DRIVE
28480
28480
35670-44701
4040-2321
7-8
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Agilent 35670A
Replaceable Parts
Front Panel Parts
Front Panel Parts
The reference designator for the screws that fasten the bezel (MP208) to the front
frame (MP201) is MP604. The reference designator for the nuts that fasten the A101
Display assembly to the front frame is MP611. The reference designator for the
screws that fasten the front frame to the chassis is MP603.
Ref
Des
Agilent Part
Number
Mfr
Code
Mfr Part
Number
CD Qty
Description
MP200 0370-3069
MP201 35670-22001
MP203 35670-34305
MP204 35670-41901
MP207 35670-43701
2
6
8
5
7
1
1
1
1
1
MOLD KNB-1.12DRD RPG .25ID
CSTG-FRT FRAME MACH&PAINTED
PNL-OVRLY-DRESS 2CHAN PLCR
KYPD HARDKEY HINGED
28480
28480
28480
28480
28480
0370-3069
35670-22001
35670-34305
35670-41901
35670-43701
MOLD-PUSHROD PWR WHT
MP209 1252-4960
MP210 35670-29301
MP212 35670-44703
MP213 35670-44101
MP214 8160-0423
5
3
1
3
9
2
1
1
1
3
CONNECTOR-MULTICONTACT
LNZ-FLTR RFI/OPTICAL
12690
28480
28480
28480
57003
05-10108
35670-29301
35670-44703
35670-44101
01-0501-1891
DISPLAY GASKET
MOLD-COVER DISC DRIVE PCMT SLS
RFI ROUND STRIP MNL/SIL-RBR
.125-IN-OD
MP215 8160-0467
MP216 0515-0482
MP223 35670-34302
1
5
5
1
1
1
RFI STRIP-FINGERS BE-CU BRIGHT DIP
SCREW-SKT-HD-CAP M3 X 0.5 8MM-LG
PNL-OVRLY-DRESS 4CHAN PLCR
30817
28480
28480
97-555-A-X
0515-0482
35670-34302
7-9
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Replaceable Parts
Rear Panel Parts
Agilent 35670A
Rear Panel Parts
The reference designator for the screws that fasten the KEYBOARD connector and
A10 Rear Panel assembly to the rear panel is MP601. The reference designator for the
screws that fasten the rear panel to the chassis is MP603.
Caution
The POWER SELECT switch must be in the DC position (out position) when the key
cap (MP315) is removed. If the switch is not in the DC position when the key cap is
removed, the switch may be damaged.
Ref
Des
Agilent Part
Number
Mfr
Code
Mfr Part
Number
CD Qty
Description
MP300 35670-00201
MP305 2190-0913
MP306 2190-0586
MP309 0380-0643
MP310 0380-1832
2
9
2
3
4
1
6
2
2
4
SHTF REAR PANEL W/SILKSCREEN
WASHER-LK HLCL NO. 4 .115-IN-ID
WASHER-LK HLCL 4.0 MM 4.1-MM-ID
STANDOFF-HEX .255-IN-LG 6-32-THD
STDF-HXMF MIXED 4.8MMLG STLZN
28480
28480
28480
28480
00779
35670-00201
2190-0913
2190-0586
0380-0643
747404-3
MP312 1510-0038
MP314 2950-0072
8
3
1
1
BINDING POST ASSY SGL THD-STUD
28480
28480
1510-0038
2950-0072
NUT-HEX-DBL-CHAM 1/4-32-THD
.062-IN-THK
MP315 5041-0564
4
1
KEYCAP
28480
5041-0564
7-10
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Agilent 35670A
Replaceable Parts
Chassis Parts
Chassis Parts
Ref
Des
Agilent Part
Number
Mfr
Code
Mfr Part
Number
CD Qty
Description
MP400 35670-00101
MP401 35670-00102
MP402 35670-04103
MP403 35650-00601
MP404 35670-64302
1
2
1
2
8
1
1
2
1
1
SHTF-CHASSIS ASSY
28480
28480
28480
28480
28480
35670-00101
35670-00102
35670-04103
35650-00601
35670-64302
SHTF WALL ASSY FRONT
INPUT BD INSULATOR
SHTF CVR-SHLD MUFL
LBL CABLE 2CH CBL ROUTINE
MP405 35670-64304
0
2
LBL CABLE 4CH CBL ROUTINE
28480
35670-64304
7-11
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Replaceable Parts
Agilent 35670A
Screws, Washers, and Nuts
Screws, Washers, and Nuts
Ref
Des
Agilent Part
Number
Mfr
Code
Mfr Part
Number
CD Qty
Description
MP600 0515-0374
MP601 0515-0430
4
3
16 SCREW-MACHINE ASSEMPLY M3 X 0.5
10MM-LG
28480
28480
0515-0374
0515-0430
66 SCREW-MACHINE ASSEMPLY M3 X 0.5
6MM-LG
MP602 0515-1940
MP603 0515-2043
MP604 0515-1622
2
8
7
4
SCR-MCH M2.5 6MMLG PHTX SST *
28480
28480
28480
0515-1940
0515-2043
0515-1622
21 SCR-MCH M4.0 8MMLG FHTX SST *
4
SCR-CAP M4.0 8MMLG SKHX SSTBL
MP607 2190-0099
MP608 2950-0035
MP611 0535-0031
MP613 2190-0060
MP619 1252-0699
2
8
2
7
9
3
3
4
1
2
WASHER-LK INTL T 7/16 IN .472-IN-ID
NUT-HEX-DBL-CHAM 15/32-32-THD
NUT-HEX W/LKWR M3 X 0.5 2.4MM-THK
WASHER-LK INTL T 1/4 IN .256-IN-ID
SCR-JCK 4-40 .25LG THRD STLZN
28480
28480
28480
28480
05791
2190-0099
2950-0035
0535-0031
2190-0060
ST-9411-36
Miscellaneous Parts
Ref
Des
Agilent Part
Number
Mfr
Code
Mfr Part
Number
CD Qty
Description
MP702
MP703
MP704
MP705
MP707
1400-1122
1400-1229
0403-0285
1400-0249
0403-0179
0
8
9
0
0
1
1
4
1
CLAMP-CABLE .187-DIA .735-WD NYL
CLAMP-CABLE .375-DIA 1-WD NYL
BUMPER FOOT-ADH MTG 12.7-MM-WD
CABLE TIE .062-.625-DIA .091-WD NYL
34785
34785
76381
56501
76381
021-0188
021-0375
SJ-5018 GRAY
TY-23M-8
18 BUMPER FOOT-ADH MTG
SJ-5012
BLACK
A8B200 1420-0336
8
0
1
1
BATTERY
55002
75915
T06/46
A10F20 2110-0665
0
FUSE-1A 125V NTD .28X.096
R251001T1
A98 F1 2110-0342
A98 F2 2110-0920
0
0
1
1
FUSE 8A 250V NTD 1.25X.25 UL
71400
75915
ABC-8
FUSE 30A 32VDC NORMAL BLOW 3AG
311-030
7-12
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Agilent 35670A
Replaceable Parts
Option UK4 Parts
Option UK4 Parts
7-13
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Replaceable Parts
Option UK4 Parts
Agilent 35670A
Ref
Des
Agilent Part
Number
Mfr
Code
CD Qty
Description
Mfr Part Number
A77
A77P2
35670-66577
1252-5280
3
4
1
4
MICROPHONE PC ASSEMBLY
28480
00268
35670-66577
CONN-LEMO 7-CNT FEMALE RT - PC
EPG.1B.307.HL
N
A77P10 1252-1481
9
4
1
4
CON-RECT D-SUB 15CKT 15PN THL
SW -SL .02A 20VA1D
00779
09353
748876-1
A77SW 3101-3124
1
1101-M2S4AV2
BE
MP801
35670-00121
5
1
SHTF-BTTM OUTBOX W/SILKSCREEN
28480
35670-00121
MP802
MP803
MP804
35670-01206
35670-00120
1250-1558
9
4
7
1
1
5
SHTF BRKT MNTG OUTBOX
SHTF LID OUTBOX PAINTED
28480
28480
24931
35670-01206
35670-00120
29JJ126-3
ADAPTER-COAX STR F-BNC
F-RCA-PHONO
M0808
MP809
0403-0285
8120-4891
9
9
4
4
BUMPER FOOT-ADH MTG 12.7-MM-WD
CBL-RCA 153MM BK
76381
28480
SJ-5018 GRAY
8120-4891
MP810
0400-0009
9
1
GROMMET-RND .125-IN-ID
.25-IN-GRV-OD
28480
0400-0009
MP811
MP812
MP813
MP814
35670-61621
1510-0091
1510-0107
1400-1122
8
3
2
0
1
1
1
1
CBL-ADAPTER PLUG 4-COND W/LEMO
BINDING POST SGL SGL-TUR JGK RED
BINDING POST SGL SGL-TUR JGK CBK
CLAMP-CABLE .187-DIA .735-WD NYL
28480
28480
28480
34785
35670-61621
1510-0091
1510-0107
021-0188
MP815
MP816
MP817
MP818
MP819
8120-3828
8120-3860
1400-0249
0515-1946
0515-0430
0
0
0
8
3
1
1
3
LJPR 22GA BLK 100MM Dx8
28480
28480
56501
28480
8120-3828
8120-3860
TY-23M-8
0515-1946
0515-0430
LJPR 22GA RED 100MM Dx8
CABLE TIE .062-.625-DIA .091-WD NYL
13 SCR-MCH M3.0 6MMLG FHTX SST
7
SCR-MCH ASSEMPLY M3 X 0.5 6MM-LG 28480
MP820
MP821
2190-0016
2950-0001
3
8
2
2
WASHER-LK INTL T 3/8 IN .377-IN-ID
28480
73734
2190-0016
9002-NP
NUT-HEX-DBL-CHAM 3/8-32-THD
.094-IN-THK
MP822
MP823
MP824
1252-0699
2190-0583
8120-2587
9
9
6
2
2
1
SCR-JCK 4-40 .25LG THRD STLZN
05791
28480
28480
ST-9411-36
2190-0583
8120-2587
WASHER-LK HLCL 2.5 MM 2.6-MM-ID
CABLE ASSY-COAX 50-OHM 1.5KV
8.5-IN-LG
35670-90014
8120-1839
4
9
1
1
MICROPHONE & POWER OP NOTE
28480
28480
35670-90051
8120-1839
CABLE ASSY-COAX 50-OHM 24-IN-LG
JGK
8120-6237
1
4
CBL-ASM CXL BNC
28480
8120-6237
7-14
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8
Circuit Descriptions
8-1
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Circuit Descriptions
This chapter contains the overall instrument description and individual
assembly descriptions for the Agilent 35670A Dynamic Signal Analyzer. The
overall instrument description lists the assemblies in the analyzer and describes
the analyzer’s overall block diagrams. The assembly descriptions give
additional information for each assembly. For signal connections and
descriptions, see chapter 9, ‘’Voltages and Signals.’’
Overall Instrument Description
The Agilent 35670A Dynamic Signal Analyzer is an FFT spectrum/network analyzer
with a frequency range that extends from 0.19531 Hz to 102.4 kHz in single channel
mode and from 0.097656 Hz to 51.2 kHz in two channel mode. The optional four
channel analyzer has a frequency range that extends from 0.097656 Hz to 51.2 kHz in
two channel mode and from 0.048828 Hz to 25.6 kHz in four channel mode. The
analyzer has a built-in signal source providing random noise, burst random noise,
periodic chirp, burst chirp, pink noise, and fixed sine. Measurements can be saved to
an internal 3.5-inch flexible disk drive, an external HP SS-80 disk drive, or to internal
non-volatile memory. Plots and prints of the measurements can be made directly to
printers and plotters with GPIB, parallel, or serial interfaces. The analyzer also
supports the Instrument Basic programming language (IBASIC).
8-2
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Agilent 35670A
Circuit Descriptions
Overall Instrument Description
Overall Block Diagram
The following figures show the overall block diagrams for both the two channel and
the four channel analyzer. Each block in the diagrams represents a functional block in
the analyzer. The assembly that performs the function is listed in the block.
Contains the BNC connectors for both input channels and the source. For the four channel
analyzer, the BNC assembly contains the BNC connectors for all four input channels. Both
BNC assemblies filter the input channels HIGH (BNC center conductor) and LOW (BNC shell)
input signals to reduce noise at the inputs.
BNC
Input
Buffers, attenuates, amplifies, and filters the input signals. The input assembly also provides
common mode and differential overload detection, and half-range detection. The two channel
analyzer contains one A1 Input assembly and the four channel analyzer contains two A2 Input
assemblies.
Analog
Converts the input signals from the Input assembly (or assemblies) to digital data. The Analog
assembly also converts the digital data from the Digital assembly’s digital source to the analog
source signal. For the two channel analyzer, the analog source signal is routed to the Rear
Panel assembly and to the BNC assembly. For the four channel analyzer, the analog source
signal is routed only to the Rear Panel assembly.
Digital
CPU
Prepares the digital data from the Analog assembly for the CPU assembly. This assembly also
generates the digital source data for the Analog assembly.
Controls the analyzer. The following is a partial list of the operations it performs:
• Configures the assemblies
• Controls the Disk Drive assembly
• Controls the Display assembly
• Initiates the power-up sequence and calibration routine
• Processes digital data from the Digital assembly
• Computes the Fast Fourier Transform (FFT)
• Monitors for a keystroke
• Monitors the assemblies for overloads or other error conditions
• Runs the self tests
DC-DC Converter
Display
Generates the driver supply voltages for the Display assembly.
Offers a view of the processed data. See the description of the Display Controller for the “A7
CPU” later in this chapter for further details.
Memory
Contains RAM, NVRAM, ROM, and the battery-backed real time clock for the CPU assembly.
NVRAM
Provides the CPU assembly with additional NVRAM. This assembly is optional.
Stores and retrieves information on 3.5-inch flexible disks.
Tells the CPU assembly which key was pressed.
Disk Drive
Keyboard Controller
Primary Keypad
Consists of hardkeys and an RPG.
8-3
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Circuit Descriptions
Agilent 35670A
Overall Instrument Description
Secondary Keypad
Power Supply
Consists of hardkeys and softkeys.
Supplies the dc voltages shown in the block diagram. See “Power Supply Voltage
Distribution” in chapter 9 for additional information.
Rear Panel
Provides the interface for devices connected to its GPIB connector, parallel connector, serial
connector, and DIN keyboard connector. The Rear Panel assembly also provides the fan
control, external trigger connector, source connector, and tachometer connector and counter.
Two Channel Overall Block Diagram
8-4
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Agilent 35670A
Circuit Descriptions
Overall Instrument Description
Four Channel Overall Block Diagram
8-5
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Circuit Descriptions
A1 Input
Agilent 35670A
A1 Input
The A1 Input assembly is the input assembly for the two channel analyzer. The A1
Input assembly conditions the channel 1 and channel 2 input signals before they are
sent to the analog-to-digital converter on the A5 Analog assembly. The A1 Input
assembly sets the voltage ranges, conditions the input signals, and filters out alias
components. Signal conditioning is done with relays, high and low buffers, and a
series of amplifiers and attenuators. In addition, autozero DACs compensate for any
dc offset added to the signals by the circuits on this assembly. This assembly also
monitors the input signals for common mode or differential overloads and for
half-range conditions. Unless stated otherwise, the following description applies to the
block diagrams for both channel 1 and channel 2.
ICP Source
Supplies power to transducers such as accelerometers when enabled. The ICP Source is a 4.25
1.5 mA floating current source. The power for the current source is obtained by switching the
15 V supplies at the sample frequency (262 kHz), isolating through a 1:1 transformer,
rectifying and filtering. When disabled, the source is disconnected by a relay and the switching
power supply is disabled.
Input Relays
Select one of the 0 dB, 20 dB, or 40 dB pads and configure the input. The relays are controlled
by Relay Select & Energize.
Relay Select &
Energize
Selects and energizes the input relays. Relay Select & Energize is controlled by the IIC
Interface.
High Buffer
Buffers the HIGH input signal (BNC center conductor). The High Buffer contains a bootstrap
circuit that prevents harmonic distortion and large common mode signals from saturating the
buffer.
Low Buffer
Buffers the LOW input signal (BNC shell). The operation of the Low Buffer is identical to the
High Buffer.
+10 dB Differential
Amplifier
Begins the gain and attenuation stages. This amplifier subtracts the HIGH and LOW input
signals from the high and low buffers. The common mode rejection adjustment, adjusts the
+10 dB Differential Amplifier to reject common mode signals.
0 /–12 dB Amplifier
0 /+14 dB Amplifier
Step Attenuator
Can attenuate the signal by 12 dB.
Can amplify the signal by 14 dB.
Can attenuate the input signal from 0 dB to –14 dB, in 2 dB steps.
+2 dB Amplifier
Adds a gain of 2 dB and allows the DC Offset DAC to vary the dc offset of the input signal.
The purpose of the amplifiers and attenuators up to this point is to ensure that the input signal
does not overdrive the anti-alias filter or analog-to-digital converter.
8-6
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Agilent 35670A
Circuit Descriptions
A1 Input
DC Offset DAC
Compensates for any dc offset added to the input signal due to circuitry in the signal path. The
required dc offset is calculated during the analyzer’s calibration routine and is added to the
input signal in 0.345 mV increments by varying the dc offset at the inverting input of the +2 dB
Amplifier (see “Calibration Routine Description” in chapter 10).
Anti-Alias Filter Bypass Bypasses all filters.
100 kHz Anti-Alias
Filter
Provides alias protection up to 100 kHz for single channel measurements. Only the channel 1
input path has a 100 kHz Anti-Alias Filter.
50 kHz Anti-Alias Filter Provides alias protection up to 50 kHz for two channel measurements.
A-Weight Filter
Analog Switch
Provides additional filtering in the 50 kHz anti-alias filter path for acoustic measurements.
Selects one of four possible signals in the channel 1 input path to send to the ADC — the signal
from the Anti-Alias Filter Bypass, 100 kHz Anti-Alias Filter, 50 kHz Anti-Alias Filter, or
A-Weight Filter. In the channel 2 input path, the Analog Switch selects one of three possible
signals to send to the ADC — the signal from the Anti-Alias Filter Bypass, 50 kHz Anti-Alias
Filter, or A-Weight Filter.
Half Range and
Differential Overload
Detectors
Sense the signal at the anti-alias filters. When a detector detects a half-range or overload
condition, a digital low is sent to the IIC Interface by the detector. The half-range detector also
sends a control signal to the A13 Primary Keypad assembly when a half-range condition
occurs.
IIC (Inter-IC) Interface Contains 32 ports and connects the A1 Input assembly to the serial IIC bus. The A7 CPU
assembly uses the IIC bus to configure the input circuits. When a common mode or differential
overload occurs, the IIC Interface forces SINTn low to interrupt the CPU assembly. The CPU
assembly then reads the IIC Interface to determine the type of interrupt and the channel it
occurred on. During up/down autoranging, the A7 CPU queries the A1 Input assembly for half
range status. For a description of the IIC bus, see the description of the IIC Controller for the
“A7 CPU” later in this chapter.
8-7
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Circuit Descriptions
A1 Input
Agilent 35670A
A1 Input Block Diagram: Channel 1
8-8
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Agilent 35670A
Circuit Descriptions
A1 Input
A1 Input Block Diagram: Channel 1 (continued)
8-9
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Circuit Descriptions
A1 Input
Agilent 35670A
A1 Input Block Diagram: Channel 2
8-10
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Agilent 35670A
Circuit Descriptions
A1 Input
A1 Input Block Diagram: Channel 2 (continued)
8-11
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Circuit Descriptions
A2 Input
Agilent 35670A
A2 Input
The A2 Input assembly is the input assembly for the four channel analyzer. The four
channel analyzer contains two A2 Input assemblies. The A2 Input assembly
connected to J1 on the Motherboard conditions the channel 1 and channel 3 input
signals before they are sent to the analog-to-digital converter on the A5 Analog
assembly. The A2 Input assembly connected to J2 on the Motherboard conditions the
channel 2 and channel 4 input signals before they are sent to the analog-to-digital
converter on the A5 Analog assembly. The Input assembly sets the voltage ranges,
conditions the input signals, and filters out alias components. Signal conditioning is
done with relays, high and low buffers, and a series of amplifiers and attenuators. In
addition, autozero DACs compensate for any dc offset added to the signals by the
circuits on this assembly. The assembly also monitors the input signals for common
mode or differential overloads and for half-range conditions. Unless stated otherwise,
the following description applies to the block diagrams for all four channels.
Supplies power to transducers such as accelerometers when enabled. The ICP Source is a 4.25
ICP Source
1.5 mA floating current source. The power for the current source is obtained by switching the
15 V supplies at the sample frequency (262 kHz), isolating through a 1:1 transformer,
rectifying and filtering. When disabled, the source is disconnected by a relay and the switching
power supply is disabled.
Input Relays
Select one of the 0 dB, 20 dB, or 40 dB pads and configure the input. The relays are controlled
by Relay Select & Energize.
Relay Select &
Energize
Selects and energizes the input relays. Relay Select & Energize is controlled by the IIC
Interface.
High Buffer
Buffers the HIGH input signal (BNC center conductor). The High Buffer contains a bootstrap
circuit that prevents harmonic distortion and large common mode signals from saturating the
buffer.
Low Buffer
Buffers the LOW input signal (BNC shell). The operation of the Low Buffer is identical to the
High Buffer.
+10 dB Differential
Amplifier
Begins the gain and attenuation stages. This amplifier subtracts the HIGH and LOW input
signals from the high and low buffers. The common mode rejection adjustment, adjusts the
+10 dB Differential Amplifier to reject common mode signals.
0 /–12 dB Amplifier
0 /+14 dB Amplifier
Step Attenuator
Can attenuate the signal by 12 dB.
Can amplify the signal by 14 dB.
Can attenuate the input signal from 0 dB to –14 dB, in 2 dB steps.
+2 dB Amplifier
Adds a gain of 2 dB and allows the DC Offset DAC to vary the dc offset of the input signal.
The purpose of the amplifiers and attenuators up to this point is to ensure that the input signal
does not overdrive the anti-alias filter or analog-to-digital converter.
8-12
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Agilent 35670A
Circuit Descriptions
A2 Input
DC Offset DAC
Compensates for any dc offset added to the input signal due to circuitry in the signal path. The
required dc offset is calculated during the analyzer’s calibration routine and is added to the
input signal in 0.3.45 mV increments by varying the dc offset at the inverting input of the
+2 dB Amplifier (see “Calibration Routine Description” in chapter 10).
Anti-Alias Filter Bypass Bypasses all filters.
50 kHz Anti-Alias Filter Provides alias protection up to 50 kHz for two channel measurements.
25 kHz Anti-Alias Filter Provides alias protection up to 25 kHz for four channel measurements.
A-Weight Filter
Analog Switch
Provides additional filtering in the 25 kHz anti-alias filter path for acoustic measurements.
Selects one of four possible signals in the channel 1 or channel 2 input path to send to the ADC
— the signal through the Anti-Alias Filter Bypass, 50 kHz Anti-Alias Filter, 25 kHz Anti-Alias
Filter, or A-Weight Filter. In the channel 3 or 4 input path, the Analog Switch selects one of
three possible signals to send to the ADC — the Anti-Alias Filter Bypass, 25 kHz Anti-Alias
Filter, or the A-Weight Filter.
Half Range and
Differential Overload
Detectors
Sense the signal at the anti-alias filters. When a detector detects a half-range or overload
condition, a digital low is sent to the IIC Interface by the detector. The half-range detector also
sends a control signal to the A13 Primary Keypad assembly that lights an LED when a
half-range condition occurs.
IIC (Inter-IC) Interface Contains 32 ports and connects the A2 Input assembly to the serial IIC bus. The A7 CPU
assembly uses the IIC bus to configure the input circuits. When a common mode or differential
overload occurs, the IIC Interface forces SINTn low to interrupt the CPU assembly. The CPU
assembly then reads the IIC Interface to determine the type of interrupt and the channel it
occurred on. During up/down autoranging, the A7 CPU queries the A1 Input assembly for half
range status. For a description of the IIC bus, see the description of the IIC Controller for the
“A7 CPU” later in this chapter.
8-13
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Circuit Descriptions
A2 Input
Agilent 35670A
A2 Input Block Diagram: Channel 1 or Channel 2
8-14
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Agilent 35670A
Circuit Descriptions
A2 Input
A2 Input Block Diagram: Channel 1 or Channel 2 (continued)
8-15
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Circuit Descriptions
A2 Input
Agilent 35670A
A2 Input Block Diagram: Channel 3 or Channel 4
8-16
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Agilent 35670A
Circuit Descriptions
A2 Input
A2 Input Block Diagram: Channel 3 or Channel 4 (continued)
8-17
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Circuit Descriptions
A5 Analog
Agilent 35670A
A5 Analog
The A5 Analog assembly converts the analog input from the A1 Input assembly or A2
Input assemblies to 16-bit serial, digital data. The Analog assembly also converts
digital data from the A6 Digital assembly to the analog source output.
The input conversion process passes the analog inputs from all active channels through
an 8-bit ADC (analog-to-digital converter) twice adding dither (noise) to improve
linearity and the accuracy of low-level signals. All active inputs are sampled
simultaneously and held until all have been converted. For the first-pass conversion,
the input is scaled then converted to 8-bit serial, digital data. Dither is added to the
first-pass data and the sum is converted to an analog voltage. The analog voltage is
subtracted from the input and the difference is scaled then converted to 8-bit, serial
data in the second pass. The first-pass and second-pass values are added to get the
final 16-bit data word. A third conversion clears the 8-bit ADC.
Channel 1 Track &
Hold
Holds a voltage sample of the channel 1 input signal for the period of time required by the
ADC circuits to digitize the voltage.
Channel 2 Track &
Hold
Holds a voltage sample of the channel 2 input signal for the period of time required by the
ADC circuits to digitize the voltage.
Channel 3 Track &
Hold
Holds a voltage sample of the channel 3 input signal for the period of time required by the
ADC circuits to digitize the voltage.
Channel 4 Track &
Hold
Holds a voltage sample of the channel 4 input signal for the period of time required by the
ADC circuits to digitize the voltage.
Channel Switch
For the two channel analyzer, the Channel Switch multiplexes the channel 1 and channel 2
input signals during two channel measurements . During single channel measurements, the
channel 1 and channel 2 signals are not multiplexed. Instead, the Channel Switch is fixed to
the output of the Channel 1 Track & Hold. For the four channel analyzer, the Channel Switch
multiplexes the channel 1 and channel 2 input signals during two channel measurements.
During four channel measurements, the Channel Switch multiplexes the channel 1, 2, 3, and 4
input signals. The output of the Channel Switch is converted to a 16-bit digital word by
passing the signal through an 8-bit ADC twice.
1st Pass Circuit
ADC Controller
Divides the Channel Switch output by four and level shifts it to the 8-bit ADC input range of
0 to −0.5 V.
Adds dither (noise) to the first pass signal to increase the accuracy and reduce the non-linearity
of the Analog-to-Digital conversion. After the first pass signal is filtered and converted to an
8-bit word, the ADC Controller adds the dither and outputs a 16-bit word to the 2nd Pass DAC.
After the second pass signal is filtered and converted to an 8-bit word, the ADC Controller adds
the second pass word to the first pass word to obtain a 16-bit data word. The ADC Controller
then sends the converted data as ADDATA to the A6 Digital assembly. The ADC Controller
also detects an ADC overload when the signal to the analog-to-digital converter is too high.
The overload information is sent as ADCOL and ADCUL to the A6 Digital assembly.
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Agilent 35670A
Circuit Descriptions
A5 Analog
A5 Analog Block Diagram: ADC and Trigger
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Circuit Descriptions
A5 Analog
Agilent 35670A
ADC Input Switch
Connects the first pass signal to the low pass filter on the first pass. On the second pass, the
ADC Input Switch connects the second pass signal to the low pass filter. After the second pass,
the ADC Input Switch connects a 0.34 Vdc signal to the low pass filter to reset the 8-Bit ADC.
Low Pass Filter
8-Bit ADC
Reduces noise and prevents high frequency signals from overdriving the 8-bit ADC.
Converts the signal to an 8-bit word.
2nd Pass DAC
2nd Pass Circuit
Converts the first pass word plus dither to a voltage that is sent to the 2nd Pass Circuit.
Compares the output of the 2nd Pass DAC (converted first pass signal plus dither) to the
original input signal (which is still held by the Track & Hold) and produces a difference
voltage. This difference voltage is the second pass signal.
6.2 Voltage Reference Reduces the error due to temperature variations. This voltage reference is used by the 1st Pass
Circuit, 2nd Pass Circuit, ADC Input Switch, 8-bit ADC, and Track & Hold. Since the 8-bit
ADC’s gain is derived from this voltage reference, the adjustment for this voltage reference is
also the gain adjustment for the 8-bit ADC.
Trigger-Level Input
Temperature Sensor
Connects the appropriate signal to the Trigger-Level Comparator.
Senses the analyzer’s internal temperature. If the internal temperature exceeds a set point, this
circuit sets FANTRIP high which turns the fan back on if the fan was turned off by the user. If
the temperature becomes excessive, this circuit sets SHUTn low which forces all A98 Power
Supply assembly output voltages to zero.
Trigger-Level
Comparator
Trigger Level DAC
Compares the signal level with the value from the Trigger Level DAC.
Provides the trigger level. The A7 CPU assembly sets the trigger level via the IIC bus using
the value set with the [ TRIGGER SETUP ] and [ LEVEL ] softkeys.
Mic Buffer
Buffers control signals for the optional sound intensity probe. When a measurement is being
made, the MEAS line goes high to turn on the probe’s green LED. If an overload occurs
during the measurement, the OVLD line goes high to turn on the probe’s yellow LED.
IIC Interface
Provides the interface between the A7 CPU assembly and the A5 Analog assembly.
Provides the mode control to the Analog Switches and the digital source data to the DAC.
Serial In Parallel Out
Shift Register
Signal DAC
Converts the digital source data to an analog signal. During calibration, the analog signal from
the DAC is buffered or attenuated by 10. The calibration signal (CALP) is then routed to each
input channel.
Programmable Low-PassFilters the analog signal from the Signal DAC when selected. Filter bandwidth is set by
Filter
LPFCLK from the A6 Digital assembly; it can be set from 51.2 kHz to 1.56 Hz in binary steps.
Random noise and burst random noise signals below 51.2 kHz are filtered. Arbitrary signals
below 51.2 kHz can be filtered using the front panel keys.
100 kHz Low-Pass
Filter
Provides image rejection, reduces noise, and prevents high frequency signals from overdriving
the Attenuator DAC. It also compensates for sinx/x rolloff at the 262.144 kHz sample rate.
Attenuator DAC/DC
Offset DAC
Pink Noise Filter
Attenuates the signal and generates a dc offset.
Shapes the noise for a flat response in octave mode.
Combines the signal with the dc offset.
Summing
Output Amplifier
Amplifies and buffers the signal. A relay disconnects the signal from the SOURCE connector
10 ms before the A98 Power Supply assembly’s output voltages fall out of regulation.
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Agilent 35670A
Circuit Descriptions
A5 Analog
A5 Analog Block Diagram: Analog Source and Calibrator
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Circuit Descriptions
A6 Digital
Agilent 35670A
A6 Digital
The A6 Digital assembly prepares the digital input data for the A7 CPU assembly.
The Digital assembly also generates the digital source data for the A5 Analog
assembly. The Digital assembly receives the input signals as 16-bit serial, digital data
from the Analog assembly. The Digital assembly uses digital signal processing to
prepare the data for the CPU assembly. The CPU assembly configures the Digital
assembly via the fast bus. This includes setting up the source, calibrator, and all gate
arrays. See “A99 Motherboard” in chapter 9 for a description of the fast bus signals.
This assembly provides the following:
• Trigger
• Local Oscillator
• Digital Filter and RAM
• FIFO Controller and RAM
• Digital Source
• Digital Tachometer
• ADC timing and synchronization signals
Data in MUX
Selects ADDATA from the A5 Analog assembly for most modes of operation. For time
capture and some self-tests, the Data in Mux selects SRCDATA from the Digital Source.
Trigger & Sync
Trigger Gate Array
Local Oscillator
Pulls TRIGI low to inform the Trigger circuit that the selected trigger occurred. Synchronizes
the ADC (on the A5 Analog assembly), Digital Source, Digital Tach, and Trigger Gate Array.
Synchronizes data transfer by telling the FIFO Controller when to collect the time record in
FIFO RAM. This circuit also controls pre- and post-trigger.
Frequency shifts the data to allow start frequencies other than 0 hertz. To frequency shift the
data, the Local Oscillator digitally mixes or heterodynes the data down into the range of the
FFT span selected. This makes the data complex and the sample is now represented by two
serial, digital signals — REALO and IMAG. During baseband measurements (where the start
frequency is 0 hertz), the data is only scaled through the Local Oscillator.
Dither PAL
Adds span-dependent dither (noise) to the digital data.
Digital Filter
Filters the digital data before placing the samples in the Filter Latches for the FIFO. As the
Digital Filter operates, it may discard some samples to effectively reduce the sample rate. This
allows frequency spans narrower than full span (due to the properties of the FFT, the sample
rate must be varied to vary the frequency span). During full span measurements, no samples
are discarded and data is just passed through.
Digital Filter RAM
Filter Latches
Stores intermediate values for the Digital Filter during the filtering process.
Temporarily hold a data point as it is passed from the Digital Filter to the FIFO RAM.
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Agilent 35670A
Circuit Descriptions
A6 Digital
A6 Digital Block Diagram
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Circuit Descriptions
A6 Digital
Agilent 35670A
FIFO Controller
FIFO RAM
Gathers the data from the Filter Latches when the selected trigger occurs and places the data
into FIFO RAM. After a time record is collected, this circuit controls data flow from FIFO
RAM to the CPU.
Stores data from the Digital Filter. When the FIFO RAM has a complete time record, the FIFO
Controller pulls FIFOBAVn low to inform the A7 CPU assembly that a block of data is ready
for transfer.
FIFO Latches
Hold a data sample until the Fast Bus Interface is ready to transfer the sample.
Digital Source and
RAM
The A7 CPU assembly loads the Digital Source RAM by putting the data needed by the Digital
Source into main memory (on the A8 Memory assembly). The CPU assembly then performs a
memory-to-memory DMA transfer from main memory to Digital Source RAM via the fast bus.
This data represents any source type except random, pink, or fixed sine which are generated
internally by the Digital Source. Any source type, except fixed sine, will be
frequency-translated and bandwidth-limited to correspond to the instrument frequency range.
Digital Tachometer and Counts and stores the buffered tachometer pulses (BTACH) from the A10 Rear Panel
RAM
assembly. At the start of a measurement, GASYNC sets the Digital Tachometer’s counter to
zero. The counter starts counting and the tachometer signal latches the counter outputs. The
latched tachometer times are stored in RAM and read over the Fast Bus Interface by the A7
CPU assembly as needed.
Frequency Reference
Fast Bus Interface
Provides all clocks and timing for the gate arrays, Trigger & Sync, Digital Source, and Digital
Tach. In addition, the Frequency Reference generates PREFS and H10MHZ to synchronize
data transfers from the ADC on the A5 Analog assembly, and FSDIV2 for the A98 Power
Supply assembly.
Connects the A6 Digital assembly to the fast bus. The fast bus transfers time records from
FIFO RAM to the A7 CPU assembly for processing. The fast bus is also used by the CPU
assembly to read tachometer data, to send time capture data or source data to the Digital
Source, and to configure the Trigger, Local Oscillator, Digital Filter, FIFO Controller, Digital
Source and Digital Tachometer.
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Agilent 35670A
Circuit Descriptions
A7 CPU
A7 CPU
The A7 CPU assembly controls the entire analyzer. It performs multiple tasks, such
as:
• Initiating the power-up sequence and calibration routines
• Capturing front panel keystrokes
• Configuring the measurement hardware
• Processing input data from the A6 Digital assembly
• Controlling the A101 Display assembly
• Monitoring the hardware for faults or overloads
• Running the self tests
• Handling all data transfers for the fast bus, rear bus, and A100 Disk Drive assembly
MPU (Microprocessor) Controls the processor address bus and the buffered processor data bus. At power-up, this
circuit initializes the analyzer from the information stored in the Monitor ROM. This circuit
also processes interrupts from the Interrupt Handler and synchronizes data transfers on the
processor data bus with the Data Transfer Handler. The MPU also has access to
battery-backed-up SRAM on the A8 Memory assembly. This allows the CPU assembly to
store and update information such as the analyzer’s address, default disk, and peripheral
addresses.
Monitor ROM
Stores the information used by the MPU to initialize the analyzer.
DSP and Floating Point Relieve the MPU of math intensive-tasks by supplying the computational power needed for
Math Co-processor
accurate, high-speed signal processing operations — for example, windowing and Fast Fourier
Transform (FFT) for the analyzer’s narrow-band zoom mode. The DSP Co-processor is a high
speed (40 MHz) math co-processor that performs complex mathematical operations. The
Floating Point Math Co-processor performs floating point mathematical operations. The DSP
Co-processor and Floating Point Math Co-processor work as slave co-processors to the MPU
and the DSP Co-processor has its own RAM. This arrangement leaves the MPU free to
perform other functions while the DSP Co-processor and Floating Point Math Co-processor
perform math-intensive operations.
Interrupt Handler
Processes interrupts for the MPU. The Interrupt Handler sets the interrupt priority level and
returns an interrupt acknowledge to the circuit that generated the interrupt. If the MFP
controller causes an interrupt, the MPU reads a status byte from the MFP controller to
determine the circuit that caused the interrupt.
Data Transfer Handler Synchronizes data transfers in the analyzer with the MPU. When a data transfer occurs, the
Data Transfer Handler notifies the MPU when the transfer is complete.
Clock Circuits
Provide the clocks for the CPU assembly and the A8 Memory assembly.
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Circuit Descriptions
A7 CPU
Agilent 35670A
A7 CPU Block Diagram
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Agilent 35670A
Circuit Descriptions
A7 CPU
A7 CPU Block Diagram: Interface
Reset Logic
Puts the analyzer into a known state. A reset occurs at power-up and power-down (PVALID
from the A98 Power Supply assembly goes high), when the reset switch S2 (located on the
CPU assembly) is pressed, or when a RESET instruction is executed.
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Circuit Descriptions
A7 CPU
Agilent 35670A
PVALID from the power supply goes high when +5 volts reaches a valid level. The
Reset Generator produces a 128 ms reset pulse when PVALID goes high and S2 is
open, or when S2 is closed then opened and PVALID is high. At the end of the reset
pulse, RSTn goes high, which terminates the reset and allows all circuits to begin
operation.
Reset Logic
81
Connects the CPU assembly to the fast bus. All data transfers between the A6 Digital assembly
Fast Bus Interface
and the CPU assembly occur over the fast bus. The fast-bus address lines (FA0 through FA5)
and data lines (FD0 through FD15) are simply extensions of the processor address and data
busses. This allows fast transfers between the two assemblies. See ‘’A99 Motherboard’’ in
chapter 9 for a description of the fast bus signals.
MFP (Multiple-Function Handles interrupts and handshaking during data transfers for the IIC Controller, Disk
Peripheral) Controller
Controller, Display Controller, and RS-232 Interface.
Interrupts from these circuits are sent to the MFP Controller. When the MFP
Controller receives an interrupt, it interrupts the prioritized Interrupt Handler, which in
turn interrupts the MPU. The MPU then reads a status byte from the MFP Controller
to determine the cause of the interrupt. The MFP Controller also tells the Data
Transfer Handler if any data transfers occurred for these circuits.
IIC (Inter-IC) Controller Manages the IIC bus. It allows direct communication between the CPU assembly and the
following assemblies via the IIC bus:
• A1 or A2 Input
• A5 Analog
• A8 Memory (calendar/clock chip)
• A10 Rear Panel (tachometer control)
• A11 Keyboard Controller
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Agilent 35670A
Circuit Descriptions
A7 CPU
All of these assemblies appear as slaves to the IIC Controller. The IIC Controller has
access to EEPROM, which allows the CPU assembly to store information such as the
analyzer’s serial number. If the CPU assembly is replaced, the EEPROM integrated
circuit (U27) on the faulty assembly must be removed and inserted into the new
assembly (see ‘’What to do before replacing the CPU assembly’’ in chapter 6). The
IIC Controller also has access to a battery backed real-time clock on the A8 Memory
assembly.
The IIC bus consists of the following four signal lines:
• SCL (serial clock)
• SDA (serial data)
• SINTn (serial interrupt)
• SINTFPn (serial interrupt for A11 Keyboard Controller assembly)
Pull-up resistors connect these signals to logic high (all four lines are open collector or
open drain). See ‘’A8 Memory,’’ ‘’A11 Keyboard Controller,’’ and ‘’A99
Motherboard’’ in chapter 9 for descriptions of the IIC signals.
Disk Controller
Allows the analyzer to store or retrieve data from the internal 3.5-inch flexible A100 Disk
Drive assembly. It provides all the control signals necessary to operate the Disk Drive
assembly. The Disk Controller performs the following functions:
• Turns on the disk drive motor
• Selects the disk drive head
• Turns on the disk drive LED
• Selects a track on the flexible disk
• Writes or reads serial data to or from the flexible disk
The Disk Controller puts data on the flexible disk in a bit stream that consists of data
and clock bits. When data is read from the disk, this circuit separates the data bits
from the clock bits, converts the serial data bits to an 8-bit parallel word, and puts the
data word on the processor data bus. The operation is reversed when data is written to
the disk.
Display Controller
Frame Memory
Takes parallel data from the processor data bus and places the data in Frame Memory.
Consists of four 256K 4-bit RAM chips. One bit in Frame Memory corresponds to one pixel
on the display. The data in Frame Memory is then sent to the Video Gate Array.
Video Gate Array
RS-232 Interface
Continuously updates the display with the contents of Frame Memory. The Video Gate Array
also supplies the horizontal and vertical sync signals for the display.
Allows the analyzer to communicate with other devices such as terminals, plotters, or printers
via Instrument Basic. See Using Instrument Basic with the Agilent 35670A for additional
information.
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Circuit Descriptions
A8 Memory
Agilent 35670A
A8 Memory
The A8 Memory assembly provides the A7 CPU assembly with ROM, dynamic RAM
(DRAM), static RAM (SRAM), and a real-time clock.
Provides the interface between the A7 CPU assembly and the Memory assembly for data
transfer.
Memory Controller
FLASH ROM, DRAM, Stores data in 32-bit words. To access a memory location, the A7 CPU assembly puts the
and SRAM
address of the desired 32-bit word on the processor address bus. The following user-accessible
states are stored in SRAM. These states are unchanged by power-up or preset.
[ Local/Gpib ]
[ SYSTEM CONTOLLR ]
[ ADDRESSBL ONLY ]
[ ANALYZER ADDRESS ]
[ PLOTTER ADDRESS ]
[ PRINTER ADDRESS ]
[ DISK ADDRESS ]
[ DISK UNIT ]
[ System Utility ]
[ CLOCK SETUP ]
[ TIME HHMM ]
[ DATE MMDDYY ]
[ TIMESTAMP SETUP ]
[ KEYBOARD SETUP ]
[ Plot/Print ]
[ PLOT/PRNT DEVICE ]
[ PLOT/PRNT DESTINATN ]
[ SETUP ]
[ PLOT LINE SETUP ]
[ MORE SETUP ]
[ PLOT PEN SPEED ]
[ P1 P2 SETUP ]
[ TIME STMP ON OFF ]
[ PAGE EJCT ON OFF ]
[ SERIAL SETUP ]
[ Disk Utility ]
[ FORMAT DISK ]
[ DISK TYPE LIF DOS ]
[ DEFAULT DISK ]
[ NON-VOL RAM DISK ]
[ VOLATILE RAM DISK ]
[ INTERNAL DISK ]
[ EXTERNAL DISK ]
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Agilent 35670A
Circuit Descriptions
A8 Memory
ROM Address
Buffer the processor address bus.
Latch,DRAM Address
MUX and Buffer
DRAM Data Buffer
Buffers the data on the Processor Data Bus and the Buffered Processor Data Bus.
Allows the FLASH ROM to be reprogrammed.
FLASH Program
Control
RAM Battery Power
Provides battery backup for SRAM and the Battery Backed Real Time Clock.
Keeps track of the current time and date.
Battery Backed Real
Time Clock
A8 Memory Block Diagram
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Circuit Descriptions
A9 NVRAM
Agilent 35670A
A9 NVRAM
The optional A9 NVRAM assembly provides the A7 CPU assembly with additional
nonvolatile RAM.
Holds the address from the processor address bus. This circuit latches the address when an
Address Latch
address strobe occurs (BBASn goes low).
Data Buffer
Buffers the processor data bus.
Address Decode
Level Shift
Enables one of the eight battery-backed static RAM chips in the SRAM Array.
Disables the SRAM Array during power-up and power down, when the A7 CPU assembly’s
processor is externally reset, and when +5 volts on the A8 Memory assembly is too low.
SRAM Array
Contains eight battery-backed static RAM chips.
A9 NVRAM Block Diagram
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Agilent 35670A
Circuit Descriptions
A10 Rear Panel
A10 Rear Panel
The A10 Rear Panel assembly contains the BNC connectors for the external trigger
input, tachometer input, and source output. The Rear Panel assembly also contains
DIN, GPIB, serial, and parallel interface connectors. In addition, the Rear Panel
assembly provides the fan control for the A90 Fan assembly.
GPIB Controller and
Buffers
Allow the analyzer to communicate with devices such as plotters, printers, or a host computer
via an GPIB cable. These circuits handle all GPIB functions for the analyzer.
Parallel Port Controller Allow the analyzer to send data to printers with Centronics interfaces.
and Buffers
IIC Processor
Provides the interface from the DIN keyboard connector to the A7 CPU assembly. The IIC
Interface also decodes the control lines for the DAC.
DAC
Sets the tachometer trigger level. The A7 CPU assembly sends the control signals to the Rear
Panel assembly over the IIC bus. The IIC Processor decodes the control signals.
Tachometer Comparator Compares the input signal from the Tachometer BNC connector with the trigger level set by the
DAC. The output of the comparator changes TTL levels when the input signal crosses the
trigger level.
External Trigger Buffer Buffers the external trigger signal.
Fan Control
Provides the A90 Fan assembly with a voltage that controls the fan speed. A temperature
sensor provides a control signal that changes with the analyzer’s internal temperature. When
the temperature increases, Fan Control increases the fan speed. When the temperature
decreases, Fan Control decreases the fan speed. Control lines from the A7 CPU assembly can
also set the fan speed to high or turn the fan off.
Serial Driver
Drives the serial data lines to and from devices connected to the Serial Port. The serial port is
only available using Instrument Basic.
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Circuit Descriptions
A10 Rear Panel
Agilent 35670A
A10 Rear Panel Block Diagram
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Agilent 35670A
Circuit Descriptions
A11 Keyboard Controller
A11 Keyboard Controller
The A11 Keyboard Controller assembly together with the A13 Primary and
A14 Secondary Keypad assemblies make up the front panel keyboard. This assembly
provides the interface between the A7 CPU assembly and the keypads.
Generates a tone when instructed by the A7 CPU assembly. The beeper can be turned off by
pressing [ System Utility ] [ BEEPER ON OFF ].
Beeper
IIC Controller
Decodes data from the IIC bus providing the A13 Primary Keypad assembly with control lines
that turn overload and source LEDs on and off.
Keyboard
Microprocessor
Interrupts the A7 CPU assembly when a key is pressed or the RPG is turned. The CPU
assembly then addresses the Keyboard Microprocessor and reads an 8-bit frame of data from
the IIC bus to determine which key was pressed (for information about the IIC bus, see the
description of the IIC Controller in the ‘’A7 CPU’’ earlier in this chapter).
Interrupt Detection
Informs the A7 CPU assembly every time a key is pressed or the RPG is turned.
A11 Keyboard Controller Block Diagram
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Circuit Descriptions
A12 BNC
Agilent 35670A
A12 BNC
The A12 BNC assembly connects the BNC connectors on the two channel analyzer’s
front panel to their respective assembly. The Source BNC is connected to the A5
Analog assembly and the Channel 1 and Channel 2 BNCs are connected to the A1
Input assembly. In addition, this assembly provides RFI filtering for the Channel 1
and Channel 2 HIGH and LOW inputs.
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Agilent 35670A
Circuit Descriptions
A13 Primary Keypad
A13 Primary Keypad
The A13 Primary Keypad assembly contains the marker, display, numeric, and
measurement keys for the two channel analyzer. The Primary Keypad assembly also
contains the RPG and the LEDs that indicate a half range or overload condition on a
channel. See ‘’A11 Keyboard Controller’’ for additional information.
A14 Secondary Keypad
The A14 Secondary Keypad assembly contains the system keys and the softkeys. See
‘’A11 Keyboard Controller’’ for additional information.
A15 Primary Keypad
The A15 Primary Keypad assembly contains the marker, display, numeric, and
measurement keys for the four channel analyzer. The Primary Keypad assembly also
contains the RPG and the LEDs that indicate a half range or overload condition on a
channel. See ‘’A11 Keyboard Controller’’ for additional information.
A22 BNC
The A22 BNC assembly connects the BNC connectors on the four channel analyzer’s
front panel to their respective assembly. The Channel 1 and Channel 3 BNCs are
connected to the A2 Input assembly connected to A99 J1. The Channel 2 and Channel
4 BNCs are connected to the A2 Input assembly connected to A99 J2. In addition, this
assembly provides RFI filtering for the HIGH and LOW inputs.
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Circuit Descriptions
A90 Fan
Agilent 35670A
A90 Fan
The A90 Fan assembly cools the analyzer. The A10 Rear Panel assembly controls the
speed of the Fan assembly. As the temperature increases, the Rear Panel assembly
increases the fan speed. As the temperature decreases, the Rear Panel assembly
decreases the fan speed. The fan can also be turned off or set to full speed by pressing
[ System Utility ] [ FAN SETUP ] [ FAN OFF ] or [ FULL SPEED ].
A98 Power Supply
The A98 Power Supply assembly is a switching power supply that provides the
voltages for all the assemblies in the analyzer. The Power Supply can operate on ac
line power or on a dc battery pack. See ‘’Power Supply Voltage Distribution’’ in
chapter 9 for a list of the voltages and the assemblies that use each voltage.
A98 Power Supply Block Diagram
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Agilent 35670A
Circuit Descriptions
A99 Motherboard
A99 Motherboard
The A99 Motherboard assembly provides a common point of contact for voltage and
signal distribution. The Motherboard also buffers the external monitor signals and
routes the buffered signals to the EXT MONITOR connector. See ‘’A99
Motherboard’’ in chapter 9 for a list of all signals that are distributed via the
Motherboard assembly.
A100 Disk Drive
The internal A100 Disk Drive assembly stores and retrieves information from 3.5-inch
flexible disks. This assembly is controlled by the A7 CPU assembly. See the
description of the Disk Controller in ‘’A7 CPU’’ (earlier in this chapter) for additional
information.
A101 Display
The A101 Display assembly shows processed data sent by the A7 CPU assembly. See
the description of the Display Controller for the ‘’A7 CPU’’ (earlier in this chapter) for
further details.
A102 DC-DC Converter
The A102 DC-DC Converter assembly generates the driver supply voltages for the
A101 Display assembly and routes the display data from the A7 CPU assembly to the
Display assembly.
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Circuit Descriptions
Agilent 35670A
Option UK4 Microphone Adapter and Power Supply
Option UK4 Microphone Adapter and Power Supply
The optional Microphone Adapter and Power Supply provides four LEMO connectors
with power for microphones. The input signal from each LEMO connector is routed
to a BNC connector. BNC cables then connect the input signals to the analyzer’s input
channels.
+5 V Regulator
DC-to-DC Converter
Filter
Regulates +8 V to +5 V.
Converts +5 V to +28 V. The second DC-to-DC Converter converts +28 V to +200 V.
Filters +28 V providing the microphone preamplifier voltage to pins 5 and 6 of each LEMO
connector.
On Off
Connects a 200 V polarization voltage or ground to pin 3 of each LEMO connector.
Heater Input Power
Allows an externally supplied heater voltage to be connected to pin 1 of each LEMO
connector.
LED Drivers
Buffer
Provides control lines for the overload and measurement LEDs on the HP 35230A Sound
Intensity Probe.
Buffers the trigger signal from the HP 35230A Sound Intensity Probe. A BNC cable connects
the trigger signal to the analyzer’s rear panel.
Sound Intensity Probe Provides the interface to the HP 35230A Sound Intensity Probe.
Connector
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Agilent 35670A
Circuit Descriptions
Option UK4 Microphone Adapter and Power Supply
Option UK4 Microphone Adapter and Power Supply Block Diagram
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9
Voltages and Signals
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Voltages and Signals
This chapter shows where the signals and voltages are used in the analyzer and
describes each signal. The signals are described in groups as shown in the
following table.
Section Title
A1 Input
A2 Input
Describes signals routed ...
through SMB cables from A1 Input to A5 Analog
through SMB cables from A2 Input to A5 Analog
between A8 Memory and A7 CPU
A8 Memory
A9 NVRAM
between A9 NVRAM and A8 Memory
between A10 Rear Panel and external connectors
between A11 Keyboard Controller and A7 CPU
through A12 BNC
A10 Rear Panel
A11 Keyboard Controller
A12 BNC
A13 Primary Keypad
A14 Secondary Keypad
A22 BNC
between A13 Primary Keypad and A11 Keyboard Controller
between A14 Secondary Keypad and A11 Keyboard Controller
through A22 BNC
A99 Motherboard
A100 Disk Drive
A101 Display
through A99 Motherboard
between A100 Disk Drive and A7 CPU
between A101 Display and A7 CPU
A102 DC-DC Converter
between A102 DC-DC Converter and A101 Display
Note
Signals with a mnemonic that end with a lower case ‘’n’’ are active low.
Signal levels listed as low or high are TTL levels unless stated otherwise.
Measurements given in dBm are terminated in 50 ohms unless stated otherwise.
9-2
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Agilent 35670A
Voltages and Signals
Assembly Locations and Connections
Assembly Locations and Connections
Assembly Locations
9-3
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Voltages and Signals
Agilent 35670A
Assembly Locations and Connections
Assembly Connections for Two Channel Analyzer
9-4
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Agilent 35670A
Voltages and Signals
Assembly Locations and Connections
Assembly Connections for Four Channel Analyzer
9-5
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Voltages and Signals
Agilent 35670A
Power Supply Voltage Distribution
Power Supply Voltage Distribution
The following table shows the power supply voltages used by each assembly in the
analyzer. In addition, the table also shows the path taken by these voltages. Some
assemblies use the power supply voltages as supplied by the Power Supply assembly.
However, most assemblies contain voltage regulation and voltage decoupling circuits
to provide additional regulation and decoupling for their own use.
Voltages
From
Path
To
+18 V
–18 V
+12 V
+8 V
+5 V
Gnd
W5
A99
A1/A2
A5
Pwr Supply
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
W5/A99
W5/A99
•
•
•
•
•
•
•
•
•
W5/A99
A6
W5/A99/W7
W5/A99
A10
A90
A7
•
•
•
•
W5/A99
•
•
W5/A99/A7
W5/A99/A7/A8
W5/A99/A7/W6
A8
A9
A11
A13
A14
A100
A101
A102
W5/A99/A7/W6/A11
W5/A99/A7/W6/A11
W5/A99/A7/W8
•
•
•
W5/A99/A7/W6
•
•
W5/A99/A7/W6
9-6
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Agilent 35670A
Voltages and Signals
A1 Input
A1 Input
Analyzers with only two channels contain one A1 Input assembly. The A1 Input
assembly conditions both input signals. After the signals are conditioned by the Input
assembly they are routed through SMB cables to the A5 Analog assembly. The signal
from A1 P200 to A5 P4 is C1AAFO (Channel 1 Anti-Alias Filter Out). The signal
from A1 P700 to A5 P5 is C2AAFO (Channel 2 Anti-Alias Filter Out). The amplitude
of C1AAFO or C2AAFO is 1 Vrms with the analyzer set to the 1 dBVrms range and a
1.122 Vrms signal connected to the channel’s input connector.
A2 Input
Analyzers with the four channel option contain two A2 Input assemblies. The A2
Input assemblies condition all four input signals. After the signals are conditioned by
the Input assemblies they are routed through SMB cables to the A5 Analog assembly.
For the Input assembly connected to A99 J1, the signal from A2 P200 to A5 P4 is
C1AAFO (Channel 1 Anti-Alias Filter Out) and the signal from A2 P700 to A5 P6 is
C3AAFO (Channel 3 Anti-Alias Filter Out). For the Input assembly connected to A99
J2, the signal from A2 P200 to A5 P5 is C2AAFO (Channel 2 Anti-Alias Filter Out)
and the signal from A2 P700 to A5 P7 is C4AAFO (Channel 4 Anti-Alias Filter Out).
The amplitude of C1AAFO, C2AAFO, C3AAFO, or C4AAFO is 1 Vrms with the
analyzer set to the 1 dBVrms range and a 1.122 Vrms signal connected to the
channel’s input connector.
9-7
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Voltages and Signals
A8 Memory
Agilent 35670A
A8 Memory
The following table lists signals routed between the A8 Memory assembly and the
A7 CPU assembly. This table shows several things — if the assembly generates or
uses the signal or voltage, and if a signal is bidirectional. A description of each signal
follows the table.
A7 J3 Pin(s)
25C
25B
26C
26B
26A
27C
27B
27A
28C
28B
28A
29C
29B
29A
30C
30B
17A
3A
A8 P1 Pin(s)
C8
A7 J3
A8 P1
Signal Name
BD16
⇔
⇔
⇔
⇔
⇔
⇔
⇔
⇔
⇔
⇔
⇔
⇔
⇔
⇔
⇔
⇔
S
⇔
⇔
⇔
⇔
⇔
⇔
⇔
⇔
⇔
⇔
⇔
⇔
⇔
⇔
⇔
⇔
•
BD17
B8
BD18
C7
BD19
B7
BD20
A7
BD21
C6
BD22
B6
BD23
A6
BD24
C5
BD25
B5
BD26
A5
BD27
C4
BD28
B4
BD29
A4
BD30
C3
BD31
CPUSPCn
DSACK0n
DSACK1n
FLASHEN
G20MHZ
MEMRESET
PA0
B3
A16
A30
A29
A14
C1
•
S
4A
•
S
19A
32C
20A
1C
S
•
S
•
A13
C32
B32
C31
B31
C30
B30
C29
S
•
S
•
PA1
1B
S
•
PA2
2C
S
•
PA3
2B
S
•
PA4
3C
S
•
PA5
3B
S
•
PA6
4C
S
•
S
This assembly is the source of the signal.
• This assembly uses the signal.
⇔ This signal is bidirectional.
9-8
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Agilent 35670A
Voltages and Signals
A8 Memory
A7 J3 Pin(s)
4Bjio
5C
A8 P1 Pin(s)
B29
C28
B28
C27
B27
C25
B25
C24
B24
C23
B23
C22
B22
C21
B21
C20
B20
A22
A15
B2
A7 J3
S
A8 P1
Signal Name
PA7
•
•
PA8
S
PA9
5B
S
•
PA10
PA11
PA12
PA13
PA14
PA15
PA16
PA17
PA18
PA19
PA20
PA21
PA22
PA23
PA24
PA25
PA26
PASn
6C
S
•
6B
S
•
8C
S
•
8B
S
•
9C
S
•
9B
S
•
10C
10B
11C
11B
12C
12B
13C
13B
11A
18A
31B
16A
16C
16B
S
•
S
•
S
•
S
•
S
•
S
•
S
•
S
•
S
•
S
•
S
•
A17
C17
B17
C16
B16
C15
B15
C14
B14
C13
B13
C12
B12
C11
B11
C10
B10
A24
A11
A10
A21
A20
S
•
PD0
PD1
PD2
PD3
PD4
PD5
PD6
PD7
PD8
PD9
PD10
PD11
PD12
PD13
PD14
⇔
⇔
⇔
⇔
⇔
⇔
⇔
⇔
⇔
⇔
⇔
⇔
⇔
⇔
⇔
⇔
S
⇔
⇔
⇔
⇔
⇔
⇔
⇔
⇔
⇔
⇔
⇔
⇔
⇔
⇔
⇔
⇔
•
17B
18C
18B
19C
19B
20C
20B
21C
21B
22C
22B
23C
23B
9A
PD15
PRW
SCL
22A
23A
12A
13A
S
•
SDA
SIZE0
SIZE1
+5
⇔
S
⇔
•
S
•
5A, 6A, 10A,
15A, 15B, 15C
A18, B18, C18, A23,
A27, A28
•
•
+12
31A, 32A
A1, A2
•
•
9-9
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Voltages and Signals
A8 Memory
Agilent 35670A
Gnd
1A, 2A, 7A, 7B, 7C, 8A, C2, A3, A8, A9, B9, C9,
•
•
14A, 14B, 14C, 21A,
24A, 24B, 24C, 25A,
30A, 31C
A12, A19, B19, C19,
A25, A26, B26, C26,
A31, A32
Not Used
32B
B1
—
—
S This assembly is the source of the signal.
• This assembly uses the signal
⇔ This signal is bidirectional.
— This assembly does not use this signal.
BD16 —31
CPUSPCn
Buffered Data Bus — This is the buffered processor data bus from the A7 CPU assembly. This
bus is further buffered on the A8 Memory assembly.
CPU Space — This line goes low when the CPU space transfer occurs. When this line is low
the A8 Memory assembly does not respond.
DSACK0n —
DSACK1n
Data Strobe Acknowledge — During a write cycle, DSACK0n goes low after the A8 Memory
assembly places valid data on the data bus. During a read cycle, DSACK0n goes low after the
Memory assembly reads the data. When DSACK0n goes low and DSACK1n is low, 32 bits of
data are valid on PD0-15 and BD16-31. When DSACK0n goes low and DSACK1n is high, 8
bits of data are valid on BD24-31.
FLASHEN
G20MHZ
Flash Enable — This line is high only when the FLASH memory on the A8 Memory assembly
is being programmed. This line enables +12 V to the FLASH memory programming pin.
20 MHz Clock — This is a 50% duty cycle, 20 MHz clock. This clock provides the timing for
the A8 Memory assembly.
MEMRESET
Memory Reset — A high on this line resets the digital logic on the A8 Memory assembly. This
line pulses high during power-up and power-down, and when the A7 CPU assembly’s
microprocessor executes the RESET instruction or is externally reset.
PA0 — PA26
Processor Address Bus — This is the processor address bus from the A7 CPU assembly. This
bus is buffered on the A8 Memory assembly. PA0 and PA1 also operate with SIZE0 and
SIZE1 to specify the alignment of the operand.
PASn
Processor Address Strobe — A low on this line starts a memory access cycle. This line pulses
low when a valid address is on the processor address bus (PA1 — PA23).
PD0 — 15
PRW
Processor Data Bus — This is the processor data bus from the A7 CPU assembly.
Processor Read/Write — This line is high when the current memory cycle is a read and low
when the current memory cycle is a write.
SCL
SDA
Serial Clock — This is the serial clock for the IIC bus. The IIC controller on the A7 CPU
assembly generates this clock to synchronize the transfer of data on the IIC bus.
Serial Data — This is the IIC bus bidirectional data line. This line transmits real-time clock
data between the A7 CPU assembly and the A8 Memory assembly in 8-bit frames. The IIC
controller on the CPU assembly controls data transfers on the IIC bus.
9-10
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Agilent 35670A
Voltages and Signals
A8 Memory
SIZE0 — SIZE1
Data Size — These lines determine the size of the operand. When SIZE0 is high and SIZE1 is
low, the operand size is 8 bits. When SIZE0 is low and SIZE1 is high, the operand size is 16
bits. When both SIZE0 and SIZE1 are high, the operand size is 24 bits. When both SIZE0 and
SIZE1 are low, the operand size is 32 bits.
9-11
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Voltages and Signals
A9 NVRAM
Agilent 35670A
A9 NVRAM
The following table lists signals routed between the optional A9 NVRAM assembly
and the A8 Memory assembly. This table shows several things — if the assembly
generates or uses the signal or voltage, and if a signal is bidirectional. A description of
each signal follows the table.
Pin(s)
A6
A8 P2
•
A9 J1
Signal Name
BASn
•
⇔
⇔
⇔
⇔
⇔
⇔
⇔
⇔
S
•
MD24
MD25
MD26
MD27
MD28
MD29
MD30
B4
⇔
⇔
⇔
⇔
⇔
⇔
⇔
⇔
—
S
C4
B3
C3
B2
C2
B1
MD31
NVPRESn
OPRAMn
PA0
C1
A16
A2
C6
S
•
PA1
B6
S
•
PA2
C7
S
•
PA3
B7
S
•
PA4
C8
S
•
PA5
B8
S
•
PA6
C9
S
•
PA7
B9
S
•
PA8
C10
B10
C12
B12
C13
B13
C14
B14
C15
B15
S
•
PA9
S
•
PA10
PA11
PA12
PA13
PA14
PA15
PA16
PA17
S
•
S
•
S
•
S
•
S
•
S
•
S
•
S
•
S This assembly is the source of the signal.
• This assembly uses the signal.
⇔ This signal is bidirectional.
— This assembly does not use this signal.
9-12
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Agilent 35670A
Voltages and Signals
A9 NVRAM
Pin(s)
A8 P2
A9 J1
Signal Name
PROTCTn
PA18
A9
S
S
S
S
S
•
•
•
•
•
•
•
•
•
•
C16
PA19
A4
A12
PA20
PA21
B16
PRW
A3
VBATT
+5
A13, A14, A15
S
•
A10, A11, B11, C11
Gnd
A1, A5, B5, C5, A7, A8
•
S This assembly is the source of the signal.
• This assembly uses the signal.
⇔ This signal is bidirectional.
— This assembly does not use this signal.
BASn
Buffered Address Strobe — This line pulses low when a valid address is on the processor
address bus (PA0 — PA21).
MD24 — MD31
NVPRESn
Memory Data Bus — This is the buffered processor data bus from the A7 CPU assembly. This
bus is further buffered on the A8 Memory assembly.
NRAM Present — A low on this line indicates that the A9 NVRAM assembly is connected to
the A8 Memory assembly. This line is checked only during manual troubleshooting
procedures.
OPRAMn
Optional RAM — A low on this line enables the battery-backed static RAM on the
A9 NVRAM assembly.
PA0 — PA21
PROTCTn
Processor Address Bus — This is the processor address bus from the A7 CPU assembly. This
bus is buffered on the A8 Memory assembly.
Protect — A low on this line disables the battery-backed static RAM on the A9 NVRAM
assembly. This line pulses low during power-up and power-down, when the A7 CPU
assembly’s microprocessor is externally reset, and when +5 volts on the A8 Memory assembly
is too low.
PRW
Processor Read/Write — This line is high when the current memory cycle is a read and low
when the current memory cycle is a write.
VBATT
Battery Voltage — This line provides the power to the battery-backed static RAM on the
A9 NVRAM assembly. When the analyzer is on, the +5 volts on the A8 Memory assembly
provides the power for this line. When the analyzer is off, the battery on the Memory assembly
provides the power for this line. Since power is applied to the static RAM even when the
analyzer is off, the static RAM is non-volatile.
9-13
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Voltages and Signals
A10 Rear Panel
Agilent 35670A
A10 Rear Panel
This section describes the signals at the A10 Rear Panel assembly’s interface
connectors and input connectors. The signals are described in the following order:
GPIB
Serial Port
Parallel Port
DIN Keyboard
Source Output
Tachometer Input
External Trigger Input
GPIB
The following table lists signals at the GPIB connector (A10 J102). A general
description of each signal follows the table. For a detailed description of how the
analyzer interprets the GPIB lines, see the Agilent 35670A GPIB Command Reference.
Pin
Signal Name
ATN
11
DAVn
DIO1
6
1
DIO2
2
3
DIO3
DIO4
4
DIO5
13
14
15
16
5
DIO6
DIO7
DIO8
EOIn
IFCn
9
NDACn
NRFDn
RENn
8
7
17
10
12
18 – 24
SRQn
Shield
GND
ATN
Attention — This line is controlled by the controller in charge. When this line is low,
the DIO lines contain interface commands. When this line is high, the DIO lines contain data.
DAVn
Data Valid — This line goes low when valid data is on the bus and NRFDn is high. This line is
controlled by the GPIB controller.
9-14
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Agilent 35670A
Voltages and Signals
A10 Rear Panel
DIO1 — DIO8
Data Input/Output — These are inverted data lines that conform to IEEE specification
IEEE-488. When ATN is low, these lines contain interface commands. When ATN is high,
these lines contain data.
EOIn
IFCn
End or Identify — If ATN is high, a low on this line marks the end of a message block. If
ATN is low, a low on this line requests a parallel poll.
Interface Clear — This line goes low to halt all current operations on the bus, unaddress all
other devices, and disable serial poll. The system controller becomes the controller in charge.
This line is only used during the analyzer’s developement.
NDACn
Not Data Accepted — This line goes high when the DIO lines have been latched by
the acceptor.
NRFDn
RENn
SRQn
Not Ready for Data — This line goes high when the acceptor is ready to accept data.
Remote Enable — This line is low when the GPIB has control and high during local operation.
Service Request — This line is low when a device on the GPIB needs service.
Serial Port
The following table lists signals at the Serial Port connector (A10 J101). The Serial
Port is a 9-pin EIA-574 port that is only available using Instrument Basic. A
description of each signal follows the table.
Pin
Signal Name
DSR
6
DTR
1
RTS
4
RxD
3
2
TxD
Logic Gnd
Not Used
7
5, 8-9
DSR
Data Set Ready — Some devices check this line for a high to verify that the analyzer is
connected and ready. The user can set this line high or set this line to go high only when the
analyzer is ready for data transfer.
DTR
RTS
RxD
TxD
Data Terminal Ready — This line is tied high. Some devices check this line for a high to
verify that the analyzer is connected and ready.
Request To Send — This line is tied high. Some devices require this line to be high before
transferring data.
Receive Data — This is the serial EIA-574 receive data line. This line transmits data from
peripheral devices one byte at a time.
Transmit Data — This is the serial EIA-574 transmit data line. This line transmits data to
peripheral devices one byte at a time.
9-15
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Voltages and Signals
A10 Rear Panel
Agilent 35670A
Parallel Port
The Parallel Port is a 25-pin, Centronics port. The Parallel Port can interface with
printers or plotters. The following table lists signals at the Parallel Port connector
(A10 J100). A description of each signal follows the table.
Pin
Signal Name
ACKn
10
BUSY
11
FAULTn
IPn
15
16
PA0
2
PA1
3
PA2
4
PA3
5
PA4
6
PA5
7
PA6
8
PA7
9
PE
12
SELECT
STROBEn
Logic Gnd
Not Used
13
1
18
14, 17, 19 - 25
ACKn
BUSY
Acknowledge — The printer pulses this line low after it accepts a byte of data and is ready for
more data.
Busy — The printer sets this line high when it cannot receive data due to data entry, a full
buffer, or error status.
FAULTn
IPn
Fault — The printer sets this line low if it reaches an error state.
Input Prime — This line pulses low to reset the printer and clear the print buffer.
PA0 - PA7
Printer Data Bus —This is the 8-bit parallel data bus. These lines transmit a byte of data to the
printer.
PE
Paper Error — The printer sets this line high when it is out of paper.
SELECT
STROBEn
Selected — The printer sets this line high to indicate that it has been selected.
Strobe — This line pulses low when a byte of data is ready. A low pulse on this line clocks the
data into the printer.
9-16
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Agilent 35670A
Voltages and Signals
A10 Rear Panel
DIN Keyboard
The following table lists signals at the DIN keyboard connector (A10 P200). A
description of each signal follows the table.
Pin
1
Signal Name
KEYCLK
KEYDAT
3
+5 V
4
Logic Gnd
Not Used
2
5
KEYCLK
KEYDAT
Key Board Clock — This clock synchronizes the transfer of keyboard data from the external
keyboard to the A10 Rear Panel assembly.
Key Board Data — This is 8-bit serial data from an external keyboard to the A10 Rear Panel
assembly .
Source Output
The source output is routed from P3 on the A5 Analog assembly through an SMB
cable to P201 on the A10 Rear Panel assembly. The A10 Rear Panel assembly then
routes the source signal to the Source BNC connector. In two channel analyzers, the
source output is also routed from P2 on the A5 Analog assembly through an SMB
cable to P11 on the A12 BNC assembly. The A12 BNC assembly then routes the
source signal to the Source BNC connector on the front panel. The source signal can
be random noise, burst random noise, periodic chirp, burst chirp, pink noise, or fixed
sine. The signal’s amplitude range is 5 Vpk.
Tachometer Input
The A10 Rear Panel assembly converts the signal connected to the Tachometer BNC
connector to a TTL representation of the tachometer input (BTACH).
External Trigger Input
The A10 Rear Panel assembly buffers the signal connected to the External Trigger
BNC connector. The maximum trigger input level is 25 Vpk. The minimum trigger
pulse width is 600 ns and the maximum trigger pulse rate is 800 kHz.
9-17
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Voltages and Signals
Agilent 35670A
A11 Keyboard Controller
A11 Keyboard Controller
The following table lists signals routed between the A11 Keyboard Controller
assembly and the A7 CPU assembly. This table shows several things — if the
assembly generates or uses the signal or voltage, and if a signal is bidirectional. A
description of each signal follows the table.
Pin(s)
A7 P1
A11
Signal Name
BBEEPER
HRNGA
3
11
9
S
—
—
—
—
S
•
•
HRNGB
•
HRNGC
2
•
HRNGD
1
•
RESET
5
•
SCL
15
13
7
S
•
SDA
⇔
•
⇔
S
•
SINTFPn
+5 V
10
•
Gnd
6, 8, 12, 14, 16
•
•
Not Used
4
—
—
S This assembly is the source of the signal.
• This assembly uses the signal.
⇔ This signal is bidirectional.
— This assembly does not use this signal.
BBEEPER
HRNGA
Buffered Beeper — This line controls the frequency of the front panel beeper tone.
Half Range A — In both the two channel and four channel analyzer, a high on this line turns on
the channel 1 half range LED. This line goes high when the A1 or A2 Input assembly detects
that the amplitude of the channel 1 input signal reached half the set range.
HRNGB
Half Range B — In a two channel analyzer, a high on this line turns on the channel 2 half range
LED. In a four channel analyzer, a high on this line turns on the channel 3 half range LED.
This line goes high when the A1 Input assembly detects that the amplitude of the channel 2
input signal reached half the set range or when the A2 Input assembly detects that the
amplitude of the channel 3 input signal reached half the set range.
HRNGC
HRNGD
Half Range C — In a four channel analyzer, a high on this line turns on the channel 2 half
range LED. This line goes high when the A2 Input assembly detects that the amplitude of the
channel 2 input signal reached half the set range. This line is only used in four channel
analyzers.
Half Range D — In a four channel analyzer, a high on this line turns on the channel 4 half
range LED. This line goes high when the A2 Input assembly detects that the amplitude of the
channel 4 input signal reached half the set range. This line is only used in four channel
analyzers.
RESET
System Reset — A high on this line resets the digital logic on the A11 Keyboard Controller
assembly. This line pulses high during power-up and power-down, and when the A7 CPU
assembly’s microprocessor executes the RESET instruction or is externally reset.
9-18
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Agilent 35670A
Voltages and Signals
A11 Keyboard Controller
SCL
Serial Clock — This is the serial clock for the keyboard IIC bus. The IIC controller on the
A7 CPU assembly generates this clock to synchronize the transfer of data from the
A11 Keyboard Controller assembly.
SDA
Serial Data — This is the keyboard IIC bus. When a key is pressed or the RPG is turned,
SINTFPn interrupts the A7 CPU assembly and this line transmits data to the A7 CPU assembly
in 8-bit frames.
SINTFPn
Serial Interrupt from the Front Panel — A high-to-low transition on this line interrupts the
A7 CPU assembly. This line goes low when a key is pressed or when the RPG is turned.
9-19
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Voltages and Signals
A12 BNC
Agilent 35670A
A12 BNC
The A12 BNC assembly is only used in two channel analyzers. The A12 BNC
assembly routes the signals connected to the Channel 1 BNC connector and Channel 2
BNC connector to the A1 Input assembly. The A12 BNC assembly also routes the
source signal from the A5 Analog assembly to the Source BNC connector. The signal
connected to Channel 1 should be between 0.19531 Hz to 102.4 kHz in single channel
mode and between 0.097656 Hz to 51.2 kHz in two channel mode. The signal
connected to Channel 2 should be between 0.097656 to 51.2 kHz. For both channels,
the signal’s amplitude range must be between +27 dBVrms and –51 dBVrms for full
scale measurements. The source output signal can be random noise, burst random
noise, periodic chirp, burst chirp, pink noise, or fixed sine. The amplitude range of the
source output is 5 Vpk.
9-20
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Agilent 35670A
Voltages and Signals
A13 Primary Keypad
A13 Primary Keypad
The following table lists signals routed between the A11 Keyboard Controller
assembly and the A13 Primary Keypad assembly. This table shows several things —
if the assembly generates or uses the signal. A description of each signal follows the
table.
A11
•
A13
S
S
S
S
S
S
S
S
S
S
•
Signal Name
CHANA
CHANB
COL0
A11 Location
U1 pin 21
U1 pin 6
•
U1 pin 5
•
COL1
U1 pin 4
•
COL2
U1 pin 3
•
COL3
U1 pin 2
•
COL4
U1 pin 1
•
COL5
U1 pin 27
U1 pin 26
U1 pin 25
U3 pin 2
•
COL6
•
COL7
•
HRNGAn
HRNGBn
HRNGCn
HRNGDn
OVLDAn
OVLDBn
OVLDCn
OVLDDn
ROW0
S
S
S
S
S
S
S
S
•
U3 pin 4
•
U3 pin 6?
U3 pin 8?
U2 pin 4
•
•
•
U2 pin 5
•
U2 pin 6
•
U2 pin 7
•
U1 pin 13
U1 pin 14
U1 pin 15
U1 pin 16
U1 pin 17
U1 pin 22
U1 pin 23
U2 pin 9
S
S
S
S
S
S
S
•
ROW1
•
ROW2
•
ROW3
•
ROW4
•
ROW5
•
ROW6
•
SRCn
S
•
+5 V
U1 pin 19
U1 pin 12
•
Gnd
•
•
S This assembly is the source of the signal.
• This assembly uses the signal.
CHANA —
CHANB
These lines indicate the RPG’s direction and offset.
COL0 - COL7
Column 0 - Column 7 — A high-to-low transition on one column line indicates that a key in
that column was pressed. After the A11 Keyboard Controller assembly’s microprocessor
determines the keypad row location and the key number, the microprocessor sets columns 0 to
5 low which forces SINTFPn low. A high-to-low transition on SINTFPn informs the A7 CPU
assembly that a key was pressed.
HRNGAn
9-21
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Voltages and Signals
A13 Primary Keypad
Agilent 35670A
Half Range A — In both the two channel and four channel analyzer, a low on this line turns on
the channel 1 half range LED. This line goes low when the A1 or A2 Input assembly detects
that the amplitude of the channel 1 input signal reached half the set range. This line is HRNGA
inverted by the A11 Keyboard Controller assembly.
HRNGBn
Half Range B — In a two channel analyzer, a low on this line turns on the channel 2 half range
LED. In a four channel analyzer, a low on this line turns on the channel 3 half range LED.
This line goes low when the A1 Input assembly detects that the amplitude of the channel 2
input signal reached half the set range or when the A2 Input assembly detects that the
amplitude of the channel 3 input signal reached half the set range. This line is HRNGB
inverted by the A11 Keyboard Controller assembly.
HRNGCn
HRNGDn
Half Range C — In a four channel analyzer, a low on this line turns on the channel 2 half range
LED. This line goes low when the A2 Input assembly detects that the amplitude of the channel
2 input signal reached half the set range. This line is HRNGC inverted by the A11 Keyboard
Controller assembly. This line is only used in four channel analyzers.
Half Range D — In a four channel analyzer, a low on this line turns on the channel 4 half range
LED. This line goes low when the A2 Input assembly detects that the amplitude of the channel
4 input signal reached half the set range. This line is HRNGD inverted by the A11 Keyboard
Controller assembly. This line is only used in four channel analyzers.
OVLDAn
OVLDBn
OVLDCn
Overload A — In a four channel analyzer, a low on this line turns on the channel 1 overload
LED. This line goes low when the A2 Input assembly detects that the amplitude of the channel
1 input signal exceeded the set range. This line is only used in four channel analyzers.
Overload B — In four channel analyzers, a low on this line turns on the channel 2 overload
LED. This line goes low when the A2 input assembly detects that the amplitude of the channel
2 input signal exceeded the set range. This line is only used in four channel analyzers.
Overload C — In a two channel analyzer, a low on this line turns on the channel 1 overload
LED. In a four channel analyzer, a low on this line turns on the channel 3 overload LED. This
line goes low when the A1 Input assembly detects that the amplitude of the channel 1 input
signal exceeded the set range or when the A2 Input assembly detects that the amplitude of the
channel 3 input signal exceeded the set range.
OVLDDn
Overload D — In a two channel analyzer, a low on this line turns on the channel 2 overload
LED. In a four channel analyzer, a low on this line turns on the channel 4 overload LED. This
line goes low when the A1 Input assembly detects that the amplitude of the channel 2 input
signal exceeded the set range or when the A2 Input assembly detects that the amplitude of the
channel 4 input signal exceeded the set range.
ROW0 - ROW6
SRCn
Row 0 - Row 7 — When the row lines are set high, the row line that remains low indicates that
a key in that row was pressed.
Source On — A low on this line turns on the source LED. This line goes low when the Source
is turned on.
9-22
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Agilent 35670A
Voltages and Signals
A14 Secondary Keypad
A14 Secondary Keypad
The following table lists signals routed between the A11 Keyboard Controller
assembly and the A14 Secondary Keypad assembly. This table shows several things
— if the assembly generates or uses the signal. A description of each signal follows
the table.
A11 Connection
P2 Pin 3
P2 Pin 2
P2 Pin 1
P3 Pin 3
P3 Pin 2
P3 Pin 1
P4 Pin 3
P4 Pin 2
P4 Pin 1
P5 Pin 3
P5 Pin 1
A11
A14
S
Signal Name
COL0
•
•
•
•
•
•
•
•
•
S
•
COL1
S
COL2
S
ROW0
S
ROW1
S
ROW2
S
ROW3
S
ROW4
S
ROW5
S
PWRFW
GND
•
•
S This assembly is the source of the signal.
• This assembly uses the signal.
COL0 - COL2
Column 0 - Column 2 — A high-to-low transition on one column line indicates that a key in
that column was pressed. After the A11 Keyboard Controller assembly’s microprocessor
determines the keypad row location and the key number, the microprocessor sets the column
lines low which forces SINTFPn low. A high-to-low transition on SINTFPn informs the
A7 CPU assembly that a key was pressed.
ROW0 - ROW5
PWRFW
Row 0 - Row 5 — A low on one row line indicates that a key in that row was pressed.
Power Fail Warning — A high on this line turns on the power-on LED.
9-23
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Voltages and Signals
A22 BNC
Agilent 35670A
A22 BNC
The A22 BNC assembly is only used in four-channel analyzers. The A22 BNC
assembly routes the signals connected to the Channel 1 BNC connector and Channel 3
BNC connector to the A2 Input assembly connected to J1 on the Motherboard. The
A22 BNC assembly also routes the signals connected to the Channel 2 BNC connector
and Channel 4 BNC connector to the A2 Input assembly connected to J2 on the
Motherboard. The signal connected to Channel 1 and Channel 2 should be between
0.097656 Hz to 51.2 kHz in two-channel mode and between 0.048828 Hz to 25.6 kHz
in four-channel mode. The signal connected to Channel 3 and Channel 4 should be
between 0.048828 Hz to 25.6 kHz. For all channels, the signal’s amplitude range must
be between +27 dBVrms and –51 dBVrms for full-scale measurements.
9-24
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Agilent 35670A
Voltages and Signals
A99 Motherboard
A99 Motherboard
The following table lists all signals routed through the Motherboard. The table uses
bold face type to show which assembly can generate the signal. A description of each
signal follows the ‘’Motherboard Voltages’’ table.
Assembly Using Signal
Signal Name
A1/A2
J1
A2
J2
A5
A6
A7
A10
P10
59
A90
P90
A98
P98
Ext Mon
P95
Motherboard Connector
J5
J6
J7
Connector Pin Number
A10MHZ
ADCOLn
ADCULn
ADDATA
B5MHZ
BRESETn
BTACH
CALP
150
17A
17B
20A
17B
17C
20C
60
148
112
12A
12B
32A
10
C1
C1
1A
25
31
CEHPIBn
CEONIXn
CHSYNCn
DACCLK
DACDAT
DACUPDn
DITHER
DSPTRIG
DSR
138
139
18C
9C
18A
9B
10C
8C
10A
8B
11A
11A
125
25A
11
46
72
22C
ECLK
19C
32B
EFFSMP
EXTRGIN
FA1
18B
8
13B
13C
14B
14C
15B
64
FA2
114
65
FA3
FA4
115
66
FA5
2
FAN+
43
46
FANFUL
FANOFF
FANTRIP
FD0
93
45
143
61
9A
25B
76
9-25
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Voltages and Signals
A99 Motherboard
Agilent 35670A
Assembly Using Signal
A1/A2
J1
A2
J2
A5
A6
A7
A10
P10
A90
P90
A98
P98
Ext Mon
P95
Signal Name
Motherboard Connector
J5
J6
J7
Connector Pin Number
FD1
25C
26B
26C
27B
27C
28B
28C
29B
29C
30B
30C
31B
31C
32B
32C
19B
126
FD2
77
FD3
127
78
FD4
FD5
128
79
FD6
FD7
129
80
FD8
FD9
130
81
FD10
FD11
131
82
FD12
FD13
132
83
FD14
FD15
133
69
FDTACKn
FIFOBAVn
FIFOENn
FIFORDYn
FIRQn
FRW
68
18C
23B
123
75
24B
70
20C
19C
119
30
FSDIV2
FSELAn
FSELSn
H10MHZ
H20MHZ
HRNGA
HRNGB
HRNGC
HRNGD
HSYNC
IFCn
6C
24C
74
23C
124
22C
21C
22B
21B
121
107
A10
B10
57
108
58
A10
B10
8
56
84
14
102
88
IMODE
INTHPIBn
INTONIXn
KEYVALID
LPFCLK
28
26
32
17
89
135
10B
10B
9-26
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Agilent 35670A
Voltages and Signals
A99 Motherboard
Assembly Using Signal
A1/A2
J1
A2
J2
A5
J5
A6
A7
A10
A90
P90
A98
P98
Ext Mon
P95
Signal Name
Motherboard Connector
J6
J7
P10
Connector Pin Number
8B
MDACCSn
PFWn
PREFS
PVALID
RA1
8A
16A
23C
101
29
59
B16
B16
23A
52
140
91
35
38
37
40
39
48
49
50
51
54
53
56
55
RA2
RA3
141
92
RA4
RA5
142
94
RD24
RD25
RD26
RD27
RD28
RD29
RD30
RD31
RDTACKn
RRESETn
RRW
144
95
145
96
146
97
99
137
23
12
134
36
90
86
RSI
20
19
RSO
136
60
B15
B15
11C
2
1
SCL
SDA
A15
A15
11B
111
58
SHUTn
4C
51
62
SINTn
SPARE1
SPARE2
SPARE3
SPARE4
C15
C15
7C
9B
7B
9A
6B
53
A1
A1
1C
7B
SRCCLOCK
SRCDATA
SYSCNTR
TRIGGER
VDATA
7A
6A
6C
18
24
85
12A
12C
3, 4, 5
9
73
VSYNC
106
87
WEHPIBn
9-27
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Voltages and Signals
A99 Motherboard
Agilent 35670A
The following table lists all voltages routed through the Motherboard (see ‘’Power
Supply Voltage Distribution’’ earlier in this chapter for a complete list of assemblies
using each voltage).
Assembly Using Voltage
A1/A2
J1
A2
J2
A5
J5
A6
J6
A7
A10
A90
P90
A98
P98
EXT MON
P95
Voltage
Motherboard Connector
J7
P10
Connector Pin Number
+18 V
–18 V
+12 V
A3 – C3
A5 – C5
A3 – C3
A5 – C5
3A – 3C
5A – 5C
5 – 6
18 – 19
48 – 49
25 – 26
55 – 56
15 – 17
45 – 47
103
3 – 4
4 – 5
54 – 55
104–105
21 – 22
+8 V
+5 V
A7 – C7
A7 – C7
14A–14C
27
57
1 – 8
16B–16C 1A – 4C
1 – 3
12 – 20
47 – 50
63
27 – 30
31 – 38
98
100
113
GND
B1
A2
C2
A4
B1
A2
C2
A4
1B
5A – 5C
7C
9C
7 – 11
21 – 45
59
7
9
13
15 – 16
33 – 34
44
47
52
1
9 – 14
20 – 24
39 – 44
50 – 54
60
1
2
6
2A – 2C
4A – 4B
6A – 6B
7A
8A
12B
13A–13
15A–15
17A
18A–18B 20B
19A–19B20 21A
A–20B21A 21C
–21B22A–2 22A
2B23A–23 24A
B25A<@1 26A
10C
71
C4
C4
11B–11C12 109
C
13A
15A
17C
19A
A6 – C6
A8 – C8
A9
C9
A11
C11
A12–C12B A12
13–C13C14 C12
A16
C16
A6 – C6
A8 – C8
A9
C9
A11
C11
118
120
122
147
149
57 – 58
C13
A14
C14
A16
C16
50 >
27A
25C26A–26 28A
B27A–27C 29A
28A–28C29 30A
A–29C30A
31A
9-28
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Agilent 35670A
Voltages and Signals
A99 Motherboard
A10MHZ
ADCOLn
ADCULn
ADDATA
10 MHz Clock — This is a 50% duty cycle, 10 MHz clock. This clock provides the timing for
the IIC processor on the A10 Rear Panel assembly.
ADC Overload — This line goes low when the input to the A5 Analog assembly’s ADC
exceeds its positive limit.
ADC Underload — This line goes low when the input to the A5 Analog assembly’s ADC
exceeds its negative limit.
Analog to Digital Data — This line is the digital representation of the input signal from the
A5 Analog assembly’s ADC controller. The ADC controller sends this digital representation to
the A6 Digital assembly once per sample (3.8147 ms).
B5MHZ
5 MHz Clock — This is a 50% duty cycle, 5 MHz clock. This clock provides the timing for
the GPIB controller on the A10 Rear Panel assembly.
BRESETn
Buffered Reset — A low on this line resets the digital logic on the A5 Analog and A6 Digital
assembly. This line pulses low during power-up and power-down, and when the A7 CPU
assembly’s microprocessor executes the RESET instruction or is externally reset.
BTACH
CALP
Buffered Tachometer — This line is a TTL representation of the A10 Rear Panel assembly’s
tachometer input.
Calibration Signal — This line is the calibration signal from the A5 Analog assembly. During
calibration routines, this signal calibrates the input circuit on the A1 or A2 Input assembly. See
“Calibration Routine Description” in chapter 10, ‘’Internal Test Descriptions,’’ for further
details.
CEHPIBn
CEONIXn
CHSYNCn
DACCLK
GPIB Controller Chip Enable — This line is low whenever the GPIB controller is accessed for
read or write operations.
Chip Enable for the Parallel Port Controller — A low on this line enables the parallel port
controller on the A10 Rear Panel assembly.
Channel Synchronize — A low on this line synchronizes the A5 Analog assembly’s ADC
controller with the A6 Digital assembly.
Source Attenuation DAC Clock — This clock provides the timing for data transfer to the
A5 Analog assembly’s source attenuator and dc offset DAC. This clock is generated by the
A6 Digital assembly’s digital source.
DACDAT
Source Attenuation DAC Data — This line provides the control for the A5 Analog assembly’s
attenuator DAC and dc offset DAC. This serial data line is generated by the A6 Digital
assembly’s digital source.
DACUPDn
Source Attenuation DAC Latch — This is a control line from the A6 Digital assembly’s digital
source. A low on this line latches DACDAT after it is clocked into the A5 Analog assembly’s
attenuator DAC and dc offset DAC.
DITHER
DSPTRIG
DSR
Dither — This line provides digital noise to the A6 Digital assembly’s digital filter. The noise
bandwidth is set by EFFSMP.
DSP Trigger — This is a trigger line for the DSP processor on the A7 CPU assembly. The
DSP processor uses this line during gated measurements.
Data Set Ready — Some devices connected to the serial port check this line for a high to verify
that the analyzer is connected and ready. The user can set this line high or set this line to go
high only when the analyzer is ready for data transfer.
ECLK
E Clock — The gate arrays on the A6 Digital assembly use this clock for read and write timing.
EFFSMP
Effective Sample Rate — This line sets the update rate for DITHER. The update rate is
frequency and span dependent, and controls the dither bandwidth.
9-29
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Voltages and Signals
A99 Motherboard
Agilent 35670A
EXTRGIN
External Trigger In — This is a buffered version of the A10 Rear Panel assembly’s external
trigger input.
FA1 — FA5
Fast Bus Address Lines — These lines are a buffered form of the A7 CPU assembly’s
microprocessor address bus. The CPU assembly uses these lines to address different circuits on
the A6 Digital assembly.
FAN+
Fan Voltage — This voltage can vary from approximately +12 V to 0 V. This variable voltage
turns the fan on and off and controls the speed of the A90 Fan assembly.
FANFUL
FANOFF
FANTRIP
Fan Full — A high on this line causes FAN+ to go to its positive limit. When FAN+ is at its
positive limit, the A90 Fan assembly is on and turning at its highest speed.
Fan Off — A high on this line causes FAN+ go to its negative limit. When FAN+ is at its
negative limit, the A90 Fan assembly is off.
Fan Trip — A high on this line causes FANOFF to go low which allows the fan to turn on and
cool the analyzer. This line goes high when the fan is turned off and the internal temperature
exceeds a set point.
FD0 — FD15
Fast Bus Data Lines — These bidirectional data lines are a buffered version of the A7 CPU
assembly’s buffered microprocessor data bus. These lines allow communication between the
CPU assembly and A6 Digital assembly.
FDTACKn
FIFOBAVn
FIFOENn
Fast Bus Data Transfer Acknowledge — A low on this line terminates asynchronous bus
cycles.
First In First Out Block Available — This line goes low after the FIFO gate array on the
A6 Digital assembly collects a complete block of data.
First In First Out Enable — This line pulses low in response to a low on FIFOBAVn. This line
enables the transfer of one data word from the A6 Digital assembly’s FIFO gate array to the
A7 CPU assembly over the fast bus.
FIFORDYn
First In First Out Ready — This line goes low when a data word is ready to be transferred from
the A6 Digital assembly over the fast bus.
FIRQn
FRW
Fast Bus Interrupt Request — A low on this line interrupts the A7 CPU assembly.
Fast Bus Read/Write — This line is high during a read cycle and low during a write cycle.
This line is a buffered version of the read/write line (PRW).
FSDIV2
Sample Clock Divided By 2 — This is a 50% duty cycle, 131.072 kHz clock generated by the
A6 Digital assembly to synchronize the A98 Power Supply assembly. The Power Supply
assembly phase locks its switching frequency to this clock.
9-30
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Agilent 35670A
Voltages and Signals
A99 Motherboard
FSELAn
FSELSn
Fast Bus Asynchronous Select — This line is low when an asynchronous fast bus cycle is in
operation.
Fast Bus Synchronous Select — This line is low when a synchronous fast bus cycle is in
operation. The A6 Digital assembly uses this signal to enable I/O to its gate arrays and to the
A5 Analog assembly’s source attenuator DAC and dc offset DAC.
H10MHZ
H20MHZ
HRNGA
10 MHz Clock — This is a 50% duty cycle, 9.961472 MHz clock. This clock is H20MHZ
divided by 2.
20 MHz Clock — This is a 50% duty cycle, 19.922944 MHz clock. This clock provides the
timing for the analyzer.
Half Range A — In both the two channel and four channel analyzer, a high on this line turns on
the channel 1 half range LED. This line goes high when the A1 or A2 Input assembly detects
that the amplitude of the channel 1 input signal reached half the set range.
HRNGB
Half Range B — In a two channel analyzer, a high on this line turns on the channel 2 half range
LED. In a four channel analyzer, a high on this line turns on the channel 3 half range LED.
This line goes high when the A1 Input assembly detects that the amplitude of the channel 2
input signal reached half the set range or when the A2 Input assembly detects that the
amplitude of the channel 3 input signal reached half the set range.
HRNGC
HRNGD
HSYNC
Half Range C — In a four channel analyzer, a high on this line turns on the channel 2 half
range LED. This line goes high when the A2 Input assembly detects that the amplitude of the
channel 2 input signal reached half the set range. This line is only used in four channel
analyzers.
Half Range D — In a four channel analyzer, a high on this line turns on the channel 4 half
range LED. This line goes high when the A2 Input assembly detects that the amplitude of the
channel 4 input signal reached half the set range. This line is only used in four channel
analyzers.
Horizontal Synchronization — A high on this line causes the external monitor to do a
horizontal retrace. The Motherboard buffers this signal and routes it to the EXT MONITOR
connector.
IFCn
Interface Clear — This line is only used during the analyzer’s development.
IMODE
Input Mode — This line indicates the A98 Power Supply assembly’s input power mode. When
this line is high, the Power Supply assembly is operating on ac power. When this line is low,
the Power Supply assembly is operation on dc power.
INTHPIBn
INTONIXn
KEYVALID
GPIB Controller Interrupt — A low on this line interrupts the A7 CPU assembly. This line is
controlled by the A10 Rear Panel assembly’s GPIB controller.
Parallel Port Interrupt — A low on this line interrupts the A7 CPU assembly. This line is
controlled by the A10 Rear Panel assembly’s parallel port controller.
Key Valid — A high on this line interrupts the A7 CPU assembly. This line goes high when a
key is pressed on an external keyboard.
9-31
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Voltages and Signals
A99 Motherboard
Agilent 35670A
LPFCLK
MDACCSn
PFWn
Low Pass Filter Clock — This is a control line from the A6 Digital assembly’s digital source.
This line controls the cut-off frequency of the A5 Analog assembly’s programmable low pass
filter.
Source Attenuation DAC Chip Select — This is a control line from the A6 Digital assembly’s
digital source. A low on this line enables the Attenuator DAC and DC offset DAC on the
A5 Analog assembly.
Power Fail Warning — This line goes low 10 ms before the A98 Power Supply assembly’s
output voltages fall out of regulation. A low on this line tells the A7 CPU assembly to prepare
for power down and opens a relay which disconnects the source output on the A5 Analog
assembly. This line goes low in response to SHUTn going low or when the supply voltage is
disconnected or is too low.
PREFS
Pre-Sample Clock — This is a 262.144 kHz clock. This clock is at the same frequency as the
system sample rate, but it is inverted and advanced in time by 100 ns.
PVALID
RA1 - RA5
Power Valid — This line is high when the +5 V supply from the A98 Power Supply assembly
is stabilized.
Rear Bus Address Lines — These lines are a buffered form of the A7 CPU assembly’s
microprocessor address bus. The CPU assembly uses these lines to address different circuits on
the A10 Rear Panel assembly.
RD24 - RD31
Rear Bus Data Lines — These bidirectional data lines are an extension of the A7 CPU
assembly’s digital data bus. These lines allow communication between the CPU assembly and
A10 Rear Panel assembly.
RDTACKn
RRESETn
Rear Bus Data Transfer Acknowledge — A low on this line terminates asynchronous bus
cycles.
Rear Reset — A low on this line resets the digital logic on the A10 Rear Panel assembly. This
line pulses low during power-up and power-down and when the A7 CPU assembly’s
microprocessor executes the RESET instruction or is externally reset.
RRW
RSI
Rear Bus Read/Write — This line is high during a read cycle and low during a write cycle.
This line is an extension of the processor read/write line (PRW).
RS-232 Input — This is the serial RS-232-C receive data line. This line transmits data to the
A7 CPU assembly from peripheral devices one byte at a time.
RSO
SCL
SDA
RS-232 Output — This is the serial RS-232-C transmit data line. This line transmits data from
the A7 CPU assembly to peripheral devices one byte at a time.
Serial Clock — This is the serial clock for the IIC bus. The IIC controller on the A7 CPU
assembly generates this clock to synchronize the transfer of data on the IIC bus.
Serial Data — This is the IIC bus bidirectional data line. This line transmits data to or from the
A7 CPU assembly in 8-bit frames. The IIC controller on the CPU assembly controls data
transfers on the IIC bus.
SHUTn
SINTn
Power Supply Shut Down — A connection to ground on this line forces all Power Supply
output voltages to zero. This line is normally an open circuit, but becomes a connection to
ground if the analyzer’s internal temperature becomes excessive or if the power supply is
operating on dc power and no measurement has been made within 30 minutes.
Serial Interrupt — This is the IIC bus interrupt line. A low on this line interrupts the A7 CPU
assembly.
9-32
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Agilent 35670A
Voltages and Signals
A99 Motherboard
SRCCLOCK
Source Clock — This clock provides the timing for data transfer to the A5 Analog assembly’s
serial-in parallel-out shift register. This clock is generated by the A6 Digital assembly’s digital
source.
SRCDATA
SYSCNTR
TRIGGER
Source Data — This is the data line for the A5 Analog assembly’s serial-in parallel-out shift
register. This serial data line is generated by the A6 Digital assembly’s digital source.
System Control — A high on this line enables the A10 Rear Panel assembly’s GPIB buffers.
This line is high when the analyzer is under GPIB control.
Trigger — This line changes state when the selected trigger (channel 1, channel 2, channel 3,
channel 4, or external trigger) equals or exceeds the trigger level. An active edge on this line
causes the A6 Digital assembly to trigger the analyzer.
VDATA
Video Data — This is the serial data line for the external monitor. The Motherboard buffers
this line and routes three lines to the EXT MONITOR connector. Pin 3 is the data line for the
color red, pin 4 is the data line for the color green, and pin 5 is the data line for the color blue.
VSYNC
Vertical Synchronization — A high on this line causes the external monitor to do a vertical
retrace. The Motherboard buffers this signal and routes it to the EXT MONITOR connector.
WEHPIBn
GPIB Write Enable — A low on this line enables write operations to the A10 Rear Panel
assembly’s GPIB controller.
9-33
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Voltages and Signals
A100 Disk Drive
Agilent 35670A
A100 Disk Drive
The following table lists signals routed between the A100 Disk Drive assembly and
the A7 CPU assembly. This table shows several things — if the assembly generates or
uses the signal or voltage, and if a signal is bidirectional. A description of each signal
follows the table.
Pin(s)
A7 P3
A100
Signal Name
DIR
17
S
•
•
S
•
DISKINn
DRIVESELn
DSKCHGn
HDSEL
22
21, 29
S
•
1
S
•
3
S
•
HIDENSn
INDEXn
MTRn
33
S
S
•
27
•
19, 31
S
•
ReDATAn
SEL0
5
S
•
25
S
S
S
•
SEL1
23
•
STEPn
15
•
T00n
9
13
S
•
WDATA
WGATE
WRIPROTn
+5 V
S
S
•
11
•
7
S
•
24, 26, 28
2-20 (even)
30, 32, 34
•
Gnd
•
•
Not Used
—
—
S This assembly is the source of the signal.
• This assembly uses the signal.
— This assembly does not use this signal.
9-34
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Agilent 35670A
Voltages and Signals
A100 Disk Drive
DIR
Direction — This line sets the direction for the disk head. A high on this line sets the direction
away from the spindle. A low on this line sets the direction toward the spindle.
DISKINn
Disk In — This line goes low when a flexible disk is inserted in the A100 Disk Drive assembly.
DRIVESELn
DSKCHGn
Drive Select — A low on this line selects the A100 Disk Drive assembly.
Disk Change — This line goes low when a flexible disk is removed from the A100 Disk Drive
assembly. This line remains low until a flexible disk is installed and STEPn goes low.
HDSEL
Head Select — A low on this line selects the lower disk drive head. A high on this line selects
the upper disk drive head.
HIDENSn
High Density Select — This line goes low when a high density flexible disk is inserted in the
A100 Disk Drive assembly.
INDEXn
MTRn
Index — This line pulses low with each revolution of the flexible disk.
Motor On — A low on this line turns on the disk drive motor.
ReDATAn
SEL0 - SEL1
STEPn
Read Data — This line pulses low for each bit detected on the flexible disk.
Drive Select — When SEL0 and SEL1 are low, the A100 Disk Drive assembly is enabled.
Step — A low on this line moves the disk drive head. When STEPn and DIR are low, the head
moves toward the disk spindle. When STEPn is low and DIR is high, the head moves away
from the disk spindle.
T00n
Track 00 — This line is low when the head is positioned over track 0 on the flexible disk.
WDATA
Write Data — When WGATE is low, a low pulse on this line writes a bit to
the disk.
WGATE
Write Gate — When this line is low, information may be written to the A100 Disk Drive
assembly under control of the WDATA line.
WRIPROTn
Write Protect — This line is low when a write-protected disk is installed in the A100 Disk
Drive assembly.
9-35
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Voltages and Signals
A101 Display
Agilent 35670A
A101 Display
The following table lists signals routed between the A102 DC-DC Converter assembly
and the A101 Display assembly. This table shows several things — if the assembly
generates or uses the signal or voltage, and if a signal is bidirectional. A description of
each signal follows the table.
Pin(s)
A102
A101
Signal Name
HSYNCELn
PSENBLn
VCLK
11
•
•
•
S
•
18
15
•
VID
13
•
•
VSYNCEL
+215 V
-175 V
9
•
•
4
S
S
S
S
•
•
1
•
+40 V
5
•
+20 V
17
•
+12 V
6
7
•
+5 V
•
•
Gnd
2, 3, 12, 14, 16
19, 20
•
•
Not Used
—
—
S This assembly is the source of the signal.
• This assembly uses the signal.
— This assembly does not use this signal.
HSYNCELn
PSENBLn
Horizontal Synchronization — A low on this line causes a horizontal retrace on the
A101 Display assembly. Between each HSYNCELn pulse, 560 pixels are sent to the Display
assembly.
Power Supply Enable — A low on this line enables the A102 DC-DC Converter assembly’s
power supply. The power supply generates the driver supply voltages. The driver supply
voltages are +20 V, +40 V, +215 V, and −175 V.
VCLK
VID
Video Clock — This 20 MHz clock provides the timing reference for HSYNCELn, VID, and
VSYNCEL. The rising edge of this clock determines setup and hold times.
Video Data — This is the serial data line for the A101 Display assembly. This line transmits
video data to the Display assembly. The video data is transmitted at the VCLK rate between
horizontal and vertical retraces (during the time HSYNCELn is high and VSYNCEL is low).
Only the first 400 lines of data are displayed after a VSYNCEL pulse.
VSYNCEL
Vertical Synchronization — A high on this line causes a vertical retrace on the A101 Display
assembly.
9-36
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Agilent 35670A
Voltages and Signals
A102 DC-DC Converter
A102 DC-DC Converter
The following table lists signals routed between the A7 CPU assembly and the
A102 DC-DC Converter assembly. This table shows several things — if the assembly
generates or uses the signal or voltage, and if a signal is bidirectional. A description of
each signal follows the table.
Pin(s)
A7 P2
A102
Signal Name
HSYNCELn
VCLK
11
S
S
S
S
•
•
•
13
VID
15
•
VSYNCEL
+12 V
9
•
1, 2
•
+5 V
3, 4
7, 8, 10, 12, 14, 16
5, 6
•
•
Gnd
•
•
Not Used
—
—
S This assembly is the source of the signal.
• This assembly uses the signal.
— This assembly does not use this signal.
HSYNCELn
Horizontal Synchronization — A low on this line causes a horizontal retrace on the
A101 Display assembly. Between each HSYNCELn pulse, 560 pixels are sent to the Display
assembly.
VCLK
VID
Video Clock — This 20 MHz clock provides the timing reference for HSYNCELn, VID, and
VSYNCEL. The rising edge of this clock determines setup and hold times.
Video Data — This is the serial data line for the A101 Display assembly. This line transmits
video data to the Display assembly. The video data is transmitted at the VCLK rate between
horizontal and vertical retraces (during the time HSYNCELn is high and VSYNCEL is low).
Only the first 400 lines of data are displayed after a VSYNCEL pulse.
VSYNCEL
Vertical Synchronization — A high on this line causes a vertical retrace on the A101 Display
assembly.
9-37
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10
Internal Test Descriptions
10-1
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Internal Test Descriptions
This chapter describes the power-on test, calibration routine, fault log
messages, and self tests. This chapter also contains a list of the GPIB
commands for each self test.
Power-on Test Description
The power-on test is run when the analyzer is powered up. The calibration routine is
run immediately following the power-on test. The power-on test exercises the
A7 CPU assembly and A8 Memory assembly. This test is divided into low-level and
high-level subtests.
Low-level Subtests
The low-level power-on subtests exercise the core of the A7 CPU assembly and A8
Memory assembly. If an error occurs during the low-level subtests, the test stops and
displays an error code on the A7 CPU assembly’s power-on test LEDs.
High-level Subtests
The high-level power-on subtests exercise the fast bus and the multi-function
peripheral on the A7 CPU assembly. The high-level subtests are also self tests (see
‘’Self-Test Descriptions’’). If an error occurs during the high-level subtests, an error
message is entered in the test log.
10-2
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Agilent 35670A
Internal Test Descriptions
Power-on Test Description
Power-on Test Messages
The ‘’Power-on Test Messages’’ table provides additional information for interpreting
the power-on test LEDs. Using the ‘’Binary to Hexadecimal’’ table, translate the
power-on test LEDs to their equivalent hexadecimal code (see ‘’To troubleshoot
power-up failures’’ on page 4-15 for details on decoding the power-on test LEDs to
their binary code). The ‘’Power-on Test Messages’’ table describes the power-on
subtests in the order they are run. The table also shows the relationship between a
failing power-on subtest and the assemblies or sub-blocks.
False error codes can be caused by shorts on the buses, reset line, or interrupt line. If
an error code is caused by the last bus connected, it is probably the source of the
failure.
Binary to Hexadecimal
Binary
1 = LED on
0 = LED off
Hexadecimal
0000
0001
0010
0011
0100
0101
0110
0111
1000
1001
1010
1011
1100
1101
1110
1111
0
1
2
3
4
5
6
7
8
9
A
B
C
D
E
F
10-3
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Internal Test Descriptions
Power-on Test Description
Agilent 35670A
Power-on Test Messages
Assembly/Sub-block
Hexadecimal
Code
Message
Undefined
FF*
04
Initial power-on
X
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
X
X
X
X
0
X
X
X
X
X
X
0
CPU flashes LEDs
LED DSACK failure
CPU failure
X
X
X
X
X
X
0
13
01
Coprocessor DSACK failure
Coprocessor failure
Boot ROM checksum failure
Display DSACK failure
Display failure
17
0
18
0
06
0
0
X
X
10
0
0
0
1B
Main RAM too small
Main RAM DSACK
Main RAM bit failure
Main RAM refresh failure
Program ROM checksum error
Clear ~4s
0
0
0
0
0
0
0
0
0
0
0
0
0
X
X
X
X
X
02
0
0
0
14
0
0
0
16
0
0
0
1C
0
0
0
00
X
0
X
X
0
0
A1
Starting DSP test
Fast bus test
0
0
0
A2
0
0
X
0
A0
MFP test failure
0
X
X
0
AE
Front panel test
0
0
0
X
0
X
Assembly or sub-block is used but is probably not the cause of the failure message.
Assembly or sub-block is probably the cause of the failure message.
(blank) Assembly or sub-block is not used in the test.
FF* If the area of failure is unclear, all LEDs flash continuously.
10-4
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Agilent 35670A
Internal Test Descriptions
Calibration Routine Description
Calibration Routine Description
The calibration routine consists of a dc-offset calibration and a frequency calibration.
The calibration routine occurs immediately following the power-on tests and
periodically afterwards to compensate for any drift. The calibration routine sets the
input relays to disconnect the internal circuitry from the BNC center conductor and
shell, and connect the source (via CALP) to the input channels. Measurements are
then taken using several input paths to produce correction curves for all input ranges.
If calibration fails, the calibration routine is repeated up to two more times. Each time
calibration fails, a calibration failure message is added to the fault log. If calibration
fails all three times, a calibration failure message is displayed on the screen.
If you abort a self test before the self test is finished, the analyzer may fail its
calibration routine. To prevent this from happening, press [ Preset ] [ DO PRESET ] or
cycle power after you abort a self test.
To manually start the calibration routine, press the [ System Utility ] [ CALIBRATN ]
[ SINGLE CAL ].
To prevent the calibration routine from occurring, set the power switch to on ( l ), then
as soon as Booting System appears on the display, press and hold in the
[ Preset ] key until Autorange in progress appears. This not only prevents the calibration
routine from occurring but also bypasses the auto start file if one exists.
10-5
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Internal Test Descriptions
Agilent 35670A
Calibration Routine Description
DC-Offset Tables and Frequency Correction Curves
The dc-offset calibration builds 5 dc-offset tables — one for each anti-alias filter and
one for each channel when the anti-alias filters are bypassed. The values in the
dc-offset tables are sent to the channel dc-offset DACs to compensate for dc offsets
introduced by analog input circuits. Forty values are entered in each table — a value
for each range setting from –51 dB to +27 dB, in 2 dB increments. For each range, the
table value is derived by changing the offset values of the dc offset DAC until the best
possible offset compensation is found. In all instrument modes, the analyzer corrects
for dc offsets by setting each channel’s dc-offset DAC to the value from the table that
matches the current anti-alias filter and range setting.
The frequency calibration generates correction curves in the frequency domain to
compensate for unflatness in the analog input circuits. A precise signal is connected
from the source to the input channels via the calibration path (CALP). Correction
curves are then produced for each range setting by taking the difference between the
source output and the measured response. In FFT analysis, correlation analysis, and
swept sine instrument modes, the analyzer multiplies the measured result with the
value from the frequency correction curve that matches the current range and span
setting. In this way, errors introduced by circuits in the analyzer are removed before
the measurement is displayed.
10-6
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Agilent 35670A
Internal Test Descriptions
Calibration Routine Description
Calibration Error Messages
The dc-offset tables and frequency correction curves produced by the calibration
routine are compared with a set of maximum allowable error curves. The Quick
Confidence self test runs the calibration routine and places error messages in the Test
Log if any measurement exceeds the maximum allowable error. To run the Quick
Confidence self test press the following keys:
[ System Utility ]
[ SELF TEST ]
[ QUICK CONF TEST ]
The following lists the possible error messages:
Quick Confidence failure information:
Channel X 0 dB freq
Channel X 20 dB freq
Channel X 40 dB freq
Channel X step attenuator
Channel X –12 dB pad
Channel X +14 dB pad
Quick Confidence
FAIL
Where X = 1, 2, 3, or 4 and freq = 100k, 50k, or 25k
Viewing the Calibration Correction Curves
The calibration correction curves can be viewed for any input range or frequency span.
However, there is no frequency correction if the anti-alias filter is bypassed or if the
A-weight filter is on. When there is no frequency correction, the calibration curve is a
flat 0 dB line.
You can save the calibration trace to a data register only when in FFT analysis or
correlation analysis instrument mode. However, these data registers can be displayed
in any instrument mode.
The following key sequence shows how to view the calibration correction curves for
channel 1 and 2 at a 1 Vrms range setting, full span. Other curves can be displayed by
changing the input range and frequency span.
10-7
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Internal Test Descriptions
Agilent 35670A
Calibration Routine Description
[ Inst Mode ]
[ 2 CHANNEL ]
[ Input ]
[ CHANNEL 1 RANGE ]
1
[ dBVrms ]
[ CHANNEL 2 RANGE ]
1
[ dBVrms ]
[ Disp Format ]
[ UPPER/LOWER ]
[ System Utility ]
[ CALBRATIN ]
[ SAVE CH1 CAL TRACE ]
[ INTO D1 ]
[ SAVE CH2 CAL TRACE ]
[ INTO D2 ]
[ Meas Data ]
[ MORE ]
[ DATA REGISTER ]
[ D2 ]
[ Active Trace ]
[ D1 ]
[ Scale ]
[ Y PER DIV (DECADES) ]
1
[ ENTER ]
[ CENTER REFERENCE ]
0
[ ENTER ]
[ Active Trace ]
[ Y PER DIV (DECADES) ]
1
[ ENTER ]
[ CENTER REFERENCE ]
0
[ ENTER ]
Note
Display A shows the message D1 CAL CHAN 1 and display B shows the message
D2 CAL CHAN 2.
The calibration correction curves should be contained within 5 dB. The 5 dB limit
applies to all ranges at full span.
10-8
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Agilent 35670A
Internal Test Descriptions
Fault Log Messages
Fault Log Messages
0
1
Unknown Fault
I2C: Timeout
This error message occurs when the fault could not be determined.
This error message occurs if the A7 CPU assembly’s IIC controller takes too long to tell the
MPU that it is ready for a new command.
2
3
I2C: No Device
Acknowledge
This error message occurs if the A7 CPU assembly’s IIC controller does not sense the
acknowledge part of the formal handshake used to transmit data over the IIC bus.
Calibration failure This error message occurs if the calibration routine generates correction vectors that exceed the
maximum allowable error vectors or if the calibration routine is bypassed because of a
hardware failure.
4
5
ROM
Checksum error
This error message occurs if the power-on test detects a ROM checksum error.
BOOTROM
Checksum Error
DSP Failure
This error message occurs if the power-on test detects a BOOTROM checksum error.
This error message occurs if the power-on digital signal processor test fails.
6
7
8
Main RAM Error This error message occurs if the power-on RAM test fails.
Math
This error message occurs if the power-on math coprocessor test fails.
Coprocessor
Failure
LED Error
9
This error message occurs if the power-on LED test fails.
This error message occurs if the power-on display test fails.
This error message occurs if the power-on CPU test fails.
10 Display Failure
11 CPU Failure
12 Floppy Controller This error message occurs if the A7 CPU assembly’s disk drive controller did not respond
Timeout
within 10 ms of receiving a command.
13 Internal Disk
Trk0 Failure
This error message occurs if the A100 Disk Drive assembly did not locate track 0 (as indicated
by a low on T00n) when instructed by the A7 CPU assembly to move to track 0.
14 NVRAM or
Battery Backup
Failure
This error message occurs if the A7 CPU assembly’s IIC Controller determined that the A8
Memory assembly’s non-volatile RAM or RAM battery power failed.
10-9
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Internal Test Descriptions
Self-Test Descriptions
Agilent 35670A
Self-Test Descriptions
Thirty-seven self tests are available that can be run in groups or individually. The
following table lists the group of self tests that are run when you select
[ FUNCTIONL TESTS ], [ ALL ]. This group does not include any of the self tests that
require a formatted flexible disk. The table lists the assemblies used by each self test
and shows the assembly that would most likely cause the failure. To run these self
tests in the order shown, press the following keys:
[ System Utility ]
[ SELF TEST ]
[ FUNCTIONL TESTS ]
[ ALL ]
To run a single self test, press the softkey shown in the table instead of [ ALL ]. To
determine the key path for the self-test softkeys, see “Self-Test Menu Map and GPIB
Commands” starting on page 10-18.
Certain instrument malfunctions cause multiple self-test failures. Therefore, to
determine the most likely cause when more than one self test fails, look in the
‘’Functional Tests All Self-Test Group’’ table for assemblies common to all failing
self tests.
10-10
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Agilent 35670A
Internal Test Descriptions
Self-Test Descriptions
Functional Tests All Self-Test Group
Assembly
A12/
A22
Softkey
[ INTERRUPT ]
[ MULTI FCTN PERIPHERL ]†
[ FRONT PANEL ]†
[ GPIB FUNC TEST ]
[ DISK CONTROLLR ]
[ DISK FIFO ]
Self Test Name
A7
A8
A6
A1
A2
A5
A10 A11 A100
Interrupt
X
X
X
X
X
X
X
X
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Multi Fctn Peripheral
Front Panel
X
GPIB
Disk Controller
Disk FIFO
IIC Bus
X
X
X
X
X
X
X
X
X
X
X
X
X
0
X
X
X
X
X
[ IIC BUS ]
[ FAST BUS ]†
Fast Bus
Trigger Gate Array
LO Gate Array
Digital Filter Gate Array
FIFO
[ TRIGGER ]
0
[ LO ]
0
[ DIGITAL FILTER ]
[ FIFO ]
0
Baseband
0
X
X
X
X
X
X
[ BASEBAND ]
[ ZOOM ]
Zoom
0
Source through DSP
Source LO
0
[ DGTL SRCE THRU DSP ]
[ SOURCE LO ]
[ SOURCE TO CPU ]
[ WITHOUT LO ]
[ WITH LO ]
0
Source to CPU
Source without LO
Source with LO
ADC Gate Array
Input Offset
0
0
X
X
X
X
X
X
X
X
X
X
X
X
X
0
0
[ ADC GATE ARRAY ]
[ OFFSET ]
0
0
X
X
X
X
X
X
X
X
X
X
X
X
Input Distortion
Input Trigger
Input A-Wt Filter
Input AAF/Bypass
Input ICP Source
Tachometer
0
0
[ DISTORTN ]
0
0
[ INPUT TRIGGER ]
[ INPUT A-WEIGHT ]
[ AAF BYPASS ]
[ INPUT ICP ]
0
0
0
0
0
0
0
X
0
X
[ TACHOMETR ]$!
C5,5,0,255,255,255
Quick Confidence
0
0
0
X
X
X
[ QUICK CONF TEST ]
X
This assembly or sub-block is the most likely cause of the failure message.
0
This assembly or sub-block is used by the self test but is not the most likely cause of the
failure message. No symbol means that the assembly is not used by the self test.
† High-level power-on tests
The power supply and display are used in every test.
10-11
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Internal Test Descriptions
Self-Test Descriptions
Agilent 35670A
Self Tests that Perform a Measurement
The following self tests perform measurements:
Self Test
Front Panel Softkey
Baseband
Zoom
[ BASEBAND ]
[ ZOOM ]
Source thru DSP
ADC gate array
Source to CPU
Source with LO
Source Without LO
Input Offset
[ DGTL SRCE THRU DSP ]
[ ADC GATE ARRAY ]
[ SOURCE TO CPU ]
[ WITH LO ]
[ WITHOUT LO ]
[ OFFSET ]
[ DISTORTN ]
Input Distortion
Input Trigger
Input A-Wt Filter
Input AAF/Bypass
Input ICP Source
[ INPUT TRIGGER ]
[ INPUT A-WEIGHT ]
[ AAF BYPASS ]
[ INPUT ICP ]
The measurements that these self tests perform are averaged measurements, with only
one trace per average. Some hardware setup modes used in these self tests are not
used by normal measurements and can not be accessed from the front panel.
The measurements bypass any standard corrections and do not perform calibration
data corrections. Therefore, all self-test measurements using analog data have limits
larger than the standard calibration tolerances.
Once the hardware is set up, data is taken and time records are processed according to
the needs of the specific test. Some tests monitor overloads, others require spectrum
data, and others require time record data. After the data is collected, it is compared to
an internal reference specification to determine if the self test passed or failed. The
pass or fail information along with any additional information is placed in the Test
Log.
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Agilent 35670A
Internal Test Descriptions
Self-Test Descriptions
Individual Self-Test Descriptions
[ AAF BYPASS ]
This test verifies that the anti-alias filters and the bypass circuits on the A1 Input assembly or
A2 Input assemblies are operating correctly. In this test, the A5 Analog assembly’s source
outputs a signal that is connected to the input channels via the calibration path (CALP). For the
A1 Input assembly’s channel 1, power spectrum measurements are made with the signal routed
through the 100 kHz anti-alias filter, the 50 kHz anti-alias filter, and the bypass circuit. For the
A1 Input assembly’s channel 2, power spectrum measurements are made with the signal routed
through the 50 kHz anti-alias filter and the bypass circuit. For the A2 Input assembly’s channel
1 or 2, power spectrum measurements are made with the signal routed through the 50 kHz
anti-alias filter, the 25 kHz anti-alias filter, and the bypass circuit. For the A2 Input assembly’s
channel 3 or 4, power spectrum measurements are made with the signal routed through the
25 kHz anti-alias filter and the bypass circuit.
[ ADC GATE ARRAY ] This test verifies that the A5 Analog assembly’s ADC gate array is functioning correctly. This
test consists of 7 tests — positive overflow, negative overflow, positive limit, negative limit,
1st pass, 2nd pass, and zero. The positive and negative overflow tests set up the ADC test
mode to cause positive and negative overflows, then check the A6 Digital assembly’s digital
filter for interrupt flags. The positive and negative limit tests check the ADC’s positive and
negative limits. The 1st and 2nd pass tests connect the calibration signal from the A5 Analog
assembly to the A1 Input assembly or A2 Input assemblies. The 1st pass test sets the 2nd pass
result to zero and checks the signal into the ADC for the proper value and the A6 Digital
assembly’s gate array for interrupts or overloads. The 2nd pass test sets the 1st pass result to
zero and checks the signal into the ADC for the proper value and the A6 Digital assembly’s
gate array for interrupts or overloads. The zero test checks for minimal output while the gate
array outputs zero data.
[ BASEBAND ]
This test verifies that the A6 Digital assembly’s gate arrays are operating correctly. The trigger
gate array provides dc input data. The signal is then measured at 0 Hz for 63.58 Vpk 0.635V
and from 4 Hz to 1.6 kHz for 0 Vpk 0.06358V.
[ DGTL SRCE THRU This test verifies that the A6 Digital assembly’s gate arrays and digital source are operating
DSP ]
correctly. In this test, the digital source outputs a periodic chirp to the gate arrays. The
resultant spectrum is then checked from 384 Hz to 51.2 kHz.
[ DIGITAL FILTER ] This test verifies that the digital filter’s gate array on the A6 Digital assembly is operating
correctly. The A7 CPU assembly’s microprocessor configures the digital filter’s gate array
over the fast bus. The microprocessor then reads the control lines to check circuits internal to
the gate array and verify correct configuration. This test also writes to and reads from the gate
array’s RAM, checking for stuck bits. The Trigger Gate Array test [ TRIGGER ] and the LO
Gate Array test [ LO ] must pass for this test to pass. No data paths on the A6 Digital assembly
are checked.
[ DISK CONTROLLR ] This test verifies that the disk controller on the A7 CPU assembly is operating correctly. In this
test, the microprocessor sends a series of writes to and reads from the disk controller.
[ DISK FIFO ]
This test verifies that the disk controller’s FIFO on the A7 CPU assembly is operating
correctly. In this test, the CPU assembly’s microprocessor writes 2048 pseudo-random bytes to
the disk FIFO. The microprocessor then reads the disk FIFO.
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Internal Test Descriptions
Self-Test Descriptions
Agilent 35670A
[ DISTORTN ]
This test checks for noise and distortion in the input circuits of the A1 Input assembly or A2
Input assemblies. In this test, the A5 Analog assembly’s source outputs a signal that is
connected to the input channels via the calibration path (CALP). For each channel in the A1
Input assembly, the signal is measured at 16.640 kHz for 5 Vpk 0.5 Vpk and from 24.96 kHz
to 51.2 kHz for 0 Vpk 0.01V. For each channel in the A2 Input assemblies, the signal is
measured at 8.320 kHz for 5 Vpk 0.5 Vpk and from 12.48 kHz to 25.6 kHz for 0 Vpk 0.01V.
[ FAST BUS ]
[ FIFO ]
This test verifies that the fast bus is operating correctly. In this test, the microprocessor on the
A7 CPU assembly writes data to the trigger gate array and digital tach on the A6 Digital
assembly over the fast bus. The microprocessor then reads the data.
This test verifies that the FIFO gate array on the A6 Digital assembly is operating correctly. In
this test, the A7 CPU assembly’s microprocessor configures the FIFO gate array. The
microprocessor then reads the control lines to check circuits internal to the gate array and verify
correct configuration. The Trigger Gate Array [ TRIGGER ], Digital Filter Gate Array
[ FILTER ], and LO Gate Array [ LO ] tests must pass for this test to pass. No data paths on
the Digital assembly are checked.
[ FRONT PANEL ]
This test verifies that the IIC controller on the A11 Keyboard Controller assembly is operating
correctly. In this test, the microprocessor on the A7 CPU assembly reads the IIC controller on
the Keyboard Controller assembly and verifies that no front-panel keys are held down.
[ GPIB CONNECTOR ] This test was not implemented.
[ GPIB FUNC TEST ] This test verifies that the GPIB interface on the A10 Rear Panel assembly is operating
correctly. In this test, the A7 CPU assembly’s microprocessor sets the GPIB interface to a
listen only state, then tests for a listen only state.
[ IIC BUS ]
This test verifies that the A7 CPU assembly can write to and read from all assemblies with IIC
interfaces. This test also checks the A7 CPU assembly’s EEROM. The following assemblies
have IIC interfaces:
A1 Input
A2 Input
A5 Analog
A6 Digital
A8 Memory
A10 Rear Panel
A11 Keyboard Controller
[ INPUT A-WEIGHT ] This test verifies that the A-weight filters on the A1 Input assembly or A2 Input assemblies are
operating correctly. In this test, the A5 Analog assembly’s source outputs a chirp signal that is
connected to the input channels via the calibration path (CALP). For each channel, the power
spectrum is measured at three frequencies with and without the A-weight filter in the input
path.
[ INPUT ICP ]
This test verifies that the ICP sources on the A1 Input assembly or A2 Input assemblies are
operating correctly. In this test, the ICP sources are turned on, then measured for 25 10 Vdc.
During this test, the front panel input BNC connectors must not be connected to anything.
10-14
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Agilent 35670A
Internal Test Descriptions
Self-Test Descriptions
[ INPUT TRIGGER ]
[ INTERRUPT ]
This test checks the trigger-level circuits on the A5 Analog assembly for both positive and
negative slope triggering. In this test, the A5 Analog assembly’s source outputs a 512 Hz,
5 Vpk signal that is connected to the input channels via the calibration path (CALP).
This test verifies that the interrupt circuits on the A7 CPU assembly are operating correctly. In
this test, the microprocessor writes to the multi-function peripheral interrupt registers and reads
the registers for verification. This test does not actually set up an interrupt but does test the
multi-function peripheral in greater depth than the [ MULTI FCTN PERIPHERL ] test.
[ LO ]
This test verifies that the local oscillator gate array on the A6 Digital assembly is operating
correctly. In this test, the A7 CPU assembly’s microprocessor configures the local oscillator
gate array. The microprocessor then reads the control lines to check circuits internal to the gate
array and verify correct configuration. The microprocessor then checks the phase of its internal
oscillator. The Trigger Gate Array [ TRIGGER ] test must pass for this test to pass. No data
paths on the A6 Digital assembly are checked.
[ LONG CONF TEST ] This test performs most of the self tests. The tests are performed in the following order:
[ INTERRUPT ]
[ MULTI FCTN PERIPHERL ]
[ FRONT PANEL ]
[ GPIB FUNC TEST ]
[ DISK CONTROLLR ]
[ DISK FIFO ]
[ IIC BUS ]
[ FAST BUS ]
[ TRIGGER ]
[ LO ]
[ DIGITAL FILTER ]
[ FIFO ]
[ BASEBAND ]
[ ZOOM ]
[ DGTL SRCE THRU DSP ]
[ SOURCE LO ]
[ SOURCE TO CPU ]
[ WITHOUT LO ]
[ WITH LO ]
[ ADC GATE ARRAY ]
[ OFFSET ]
[ DISTORTN ]
[ INPUT TRIGGER ]
[ INPUT A-WEIGHT ]
[ AAF BYPASS ]
[ QUICK CONF TEST ]
[ MULTI FCTN
PERIPHERL ]
This test verifies that the multi-function peripheral on the A7 CPU assembly is operating
correctly. In this test, the microprocessor writes to the multi-function peripheral, then reads the
registers checking for errors. Further testing of the multi-function peripheral is done by the
[ INTERRUPT ] test.
10-15
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Internal Test Descriptions
Self-Test Descriptions
Agilent 35670A
[ OFFSET ]
This test verifies that the analyzer can correct for dc offsets generated by the input circuits on
the A1 Input assembly or A2 Input assemblies. In this test, the input circuits are connected to
ground. For the A1 Input assembly’s channel 1, time record measurements are taken with the
signal routed through the 100 kHz anti-alias filter and through the 50 kHz anti-alias filter with
the dc offset DAC set to 127, then to –127. For the A1 Input assembly’s channel 2, time record
measurements are taken with the signal routed through the 50 kHz anti-alias filter with the dc
offset DAC set to 127, then to –127. For the A2 Input assembly’s channel 1 or 2, time record
measurements are taken with the signal routed through the 50 kHz anti-alias filter and through
the 25 kHz anti-alias filter with the dc offset DAC set to 127, then to –127. For the A2 Input
assembly’s channel 3 or 4, time record measurements are taken with the signal routed through
the 25 kHz anti-alias filter with the dc offset DAC set to 127, then to –127.
[ QUICK CONF TEST ] This test calibrates the analyzer and checks the calibration limits. Any calibration errors are
entered in the Test Log. See “Calibration Routine Description” earlier in this chapter for a
description of the calibration routine.
[ RANDOM SEEK ]
This test verifies that the A100 Disk Drive assembly’s head can move to a random sector on the
flexible disk. In this test, the disk controller on the A7 CPU assembly instructs the disk-drive
head to move to a random record. This test requires a formatted flexible disk.
[ READ ]
This test verifies that the A100 Disk Drive assembly can read a flexible disk. In this test, the
A7 CPU assembly’s disk controller instructs the Disk Drive assembly to read the current record
on the flexible disk. While the current record is being read, the disk controller monitors the
RDDATAn signal to verify the read operation. The current record is set by the [ SEEK RECORD
] test. This test requires a formatted flexible disk.
[ READ/WRITE ]
This test verifies that the A100 Disk Drive assembly can read and write to a flexible disk. In
this test, the A7 CPU assembly’s disk controller instructs the Disk Drive assembly to read the
current record on the flexible disk. While the current record is being read, the disk controller
monitors the RDDATAn signal to verify the read operation. The disk controller then instructs
the Disk Drive assembly to write to the current record. While the current record is being
written to, the disk controller monitors the WDATAn signal to verify the write operation. The
current record is set by the [ SEEK SECTOR ] test. This test requires a formatted flexible disk that
is not write protected.
[ READ/WRITE ALL ] This test verifies that the A100 Disk Drive assembly can read and write to all records of a
flexible disk. In this test, the A7 CPU assembly’s disk controller instructs the Disk Drive
assembly to read every available record on the flexible disk (excluding privileged tracks).
While the flexible disk is being read, the disk controller monitors the RDDATAn signal to
verify the read operation. The disk controller then instructs the Disk Drive assembly to write to
every available record on the flexible disk (excluding privileged tracks). While the flexible
disk is being written to, the disk controller monitors the WDATAn signal to verify the write
operation. This test stops on the first error. The execution time for this test depends upon the
size of the disk. For example, if there are no errors, this test takes approximately one hour for a
double-sided, low-density disk. This test requires a formatted flexible disk that is not write
protected.
[ RESTORE ]
This test verifies that the A100 Disk Drive assembly’s head can move away from track 0, then
back to track 0. In this test, the A7 CPU assembly’s disk controller instructs the disk-drive
head to move away from track 0, then back to track 0. The disk controller monitors the T00n
signal to verify the move operation. This test requires a formatted flexible disk.
10-16
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Agilent 35670A
Internal Test Descriptions
Self-Test Descriptions
[ SERIAL PORT ]
[ SEEK RECORD ]
This test verifies that the RS-232 interface on the A7 CPU assembly is capable of sending and
receiving data. In this test, the user connects the transmit data line to the recieve data line.
Data is sent out on the transmit data line and read back on the receive data line.
This test verifies that the A100 Disk Drive assembly’s head can move to a user specified record
on the flexible disk. In this test, the disk controller on the A7 CPU assembly instructs the
disk-drive head to move to a user specified record. The user specified record number must be
in the range of valid record numbers. The default record number is 0. This test requires a
formatted flexible disk.
[ SOURCE LO ]
This test verifies that the local oscillator (LO) gate array on the A6 Digital assembly is
operating correctly. In this test, the A7 CPU assembly’s microprocessor configures the LO
gate array and reads its control lines to check circuits internal to the gate array and verify
correct configuration. No data paths on the Digital assembly are checked.
[ SOURCE TO CPU ] This test verifies that the core of the digital source on the A6 Digital assembly is operating
correctly. In this test, the A7 CPU assembly’s microprocessor configures the digital source to
output a 12.8 kHz chirp. The microprocessor then reads the final chirp value in the
digital-source RAM. This test does not use the time record to verify the chirp.
[ TACHOMETR ]
This test verifies that the tachometer circuits on the A10 Rear Panel assembly and A6 Digital
assembly are operating correctly. In this test, a BNC cable must be connected from the source
connector to the tachometer connector. The tachometer pulses are counted for 200
milliseconds with the source turned off. The count should be zero. Next the source is set to
100 Hz, 3.53 Vrms and the tachometer pulses are counted for another 200 milliseconds. This
time the count should be 20 1.
[ TRIGGER ]
[ WITH LO ]
[ WITHOUT LO ]
[ ZOOM ]
This test verifies that the trigger gate array on the A6 Digital assembly is operating correctly.
In this test, the A7 CPU assembly’s microprocessor configures the trigger gate array. The
microprocessor then reads the control lines to check circuits internal to the gate array and verify
correct configuration. This test also verifies functions internal to the gate array such as internal
trigger level, trigger interrupts, overload interrupts, and post trigger delay.
This test verifies the capability of the A5 Analog assembly’s analog source to output a flat
zoomed periodic chirp signal. In this test, the A6 Digital assembly’s local oscillator is used
with the analog source to produce a zoomed periodic chirp signal. The signal is connected to
the input channels via the calibration path (CALP). The flatness of the signal is measured from
13.6 kHz to 26.4 kHz.
This test verifies the capability of the A5 Analog assembly’s analog source to output a flat
baseband chirp signal. In this test, the Analog assembly’s analog source outputs a baseband
chirp signal (starting at 0 Hz) that is connected to the A1 Input assembly or A2 Input
assemblies via the calibration path (CALP). The flatness of the signal is measured from
384 Hz to 51.2 kHz.
This test checks most of the DSP chain, including the LO gate array. In this test, the Digital
assembly’s trigger gate array outputs a dc value to the DSP chain.
10-17
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Internal Test Descriptions
Self-Test Descriptions
Agilent 35670A
Self-Test Menu Map and GPIB Commands
The analyzer’s self tests can be run from the front panel or by a controller via GPIB.
To run a test from the front panel, press [ System Utility ] followed by the appropriate
softkey in the table. To run a test via GPIB, send the equivalent GPIB command (to
abort a test, send TEST:ABOR).
To view the analyzer’s fault log via GPIB, send DISP:CONT FTAB. To clear the
fault log send SYST:FLOG:CLE. To return to the top line of the test log and delete
the line from the test log, send TEST:LOG:DATA:LINE?
The following table shows the softkeys and GPIB commands for each self test.
Self Test
GPIB Command
–
[ SELF TEST ]
*TST?
[ QUICK CONF TEST ]
[ LONG CONF TEST ]
[ FUNCTIONL TESTS ]
[ DISPLAY PATTERN ]
[ I/O ]
TEST:LONG
–
TEST:DISP:PATT ON|OFF
–
TEST:IO:FPAN; *WAI
–
[ FRONT PANEL ]
[ GPIB ]
TEST:IO:GPIB; *WAI
–
[ GPIB FUNC TEST ]
[ GPIB CONNECTOR ]
[ INTERNAL DISK ]
[ DISK CONTROLLR ]
[ DISK FIFO ]
–
TEST:IO:DISK:CONT; *WAI
TEST:IO:DISK:FIFO; *WAI
TEST:IO:DISK:REST; *WAI
TEST:IO:DISK:RAND; *WAI
TEST:IO:DISK:SEEK n; *WAI
TEST:IO:DISK:READ; *WAI
TEST:IO:DISK:WRIT; *WAI
TEST:IO:DISK:RWR; *WAI
TEST:IO:DISK:ALL; *WAI
TEST:IO:IIC; *WAI
TEST:IO:FBUS; *WAI
TEST:IO:SER; *WAI
TEST:IO:ALL; *WAI
[ RESTORE ]
[ RANDOM SEEK ]
[ SEEK RECORD ]
[ READ ]
†
[ READ/WRITE ]
[ READ/WRITE ALL ]
[ ALL ]
[ IIC BUS ]
[ FAST BUS ]
[ SERIAL PORT ]
[ ALL ]
† where n = 0 to [(tracks per side x sides x sectors per track) –1]
10-18
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Agilent 35670A
Internal Test Descriptions
Self-Test Descriptions
Self Test
GPIB Command
–
[ SELF TEST ]
[ FUNCTIONL TESTS ]
[ DIGITAL PROCESSOR ]
[ TRIGGER ]
–
–
TEST:DSP:TRIG; *WAI
TEST:DSP:LO; *WAI
TEST:DSP:FILT; *WAI
TEST:DSP:FIFO; *WAI
TEST:DSP:BAS; *WAI
TEST:DSP:ZOOM; *WAI
TEST:DSP:SOUR; *WAI
TEST:DSP:ALL; *WAI
–
[ LO ]
[ DIGITAL FILTER ]
[ FIFO ]
[ BASEBAND ]
[ ZOOM ]
[ DGTL SRCE THRU DSP ]
[ ALL ]
[ SOURCE ]
TEST:SOUR:LO; *WAI
TEST:SOUR:CPU; *WAI
TEST:SOUR:BAS; *WAI
TEST:SOUR:ZOOM; *WAI
TEST:SOUR:ALL; *WAI
–
[ SOURCE LO ]
[ SOURCE TO CPU ]
[ WITHOUT LO ]
[ WITH LO ]
[ ALL ]
[ INPUTS ]
TEST:INP:OFFS; *WAI
TEST:INP:DIST; *WAI
TEST:INP:TRIG; *WAI
TEST:INP:AWE; *WAI
TEST:INP:AAF; *WAI
TEST:INP:ICP; *WAI
TEST:INP:ALL; *WAI
TEST:TACH; *WAI
TEST:ADC:GARR; *WAI
–
[ OFFSET ]
[ DISTORTN ]
[ INPUT TRIGGER ]
[ INPUT A-WEIGHT ]
[ AAF BYPASS ]
[ INPUT ICP ]
[ ALL ]
[ TACHOMETR ]
[ ADC GATE ARRAY ]
[ OTHER ]
TEST:PROC:INT; *WAI
TEST:PROC:MFP; *WAI
TEST:PROC:ALL; *WAI
TEST:ALL; *WAI
TEST:LOOP:MODE ON|OFF
DISP:CONT TTAB
TEST:LOG:CLE
[ INTERRUPT ]
[ MULT FCTN PERIPHERL ]
[ ALL ]
[ ALL ]
[ LOOP MODE ON/OFF ]
[ TEST LOG ]
[ CLEAR TEST LOG ]
[ NEXT PAGE ]
[ PREVIOUS PAGE ]
–
–
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11
Backdating
11-1
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Backdating
This chapter provides information necessary to modify this manual for
instruments that differ from those currently being produced. The information
in this chapter documents earlier instrument configurations and associated
servicing procedures.
With the information provided in this chapter, this manual can be corrected so
that it applies to any earlier version or configuration of the instrument.
11-2
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12
Quick Reference
12-1
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Quick Reference
This chapter shows assembly locations, cable connections, and all the block
diagrams for the Agilent 35670A Dynamic Signal Analyzer. All block
diagrams, except the overall block diagrams, show the connector numbers for
signals routed through RF cables. The block diagrams do not show connector
numbers for signals routed through the analyzer’s Motherboard assembly.
12-2
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Agilent 35670A
Quick Reference
Assembly Locations
12-3
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Quick Reference
Agilent 35670A
Assembly Connections for Two Channel Analyzer
12-4
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Agilent 35670A
Quick Reference
Assembly Connections for Four Channel Analyzer
12-5
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Quick Reference
Agilent 35670A
Two Channel Overall Block Diagram
12-6
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Agilent 35670A
Quick Reference
Four Channel Overall Block Diagram
12-7
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Quick Reference
Agilent 35670A
A1 Input Block Diagram: Channel 1
12-8
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Agilent 35670A
Quick Reference
A1 Input Block Diagram: Channel 1 (continued)
12-9
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Quick Reference
Agilent 35670A
A1 Input Block Diagram: Channel 2
12-10
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Agilent 35670A
Quick Reference
A1 Input Block Diagram: Channel 2 (continued)
12-11
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Quick Reference
Agilent 35670A
A2 Input Block Diagram: Channel 1 or Channel 3
12-12
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Agilent 35670A
Quick Reference
A2 Input Block Diagram: Channel 1 or Channel 3 (continued)
12-13
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Quick Reference
Agilent 35670A
A2 Input Block Diagram: Channel 2 or Channel 4
12-14
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Agilent 35670A
Quick Reference
A2 Input Block Diagram: Channel 2 or Channel 4 (continued)
12-15
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Quick Reference
Agilent 35670A
A5 Analog Block Diagram: ADC and Trigger
12-16
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Agilent 35670A
Quick Reference
A5 Analog Block Diagram: Analog Source and Calibrator
12-17
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Quick Reference
Agilent 35670A
A6 Digital Block Diagram
12-18
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Agilent 35670A
Quick Reference
A7 CPU Block Diagram
12-19
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Quick Reference
Agilent 35670A
A7 CPU Block Diagram: Interface
12-20
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Agilent 35670A
Quick Reference
Reset Logic
121
12-21
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Quick Reference
Agilent 35670A
A8 Memory Block Diagram
12-22
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Agilent 35670A
Quick Reference
A9 NVRAM Block Diagram
12-23
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Quick Reference
Agilent 35670A
A10 Rear Panel Block Diagram
12-24
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Agilent 35670A
Quick Reference
A11 Keyboard Controller Block Diagram
12-25
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Quick Reference
Agilent 35670A
A98 Power Supply Block Diagram
Option UK4 Microphone Adapter and Power Supply Block Diagram
12-26
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Index
A
B
A-weight filter test 3-20
ac power
baseband self test 10-13
battery 2-8
cables 2-4
consumption 2-2
select switch 2-5
accessories vi
ADC
part number 7-12
battery backed memory
states stored in 8-30
troubleshooting 4-67
binary to hexadecimal conversion 10-3
block diagrams 12-2
BNC assembly
adjustments 5-7
circuit description 8-18
gate array self-test 10-13
adjustments
circuit description 8-3, 8-36 - 8-37
part number 7-5
GPIB commands for 5-4
required after replacing assembly 6-4
warm up time 5-2
amplitude
signal descriptions 9-20, 9-24
bracket part numbers 7-8
bus
See fast bus
See IIC bus
accuracy test 3-17
linearity test 3-19
source accuracy test 3-45
analog assembly
C
cable part numbers 7-6
calibration routine
ADC adjustments 5-7
circuit description 8-18
dc offset adjustment 5-6
part number 7-5
procedures required after replacing 6-4
signal descriptions 9-7
source output 9-17
anti-alias filter
correction curves 10-7
description 10-5
error messages 10-7
signal 9-29
troubleshooting failing 4-31
centronics port 2-11, 9-16
channel match test 3-21
chassis part numbers 7-11
cleaning the screen 2-17
common mode rejection adjustment 5-13
adjustment 5-17
performance test 3-23
self-test description 10-13
assembly part numbers 7-5
assistance 11
auto-range troubleshooting test 4-59
automobile
conformity, declaration of
connecting
9
dc power 2-8
external keyboard 2-14
external monitor 2-13
microphone adapter 2-16
connectors
dc power 2-8
dc power cable 2-3
power transients 2-20
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front panel 8-3, 8-36 - 8-37
rear panel 8-33
cooling 2-7
cover
circuit description 8-22
self-test description 10-13
digital tachometer
See tachometer
DIN connector
part numbers 7-7
removing 6-6
CPU assembly
signal descriptions 9-17
troubleshooting 4-61
disassembly
before replacing 6-3
circuit description 8-3, 8-25
frequency adjustment 5-5
part number 7-5
See removing
disk drive assembly
circuit description 8-3, 8-39
controller 8-29
removing 6-11
signal descriptions 9-8, 9-34, 9-37
troubleshooting 4-18
cross talk test 3-30
CRT
part number 7-5
removing 6-10
self test 10-13
signal descriptions 9-34
troubleshooting 4-57
disk drive cover 2-7
part number 7-8
See display assembly
D
display assembly
circuit description 8-3, 8-39
controller 8-29
data sheet 1-2
dc offset adjustment
analog assembly 5-6
input assembly 5-10
dc offset test 3-14
dc power
part number 7-5
procedure required after replacing 6-5
signal descriptions 9-36
troubleshooting 4-5, 4-22
distortion
cables 2-3
connecting 2-8
self-test description 10-14
troubleshooting 4-56
consumption 2-2
intermittent operation 2-20
select switch 2-8
dc-dc converter assembly
adjustment 5-21
circuit description 8-39
part number 7-5
procedure required after replacing 6-5
removing 6-18
E
equipment required 1-17
error messages
calibration routine 10-7
fault log 10-9
exchange assembly part numbers 7-5
external keyboard 2-14
signal descriptions 9-17
troubleshooting connector 4-61
external monitor 2-13
signal descriptions 9-31
external trigger
signal descriptions 9-36 - 9-37
declaration of conformity
diagnostics
9
See power-on test
See self tests
digital assembly
circuit description 8-22
part number 7-5
signal description 9-17
test 3-35
procedures required after replacing 6-4
signal descriptions 9-25
digital filter
circuit description 8-22
self-test description 10-13
digital source
F
fan assembly
circuit description 8-38
2
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part number 7-5
fast bus
controller 8-28
self-test description 10-14
signals 8-29, 9-8
interface 8-28
self-test description 10-14
troubleshooting 4-29
fault log messages 10-9
FIFO gate array self test 10-14
flatness
troubleshooting 4-25
incoming inspection 2-5
individual self-test descriptions 10-13
initial verification troubleshooting 4-5
input
adjustment 5-17
coupling test 3-24
test 3-18
resistance test 3-39
frequency accuracy test 3-22
frequency reference
adjustment 5-5
circuit description 8-24
clock 8-25
self-test description 10-14 - 10-15
input assembly
circuit description 8-6, 8-12
common mode adjustment 5-13
dc offset adjustment 5-10
flatness adjustment 5-17
part number 7-5
front panel ii
part numbers 7-9
removing 6-8
procedures required after replacing 6-4
signal descriptions 9-7
troubleshooting 4-51
troubleshooting four channels 4-54
installation 2-7
self-test description 10-14
front panel connectors 8-36 - 8-37
See also BNC assembly
functional tests
See self tests
fuse 2-10
instrument BASIC 8-2
interface
part numbers 7-12
GPIB 2-12
parallel 2-11
serial 2-11
G
connector 2-12
intermittent failures 4-31, 4-40
intermodulation distortion test 3-28
interrupt self test 10-15
GPIB
interface 8-33
self-test description 10-14
signal descriptions 9-14
troubleshooting 4-31
GPIB commands
K
keyboard 2-14
See primary keypad
See secondary keypad
keyboard controller assembly
circuit description 8-35
part number 7-5
for adjustments 5-4
for self tests 10-18
grounding requirements 2-3
signal description 9-18
H
harmonic distortion test 3-25
L
LO gate array self test 10-15
local oscillator
I
circuit description 8-22
See digital assembly
long confidence self test 10-15
IBASIC 8-2
ICP source 8-6, 8-12
ICP supply test 3-41
IIC bus
3
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cables 7-6
chassis 7-11
covers 7-7
front panel 7-9
M
measurement uncertainty 3-4, 3-56
memory assembly
circuit description 8-3, 8-30
part number 7-5
removing 6-13
signal descriptions 9-8, 9-12
troubleshooting 4-18
troubleshooting battery 4-67
microphone adapter, connecting 2-16
microphone assembly
circuit description 8-40
part numbers 7-14
fuse 7-12
microphone adapter 7-14
miscellaneous 7-12
rear panel 7-10
screws and washers 7-12
performance test
confidence level 3-4
cycle 3-3
required after replacing an
assembly 6-4
troubleshooting 4-69
monitor, connecting external 2-13
motherboard
test list 3-4
troubleshooting failing 4-31, 4-42
versus specification 3-6
performance test software
loading program 3-7
manual mode 3-12
program controlled equipment 3-4
semiautomated mode 3-8
softkey descriptions 3-51
without a printer 3-10, 3-12
phone assistance 11
plotter interface 2-11
port
circuit description 8-39
part number 7-5
removing 6-16
signal descriptions 9-25
N
noise test 3-15
NVRAM assembly
circuit description 8-32
options stored in 6-3
part number 7-5
removing 6-12
parallel 9-16
serial 9-15
power
signal descriptions 9-12
states stored in 8-30
ac cables 2-4
consumption 2-2
dc cables 2-3
select switch 2-5
power supply assembly
circuit description 8-4, 8-38
part number 7-5
O
offset self test 10-16
operating environment 2-7
operation verification
confidence level 3-4
test list 3-4
removing 6-14
troubleshooting 4-5, 4-11
voltage distribution 9-6
power-on test
options vi
stored in NVRAM 6-3
overload detectors 8-7, 8-13
descriptions 10-2
messages 10-4
troubleshooting using 4-15
primary keypad assembly
circuit description 8-37
part number 7-5
signal descriptions 9-21
printer interface 2-11
P
parallel port 2-11
signal descriptions 9-16
part numbers
assemblies 7-5
assembly covers and brackets 7-8
battery 7-12
4
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signal descriptions 9-23
seek record self test 10-17
self test 3-13
Q
quick confidence self test 10-16
assemblies used in 10-12
descriptions 10-10
R
GPIB commands 10-18
troubleshooting lockup 4-37
troubleshooting using 4-31
serial number, stored in NVRAM 6-3
serial port 2-11
random seek self test 10-16
read self test 10-16
read/write self test 10-16
rear panel iv
connectors 8-33
part numbers 7-10
removing 6-7
rear panel assembly
circuit description 8-4, 8-33
part number 7-5
procedures required after replacing 6-5
signal descriptions 9-14
receiver
circuit description 8-29
self-test description 10-17
signal descriptions 9-15
service assistance 11
shipping 2-18
single channel phase accuracy test 3-34
source
amplitude accuracy test 3-45
See also analog assembly
dc offset test 3-48
See also digital assembly
distortion test 3-50
See input assembly
recommended test equipment 1-17
remote commands
See GPIB commands
removing
flatness test 3-49
LO self test 10-17
cover 6-6
CPU 6-11
dc-dc converter 6-18
disk drive 6-10
front panel 6-8
memory 6-13
motherboard 6-16
NVRAM 6-12
output resistance test 3-46
to CPU self test 10-17
specifications 1-2
spurious signals test 3-16
states stored in memory 8-30
storage 2-17
power supply 6-14
rear panel 6-7
replaceable part numbers
T
tachometer
circuit description 8-24
function test 3-37
self-test description 10-17
signal description 9-17
troubleshooting 4-70
telephone assistance 11
test equipment 1-17
test log 4-32
See part numbers
reset logic 8-28
restore self test 10-16
RS-232
See serial port
transporting 2-18
trigger
S
circuit description 8-20, 8-22
self-test description 10-17
troubleshooting 4-62
troubleshooting failing 4-31
troubleshooting
safety 4-2
See inside front cover
screen, cleaning 2-17
screws, part numbers 7-12
secondary keypad assembly
circuit description 8-37
part number 7-5
guide 4-4
5
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hints 4-3
using self tests 4-31
V
voltages
power supply distribution 9-6
W
washers, part numbers 7-12
with LO self test 10-17
without LO self test 10-17
Z
zoom self test 10-17
6
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Guide to Agilent 35670A Documentation
If you are thinking about...
And you want to...
Then read...
Install the Agilent 35670A Dynamic
Signal Analyzer
Agilent 35670A Installation and
Verification Guide
♦ Unpacking and installing
the Agilent 35670A
Do operation verification or
performance verification tests
Agilent 35670A Installation and
Verification Guide
Make your first measurements with
your new analyzer
Agilent 35670A Quick Start Guide
Agilent 35670A Operator’s Guide
♦ Getting started
Review measurement basics
Learn what each key does
Use the analyzer’s [
] key
Help
Learn how to make typical
measurements with the Agilent
35670A
Agilent 35670A Operator’s Guide
♦ Making measurements
Understand each of the analyzer’s
instrument modes
Agilent 35670A Operator’s Guide
Learn the Instrument Basic interface
Using Instrument Basic with the
Agilent 35670A
♦ Creating automated
measurements
Record keystrokes for a particular
measurement
Agilent 35670A Quick Start Guide
(Instrument Basic is Option 1C2)
Program with Instrument Basic
Learn about the GPIB
Instrument Basic User’s Handbook
GPIB Programmer’s Guide
♦ Remote operation
Learn how to program with GPIB
Find specific GPIB commands
GPIB Programming with
the Agilent 35670A
Agilent 35670A GPIB Commands:
Quick Reference
Display or plot analyzer data on or
from a Personal Computer
Standard Data Format Utilities:
User’s Guide
♦ Using analyzer data with a PC
application
Transfer analyzer data to a PC
sofware application forma
Transfer data from a PC software
application format tothe analyzer (for
example, to load data into a data
register)
Adjust, troubleshoot, or repair the
analyzer
Agilent 35670A Service Guide
♦ Servicing the analyzer
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Need Assistance?
If you need assistance, contact your nearest Agilent Technologies Sales and
Service Office listed in the Agilent Catalog. You can also find a list of local
service representatives on the Web at:
http://www.agilent.com/find/assist or contact your nearest regional office
listed below.
If you are contacting Agilent Technologies about a problem with your Agilent
35670 Dynamic Signal Analyzer, please provide the following information:
qModel number: Agilent 35670A
qSerial number:
qOptions:
qDate the problem was first encountered:
qCircumstances in which the problem was encountered:
qCan you reproduce the problem?
qWhat effect does this problem have on you?
You may find the serial number and options from the front panel of your
analyzer by executing the following:
Press [
Press [
], [ ], [
].
serial number
System Utility
System Utility
more
], [
].
options setup
If you do not have access to the Internet, one of these centers can direct you to
your nearest representative:
United States
Test and Measurement Call Center
(800) 452-4844 (Toll free in US)
Canada
Europe
Japan
(905) 206-4725
(31 20) 547 9900
Measurement Assistance Center
(81) 426 56 7832
(81) 426 56 7840 (FAX)
Latin America
(305) 267 4245
(305) 267 4288 (FAX)
Australia/New Zealand
Asia-Pacific
1 800 629 485 (Australia)
0800 738 378 (New Zealand)
(852) 2599 7777
(FAX) (852) 2506 9285
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About this edition
October 2000: Rebranded for Agilent Technologies
February 1995: In Replaceable Parts, page 7-5, three corrections were made to the
replaceable parts list.
July 1994: Previous edition.
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