Tektronix Thermometer P6249 User Manual

Instruction Manual  
P6249  
4 GHz 5X Active Probe  
071-0538-03  
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WARRANTY  
Tektronix warrants that the products that it manufactures and sells will be free from defects  
in materials and workmanship for a period of one (1) year from the date of shipment. If a  
product proves defective during this warranty period, Tektronix, at its option, either will  
repair the defective product without charge for parts and labor, or will provide a  
replacement in exchange for the defective product.  
In order to obtain service under this warranty, Customer must notify Tektronix of the  
defect before the expiration of the warranty period and make suitable arrangements for the  
performance of service. Customer shall be responsible for packaging and shipping the  
defective product to the service center designated by Tektronix, with shipping charges  
prepaid. Tektronix shall pay for the return of the product to Customer if the shipment is to  
a location within the country in which the Tektronix service center is located. Customer  
shall be responsible for paying all shipping charges, duties, taxes, and any other charges for  
products returned to any other locations.  
This warranty shall not apply to any defect, failure or damage caused by improper use or  
improper or inadequate maintenance and care. Tektronix shall not be obligated to furnish  
service under this warranty a) to repair damage resulting from attempts by personnel other  
than Tektronix representatives to install, repair or service the product; b) to repair damage  
resulting from improper use or connection to incompatible equipment; c) to repair any  
damage or malfunction caused by the use of non-Tektronix supplies; or d) to service a  
product that has been modified or integrated with other products when the effect of such  
modification or integration increases the time or difficulty of servicing the product.  
THIS WARRANTY IS GIVEN BY TEKTRONIX IN LIEU OF ANY OTHER  
WARRANTIES, EXPRESS OR IMPLIED. TEKTRONIX AND ITS VENDORS  
DISCLAIM ANY IMPLIED WARRANTIES OF MERCHANTABILITY OR  
FITNESS FOR A PARTICULAR PURPOSE. TEKTRONIX’ RESPONSIBILITY  
TO REPAIR OR REPLACE DEFECTIVE PRODUCTS IS THE SOLE AND  
EXCLUSIVE REMEDY PROVIDED TO THE CUSTOMER FOR BREACH OF  
THIS WARRANTY. TEKTRONIX AND ITS VENDORS WILL NOT BE LIABLE  
FOR ANY INDIRECT, SPECIAL, INCIDENTAL, OR CONSEQUENTIAL  
DAMAGES IRRESPECTIVE OF WHETHER TEKTRONIX OR THE VENDOR  
HAS ADVANCE NOTICE OF THE POSSIBILITY OF SUCH DAMAGES.  
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Table of Contents  
General Safety Summary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Service Safety Summary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
v
vii  
Product Description  
Options . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Standard Accessories . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Optional Accessories . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Contacting Tektronix . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
1
1
2
3
Features and Accessories  
Configuration  
Probe Offset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
11  
Functional Check  
Deskew Fixture . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Probe Calibration Errors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Check Compatibility . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Check for Hardware Problems . . . . . . . . . . . . . . . . . . . . . . . . . .  
15  
16  
16  
17  
Operating Basics  
Handling the Probe . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Maximum Non-destructive Input Voltage . . . . . . . . . . . . . . . . .  
Input Linear Dynamic Range . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Ground Lead Length . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
19  
19  
19  
20  
Helpful Hints  
Low-Inductance Grounding . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
SureFoot Grounding . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Probe Tip Test Points . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
23  
24  
25  
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Table of Contents  
Specifications  
Theory of Operation  
Probe Head and Cable Assembly . . . . . . . . . . . . . . . . . . . . . . .  
36  
36  
36  
36  
37  
37  
Compensation Box . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Offset Amplifier . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Probe Identification EEPROM . . . . . . . . . . . . . . . . . . . . . . . . .  
TEKPROBE Interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
VCC, +7 V Regulator . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Performance Verification  
Equipment Required . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Equipment Setup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Output Zero . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
DC Attenuation Accuracy . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Rise Time . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
39  
40  
41  
42  
44  
Adjustments  
Adjustment Locations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Offset Zero . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Offset Range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
49  
50  
51  
Maintenance  
Replacing TEKPROBE Interface Pins . . . . . . . . . . . . . . . . . . .  
Removing and Replacing the Compensation Box Covers . . . . .  
Removing and Replacing the TEKPROBE Interface Collar . . .  
Inspection and Cleaning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Replacement Parts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Preparation for Shipment . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
53  
54  
56  
57  
57  
57  
Troubleshooting  
Replaceable Parts  
Parts Ordering Information . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Using the Replaceable Parts List . . . . . . . . . . . . . . . . . . . . . . . .  
63  
64  
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Table of Contents  
List of Figures  
Figure 1: Dynamic and offset limitations . . . . . . . . . . . . . . . . .  
Figure 2: Probe functional check connections . . . . . . . . . . . . . .  
12  
13  
Figure 3: Deskew fixture connections  
(two P6249 probes shown) . . . . . . . . . . . . . . . . . . . . . . . . . .  
Figure 4: Maximum frequency vs. measurement lead length . .  
Figure 5: Low-inductance grounding . . . . . . . . . . . . . . . . . . . .  
Figure 6: Using a SureFoot adapter for grounding . . . . . . . . . .  
Figure 7: Using a probe tip as a test point . . . . . . . . . . . . . . . . .  
Figure 8: Typical input impedance and phase versus frequency  
Figure 9: Typical bandwidth . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Figure 10: P6249 simplified schematic diagram . . . . . . . . . . . .  
Figure 11: TEKPROBE interface . . . . . . . . . . . . . . . . . . . . . . .  
Figure 12: Setup for output zero and DC attenuation accuracy  
Figure 13: Test system rise time setup . . . . . . . . . . . . . . . . . . . .  
Figure 14: Test system and probe rise time setup . . . . . . . . . . .  
Figure 15: P6249 adjustment locations . . . . . . . . . . . . . . . . . . .  
Figure 16: 1103 power supply offset voltage location . . . . . . . .  
Figure 17: P6249 offset range setup . . . . . . . . . . . . . . . . . . . . .  
Figure 18: Replacing TEKPROBE interface pins . . . . . . . . . . .  
Figure 19: Removing the compensation box covers . . . . . . . . .  
Figure 20: Replacing the compensation box cover . . . . . . . . . .  
Figure 21: Replacing the TEKPROBE interface collar . . . . . . .  
Figure 22: Compensation box test point locations . . . . . . . . . .  
Figure 23: P6249 replaceable parts . . . . . . . . . . . . . . . . . . . . . .  
Figure 24: P6249 standard accessories . . . . . . . . . . . . . . . . . . .  
Figure 25: P6249 optional accessories . . . . . . . . . . . . . . . . . . .  
15  
21  
23  
24  
25  
28  
29  
35  
37  
41  
44  
45  
49  
51  
52  
53  
54  
55  
56  
60  
65  
66  
68  
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Table of Contents  
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General Safety Summary  
Review the following safety precautions to avoid injury and prevent  
damage to this product or any products connected to it. To avoid  
potential hazards, use this product only as specified.  
Only qualified personnel should perform service procedures.  
To Avoid Fire or Personal Injury  
Connect and Disconnect Properly. Connect the probe output to the  
measurement instrument before connecting the probe to the circuit  
under test. Disconnect the probe input and the probe ground from the  
circuit under test before disconnecting the probe from the measure-  
ment instrument.  
Observe All Terminal Ratings. To avoid fire or shock hazard, observe  
all ratings and markings on the product. Consult the product manual  
for further ratings information before making connections to the  
product.  
Connect the ground lead of the probe to earth ground only.  
Do Not Operate Without Covers. Do not operate this product with  
covers or panels removed.  
Do Not Operate With Suspected Failures. If you suspect there is  
damage to this product, have it inspected by qualified service  
personnel.  
Do Not Operate in Wet/Damp Conditions.  
Do Not Operate in an Explosive Atmosphere.  
Keep Product Surfaces Clean and Dry.  
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General Safety Summary  
Safety Terms and Symbols  
Terms in This Manual. These terms may appear in this manual:  
WARNING. Warning statements identify conditions or practices that  
could result in injury or loss of life.  
CAUTION. Caution statements identify conditions or practices that  
could result in damage to this product or other property.  
Terms on the Product. These terms may appear on the product:  
DANGER indicates an injury hazard immediately accessible as you  
read the marking.  
WARNING indicates an injury hazard not immediately accessible as  
you read the marking.  
CAUTION indicates a hazard to property including the product.  
Symbols on the Product. These symbols may appear on the product:  
CAUTION  
Refer to Manual  
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Service Safety Summary  
Only qualified personnel should perform service procedures. Read  
this Service Safety Summary and the General Safety Summary before  
performing any service procedures.  
Do Not Service Alone. Do not perform internal service or adjustments  
of this product unless another person capable of rendering first aid  
and resuscitation is present.  
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Service Safety Summary  
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Product Description  
The Tektronix P6249 is a 4 GHz (probe only), 5X active FET probe  
with 1 pF input capacitance. The P6249 has a low input capacitance  
and high input resistance which minimize circuit loading over a wide  
bandwidth range. The small profile and low-mass head of the P6249  
make probing crowded circuits by hand fast and easy. The accessory  
tips and adapters included with the probe enable the P6249 to be  
used on a wide variety of circuit architectures.  
The P6249 is powered through a TEKPROBE interface between the  
probe compensation box and the oscilloscope. The P6249 can be  
used with non-TEKPROBE oscilloscopes and instruments by using  
the optional Tektronix 1103 Probe Power Supply.  
Options  
The following options are available when ordering the P6249 probe:  
H Option D1 – Calibration Data  
H Option C3 – 3 years Calibration Service  
H Option D3 – 3 years Calibration Data  
H Option R3 – 3 years Extended Warranty  
Standard Accessories  
The P6249 is shipped with the following standard accessories:  
H Standard probe tips  
H SureFoot adapter probe tips  
H SureToe adapter probe tips  
H SMT KlipChip microcircuit test leads  
H Y-lead adapter  
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Product Description  
H Right-angle adapter  
H Three-inch ground lead  
H Low-inductance ground pogo pin  
H Color marker bands  
H SMK4 Micro KlipChip adapters  
H .100square pin adapter  
H Instruction manual  
Optional Accessories  
The following accessories are available for the P6249 probe:  
H Deskew fixture  
H Probe tip-to-SMA adapter  
H 1103 Probe Power Supply  
H Compensation box release tool  
H Insulated adjustment tool  
Refer to Features and Accessories on page 5 for more information on  
using the probe and accessories.  
For part number information for standard and optional accessories,  
refer to Replaceable Parts on page 63.  
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Product Description  
Contacting Tektronix  
Phone  
1-800-833-9200*  
Address  
Tektronix, Inc.  
Department or name (if known)  
14200 SW Karl Braun Drive  
P.O. Box 500  
Beaverton, OR 97077  
USA  
Web site  
Sales  
1-800-833-9200, select option 1*  
support  
Service  
support  
1-800-833-9200, select option 2*  
Technical  
support  
1-800-833-9200, select option 3*  
6:00 a.m. 5:00 p.m. Pacific time  
*
This phone number is toll free in North America. After office  
hours, please leave a voice mail message.  
Outside North America, contact a Tektronix sales office or  
distributor; see the Tektronix web site for a list of offices.  
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Product Description  
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Features and Accessories  
The P6249 is provided with several features and accessories designed  
to make probing and measurement a simpler task. Please familiarize  
yourself with these items and their uses.  
Probe head assembly. The probe head is  
designed for ease of use and high performance.  
Its small size makes it easy to handle in tight  
areas.  
Probe tip  
socket  
The probe tip socket is sized to easily press onto  
0.025 inch pins for direct access. The ground  
socket provides a short ground path for high  
fidelity ground connections.  
Ground  
socket  
Stabilization  
notch  
The stabilization notch permits you to use  
adjacent pins to reduce stresses on the probe  
and pins.  
TEKPROBE Interface. The TEKPROBE  
interface provides a communication path between  
the probe and the oscilloscope. Contact pins  
provide power, signal, offset, and probe  
characteristic data transfer. See page 37 for more  
information.  
If your oscilloscope does not support the  
TEKPROBE interface, you can use the optional  
1103 probe power supply as an effective  
interface. Contact your local Tektronix representa-  
tive for more information.  
Push-in probe tip. Use the push-in probe tip  
for general purpose probing by hand. The tip may  
also be used as a temporary test point. See  
page 25 for more information.  
Push-in probe tip  
The push-in probe tip may also be used with the  
other socketed leads and adapters.  
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Features and Accessories  
Installing the push-in probe tip. Attach the  
push-in probe tip by seating the tip into the probe  
tip socket and pushing the tip in until it is seated.  
Either end of the tip may be used.  
Do not force the tip. Also, be careful not to poke  
yourself with the sharp probe-tip. To remove the  
tip, gently grab the tip with small pliers and pull  
the tip out.  
SureFoot probe tip. The SureFoot tip is an  
integral probe tip and miniature guide that  
enables fault-free probing of fine-pitch SMD  
packages. Attach SureFoot adapters the same  
way as the push-in probe tips. They can be used  
with any of the socketed accessory leads.  
The orange, 0.050 inch SureFoot tip is compatible  
with 50 mil JEDEC packages such as SOIC,  
PLCC, CLCC, etc.  
The blue, 0.025 inch SureFoot tip is compatible  
with 0.65 mm JEDEC and EIAJ packages.  
The red, 0.5 mm SureFoot tip is compatible with  
EIAJ packages.  
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Features and Accessories  
SureToe probe tip. The SureToe tip is a pointed  
probe tip useful for probing in dense circuitry.  
Attach the SureToe adapters the same way as  
the push-in probe tips. Do not force the tip. Also,  
be careful not to poke yourself with the sharp  
probe tip. They can be used with any of the  
socketed accessory leads.  
Right-angle adapter. Use the right-angle  
adapter for low-profile probing of 0.025 inch  
diameter square pins.  
The right-angle adapter allows the probe to lie flat  
against a circuit board. This enables probing in  
vertical circuits such as computer or communica-  
tions backplanes, or in tight areas such as  
between circuit cards.  
The right-angle adapter can be used directly with  
the probe head, or attached to the Y-lead adapter  
or ground leads.  
Right  
angle  
The right-angle adapter is attached the same way  
as the push-in probe tip, and can be easily  
removed by hand.  
adapter  
Y-lead adapter. Use the Y-lead adapter to  
extend the physical reach of the probe and  
ground when necessary. The Y-lead adapter  
accepts any of the probe tips or adapters, and  
can be pushed directly onto 0.025 inch pins.  
Y-lead  
adapter  
When selecting the grounding connection,  
maintain as short a ground path as possible.  
Refer to page 20 for more information.  
To attach the Y-lead adapter, gently press the  
lead pins into the probe head tip and ground  
receptacles. Using the black lead for ground is  
recommended.  
Y-lead  
adapter  
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Features and Accessories  
Three-inch ground lead. Use the three-inch  
ground lead for general probing. The socketed  
end of the lead may be connected to any of the  
probe tips and adapters or fitted onto 0.025 inch  
pins.  
To attach the ground lead, press and rotate the  
lead pin connector into the ground socket on the  
probe head. The lead may be removed by simply  
pulling the pin out by hand.  
When selecting the grounding connection,  
maintain as short a ground path as possible.  
Refer to page 20 for more information.  
Low-inductance ground pogo pin. Use the  
low-inductance ground pogo pin to substantially  
reduce ground lead inductance. Because the  
pogo pin simply touches the ground reference,  
you can easily move the probe to different points  
on the circuit under test.  
Pogo pin  
To attach, press the pogo pin into the probe head  
ground socket.  
When selecting the grounding connection,  
maintain as short a ground path as possible.  
Refer to page 20 for more information.  
Signal-Ground Adapter. The signal-ground  
adapter is ideal for use with signal/ground pairs  
on 0.100 inch header pins (such as FlexLead  
adapters).  
Attach the signal-ground adapter by gently  
pressing it into the ground socket on the probe  
head.  
FlexLead  
adapter  
Be sure to use the stabilization notch whenever  
possible, to avoid slipping and damaging the  
probe or circuitry under test.  
Signal ground  
adapter  
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Features and Accessories  
SMT KlipChip. Use the SMT KlipChip test clips  
to access fragile, dense circuitry.  
KlipChip  
KlipChip test clips can be connected to the Y-lead  
or three-inch ground leads. Simply press the lead  
socket into the KlipChip handle.  
Y-lead adapter  
The KlipChip body freely turns, allowing better  
probe orientation. To reduce stress and provide a  
lower profile on components being tested, the  
flexible sleeve of the KlipChip bends up to a  
35 degree angle.  
SMK4 Micro KlipChip adapters. Use the  
adapters to probe the leads on integrated circuits  
that are surface-mounted.  
Color marker  
bands  
Color marker bands. Attach matching pairs of  
the color marker bands onto the cable at the head  
and compensation box of each probe. The marker  
bands enable quick verification of which probe is  
connected to which instrument channel.  
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Features and Accessories  
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Configuration  
The P6249 provides the oscilloscope with the probe model number,  
serial number, and attenuation factor. When connected to an  
oscilloscope with a TEKPROBE interface, display readouts are  
corrected for the probe attenuation factor, the instrument input is set  
to 50 W, and the coupling is set to DC.  
CAUTION. Do not attempt to install the P6249 on a non-TEKPROBE  
connector. Damage to the probe and connector may result. If your  
oscilloscope does not support the TEKPROBE interface, use the  
optional Tektronix 1103 Probe Power Supply.  
If the P6249 is used with the Tektronix 1103 Probe Power Supply, be  
sure to have a 50 W termination at the oscilloscope. Also, set the  
oscilloscope channel coupling to DC.  
The probe offset control is controlled by the oscilloscope. If the  
oscilloscope used does not support the TEKPROBE interface, use the  
offset controls on the optional Tektronix 1103 Probe Power Supply.  
Probe Offset  
The probe offset is adjustable to permit operation within the linear  
range of the probe. Using the offset to cancel DC signal components  
enables optimal probe performance. See Figure 1 on page 12 for  
more information.  
NOTE. See your oscilloscope manual for specific instructions on its  
operation and offset control.  
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Configuration  
To set the probe offset, follow these steps:  
1. Set the oscilloscope coupling to GND.  
2. Use the vertical position control to set a zero reference level on  
the oscilloscope display.  
3. Set the oscilloscope coupling to DC and 5 V/div.  
4. Attach the probe to the circuit.  
5. Adjust the probe offset to bring the trace to the oscilloscope zero  
reference.  
6. Change the volts/division setting to the desired range, adjusting  
the offset to keep the trace on the zero reference level.  
NOTE. The P6249 has a 5.0 V offset range. The linear operating  
range is 2.0 V. See Figure 1. Also, see page 19 for more informa-  
tion.  
If cursors are used on a TEKPROBE oscilloscope, the zero reference  
will be at the probe offset voltage.  
Nonoperating range (+30 V maximum nondestructive input voltage )  
+7.0 V  
+5.0 V  
Maximum offset range  
–5.0 V  
+5.0 V  
+2.0 V  
Maximum AC signal amplitude  
0 V  
–2.0 V  
–5.0 V  
–7.0 V  
Nonoperating range (–30 V maximum nondestructive input voltage )  
Figure 1: Dynamic and offset limitations  
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Functional Check  
After installing the probe on the oscilloscope, a functional check  
may be performed using the PROBE COMPENSATION connections  
on the front panel of the oscilloscope. Use the optional deskew  
fixture for optimum connections. See Figure 2.  
A
B
Deskew fixture  
Figure 2: Probe functional check connections  
1. Connect the probe to the oscilloscope.  
2. Set the oscilloscope to display the probe channel.  
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Functional Check  
3. If you have the optional deskew fixture, connect it to the PROBE  
COMPENSATION connections. Connect the probe to the deskew  
fixture (see Figure 3 on page 15), and proceed to step 6.  
4. Using a ground lead and a SMT KlipChip, connect the probe  
ground to the PROBE COMPENSATION ground connection on  
the oscilloscope.  
5. Using a standard tip, hold the probe to the SIGNAL terminal on  
the oscilloscope.  
6. Adjust the oscilloscope to display a stable calibration waveform.  
NOTE. If your instrument supports probe calibration routines, now is  
a good time to perform them. However, certain firmware versions of  
TDS series oscilloscopes will return a Probe Cal Failedmessage. If  
this occurs, refer to Probe Calibration Errors on page 16.  
7. Disconnect the probe from the deskew fixture or SIGNAL  
terminal and ground the probe tip. (Connect the KlipChip to the  
probe tip.)  
8. With the probe offset set to 0.0 V, the oscilloscope display should  
be at the ground reference.  
9. Set the oscilloscope volts/division to 1 V.  
10. Adjust the probe offset. The displayed waveform should vary  
between approximately +2.0 V and 2.0 V.  
NOTE. If no waveform is displayed, check the vertical coupling to be  
sure that it is set to DC.  
If the offset adjustment has no effect, set the vertical coupling to DC.  
If you are using the Tektronix 1103 Probe Power Supply, and the  
waveform is distorted, check to make sure that the oscilloscope  
termination is 50 W.  
If the probe does not pass this functional check, go to Troubleshoot-  
ing on page 59.  
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Functional Check  
Deskew Fixture  
The optional deskew fixture provides a convenient way to connect  
the probes in your system to the calibration signal for deskewing.  
The deskew fixture is configured to allow you to connect different  
probe models to the system. Refer to Figure 3 to see how two P6249  
probes are connected.  
P6249 probe  
Signal  
Ground  
P6249 probe  
Figure 3: Deskew fixture connections (two P6249 probes shown)  
For part number information for the deskew fixture, refer to  
Replaceable Parts on page 63.  
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Functional Check  
Probe Calibration Errors  
If you get the message Probe Cal Failed, or other calibration  
anomalies occur, you may be using an oscilloscope that is not fully  
compatible with the P6249 probe, or you may have a hardware  
problem.  
Check Compatibility  
Before suspecting a problem with your probe, compare your  
oscilloscope firmware version with those listed in Table 1.  
Table 1: TDS 500, 600, or 700 series oscilloscopes fully compatible  
with the P6249 probe  
Model number  
Firmware version required  
TDS 520D  
greater than FV:6.3e  
TDS 540D  
TDS 580D  
TDS 654C  
TDS 680C  
TDS 684C  
TDS 694C  
TDS 724D  
TDS 754D  
TDS 784D  
TDS 794D  
greater than FV:6.3e  
greater than FV:6.3e  
FV:5.1e or above  
FV:5.1e or above  
FV:5.1e or above  
all versions compatible  
greater than FV:6.3e  
greater than FV:6.3e  
greater than FV:6.3e  
greater than FV:6.3e  
NOTE. You can take P6249 probe measurements with any TDS 500,  
600, or 700 series oscilloscope, regardless of firmware version. The  
fully compatible oscilloscopes listed in Table 1 give you enhanced  
accuracy after successfully passing the probe calibration function.  
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Functional Check  
Other TDS 500, 600, or 700 series oscilloscopes may give the error  
message Probe Cal Failedwhen you run the probe calibration  
function, but the probe will still meet its warranted specifications.  
Check for Hardware Problems  
If the firmware version on your TDS 500, 600, or 700 series  
oscilloscope is fully compatible with the P6249 probe, do the  
following:  
1. Perform the Signal Path Calibration on the oscilloscope and wait  
for it to complete.  
2. Rerun the calibration routine on the P6249 probe.  
3. If the oscilloscope returns the failure message again, initialize the  
probe calibration and check probe offset zero:  
H If offset zero is greater than 25 mV, perform the Offset Zero  
adjustment on page 50 in the Adjustments section.  
H If offset zero is less than 25 mV, check the Offset Range as  
instructed on page 51 in the Adjustments section.  
4. Rerun the probe calibration function on the P6249 probe. If the  
probe calibration fails, run the calibration on another oscilloscope  
channel.  
5. If the problem persists, there is a hardware fault. Please contact  
your nearest Tektronix Service Center for more information.  
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Functional Check  
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Operating Basics  
Please follow these operating guidelines to get optimum performance  
from your P6249.  
Handling the Probe  
Exercise care when using and storing the P6249. The probe and cable  
are susceptible to damage caused by careless use. Always handle the  
probe using the compensation box and probe head, avoiding undue  
physical strain to the probe cable, such as kinking, excessive  
bending, or pulling. Visible dents in the cable will increase signal  
aberrations. Do not drop the probe or subject it to physical shock.  
Damage to the probe may result.  
Maximum Non-destructive Input Voltage  
The P6249 is electrically protected against static voltage; however,  
applying voltages above its design limits may damage the probe tip  
amplifier. Please refer to Specifications on page 27 for the maximum  
operating voltage and frequency derating information.  
Input Linear Dynamic Range  
The probe head amplifier used by the P6249 has a limited linear  
operating range. To keep the input linearity error less than 0.1% you  
must limit the apparent signal input voltage to 2.0 V.  
Use the DC offset adjustment to maintain the probe within its  
dynamic range. The nominal offset adjustment range of the P6249 is  
5.0 VDC. For example: to offset a +2 VDC level in a circuit, set the  
offset to +2 V.  
NOTE. The probe can tolerate input voltages of 30 V without  
damage; however, the linearity error specification does not apply to  
input voltages exceeding 7.0 V (including any DC offset). See  
Figure 1 on page 12.  
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Operating Basics  
Ground Lead Length  
When you are probing a circuit, you should always use as short a  
ground lead as possible between the probe head and circuit ground.  
When you touch your probe tip to a circuit element, you are  
introducing a new resistance, capacitance, and inductance into the  
circuit. This represents the characteristics of your probe and ground  
lead.  
You can determine if ground lead effects may be a problem in your  
application if you know the self-inductance (L) and capacitance (C)  
of your probe and ground lead path. A portion of the ground lead  
path is uncontrollable since it is hard-wired on the circuit board  
under test.  
As a guide, refer to Figure 4 to estimate the maximum frequency you  
can measure using additional lead length.  
The total inductance can be calculated, with reference to the  
measurement loop area formed by the ground lead path, using the  
following formula:  
A
113  
A = Measurement loop area in square inches  
L = Inductance in microhenries  
L +  
Once you have calculated the inductance, use 1 picofarad for the  
capacitance of the P6249 and calculate the approximate resonant  
frequency (f ) at which this parasitic circuit will resonate, using the  
0
following formula:  
1
f0 +  
Ǹ
2p LC  
The preceding equation shows that reducing the ground lead  
inductance will raise the resonant frequency. If your measurements  
are affected by ringing, your goal is to lower the inductance of your  
ground path until the resulting resonant frequency is at least 3 times  
greater than the frequency of your measurements.  
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Operating Basics  
1000  
900  
800  
700  
600  
500  
400  
Frequency  
(MHz)  
300  
200  
100  
0
1
1.2 1.4 1.6 1.8  
2
2.2 2.4 2.6 2.8  
3
Measurement lead length (Inches)  
Figure 4: Maximum frequency vs. measurement lead length  
In order to reach two test points with a P6249, a 2-inch length return  
ground lead is used. What is the maximum circuit frequency which  
should be measured?  
Using the graph shown in Figure 4 as a guide, a 2-inch lead length  
yields a 500 MHz maximum frequency.  
The low-inductance ground contacts described in Accessories on  
page 5 can help you reduce the effects of ground lead inductance on  
your measurements.  
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Operating Basics  
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Helpful Hints  
Follow these helpful hints to make probing easier and noise free.  
Low-Inductance Grounding  
Placing a ground plane on top of a package being probed can  
minimize ground lead length and inductance. See Figure 5.  
Figure 5: Low-inductance grounding  
Attach a small piece of copper clad on top of the package and  
connect it to the package ground connection. Use the low-inductance  
ground lead provided with the P6249 to keep the ground lead length  
as short as possible.  
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Helpful Hints  
This method is very useful when making many measurements on the  
same package. Using a ground plane on the package makes probing  
the package easier and avoids adding unnecessary ground lead length  
and distortion.  
SureFoot Grounding  
If you cannot use the recommended low-inductance grounding  
method, you may ground the probe to the package under test using a  
SureFoot adapter. Refer to Figure 6.  
Figure 6: Using a SureFoot adapter for grounding  
Use a SureFoot adapter at the end of a short ground lead to connect  
directly to the package ground. This method is preferred over using  
an adjacent circuit ground because it is the shortest ground path  
possible.  
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Helpful Hints  
Probe Tip Test Points  
You can solder the push-in probe tip or a 0.025 square pin to a  
circuit, to be used as a temporary test point. See Figure 7.  
Solder the tip onto a lead or pin with a low-power soldering iron.  
Press the probe head onto the tip to make a measurement, and then  
pull the probe head off when you are done.  
The probe tip may be removed and reused by desoldering it from the  
circuit, and soldering it into another circuit in the future.  
Solder  
Figure 7: Using a probe tip as a test point  
NOTE. Do not use pieces of solid-core copper wire be used as test  
points. If the wire breaks off in the probe tip socket, it may be  
impossible to remove the wire, and it will prevent insertion of other  
accessory tips.  
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Helpful Hints  
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Specifications  
These specifications apply to a P6249 probe when used with a  
TDS 694C oscilloscope.  
The probe and oscilloscope must first be allowed to warm up for  
20 minutes before measurements are taken.  
CAUTION. Do not apply voltages beyond the non-destructive input  
voltage range to the probe. Damage to the probe or circuit under test  
may result.  
Table 2: Warranted electrical specifications  
DC Attenuation Accuracy (probe only)  
Output Zero  
0.2 2% (excludes offset error)  
10 mV or less at output of probe  
120 ps  
Rise Time (probe only)  
Table 3: Typical electrical characteristics  
Bandwidth, (probe only)  
4 GHz (See Figure 9)  
Linear Input Dynamic Range  
2.0 V to +2.0 V.  
(Equivalent to 0.4 V to +0.4 V  
at the output of the probe.)  
Linearity  
"0.1% over a dynamic range of 1.75 V to  
+1.75 V  
"1.0% over a dynamic range of 2.0 V to  
+2.0 V  
30 V to +30 V (DC + peak AC)  
Nondestructive Input Voltage Range  
Input Resistance  
20 kW at DC. (See Figure 8)  
Input Capacitance  
1.0 pF  
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Specifications  
Table 3: Typical electrical characteristics (Cont.)  
Offset Range  
DC Offset Drift  
5.0 V to +5.0 V  
150 mV/°C or less at output of probe  
0.75 mV/°C or less displayed on screen with  
TEKPROBE interface  
DC Offset Scale Accuracy  
Delay Time  
2% (of 5X actual probe gain)  
5.05 ns 0.2 ns  
System Noise  
300 mV rms or less at output of probe with  
probe tip grounded  
110°  
90°  
70°  
50°  
30°  
22 K  
20 K  
18 K  
16 K  
14 K  
12 K  
10 K  
Magnitude  
10°  
10°  
30°  
50°  
70°  
90°  
Phase  
8 K  
6 K  
4 K  
2 K  
110°  
0
1 M  
10 M  
100 M  
1 G  
5 G  
Frequency  
Figure 8: Typical input impedance and phase versus frequency  
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Specifications  
Table 4: Physical Characteristics  
Net Shipping Weight  
Cable Length  
1.78 kg (3.93 lb)  
1.3 meters  
10  
12  
14  
16  
18  
Gain dB  
20  
VOUT  
VIN  
22  
24  
26  
28  
Gain + 20 Log ǒ Ǔ  
1 MHz  
10 MHz  
100 MHz  
1 GHz  
10 GHz  
Frequency  
Figure 9: Typical bandwidth  
Table 5: Environmental characteristics  
Operating Temperature  
0° C to +40° C.  
The environmental exposure is the procedure stated  
in Tektronix Design Standard 062-2847-00 for Class 5  
equipment.  
Nonoperating Temperature  
40° C to +71° C.  
The environmental exposure is the procedure stated  
in Tektronix Design Standard 062-2847-00 for Class 5  
equipment.  
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Specifications  
Table 5: Environmental characteristics (Cont.)  
Humidity  
80% RH at 40° C.  
The environmental exposure is as stated in Tektronix  
Design Standard 062-2847-00 for Class 5 equipment.  
Packaged Product Vibration and  
Shock  
The packaged product qualifies under the Distribution  
Cycle 1 Assurance Level II for packaged products 0 to  
20 lbs. Test 2 for Warehouse and Vehicle Stacking  
(Compression) is omitted.  
Tektronix standard 062-2858-00, Rev. B, Class 5.  
Electrostatic Immunity  
IEC 61000-4-2  
EMC  
IEC 8013  
Altitude  
Operating: 15,000 ft.  
Non-Operating: 50,000 ft.  
Pollution Degree  
Pollution Degree 2  
Table 6: Certifications and compliances  
Category  
Standards or description  
EC Declaration of  
Conformity EMC  
Meets intent of Directive 89/336/EEC for Electromagnetic  
Compatibility. Compliance was demonstrated to the following  
specifications as listed in the Official Journal of the European  
Union:  
EN 55011  
Class A Radiated and Conducted Emissions  
EN 55011  
EN 61000-3-2  
EN 61000-3-3  
Class B Radiated and Conducted Emissions  
AC Power Line Harmonic Emissions  
AC Power Line Flicker  
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Specifications  
Table 6: Certifications and compliances (cont.)  
Category  
Standards or description  
EN 50082-1 Immunity:  
IEC 61000-4-2 Electrostatic Discharge Immunity  
IEC 61000-4-3 RF Electromagnetic Field Immunity  
IEC 61000-4-4 Electrical Fast Transient/Burst Immunity  
IEC 61000-4-5 Power Line Surge Immunity  
IEC 61000-4-6 Radio Frequency Common Mode  
IEC 61000-4-8 Power Frequency Magnetic Field  
IEC 61000-4-11 Voltage Dips and Interruptions  
Australia/New Zealand Complies with EMC provision of Radiocommunications Act  
Declaration of  
per the following standard(s):  
Conformity EMC  
AS/NZS 2064.1/2 Industrial, Scientific, and Medical  
Equipment:1992  
AS/NZS 3548  
Information Technology Equipment: 1995  
EMC Compliance  
FCC Compliance  
Meets the intent of Directive 89/336/EEC for Electromagnetic  
Compatibility when it is used with the product(s) stated in the  
specifications table. Refer to the EMC specification published for  
the stated products. May not meet the intent of the directive if used  
with other products.  
Emissions comply with FCC Code of Federal Regulations 47, Part  
15, Subpart B, Class A Limits.  
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Specifications  
Table 6: Certifications and compliances (cont.)  
Category  
Standards or description  
Pollution Degree  
A measure of the contaminates that could occur in the  
environment around and within a product. Typically the internal  
environment inside a product is considered to be the same as the  
external. Products should be used only in the environment for  
which they are rated.  
Pollution Degree 1  
No pollution or only dry, nonconductive pollution occurs.  
Products in this category are generally encapsulated,  
hermetically sealed, or located in clean rooms.  
Pollution Degree 2  
Normally only dry, nonconductive pollution occurs.  
Occasionally a temporary conductivity that is caused by  
condensation must be expected. This location is a typical  
office/home environment. Temporary condensation occurs  
only when the product is out of service.  
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WARNING  
The following servicing instructions are for use only by  
qualified personnel. To avoid injury, do not perform any  
servicing other than that stated in the operating instructions  
unless you are qualified to do so. Refer to all Safety  
Summaries before performing any service.  
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Theory of Operation  
There are no user replaceable parts within the probe or the  
compensation box; however, this theory of operation is provided to  
assist you in isolating failures to either the probe or the host  
oscilloscope. Refer to Figure 10 for the simplified schematic.  
Probe head  
Compensation box  
Oscilloscope  
Signal Out  
Probe tip  
Probe tip  
amplifier  
Probe ID Out  
Clock In  
EEPROM  
Offset ampifier  
1V Offset  
Offset  
zero  
Offset to probe  
+5  
5  
Offset  
gain  
+7V  
Linear  
regulator  
+5V  
5V  
Ground  
Probe  
cable  
TEKPROBE  
Interface  
Figure 10: P6249 simplified schematic diagram  
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Theory of Operation  
Probe Head and Cable Assembly  
The probe head assembly contains an active amplifier circuit that  
buffers and amplifies the input signal. The amplifier receives power  
and an offset level from the compensation box assembly via the  
cable assembly.  
All signal amplification and buffering is performed in the probe head  
assembly. No further amplification takes place in the compensation  
box.  
Compensation Box  
The compensation box contains the following circuits:  
H Offset amplifier  
H Probe identification EEPROM  
H TEKPROBE interface  
H V , +7 V linear regulator  
CC  
Offset Amplifier  
The offset amplifier is used to offset the input signal DC component  
so that it stays at the optimal point of the probe linear dynamic  
range. For more information on the linear dynamic range characteris-  
tic, refer to Input Linear Dynamic Range on page 19.  
The offset amplifier receives offset information as a 1 VDC voltage  
from the oscilloscope. The amplfier then amplifies it to match the  
probe characteristics and applies it to the probe head circuit.  
The offset amplifier has two adjustments: offset zero and offset gain.  
These adjustments rarely need attention; however, detailed  
adjustment instructions are in the Adjustment section on page 49.  
Probe Identification EEPROM  
The probe identification EEPROM is used to configure the  
oscilloscope to the probe. The EEPROM receives a clock input from  
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Theory of Operation  
the oscilloscope, and information about the probe is passed to the  
oscilloscope.  
TEKPROBE Interface  
The TEKPROBE interface provides a communication path between  
the probe and the oscilloscope. Contact pins provide power, signal,  
offset, and data transfer for the probe identification EEPROM.  
V , +7 V Regulator  
CC  
The +15 V input is regulated to +7 V to supply the IC, V .  
CC  
Figure 11 shows the TEKPROBE interface pin functions. Refer to  
your oscilloscope service documentation for more detailed  
specifications.  
15 V  
5 V  
Offset  
Ground  
Signal  
Data  
Clock  
+5 V  
+15 V  
Figure 11: TEKPROBE interface  
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Theory of Operation  
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Performance Verification  
Use the following procedures to verify the warranted specifications  
of the P6249 probe. Before beginning these procedures, refer to  
page 47 and photocopy the test record and use it to record the  
performance test results. The recommended calibration interval is  
one year.  
These procedures test the following specifications:  
H Output offset voltage  
H DC attenuation accuracy  
H Rise time  
Equipment Required  
Refer to Table 7 for a list of the equipment required to verify the  
performance of your probe.  
Table 7: Equipment required for performance verification  
Performance  
Requirement  
Item Description  
Recommended Example  
Tektronix TDS 694C  
Tektronix 11801  
Tektronix SD24  
Tektronix 1103  
Oscilloscope  
TEKPROBE interface  
Sampling Oscilloscope  
Sampling Head  
TEKPROBE Power Supply  
Calibration Step Generator  
Adapter  
067-1338-0X  
Probe tip  
015-0678-00  
DC Power Supply  
DMM  
1 VDC at 1 mA  
0.5% accuracy at 2 VDC  
50 W 0.05 W  
Tektronix PS280  
Tektronix TX3  
Feedthrough Termination  
011-0129-00  
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Performance Verification  
Table 7: Equipment required for performance verification (Cont.)  
Performance  
Requirement  
Item Description  
Recommended Example  
BNC-to-BNC coaxial cable  
Coaxial cable  
012-1342-00  
50 W coaxial cable  
Male-to-Male SMA, 20 in  
174-1427-00  
Precision coaxial cable  
Male-to-Male SMA, 1 ns  
delay  
015-0562-00  
Adapter  
SMA Female-to-Female  
015-1012-00  
015-0572-00  
103-0090-00  
Adapters (2)  
Adapter  
SMA Female-to-BNC Male  
BNC Female-to-Dual  
Banana  
Adapter  
Y-lead adapter  
196-3457-00  
206-0364-00  
Adapters (2)  
Klip Chip adapter  
Equipment Setup  
Use this procedure to set up the equipment to test the probe.  
1. Connect the probe to the oscilloscope.  
2. Connect a Y-lead adapter with KlipChip adapters attached to the  
P6249.  
3. Turn on the oscilloscope and enable the channel.  
4. Allow 30 minutes for the equipment to warm up.  
NOTE. If your oscilloscope has a probe calibration routine, run it  
before making any of the following checks. However, certain  
firmware versions of TDS series oscilloscopes will return a Probe Cal  
Failed message. If this occurs, see Probe Calibration Errors on  
page 16 for more information.  
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Performance Verification  
Output Zero  
Use this procedure to verify the probe output zero.  
1. Connect the test equipment as shown in Figure 12.  
2. Attach the probe to a TEKPROBE interface on the 1103 power  
supply.  
3. Ground the probe tip by connecting the probe tip to the probe  
ground socket. (Connecting two KlipChip adapters together is  
recommended.)  
4. Set the 1103 offset VAR/0V to 0V.  
5. Observe the multimeter display and record the results on the test  
record.  
The displayed DC level should be 0.00 V 10 mV.  
1103  
Power supply  
Power supply  
Digital multimeter  
+
+
50W Precision  
terminator  
BNC-to-Dual  
Banana Adapter  
Figure 12: Setup for output zero and DC attenuation accuracy  
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Performance Verification  
DC Attenuation Accuracy  
Use this procedure to verify the probe DC attenuation accuracy.  
Before beginning, read the procedure through completely.  
1. Connect the test equipment as shown in Figure 12 on page 41.  
2. Attach the probe to a TEKPROBE interface on the 1103 power  
supply.  
3. Set the 1103 offset VAR/0V to 0V.  
4. Set the multimeter to read DC volts.  
5. Connect the probe tip and ground to the power supply using the  
Y-lead and KlipChip adapters.  
6. Allow 30 minutes for the equipment to warm up.  
Record the results of steps 7 through 10 separately. Use the results to  
calculate the DC accuracy of the probe in step 11.  
7. Set the power supply to +1.000 V. Record the power supply  
output as Vmax.  
8. Measure and record the multimeter reading as M1.  
9. Set the power supply to 1.000 V. Record the power supply  
output as Vmin.  
10. Measure and record the multimeter reading as M2.  
NOTE. If you are unable to set the power supply precisely, record the  
actual readings and determine the absolute difference.  
|Vmax – Vmin| = difference.  
Divide the difference by 5 to account for the ideal probe attenuation  
factor. For example: 0.8 is the difference between +2 and –2, divided  
by 5.  
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Performance Verification  
11. Determine the percent error by using the formula below:  
M1 * M2  
%Error + [  
* 1]   100%  
0.4  
The calculated error should be 2%.  
12. Record the results on the test record.  
NOTE. An unaccceptable error value may result if a low tolerance  
termination is substituted for the recommended termination.  
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Performance Verification  
Rise Time  
This procedure verifies that the probe meets rise time specifications.  
The probe rise time is calculated from rise times obtained by  
measuring the test system without the probe attached, and the test  
system plus the probe.  
1. Connect the test equipment as shown in Figure 13.  
2. Set the oscilloscope trigger to internal clock.  
3. Turn on channel 1 on the SD-24, and then set the oscilloscope  
vertical scale to 50 mV/div.  
4. Set the oscilloscope horizontal scale to 100 ps/div.  
5. Adjust the oscilloscope horizontal and vertical position controls  
to display a signal similar to that shown in Figure 13.  
BNC to SMA adapter  
Precision coaxial cable  
1103  
Power supply  
Calibration  
step generator  
11801  
Input  
Output  
Trigger Input  
Internal  
clock output  
Generator  
remote head  
Figure 13: Test system rise time setup  
6. Use the oscilloscope measurement capability to display rise time.  
Rise time is determined from the 10% and 90% amplitude points  
on the waveform. Record the rise time as t  
s.  
The system rise time (t ) that you measured in step 6 represents the  
s
rise time of the test system without the probe.  
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Performance Verification  
The following steps instruct you to assemble the test setup that  
includes the probe, as shown in Figure 14. The system and probe rise  
time (t ) that you measure in step 12 is used to calculate the probe  
s+p  
rise time (t ) in step 13.  
p
7. Disconnect the calibration generator remote head from the 1103  
power supply input. Remove the SMA-BNC adapter from the  
1103 power supply input.  
8. Use the BNC locking ring to connect the probe to the 1103 power  
supply channel 1 input. Disable the offset control on channel 1 of  
the 1103 power supply.  
9. Connect the probe tip adapter to the calibration step generator  
remote head using the SMA female-female adapter. Insert the  
probe tip into the probe tip adapter.  
P6249 Probe  
50 W Terminator  
1103 Power supply  
Probe tip adapter  
BNC to SMA  
adapter  
Output Input  
Generator remote head  
Precision  
coaxial cable  
11801  
Calibration  
step generator  
Input  
Trigger input  
Internal  
clock output  
Figure 14: Test system and probe rise time setup  
10. Press the AUTOSET button. Set the vertical to 10 mV/div and  
horizontal to 100 ps/div. Turn averaging on.  
11. Adjust the oscilloscope horizontal and vertical position controls  
to display a signal similar to that shown in Figure 14.  
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Performance Verification  
NOTE. Do not touch the probe tip adapter when making calibration  
measurements. Measurement accuracy is degraded when the probe  
tip adapter is handled.  
12. Use the oscilloscope measurement capability to display rise time.  
Rise time is determined from the 10% and 90% amplitude points  
on the waveform. Record the rise time as t  
s+p.  
13. Calculate the probe only rise time using the following formula:  
2
tp + t(s)p)2 * ts  
Ǹ
14. Check that the calculated rise time meets the probe specification.  
The rise time (t ) must be v120 ps.  
p
15. Record the results on the test record.  
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Performance Verification  
Test record  
Probe Model:  
Serial Number:  
Certificate Number:  
Temperature:  
RH %:  
Date of Calibration:  
Technician:  
Performance test  
Minimum Incoming Outgoing Maximum  
Output zero voltage  
(at probe output)  
10 mV  
N/A  
________ ________ + 10 mV  
________ ________ 2 %  
________ ________ 120 ps  
10 mV (20_ C to 30_ C)  
DC attenuation accuracy  
Rise time  
N/A  
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Performance Verification  
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Adjustments  
The P6249 has two internal controls: offset zero and offset range.  
These controls rarely need to be adjusted, and only should be  
changed after a probe calibration and functional check has been  
performed on the oscilloscope.  
In order to make adjustments to the probe, the compensation box top  
cover needs to be removed with the optional release tool. Refer to  
page 54. Use the optional adjustment tool for making any adjust-  
ments.  
Adjustment Locations  
Refer to Figure 15 for the location of the offset zero and offset range  
controls.  
Offset zero  
adjust  
Offset range  
adjust  
J1  
Figure 15: P6249 adjustment locations  
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Adjustments  
Offset Zero  
Use this procedure to adjust the probe offset zero.  
NOTE. If your oscilloscope has a probe calibration routine, clear the  
probe calibration constants at this time.  
If the offset zero is adjusted, perform a functional check of the offset  
range before closing the compensation box.  
1. Ground the probe tip by connecting the probe tip to the probe  
ground socket.  
2. Set the channel vertical offset to 0.00 V.  
3. Measure the displayed DC level.  
4. Adjust Offset Zero for 0.00 15 mV. ( 3 mV when measured  
directly without attenuation factor.)  
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Adjustments  
Offset Range  
Use this procedure to adjust the offset range of the probe. The offset  
zero of the probe should be checked before making any adjustment  
to the offset range. The offset range of the probe is approximately  
3.5 to +3.5 volts.  
1. Power on the 1103 power supply and turn on the offset.  
2. Using a DMM, adjust the 1103 offset voltage to 0.5 V. Refer to  
Figure 16 for the location of the offset voltage test point.  
Offset voltage  
Ground  
Figure 16: 1103 power supply offset voltage location  
3. Connect the equipment as shown in Figure 17. Take care not to  
disturb the offset level setting on the 1103 power supply.  
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Adjustments  
1103  
Power supply  
Power supply  
Digital multimeter  
+
+
50W Precision  
terminator  
BNC-to-dual  
Banana Adapter  
Figure 17: P6249 offset range setup  
4. Set the DC power supply (using the DMM) to +2.5 VDC.  
5. Observe the DC value on the DMM.  
6. Adjust Offset Range for a DMM reading of 0 V 5 mV. Refer to  
Figure 15 on page 49 for the location of the offset range  
adjustment.  
NOTE. After the offset zero and offset range have been adjusted,  
perform a probe calibration and functional check to verify perfor-  
mance.  
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Maintenance  
This section describes the maintenance and repair procedures for the  
P6249.  
Replacing TEKPROBE Interface Pins  
TEKPROBE interface pins can stick and fail to make contact after  
time. Periodically check to see that each of the interface pins move  
freely and fully extends out of the interface. If any pin fails to move  
freely and fully extend, replace the pin.  
To remove a TEKPROBE interface pin, firmly grasp the pointed tip  
with pliers and pull the pin out of the connector. See Figure 18.  
No tools are required to install a replacement pin. Insert a new pin  
into the connector socket as far as possible using finger pressure. If  
necessary, seat the pin into the connector by pressing the tip gently  
but firmly against a hard surface, such as a wood block or table top.  
Figure 18: Replacing TEKPROBE interface pins  
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Maintenance  
Removing and Replacing the Compensation Box Covers  
Follow these steps to open the compensation box.  
1. Press the optional release tool pins into the compensation box  
cover catches and gently lift the cover off a small distance. Refer  
to Figure 19.  
2. Hold the open edge apart, and use the tool to open the other side  
of the compensation box.  
3. With both sides of the box open, gently separate the two halves of  
the compensation box.  
Optional  
release  
tool  
Cover  
catches  
Figure 19: Removing the compensation box covers  
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Maintenance  
To replace the covers, follow these steps:  
1. Align the tabs with the notches on the cover halves. Refer to  
Figure 20.  
2. Press the cover tabs in so that the cover can be lowered.  
3. Slide the tabs into the notches.  
4. Firmly press the pieces together until the cover catches snap into  
place.  
Tabs (4)  
Figure 20: Replacing the compensation box cover  
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Maintenance  
Removing and Replacing the TEKPROBE Interface Collar  
To remove the TEKPROBE interface collar, firmly grasp the  
compensation box body with one hand, and the TEKPROBE  
interface collar with the other hand. Firmly pull the interface collar  
off.  
To replace the interface collar, first note the pin configuration on the  
compensation box, and their holes in the interface collar. The group  
of three pins fit through the smaller of the two holes in the interface  
collar. See Figure 21.  
Align the tab to the slot and gently press the two pieces together. See  
Figure 21.  
Once installed, the TEKPROBE interface collar should rotate freely  
to lock and unlock.  
Tab  
Slot  
Figure 21: Replacing the TEKPROBE interface collar  
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Maintenance  
Inspection and Cleaning  
To prevent damage to probe materials, avoid using chemicals that  
contain benzine, benzene, toluene, xylene, acetone, or similar  
solvents.  
Do not immerse the probe or use abrasive cleaners.  
Dirt may be removed with a soft cloth dampened with a mild  
detergent and water solution, or isopropyl alcohol.  
Replacement Parts  
Refer to Replaceable Parts on page 63 for a list of customer  
replaceable parts. Due to the sophisticated design of the P6249, there  
are no user replaceable parts within the probe.  
Preparation for Shipment  
If the original packaging is unfit for use or not available, use the  
following packaging guidelines:  
1. Use a corrugated cardboard shipping carton having inside  
dimensions at least one inch greater than the probe dimensions.  
The box should have a carton test strength of at least 200 pounds.  
2. Put the probe into a plastic bag or wrap to protect it from  
dampness.  
3. Place the probe into the box and stabilize it with light packing  
material.  
4. Seal the carton with shipping tape.  
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Maintenance  
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Troubleshooting  
This troubleshooting documentation details isolation to either the  
probe or the oscilloscope.  
NOTE. Certain firmware versions of TDS series oscilloscopes will  
return a Probe Cal Failedmessage when you run probe calibration  
routines on the P6249 probe. If this occurs, refer to Probe Calibration  
Errors on page 16.  
To troubleshoot the P6249, the probe must be attached to an  
operating TEKPROBE interface oscilloscope with the top cover of  
the compensation box removed. Refer to page 54 for instructions on  
opening the compensation box.  
The oscilloscope should be set to the following settings:  
H 50 W termination at instrument.  
H DC coupling  
CAUTION. Observe caution when probing in the compensation  
box. Operating voltages will be present. Be careful not to touch  
or ground energized components.  
Work at a Level 1 ESD workstation when performing trouble-  
shooting. The compensation box contains static sensitive  
devices.  
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Troubleshooting  
Refer to Table 8 for troubleshooting procedures, and Figure 22 for  
troubleshooting test points.  
Offset zero  
adjust  
Offset range  
adjust  
J1  
Offset  
5  
Data  
Clock  
+5  
+5  
(Red)  
Ground 5  
(Black) (White) (Blue)  
Offset  
Figure 22: Compensation box test point locations  
Table 8: Troubleshooting guide  
Symptom  
Checks  
Result  
Action  
No Signal Out  
Check known signal No signal.  
Continue checks  
Replace probe.  
Go to Probe Power  
Probe power OK.  
Distorted or  
nonlinear signal  
Is the instrument set No  
to 50 W termination?  
Set termination to  
50 W, or install a  
feedthrough  
termination at the  
instrument input.  
Yes  
Continue  
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Troubleshooting  
Table 8: Troubleshooting guide (Cont.)  
Symptom  
Checks  
Result  
Action  
Distorted or  
nonlinear signal  
Is the signal within  
linear dynamic  
range? See page 19.  
No  
Set channel vertical  
offset to match signal  
characteristic.  
No Offset Adjust  
(Signal present)  
Go to Probe Power  
row  
Probe power OK  
Offset input OK  
Continue checks  
Check variation of  
offset input from host  
instrument. See  
Figure 22. Signal  
should vary between  
+1 V and 1 V.  
Replace probe.  
Offset input bad  
Check TEKPROBE  
interface pins on the  
compensation box.  
See page 53.  
Check TEKPROBE  
interface on host  
instrument. (Try an  
adjacent channel.)  
Repair host  
instrument  
Probe Power  
Check the power  
test points in the  
compensation box.  
See Figure 22.  
Power OK  
Power bad  
Continue checks.  
Check TEKPROBE  
interface pins on the  
compensation box.  
See page 53.  
Check TEKPROBE  
interface on host  
instrument. (Try an  
adjacent channel.)  
Repair host  
instrument  
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Troubleshooting  
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Replaceable Parts  
This section contains a list of replaceable parts for the P6249. Use  
this list to identify and order replacement parts.  
Parts Ordering Information  
Replacement parts are available from or through your local  
Tektronix, Inc. service center or representative.  
Changes to Tektronix instruments are sometimes made to accommo-  
date improved components as they become available and to give you  
the benefit of the latest circuit improvements. Therefore, when  
ordering parts, it is important to include the following information in  
your order:  
H Part number  
H Instrument type or model number  
H Instrument serial number  
H Instrument modification number, if applicable  
If a part you order has been replaced with a different or improved  
part, your local Tektronix service center or representative will  
contact you concerning any change in the part number.  
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Replaceable Parts  
Using the Replaceable Parts List  
The tabular information in the Replaceable Parts List is arranged for  
quick retrieval. Understanding the structure and features of the list  
will help you find the information you need for ordering replacement  
parts.  
Item Names  
In the Replaceable Parts List, an Item Name is separated from the  
description by a colon (:). Because of space limitations, an Item  
Name may sometimes appear as incomplete. For further Item Name  
identification, U.S. Federal Cataloging Handbook H6-1 can be used  
where possible.  
Indentation System  
This parts list is indented to show the relationship between items.  
The following example is of the indentation system used in the  
Description column:  
1ą 2ą 3ą 4ą 5  
Assembly and/or Component  
Attaching parts for Assembly and/or Component  
(END ATTACHING PARTS)  
Detail Part of Assembly and/or Component  
Attaching parts for Detail Part  
(END ATTACHING PARTS)  
Name & Description  
Parts of Detail Part  
Attaching parts for Parts of Detail Part  
(END ATTACHING PARTS)  
Attaching parts always appear at the same indentation as the item it  
mounts, while the detail parts are indented to the right. Indented  
items are part of, and included with, the next higher indentation.  
Attaching parts must be purchased separately, unless otherwise  
specified.  
Abbreviations  
Abbreviations conform to American National Standards Institute  
(ANSI) standard Y1.1  
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Replaceable Parts  
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