Intel® Solid-State Drive 520 Series
Product Specification
Capacity: 60/120/180/240/480 GB
Power Management
— 5 V SATA Supply Rail
— SATA Link Power Management (LPM)
Components:
®
— Intel 25nm NAND Flash Memory
— Multi-Level Cell (MLC)
Form Factor: 2.5-inch
Thickness: 7 mm and 9.5 mm
— 7 mm: 120/180/240 GB
— 9.5 mm: 60/120/180/240/480 GB
Weight: Up to 78 grams
Power
— Active (MobileMark* 2007 Workload):
850 mW (TYP)
— Idle: 600 mW (TYP)
Temperature
o
o
— Operating: 0 C to 70 C
— Non-Operating: -55 C to 95 C
Reliability
o
o
1
SATA 6Gb/s Bandwidth Performance
(Iometer* Queue Depth 32)
— Uncorrectable Bit Error Rate (UBER):
— Sustained Sequential Read: Up to 550 MB/s
— Sustained Sequential Write:Up to 520 MB/s
16
< 1 sector per 10 bits read
— Mean Time Between Failures (MTBF):
1,200,000 hours
Shock (operating and non-operating):
1,500 G/0.5 msec
Vibration
— Operating: 2.17 G
— Non-operating: 3.13 G
Certifications and Declarations:
1
Read and Write IOPS
(Iometer Queue Depth 32)
— Random 4 KB Reads: Up to 50,000 IOPS
— Random 4 KB Writes: Up to 80,000 IOPS
Latency (average sequential)
— Read: 80 µs (TYP)
— Write: 85 µs (TYP)
Data Compression
2
(5-700 Hz)
RMS
(5-800 Hz)
RMS
— UL*
— CE*
— C-Tick*
— BSMI*
— KCC*
— Microsoft* WHQL
— VCCI*
AES 256-bit Encryption
End-to-End Data Protection
Compatibility
®
®
— Intel SSD Toolbox with Intel SSD Optimizer
®
— Intel Data Migration Software
®
— Intel Rapid Storage Technology
®
— Intel 6 Series Express Chipsets
— SATA-IO*
Product Ecological Compliance
— RoHS*
(with SATA 6Gb/s)
— SATA Revision 3.0
— ACS-2
— SSD-enhanced SMART ATA feature set
— Native Command Queuing (NCQ)
command set
— Data Set Management Command
Trim attribute
1. Performance values vary by capacity.
2. Random 4 KB writes measured using out-of-box SSD.
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Contents
1.0 Overview...................................................................................................................5
2.0 Product Specifications ...............................................................................................6
Capacity ............................................................................................................6
Performance.......................................................................................................6
Electrical Characteristics.......................................................................................8
Environmental Conditions.....................................................................................8
Product Regulatory Compliance.............................................................................9
Reliability......................................................................................................... 10
Hot Plug Support............................................................................................... 10
3.0 Mechanical Information........................................................................................... 11
4.0 Pin and Signal Descriptions ..................................................................................... 13
Signal Descriptions............................................................................................ 13
4.2.1 Connector Pin Signal Definitions............................................................... 13
4.2.2 Power Pin Signal Definitions..................................................................... 14
5.0 Supported Command Sets........................................................................................ 15
SMART Command Set........................................................................................ 16
5.4.1 SMART Attributes ................................................................................... 17
5.4.2 SMART Logs .......................................................................................... 19
Data Set Management Command Set................................................................... 20
5.10 General Purpose Log Command Set ..................................................................... 21
5.11 Native Command Queuing.................................................................................. 21
5.12 Software Settings Preservation............................................................................ 21
5.13 SATA Link Power Management (LPM) ................................................................... 21
6.0 Certifications and Declarations................................................................................ 22
7.0 References .............................................................................................................. 23
8.0 Terms and Acronyms............................................................................................... 23
9.0 Revision History ...................................................................................................... 24
IDENTIFY DEVICE Command Data ........................................................................... 25
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Intel Solid-State Drive 520 Series
1.0
Overview
®
This document describes the specifications and capabilities of the Intel Solid-State
®
1
Drive 520 Series (Intel SSD 520 Series) .
The Intel SSD 520 Series delivers leading performance for Serial Advanced Technology
Attachment (SATA)-based computers in capacities ranging up to 480 GB.
By combining Intel's leading 25nm NAND flash memory technology with SATA 6Gb/s
interface support, the Intel SSD 520 Series delivers sequential read speeds of up to
550 MB/s and sequential write speeds of up to 520 MB/s.
The industry-standard 2.5-inch form factor enables interchangeability with existing
hard disk drives (HDDs) and native SATA HDD drop-in replacement with the enhanced
performance, reliability, and ruggedness offered by an SSD.
As compared to standard SATA HDDs, Intel SSD 520 Series offers these key features:
• High I/O and throughput performance
• Increased system responsiveness
• High reliability
• Enhanced ruggedness
The Intel SSD 520 Series also offers additional key features such as:
• Advanced Encryption Standard (AES) 256-bit Encryption
AES 256-bit encryption is an industry standard in data security, providing a
hardware-based mechanism for encryption and decryption of user data. Utilizing a
256-bit encryption key, AES encryption — when combined with an ATA drive
password — helps protect user data.
• End-to-End Data Protection
End-to-end data protection helps protect data from being corrupted across the data
path by using cyclic redundancy check (CRC), parity, and error correction code
(ECC) checks in the data path from the host interface to the NAND, and back.
• Data Compression
Data compression helps improve performance and endurance by automatically
compressing information sent to the SSD so that less data has to be processed and
stored on the NAND. The amount of data that can be compressed depends on the
type of data.
1. The Intel SSD 520 Series is currently not validated for data center usage.
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Intel Solid-State Drive 520 Series
2.0
Product Specifications
2.1
Capacity
Table 1.
User Addressable Sectors
Unformatted Capacity
(Total User Addressable Sectors in LBA Mode)
Intel SSD 520 Series
60 GB
120 GB
180 GB
240 GB
480 GB
117,231,408
234,441,648
351,651,888
468,862,128
937,703,088
Notes: 1 GB = 1,000,000,000 bytes; 1 sector = 512 bytes.
LBA count shown represents total user storage capacity and will remain the same throughout the life of the drive.
The total usable capacity of the SSD may be less than the total physical capacity because a small portion of the capacity is
used for NAND flash management and maintenance purposes.
2.2
Performance
The data compression engine in the Intel SSD 520 Series controller optimizes
performance based on the data pattern of the workload.
This section provides both compressible and incompressible Input/Output Operations
Per Second (IOPS) and sustained sequential read and write bandwidth specifications.
Table 2.
Compressible Performance
Intel SSD 520 Series
180 GB
Specification
Unit
60 GB
120 GB
240 GB
480 GB
Random 4 KB Read (up to)
IOPS
IOPS
IOPS
15,000
80,000
23,000
25,000
80,000
40,000
50,000
80,000
60,000
50,000
80,000
60,000
50,000
50,000
42,000
1
Random 4 KB Write (up to)
2
Random 4 KB Write (TYP)
3
Sequential Read (up to)
SATA 6Gb/s
SATA 3Gb/s
MB/s
MB/s
550
280
550
280
550
280
550
280
550
280
3
Sequential Write (up to)
SATA 6Gb/s
SATA 3Gb/s
475
245
500
260
520
260
520
260
520
260
Notes:
1.
2.
Random 4 KB write performance measured using out-of-box SSD.
Performance measured using Iometer* with Queue Depth 32. Measurements are performed on
8 GB of Logical Block Address (LBA) range on a full SSD.
3.
Performance measured using Iometer with Queue Depth 32.
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Table 3.
Incompressible Performance
Intel SSD 520 Series
180 GB
Specification
Unit
60 GB
120 GB
240 GB
480 GB
1
1
1
1
1
12,000
18,000
24,000
35,000
46,000
56,000
46,000
56,000
46,000
56,000
Random 4 KB Read (up to)
Random 4 KB Write (up to)
Sequential Read (up to)
Sequential Write (up to)
IOPS
IOPS
MB/s
MB/s
2
2
2
2
2
1
1
1
1
1
6,900
13,000
42,000
13,000
54,000
16,500
60,000
9,500
2
2
2
2
2
22,000
36,000
1
1
1
1
1
430
475
550
515
550
485
550
515
550
500
2
2
2
2
2
1
1
1
1
1
80
85
150
170
170
240
235
295
275
235
2
2
2
2
2
Notes:
1.
Performance measured using Iometer with Queue Depth 32. Measurements are performed on
8 GB of Logical Block Address (LBA) range.
2.
Performance measured with incompressible data using AS-SSD* benchmark, where
MB/s = 1,048,576 bytes/second.
Table 4.
Latency
Intel SSD 520 Series
180 GB
Specification
60 GB
120 GB
240 GB
480 GB
1
Latency
Read
Write
Power On To Ready
80 µs (TYP)
85 µs (TYP)
2 s (TYP)
2
Notes: 1. Based on sequential 4 KB using Iometer with Queue Depth 1 workload with compressible (non-random) data pattern.
Write Cache Enabled.
2. Power On To Ready time assumes proper shutdown.
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2.3
Electrical Characteristics
Table 5.
Operating Voltage and Power Consumption
Electrical Characteristics
Value
Operating Voltage for 5 V (±5%)
Min
Max
4.75 V
5.25 V
Power Consumption (TYP)
1
Active
Idle
850 mW
600 mW
2
Notes:
1.
2.
Active power measured during execution of MobileMark* 2007 with SATA Link Power Management (LPM) enabled.
Idle power defined as SSD at idle with SATA Link Power Management (LPM) enabled.
2.4
Environmental Conditions
Table 6.
Temperature, Shock, Vibration
Temperature
Range
Case Temperature
Operating
o
0 – 70 C
o
Non-operating
-55 – 95 C
1
Temperature Gradient
Operating
o
30 (TYP) C/hr
o
Non-operating
30 (TYP) C/hr
Humidity
Operating
Non-operating
5 – 95 %
5 – 95 %
Shock and Vibration
Range
2
Shock
Operating
Non-operating
1,500 G (Max) at 0.5 msec
1,500 G (Max) at 0.5 msec
3
Vibration
Operating
Non-operating
2.17 G
3.13 G
(5-700 Hz) Max
(5-800 Hz) Max
RMS
RMS
Notes:
1.
2.
Temperature gradient measured without condensation.
Shock specifications assume the SSD is mounted securely with the input vibration applied to the drive-mounting screws.
Stimulus may be applied in the X, Y or Z axis. Shock specification is measured using Root Mean Squared (RMS) value.
3.
Vibration specifications assume the SSD is mounted securely with the input vibration applied to the drive-mounting
screws. Stimulus may be applied in the X, Y or Z axis. Vibration specification is measured using Root Mean Squared (RMS)
value.
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2.5
Product Regulatory Compliance
The Intel SSD 520 Series meets or exceeds the regulatory or certification requirements
Table 7.
Product Regulatory Compliance Specifications
Region for which
conformity declared
Title
Description
European Union Low Voltage
Directive (LVD) 2006/95/EC
EN 60950-1 2nd edition for Information Technology Equipment -
Safety - Part 1: General Requirements
European Union
UL/CSA 60950-1, Second Edition
CAN/CSA-C22.2 No. 60950-1-07
Second Edition
Information Technology Equipment - Safety - Part 1:
General Requirements
USA/Canada
CFR Title 47 Part 15
ICES-003 Issue 4
Radio Frequency Devices - Subpart B (Unintentional Radiators)
Interference Causing Equipment Standard
USA
Canada
Information technology equipment -
Radio disturbance characteristics -
Limits and methods of measurement
EN 55022:2006
CNS 14348:2006
VCCI V3/2010.04
KN22 (2008-5)
CISPR 22:2006
EN 55024:1998
KN24 (2008-5)
European Union
Taiwan
Information technology equipment -
Radio disturbance characteristics -
Limits and methods of measurement
Information technology equipment -
Radio disturbance characteristics -
Limits and methods of measurement
Japan
Information technology equipment -
Radio disturbance characteristics -
Limits and methods of measurement
Korea
Information technology equipment -
Radio disturbance characteristics -
Limits and methods of measurement
International
European Union
Korea
Information technology equipment -
Immunity characteristics -
Limits and methods of measurement (CISPR 24:1997, modified)
Information technology equipment -
Immunity characteristics -
Limits and methods of measurement (CISPR 24:1997, modified)
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2.6
Reliability
The Intel SSD 520 Series meets or exceeds SSD endurance and data retention
requirements as specified in the JESD218 specification.
Table 8.
Reliability Specifications
Parameter
Value
Uncorrectable Bit Error Rate (UBER)
Uncorrectable bit error rate will not exceed one sector in the
specified number of bits read. In the unlikely event of a
nonrecoverable read error, the SSD will report it as a read failure to
the host; the sector in error is considered corrupt and is not
returned to the host.
16
< 1 sector per 10 bits read
Mean Time Between Failures (MTBF)
Mean Time Between Failures is estimated based on Telcordia*
methodology and demonstrated through Reliability Demonstration
Test (RDT).
1,200,000 hours
Minimum Useful Life/Endurance Rating
5 years
The SSD will have a minimum of five years of useful life under
typical client workloads with up to 20 GB of host writes per day.
Insertion Cycles
250 insertion/removal cycles
The SSD supports up to 250 insertion/removal cycles on SATA/
power cable.
2.7
Hot Plug Support
Hot Plug insertion and removal is supported in the presence of a proper connector and
appropriate operation system, as described in the SATA 3.0 specification.
This product supports asynchronous signal recovery and issues an unsolicited COMINIT
when first mated with a powered connector to guarantee reliable detection by a host
system without hardware device detection.
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3.0
Mechanical Information
Figure 1 shows the physical package information for the 7mm height 2.5-inch
Intel SSD 520 Series. All dimensions are in millimeters.
Figure 1.
Dimensions for 7mm 2.5-inch Form Factor
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Figure 2 shows the physical package information for the 9.5mm height 2.5-inch
Intel SSD 520 Series. All dimensions are in millimeters.
Figure 2.
Dimensions for 9.5mm 2.5-inch Form Factor
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4.0
Pin and Signal Descriptions
4.1
Pin Locations
Figure 3.
Layout of Signal and Power Segment Pins
Signal Segment S1
Power Segment P1
Note: 2.5-inch connector supports in-built latching capability.
4.2
Signal Descriptions
4.2.1
Table 9.
Connector Pin Signal Definitions
Serial ATA Connector Pin Signal Definitions
Pin
Function
Definition
S1
S2
S3
S4
S5
S6
S7
Ground
A+
1st mate
Differential signal pair A
1st mate
A-
Ground
B-
Differential signal pair B
1st mate
B+
Ground
Note: Key and spacing separate signal and power segments.
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4.2.2
Power Pin Signal Definitions
Table 10.
Serial ATA Power Pin Definitions
1
Pin
Name
Definition
3.3 V Power; not used
Mating Order
2
P1
V
V
V
2nd Mate
2nd Mate
1st Mate
1st Mate
1st Mate
1st Mate
1st Mate
2nd Mate
2nd Mate
1st Mate
2nd Mate
1st Mate
1st Mate
2nd Mate
2nd Mate
33
33
33
2
P2
3.3 V Power; not used
3.3 V Power; not used
2
P3
3,4
P4
Ground
Ground
Ground
3
P5
3
P6
3,5
P7
V
V
V
5 V Power
5 V Power
5 V Power
5
5
5
3,5
P8
3,5
P9
3
P10
Ground
DAS
6
P11
Device Activity Signal
3, 4
P12
Ground
2
2
2
P13
V
V
V
12 V Power; not used
12 V Power; not used
12 V Power; not used
12
12
12
P14
P15
Notes:
1.
2.
All pins are in a single row, with a 1.27 mm (0.050-inch) pitch.
Pins P1, P2 and P3 are connected together; Pins P13, P14 and P15 are connected together. Although they are not
connected internally to the device, the host may apply voltage on these pins.
The mating sequence is:
3.
•
•
Ground pins P4-P6, P10, P12 and the 5V power pin P7.
Signal pins and the rest of the 5V power pins P8-P9.
4.
Ground connectors P4 and P12 may contact before the other 1st mate pins in both the power and signal connectors to
discharge ESD in a suitably configured backplane connector.
5.
6.
Power pins P7, P8, and P9 are internally connected to one another within the device.
The host may ground P11 if it is not used for Device Activity Signal (DAS).
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5.0
Supported Command Sets
The Intel SSD 520 Series supports all mandatory Advanced Technology Attachment
(ATA) and Serial ATA (SATA) commands defined in the ACS-2 and SATA Revision 3.0
specifications. The mandatory and optional commands are defined in this section.
5.1
ATA General Feature Command Set
General Feature command set (non-PACKET), which consists of:
• EXECUTE DEVICE DIAGNOSTIC
• FLUSH CACHE
• IDENTIFY DEVICE
Note:
returned after issuing an IDENTIFY DEVICE command.
• READ DMA
• READ SECTOR(S)
• READ VERIFY SECTOR(S)
• SEEK
• SET FEATURES
• WRITE DMA
• WRITE SECTOR(S)
• READ MULTIPLE
• SET MULTIPLE MODE
• WRITE MULTIPLE
The Intel SSD 520 Series also supports the following optional commands:
• READ BUFFFER
• WRITE BUFFER
• NOP
• DOWNLOAD MICROCODE
5.2
Power Management
The Intel SSD 520 Series supports several power management feature sets as defined
by the ATA specification: general Power Management feature set, Advanced Power
Management feature set, and Power-Up In Standby (PUIS) feature set.
The Advanced Power Management and PUIS features can be enabled or disabled using
the SET FEATURES command.
The Power Management feature set includes the following commands:
• CHECK POWER MODE
• IDLE
• IDLE IMMEDIATE
• SLEEP
• STANDBY
• STANDBY IMMEDIATE
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5.3
Security Mode Feature Set
The Intel SSD 520 Series supports the Security Mode command set, which consists of:
• SECURITY SET PASSWORD
• SECURITY UNLOCK
• SECURITY ERASE PREPARE
• SECURITY ERASE UNIT
• SECURITY FREEZE LOCK
• SECURITY DISABLE PASSWORD
5.4
SMART Command Set
The Intel SSD 520 Series supports the SMART command set, which consists of:
• SMART READ DATA
• SMART READ ATTRIBUTE THRESHOLDS
• SMART ENABLE/DISABLE ATTRIBUTE AUTOSAVE
• SMART SAVE ATTRIBUTE VALUES
• SMART EXECUTE OFF-LINE IMMEDIATE
• SMART READ LOG SECTOR
• SMART WRITE LOG SECTOR
• SMART ENABLE OPERATIONS
• SMART DISABLE OPERATIONS
• SMART RETURN STATUS
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5.4.1
SMART Attributes
page 19 lists the corresponding status flags and threshold settings.
Table 11.
SMART Attributes
1
Status Flags
ID
Attribute
Re-allocated Sector Count
Threshold
SP
EC
ER
PE
OC
PW
The raw value of this attribute shows the
number of retired blocks since leaving the
factory (grown defect count).
05h
1
1
0
0
1
0
0 (none)
Power-On Hours Count
The raw value reports two values: the first
4 bytes report the cumulative number of
power-on hours over the life of the device,
the remaining bytes report the number of
milliseconds since the last hour increment.
The On/Off status of the Device Initiated
Power Management (DIPM) feature will
affect the number of hours reported. If DIPM
is turned On, the recorded value for
power-on hours does not include the time
that the device is in a "slumber" state. If
DIPM is turned Off, the recorded value for
power-on hours should match the clock
time, as all three device states are counted:
active, idle and slumber.
09h
1
1
0
0
1
0
0 (none)
Power Cycle Count
The raw value of this attribute reports the
cumulative number of power cycle events
over the life of the device.
0Ch
AAh
1
1
1
1
0
0
0
0
1
1
0
1
0 (none)
10
Available Reserved Space
Program Fail Count
The raw value of this attribute shows total
count of program fails and the normalized
value, beginning at 100, shows the percent
remaining of allowable program fails.
ABh
ACh
1
1
1
1
0
0
0
0
1
1
0
0
0 (none)
0 (none)
Erase Fail Count
The raw value of this attribute shows total
count of erase fails and the normalized
value, beginning at 100, shows the percent
remaining of allowable erase fails.
Unexpected Power Loss
The raw value of this attribute reports the
cumulative number of unsafe (unclean)
shutdown events over the life of the device.
An unsafe shutdown occurs whenever the
device is powered off without STANDBY
IMMEDIATE being the last command
AEh
1
1
0
0
1
0
0 (none)
End-to-End Error Detection Count
Reports number of errors encountered
during end-to-end error detection within the
SSD data path.
B8h
BBh
1
1
1
1
0
0
0
0
1
1
1
0
90
Uncorrectable Error Count
The raw value shows the count of errors
that could not be recovered using Error
Correction Code (ECC).
0 (none)
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Table 11.
SMART Attributes (Continued)
1
Status Flags
ID
Attribute
Threshold
SP
EC
ER
PE
OC
PW
Power-Off Retract Count (Unsafe Shutdown
Count)
The raw value of this attribute reports the
cumulative number of unsafe (unclean)
shutdown events over the life of the device.
An unsafe shutdown occurs whenever the
device is powered off without STANDBY
IMMEDIATE being the last command.
C0h
1
1
0
0
1
0
0 (none)
Host Writes
The raw value of this attribute reports the
total number of sectors written by the host
system. The raw value is increased by 1 for
every 65,536 sectors (32MB) written by
the host.
E1h
E2h
1
1
1
1
0
0
0
0
1
1
0
0
0 (none)
0 (none)
Timed Workload Media Wear
Measures the wear seen by the SSD (since
reset of the workload timer, attribute E4h),
as a percentage of the maximum rated
cycles.
Timed Workload Host Read/Write Ratio
Shows the percentage of I/O operations
that are read operations (since reset of the
workload timer, attribute E4h).
E3h
E4h
1
1
1
1
0
0
0
0
1
1
0
0
0 (none)
0 (none)
Timed Workload Timer
Measures the elapsed time (number of
minutes since starting this workload timer).
Available Reserved Space
This attribute reports the number of reserve
blocks remaining. The normalized value
begins at 100 (64h), which corresponds to
100 percent availability of the reserved
space. The threshold value for this attribute
is 10 percent availability.
E8h
1
1
0
0
1
1
10
Media Wearout Indicator
This attribute reports the number of cycles
the NAND media has undergone. The
normalized value declines linearly from 100
to 1 as the average erase cycle count
increases from 0 to the maximum rated
cycles.
Once the normalized value reaches 1, the
number will not decrease, although it is likely
that significant additional wear can be put
on the device.
E9h
F1h
1
1
1
1
0
0
0
0
1
1
0
0
0 (none)
Total LBAs Written
The raw value of this attribute reports the
total number of sectors written by the host
system. The raw value is increased by 1 for
every 65,536 sectors (32MB) written by
the host.
0 (none)
Total LBAs Read
The raw value of this attribute reports the
total number of sectors read by the host
system. The raw value is increased by 1 for
every 65,536 sectors (32MB) read by
the host.
F2h
F9h
1
1
1
1
0
0
0
0
1
1
0
0
0 (none)
0 (none)
Total NAND Writes
Raw value reports the number of writes to
NAND in 1 GB increments.
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Table 12.
SMART Attribute Status Flags
Status
Description
Flag
Value = 0
Value = 1
SP
EC
ER
PE
Self-preserving attribute
Event count attribute
Error rate attribute
Not a self-preserving attribute
Not an event count attribute
Not an error rate attribute
Not a performance attribute
Self-preserving attribute
Event count attribute
Error rate attribute
Performance attribute
Performance attribute
Collected during both offline and
online activity
OC
PW
Online collection attribute
Pre-fail warranty attribute
Collected only during offline activity
Advisory
Pre-fail
5.4.2
SMART Logs
The Intel SSD 520 Series implements the following Log Addresses: 00h, 02h, 03h, 06h,
and 07h.
The Intel SSD 520 Series implements host vendor specific logs (addresses 80h-9Fh) as
read and write scratchpads, where the default value is zero (0). Intel SSD 520 Series
does not write any specific values to these logs unless directed by the host through the
appropriate commands.
The Intel SSD 520 Series also implements a device vendor specific log at address A9h
as a read-only log area with a default value of zero (0).
5.5
Device Statistics
In addition to the SMART attribute structure, statistics pertaining to the operation and
health of the Intel SSD 520 Series can be reported to the host on request through the
Device Statistics log as defined in the ATA specification.
The Device Statistics log is a read-only GPL/SMART log located at read log address
0x04 and is accessible using READ LOG EXT, READ LOG DMA EXT or SMART READ LOG
commands.
Table 13.
Device Statistics Log
Equivalent SMART attribute if
Page
Offset
Description
applicable
0x00
-
List of Supported Pages
Power Cycle Count
Power-On Hours
-
0x08
0x10
0x18
0Ch
09h
E1h
Logical Sectors Written
Num Write Commands - incremented
by one for every host write command
0x01 - General Statistics
0x20
0x28
0x30
0x08
0x10
-
F2h
-
Logical Sectors Read
Num Read Commands - incremented
by one for every host write command
Num Reported Uncorrectable Errors
BBh
-
0x04 - General Errors Statistics
0x06 - Transport Statistics
Num Resets Between Command
Acceptance and Completion
0x08
0x10
0x18
Num Hardware Resets
Num ASR Events
-
-
-
Num Interface CRC Errors
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Table 13.
Device Statistics Log (Continued)
Equivalent SMART attribute if
applicable
Page
Offset
Description
E9h
This statistic counts up from 0
rather than down from 100, and
may go beyond 100 for drives that
exceed their expected lifetime.
0x07 - Solid State Device Statistics
0x08
Percentage Used Endurance Indicator
5.6
SMART Command Transport (SCT)
With SMART Command Transport (SCT), a host can send commands and data to an
SSD and receive status and data from an SSD using standard write/read commands to
manipulate two SMART Logs:
• Log Address E0h ("SCT Command/Status") — used to send commands and retrieve
status
• Log Address E1h ("SCT Data Transfer") — used to transport data
5.7
5.8
Data Set Management Command Set
The Intel SSD 520 Series supports the Data Set Management command set Trim
attribute, which consists of:
• DATA SET MANAGEMENT
Host Protected Area Command Set
The Intel SSD 520 Series supports the Host Protected Area command set, which
consists of:
• READ NATIVE MAX ADDRESS
• SET MAX ADDRESS
• READ NATIVE MAX ADDRESS EXT
• SET MAX ADDRESS EXT
5.9
48-Bit Address Command Set
The Intel SSD 520 Series supports the 48-bit Address command set, which consists of:
• FLUSH CACHE EXT
• READ DMA EXT
• READ NATIVE MAX ADDRESS
• READ NATIVE MAX ADDRESS EXT
• READ SECTOR(S) EXT
• READ VERIFY SECTOR(S) EXT
• SET MAX ADDRESS EXT
• WRITE DMA EXT
• WRITE MULTIPLE EXT
• WRITE SECTOR(S) EXT
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5.10
5.11
General Purpose Log Command Set
The Intel SSD 520 Series supports the General Purpose Log command set, which
consists of:
• READ LOG EXT
• WRITE LOG EXT
• READ LOG DMA EXT
• WRITE LOG DMA EXT
Native Command Queuing
The Intel SSD 520 Series supports the Native Command Queuing (NCQ) command set,
which includes:
• READ FPDMA QUEUED
• WRITE FPDMA QUEUED
Note: With a maximum queue depth equal to 32.
5.12
5.13
Software Settings Preservation
The Intel SSD 520 Series supports the SET FEATURES parameter to enable/disable the
preservation of software settings.
SATA Link Power Management (LPM)
The Intel SSD 520 Series supports the SET FEATURES parameter to enable Device
Initiated Power Management (DIPM). The SSD also supports Host Initiated Power
Management (HIPM).
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6.0
Certifications and Declarations
Table 14.
Device Certifications and Declarations
Certification
Description
Low Voltage DIRECTIVE 2006/95/EC OF THE EUROPEAN PARLIAMENT AND OF THE COUNCIL
CE Compliant
UL Certified
of 12 December 2006, and EMC Directive 2004/108/EC OF THE EUROPEAN PARLIAMENT AND OF
THE COUNCIL of 15 December 2004.
Certified Underwriters Laboratories, Inc. Bi-National Component Recognition; UL 60950-1, 2nd
Edition, 2007-03-27 (Information Technology Equipment - Safety - Part 1: General Requirements)
CSA C22.2 No. 60950-1-07, 2nd Edition, 2007-03 (Information Technology Equipment - Safety -
Part 1: General Requirements)
Compliance with the Australia/New Zealand Standard AS/NZS3548 and Electromagnetic
Compatibility (EMC) Framework requirements of the Australian Communication Authority (ACA).
C-Tick Compliant
BSMI Compliant
Compliance to the Taiwan EMC standard CNS 13438: Information technology equipment - Radio
disturbance Characteristics - limits and methods of measurement, as amended on June 1, 2006, is
harmonized with CISPR 22: 2005.04.
Compliance with paragraph 1 of Article 11 of the Electromagnetic Compatibility Control Regulation
and meets the Electromagnetic Compatibility (EMC) Framework requirements of the Radio Research
Laboratory (RRL) Ministry of Information and Communication Republic of Korea.
KCC
Microsoft WHQL
RoHS Compliant
Microsoft Windows Hardware Quality Labs
Restriction of Hazardous Substance Directive
Voluntary Control Council for Interface to cope with disturbance problems caused by personal
computers or facsimile.
VCCI
SATA-IO
Indicates certified logo program from Serial ATA International Organization.
Applies only to brominated and chlorinated flame retardants (BFRs/CFRs) and PVC in the final
product. Intel components as well as purchased components on the finished assembly meet JS-709
requirements, and the PCB/substrate meet IEC 61249-2-21 requirements. The replacement of
halogenated flame retardants and/or PVC may not be better for the environment.
Low Halogen
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7.0
References
Table 15.
Standards References
Date or
Rev. #
Title
Location
Sept 2010
Dec 2008
(JESD218)
VCCI
documents/docs/jesd218/
June 2009
RoHS
Click Search MDDS Database and search
for material description datasheet
August 2009
June 2009
May 2006
May 2005
ACS-2 Specification
Serial ATA Revision 3.0
SFF-8223, 2.5-inch Drive w/Serial Attachment Connector
SFF-8201, 2.5-inch drive form factor
Compliance with EN 55022:1998 Information technology
equipment - Radio disturbance characteristics - Limits and
methods of measurement CISPR 22:1997 (Modified)
8.0
Terms and Acronyms
Table 16.
Glossary of Terms and Acronyms
Term
Definition
ATA
Advanced Technology Attachment
Device Activity Signal
DAS
DIPM
DMA
EXT
Device Initiated Power Management
Direct Memory Access
Extended
FPDMA
First Party Direct Memory Access
Gigabyte (1,000,000,000 bytes)
GB
Note: The total usable capacity of the SSD may be less than the total physical capacity because a
small portion of the capacity is used for NAND flash management and maintenance purposes.
HDD
HIPM
I/O
Hard Disk Drive
Host Initiated Power Management
Input/Output
IOPS
KB
Input/Output Operations Per Second
Kilobyte (1,024 bytes)
Logical Block Address
LBA
LPM
MB
Link Power Management
Megabyte (1,000,000 bytes)
Multi-level Cell
MLC
MTBF
Mean Time Between Failures
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Table 16.
Glossary of Terms and Acronyms (Continued)
Term
Definition
NCQ
NOP
PIO
Native Command Queuing
No Operation
Programmed Input/Output
Reliability Demonstration Test
Root Mean Squared
RDT
RMS
SATA
SMART
SSD
TYP
Serial Advanced Technology Attachment
Self-Monitoring, Analysis and Reporting Technology
Solid-State Drive
Typical
UBER
Uncorrectable Bit Error Rate
9.0
Revision History
Date
February 2012
Revision Description
001
Initial release.
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Appendix A IDENTIFY DEVICE Command Data
Table 17.
Returned Sector Data
F = Fixed
V = Variable
X = Both
Word
Default Value
Description
0
1
F
X
V
X
X
X
V
X
F
0040h
3FFFh
C837h
0010h
0h
General configuration bit-significant information
Obsolete - Number of logical cylinders (16,383)
Specific configuration
2
3
Obsolete - Number of logical heads (16)
Retired
4-5
6
003Fh
0h
Obsolete - Number of logical sectors per logical track (63)
Reserved for assignment by the CompactFlash* Association (CFA)
Retired
7-8
9
0h
10-19
20-21
22
varies
0h
Serial number (20 ASCII characters)
Retired
X
X
F
0h
Obsolete
23-26
27-46
varies
varies
Firmware revision (8 ASCII characters)
®
F
Model number (Intel Solid-State Drive)
7:0—Maximum number of sectors transferred per interrupt on multiple
commands
47
F
8010h
48
49
F
F
F
X
F
X
X
X
X
V
F
X
F
F
F
F
F
F
F
F
F
4000h
2F00h
4000h
0h
Reserved
Capabilities
50
Capabilities
51-52
53
Obsolete
0007h
3FFFh
0010h
003Fh
00FBFC10h
0110h
varies
0h
Words 88 and 70:64 valid
54
Obsolete - Number of logical cylinders (16,383)
Obsolete - Number of logical heads (16)
Obsolete - Number of logical sectors per logical track (63)
Obsolete
55
56
57-58
59
Number of sectors transferred per interrupt on multiple commands
Total number of user-addressable sectors
Obsolete
60-61
62
63
0007h
0003h
0078h
0078h
0078h
0078h
4000h
0h
Multi-word DMA modes supported/selected
PIO modes supported
64
65
Minimum multiword DMA transfer cycle time per word
Manufacturer’s recommended multiword DMA transfer cycle time
Minimum PIO transfer cycle time without flow control
Minimum PIO transfer cycle time with IORDY flow control
Additional Supported
66
67
68
69
70
Reserved
71-74
0h
Reserved for IDENTIFY PACKET DEVICE command
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Table 17.
Returned Sector Data (Continued)
F = Fixed
V = Variable
X = Both
Word
Default Value
Description
75
76
77
78
79
80
81
82
83
84
85
86
87
88
89
90
91
92
F
F
F
F
V
F
F
F
F
F
V
V
V
V
F
F
V
V
001Fh
470Eh
0006h
004Ch
0040h
03FCh
0110h
746Bh
7469h
6163h
7469h
B449h
6163h
407Fh
0002h
0001h
00FEh
FFFEh
Queue depth
Serial ATA capabilities
Reserved for future Serial ATA definition
Serial ATA features supported
Serial ATA features enabled
Major version number
Minor version number
Command set supported
Command sets supported
Command set/feature supported extension
Command set/feature enabled
Command set/feature enabled
Command set/feature default
Ultra DMA Modes
Time required for security erase unit completion
Time required for enhanced security erase completion
Current advanced power management value
Master Password Revision Code
Hardware reset result: the contents of bits (12:0) of this word shall
change only during the execution of a hardware reset
93
F
0h
94
95
V
F
V
V
F
V
V
F
F
F
F
F
V
F
F
F
F
F
V
X
0h
0h
Vendor’s recommended and actual acoustic management value
Stream minimum request size
Streaming transfer time - DMA
Streaming access latency - DMA and PIO
Streaming performance granularity
Maximum user LBA for 48-bit address feature set
Streaming transfer time - PIO
96
0h
97
0h
98-99
100-103
104
0h
varies
0h
105
0001h
4000h
0h
Reserved
106
Physical sector size / logical sector size
Inter-seek delay for ISO-7779 acoustic testing in microseconds
Unique ID
107
108-111
112-115
116
varies
0h
Reserved for world wide name extension to 128 bits
Reserved for technical report
0h
117-118
119
0h
Words per logical sector
401Ch
401Ch
0h
Supported settings
120
Command set/feature enabled/supported
Reserved
121-126
127
0h
Removable Media Status Notification feature set support
Security status
128
0021h
varies
129-159
Vendor-specific
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Table 17.
Returned Sector Data (Continued)
F = Fixed
V = Variable
X = Both
Word
Default Value
Description
160
161-168
169
F
X
X
F
0h
0h
CompactFlash Association (CFA) power mode 1
Reserved for assignment by the CFA
Data set management Trim attribute support
Additional Product Identifier
Reserved
0001h
0h
170-173
174-175
176-205
206
F
0h
V
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
0h
Current media serial number
SCT Command Transport
0021h
0h
207-208
209
Reserved
4000h
0h
Alignment of logical blocks within a physical block
Write-Read-Verify Sector Count Mode 3 (DWord)
Write-Read-Verify Sector Count Mode 2 (DWord)
NV Cache Capabilities
210-211
212-213
214
00000100h
0h
215-216
217
0h
NV Cache Size in Logical Blocks (DWord)
Nominal media rotation rate
Reserved
0001h
0h
218
219
0h
NV Cache Options
220
0h
Write-Read-Verify feature set
Reserved
221
0h
222
103Fh
0h
Transport major version number
Transport minor version number
Reserved
223
224-229
230-233
0h
0h
Extended Number of User Addressable Sectors (QWord)
Minimum number of 512-byte data blocks per DOWNLOAD MICROCODE
command for mode 03h
234
235
X
X
0h
0h
Maximum number of 512-byte data blocks per DOWNLOAD MICROCODE
command for mode 03h
236-254
255
X
X
0h
Reserved
varies
Integrity word
Notes: F = Fixed. The content of the word is fixed and does not change. For removable media devices, these values may change
when media is removed or changed.
V = Variable. The state of at least one bit in a word is variable and may change depending on the state of the device or
the commands executed by the device.
X = F or V. The content of the word may be fixed or variable.
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