Tektronix Stereo System CSA8000B User Manual

User Manual  
CSA8000B Communications Signal Analyzer  
TDS8000B Digital Sampling Oscilloscope  
071-1099-03  
This document applies to firmware version 2.0  
and above.  
www.tektronix.com  
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WARRANTY  
Tektronix warrants that the products that it manufactures and sells will be free from defects in materials and  
workmanship for a period of one (1) year from the date of shipment. If this product proves defective during its  
warranty period, Tektronix, at its option, will either repair the defective product without charge for parts and labor,  
or provide a replacement in exchange for the defective product.  
This warranty applies only to products returned to the designated Tektronix depot or the Tektronix authorized  
representative from which the product was originally purchased. For products returned to other locations,  
Customer will be assessed an applicable service charge. The preceding limitation shall not apply within the  
European Economic Area, where products may be returned for warranty service to the nearest designated service  
depot regardless of the place of purchase.  
In order to obtain service under this warranty, Customer must provide the applicable office of Tektronix or its  
authorized representative with notice of the defect before the expiration of the warranty period and make suitable  
arrangements for the performance of service. Customer shall be responsible for packaging and shipping the  
defective product to the service center designated by Tektronix or its representative, with shipping charges  
prepaid. Tektronix or its representative shall pay for the return of the product to Customer. Customer shall be  
responsible for paying any associated taxes or duties.  
This warranty shall not apply to any defect, failure or damage caused by improper use or improper or inadequate  
maintenance and care. Tektronix shall not be obligated to furnish service under this warranty:  
a) to repair damage resulting from attempts by personnel other than Tektronix representatives to install, repair or  
service the product;  
b) to repair damage resulting from improper use or connection to incompatible equipment;  
c) to repair any damage or malfunction caused by the use of non-Tektronix supplies or consumables;  
d) to repair a product that has been modified or integrated with other products when the effect of such  
modification or integration increases the time or difficulty of servicing the product; or  
e) to repair damage or malfunction resulting from failure to perform user maintenance and cleaning at the  
frequency and as prescribed in the user manual (if applicable).  
THE ABOVE WARRANTIES ARE GIVEN BY TEKTRONIX WITH RESPECT TO THIS PRODUCT IN LIEU OF  
ANY OTHER WARRANTIES, EXPRESS OR IMPLIED. TEKTRONIX AND ITS VENDORS DISCLAIM ANY  
IMPLIED WARRANTIES OF MERCHANTABILITY OR FITNESS FOR A PARTICULAR PURPOSE. TEKTRONIX’  
RESPONSIBILITY TO REPAIR OR REPLACE DEFECTIVE PRODUCTS IS THE SOLE AND EXCLUSIVE  
REMEDY PROVIDED TO THE CUSTOMER FOR BREACH OF THIS WARRANTY. TEKTRONIX AND ITS  
VENDORS WILL NOT BE LIABLE FOR ANY INDIRECT, SPECIAL, INCIDENTAL, OR CONSEQUENTIAL  
DAMAGES IRRESPECTIVE OF WHETHER TEKTRONIX OR THE VENDOR HAS ADVANCE NOTICE OF THE  
POSSIBILITY OF SUCH DAMAGES.  
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Table of Contents  
General Safety Summary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
ix  
Preface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
About This Manual . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Related Manuals and Online Documents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Conventions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Contacting Tektronix . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
xi  
xi  
xii  
xii  
xiii  
Getting Started  
Product Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Models . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Key Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Product Software . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Firmware Upgrade . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Sampling Modules Supported . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
1--1  
1-1  
1-1  
1-3  
1-4  
1-4  
Check the Package Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
1--7  
Installation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Check the Environmental Requirements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Install the Sampling Modules . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Connect the Peripherals . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Power On the Instrument . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Powering Off the Instrument . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Brightness and Contrast Adjustment (Gamma) . . . . . . . . . . . . . . . . . . . . . . . . .  
Back Up User Files . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Software Installation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Software Release Notes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Operating System Reinstallation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
System Diagnostics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Windows Safe Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
1--9  
1-9  
1-10  
1-12  
1-13  
1-15  
1-15  
1-15  
1-15  
1-16  
1-16  
1-16  
1-16  
1-16  
Incoming Inspection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Assemble Equipment . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Perform the Diagnostics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Perform the Compensation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Perform the Functional Tests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Perform the Hardware and Operating System Tests (Windows 98 Only) . . . . .  
1--17  
1-17  
1-18  
1-20  
1-21  
1-38  
Accessories and Options . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Accessories . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Standard . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Optional . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Options . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
1--41  
1-41  
1-41  
1-42  
1-43  
i
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Table of Contents  
Operating Basics  
Operational Maps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Documentation Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
2--1  
2--2  
System Overview Maps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Functional Model Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Process Overview Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
2--4  
2-4  
2-6  
User Interface Map -- Complete Control and Display . . . . . . . . . . . .  
Front Panel Map -- Quick Access to Most Often Used Features . . . .  
Display Map -- Single Graticule View . . . . . . . . . . . . . . . . . . . . . . . . .  
Display Map -- Multiple Views . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Front Panel I/O Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Rear Panel I/O Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
2--7  
2--8  
2--9  
2--10  
2--11  
2--12  
Reference  
Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
3--1  
Acquiring Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Signal Connection and Scaling . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Why Use? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
What’s Special? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
What’s Excluded? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Keys to Using . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
To Set Up the Signal Input . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
To Autoset the Instrument . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
To Reset the Instrument . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Signal Conditioning Background . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Setting Acquisition Controls . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Why Use? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
What’s Special? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
What’s Excluded? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Keys to Using . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
To Set Acquisition Modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
To Start and Stop Acquisition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Acquisition Control Background . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Acquisition Hardware . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Sampling Process . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Sampling Modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Waveform Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Acquisition Cycle . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
FrameScan Acquisitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Why Use? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
What’s Special? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
What’s Excluded? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Keys to Using . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
To Acquire in FrameScan Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
To Catch a Bit Error . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
3--3  
3-4  
3-4  
3-5  
3-5  
3-5  
3-8  
3-11  
3-13  
3-13  
3-21  
3-21  
3-21  
3-22  
3-22  
3-24  
3-26  
3-27  
3-27  
3-27  
3-28  
3-28  
3-29  
3-30  
3-30  
3-30  
3-31  
3-31  
3-33  
3-36  
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Table of Contents  
Triggering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
3--39  
3-39  
3-39  
3-39  
3-40  
3-48  
3-50  
Edge Triggering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Why Use? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Whats Special? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Keys to Using . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
To Trigger . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
To Use Gated Trigger . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Displaying Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Using the Waveform Display . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Why Use? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Whats Special? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Whats Excluded? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Keys to Using . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
To Display Waveforms in the Main Time Base View . . . . . . . . . . . . . . . .  
To Display Waveforms in a Mag View . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Customizing the Display . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Why Use? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Whats Special? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Keys to Using . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
To Set Display Styles . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
To Customize the Graticule and Waveforms . . . . . . . . . . . . . . . . . . . . . . .  
3--53  
3-53  
3-55  
3-55  
3-55  
3-56  
3-62  
3-64  
3-66  
3-66  
3-66  
3-66  
3-68  
3-69  
Measuring Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Taking Automatic Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Why Use? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Whats Measured? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Whats Special? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Whats Excluded? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Keys to Using . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
To Take Automatic Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
To Localize a Measurement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Taking Cursor Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Why Use? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Whats Measured? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
What Sources Can I Measure? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Keys to Using Cursors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
To Take a Cursor Measurement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
To Set the Cursor Sources . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Optimizing Measurement Accuracy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Why Use? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Compensation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
To Compensate the Instrument and Modules . . . . . . . . . . . . . . . . . . . . . . .  
To Perform Dark-Level and User Wavelength Gain Compensations . . . . .  
3--73  
3-74  
3-74  
3-74  
3-74  
3-76  
3-76  
3-80  
3-83  
3-85  
3-85  
3-85  
3-86  
3-86  
3-89  
3-90  
3-92  
3-92  
3-92  
3-92  
3-98  
Creating Math Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3--101  
Defining Math Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Why Use? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Whats Special? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Whats Excluded? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Keys to Using . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
To Define a Math Waveform . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
3-101  
3-102  
3-102  
3-102  
3-103  
3-105  
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Table of Contents  
Operations on Math Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Why Use? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Whats Excluded? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Keys to Using . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
To Use Math Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
3-107  
3-107  
3-107  
3-108  
3-109  
Data Input and Output . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3--113  
Saving and Recalling Setups . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Why Use? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Whats Special? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Whats Excluded? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Keys to Using . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
To Save Your Setup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
To Recall Your Setup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Saving and Recalling Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Why Use? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Whats Special? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Whats Excluded? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
To Save Your Waveform . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
To Recall Your Waveform . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
To Clear References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Exporting Waveforms and Histograms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Why Use? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Keys to Using . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
To Export Your Waveform . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
To Export Your Histogram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
To Use an Exported Waveform (or Histogram) . . . . . . . . . . . . . . . . . . . . .  
Printing Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Remote Communication . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
3-113  
3-113  
3-114  
3-114  
3-114  
3-115  
3-118  
3-120  
3-120  
3-120  
3-120  
3-121  
3-124  
3-127  
3-128  
3-128  
3-128  
3-128  
3-129  
3-129  
3-132  
3-139  
Using Masks, Histograms, and Waveform Databases . . . . . . . . . . . . 3--141  
Mask Testing Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Why Use? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Whats Special? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Whats Excluded? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Keys to Using . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
To Mask Test a Waveform . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
To Edit a Mask . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Counting Masks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
To Create a New Mask . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Taking Histograms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Why Use? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Whats Special? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Whats Excluded? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Keys to Using Histograms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
To Take a Histogram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Histogram Statistics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
3-141  
3-141  
3-141  
3-142  
3-142  
3-145  
3-149  
3-151  
3-152  
3-154  
3-154  
3-154  
3-155  
3-155  
3-156  
3-158  
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Table of Contents  
Using Waveform Databases . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
3-159  
3-159  
3-159  
3-159  
3-160  
3-162  
3-164  
Why Use? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Whats Special? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Whats Excluded? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Keys to Using . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
To Set Up a Waveform Database . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
To Customize the Database Display . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Accessing Online Help . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3--167  
Whats Available? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Why Use? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Keys to Using . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
How to Use Online Help . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
3-167  
3-167  
3-167  
3-168  
Cleaning the Instrument . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3--175  
Exterior Cleaning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Flat Panel Display Cleaning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Optical Connector Cleaning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
3-175  
3-176  
3-176  
Appendices  
Appendix A: Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Certifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
A--1  
A-11  
Appendix B: Automatic Measurements Reference . . . . . . . . . . . . . .  
Pulse Measurements - Amplitude . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Pulse Measurements - Timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Pulse Measurement - Area . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Return-to-Zero (RZ) Measurements - Amplitude . . . . . . . . . . . . . . . . . . . . . . .  
Return-to-Zero (RZ) Measurements - Timing . . . . . . . . . . . . . . . . . . . . . . . . . .  
Return-to-Zero (RZ) Measurements - Area . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Non-Return-to-Zero (NRZ) Measurements - Amplitude . . . . . . . . . . . . . . . . .  
Non-Return-to-Zero (NRZ) Measurements - Timing . . . . . . . . . . . . . . . . . . . .  
Non-Return-to-Zero (NRZ) Measurements - Area . . . . . . . . . . . . . . . . . . . . . .  
B--1  
B-2  
B-8  
B-14  
B-15  
B-29  
B-36  
B-37  
B-50  
B-55  
Measurement Reference Parameters and Methods . . . . . . . . . . . . . .  
All Sources . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Pulse Sources . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
RZ Sources . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
NRZ Sources . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Tracking Methods . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Mid-reference Level . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
To Optimize the Vertical Resolution . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Use a Waveform Database . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
B--56  
B-56  
B-57  
B-60  
B-62  
B-68  
B-69  
B-69  
B-70  
Glossary  
Index  
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Table of Contents  
List of Figures  
Figure 1--1: Compartments for sampling modules . . . . . . . . . . . . . . .  
Figure 1--2: Maximum inputs in three configurations . . . . . . . . . . . .  
Figure 1--3: Locations of peripheral connectors on rear panel . . . . .  
1--11  
1--11  
1--12  
Figure 1--4: Line fuse and power cord connector locations,  
rear panel . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
1--13  
1--14  
1--20  
1--23  
1--23  
1--26  
1--27  
1--28  
1--29  
1--30  
1--31  
1--32  
1--33  
1--34  
1--35  
1--36  
1--37  
Figure 1--5: On/Standby switch location . . . . . . . . . . . . . . . . . . . . . . .  
Figure 1--6: Compensation dialog box . . . . . . . . . . . . . . . . . . . . . . . . .  
Figure 1--7: Hookup for electrical functional tests . . . . . . . . . . . . . . .  
Figure 1--8: Channel button location . . . . . . . . . . . . . . . . . . . . . . . . . .  
Figure 1--9: Channel button location . . . . . . . . . . . . . . . . . . . . . . . . . .  
Figure 1--10: Optical channel verification . . . . . . . . . . . . . . . . . . . . . .  
Figure 1--11: Hookup for the time base tests . . . . . . . . . . . . . . . . . . . .  
Figure 1--12: Channel button location . . . . . . . . . . . . . . . . . . . . . . . . .  
Figure 1--13: Main time base verification . . . . . . . . . . . . . . . . . . . . . .  
Figure 1--14: Mag time base verification . . . . . . . . . . . . . . . . . . . . . . .  
Figure 1--15: Channel button location . . . . . . . . . . . . . . . . . . . . . . . . .  
Figure 1--16: Hookup for the gated trigger tests . . . . . . . . . . . . . . . . .  
Figure 1--17: Signal triggered . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Figure 1--18: Signal not triggered (signal frozen) . . . . . . . . . . . . . . . .  
Figure 1--19: Signal not triggered (no signal) . . . . . . . . . . . . . . . . . . .  
Figure 1--20: Signal triggered . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Figure 3--1: Acquisition and display controls . . . . . . . . . . . . . . . . . . .  
Figure 3--2: Setting vertical scale and position of input channels . . .  
3--4  
3--15  
Figure 3--3: Varying offset positions vertical acquisition  
window on waveform amplitude . . . . . . . . . . . . . . . . . . . . . . . . . .  
3--17  
3--18  
Figure 3--4: Horizontal acquisition window definition . . . . . . . . . . .  
Figure 3--5: Common trigger, record length, and acquisition  
rate for all channels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
3--20  
3--23  
3--27  
3--28  
3--29  
Figure 3--6: Aliasing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Figure 3--7: Channel configuration . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Figure 3--8: Digital acquisition — sampling and digitizing . . . . . . . .  
Figure 3--9: The waveform record and its defining parameters . . . .  
Figure 3--10: How FrameScan acquisition works (scanning on  
a 127-bit PRBS shown) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
3--32  
3--41  
Figure 3--11: Slope and level define the trigger event . . . . . . . . . . . . .  
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Figure 3--12: Triggered versus untriggered displays . . . . . . . . . . . . .  
3--41  
3--42  
3--46  
3--47  
3--54  
Figure 3--13: Trigger inputs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Figure 3--14: Holdoff adjustment can prevent false triggers . . . . . . .  
Figure 3--15: Trigger to End Of Record Time (EORT) . . . . . . . . . . .  
Figure 3--16: Display elements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Figure 3--17: Horizontal position includes time to Horizontal  
Reference . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
3--59  
3--73  
3--75  
3--78  
3--79  
3--86  
Figure 3--18: Graticule, cursor and automatic measurements . . . . .  
Figure 3--19: Measurement annotations on a waveform . . . . . . . . . .  
Figure 3--20: High/Low tracking methods . . . . . . . . . . . . . . . . . . . . . .  
Figure 3--21: Reference-level calculation methods . . . . . . . . . . . . . . .  
Figure 3--22: Horizontal cursors measure amplitudes . . . . . . . . . . . .  
Figure 3--23: Components determining Time cursor readout  
values . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
3--88  
Figure 3--24: Functional transformation of an acquired  
waveform . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3--101  
Figure 3--25: Export dialog box . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3--129  
Figure 3--26: Creating a user mask . . . . . . . . . . . . . . . . . . . . . . . . . . . 3--144  
Figure 3--27: Adding a new vertex . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3--144  
Figure 3--28: Vertical histogram view and statistics on data . . . . . . . 3--154  
Figure 3--29: Normal vector view of a waveform . . . . . . . . . . . . . . . . 3--163  
Figure 3--30: Waveform database view of a waveform . . . . . . . . . . . . 3--163  
Figure B--1: Reference-level calculation methods . . . . . . . . . . . . . . . .  
Figure B--2: Pulse-reference levels . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Figure B--3: Pulse crossings and mid-reference level . . . . . . . . . . . . .  
Figure B--4: AOP pulse crossings and mid-reference level . . . . . . . .  
Figure B--5: Overshoot levels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Figure B--6: RZ measurement reference levels . . . . . . . . . . . . . . . . . .  
Figure B--7: RZ crossings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Figure B--8: RZ eye--aperture parameters . . . . . . . . . . . . . . . . . . . . . .  
Figure B--9: NRZ measurement reference levels . . . . . . . . . . . . . . . . .  
Figure B--10: NRZ crossings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Figure B--11: NRZ eye-aperture parameters . . . . . . . . . . . . . . . . . . . .  
Figure B--12: NRZ overshoot levels . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Figure B--13: NRZ Crossings (OMA) . . . . . . . . . . . . . . . . . . . . . . . . . .  
B--56  
B--57  
B--58  
B--59  
B--59  
B--60  
B--61  
B--62  
B--63  
B--64  
B--65  
B--66  
B--67  
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Table of Contents  
List of Tables  
Table 1--1: Additional accessory connection information . . . . . . . . .  
Table 1--2: Line fuses . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Table 1--3: Standard accessories . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Table 1--4: Optional accessories . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
1--13  
1--13  
1--41  
1--42  
Table 3--1: Application-based triggering . . . . . . . . . . . . . . . . . . . . . .  
Table 3--2: Defining and displaying waveforms . . . . . . . . . . . . . . . . .  
3--43  
3--56  
Table 3--3: Operations performed based on the selected  
waveform . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
3--57  
3--61  
3--66  
3--85  
3--88  
Table 3--4: Equivalent mouse and touchscreen operations . . . . . . . .  
Table 3--5: Customizable display attributes . . . . . . . . . . . . . . . . . . . .  
Table 3--6: Cursor functions (types) . . . . . . . . . . . . . . . . . . . . . . . . . .  
Table 3--7: Cursor units . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Table 3--8: Math expressions and the math waveforms produced . . 3--103  
Table 3--9: Standard masks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3--142  
Table 3--10: Histogram statistics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3--158  
Table A--1: System -- Signal acquisition . . . . . . . . . . . . . . . . . . . . . . .  
Table A--2: System -- Timebase . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
T a b l e A -- 3 : S y s t e m -- T r i g g e r . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Table A--4: System -- Environmental . . . . . . . . . . . . . . . . . . . . . . . . . .  
Table A--5: Power consumption and cooling . . . . . . . . . . . . . . . . . . .  
T a b l e A -- 6 : D i s p l a y . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
T a b l e A -- 7 : P o r t s . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Table A--8: Data storage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Table A--9: Mechanical . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
Table A--10: Certifications and compliances . . . . . . . . . . . . . . . . . . .  
A--1  
A--2  
A -- 3  
A--6  
A--7  
A -- 7  
A -- 8  
A--9  
A--10  
A--11  
Table B--1: Pulse Measurements Amplitude . . . . . . . . . . . . . . . . .  
Table B--2: Pulse Measurements -- Timing . . . . . . . . . . . . . . . . . . . . .  
Table B--3: Pulse Measurements -- Area . . . . . . . . . . . . . . . . . . . . . . .  
Table B--4: RZ Measurements -- Amplitude . . . . . . . . . . . . . . . . . . . .  
Table B--5: RZ Measurements -- Timing . . . . . . . . . . . . . . . . . . . . . . .  
Table B--6: RZ Measurements --Area . . . . . . . . . . . . . . . . . . . . . . . . .  
Table B--7: NRZ Measurements -- Amplitude . . . . . . . . . . . . . . . . . .  
Table B--8: NRZ Measurements -- Timing . . . . . . . . . . . . . . . . . . . . .  
Table B--9: NRZ Measurements -- Area . . . . . . . . . . . . . . . . . . . . . . .  
B--2  
B--8  
B--14  
B--15  
B--29  
B--36  
B--37  
B--50  
B--55  
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General Safety Summary  
Review the following safety precautions to avoid injury and prevent damage to  
this product or any products connected to it. To avoid potential hazards, use this  
product only as specified.  
Only qualified personnel should perform service procedures.  
While using this product, you may need to access other parts of the system. Read  
the General Safety Summary in other system manuals for warnings and cautions  
related to operating the system.  
To Avoid Fire or  
Personal Injury  
Use Proper Power Cord. Use only the power cord specified for this product and  
certified for the country of use.  
Connect and Disconnect Properly. Do not connect or disconnect probes or test  
leads while they are connected to a voltage source.  
Ground the Product. This product is grounded through the grounding conductor  
of the power cord. To avoid electric shock, the grounding conductor must be  
connected to earth ground. Before making connections to the input or output  
terminals of the product, ensure that the product is properly grounded.  
Observe All Terminal Ratings. To avoid fire or shock hazard, observe all ratings  
and markings on the product. Consult the product manual for further ratings  
information before making connections to the product.  
Do not apply a potential to any terminal, including the common terminal, that  
exceeds the maximum rating of that terminal.  
Do Not Operate Without Covers. Do not operate this product with covers or panels  
removed.  
Use Proper Fuse. Use only the fuse type and rating specified for this product.  
Avoid Exposed Circuitry. Do not touch exposed connections and components  
when power is present.  
Wear Eye Protection. Wear eye protection if exposure to high-intensity rays or  
laser radiation exists.  
Do Not Operate With Suspected Failures. If you suspect there is damage to this  
product, have it inspected by qualified service personnel.  
Do Not Operate in Wet/Damp Conditions.  
Do Not Operate in an Explosive Atmosphere.  
Keep Product Surfaces Clean and Dry.  
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General Safety Summary  
Provide Proper Ventilation. Refer to the manual’s installation instructions for  
details on installing the product so it has proper ventilation.  
Symbols and Terms  
Terms in this Manual. These terms may appear in this manual:  
WARNING. Warning statements identify conditions or practices that could result  
in injury or loss of life.  
CAUTION. Caution statements identify conditions or practices that could result in  
damage to this product or other property.  
Terms on the Product. These terms may appear on the product:  
DANGER indicates an injury hazard immediately accessible as you read the  
marking.  
WARNING indicates an injury hazard not immediately accessible as you read the  
marking.  
CAUTION indicates a hazard to property including the product.  
Symbols on the Product. The following symbols may appear on the product:  
Protective Ground  
(Earth) Terminal  
CAUTION  
Refer to Manual  
WARNING  
High Voltage  
Mains Connected  
ON (Power)  
Mains Disconnected  
OFF (Power)  
Standby  
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Preface  
This is the user manual for the CSA8000B Communications Signal Analyzer and  
TDS8000B Digital Sampling Oscilloscope. It covers the following information:  
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Describes the capabilities of the instrument: how to install it and reinstall its  
software  
Explains how to operate the instrument: how to control acquisition of,  
processing of, and input/output of information  
Lists the specifications and accessories of the instrument  
About This Manual  
This manual is composed of the following chapters:  
H
Getting Started shows you how to configure and install your instrument and  
provides an incoming inspection procedure.  
H
Operating Basics uses maps to describe the various interfaces for controlling  
the instrument, including the front panel and the software user interface.  
These maps provide overviews of the product and its functions from several  
viewpoints.  
H
Reference comprises an encyclopedia of topics (see Overview on page 3--1)  
that describe the instrument interface and features, and that give background  
and basic information on how to use them. (The online help onboard the  
instrument application describes the interface, features, and their usage in  
more detail; detailed descriptions of all programming commands are found  
in the online CSA8000 & TDS8000 Programmer Guide manual.)  
H
Appendices provides additional information including the specifications and  
automatic measurement definitions.  
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Preface  
Related Manuals and Online Documents  
This manual is part of a document set of standard-accessory manuals and online  
documentation; this manual mainly focuses on installation and background  
needed to use the product features. See the following list for other documents  
supporting instrument operation and service. (Manual part numbers are listed in  
Table 1--3 on page 1--41.)  
Manual name  
Description  
CSA8000 & TDS8000 Online Help  
An online help system, integrated with the User Interface application that ships with this  
product.  
CSA8000B & TDS8000B References  
A quick reference to major features of the instrument and how they operate.  
CSA8000 & TDS8000 Programmer Guide Part of the online help system this guide comprises an alphabetical listing of the  
programming commands and other information related to controlling the instrument over  
the GPIB. This is an online document.  
Electrical Sampling Modules User Manual The user manual for the electrical sampling modules. Included as a PDF file on the  
product software CD or the PDF file can be downloaded from the Tektronix website.  
80C00 Series Optical Sampling Modules  
User Manual  
The user manual for the optical sampling modules. Included as a PDF file on the product  
software CD or the PDF file can be downloaded from the Tektronix website.  
80A01 Trigger Prescale Limiting Preamplifi- The user manual for the 80A01 Trigger Prescale Limiting Preamplifier Module. Included  
er Module User Manual  
as a standard accessory if you ordered this module with this instrument. Shipped in the  
module package, not the main instrument package.  
80A02 EOS/ESD Protection Module  
Instructions  
The instructions for the 80A02 EOS/ESD Protection Module. Included as a standard  
accessory if you ordered this module with this instrument. Shipped in the module  
package, not the main instrument package.  
CSA8000 & TDS8000 Service Manual  
Describes how to service the instrument to the module level. This optional manual must  
be ordered separately.  
For more information on how the product documentation relates to the  
instrument operating interfaces and features, see Documentation Map on  
page 2--2.  
Conventions  
This manual uses the terms vertical acquisition window and horizontal acquisi-  
tion window throughout this section and elsewhere. These terms refer to the  
vertical and horizontal range of the acquisition window, which defines the  
segment of the input signal that the acquisition system acquires.  
The terms do not refer to any operating system windows that you might display  
on screen.  
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Preface  
Contacting Tektronix  
Phone  
1-800-833-9200*  
Address  
Tektronix, Inc.  
Department or name (if known)  
14200 SW Karl Braun Drive  
P.O. Box 500  
Beaverton, OR 97077  
USA  
Web site  
www.tektronix.com  
Sales support  
Service support  
Technical support  
1-800-833-9200, select option 1*  
1-800-833-9200, select option 2*  
Email: techsupport@tektronix.com  
1-800-833-9200, select option 3*  
6:00 a.m. - 5:00 p.m. Pacific time  
*
This phone number is toll free in North America. After office hours, please leave a  
voice mail message.  
Outside North America, contact a Tektronix sales office or distributor; see the  
Tektronix web site for a list of offices.  
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Preface  
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Product Description  
This chapter describes your instrument, which is either the CSA8000B Commu-  
nications Signal Analyzer or the TDS8000B Digital Sampling Oscilloscope, and  
its options. Following this description are four sections:  
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Check the Package Contents, on page 1--7, shows you how to verify that you  
have received all of the parts of your instrument.  
H
Installation, on page 1--9, shows you how to configure and install the  
instrument, as well as how to reinstall the system software included with the  
product.  
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Incoming Inspection, on page 1--17, provides a procedure for verifying basic  
operation and functionality.  
Accessories and Options, on page 1--41, lists the instrument options  
available and the standard and optional accessories for this product.  
Models  
This manual supports two very similar instruments:  
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The CSA8000B Communications Signal Analyzer.  
The TDS8000B Digital Sampling Oscilloscope.  
Differences between the two instruments will be called out when necessary;  
otherwise, the material applies to both instruments. The word instrumentrefers  
to either product.  
Key Features  
The instrument is a high-speed, precision sampling system that finds use in  
validation and conformance testing and impedance verification for:  
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high-performance semiconductor/computer applications, such as semicon-  
ductor testing, TDR characterization of circuit boards, IC packages and  
cables, and high-speed serial digital data communications.  
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high-performance communications applications, such as design evaluation  
and manufacturing test of datacom and telecom components, transceiver  
subassemblies, and transmission systems.  
The instrument includes a user interface that runs on the Microsoft Windows  
operating system as a windowed application. You operate the instrument using  
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Product Description  
front-panel controls with the mouse and keyboard or with the touch screen. The  
installed Windows operating system (MS Windows 98 or MS Windows 2000) is  
dependent on the purchase date or product upgrade status.  
Key features include:  
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industry-leading waveform acquisition and measurement rate, with Sample,  
Envelope, and Average acquisition modes.  
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support for up to six sampling modules (two large and four small modules)  
for a maximum configuration of ten inputs. (Up to eight inputs can be active  
at a time. See Maximum Configuration on page 1--11).  
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supports integrated optical signal pick-off and clock recovery enabling  
accurate triggering on optical communication-signals.  
support for optical modules with several integrated, selectable reference  
receivers, which eliminates the need for a multitude of add-on reference  
receivers.  
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full programmability, with an extensive GPIB-command set and a message-  
based interface.  
true differential TDR, with fast step (35 psec reflected risetime) when used  
with a TDR-capable sampling module.  
industry-leading trigger bandwidth (12+ GHz) when using the built-in-  
prescaler.  
support of both telecom (SONET and SDH) and datacom (Fibre Channel,  
Infiniband, and Gigabit Ethernet) optical communication standards.  
powerful built-in measurement capability, including histograms, mask  
testing, and automatic measurements.  
automatic measurements operate on Pulses, RZ eye patterns, and NRZ eye  
patterns.  
DC to 65 GHz optical bandwidth; DC to 65 GHz electrical bandwidth, with  
up to 12.5 GHz triggering.  
NOTE. Bandwidth is determined by the specific modules that are installed.  
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FrameScan acquisition for isolating data-dependent failures during confor-  
mance/performance testing and for examining very low-level repetitive  
signals.  
support for optical conformance testing of SONET/SDH signals (including  
the various forward error correction rates for these telecom rates) from  
155 Mbps to 43 Gb/s, 1 and 10 Gb/s FibreChannel signals, 10.52 Gb/s  
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FibreChannel signals, and 1, 2, and 10 Gigabit FibreChannel signals as well  
as 2.5 Gb/s Infiniband signals.  
NOTE. Support for conformance testing rates is determined by the specific  
modules that are installed.  
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high precision time base with two modes of operation, locked and short-term  
jitter-optimized  
negligible long-term jitter degradation (<0.1 ppm), which substantially  
improves the ability to view signals that are delayed far from the trigger  
point without distortion.  
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improved short-term and long-term trigger jitter.  
a gated trigger option (Option GT) that lets you disable or enable (gate)  
triggering based on a TTL signal you connect to the instrument rear panel.  
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the GT feature also allows you to use recirculating buffers as part of your test  
setup to simulate the effects of very long optical links that are typical of  
undersea cables and other long terrestrial links.  
analysis and connectivity tools enable the instrument to be controlled from a  
variety of local and remote environments and to share data with other  
commercially available analysis programs.  
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pre-defined, built-in masks in addition to the user-defined masks.  
a large 10-inch color display that supports color grading of waveform data to  
show sample density.  
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an intuitive UI (User Interface), with built-in online help displayable on  
screen.  
Product Software  
The instrument includes the following software:  
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MS Windows comes preinstalled on the instrument. MS Windows is the  
operating system on which the user-interface application of this instrument  
runs. The OS Rebuild CDs include the software needed to rebuild the  
instrument operating system if that becomes necessary.  
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The User Interface (UI) Application (product software) comes preinstalled on  
the instrument. This UI application complements the hardware controls of  
the front panel, allowing complete set up of all instrument features. The  
Product Software CD includes the UI Application for use if reinstalling the  
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Product Description  
product software becomes necessary. See Software Installation on  
page 1--15.  
New versions of the software may become available at our web site. See  
Contacting Tektronix on page xiii in Preface.  
Firmware Upgrade  
Tektronix may offer firmware upgrade kits for the instrument. Contact your  
Tektronix service representative for more information (see Contacting Tektronix  
on page xiii).  
Sampling Modules Supported  
This product can use the following optical and electrical sampling modules listed  
below. These modules, which plug into the instrument, are more fully described  
in their respective user manuals. These manuals were shipped with those  
sampling modules that were ordered with this product.  
The sampling modules listed here were available at the time this manual was  
published; see your Tektronix product catalog for current offerings.  
Optical Sampling Modules.  
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80C01 -- 622/2488/9953 Mb/s, 12.5/20 GHz optical module.  
Clock Recovery (622/2488 Mb/s) added with option CR.  
80C02 -- 9.953 Gb/s, 20/30 GHz optical module.  
Clock Recovery (9.953 Gb/s) added with option CR.  
80C03 -- 1.063/1.250/2.488/2.500 Gb/s amplified optical module.  
Clock Recovery for all rates added with option CR.  
This module has been superseded by the 80C07B.  
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80C04 -- 9.953/10.3125 Gb/s, 20/30 GHz optical module.  
Clock Recovery (9.953 Gb/s) added with option CR1.  
Clock Recovery (9.953 Gb/s and 10.66 Gb/s) added with option CR2.  
This module has been superseded by the 80C11.  
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80C05 -- 9.953 Gb/s, 20/30/40 GHz optical module for 10/40 Gb/s NRZ.  
This module has been superseded by the 80C10.  
80C06 -- 55 GHz optical module for 40 Gb/s RZ and NRZ telecom.  
This module has been superseded by the 80C10.  
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Product Description  
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80C07 -- 155/622/2488 Mb/s amplified optical module.  
Clock Recovery for all rates added with option CR1.  
This module has been superseded by the 80C07B.  
80C07B -- 155/622/1063/1250/2125/2488/2500 Mb/s amplified optical  
module. (The module is limited to five receivers configured at the time of  
order.)  
Clock Recovery for all rates (plus 2666 Mb/s) added with option CR1.  
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80C08 -- 9.953/10.31 Gb/s Multi-rate amplified optical module.  
Clock Recovery (9.953 and 10.3125 Gb/s) added with option CR1.  
This module has been superseded by the 80C08C.  
80C08B -- 9.953/10.31/10.52 Gb/s Multi-rate amplified optical module.  
Clock Recovery (9.953 and 10.3125 Gb/s) added with option CR1.  
FibreChannel Clock Recovery (10.3125 and 10.51875 Gb/s) added with  
option CR2.  
This module has been superseded by the 80C08C.  
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80C08C -- 9.953/10.31/10.52/11.10 Gb/s Multi-rate amplified optical  
module.  
Clock Recovery (9.953 and 10.3125 Gb/s) added with option CR1. Clock  
Recovery (10.3125 and 10.51875 Gb/s) added with option CR2.  
Continuous-rate clock recovery added with CR4.  
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80C09 -- 9.953/10.71 Gb/s Multi-rate optical module.  
Clock Recovery (9.953 and 10.709 Gb/s) added with option CR1.  
This module has been superseded by the 80C11.  
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80C10 -- 65 GHz optical module for 40 Gb/s RZ and NRZ telecom.  
80C11 -- 9.953/10.31/10.52/10.66/10.71//11.10 Gb/s Multi-rate amplified  
optical module.  
Clock Recovery (9.953 Gb/s) added with option CR1.  
Clock Recovery (9.953 and 10.66 Gb/s) added with option CR2.  
Clock Recovery (9.953 and 10.71 Gb/s) added with option CR3.  
Continuous-rate clock recovery added with CR4.  
Electrical Sampling Modules.  
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80E01 -- A single-channel, 50 GHz sampling module  
80E02 -- A dual-channel, 12.5 GHz, 50 , sampling module with low noise  
80E03 -- A dual-channel, 20 GHz sampling module. This model provides the  
same features as 80E04, but without the TDR step generators.  
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Product Description  
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80E04 -- A dual-channel, 20 GHz TDR sampling module. The TDR step  
generator provides 35 ps reflected step risetime. Voltage polarity can be  
reversed on either step to provide true differential TDR.  
80E06 -- A single-channel, 70+ GHz sampling module. This model provides  
very high performance bandwidth for general-purpose characterization of  
high speed devices and circuits.  
Other Modules.  
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80A01 Trigger Prescale Limiting Preamplifier Module -- A single-channel  
module providing 8-14 GHz AC coupled 50 limiting preamplification. It  
increases the sensitivity of the prescale trigger input of the 8000 Series  
instruments to 200 mVpk-pk  
.
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80A02 EOS/ESD Protection Module -- A module that protects the sensitive  
input stage of instruments (such as the sampling bridge of Tektronix  
electrical TDR sampling modules) from damage due to electro-overstress  
(EOS) and electro static discharge (ESD) from the device under test (DUT).  
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Check the Package Contents  
Verify that you have received all of the parts of your instrument. You should  
verify that you have:  
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the main instrument.  
all the standard accessories for the main instrument. Standard accessories are  
listed in Table 1--3 on page 1--41.  
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the correct power cords for your geographical area.  
the OS Rebuild CDs and Product Software CD that include an installation  
copy of the software installed on the instrument and all files needed to  
rebuild your instrument operating system if necessary. Store the CDs in a  
safe location where you can easily retrieve them for maintenance purposes.  
NOTE. Keep the certificate of authenticity that accompanies the product-software  
CD.  
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the 8000 Series Demo Applications Software CD that includes an installa-  
tion copy of the software. This CD, which is a separate CD from the  
Oscilloscope software, includes the TDR Impedance Measuring application,  
which implements the TDR calibration procedures specified by the  
IPC-TM-650 test methodology, and the Fast NRZ application, which allows  
you to improve throughput for when eye-pattern mask testing.  
NOTE. New versions of the product and/or demo application software may  
become available at our web sit. See Contacting Tektronix on page xiii.  
Remember to fill out and send in the customer registration card. The registration  
card is packaged in an envelope in the shipping package.  
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Check the Package Contents  
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Installation  
This section covers installation of the instrument, addressing the following  
topics:  
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Check the Environment Requirements on page 1--9  
Install the Sampling Modules on page 1--10  
Connect the Peripherals on page 1--12  
Power On the Instrument on page 1--13  
Powering Off the Instrument on page 1--15  
Brightness and Contrast Adjustment (Gamma) on page 1--15  
Back Up User Files on page 1--15  
The basic operating software is already installed on the hard disk. If reinstalla-  
tion of software becomes necessary, see the following topic:  
H
Software Installation on page 1--15  
Check the Environmental Requirements  
Read this section before attempting any installation procedures. This section  
describes site considerations, power requirements, and ground connections for  
your instrument.  
Site Considerations  
The instrument is designed to operate on a bench or on a cart in the normal  
position (on the bottom feet). For proper cooling, at least two inches (5.1 cm) of  
clearance is recommended on the rear and sides of the instrument.  
You can also operate the instrument while it rests upright on its rear feet. If you  
operate the instrument while it is resting on the rear feet, make sure that you  
properly route any cables coming out of the rear of the instrument to avoid  
damaging them.  
CAUTION. Keep the bottom of the instrument clear of obstructions to ensure  
proper cooling.  
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Installation  
Operating Requirements  
Rackmount Requirements  
Specifications in Appendix A list the operating requirements for the instrument.  
Power source and temperature, humidity, and altitude are listed.  
If this instrument is rackmounted, see the TDS8000 & CSA8000 Rackmount  
Instructions for additional site considerations or operating requirements. This  
document ships with the Option 1R (rackmount kit).  
Install the Sampling Modules  
CAUTION. Do not install or remove any sampling modules while the instrument is  
powered on.  
Always power the instrument down before attempting to remove or insert any  
sampling module.  
CAUTION. Sampling modules are inherently vulnerable to static damage. Always  
observe static-safe procedures and cautions as outlined in your sampling module  
user manual.  
Check Your Sampling  
Module Manual(s)  
Read the appropriate sampling module user manual for instructions on how to  
install your sampling modules, and then install them as outlined. (Sampling  
modules do not ship preinstalled.)  
NOTE. After first installing a sampling module(s) or after moving a sampling  
module from one compartment to another, you should run compensation from the  
Utilities menu to ensure the instrument meets it specifications. You must run a  
compensation (accessed from the Utilities menu) whenever the extender  
configuration is changed from that present at the last compensation. In short, if  
you install or remove an 80E00 extender, run a compensation. If you exchange a  
extender for one of a different length, run a compensation. For instructions on  
running a compensation, see Optimizing Measurement Accuracy on page 3--92.  
Figure 1--1 shows compartments for both large and small sampling modules,  
along with the plug-in connector for the ESD wrist strap that you must use while  
installing or removing these modules.  
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Installation  
Large-module compartments (2)  
Small-module compartments (4)  
Connect ESD wrist strap here  
Figure 1-1: Compartments for sampling modules  
Maximum Configuration  
You can install up to two large sampling modules and four small modules for a  
total of 10 inputs. Of these 10 inputs, only eight inputs can be active at one time  
(see Figure 1--2, top two configurations). Also, note that installing a single large  
module in either compartment disables the first small-module compartment (see  
note). This configuration (see Figure 1--2, bottom configuration) limits the input  
count to sevenone from the large, six from the small compartments.  
NOTE. Power is still provided to this small slot, which does allow an 80A01 to  
be functional in this slot even when a large module is installed.  
CH 1  
CH 2  
Eight channels: Two large modules and  
three small modules  
1
N.A.  
N.A.  
CH 3  
CH 4  
CH 5  
CH 6  
CH 7  
CH 8  
N.A.  
N.A.  
Eight channels: No large and four  
small modules  
CH 1  
CH 2  
CH 3  
CH 4  
CH 5  
CH 6  
CH 7  
CH 8  
CH 1/N.A.  
CH 2/N.A.  
Seven channels: One large module,  
installed in either compartment, and  
three small modules  
N.A.  
N.A.  
CH 3  
CH 4  
CH 5  
CH 6  
CH 7  
CH 8  
1
Not Available  
Figure 1-2: Maximum inputs in three configurations  
Install probes, cables, and other connection accessories to your sampling  
modules as appropriate for your application and sampling module. Again,  
consult your sampling-module and connection-accessory manuals. Continue with  
the next section after installing the sampling modules.  
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Installation  
Connect the Peripherals  
The peripheral connections are mostly the same as those you would make on a  
personal computer. The connection points are shown in Figure 1--3. See  
Table 1--1 on page 1--13 for additional connection information.  
WARNING. Before installing peripheral accessories to connectors (mouse, keyboard,  
etc.), power down the instrument. See Powering Off the Instrument on page 1--15.  
Monitor.............  
Printer......................  
RS-232.................  
Network.............................  
1
PS2 mouse .......................  
1
PS2 keyboard ................  
USB................................  
Audio line out.......................  
Audio line in........................  
Removable hard drive.....................  
CD drive.........................  
GPIB...........  
Monitor....................  
2
Card slot ...........  
(only available with Option GT)  
Gated trigger...........  
1
2
Product ships with a USB keyboard that plugs into the USB port and a USB mouse that plugs into the back of the keyboard  
PCMCIA card readers are not available on the following products: CSA8000B SN B020338 and above, TDS8000B SN B020346 and above.  
Product software version 2.0 (or greater) does not support PCMCIA readers.  
Figure 1-3: Locations of peripheral connectors on rear panel  
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Installation  
Table 1-1: Additional accessory connection information  
Item  
Description  
Monitor  
If you use a non-standard monitor, you may need to change the  
the Windows display settings to achieve the proper resolution  
for your monitor.  
Printer  
Other  
Connect the printer to the EPP (enhanced parallel port)  
connector directly. If your printer has a DB-25 connector, use  
the adapter cable that came with your printer to connect to the  
EPP connector. For information on printer usage, see Printing  
Waveforms on page 3-126.  
Refer to the Application release notes on your System Rebuild  
CD for possible additional accessory installation information  
not covered in this manual.  
Power On the Instrument  
Follow these steps to power on the instrument for the first time.  
1. Check that the line fuses are correct for your application. Both fuses must be  
the same rating and type. Fuse types require a unique cap and fuseholder. See  
Table 1--2 and Figure 1--4.  
Table 1-2: Line fuses  
Cap & fuseholder  
part number  
200-2264-00  
200-2265-00  
Fuse type  
Rating  
Fuse part number  
0.25 x 1.250 inch  
5 x 20 mm  
8 A, fast blow, 250 V  
159-0046-00  
6.3 A, fast blow, 250 V 159-0381-00  
Power switch  
AC power  
Fuses  
Figure 1-4: Line fuse and power cord connector locations, rear panel  
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Installation  
CAUTION. Connect the keyboard, mouse, and other accessories before applying  
power to the product. Connecting the accessories after powering on the  
instrument can damage the accessories. Two exceptions are the USB keyboard  
and mouse that ships with the instrument. Both can be plugged or unplugged  
without first turning power off.  
2. Connect the keyboard and mouse, observing the caution above. Note that the  
instrument ships with a USB keyboard, which plugs into the USB port (see  
Figure 1--3 on page 1--12 for location) and a USB mouse, which plugs into  
the back of the USB keyboard.  
NOTE. Connection of the keyboard and mouse is optional. You can operate most  
features without them, using the front-panel controls and the touchscreen.  
3. Connect the power cord.  
4. If you have an external monitor, connect the power cord and power on the  
monitor.  
5. Turn the Power switch on at the rear panel. (See Figure 1--4 on page 1--13 for  
switch location.)  
6. Push the On/Standby switch to power on the instrument (see Figure 1--5 for  
the switch location).  
Switch  
Figure 1-5: On/Standby switch location  
7. Wait for the boot routine and low-level self test to complete.  
8. Follow any instructions on the screen.  
The internal setup software will automatically configure your instrument and  
install all required devices, depending on the installed accessories.  
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Installation  
Powering Off the Instrument  
The instrument has a built-in soft power-down function that safely powers down  
the instrument when you push the On/Standby button. You do not need to close  
the UI application or Windows before using the On/Standby button.  
To completely remove power to the instrument, first soft power-down the  
instrument using the On/Standby button, and then set the power switch on the  
rear panel to off.  
Brightness and Contrast Adjustment (Gamma)  
Although this instrument is set for optimal Gamma display before shipping, you  
can adjust it to suit your preferences. If you wish to do so, use the Display  
settings located in the Windows Control Panel.  
Back Up User Files  
You should back up your user files on a regular basis. Use the Windows Back Up  
tool to back up files stored on the hard disk. The Back Up tool is located in the  
System Tools folder in the Accessories folder.  
1. Minimize the UI application by clicking the minimize (--) button in the  
upper-right corner on screen.  
2. Click Start in the Task bar to pop up the Start menu.  
3. Select Programs > Accessories > System Tools > Backup in the Start menu.  
4. Use the backup tool that displays to select your back-up media and to select  
the files and folders that you want to back up. Use the Windows online help  
for information on using the Backup tool. You can back up to the floppy  
drive or to a networked storage device over the ethernet port (rear panel).  
5. You can restore the UI application to the screen by clicking its button in the  
Windows Task bar.  
Software Installation  
This section describes how to install the software found on the CSA8000 &  
TDS8000 OS Restore and Product Software CDs that accompany this product.  
The instrument ships with the product software installed, so only perform these  
procedures if reinstallation becomes necessary.  
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Installation  
Description  
There are two sets of CDs that ship with this instrument:  
H
OS Rebuild CD. This 2-disk set contains the operating system for the  
instrument. This CD set, which can be used to rebuild the instrument hard  
drive, includes the Windows operating system installation.  
H
Product Software CD. The product software, or UI application, complements  
the hardware controls of the front panel, allowing complete set up of all  
instrument features. The Product Software CD includes software allowing  
you to reinstall the product software without having to rebuild the entire  
operating system.  
Software Release Notes  
Read the software release notes README.TXT ASCII file if present on the  
Product Software CD before performing any installation procedures. This file  
contains additional installation and operation information that supercedes other  
product documentation.  
To view the README.TXT file, open the Notepad Windows accessory and open  
the file on the CD. After installation, you can also read the copy from a directory  
on the product:  
C:\Programs Files\TDSCSA8000\System  
Operating System  
Reinstallation  
If it becomes necessary to reinstall the Windows operating system, use the CDs  
and instructions provided with your Windows Operating System Rebuild kit  
(shipped with your instrument).  
This process will return the hard disk to the its original condition present when  
the instrument shipped.  
NOTE. All data and programs you may have installed will be lost when reinstal-  
ling the Windows Operating System.  
System Diagnostics  
Windows Safe Mode  
In case of instrument problems, you may wish to run the system diagnostics. If  
so, see the procedure Perform the Diagnostics, on page 1--18.  
If the instrument is turned off before the operating system boots, or if youve  
installed a third-party product with a driver incompatible with instrument start  
up, Windows will open in Safe mode. The touchscreen will be inoperable;  
therefore, you must install the standard-accessory mouse and keyboard to operate  
the instrument.  
When you have finished investigating and removed any barrier to Windows  
start-up, you can reboot. If the instrument no longer boots to Safe mode, you can  
remove the keyboard and mouse if desired.  
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Incoming Inspection  
This section contains instructions for performing an incoming inspection of this  
instrument. Performance of an incoming inspection is not required to put the  
instrument in service.  
These instructions verify that the instrument is operating correctly after  
shipment, but do not check product specifications. An incoming inspection  
includes the following parts:  
H
H
H
Perform the Diagnostics on page 1--18 runs the internal diagnostics.  
Perform a Compensation on page 1--20 runs the self compensation routine.  
Perform the Functional Tests on page 1--21 uses the DC CALIBRATION  
OUTPUT and the INTERNAL CLOCK OUTPUT connectors to verify that  
the instrument is functioning.  
H
Perform the Hardware and Operating System Tests (Windows 98 only) on  
page 1--38 uses a software program called QAPlus/Win to verify instrument  
hardware and the MS Windows 98 operating system is functioning.  
QAPlus/Win is only available on instruments using the MS Windows 98  
operating system. Instruments using the MS Windows 2000 operating  
system do not include QAPlus/Win software.  
NOTE. The procedures that follow contain instructions based on the menus and  
controls supported by the version 1.5 release and later of the instrument  
firmware. The procedures will work for earlier versions of software, but the  
control and menu names may vary slightly.  
If the instrument fails any test within this section, it may need service. To contact  
Tektronix for service, see Contacting Tektronix on page xiii of Preface.  
Make sure you have put the instrument into service as detailed in Installation  
starting on page 1--9. Then assemble the following test equipment and proceed  
with the procedures that follow.  
Assemble Equipment  
To complete the incoming inspections procedures requires the following test  
equipment:  
H
H
One SMA cable, such as Tektronix part number 174-1427-00.  
One 50 BNC cable, such as Tektronix part number 174-1341-00.  
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H
H
One SMA 10X attenuator, such as Tektronix part number 015-1003-00.  
One or more (quantity to match number of electrical channels to compen-  
sate) 50 terminators, such as Tektronix part number 015-1022-01  
H
H
One 50 terminator cap, such as Tektronix part number 011-0049-02  
One 80E00-series electrical sampling modules installed as outlined in its  
User manual.  
H
One 80C00-series optical sampling module installed as outlined in its User  
manual (optional; test only if purchased with/for your instrument).  
H
H
Mouse  
Keyboard  
Perform the Diagnostics  
The instrument Diagnostics use internal routines to confirm basic functionality  
and proper adjustment.  
None  
Equipment required  
Prerequisites  
First, all sampling modules to be diagnosed must be installed as  
outlined in their user manuals.  
Second, power on the instrument and allow a 20 minute warm-up  
before doing this procedure.  
1. Set up the instrument: From the application menu bar, select Utilities, and  
then select Diagnostics. The Diagnostics dialog box displays. See below.  
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Incoming Inspection  
2. Select a diagnostics suite:  
a. In the dialog box, click the Subsystem Level tab.  
b. Select the all the entries by clicking the first entry Control Proc and  
dragging down to select the rest. All entries should be highlighted as  
shown above.  
c. In the Run box, leave Loop and Halt on Failure unchecked.  
3. Verify that the diagnostic suite passes:  
a. Click the Run button to execute the diagnostics.  
b. The diagnostics may take several minutes to complete. Verify that Pass  
appears as Status in the dialog box when the diagnostics complete.  
c. If instead an error number appears as Status, rerun the diagnostics. If  
Fail status continues after rerunning diagnostics and you have allowed  
warm up to occur, the module or main instrument may need service.  
4. Close the diagnostic dialog box.  
End of Procedure  
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Perform the Compensation  
This procedure uses internal routines to verify that the instrument compensates  
properly.  
For sampling modules:  
Equipment required  
H
50 terminations on all electrical module channels (Tektronix  
part number 015-1022-xx).  
H
Dust covers on all optical module channels.  
The sampling modules ship from Tektronix with the proper termina-  
tions and dust covers installed.  
Prerequisites  
First, all sampling modules to be compensated must be installed as  
outlined in their user manuals.  
Second, power on the instrument and allow a 20 minute warm-up  
before doing this procedure.  
1. Run the compensation routines:  
a. From the application menu bar, select Utilities, and then select Com-  
pensation.  
In the Compensation dialog box, the main instrument (mainframe) and  
sampling modules are listed. The temperature change from the last  
compensation is also listed. See Figure 1--6.  
Click to select compensate  
Choose all as targets  
Click to start compensation  
Figure 1-6: Compensation dialog box  
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b. Wait until the Status for all items you wish to compensate changes from  
Warm Up to Pass, Fail, or Comp Reqd.  
c. Under Select Action, click the Compensate option button.  
d. From the top pulldown list, choose All (default selection) to select the  
main instrument and all its modules as targets to compensate.  
e. Click the Execute button to begin the compensation.  
f. Follow the instructions to disconnect inputs and install terminations that  
will appear on screen; be sure to follow static precautions (see the user  
manual for your sampling module) when following these instructions.  
NOTE. Failing to install the 50 terminations on electrical inputs can yield  
erroneous compensation failures or results.  
2. Verify that the compensation routines pass:  
a. The compensation may take several minutes to complete. Verify that  
Pass appears as Status for the main instrument and for all sampling  
modules listed in the Compensation dialog box when compensation  
completes.  
b. If instead Fail appears as Status, rerun the compensation. If Fail status  
continues after rerunning compensation and you have allowed warm up  
to occur, the module or main instrument may need service.  
c. If you want to save the compensation constants generated by this  
compensation, click the Save option button under Select Action. Click  
the Execute button to save the compensation.  
3. Close the compensation dialog box.  
End of Procedure  
Perform the Functional Tests  
These procedures use the DC CALIBRATION OUTPUT and the INTERNAL  
CLOCK OUTPUT connectors to further verify that the instrument functions  
properly. An SMA cable and a 10x attenuator are required to do these test  
procedures.  
The purpose of these procedures is to confirm that the instrument functions  
properly. The equipment required is intentionally kept to a minimum.  
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Incoming Inspection  
STOP. These procedures verify functions; that is, they verify that the instrument  
features operate. They do not verify that they operate within limits; therefore, do  
not interpret any quantities cited (such as “about five horizontal divisions”) as  
limits.  
STOP. DO NOT make changes to the front-panel settings that are not called out  
in the procedures. Each verification procedure will require you to set the  
instrument to default settings before verifying functions. If you make changes to  
these settings, other than those called out in the procedure, you may obtain  
invalid results. In this case, go back to step 1 and repeat the procedure.  
Verify Electrical Input  
Channels  
Install the test hookup and preset the instrument controls:  
Equipment  
required  
One SMA cable, such as Tektronix part number 174-1427-00.  
Prerequisites  
At least one electrical (80E00 series) sampling module must be  
installed as outlined in its user manual.  
1. Initialize the instrument: Push the front-panel DEFAULT SETUP button,  
and click Yes in the confirmation dialog box.  
2. Set the Trigger System: In the UI application toolbar, select Internal Clock  
from the Trig list box as shown below.  
3. Hook up the signal source: Connect the SMA cable from the DC CALIBRA-  
TION output to the channel input that you want to test as shown in  
Figure 1--7.  
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CSA8000/TDS8000  
SMA cable from DC calibration  
output to 80E00 C3 input  
Figure 1-7: Hookup for electrical functional tests  
4. Set the DC CALIBRATOR OUTPUT:  
a. Push the Vertical MENU front-panel button. This displays the Vert  
Setup dialog box.  
NOTE. When an optical module is installed, the optical setup dialog box displays  
by default. Click the Basic button to display the basic dialog box.  
b. Enter a level of 200 mV in the DC CAL box.  
c. Push the Vertical MENU front-panel button again to dismiss the Vert  
Setup dialog box.  
5. Select the channel to test: Push the channel button for the channel you want  
to test. The button lights and the channel display comes on. See Figure 1--8.  
Channel  
buttons  
Figure 1-8: Channel button location  
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6. Verify that the channel is operational: Confirm that the following statements  
are true:  
H
H
The vertical scale readout for the channel under test shows a setting of  
100 mV, and a DC level is at about 2 divisions above center screen.  
The front-panel vertical POSITION knob (for the channel you are  
testing) moves the DC level up and down the screen when rotated.  
Return the DC level to 2 divisions above center screen before continuing.  
H
Turning the vertical SCALE knob to 50 mV changes the amplitude of  
the DC level to about 4 divisions above center screen, and returning the  
knob to 100 mV returns the amplitude to about 2 divisions above center  
screen.  
7. Verify that the channel acquires in all acquisition modes: Push the  
front-panel Acquisition MENU button to display the Acq setup dialog box.  
Click each of the three acquisition modes, and confirm that the following  
statements are true:  
H
H
H
Sample mode displays an actively acquiring waveform on-screen. (Note  
that there is a small amount of noise present on the DC level).  
Average mode displays an actively acquiring waveform on-screen with  
the noise reduced.  
Envelope mode displays an actively acquiring waveform on-screen with  
the upper and lower extremes of the noise displayed.  
8. Close Acquisition setup dialog box: Push the Acquisition MENU button to  
close the Acq setup dialog box.  
9. Verify the DC accuracy compensation: Do the following substeps:  
a. Select Measurement from the Setup menu. In the Meas Setup dialog box  
that displays:  
H
Select as Source the channel under test. For example, select Main C3  
for channel 3.  
H
H
Select Meas1.  
Set the Select Meas menu to Pulse > Amplitude > Mean.  
b. Push the Vertical MENU front-panel button to switch to the Vert Setup  
dialog box.  
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c. Set the Vertical Scale, Vertical Offset, and DC Calibration Output to the  
levels shown in the first row of the table that follows.  
d. In Measurement readout on screen, verify that the Mean measurement  
for the channel under test falls within the limits given in the table.  
e. Repeat steps c and d for each row in the table.  
Vertical Scale  
(mV/div)  
Vertical Offset DC CAL Output  
Limits  
(mV)  
-1000.0  
0.0  
(mV)  
-1000.0  
-450  
0
Minimum (mV) Maximum (mV)  
100  
100  
100  
100  
100  
-1009.0  
-461.0  
- 2 . 0  
-991.0  
-439.0  
2.0  
0.0  
0.0  
450  
439.0  
991.0  
461.0  
1009.0  
1000.0  
1000.0  
10. Test all channels: Repeat steps 3 through 9 until all electrical input channels  
are verified.  
11. Remove the test hookup: Disconnect the SMA cable from the channel input  
and the DC CALIBRATION output.  
Verify Optical Input  
Channels  
After verifying the electrical channels and if you have an 80C00 Series Sampling  
Module installed, you can now verify its optical channels. This verification is  
done without an input signal.  
Equipment  
required  
None.  
Prerequisites  
At least one optical (80C00 series) sampling module must be installed  
as outlined in its user manual.  
1. Initialize the instrument: Push the front-panel DEFAULT SETUP button,  
and click Yes in the confirmation dialog box.  
2. Set the Trigger System: In the UI application toolbar, select Internal Clock  
from the Trig list box as shown below.  
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3. Select the channel to test: Push the channel button for the channel you want  
to test. The button lights amber and the channel displays. See Figure 1--9.  
Channel  
buttons  
Figure 1-9: Channel button location  
4. Verify that the channel is operational: Confirm that the following statements  
are true.  
H
A baseline trace displays at about center screen (see Figure 1--10 on page  
1--27) and the vertical scale readout for the channel under test shows a  
setting as follows:  
H
80C01, 80C02, 80C04, 80C09, and 80C11: 1 mW  
80C03: 100 W  
80C05: 3 mW  
80C06: 6 mW  
80C07, and 80C07B: 100 W  
80C08, 80C08B, and 80C08C: 200 W  
80C10: 3 mW  
H
H
Turning the front-panel Vertical POSITION knob (for the channel you  
are testing) moves the signal up and down the screen. Return the  
baseline trace to center screen before continuing.  
Turning the front-panel Vertical OFFSET knob counterclockwise offsets  
the baseline towards the bottom of the screen; turning the knob  
clockwise offsets the baseline towards the top of the screen, and  
returning the knob to 0.000 offset returns the baseline to center screen.  
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NOTE. If the position knob was set to 0.000, you can confirm this in the Vertical  
menu (use Basic button in the dialog box).  
Baseline  
Vertical offset  
Control bar  
Vertical offset  
setting  
Figure 1-10: Optical channel verification  
5. Verify that the channel acquires in all acquisition modes: Push the  
front-panel button Acquisition MENU to display the Acq Setup dialog box.  
Click each of the three acquisition modes and confirm that the following  
statements are true:  
H
H
H
Sample mode displays an actively acquiring waveform on-screen. (Note  
that there may be a small amount of noise present on the baseline level).  
Average mode displays an actively acquiring waveform on-screen with  
any noise present reduced.  
Envelope mode displays an actively acquiring waveform on-screen with  
the upper and lower extremes of the noise displayed.  
6. Close Acquisition setup dialog box: Push the Acquisition MENU button to  
close the Acq setup dialog box.  
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7. Test all channels: Repeat steps 3 through 5 until all optical input channels  
are verified.  
Verify the  
Time Bases Work  
After verifying the channels, you can now verify that the time bases function.  
This verification is done using a front-panel signal.  
Equipment  
required  
One SMA cable, such as Tektronix part number 174-1427-00.  
One 10x SMA attenuator, such as Tektronix 015-1003-00.  
One electrical (80E00-series) sampling module.  
None  
Prerequisites  
1. Initialize the instrument: Push the front-panel DEFAULT SETUP button,  
and click Yes in the confirmation dialog box.  
2. Hook up the signal source: Connect the SMA cable from the Internal Clock  
output through a 10x attenuator to the 80E00 sampling module input  
channel 3 as shown in Figure 1--11.  
CSA8000/TDS8000  
SMA cable from  
INTERNAL CLOCK  
output to 80E00 C3 input  
10x attenuator  
Figure 1-11: Hookup for the time base tests  
3. Set up the instrument:  
a. Push the Trigger MENU front-panel button to display the Trig Setup  
dialog box.  
b. Click Internal Clock under Trigger Source in the Trig Setup dialog  
box. The Internal Clock rate should be set to 200kHz.  
c. Push the Trigger MENU front-panel button again to dismiss the Trig  
Setup dialog box.  
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d. Push the channel button for the channel you connected to in step 2. See  
Figure 1--12 on page 1--29. The button lights and the channel display  
comes on.  
e. Turn the Vertical SCALE knob to set the vertical scale to 20 mV/div.  
The channel scale readout is displayed in the Control bar at the bottom  
of the graticule.  
Channel  
buttons  
Figure 1-12: Channel button location  
4. Set the time base: Set the Horizontal SCALE to 1 s/div. The horizontal  
scale readout is displayed in the Control bar at the bottom of the graticule.  
a. Set the display for Normal and Show Vectors (enable). See To Set  
Display Styles on page 3--68.  
b. Rotate vertical OFFSET knob counterclockwise so that the base of the  
square wave is about 2 divisions below the center graticule.  
NOTE. Otherwise, no vertical trace will be seen for rise and fall.  
5. Verify that the Main time base operates: Confirm the following statements  
are true:  
H
One period of the internal clock signal (a square wave) is about five  
horizontal divisions on-screen. See Figure 1--13 on page 1--30.  
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NOTE. At some temperatures, there may be extraneous data points after the first  
half cycle when viewing the front-panel Internal Clock output (as is done in this  
step). This behavior may also occur when viewing multiple cycles in TDR mode.  
In both cases, this behavior is normal.  
H
Rotating the Horizontal SCALE knob clockwise expands the waveform  
on-screen (more horizontal divisions per waveform period), counter-  
clockwise rotation contracts it, and returning the horizontal scale to  
1 s/div returns the period to about five divisions. Leave the time base  
set to 1 s/div.  
H
The horizontal POSITION knob positions the signal left and right  
on-screen when rotated.  
NOTE. The signal will not move past the minimum position setting.  
s
Internal clock  
signal  
Control bar  
Vertical scale  
setting  
Horizontal  
scale setting  
Figure 1-13: Main time base verification  
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6. Set up the Mag1 time base:  
a. Push the Horizontal View MAG1 button on the front panel. The Mag1  
time base view will display under the Main time base view.  
b. Set the Horizontal SCALE to 1 s/div. The horizontal scale readout is  
displayed in the Control bar at the bottom of the graticule and is now  
reading out the scale of the Mag1 time base view.  
7. Verify that the Mag1 time base operates: Confirm the following statements.  
H
The brackets on the Main View waveform (top graticule) are a full-  
screen width apart (10 divisions). See Figure 1--14 on page the 1--31.  
H
One period of the internal clock signal (a square wave) in the Mag view  
(bottom graticule) is about five horizontal divisions on-screen. (Matches  
the waveform in the top graticule.) See Figure 1--14.  
H
Rotating the Horizontal SCALE knob clockwise to 500 ns/div expands  
the waveform in the bottom graticule to double the period (about  
10-horizontal divisions per waveform period) and returning the  
Horizontal SCALE knob to 1 s/div returns the period to about five  
divisions. Leave the Horizontal Scale set to 1 us/div.  
Left mag time base  
marker  
Right mag time base  
marker  
Main time base view  
Mag time base view  
Figure 1-14: Mag time base verification  
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8. Verify that the Mag2 time base operates:  
a. Push the Mag1 button to remove the display of the Mag1 time base.  
b. Perform steps 6 and 7, but use the Mag2 button instead of the Mag1.  
This test verifies that the Gated Trigger (GT Option) is functional. This test is  
done using a front-panel signal and a rear-panel TTL connection.  
Perform Gated Trigger  
Test  
Equipment  
required  
One 50 BNC cable, such as Tektronix part number 174-1341-00  
One SMA cable, such as Tektronix part number 174-1427-00  
One 50 terminator cap, such as Tektronix part number 011-0049-02.  
One SMA 10X attenuator (20 dB attenuator), SMA connector, such as  
Tektronix part number 015-1003-00  
One electrical (80E00-series) sampling modules.  
Prerequisites  
This test applies only to instruments that include option GT.  
1. Initialize the instrument: Push the front-panel DEFAULT SETUP button,  
and click Yes in the confirmation dialog box.  
2. Push the channel 3 button to select it. The button lights and the channel  
display comes on. See Figure 1--15.  
Channel  
buttons  
Figure 1-15: Channel button location  
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3. Hook up the signal source: Connect the SMA cable from the Internal Clock  
output through a 10x attenuator to 80E00 sampling module input channel 3  
as shown in Figure 1--16. Connect BNC cable to External Gate input at rear  
panel.  
Rear panel  
CSA8000/TDS8000  
TRIGGER  
GATE (TTL)  
SMA cable from  
INTERNAL CLOCK  
output to 80E00 C3 input  
10x attenuator  
BNC cable attached to TRIGGER  
GATE (TTL) on the rear panel.  
Figure 1-16: Hookup for the gated trigger tests  
4. Set up the instrument:  
a. Push the Trigger MENU front-panel button to display the Trig Setup  
dialog box.  
b. Click Internal Clock under Trigger Source in the Trig Setup dialog  
box. The Internal Clock rate should be set to 200kHz.  
c. Verify that the Gated Trigger option in Enhanced Triggering section is  
selected (check box is checked). See To Use Gated Trigger, step 4 on  
page 3--51.  
d. Turn the Vertical SCALE knob to set the vertical scale to 50 mV/div.  
The channel scale readout is displayed in the Control bar at the bottom  
of the graticule.  
5. Set the time base: Set the Horizontal SCALE to 2 s/div. The horizontal  
scale readout is displayed in the Control bar at the bottom of the graticule.  
6. Set the display for Normal and Show Vectors (enable). See To Set Display  
Styles on page 3--68.  
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7. Push the Horizontal MENU button, the Mode in All Timebases must be set  
to Lock to Int. 10 MHz.  
8. Verify that Triggering occurs: Verify signal is triggered with waveform  
on-screen. See Figure 1--17 on page 1--34.  
Triggered signal indicator  
Internal  
clock  
signal  
Control  
bar  
Vertical scale  
setting  
Horizontal  
scale setting  
Figure 1-17: Signal triggered  
9. Disable trigger: Install 50 terminator cap to the end of the cable that is  
attached to the rear-panel gated trigger BNC. See Figure 1--16 on page 1--33.  
10. Verify that the Gated Trigger functions: Verify signal is not triggered (gate  
disabled). Signal freezes on the screen above to indicate triggering has  
stopped. See Figure 1--18 on page 1--35. Note the Not Trigd indication at the  
top of the window.  
a. Push the CLEAR DATA button.  
b. Verify signal is not triggered with no waveform on-screen (see Fig-  
ure 1--19 on page 1--36). Note the Not Trigd indication at the top of the  
window.  
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Untriggered signal indicator  
Control  
bar  
Vertical scale setting  
Horizontal scale setting  
Figure 1-18: Signal not triggered (signal frozen)  
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Untriggered signal indicator  
Control  
bar  
Vertical scale  
setting  
Horizontal  
scale setting  
Figure 1-19: Signal not triggered (no signal)  
11. Verify that the Gated Trigger function is enabled: Disconnect 50 Ω  
terminator cap from the end of the cable. Verify signal is triggered (gate  
enabled) with waveform on-screen. See Figure 1--20 on page 1--37.  
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Triggered signal indicator  
Internal  
clock  
signal  
Control  
bar  
Vertical scale setting  
Horizontal scale setting  
Figure 1-20: Signal triggered  
12. Disconnect the test hook up.  
End of Functional Test Procedures  
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Perform the Hardware and Operating System Tests (Windows 98 Only)  
NOTE. The procedures in this section only apply to instruments using the  
MS Windows 98 operating system. Instruments using the MS Windows 2000  
operating system do not include the QAPlus/Win software.  
These procedures verify the instrument hardware functions. A diagnostics  
program called QAPlus/Win is used to make the verifications. No equipment is  
required.  
QA+Win32 is a comprehensive software application used to check and verify the  
operation of the PC hardware in the main instrument. This procedure uses  
QA+Win32 to verify the instrument hardware. To run QA+Win32, you must  
have either a working keyboard or a working mouse or other pointing device and  
have Windows 98 running.  
QA+Win32  
CAUTION. Before running the QA+Win32 tests, be aware of the following  
problems and work-arounds.  
H
The QA+Win32 discrete memory test fails if the system being tested  
contains more than 16 megabytes of RAM.  
Since your product ships with more than 16 megabytes of RAM, please  
follow the procedure for Checking the Hardware and Operating System on  
page 1--39.  
NOTE. Do not run the memory test from the Memory icon.  
H
The QA+Win32 hard drive test may report an incorrect number of tracks and  
cylinders for your hard drive.  
This is an internal mapping problem, but has no effect on the results of the  
test. Bad sectors on your hard drive are still found and marked.  
H
The QA+Win32 keyboard test does not respond correctly to keys used by  
Windows 98.  
Keyboards made for use with Windows contain two or three keys specific to  
that operating system. These are usually located on either side of the space  
bar. QA+Win32 does not trap these keys when performing the keyboard test.  
Do not press them.  
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Checking the Cooling Fan  
Operation  
Power on the instrument and visually inspect the left side panel of the instrument  
to verify that all six cooling fans are rotating.  
Equipment  
required  
None  
Prerequisites  
The instrument must be powered on and running.  
To perform a minimal check of the hardware and Windows 98 operating system  
of this instrument, perform this procedure to run QA+Win32 diagnostics from  
the Windows 98 Start menu.  
Checking the Hardware  
and Operating System  
Equipment  
required  
None  
Prerequisites  
A mouse and keyboard must be connected to the instrument and it  
must be powered on.  
1. Push the RUN/STOP front-panel button to stop acquisition.  
2. Use CTRL-ALT-DEL to close the TDS/CSA8000 application.  
3. Click Start, then select Programs, and then Sykes Diagnostics in the Start  
Menu. Finally, click QA+Win32.  
NOTE. You may experience a delay before the program starts.  
4. Click Tools on the menu bar, then click Customize Test...  
5. Click Default and exit this dialog by clicking OK.  
6. Select and execute the following tests individually by clicking on the test  
buttons (see the illustration on page 1--40) one at a time (see note) and  
clicking Start:  
a. COM Ports  
b. LPT Ports  
c. System Board  
d. System Info  
e. USB  
f. Video  
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NOTE. A test button is not highlighted until you select it. As you select the button  
for each test (tool tip appears when you point to the button), a highlight box  
appears around the button. When you click Start, the button blinks until the test  
is complete and the highlight box changes color to indicate the test is complete.  
Follow any instructions appearing on the screen.  
7. Check test results in scrollable results listing in the Test Results window of  
the QAPlus test window. All tests should pass.  
8. Close the QA+Win32 diagnostics by selecting Exit in the File menu or click  
the Control Box (X) in upper right corner.  
9. You can restart the TDS/CSA8000 product software application by clicking  
Start, then selecting Restart from the Shutdown Windows dialog box.  
End of Procedure  
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Accessories and Options  
This section lists the standard and optional accessories, as well as the product  
options available for the instrument at the time this manual was published.  
Accessories  
Table 1--3 lists the standard accessories that ship with the instrument.  
Standard  
NOTE. The standard accessories that ship with any instrument modules are not  
listed here. Each instrument module ships in its own package. Consult the user  
documentation of the module for a list of accessories.  
Table 1-3: Standard accessories  
Item  
H
Part number  
Certificate of Traceable Calibration for product at initial shipment Not orderable  
H
Business reply card  
Not orderable  
119-6297-00  
119-6298-00  
200-4519-00  
016-1441-00  
119-6107-00  
006-3415-04  
Not orderable  
071-1099-xx  
071-1096-xx  
Not orderable  
H
1 Windows compatible keyboard  
1 Windows compatible mouse  
1 Instrument front cover  
H
H
H
1 Accessory pouch  
H
2 Touchscreen styluses  
H
1 ESD wrist strap with 6 foot coiled cord  
CSA8000 & TDS8000 Online Help (part of application software)  
CSA8000B & TDS8000B User Manual  
CSA8000 & TDS8000 Reference  
H
H
H
H
CSA8000 & TDS8000 Programmer Online Guide (part of  
application software)  
H
Oscilloscope Analysis and Connectivity Made Easy (manual and 020-2449-xx  
CD with connectivity examples)  
H
H
H
H
CSA8000 & TDS8000 Series Windows 2000 OS Restore Kit  
CSA8000 & TDS8000 Series Product Software Kit  
8000 Series Demo Applications Software CD  
Power cord  
020-2526-xx  
020-2527-xx  
020-2480-xx  
Order by option  
number  
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Accessories and Options  
Optional  
The following accessories are orderable for use with the instrument at the time  
this manual was originally published. Consult a current Tektronix catalog for  
additions, changes, and details.  
Table 1-4: Optional accessories  
Item  
H
Part number  
80A02  
80A02 EOS/ESD Protection module  
Sampling Module Extender (1 meter)  
Sampling Module Extender (2 meter)  
3.5 Male to 3.5 Female SMA  
H
012-1568-00  
012-1569-00  
015-0552-00  
015-0553-00  
015-1001-00  
015-1002-00  
015-1003-00  
015-1014-00  
H
H
H
Slip-on SMA connector  
H
2X Attenuator (SMA Male-to-Female)  
5X Attenuator (SMA Male-to-Female)  
10X Attenuator (SMA Male-to-Female)  
Power Divider  
H
H
H
H
BNC Female 75 to 50 Type N Minimum Loss Attenuator 131-0112-00  
H
P6209 4 GHz Active FET Probe  
P6150 9 GHz Passive Probe  
Replacement hard disk drive  
P6209  
H
P6150  
H
119-6241-00  
071-0438-xx  
H
CSA8000 Series Communications Signal Analyzers  
TDS8000 Series Digital Sampling Oscilloscopes  
Service Manual  
H
Calibration Step Generator  
067-1338-00  
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Accessories and Options  
Options  
The following options can be ordered for the instrument:  
H
H
Option 1K: Cart  
Option 1R: Rack Mount Kit (includes hardware and instructions for  
converting to rackmount configuration)  
H
H
Option GT: Gated Trigger option.  
International Power Cords Options:  
H
H
H
H
H
H
Option A1 -- Universal Euro 220 V, 50 Hz  
Option A2 -- UK 240 V, 50 Hz  
Option A3 -- Australian 240 V, 50 Hz  
Option A5 -- Switzerland 220 V, 50 Hz  
Option AC -- China 220 V, 50 Hz  
Option A99 -- No power cord shipped  
H
Service offerings:  
H
H
H
H
H
H
H
Option C3: Three years of calibration services  
Option C5: Five years of calibration services  
Option D1: Calibration data report  
Option D3: Test Data for calibration services in Option C3  
Option D5: Test Data for calibration services in Option C5  
Option R3: Repair warranty extended to cover three years  
Option R5: Repair warranty extended to cover five years  
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Operational Maps  
This chapter acquaints you with how the instrument functions and operates. It  
consists of several maps that describe the system, its operation, and its documen-  
tation:  
H
H
H
H
Documentation Map, on page 2--2, lists the documentation that supports the  
instrument.  
System Overview Maps on page 2--4, describe the high-level operating blocks  
and operating cycle of the instrument.  
User-Interface Map, on page 2--7, describes the elements of the User Interface  
(UI) application, which provides complete control of the instrument.  
Front-Panel Map, on page 2--8, describes the elements, such as control  
buttons, of the instrument front panel and cross references information  
relevant to each element.  
H
H
Display Maps, on pages 2--9 and 2--10, describe elements and operation of  
single-graticule and multiple-graticule displays.  
I/O Maps, on pages 2--11 and 2--12, describe front and rear input/output ports  
and peripherals on the front and rear panels.  
Tutorial procedures are available online, as part of the online help. To display,  
select the Setup Procedures from the UI application Help menu.  
For information on configuring and installing your instrument, refer to  
Chapter 1, Getting Started.  
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Documentation Map  
This instrument ships with documents individually tailored to address different  
aspects or parts of the product features and interface. The table below cross  
references each document to the instrument features and interfaces it supports.  
To read about...  
Refer to these documents:  
Description  
Standard accessories or packing list  
Graphical packing list  
The graphical packing list is one of the items you  
should find when you open the instrument box. It  
shows all items as they are packaged in the box.  
Additionally, all standard accessories are listed on  
page 1-41 of this manual.  
Installation, Specification, & Operation  
(overviews)  
Main User Manual  
Reference Manual  
CD booklets  
Read the Reference for a quick overview of  
instrument features and their usage.  
Read the User Manual for general information  
about your instrument — procedures on how to put  
it into service, specifications of its performance,  
maps of its user interface controls, overviews and  
background on its features.  
Specific installation information for both the  
operating system (OS) and product software is  
located in each of the CD booklets accompanying  
the CDs.  
For more detailed usage information, see Online  
Help System, below.  
All about Sampling Modules  
Electrical, Optical, or Other  
Modules User Manual  
Read these manuals for complete information  
about the sampling modules you purchased —  
how to install them in the instrument, how to use  
them, and how to protect them from ESD.  
The user manual for Electrical and Optical  
Modules are provided on the product software CD  
as PDF files. These are also available for  
download on the Tektronix Web site. Other module  
user manuals are provided with the module.  
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Documentation Map  
To read about...  
Refer to these documents:  
Description  
Access online help from the instrument for  
context-sensitive information on virtually all  
controls and elements on screen.  
In Depth Operation and UI Help  
Online Help System  
Online help includes a setup guide of procedures  
for applying all instrument functions. See  
Accessing Online Help on page 3-167.  
Access this online guide from the instrument from  
its Help menu. Quickly find the syntax for any  
command, and copy the command if desired.  
Read about communication, error handling, and  
other information on GPIB usage.  
Online Programmers Guide  
GPIB Commands  
<Space>  
<NR3>  
?
Information about other products is available on  
the Tektronix website. See Contacting Tektronix for  
information on how to access our website.  
Analysis and Connectivity Tools  
Oscilloscope Analysis and  
Connectivity Made Easy  
TekVISA Programming  
VXIplug&play Driver Help  
TekVISA Excel Toolbar Help  
These documents help you use various connectiv-  
ity and analysis tools that you can install. See  
Analysis and Connectivity Support in the  
instrument online help (described above) for more  
information. Note that earlier instrument models  
(TDS8000 and CSA8000) did not ship with these  
tools.  
You may also want to obtain the optional service manual for this product if you  
carry out self-service or performance test this instrument. See Optional  
Accessories on page 1--42.  
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System Overview Maps  
The instrument and its sampling modules comprise a highly capable waveform  
acquisition, test, and measurement system. The following model provides  
background information on its operation, which, in turn, may provide you insight  
on how the instrument can be used.  
Functional Model Map  
Modular Sampling  
Specialization  
Signal Processing Display, I/O,  
& Storage  
User Interface  
& Waveform Display  
Digital Signal Acquisition  
& Transformation  
Channel  
Channel  
Channel  
Input modules  
Page 3-5  
Chan 1-8  
Acquisition  
system  
S P & T  
systems  
Page 3-53  
CH1..8  
Page 3-21  
Page 3-14  
Pages  
3-73,  
Ref 1-8  
3-101,  
3-141  
Clock recovery  
options only  
Trigger  
system  
Timebase  
system  
Math 1-8  
External trigger  
inputs  
Page 3-39  
Page  
3-101,  
3-53  
Gated trigger  
TTL input  
(option GT )  
The model comprises five high-level subsystems or processes (embodying a  
variety of hardware and software functions):  
H
Modular Sampling Specialization System. Allows you to choose modules  
to begin tailoring your waveform acquisition based on the types of signals  
you want to acquire: electrical or optical; with clock recovery or without,  
with bandwidth filter or not. Provides cost-effective solution for users  
needing very high bandwidth with superb time resolution on repetitive  
waveforms. Sampling modules determine the size of the vertical acquisition  
window for each channel.  
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System Overview Maps  
H
Digital Signal Acquisition System. Acquires a waveform record from each  
signal you apply to each channel using the following subsystems:  
H
Acquisition System. Sets vertical offset for the vertical acquisition  
window for each channel. Performs the actual A/D conversion and  
storing of digitized samples. Also performs post A/D sample-based  
corrections to compensate for non-linearities of various analog circuits.  
H
Trigger System. Recognizes a specific event of interest on the input  
trigger signal and informs the Timebase of the trigger events occurrence,  
gating the taking of a sample after a controlled, incremental delay (see  
page 3--17). The trigger event is defined as time zero for the waveform  
record, which means that all samples are displayed relative to this point.  
There is no internal trigger pick off from the channels; rather, a trigger  
signal must be obtained through the external trigger inputs, from the  
system clock, or from the clock recovery when available from optical  
modules equipped with clock recovery.  
For those CSA8000B and TDS8000B instruments equipped with the  
Gated Trigger option (Option GT), the system allows triggering to be  
enabled and disabled (gated) based on a TTL signal at a rear-panel input.  
See the To Use Gated Trigger section on page 3--51 for more informa-  
tion.  
H
Timebase System. Tells the Acquisition system to take a sample (i.e.  
convert from analog to digital) at some specific time relative to the  
trigger (or clock) event. In more general terms, synchronizes the  
capturing of digital samples in the Acquisition system to the trigger  
events generated from the Trigger system.  
H
H
Signal Processing Transformation System. Performs a variety of trans-  
formations or operations, beginning with the most fundamental data  
elements in the system, the channel waveforms. Waveform math operations,  
automatic measurements, and histogram generation are examples.  
Display, Input/Output, Storage Systems. Provides display control. Sets the  
vertical scale and position of the display, which controls how much of the  
vertical acquisition window appears on screen. Provides output (and  
sometimes input) of instrument-data elements in a form suitable to the user.  
The process overview that follows describes each step in the top-level cycle of  
instrument operation.  
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System Overview Maps  
Process Overview Map  
Process overview  
Process block description  
1. The instrument starts in the idle state; it enters this state  
upon power up, upon receiving most control setting changes,  
or upon finishing acquisition tasks.  
Idling...  
Reset  
Abort  
Power On  
Yes  
1
Stop  
condition?  
2. When you toggle its RUN/STOP control to RUN, the  
instrument implements its setup based on the current  
control settings (upon start up, these are default or last  
setup depending on user-set preferences).  
No  
Implement  
setup  
3. The instrument then begins waiting for a trigger. No sampling  
takes place until triggering criteria are met or a free-run  
trigger is forced (Auto-trigger mode only). The instrument  
accepts trigger.  
Wait for trigger/  
accept trigger  
4. The instrument then waits a delay time, that is, it delays  
taking a sample until a specified time elapses, where:  
Delay time = Horizontal Pos. + Ch. Deskew + N sample intervals  
Wait Delay time  
In the above calculation, N = Current sample count - 1  
For example, if taking the 6th sample in the waveform record,  
5 sample intervals are added.  
Add one  
sample interval  
to Delay time  
5. The instrument takes one sample for each waveform record  
(channel) for each active (on) timebase. This instrument  
sequentially samples: one sample is taken per trigger for  
each active channel in each displayed timebase.  
Take 1 sample  
per active  
channel  
6. If averaging or enveloping is on, each record becomes part of  
a multi-acquisition record that these modes produce (see  
page 3-22). The process loops back to step 3 above to  
acquire additional records until the number of acquisitions  
required for the acquisition mode currently set are processed,  
and then processing continues as for step 8 below.  
Waveform  
record  
complete?  
No  
7. If FrameScan mode is on, the acquisition process is  
modified. See FrameScan Acquisitions on page 3-30 for  
information on how FrameScan works.  
Yes  
8. At this point the acquisition record is in channel acquisition  
memory and is available to the instrument for measurement  
of its parameters, display, output, and so on.  
Waveform  
available  
The instrument then checks for user-specified stop condition  
and either returns to its idle state or continues at step 3,  
according to what it finds.  
1
Note: if acquiring when powered down, the oscilloscope may skip the  
idle state and resume acquisition starting with step 3.  
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User Interface Map - Complete Control and Display  
Menu Bar: Access to data I/O,  
printing, online help system,  
and set-up functions  
Status Bar. Trigger status  
and waveform count  
Tool Bar: Handy access to  
key features, including the  
setup dialogs, acquisition  
modes, triggering modes,  
and online help  
Measurements Bar: Quick  
access to automated  
measurements by signal type  
and category; click  
Readout Bar. Toggle  
individual readouts on and  
off by clicking its button  
A Readout. Right click  
any readout to display a  
short-cut menu providing  
handy access to  
often-used setup controls  
and properties for the  
feature associated with  
the readout  
measurement buttons to  
measure the selected waveform  
Display: Live, reference, and  
math waveforms display here,  
along with cursors, masks,  
etc. to analyze them  
Waveform Bar: Access to  
waveform selection (click),  
waveform position (drag),  
and waveform properties  
(right-click)  
Readouts: Display up  
to five readouts in this  
area, selectable from  
the Readout Bar  
Controls Bar: Quick access  
to waveforms and timebases  
for display, and to their scale,  
offset, and position controls  
for adjustment  
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Front Panel Map - Quick Access to Most Often Used Features  
Turn knob to adjust most control fields in setup dialogs.  
Press the Select button to switch among fields. Press the  
Fine button to toggle between normal and fine adjustment.  
Press to start and stop acquisition or clear  
all channel waveforms at once. Page 3-26.  
Press a Menu button to quickly access the setup dialog for  
its control group for more detailed set up.  
Press to display measurement cursors and set the knob  
and Fine (adjust) and Select buttons to control them.  
Page 3- 89.  
Press to quickly return to instrument-default  
control settings. Page 3-13.  
Press to automatically set up the instrument controls  
based on selected channels. Page 3-11.  
Press to access print dialog for  
printing the display. Page 3-131.  
Press to display the cluster of Setup Dialogs  
for comprehensive set up of the instrument.  
Press to toggle the touch screen on and off. Use the  
touch screen to control UI when you haven’t installed a  
mouse. Page 3-60.  
Select a waveform type, Channel,  
Reference, or Math, to display or adjust on  
screen (selected button lights). Page 3-62.  
Press to display and select a waveform not yet displayed;  
press to select among displayed waveforms;  
press again to turn a selected waveform off.  
Button lights indicate displayed and selected waveforms.  
Page 3-62.  
Press to display and select a time base view not  
selected, or to select among displayed views;  
press selected timebase again to toggle it off  
(except Main which is always on). Page 3-64.  
Turn knobs to vertically scale, position, and  
offset selected waveform. Page 3-8.  
Turn knobs to Horizontally scale, position,  
and set record length of selected waveform.  
Page 3-10.  
Use controls to set trigger level and lights  
to monitor trigger state. Page 3-48.  
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Display Map - Single Graticule View  
Drag cursors to measure  
waveforms on screen.  
Drag the Horizontal Reference to move  
the point around which horizontal scaling  
expands and contracts the waveforms.  
Drag the Waveform Icon vertically  
to position waveform.  
Right click on a waveform or its  
icon for handy access to often  
used setup controls and properties.  
Drag ground reference icon to add  
offset to a waveform.  
Drag across the waveform area to  
zoom the boxed waveform segment  
to full screen width.  
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Display Map - Multiple Views  
Drag the markers to enclose  
the portion of waveform to  
appear in Mag 2 View.  
Drag the markers to enclose  
the portion of waveform to  
appear in Mag 1 View.  
MAIN View  
Drag the border between  
graticules to vertically size  
Main, Mag1, and Mag2  
Views.  
Mag  
Mag  
View  
View  
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Front Panel I/O Map  
Floppy disk drive accessible  
from Windows 98  
Compartments for large  
modules, up to two channels  
INTERNAL CLOCK OUTPUT  
DC CALIBRATION OUTPUT  
Compartments for small  
modules, up to eight channels  
EXTERNAL 10 MHZ REFERENCE INPUT  
ANTISTATIC CONNECTION for  
wrist strap, 1 Mto ground  
TRIGGER  
TRIGGER  
DIRECT  
input  
TRIGGER  
PROBE  
PRESCALE  
input  
POWER  
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Rear Panel I/O Map  
Removable hard disk drive to provide  
individual environment for each user or to  
secure data, press to release  
CDROM drive accessible from  
Windows, press to open  
USB connector for mouse or  
keyboard and mouse  
PS-2 connectors for mouse and keyboard  
Upper VGA port to connect a second  
monitor for side-by-side display  
Lower VGA port to connect a  
monitor for oscilloscope display  
Parallel port (Centronics) to  
connect printer or other device  
GPIB port to connect to controller  
RJ-45 connector to connect to network  
COM1 serial port  
Card Bus slots for two PCMCIA type-1  
cards, two type-2 cards, or one type-3  
1
card  
TRIGGER GATE (TTL)  
1
PCMCIA card readers are not available on the following products: CSA8000B SN B020338 and above,  
TDS8000B SN B020346 and above. Product software version 2.0 (or greater) does not support PCMCIA readers.  
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Overview  
This chapter describes how the many features of the instrument operate. Please  
note the following points on using this chapter:  
H
Each section in this chapter provides background information needed to  
operate the instrument effectively as well as the higher-level procedures for  
accessing and using the features. These procedures emphasize using the front  
panel when possible.  
H
Lower-level, detailed usage procedures are in the online help system.  
The table that follows lists the sections in this chapter.  
Section  
Description  
Page no.  
3-3  
Acquiring Waveforms  
Triggering  
Provides an overview of capturing signals and digitizing them into waveforms  
Provides an overview of the instrument trigger features and their use  
Provides an overview of display operation  
3-39  
Displaying Waveforms  
Measuring Waveforms  
3-53  
Provides an overview of the the cursors and automatic measurements tools this  
instrument provides and how to use them  
3-73  
Creating Math Waveforms  
Data Input and Output  
Provides an overview of how you can mathematically combine acquired waveforms and  
measurement scalars to create a math waveform that supports your data-analysis task  
3-101  
Provides an overview of the input and output capabilities of your instrument  
3-113  
3-141  
Using Masks, Histograms,  
and Waveform Databases  
Provides an overview of the statistical tools this instrument provides and how to use  
them: mask testing, histograms, and waveform databases  
Accessing Online Help  
Provides an overview of the help system, which is integrated as part of the instrument  
user interface, and describes how to access it  
3-167  
3-175  
Cleaning the Instrument  
Provides instructions on how to clean the exterior of the instrument and its touch screen  
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Overview  
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Acquiring Waveforms  
Before you can display, measure, or analyze a waveform, you must acquire it  
from a signal. This instrument comes equipped with the features you need for  
capturing your waveforms. The following topics provide an overview of captur-  
ing signals and digitizing them into waveform records:  
H
Signal Connection and Scaling: How to connect signals to the instrument  
channels; how to offset channels and position and scale the time bases for  
acquiring waveforms; how to scale and position waveforms in the display.  
H
H
H
Setting Acquisition Controls: How to choose the appropriate acquisition mode  
for acquiring your waveforms; how to start and stop acquisition.  
Acquisition Control Background: Information describing the data-sampling  
and acquisition processes.  
FrameScan Acquisitions: How to use FrameScan acquisition to help analyze  
pattern-dependent failures in high bit-rate communications signals.  
Signal processing  
& transformation  
system  
Acquisition  
system  
Output and  
storage  
User Interface  
and display  
Sampling  
module  
Trigger  
system  
Time base  
system  
NOTE. This section describes how the vertical and horizontal controls define the  
acquisition of live, channel waveforms. These controls also define how all  
waveforms are displayed, both live and derived waveforms (math and reference  
waveforms). The following sections cover display-related usage:  
H
H
Displaying Waveforms on page 3--53.  
Creating Math Waveforms on page 3--101.  
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Acquiring Waveforms  
Signal Connection and Scaling  
This section presents an overview of the instrument features related to setting up  
the input signal for digitizing and acquisition. It addresses the following topics:  
H
Where to find information for installing sampling modules and connecting  
input signals  
H
H
How to turn on channels and adjust their vertical scale, position, and offset  
How to set the horizontal scale, position, and record length of the Main (time  
base) View  
NOTE. Terminology: This manual uses the terms vertical acquisition window and  
horizontal acquisition window. These terms refer to the vertical and horizontal  
range of the acquisition window, which defines the segment of the input signal  
that the acquisition system acquires. The terms do not refer to any windows or  
display windows on screen. See Conventions on page xii.  
Vertical  
offset  
Vertical  
position  
Vertical  
scale  
Sampling  
module  
Acquisition  
system  
Display  
system  
Horizontal Horizontal Horizontal  
scale  
position  
record  
length  
Figure 3-1: Acquisition and display controls  
Why Use?  
Use signal conditioning and scaling controls to ensure the instrument acquires  
the data that you want to display, measure, or otherwise process. To ensure the  
best possible data for further processing, you do the following:  
H
Set vertical scale to adjust the waveform size on screen. You can set vertical  
offset to shift the vertical acquisition window up or down on the signal to  
capture the portion you want.  
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Acquiring Waveforms  
H
Set horizontal scale to control the time duration of the horizontal acquisition  
window to capture as much as you want of the input signal(s). To control  
where in the input signal (data stream) that the horizontal acquisition  
window acquires, you set horizontal position to delay the window relative to  
a trigger to capture the waveform portion you want. To increase or decrease  
the resolution between sample points, change the record length.  
For more background on the acquisition window concepts, see Signal Condition-  
ing Background on page 3--13.  
What’s Special?  
A Versatile Autoset. Autoset can be defined to set up for a waveform edge, period,  
or an eye/bit pattern. Pushing the Autoset button automatically sets up the  
instrument controls for a usable display based on the property you choose and  
the characteristics of the input signal. Autoset is much faster and easier than a  
manual control-by-control setup. You can also reset the instrument to its factory  
default settings by pushing the Default Setup button.  
What’s Excluded?  
The vertical offset cannot be adjusted for any reference waveform, because a  
reference waveform is a static, saved waveform, and offset adjusts the acquisi-  
tion hardware for acquiring live waveforms. Also, TDR waveforms, if displayed  
in rho or ohm units, cannot be adjusted for vertical offset.  
The vertical offset of a math waveform cannot be adjusted directly. You can  
adjust the offset of waveform sources (waveforms included in the math  
expression) for the math waveform if the sources are live waveforms.  
Keys to Using  
The key points that follow describe operating considerations for setting up input  
scaling, offset, and position to properly acquire your waveforms.  
Sampling Modules Selection and Signal Connection. Select the sampling module,  
optical or electrical, that best fits your sampling task, whether it is connecting to  
a fiber or electrical cable to test a digital data stream, or to a test fixture through  
SMA cables to characterize a device. The connection to the sampling module  
depends on your application.  
Tektronix provides 80E00-series (electrical) and 80C00-series (optical) sampling  
modules for this instrument; you can read about any sampling module and its  
connections in the sampling-module user manual(s) that shipped with your  
product. (Insert your sampling-module user manual(s) in Appendix C at the back  
of this manual for ready reference.) You can also check your Tektronix catalog  
for connection accessories that may support your application.  
Up to eight acquisition channels are available, depending on the sampling  
modules installed. Each channel can be displayed as a waveform or can  
contribute waveform data to other waveforms (math and reference waveforms,  
for example).  
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Acquiring Waveforms  
CAUTION. Install sampling modules before applying power and before connect-  
ing them to the signals you want to test. See your sampling-module user manual  
for instructions.  
CAUTION. Sampling modules are inherently vulnerable to static damage. Always  
observe static-safe procedures and cautions as outlined in your sampling-module  
user manual.  
Coupling Concerns. Electrical sampling modules provide only straight-DC  
coupling to their sampling circuits, with no protection. All modules specify a  
maximum vertical nondestructive range that limits signals to small levels,  
typically about 2 to 3 volts (DC + ACpk-pk). (See Specifications in the user  
manual for your sampling module for exact limits.) Do not exceed the limit, even  
momentarily, as the input channel may be damaged.  
All modules also specify a dynamic range that, if exceeded, could cause  
acquisition and measurement errors due to nonlinearity. Do not exceed this limit.  
(See Specifications in the user manual for your sampling module for exact  
limits.)  
NOTE. Optical sampling modules may have dynamic range exceeded without  
obvious visual indications onscreen because the photo detector and/or filters  
used may not necessarily be able to pass through overloaded signals to the  
sampler.  
Use external attenuators if necessary to prevent exceeding the limits just  
described. Note that there are no hardware bandwidth filters in most sampling  
modules or in the instrument. (Some optical sampling modules have bandwidth  
filters settable from the Vertical Setup menu of the instrument. See the user  
manual for your optical sampling module for more information.)  
Scaling, Offset, and Positioning Considerations. These key controls determine the  
portion of the input signal presented to the acquisition system:  
H
Set the vertical offset to display the features of interest on your waveform  
and avoid clipping. (See Note that follows.) Adjust the display control  
Vertical Scale to control the portion of the vertical window displayed on  
screen; adjust the display control Vertical Position to position the waveform  
on screen. Note that vertical offset affects the vertical acquisition window,  
but vertical scale and position do not. These last two controls are display  
controls only. Vertical Acquisition Window Considerations on page 3--14  
describes the vertical acquisition window.  
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Acquiring Waveforms  
Clipped  
H
Set horizontal scale, position, and resolution (record length) so that the  
acquired waveform record includes the signal attributes of interest with good  
sampling density on the waveform. The settings you make define the  
horizontal acquisition window, described in Horizontal Acquisition Window  
Considerations on page 3--17. (Good sample densitymight be at least  
five samples on each waveform transition when acquiring for timing  
measurements. The trade off for increased sample density is increased time  
to acquire.)  
NOTE. Waveform data outside the vertical acquisition window is clipped; that is,  
the data is limited to the minimum and/or maximum boundaries of the vertical  
acquisition window. This limiting can cause inaccuracies in amplitude-related  
measurements. See Vertical Acquisition Window Considerations on page 3--14.  
Trigger and Display. Set basic trigger controls to gate waveform acquisition, and  
use the display to interactively set scale, position, and offset waveforms. See the  
sections Triggering on page 3--39 and Displaying Waveforms on page 3--53.  
Selected Waveform. Many of the controls of this instrument, especially the  
vertical controls, operate on the selected waveform. The instrument applies all  
actions that only affect one waveform at a time, such as applying a changes to  
the vertical control settings, to the selected waveform.  
NOTE. You can select a channel waveform, a math waveform, or a reference  
waveform. The procedures here describe how to select and set up channel  
waveforms for acquisition. See Displaying Waveforms on page 3--53 for  
information regarding using the controls for adjusting display of reference and  
math waveforms.  
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Acquiring Waveforms  
Flexible Control Access. The product provides multiple methods for adjusting  
acquisition controls. This manual focuses on basic setup through the front panel,  
and the use of the User Interface (UI) Application displayed full screen. See the  
display maps, beginning on page 2--9, for UI alternatives to controlling vertical  
and horizontal setup. The online help system also documents the UI.  
To Set Up the Signal Input  
Use the procedure that follows when setting up the instrument to scale and  
position input signals for acquisition.  
CAUTION. Sampling modules are inherently vulnerable to static damage. Always  
observe static-safe procedures and cautions as outlined in your sampling-module  
user manual.  
Overview  
To set the signal input  
Related control elements and resources  
Prerequisites 1. The instrument must be installed with sampling modules  
in place. The acquisition system should be set to run  
continuously.  
See the sampling-module user manuals for sampling  
module installation. See page 3-24 for acquisition  
setup and page 3-48 for trigger setup in this manual.  
Also, an appropriate trigger signal must be routed to the  
instrument and triggering must be set up.  
Connect the 2. Connect to the signal to be acquired using proper  
input signal  
probing/connecting techniques. See the user manual for  
the sampling module you have chosen.  
Note: For more details on controlling vertical setup,  
push the Vertical MENU button to display the Vertical  
Setup dialog box, and then click its HELP button.  
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Acquiring Waveforms  
Overview  
To set the signal input (cont.)  
Related control elements and resources  
3. Push the channel button (turns amber) to assign  
the waveform buttons, 1 - 8, to operate on  
channel waveforms. Push a waveform button to  
select the signal channel (it displays).  
Select the input  
signal channel  
A waveform button lights when its channel is on:  
H
When on but not selected, its button is lighted  
green.  
H
When on and selected, its button is lighted  
amber.  
Hint. To select one of the channels already  
displayed, you can use a mouse and click its trace  
or its reference indicator to select it.  
Set the vertical 4. Use the Vertical Offset knob to adjust the selected  
acquisition  
window  
waveform on screen. Use the Vertical Scale and  
Position knobs to adjust the display.  
Positioned vertically  
Scaled vertically  
Offset vertically  
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Acquiring Waveforms  
Overview  
To set the signal input (cont.)  
Related control elements and resources  
Set the  
5. Push the View Main button to make sure the main time  
base view is selected. Use horizontal knobs to scale and  
position the waveform on screen and to set sample  
resolution.  
horizontal  
acquisition  
window  
Scaled horizontally  
Positioned horizontally  
The Resolution knob sets the record length. (See  
discussion on page 3-19.)  
Push Set to 50% if required to stabilize display.  
Continue with 6. To finish the acquisition setup, you must set the  
the acquisition  
setup  
acquisition mode and start the acquisition.  
See To Set Up Acquisition Controls on page 3-24.  
For more help 7. For more information on the controls described in this  
procedure, push the Vertical or Horizontal MENU  
button. Click the HELP button in the setup dialog box  
that displays.  
End of Procedure  
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Acquiring Waveforms  
To Autoset the Instrument  
With an input signal connected, use the procedure that follows to autoset based  
on the characteristics of the input signal. Autoset operates on the selected  
channel only.  
Overview  
To autoset  
Control elements and resources  
Prerequisites 1. The instrument must be installed with sampling modules  
in place. Signals must be connected to channels. A  
triggering source must be provided.  
2. At least one channel must be turned on (its front-panel  
button lighted).  
See the sampling-module user manuals for help with  
installing sampling modules. See page 3-48 in this  
manual for trigger setup information.  
Execute 3. Push the Autoset button to to execute an autoset on the  
selected waveform.  
If you use Autoset when one or more channels are  
displayed, the instrument uses the selected channel for  
horizontal scaling. Vertically, all channels in use are  
individually scaled.  
Note. Autoset can execute on live waveforms (either  
channel or math) in the Main time base.  
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Acquiring Waveforms  
Overview  
To autoset (cont.)  
Control elements and resources  
Define 4. Click Define Autoset in the Utilities menu to display  
the Autoset properties dialog box. To change the autoset  
criteria, select from:  
H
H
H
Edge to setup the default autoset for instrument to  
acquire the waveform data such that the center  
20% of the record contains a rising edge.  
Period to setup the default autoset for instrument  
to acquire the waveform data such that the record  
contains 2 or 3 periods.  
NRZ Eye to setup the default autoset for instru-  
ment to acquire the waveform data as follows:  
H
one bit (two eye crossings) is displayed over  
about 7.5 horizontal divisions, centered on the  
screen.  
H
the high/low values are displayed over about 6  
vertical divisions, also centered on screen.  
H
RZ Eye Pattern to setup the default autoset for  
instrument to acquire the waveform data as follows:  
H
three rise/fall edges are displayed over the  
center 6 horizontal divisions, with the first  
rising edge placed near the 20% horizontal  
location (second division).  
H
amplitude (the high/low values) is displayed  
over the center 5 vertical divisions.  
Click OK to set Autoset to use the current criteria. To  
execute, push the Autoset button.  
For More 5. For more information on the controls described in this  
Information  
procedure, push/click the HELP button in any dialog  
box or select Help Contents and Index in the Help  
menu.  
End of Procedure  
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Acquiring Waveforms  
NOTE. Autoset sets the vertical position to zero and adjusts the vertical offset to  
center the signal in the display.  
If a standard mask is active for the selected waveform, Autoset adjusts the  
selected waveform record to match the mask, if possible. Autoset adjusts the  
vertical scale and offset, horizontal scale, position, and reference parameters as  
required for the mask standard.  
To Reset the Instrument  
You may want to revert to the factory default setup; if so, use the following  
procedure to reset the instrument:  
Overview  
To reset to factory defaults  
Control elements and resources  
Prerequisites 1. The instrument is powered on and running.  
See Power On Instrument on page 1-13.  
Execute 2. Push the Default Setup button.  
End of Procedure  
Signal Conditioning  
Background  
This section contains background information that can help you more effectively  
set up the acquisition window of each channel.  
Input. This instrument samples sequentially, in order to provide superior  
bandwidth and time resolution. Sequential sampling systems sample the input  
without scaling it (they have a fixed dynamic range); therefore, input protection  
and dynamic range are necessarily limited.  
CAUTION. Do not overdrive the inputs. Also observe static-safe procedures and  
cautions as outlined in the sampling-module user manual. Sampling modules are  
very sensitive to ESD.  
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Acquiring Waveforms  
Autoset Considerations. Autoset acquires samples from the input signal and  
attempts to take the following actions based on the input data:  
H
H
H
Evaluate the amplitude range of the input signals and offset of the vertical  
acquisition window to acquire the signal without clipping.  
Set the trigger level to the approximate midlevel of the trigger signal being  
applied (either an external trigger or a clock-recovery trigger).  
Evaluate the signal transitions and set the horizontal scale to produce a  
waveform display based on the Autoset mode selected: Edge, Period, or  
Bit/Eye Pattern.  
Sometimes Autoset cannot produce a correct display due to the nature of the  
input signal; if so, you may have to adjust the scale, trigger, and acquisition  
controls manually. Some conditions that can cause Autoset to fail are:  
H
H
H
H
H
H
no signal present.  
signals with extreme or variable duty cycles.  
signals with multiple or unstable signal periods.  
signals with too low amplitude.  
no recognizable trigger signal.  
no eye diagram waveform present when autosetting in Bit/Eye Pattern  
autoset mode.  
Vertical Acquisition Window Considerations. The size of the vertical acquisition  
window is determined by the operating range of the the sampling module and  
any probe connected to it. The vertical offset determines where the vertical  
window is positioned relative to ground. Parts of the signal amplitude that fall  
within the vertical window are acquired; parts outside (if any) are not (they are  
clipped).  
As an example, consider that a basic 80E00-series sampling module, with a  
maximum 100 mV/div scale, covers 1 volt over 10 divisions. Changing the  
vertical scale setting only changes how much of the vertical window displays on  
screen; changing vertical position simply changes the space on the screen where  
the data is displayed.  
You can set the vertical scale, position, and offset of each channel independently  
of other channels.  
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Acquiring Waveforms  
The vertical scale and position controls do not affect the vertical acquisition  
window, rather they adjust the display system to display the waveform as  
follows:  
H
The vertical scale (per division) setting determines the portion of the vertical  
acquisition window that appears in the graticule, allowing you to scale it to  
contain all of the window or only part. Figure 3--2 shows two vertical  
acquisition windows that contain the entire waveform, but only one window  
contains the entire waveform in the graticule on screen.  
a. Volts/Div setting determines the size of the display graticule within the vertical  
acquisition window (scale set to 50 mv/div.)  
+0.50 volt  
Vertical window  
+0.25 volt  
C1  
Graticule  
-0.25 volt  
-0.50 volt  
b. Vertical position can change location of display graticule within 5 divisions  
(position set to --4 divisions)  
+0.50 volt  
+0.45 volt  
Vertical window  
Graticule  
C1  
-0.05 volt  
-0.5 volt  
Figure 3-2: Setting vertical scale and position of input channels  
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Acquiring Waveforms  
NOTE. Amplitude-related automatic measurements (for example, peak-to-peak  
and RMS) will be accurate for vertical windows like those shown in  
Figure 3--2 a and b on page 3--15 because neither waveform is clipped (that is,  
both waveforms are acquired). But if the signal amplitude were to extend outside  
the vertical acquisition window, the data acquired becomes clipped. Clipped  
data causes inaccurate results if used in amplitude-related automatic measure-  
ments. Clipping also causes inaccurate amplitude values in waveforms that are  
stored or exported for use in other programs.  
H
The vertical position adjusts the display of the graticule relative to the  
vertical acquisition window (position is a display control). Figure 3--2 b  
shows how vertical position moves the waveform graticule vertically in the  
vertical acquisition window to place the acquired waveform in the graticule  
display. Position does not determine what data is acquired as does vertical  
offset.  
The vertical offset control affects the vertical acquisition window and the  
displayed waveform as follows:  
H
The vertical range (window) is always centered around the offset value that  
is set. Vertical offset is the voltage level at middle of the vertical acquisition  
window. With no (zero) offset (see Figure 3--3), that voltage level is zero  
(ground).  
H
As you vary vertical offset, the middle voltage level moves relative to zero.  
This moves the vertical acquisition window up and down on the waveform.  
With input signals that are smaller than the window, it appears the waveform  
moves in the window. Actually, a larger signal shows what really happens:  
the offset moves the middle of the vertical acquisition window up and down  
on input signal. Figure 3--3 shows how offset moves the acquisition window  
to control the portion of the waveform amplitude the window captured.  
H
Applying a negative offset moves the vertical range down relative to the DC  
level of the input signal, moving the waveform up on the display. Likewise,  
applying a positive offset moves the vertical range up, moving the waveform  
down on the display. See Figure 3--3.  
NOTE. On screen, the channel icon in the waveform bar points to the offset value  
around which the vertical acquisition window is centered. The offset value  
pointed to is relative to the ground reference icon. Both icons are shown in  
Figure 3--3.  
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Vertical window = 1 V peak-to-peak (fixed by sampling module used)  
Acquisition window shifts  
positive to capture overshoot  
Offset +300 mV  
(Near waveform top level)  
C1  
C1  
C1  
Offset 0.0 V  
(At waveform ground reference)  
Offset -300 mV  
(Waveform bottom level)  
Acquisition window shifts  
negative to capture preshoot  
Figure 3-3: Varying offset positions vertical acquisition window on waveform  
amplitude  
NOTE. Measurements use the entire portion of the waveform that the vertical  
window captures, not only the portion displayed on screen. Also, waveforms  
exported or saved (from the File menu or over the GPIB) contain data from the  
entire vertical window, not just the on-screen portion.  
Horizontal Acquisition Window Considerations.You define the horizontal  
acquisition window, that is, you set several parameters that determine the  
segment of an incoming signal that becomes the waveform record when  
acquired. (For background, please read Waveform Record on page 3--28.) These  
common parameters specify a common horizontal acquisition window that is  
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applied to all channels in parallel. (See Independent vs. Shared Window on  
page 3--20.) These parameters are:  
H
The external trigger signal that you input and set the trigger system to  
recognize determines the point relative to the input waveform that triggers  
the instrument.  
H
H
The horizontal position you set determines the horizontal delay from the  
trigger point to the first sample point in the acquisition window.  
The horizontal scale you set, and the requirement that all waveforms fit  
within the 10 horizontal-division display, determines the horizontal duration  
of the window relative to any waveform, allowing you to scale it to contain a  
waveform edge, a cycle, or several cycles.  
Horizontal position  
Sample interval  
First sampled and  
digitized point  
Trigger event on  
Ext. trigger signal  
Horizontal  
acquisition  
Horizontal  
window  
delay  
Time of first point  
Figure 3-4: Horizontal acquisition window definition  
H
The record length (along with the horizontal scale) you set for the 10-divi-  
sion window determines the sample interval (horizontal point spacing or  
resolution) on the waveform.  
NOTE. The horizontal position controls the distance to the Horizontal Reference  
to indirectly set the time to the first sampled point. See Horizontal Position and  
the Horizontal Reference on page 3--59 for a discussion of this relationship.  
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Horizontal Scale vs. Record Length vs. Sample Interval vs. Resolution. These  
parameters all relate to each other and specify the horizontal acquisition window.  
Because the horizontal acquisition window must fit in the 10 horizontal division  
display, for most cases, you just set the duration of the horizontal acquisition  
window (10 divs x the scale setting) as described in (1) below. By also setting a  
record length in samples, you indirectly set the resolution/sample interval/sample  
rate for the horizontal acquisition window (waveform record). The relationships  
between these horizontal elements follow:  
1. Time Duration (seconds) = 10 divs (window size) x Horizontal Scale  
(sec/div)  
2. Time Duration (seconds) = Sample Interval (seconds/sample) x Record  
Length (samples),  
where:  
Time Duration is the horizontal acquisition window time duration  
3. Sample Interval (sec/sample) = Resolution (sec/sample) = 1/Sample Rate  
(samples/sec)  
In (2) above, note that it is Sample Interval that varies indirectly to accommodate  
the window time duration (and its scale setting) and the Record Length setting as  
these later two elements can be set by you. These elements behave as follows:  
H
If Record Length or Time Duration vary, Sample Interval varies to accom-  
modate, up to highest sample rate/lowest sample interval/highest resolution.  
H
If you set faster Horizontal Scale settings, decreasing Time Duration, and the  
Sample Interval reaches its lower limit, the horizontal scale becomes limited  
to a setting compatible with the record length and the lower limit of the  
sample interval.  
H
If you attempt to set longer Record Lengths and the Sample Interval reaches  
it lower limit, Time Duration remains constant and the record length  
becomes limited. The equation becomes:  
Maximum Record Length = Time Duration ÷ Min Sample Interval  
For example, at 1 ps/div and 10 divisions, the record length must be no more  
than 1000 points:  
Max Rec Length 1000 samples = (10 divs x 1ps/div) ÷ 0.01 ps/sample  
Max Rec Length = 1000 samples  
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NOTE. Resolution and the equivalent elements, sample interval and sample rate  
(see equation 3 above), are not settable directly, but are derived. You can,  
however, check the resolution at anytime in the resolution readout (push the  
Horizontal Menu button). Also note, that the Resolution knob actually adjusts  
the record length to increase sample density (detail).  
Independent vs. Shared Window. For a given time base, the instrument applies the  
same horizontal acquisition window to all channels from which it acquires data.  
Unlike the vertical acquisition window that you set independently for each  
channel, the same time/division, resolution (record length), and horizontal delay  
(from the same trigger point) that you set for a time base, apply to all channels in  
that time base. In other words, one trigger, from a single trigger source, will  
locate a common horizontal acquisition window on all active channels, which  
you can shift by setting the horizontal position control.  
The horizontal acquisition window determines the waveform records extracted  
from all signals present at all active channels and math waveforms. You can  
think of the horizontal acquisition window as cutting across any input signals  
present in the input channels to extract the same slice of time into waveform  
records. See Figure 3--5.  
Ch1 record  
Common record start  
point and record length  
Common trigger  
Ch2 record  
Common horizontal  
delay  
Ch3 record  
Ch4 record  
Figure 3-5: Common trigger, record length, and acquisition rate for all channels  
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Setting Acquisition Controls  
This section overviews the instrument acquisition featuresthose that start and  
stop acquisitions and those that control how the instrument processes the data as  
it is acquired (just sampled, or averaged or enveloped). Special features, keys to  
using, and operation controls are covered.  
Vertical  
offset  
Acquisition  
mode  
Acquisition  
system  
Sampling  
module  
Time bases  
Horizontal  
scale  
Horizontal  
position  
Record  
length  
Why Use?  
Use the acquisition controls to optimize and tailor the acquisition of your  
waveforms. The mode controls described here operate on the data as the  
instrument acquires itperhaps to reduce noise in the waveform record or to  
capture a record of min/max values for each data point in the waveform record.  
The acquisition controls also let you start and stop acquisition, as well as take  
certain actions after acquisition stops, such as to print the acquired waveform.  
Whats Special?  
Stop After Options. You can set the condition upon which acquisition stops, such  
as after a number of acquisitions or a number of mask hits you specify. You can  
set the instrument to save waveforms or print the screen to a file or printer.  
FrameScan Acquisition. You can alter the normal acquisition cycle to produce a  
waveform record suitable for acquiring and analyzing Pseudo-Random Bit  
Streams (PRBSs), which are contained within a repeating data frame. See  
FrameScan Acquisitions on page 3--30 for more information on using FrameScan  
acquisitions.  
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Whats Excluded?  
Envelope acquisition mode can not be used with FrameScan acquisitions; you  
must use Sample or Average modes.  
Keys to Using  
The key points that follow describe operating considerations for setting up the  
acquisition system so the waveforms acquired best fit your requirements.  
Acquisition Modes. Consider the mode you want to use to acquire data:  
H
H
Sample - the instrument does no post-processing of acquired samples.  
Average - the instrument processes the number of waveforms you specify  
into the acquired waveform, creating a running exponential average of the  
input signal.  
H
Envelope - the instrument retains the running minimum (Min) and maximum  
(Max) values in adjacent sample intervals continuously, as subsequent  
waveforms are acquired, creating an envelope of all waveforms acquired for  
that channel.  
Acquiring and displaying a noisy square wave signal illustrates the difference  
between the three modes. Note how Average reduces the noise while Envelope  
captures its extremes:  
Sample  
Average  
Envelope  
Acquisition Control. Also, consider how you want to control acquisition; you  
have two main options, either settable from the Acquisition Setup dialog box  
(push Acquisition MENU to display):  
H
Run/Stop Button Only - sets the instrument to start and stop the acquisition  
only when you use the Run/Stop button, which is available on the front  
panel, on the application toolbar, and in the Acquisition Setup dialog box. If  
toggled to Run, acquisition will start if a valid trigger occurs. If toggled to  
Stop, acquisition stops immediately.  
H
Condition - in addition to Run/Stop Button, which can always stop  
acquisition, the stop-after control provides additional conditions you can  
select from to stop an acquisition. See step 4, Set the Stop Mode and Action,  
on page 3--25, or access the online help in the Acquisition Setup dialog box  
for more information.  
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Acquiring Waveforms  
Global Controls. Like the horizontal controls, the acquisition controls apply to all  
active channels. For example, channel 1 cannot acquire in Sample mode while  
channel 2 acquires in Envelope mode; you cannot stop channel 8 from acquiring  
(if turned on) while other channels continue to acquire. Unlike horizontal  
controls, acquisition settings extend across time bases: you cannot set a different  
sample mode for channels acquired in the Mag1 time base; the sample mode you  
set extends across the Main, Mag1 and Mag2 time bases.  
Preventing Aliasing. Under certain conditions, a waveform may be aliased on  
screen. Read the following description about aliasing and the suggestions for  
preventing it.  
When a waveform aliases, it appears on screen with a frequency lower than that  
of the input signal or it appears unstable even though the TRIGD light is lit.  
Aliasing occurs because the instrument sample interval is too long to construct  
an accurate waveform record. (See Figure 3--6.)  
Actual high-frequency waveform  
Apparent low-frequency  
waveform due to aliasing  
Sampled points  
Figure 3-6: Aliasing  
Methods to Check and Eliminate Aliasing. To quickly check for aliasing, slowly  
adjust the horizontal scale to a faster time per division setting. If the shape of the  
displayed waveform changes drastically or becomes stable at a faster time base  
setting, your waveform was probably aliased. You can also try pressing the  
AUTOSET button to eliminate aliasing.  
To avoid aliasing, be sure to set resolution so that the instrument samples the  
input signal at a rate more than twice as fast as the highest frequency component.  
For example, a signal with frequency components of 500 MHz would need to be  
sampled with a sample interval less than 1 nanosecond to represent it accurately  
and to avoid aliasing.  
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To Set Acquisition Modes  
Use the procedure that follows to set the data-acquisition mode and specify  
acquisition start and stop methods. For more detailed information, display online  
help when performing the procedure.  
Overview  
To set acquisitions modes  
Control elements and resources  
Prerequisites 1. Instrument must be installed with sampling modules in  
place before powering on the instrument. Instrument  
must be powered up, with horizontal and vertical  
controls setup. Triggering should also be set up.  
See the sampling-module user manuals for sampling  
module installation. See page 3-48 for trigger setup.  
To select an 2. Push the Acquisition MENU button to display the Acq  
Setup dialog box.  
Acquisition mode  
Select the 3. Click an option button to select the acquisition mode;  
choose from the following modes:  
Acquisition mode  
H
H
H
Sample  
Average  
Envelope  
For Average mode only, enter the number of samples to  
to average in the Average box.  
Set a  
sample count  
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Overview  
To set acquisitions modes (cont.)  
Control elements and resources  
Set the Stop 4. Under Stop After, click one of the following options:  
mode and action  
H
H
Run/Stop Button Only  
Condition  
5. If you selected Condition, choose a condition from the  
drop-down list, such as Number of Acquisitions or  
Mask Total Hits, to stop on. If the condition requires a  
count (count box is enabled), enter a count.  
6. Select a Stop After action from the drop-down list box.  
Choose from the following actions:  
H
H
H
H
None  
Print Screen to File  
Print Screen to Printer  
Save all Waveforms  
Enter a filename for saving to if youve selected Print to  
File or Save all Waveforms.  
7. Click to check Ring Bell if you want audio notice when  
acquisition stops.  
Start acquisition 8. Push the RUN/STOP front-panel button to begin  
acquiring.  
See To Start and Stop Acquisition on page 3-26.  
End of Procedure  
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To Start and  
Stop Acquisition  
Use the procedure that follows to start and stop acquisition.  
Overview  
To start and stop acquisition  
Control elements and resources  
Prerequisites 1. Instrument must be installed with sampling modules in  
place before powering on the instrument. Instrument  
must be powered up, with horizontal and vertical  
controls set up. Triggering should also be set up.  
See sampling-module user manuals for sampling  
module installation. See page 3-24 for acquisition  
setup and page 3-48 for trigger setup in this manual.  
To start 2. Make sure all the channels to be acquired are turned on  
acquiring  
(use the channel buttons; see page 3-9 if needed).  
Then push the RUN/STOP button to begin acquiring.  
To stop 3. Push the RUN/STOP button to stop acquisition.  
acquiring  
Acquisition will also stop when acquisition finishes if a  
selected stop condition is satisfied (see step 4 on  
page 3-25) or if triggering ceases while in Normal  
trigger mode.  
To clear an 4. Push the Acquisition CLEAR DATA button to discard the  
acquisition  
acquired data in all channels.  
For more 5. For more information on the controls described in this  
information  
procedure, push the Acquisition MENU button. Click the  
HELP button in the setup dialog box that displays.  
Also, see references listed at right.  
See To Set Up Acquisition Modes on page 3-24.  
End of Procedure  
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Acquisition Control Background  
This section contains background information on the data sampling and  
acquisition process that can help you more effectively setup the acquisition  
window of each channel. This section:  
H
H
H
describes the acquisition hardware.  
defines the sampling process, sampling modes, and the waveform record.  
describes the acquisition cycle in Normal and FrameScan modes.  
Acquisition Hardware  
Before a signal can be acquired, it must pass through the input channel where it  
is sampled and digitized. Each channel has a dedicated sampler and digitizer as  
shown in Figure 3--7; each channel can produce a stream of digital data from  
which waveform records can be extracted. See Signal Connection and Scaling on  
page 3--4 for further description of scaling, positioning, and DC offsetting of  
channels.  
Number of channels depends on sampling modules installed  
Sampler  
Digitizer  
CH 1  
CH 2  
Sampler  
Digitizer  
Sampling module  
Instrument  
Sampler  
Digitizer  
CH 3  
CH n  
Sampler  
Digitizer  
Sampling module  
Instrument  
Figure 3-7: Channel configuration  
Sampling Process  
Acquisition is the process of sampling an analog input signal of an input  
channel, converting it into digital data, and assembling it into a waveform  
record, which is then stored in acquisition memory. Sampling, then, is the  
process that provides one sample per trigger event and, when taken from  
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repeated trigger events, also provides the digitized signal data from which the  
instrument assembles the waveform record (see Figure 3--9 on page 3--29). The  
signal parts within the vertical range of the sampler are digitized. See  
Figure 3--8.  
+0.5 V  
0 V  
+0.5 V  
0 V 0 V  
- 0 . 5 V  
0 V  
- 0 . 5 V  
Digital values  
Input signal  
Sampled points  
Figure 3-8: Digital acquisition — sampling and digitizing  
Sampling Modes  
The instrument acquisition system can process the data as it is acquired,  
averaging or enveloping the waveform data to produce enhanced waveform  
records. Once the waveform record exists (enhanced or not), you can use the  
post-processing capabilities of the instrument to further process that record:  
perform measurements, waveform math, mask tests, and so on. Refer to Keys to  
Using on page 3--22 for description of all three acquisition modes.  
Waveform Record  
While sampling the input signal provides the data that makes up the waveform  
record for any given channel, the instrument builds the waveform record through  
use of some common parameters (commonmeans they affect the waveforms in  
all channels).  
Figure 3--9 shows how these common parameters define the waveform record; as  
shown in the figure, they define where in the data stream data is taken and how  
much data is taken. Locate the following parameters in the figure:  
H
Sample Interval. The precise time between sample points taken during  
acquisition.  
H
H
Record Length. The number of samples required to fill a waveform record.  
Trigger Point. The trigger point marks the time zero in a waveform record.  
All waveform samples are located in time with respect to the trigger point.  
H
Horizontal Delay. The time lapse from the trigger point to the first sample  
taken (first point in the waveform record). It is set indirectly by setting the  
horizontal position (see Horizontal Position and the Horizontal Reference on  
page 3--59).  
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Sample interval  
First sampled and  
digitized point  
Waveform record acquired  
over many acquisitions,  
1 sample per acquisition  
Recurring trigger events  
from trigger signal  
Record length  
Horizontal delay  
Figure 3-9: The waveform record and its defining parameters  
As Figure 3--9 shows, the instrument acquires points in order from left to right,  
with each point from a separate trigger event, and delayed from that event by:  
horizontal delay + (sample interval x (sample number -- 1))  
When all the points in the waveform record have been sampled and digitized, the  
waveform record is in acquisition memory and becomes available for display (or  
use in math waveforms, storing, exporting, and elsewhere). See Acquisition  
Cycle, which follows.  
For a control-oriented discussion of the waveform record, see:  
H
H
Horizontal Acquisition Window Considerations on page 3--17.  
Horizontal Scale vs. Record Length vs. Sample Interval vs. Resolution on  
page 3--19.  
The process of building a record is a subpart the acquisition cycle, which  
describes how the instrument cycles through recognizing a trigger, taking a  
sample and processing it according to sample mode, and adding it to a waveform  
record. This manual describes the normal acquisition cycle in Process Overview  
Map on page 2--6. Note the following points regarding acquisition cycles:  
Acquisition Cycle  
H
A waveform record exists, either on display or as an icon on the waveform  
bar, until it is replaced by a more recent acquisition or until you clear the  
record. The process of clearing waveform records is described on page 3--26.  
H
Choose the FrameScan cycle when you want to test for anomalies in  
Pseudo-Random Bit Streams. See FrameScan Acquisitions on page 3--30.  
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FrameScan Acquisitions  
This instrument can modify its normal acquisition process to help you analyze  
pattern-dependent failures in high bit-rate communications signals.  
Why Use?  
FrameScan acquisitions allow detailed display and analysis of individual,  
complete waveforms or of the bit sequences leading up to a failure. This ability  
to identify the specific patterns that caused the failures makes using FrameScan  
mode superior to traditional methods. Traditional methods include:  
H
creating an eye diagram, which is a statistical representation of signal, using  
clock-triggered sampling oscilloscope.  
H
bit-error testing to find the total number of errors in a frame.  
These methods are time consuming to use and neither can examine in detail the  
pattern driving the failure.  
Whats Special?  
FrameScan acquisition mode offers the following advantages.  
Breakthrough time base stability. Timing accuracy varies no more than 0.1 part  
per million from trigger event to data point, providing the stability needed to  
examine signals of almost any length for pattern-dependent failures.  
Flexible set-up support. Set bit rates manually or set a bit rate based on a  
communication standard. Then set the horizontal scale manually or invoke a  
custom autoset: Bit/Eye-Pattern Autoset, if you have set an independent bit rate,  
or Standard-Mask Autoset, if you set bit rate based on a communication  
standard.  
Identification and analysis of pattern-dependent failures. FrameScan acquisition,  
when used with mask testing and Stop After condition acquisition, can automati-  
cally determine the bit at which a pattern-dependent failure occurred.  
Improved noise resolution on low-power communication signals. The instrument  
can use Average acquisition mode on Eye diagrams when acquiring using  
FrameScan mode. Averaging provides the noise resolution that the examination  
of many of todays low-power communication signals can require. FrameScan  
mode results in sequentially acquired data which can be averaged; normal eye  
diagrams acquire data randomly and cannot be averaged. Compare the noise of  
the waveforms that follow. The right waveform is averaged; the left is not.  
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Whats Excluded?  
The instrument must be in Average or Sample acquisition modes; FrameScan  
excludes Envelope acquisition mode.  
Keys to Using  
The key points that follow describe FrameScan mode operating behavior and  
provide background to help you to use this feature.  
Determine Start Bit and Scan Bits. You need to know the bit in the bit stream at  
which you want to start the scan, the appropriate horizontal scale, the starting  
horizontal position, and the total number of bits for the desired FrameScan cycle.  
How FrameScan Mode Acquires. FrameScan mode alters the normal acquisition  
sequence in order to scan a pseudo-random bit sequence (PRBS) or another  
repetitive bit stream to acquire one bit at time in the same sequence found in the  
bit stream:  
H
Triggering is synchronous with the bit streams (framing signal) of the  
communication signal you want to scan, which results in the acquisition of a  
single sample prior the scanning of the next bit. You must supply an external  
trigger source that is synchronous with the frame; possible sources are  
external frame trigger/sync signals from a pattern generator or from a BERT  
(Bit Error Rate Tester).  
H
Acquisition operates in a scanning mode, where:  
a. horizontal position is set to acquire the first bit, which the acquisition  
system acquires as a subframe (see Figure 3--10 on page 3--32).  
b. horizontal position is incremented one-bit period (1/bit rate), and then  
the acquisition system acquires the second bit as a subframe. The  
duration of each subframe acquisition is set to provide about a 20%  
overlap between frames.  
c. This sequence of incrementing, and then acquiring the next bit,  
continues until the instrument acquires the number of bits you specify  
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for the frame, or until acquisition stops due to a specific test condition,  
such as the failure of a mask test.  
The resulting horizontally skewed FrameScan acquisitions display successive  
individual bits acquired in increasing time order. FrameScan acquisitions can  
continue through an entire frame of data if needed to help you to uncover faulty  
bit sequences leading up to pattern-dependent failures.  
Subframe 1  
Subframe 3  
Subframe 5  
Subframe 2  
Subframe 4  
h  
h  
h  
h  
+
+
+
+
=
Subframe 1  
Notes:  
h is the horizontal position change = one bit period (=1/bit-rate)  
Subframe 2  
Subframe 3  
Subframe 4  
Subframe 5  
Accumulated  
acquisitions  
Subframe acquisition duration is 40% greater than the bit period  
Figure 3-10: How FrameScan acquisition works (scanning on a 127-bit PRBS  
shown)  
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To Acquire in  
FrameScan Mode  
Use the procedure that follows to set up the instrument to acquire in FrameScan  
mode.  
Overview  
To acquire in FrameScan mode  
Control elements and resources  
Prerequisites 1. The instrument must have an appropriate sampling  
module in place before powering on the instrument.  
Instrument must be powered up.  
2. The signal to be scanned must be input to a channel  
and an appropriate external framing signal must be  
applied to the trigger input.  
H
See sampling-module user manuals for  
sampling module installation.  
H
See page 3-24 for acquisition setup and  
page 3-48 for trigger setup in this manual.  
3. The acquisition mode must be set to Sample or  
Average. Envelope cannot be used with FrameScan  
acquisitions.  
4. The vertical and horizontal controls and triggering must  
be set to acquire the signal.  
Access the 5. From the application menu bar, select Setup, and then  
FrameScan  
controls  
select Horizontal. See right.  
Set the frame 6. In the Horz Setup dialog box, click the Units Bits option  
duration  
button.  
Check for bits units  
7. Enter the total number of bits you wish to scan (the  
frame duration) in the Scan Bits box. You must always  
set this parameter manually.  
Tip. You can set Units to Seconds if you prefer, but  
Bits usually makes the set up and use of FrameScan  
acquisition easier.  
Enter bits to be scanned  
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Acquiring Waveforms  
Overview  
To acquire in FrameScan mode (cont.)  
Control elements and resources  
Set the bit rate 8. Set the horizontal scale so one acquisition record is  
equal to one bit. Use one of the two methods that follow:  
Select a comm.  
standard, or...  
H
Automatic: If your signal to be scanned matches a  
communications standard, select it from the Comm  
Standard list. Choosing a standard sets the bit rate  
and start bit; otherwise, if you know the bit rate, you  
can set the bit rate manually using the Bit Rate  
box.  
Set the bit rate  
manually  
Set to 1/8 bit  
per division  
H
Manual: Adjust the Scale control to a setting that  
results in a display of both edges of the bit. For  
example, setting 1/8 of a bit per division (0.125  
bits/div) yields 1 bit in 8 divisions, which fits nicely  
on screen.  
Set the starting 9. Set the initial horizontal position to the first bit you want  
horizontal posi-  
tion  
First set the  
start bit, ...  
to acquire. Use one of the two methods that follow:  
H
Automatic: Enter your desired start bit location, and  
then check the Auto Position box to enable the  
instrument to set the position as near as possible to  
match the bit specified in the Start Bit box.  
and then enable  
Auto Position  
H
Manual: Adjust the Position control to align the  
start of a bit to desired location in the frame.  
Or set manually  
Tip. The latter method is useful when you need to  
manually align a bit or waveform to a mask on the  
display.  
Enable 10. In the dialog box, click to check the FrameScan  
Enabled box. See right.  
Check to  
start scan  
FrameScan  
11. To restart the scan at the first bit at any time, click the  
Reset button.  
Click to  
restart scan  
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Acquiring Waveforms  
Overview  
To acquire in FrameScan mode (cont.)  
Control elements and resources  
Set a display 12. If you want to display the frame-scanned acquisition as  
mode  
an eye diagram, set one of the following display modes:  
H
Select Infinite Persistence or Variable Persis-  
tence in the Display Setup dialog box (from the  
application menu bar, select Setup, and then  
select Display).  
H
Right click the waveform icon (left side of the  
screen in the waveform bar) of the waveform being  
scanned and select Color Grade in the menu.  
For more 13. For more help on FrameScan acquisitions, click the  
information  
Help button in the Setup dialog box to access  
contextual help on screen.  
See page 3-167 to learn about using online help.  
End of Procedure  
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Acquiring Waveforms  
To Catch a Bit Error  
FrameScan Acquisition, when coupled with mask testing, provides the tool you  
need to capture a defective bit and examine the pattern leading up to it.  
Overview  
To catch a bit error  
Control elements and resources  
Prerequisites 1. The instrument should be set up per the previous  
procedure.  
2. Pause the acquisition system (push the Run/Stop  
button on the front-panel).  
H
See To Acquire in FrameScan Mode  
page 3-33.  
3. Infinite persistence and color grading display modes  
should be off if turned on in the previous procedure.  
Enable 4. From the application menu bar, select Setup, and then  
select Mask. (See right.)  
mask testing  
5. Use the Mask Setup dialog box to set up for mask  
testing as you would for nonFrameScan acquisitions.  
See Using Mask Testing on page 3-141 for information  
about using Mask testing. Be sure to enable the mask.  
Tip. If you selected a communication standard when you  
set the FrameScan bit rate (see step 8 on page 3-34),  
the same standard will be preselected in the Mask  
Setup dialog box.  
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Acquiring Waveforms  
Overview  
To catch a bit error (cont.)  
Control elements and resources  
Set conditional 6. From the application menu bar, select Setup, and then  
acquisition and  
start testing  
select Acquire.  
7. In the Acq Setup dialog box (see right), check the  
Condition option under Stop After.  
8. In the Condition pulldown list, select Mask Total Hits  
and set a count of one in the count box. These settings  
will stop acquisition on a violation of any of the masked  
areas on screen. See below.  
For more 9. For more help on using FrameScan acquisitions, click  
information  
the Help button in the Horz Setup dialog box to  
display contextual help on screen.  
See page 3-167 to learn about using online help.  
End of Procedure  
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Acquiring Waveforms  
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Triggering  
To properly acquire waveforms to sample a signal and assemble it into a  
waveform record you need to set up the instrument trigger conditions. This  
section provides an overview of the instrument trigger features and their use.  
Signal processing  
& transformation  
system  
Acquisition  
system  
Output and  
storage  
User Interface  
and display  
Sampling  
module  
Trigger  
system  
Time base  
system  
Edge Triggering  
The instrument supports direct-edge triggering, which triggers as described in  
Keys to Using on page 3--40. You must provide an external trigger source, except  
when using clock-recovery triggering from an optical sampling module equipped  
with the clock-recovery option or using the internal clock (as when TDR testing).  
Why Use?  
Use triggering controls to control the acquisition window, so that the instrument  
acquires the waveform data you want. The trigger event, when synchronized to  
the input signal, defines the horizontal acquisition window. By choosing the  
trigger event and adjusting the horizontal position (delay between trigger event  
and the horizontal reference point) you control the location in the data stream  
(the input signal) from which the waveform record is taken.  
Whats Special?  
Clock Recovery. If you use optical sampling modules that include a clock-recov-  
ery option, you can use this recovered clock to trigger the instrument for specific  
DATA rates and formats that are compatible with the specific CR option in the  
optical module. Also, if you use optical sampling modules that support  
continuous-rate clock recovery, you can specify any custom clock-recovery rate  
within the range supported by the module. Refer to Sampling Modules Supported  
on page 1--4 to see those modules that support continuous-rate clock recovery.  
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Triggering  
Gated Triggering. For instruments equipped with Option GT, the system allows  
triggering to be enabled and disabled (gated) based on a TTL signal at a rear  
panel input. See To Use Gated Trigger on page 3--50.  
Keys to Using  
The key points that follow describe operating considerations for setting up to  
trigger on your waveforms.  
Triggering Process. When a trigger event occurs, the instrument acquires a  
sample in the process of building a waveform record. The trigger event  
establishes the time-zero point in the waveform record and all samples are  
measured with respect to that event.  
The trigger event starts waveform acquisition. A trigger event occurs when the  
trigger source (the signal that the trigger circuit monitors) passes through a  
specified voltage level in a specified direction (the trigger slope). When a trigger  
event occurs, the instrument acquires one sample of the input signal. When the  
next trigger event occurs, the instrument acquires the next sample. This process  
continues until the entire record is filled with acquired samples. Without a  
trigger, the instrument does not acquire any samples. See Figure 3--9 on  
page 3--29. This behavior differs from that of real time acquisition systems,  
which can acquire a complete waveform record from a single trigger event.  
Triggering is Global. The instrument uses the trigger event to acquire across all  
active channels. This same trigger is also common across all time bases currently  
active (one or more of Main, Mag1 and Mag2).  
Edge-Trigger Type. This instrument supports edge triggering only, in which edge  
triggers gate a series of acquisitions.  
The slope control determines whether the instrument recognizes the trigger point  
on the rising or the falling edge of a signal. See Figure 3--11. You can set the  
trigger slope from the toolbar at the top of the display or in the Trigger Setup  
dialog box.  
The level control determines where on that edge the trigger point occurs. The  
instrument lets you set the trigger level from the front panel with the Trigger  
LEVEL knob.  
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Triggering  
Positive-going edge  
Negative-going edge  
Trigger level  
can be adjusted  
vertically.  
Trigger slope can be positive or negative, with  
trigger point occurring on the slope specified.  
Figure 3-11: Slope and level define the trigger event  
Trigger Modes. The trigger modes control the behavior of the instrument when  
not triggered:  
H
Normal mode sets the instrument to acquire a waveform only when  
triggered. Normal mode does not acquire data if triggering stops, rather the  
last waveform records acquired remains frozenon the display (if the  
channels containing them are displayed). If no last waveform exists, none is  
displayed. See Figure 3--12, Normal trigger mode.  
H
Auto mode sets the instrument to acquire a waveform even if a trigger event  
does not occur. Auto mode uses a timer that starts after trigger rearm. If the  
trigger circuit does not detect a trigger after this timeout (about 100 ms), it  
auto triggers, forcing enough trigger events to acquire all active channels. In  
the case of repetitive acquisitions in automatic trigger mode, waveform  
samples are acquired, but at different places in the data stream (synchroniza-  
tion is lost). See Figure 3--12, Automatic trigger mode. If you do not apply a  
signal to any channel displayed, a baseline is displayed for that channel.  
Triggered waveform  
Untriggered waveforms  
Normal trigger mode  
Automatic trigger mode  
Figure 3-12: Triggered versus untriggered displays  
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Triggering  
Trigger Sources. The trigger source provides the signal that the trigger system  
monitors. The source can be:  
H
the internal clock of the instrument (TDR clock rate), with user-selectable  
clock frequencies. The Internal Clock Out connector supplies a replica of the  
internal clock at the instrument front panel. See Figure 3--13 on page 3--42.  
H
an external signal coupled to one of the trigger input connectors (see  
Figure 3--13) on the front panel:  
H
External Direct, DC coupled and usable with signals up to at least  
3.0 GHz  
H
External Prescale, divided by 8 and usable with signals up to at least  
12.5 GHz  
NOTE. The upper limit is determined by signal input level; this is enhanced by  
the optional accessory 80A01.  
H
an internal clock-recovery trigger provided by an optical sampling module  
equipped with a clock-recovery option. Clock recovery is user-selectable for  
triggering rates that depend on the sampling module used; for example,  
either 622 Mbps (OC-12/STM-4 standards) or 2.488 Gbps (OC-48/STM-16  
standards) for the 80C01-CR Optical Sampling Module.  
Some optical sampling modules support continuous-rate clock recovery. If  
you have such a module installed, a user-defined custom clock recovery rate  
is selectable from the Trigger Source Setup menu.  
Internal clock output  
Trigger  
prescale  
input  
Trigger  
direct  
input  
Trigger  
probe  
power  
Figure 3-13: Trigger inputs  
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Triggering  
Use a trigger source that is synchronized with the signal you are sampling and  
displaying. Selection of your trigger source depends on your application, as  
shown in Table 3--1.  
Table 3-1: Application-based triggering  
Application  
Source to use  
Communications (optical)  
serial NRZ data signals  
Set source to Clock Recovery, set the clock-recovery type, and  
use an optical sampling module equipped with a clock-recovery  
option supporting the specific data rate of the serial optical  
signal.  
A custom clock recovery rate can be defined by the user if the  
optical module supports a continuous-rate clock recovery. Refer  
to Sampling Modules Supported on page 1-4 to see those  
modules that support continuous-rate clock recovery.  
TDR measurement using an  
electrical sampling module  
equipped with TDR  
Set source to Internal Clock to use the internal clock of the  
instrument (TDR clock), and select the appropriate clock  
frequency. Disconnect any signal connected to the External  
10MHz Reference Input when using the Internal clock.  
Measurements on systems  
Set source to External Direct or External Prescaler as  
with a synchronized pretrigger appropriate (see Trigger Source Connectors) and connect the  
signal pretrigger signal.  
Any application requiring that Set source to External Direct or External Prescaler as  
the input signal provide the  
trigger  
appropriate (see Trigger Source Connectors). Use a signal  
splitter or power divider to couple to both the Ext Direct or  
Prescaler input and the input channel, so that the sampled  
signal is also the trigger signal.  
Any application requiring that Set source to External Direct, and use a Tektronix probe as  
you probe the trigger source  
described in Probe-to-Trigger Source Connection on  
page 3-44.  
Any application requiring that Set source to External Direct, and use a TTL connection to  
you perform special measure- trigger gate as described in To Use Gated Trigger on  
ments using gated trigger.  
page 3-50.  
Trigger Source and ESD. Observe static precautions when coupling trigger  
sources to this instrument.  
CAUTION. Electrostatic-static damage can permanently degrade and damage the  
inputs to this instrument, its sampling modules, and accessory probes. You must  
take proper precautions; please read your sampling module user manual for  
more information.  
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Triggering  
Trigger Source Connectors. External triggers can be connected to either the  
Trigger DIRECT or Trigger PRESCALE connectors on the front panel (see  
Figure 3--13):  
H
Signals connected to the PRESCALE connector are divided by eight and  
then fed to the trigger circuits.  
H
Signals connected to the DIRECT connector are fed directly to the trigger  
circuitry. The signal is DC coupled and can be up to 3.0 GHz.  
When using a given trigger source, you should disconnect any other trigger  
source from the front panel to ensure specified performance. Specifically:  
H
Do not connect a signal to the Trigger Direct or Trigger Prescale front-panel  
connector unless youve selected that input as the trigger source.  
H
Do not connect a signal to the External 10 MHz Reference front-panel  
connector unless you have selected that input as the timebase mode in the  
Horizontal setup dialog box.  
Probe-to-Trigger Source Connection. You can connect probes, such as the P6207  
and P6209, to the Trigger DIRECT input connector of the instrument. Observe  
all static precautions outlined in the documentation for the probe you choose  
while following these steps:  
H
H
H
Connect the probe-power connector to the TEKPROBE-SMA compatible  
probe (Level 1 or 2 only).  
Connect the probe signal connector (probe must have an SMA connector) to  
the Trigger DIRECT source input (not the PRESCALE source input).  
Connect the probe input to the signal that is to supply the trigger source.  
The probe you attach preconditions the trigger signal for its input just as other  
probes do for the vertical inputs. More specifically, a probe attached to the Trigger  
DIRECT input may affect trigger-level range, resolution, and units as follows:  
H
H
Trigger-level units will match those of the probe.  
The trigger level for probes that have offset control is adjusted by changing  
the offset of the connected probe and is limited by the range, resolution, and  
offset characteristics of the probe.  
H
When a connected probe is removed and a different probe installed, the  
instrument attempts to keep the same absolute trigger level as the current  
trigger-level setting.  
Note that the probe parameters (range, resolution, offset scale, and units) that are  
relevant to the trigger circuit affect the Trigger Level control.  
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Triggering  
Gated Trigger Connector (Option GT equipped). You can attach a BNC cable to the  
External Gate input at rear panel (TTL connection). Two conditions must be  
satisfied to get a stable display of waveform data:  
H
The channel and trigger must be otherwise triggerable without the trigger  
gate.  
H
The gating signal must be at a TTL high; the triggering system enabled and  
the instrument will acquire.  
Note that the function of the trigger gate is to selectively exclude data from  
acquisition by means of gating the trigger on and off, and it need not be  
synchronized with either channel or trigger. See procedure on page 3--50 for  
more information on setting up gated trigger.  
Enhanced Triggering. These features (see note) can help stabilize triggering and  
perform special measurements:  
H
High Frequency Triggering. When you enable the High Frequency  
triggering control, the instrument increases trigger sensitivity of the trigger  
circuit by decreasing hysteresis (a transition or noise band), allowing  
triggering on higher frequency signals.  
H
Metastability Reject. When you enable Metastability Reject, the instrument  
replaces the acquired sample with a null sample if it detects a potential  
metastable condition. A metastable condition occurs when both the trigger  
input signal and the holdoff-generated enable signal arrive at the internal  
trigger recognizer at virtually the same time.  
H
Gated Triggering. When you enable the Gated trigger control, the trigger  
and the External Gate input are applied to the instrument through what is in  
effect an AND function. Gated triggering is applied to acquire and to mask  
test or otherwise characterize signals like those found in extremely long  
transmission carriers, such as undersea communication fibres. Since long  
fibres are difficult to test, user-supplied test fixtures are used to repeat the  
test signal through a short loop of the cable to simulate traveling longer  
distances along its entire length. The signal is picked off and connected to  
the instrument.  
NOTE. Gated trigger is available only when ordered as Option GT at the time the  
instrument ships.  
Adjusting Holdoff. Trigger holdoff can help stabilize triggering. When you adjust  
holdoff, the instrument changes the time it waits before rearming its trigger  
circuit after acquiring a sample. Before rearming, trigger circuitry cannot  
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Triggering  
recognize when the next trigger conditions are satisfied and cannot generate the  
next trigger event. When instrument is triggering on undesired events  
(Figure 3--14, top waveform), you adjust holdoff to obtain stable triggering.  
Holdoff  
Holdoff  
Holdoff  
Trigger level  
Indicates trigger points  
Holdoff  
Holdoff  
Holdoff  
Holdoff  
Trigger level  
At the longer holdoff time for the top waveform, triggering occurs at valid, but undesired, trigger  
events. With a shorter holdoff set for the bottom waveform, triggers all occur on the first pulse in the  
burst, which results in a stable display.  
Figure 3-14: Holdoff adjustment can prevent false triggers  
Usable Holdoff. The holdoff time the instrument can use varies within limits. The  
maximum holdoff the instrument can achieve is the 50 ms specified in Specifica-  
tion on page Table A--3 on page A--3.  
The minimum holdoff used depends on hardware constraints, which do not  
change, and certain control settings, which you can control:  
H
The instrument hardware constrains the minimum usable holdoff time to the  
greater of the trigger-to-end-of-record time or 5 s.  
H
The trigger-to-end-of-record time (EORT) is the time from the trigger event  
to the last sample in the waveform record and is calculated as:  
EORT = Horiz. Position + (1 -- 0.01 x Horiz. Ref.) x Time/Div x 10  
divisions) + Channel Deskew  
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Triggering  
For example:  
EORT = 6 s + (1--0.1(.5) x 1 s/div x 10 div + 0  
= 6 s + 5 = 11 s, when:  
Horizontal position = 6 s  
Horizontal Ref = 50%  
Time/Division = 1 s/div  
Channel Deskew = 0 (set to minimum)  
In this example, because 11 s is greater than 5 s, the current control settings  
determine the minimum usable holdoff the instrument can use.  
Trigger point  
EORT  
Time to EORT  
Horizontal position  
Horizontal  
delay  
(19 ns min.)  
Time  
zero  
Time of first point  
Horizontal  
reference point  
Time of last point  
(EORT)  
Figure 3-15: Trigger to End Of Record Time (EORT)  
Requested vs Actual Holdoff. The instrument operates with two holdoff values:  
H
Requested -- the last value requested in the Trigger Setup dialog box. You  
can set times from 5 s - 50 ms, but the time requested becomes the actual  
time used only if it meets the requirements just described for Actual.  
Otherwise, the holdoff-time value requested is held for later use as described  
for Actual.  
H
Actual -- in effect the holdoff time; that is, the time the instrument is using or  
will use when acquiring data. The instrument uses it when the minimum  
usable holdoff (determined as described in Usable Holdoff, on page 3--46) is  
greater than the requested value. The instrument retains and changes to the  
requested value if the user changes control settings such that the requested  
value exceeds the minimum usable holdoff. Actual values can range from  
5 s -- 55 ms.  
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Triggering  
To Trigger  
Use the procedure that follows when setting up the instrument to trigger  
acquisitions.  
Overview  
To trigger  
Control elements and resources  
Prerequisites 1. The instrument must be installed with sampling modules  
in place. Acquisition system should be set to Run, and  
the vertical and horizontal controls should be set  
appropriately for the signal to be acquired.  
See Sampling Module User Manuals for sampling module  
installation. See page 3-24 of this manual for acquisition  
setup.  
Apply a trigger 2. Connect the signal to be triggered on using proper  
signal  
probing/connecting techniques for your application.  
Typical approaches include using:  
H
External Trigger, Direct or Prescale. Portion of the  
input signal coupled to the appropriate input (see  
right) using a power divider on input signal.  
H
H
Internal Clock. No external trigger required.  
Clock Recovery. Recovered clock signal obtained  
from those optical sampling modules supporting  
clock recovery (connection internal through the  
sampling module; no external trigger connection  
required).  
A custom clock recovery rate can be defined by the  
user if the optical module supports a continuous-  
rate clock recovery. Refer to Sampling Modules  
Supported on page 1-4 to see those modules that  
support continuous-rate clock recovery.  
See Table 3-1 on page 3-43 for more information.  
Note. When using any of the above sources, disconnect  
any signal connected to the other source trigger and  
clock sources. See External 10MHz Reference Input  
when using the Internal clock).  
Source Menu  
Select source, 3. Click the Trig Source menu, and select the trigger  
slope, and  
level  
Slope button  
source to match your trigger signal in the pull-down  
menu (upper right corner of display).  
4. Click the Slope button to toggle to the trigger slope you  
want, positive or negative.  
5. Adjust the trigger level using the (Set Level to) 50% button  
or the Level list box as show at right, or using those on  
the front panel, shown in step 7.  
Level Controls  
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Triggering  
Overview  
To trigger (cont.)  
Control elements and resources  
Verify 6. When the instrument is triggered, the word Triggered is  
displayed in the toolbar on screen. You can use also the  
trigger lights to verify triggering status as follows:  
triggering  
H
READY lights when the instrument acquisition  
system is running but the trigger system is not  
receiving valid trigger events. This includes when  
auto triggering in absence of a trigger.  
H
H
TRIG’D lights when the instrument acquisition  
system is running and the trigger system is  
triggered.  
READY and TRIG’D are always off if acquisition is  
stopped.  
Trigger Menu button  
Other trigger 7. If you need to change the trigger mode or other settings,  
parameters  
push the Trigger MENU button to display the Trig Setup  
dialog box. From there, you can:  
H
H
Switch between Auto and Normal trigger modes  
If you have trouble triggering, you can adjust  
holdoff, which may help. For assistance with this  
control, see step 8.  
H
You may on occasion want to turn off metastable  
rejection; again, see step 8 for more information.  
For more 8. Press the Help button in the Trig Setup dialog box to  
information  
access the online assistance specific to triggering  
commands. You can also read about key trigger  
features in Keys to Using on page 3-40.  
See page 3-167 for information on online help.  
End of Procedure  
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Triggering  
To Use Gated Trigger  
Use the procedure that follows when setting up the instrument to use the gated  
trigger. Gated trigger is only available with Option GT installed.  
Overview  
To use gated trigger  
Control elements and resources  
Prerequisites 1. The Acquisition system should be set to Run, and the  
vertical and horizontal controls should be set appropri-  
ately for the signal to be acquired.  
2. Trigger on your input signal. Use the procedure To  
Trigger on page 3-48 as needed.  
See Sampling Module User Manuals for sampling module  
installation. See page 3-24 of this manual for acquisition  
setup.  
Note that you must supply the input signal and the TTL  
gating signal to the appropriate instrument inputs. The  
instrument does not control or generate these signals.  
Access the 3. From the application menu bar, select Setup, and then  
Setup trigger  
dialog box  
select Trigger. See right. You also can select this menu  
by pushing the Trigger MENU button.  
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Triggering  
Overview  
To use gated trigger (Cont.)  
Control elements and resources  
Enable gated 4. In the Enhanced Triggering options section of the dialog  
triggering  
box, check Gated Trigger.  
Check to  
enable  
5. Attach an appropriate TTL-gating signal to the  
TRIGGER GATE (TTL) rear-panel connector. Operation  
is as follows:  
Complete set up  
TRIGGER  
GATE (TTL)  
H
Triggering system will be disabled when the gating  
signal is a TTL low, and instrument will not acquire.  
H
The triggering system will be enabled when the  
gating signal is a TTL high, and the instrument will  
acquire.  
H
There is an internal pull -up on the Gated Trigger  
input such that if no drive signal is supplied or if the  
input is left unconnected, triggering will be enabled  
even if the Gated Trigger is selected in the Trig  
Setup dialog box.  
For more 6. Press the Help button in the Trig Setup dialog box to  
information  
access the online assistance specific to triggering  
commands. You can also read about key trigger  
features in Keys to Using on page 3-40.  
See page 3-167 for information on online help.  
End of Procedure  
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Triggering  
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Displaying Waveforms  
To make use of the waveforms you acquire, you will often want to display them.  
This instrument includes a flexible, customizable display that you can control to  
examine and analyze acquired waveforms. This section presents an overview of  
display operation in the topics Using the Waveform Display and Customizing the  
Display.  
Signal processing  
& transformation  
system  
Acquisition  
system  
Output and  
storage  
User Interface  
and display  
Sampling  
module  
Trigger  
system  
Time base  
system  
Using the Waveform Display  
The waveform display (see Figure 3--16) is part of the User Interface (UI)  
application. The UI takes up the entire screen of the instrument and the  
waveform display takes most of the UI. Some terms that are useful in discussing  
the waveform display follow.  
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Displaying Waveforms  
(2) Graticule  
(5) Horizontal reference  
(6) Preview mode indicator  
(3) Upper limit of graticule  
(selected waveform)  
(7) Main view  
(1) Waveform display  
(3) Lower limit of graticule  
(selected waveform)  
(7) Mag1 view  
(4) Horizontal scale readout (selected waveform)  
Figure 3-16: Display elements  
(1) Waveform display: the area where the waveforms appear. The display  
comprises the time bases and graticules, the waveforms, masks, histograms, and  
readouts.  
(2) Graticule: a grid marking the display area of a view. Each graticule is  
associated with its time base.  
(3) Upper and lower amplitude-limits readouts: the upper and lower boundary level  
of the graticule for the selected waveform.  
(4) Horizontal-scale readout: the horizontal scale of the selected waveform.  
(5) Horizontal reference: a control that you can position to set the point around  
which channel waveforms expand and contract horizontally on screen as you  
change the Horizontal Scale control.  
(6) Preview: a status field that indicates when all waveforms are being previewed  
(that is, displaying an approximation of the waveforms as they will appear when  
acquisition completes). This indicator may appear when you alter acquisition  
controls.  
(7) Main, Mag1, and Mag2 views: selectable objects displaying on screen in the  
display, each with its own display of any waveform that is currently turned on. A  
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Displaying Waveforms  
view is a representation of a signal on an associated time basethe Main time  
base with the Main view, which is always displayed, or one of the two Mag  
views, each with its own time base and graticule. The display of the Mag views  
can be turned on or off. You can display up to three views on screen (Main plus  
Mag1 and Mag2) at the same time.  
Touchscreen (not shown): a feature that lets you touch controls on screen to  
operate the instrument. See Mouse and Touchscreen Operation on page 3--60.  
Why Use?  
Use display features and controls to view, test, measure, and otherwise analyze  
your waveforms.  
Whats Special?  
This instrument provides a robust display. Some features of note follow.  
Flexible Display Control. Front-panel knobs and buttons support quick access to  
the most often used adjustmentsthose that display, position, and scale  
waveforms. Mouse, keyboard, and touchscreen interfaces support complete setup  
of all the display parameters.  
Multiple Time base Views. Three views, Main, plus Mag1 and Mag2, can be  
displayed simultaneously, each with its own time base. Live waveforms are  
acquired independently in each time base (C1 in Main is a different waveform  
than C1 in Mag1 or Mag2).  
All the displayed waveforms appear in each view that you display: if C1 and M1  
are displayed in Main, they also appear in Mag1 and Mag2 if you display those  
views. Reference waveforms will appear in all views as well, but, since they  
have a static time base setting (the time base setting with which they were  
saved), they will be identical in all views.  
Fast Access to Zoom. Waveform inspection has never been easier. Just click and  
drag a box around the feature of interest and it zooms horizontally to fill the  
screen, reacquired at a higher resolution.  
Preview Mode. The instrument automatically uses a preview display when control  
changes initiate reacquisition of waveform data. A preview display shows how  
the waveforms will look when acquisition completes. When the instrument  
finishes the processing of state changes, it removes the preview and displays the  
actual waveforms.  
Whats Excluded?  
Previewing of changes does not occur when the acquisition system is stopped;  
the data will not update on screen until acquisition is restarted.  
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Displaying Waveforms  
Keys to Using  
The key points that follow describe operating considerations for setting up the  
instrument time base views so that they best support your data-analysis tasks.  
Waveform Display. In general, the method of displaying a waveform is to define  
the waveform, and then turn it on. Table 3--2 summarizes this process as it  
applies to the different waveforms.  
Table 3-2: Defining and displaying waveforms  
Waveform1  
To define:  
To turn on:  
Channel:  
C1 - C8  
Install sampling modules in the instrument  
compartments.  
Push the Vertical CH button, and then push one of  
the numbered buttons 1 - 8.  
Reference: R1 - R8  
Define an active reference waveform by:  
Defining a reference waveform as is described at left  
turns on its display.  
H
saving a channel, reference, or math waveform  
to one of locations R1 - R8.  
After a waveform is defined, use the Vertical REF  
button with the waveform number buttons to turn the  
waveform on and off.  
H
recalling a waveform previously saved to a file  
into one of locations R1 - R8.  
Both of these operations can be performed from the  
File menu.  
Math:  
M1 - M8 Define a math waveform using existing sources  
(channel and reference waveforms, and measure-  
ment scalar values).  
When defining a math waveform, you turn it on in  
the Define Math dialog box.  
After the waveform is defined, use the Vertical  
MATH button with the waveform number buttons to  
turn the waveform on and off.  
This operation can be performed by selecting the  
Edit menu and then selecting Define Math.  
1
The waveform number buttons affect C1-C8, R1-R8, or M1-M8, depending on the Vertical Source button you push CH,  
REF, or MATH.  
Operations on Selected Waveforms. In general, the method of adjusting (vertically  
scaling, offsetting, position, and so on) is from the front panel: select the  
waveform using the Vertical source and waveform selection buttons, and then  
adjust it using the Vertical Scale, Offset, and Position knobs.  
Table 3--3 on page 3--57 summarizes operations you can perform for the three  
waveform types.  
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Displaying Waveforms  
Table 3-3: Operations performed based on the selected waveform  
Control function  
Waveform supports? Operating notes  
Ref  
Ch  
Math  
Vertical Scale  
Yes  
Yes  
Yes  
If more than one time base is displayed, these controls adjust the  
selected channel waveform in all time bases.  
Vertical Position  
Vertical Offset  
Yes  
Yes  
Yes  
Yes  
Yes  
Yes  
No  
No  
No  
No  
Yes  
No  
No  
No  
No  
Vertical offset is unavailable for channel waveforms displayed with rho  
or ohm units.  
Horizontal Scale  
Horizontal Position  
Horizontal Record Length  
All channel waveforms are adjusted globally in the selected time base.  
Math waveforms are not adjusted because their horizontal parameters  
are derived from their sources. Reference waveforms are not adjusted  
because they have fixed horizontal parameters determined at the time  
the waveform was saved.  
Automatic Source Selection  
for Automatic Measurements  
Yes  
Yes  
Yes  
Yes  
Yes  
No  
Yes  
Yes  
No  
Measurements, if selected from Measurements toolbar, use the  
selected waveform as the measurement target.  
Automatic Target Selection for  
Cursors  
If cursors are off, pushing the Cursor button on the front panel turns  
cursors on with the selected waveform as their target.  
Quick Horizontal Scale Adjust  
(Zoom)  
Dragging a box around a portion of the selected waveform adjusts  
horizontal scale to fill the screen with the boxed portion (see  
Quick-adjust the time base on page 3-63).  
Graticules. One graticule is displayed for the Main time base, and an additional  
graticule is displayed for each Mag time base that you turn on. Figure 3--16 on  
page 3--54 shows the elements of the time base graticules; the elements are the  
same for each time base displayed.  
Using Multiple Views. The methods of displaying (turning on) and selecting any  
time base view follow:  
H
Turn the view on: Press the Mag1 or Mag2 front-panel button once to turn on  
the Mag1 or Mag2 time base. The Main view is always (displayed); you  
cannot turn it off. Turning on a time base makes it active (selects it for  
adjustment).  
H
H
Select among displayed views: Press any time base view button to make it  
the active, selected time base. The button of the selected view is always lit  
amber.  
Turn off the selected Mag view: Once selected, press the Mag1 or Mag2  
button to turn off the time base. The Main time base becomes the selected  
time base.  
Operations on the Selected Time Base View. The method of adjusting (horizontal  
scaling and positioning, setting resolution/record length, and so on) is from the  
front panel: select the time base using the Horizontal time base selection buttons,  
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Displaying Waveforms  
and then adjust it using the Horizontal Scale, Resolution, and Position knobs.  
Only channel waveforms can have their horizontal parameters set directly.  
Table 3--3 shows how horizontal operations relate to the waveform types; the key  
points to remember follow:  
H
H
H
H
As Table 3--3 shows, horizontal operations affect all channel waveforms, but  
in the selected view only. For example, you can select each time base in turn  
and set one horizontal scale for all channel waveforms in the Main view,  
another horizontal scale for those in the Mag1 view, and a third for those in  
the Mag2 view.  
The instrument displays a reference waveform with horizontal settings in  
effect at the time it was saved. You cannot adjust these settings; the  
instrument disables the horizontal controls when you select a reference  
waveform. See Saving and Recalling Waveforms on page 3--120 for more  
information on reference waveforms.  
The instrument displays a math waveform with the horizontal settings  
derived from its math expression. You cannot change these directly; the  
instrument disables the horizontal controls when you select a math wave-  
form. See Creating Math Waveforms on page 3--101 for more information on  
math waveforms.  
All waveforms in each time base are displayed fit-to-screen; that is, within  
the full 10 horizontal divisions that the graticule provides.  
Waveform Operations that Cross Time Base Views. Unlike the horizontal controls  
just described, some controls apply to all time base views:  
H
H
Turning a waveform on or off in any view displays or removes it from all  
views.  
Selecting a waveform in any view makes it the selected waveform in all  
views; for example, select C1 in Main, and then select Mag1. C1 is the  
selected waveform in Mag1. Turn on Mag2, and Mag2 displays on screen  
with C1 selected.  
H
Vertical adjustments on a waveform in any time base adjust the waveform in  
all time bases.  
Display Controls vs. Acquisition Controls. For channel waveforms, the vertical  
offset control and the horizontal controls you set adjust the instrument acquisi-  
tion parameters. See the following descriptions for more information:  
H
H
Vertical Acquisition Window Considerations on page 3--14  
Horizontal Acquisition Window Considerations on page 3--17  
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Mag1 and Mag2 are Magnifying Timebases. The Mag1 and Mag2 time bases are so  
named because they cannot be set to a more coarse (slower) horizontal scale than  
that of the Main. When set to a more fine (faster) horizontal scale, they can be  
thought of as magnifying a segment of the Main time base. In short:  
H
H
each Mag time base scale sets the size of an aperture on the Main time base.  
each Mag time base position setting locates the aperture within the Main  
time base.  
H
each Mag time base graticule displays, across its full horizontal width  
(10 divisions), the contents of the aperture.  
See To Display Waveforms in a Mag View on page 3--64 for a procedure that  
demonstrates this operating characteristic.  
Horizontal Position and the Horizontal Reference. The time values you set for  
horizontal position are from the trigger point to the horizontal reference point.  
This is not the time from the trigger point to the start of the waveform record  
unless you set the horizontal reference to 0%. See Figure 3--17.  
Trigger point  
50 ms max.  
Horizontal position  
Horizontal  
delay  
(19 ns min.)  
Time  
zero  
Time of first point  
Horizontal  
reference point  
Time of last point  
Figure 3-17: Horizontal position includes time to Horizontal Reference  
NOTE. The time from the trigger to the time of the first point sampled is the  
horizontal delay. Note that horizontal delay is set indirectly by the horizontal  
position and horizontal reference settings:  
Time of first point = Horizontal Position - (10 divs x horizontal scale in sec/div x Horizontal  
Reference / 100)  
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Displaying Waveforms  
Horizontal Units. You can specify the time values in seconds, bits or distance  
from the Horizontal Setup dialog box. When you select Distance as the timebase  
units, the timebase scale and position controls and the readouts use (appear with)  
distance units. You can select from meters, feet, or inches as your distance unit.  
The timing measurement results remain as seconds.  
The dialog box also provides a Dielectric Const(ant) and Prop(agation) Velocity  
controls with which you can select either the effective dielectric constant of the  
device under test or its propagation velocity (they interact, so set one or the  
other). Distance units and these other two controls are useful when doing TDR  
measurements and testing. You may want to turn on distance units and set the  
dielectric constant or propagation velocity when making such measurements.  
The formula is:  
D = vT  
where:  
D = distance per division  
co  
DielectricConst  
v= propogation velocity, =  
co = speed of light in a vacuum, = 2.997925 e8 meterss  
time per division  
T =  
Velocity of Propagation (vp) is a measure of how fast a signal travels in that  
transmission line.  
DielectricConst is the relative effective dielectric constant of the propagation  
media.  
Mouse and Touchscreen Operation. This instrument ships with a mouse and  
keyboard to give you more options for instrument control. However, for some  
installations, you might not have sufficient work space to install the mouse or  
keyboard. For most operations, you can use the touchscreen instead.  
Table 3--4 lists some operations and the mouse/touchscreen equivalents. The  
instrument ships with two styluses. Using a stylus can make it easier to perform  
touchscreen operations.  
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Table 3-4: Equivalent mouse and touchscreen operations  
Operations  
Mouse  
Stylus or finger  
Select waveforms  
Left click object on screen  
Touch object on screen  
Push toolbar and dialog box buttons  
Display menus and select menu items  
Activate list boxes  
Position cursors on screen, draw a zoom  
box  
Left click and drag  
Right click object  
Touch and drag  
Display a pop up menu for a channel or a  
readout  
Touch and hold (dont move stylus)  
Type a value in a list box  
Click the keyboard icon to pop up the  
virtual keyboard; click to type in the value  
Touch the keyboard icon to pop up the  
virtual keyboard; touch to type in the value  
you want (or use the peripheral keyboard if you want  
installed)  
Display a tool tip  
Rest pointer over UI button or label  
None  
Touch the appropriate button (see below),  
and then touch a control in the UI application  
Display Whats This Help  
Click the appropriate button (see below),  
and then click a control in the UI application  
main screen button  
dialog box button  
main screen button  
dialog box button  
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Displaying Waveforms  
To Display Waveforms in  
the Main Time Base View  
Use the procedure that follows to become familiar with the display adjustments  
you can make.  
Overview  
To control the Main view  
Related control elements and resources  
Prerequisites 1. The instrument must be installed with sampling modules  
in place.  
2. The acquisition system should be set to run  
continuously.  
See the sampling Module user manuals for sampling  
module installation. See page 3-24 for acquisition  
setup and page 3-48 for trigger setup in this manual.  
3. Also, an appropriate trigger signal must be applied to  
the instrument and triggering must be set up.  
4. Push a Vertical Source button (turns amber) to  
assign the numbered buttons 1-8 to operate on  
channel, reference, or math waveforms. Push a  
numbered button 1-8 to select the waveform (it  
displays).  
Set the vertical  
display  
parameters  
A waveform button lights when its waveform is on:  
H
Lighted green: waveform is on but not  
selected  
H
Lighted amber: waveform is on and selected  
Hint. Step 4 assumes any reference or math  
waveforms you select are defined. See Table 3-2  
on page 3-56 if you need help defining these  
waveforms.  
5. Use the Vertical knobs to achieve a good display  
of each waveform you select.  
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Displaying Waveforms  
Overview  
To control the Main view (cont.)  
Related control elements and resources  
Set the horizon-  
tal display  
parameters  
6. Push the View Main button to make sure the Main time  
base view is selected. Use the Horizontal knobs to scale  
and position the waveform on screen and to set sample  
resolution.  
Positioned Horizontally  
Scaled Horizontally  
The Resolution knob sets the record length. (See  
discussion on page 3-19.)  
Push the Set to 50% button if required to stabilize  
display.  
Horizontal reference  
Adjust the 7. To adjust the point around which the waveforms  
Horizontal  
Reference  
expand and contract, click the Horizontal reference  
and drag it left or right on screen.  
Move the Horizontal reference along the horizontal  
axis until it aligns to the point on the waveform you  
want to be stationary on screen.  
8. Release the Horizontal reference, and then adjust the  
Horizontal Scale knob.  
Quick-adjust 9. To quickly rescale a portion of a channel waveform so  
the time base  
(Zoom)  
it expands to fill the 10 divisions on screen. Click on  
the screen and drag a box around the portion of the  
waveform you want to zoom.  
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Displaying Waveforms  
Overview  
To control the Main view (cont.)  
Related control elements and resources  
Explore the 10. The next procedure describes how to set up and  
Mag time base  
controls  
control the Mag time bases.  
See To Display Waveforms in a Mag View on page 3-64.  
End of Procedure  
To Display Waveforms  
in a Mag View  
Use the procedure that follows to become familiar with the display adjustments  
you can make when using the Mag 1 and Mag 2 time base views.  
Overview  
To control a Mag view  
Related control elements and resources  
Prerequisites 1. Set up as from the last procedure. See right.  
See To Display Waveforms in the Main Timebase  
on page 3-62.  
Turn on a Mag 2. Push the Mag1 or Mag2 View button (turns  
view  
amber) to display a Mag view. (See right.)  
A numbered button lights when its waveform is  
on:  
H
H
Lighted green: view is on but not selected  
Lighted amber: view is on and selected  
Tip. Drag the divider bar between the two views to  
adjust the display height between them. See the  
figure in step 3.  
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Displaying Waveforms  
Overview  
Set horizontal  
display  
To control a Mag view (cont.)  
Related control elements and resources  
3. Use the Horizontal knobs (see right) to achieve a good  
display of the waveform in the Mag time base.  
parameters  
Time base settings for Channel waveforms will be  
adjusted as you use the controls; the controls will be  
inoperable if you have a reference or a math waveform  
selected.  
Note that the Mag1 markers enclose a segment of Main  
view that appears across the 10 division width of the  
Mag view. See below.  
Portion magnified in the Mag1 time base view  
Main  
Divider  
bar  
Mag  
For more 4. Press the Horizontal Menu front-panel button. Click  
information  
the  
icon in the the upper-right corner of the Horiz  
Setup dialog box, and then click any dialog-box  
control to pop up help on that control.  
See Accessing Online Help on page 3-167 for an  
overview of the online help system.  
5. Click the Help button in the Horiz Setup dialog box to  
access a context-sensitive overview on the horizontal  
controls and their set up.  
End of Procedure  
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Displaying Waveforms  
Customizing the Display  
Why Use?  
Use the display customizing features this instrument provides to present the  
display elementscolor, graticule style, waveform representation, and so  
onaccording to your preferences.  
Color grading. You can select color grading of a waveform so that its data color  
or intensity reflects the frequency of occurrence of the data.  
Whats Special?  
The key points that follow describe operating considerations for setting up the  
the display system so that it presents waveforms and other display elements.  
Keys to Using  
Display Settings. Table 3--5 lists display attributes that you can set and where  
they are accessed.  
Table 3-5: Customizable display attributes  
Display attribute  
Access  
Options  
Menu name1  
Entry  
User Preferences2  
Utility  
Graticule Style  
Display Mode  
Choose from Full, Grid, Cross-hair, and Frame styles.  
Setup  
Utility  
Setup  
Utility  
Display  
User Preferences2  
Display  
Choose from Normal, Infinite Persistence, and Variable Persistence  
Modes.  
User Preferences2  
Show Vectors  
(normal display  
mode only)  
Choose No to display each waveform as a series of dots.  
Choose Yes to display vectors or lines between the dots.  
Setup  
Display  
Shortcut  
Utilities  
Utility  
Properties  
Waveform Label  
Waveform Color  
Enter a new label for the waveform you have selected.  
Waveform Props  
Waveform Props  
Properties  
Shortcut  
Setup  
Cursor Colors  
Graticule Colors  
Histogram Color  
Mask Color  
Cursors  
Choose from six different colors for each waveform; choose from 16  
different colors for a cursor, graticule, histogram, or mask.  
Setup  
Display  
Setup  
Histogram  
Setup  
Mask Test  
Waveform Color  
Grading  
Shortcut  
Color Grading  
Choose to display a waveform with its data color graded based on its  
frequency of occurrence. See Color grade a waveform on page 3-70.  
Virtual Keyboard  
Utility  
User Preferences  
Choose from alphabetic or QWERTY styles.  
1
Except for Shortcut,the Menu Names refer to the menus found in the Menu bar at the top of the instrument screen. The  
shortcut menu for a waveform can be displayed by right clicking on a displayed waveform or on its icon, which is  
displayed in the waveform bar (left of the graticule).  
2
Available only on instrument running the MS Windows 98 Operating System.  
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Normal and Persistence Displays. Use display persistence to control how  
waveform data ages:  
H
Normal style displays waveforms without persistence: each new waveform  
record replaces the previously acquired record for a channel. You can choose  
to display normal waveforms as vectors, which displays lines between the  
record points, or dots (vectors off) which displays the record points only.  
You can also choose an interpolation mode. See Interpolation below.  
H
H
Variable Persistence style accumulates the waveform-record points on screen  
and displays them for a specific time interval. The oldest waveform data  
continuously fades from the display as new waveform records acquire.  
Infinite Persistence style accumulates the data record points until you change  
some control (such as scale factor) or explicitly clear the data, causing the  
display to be erased. Waveform data builds up as new data records acquire.  
Persistence style applies to all waveforms, except for channel waveforms and  
reference waveforms displayed with color or intensity grading.  
Interpolation. For record lengths of less than 500 points, you can choose to have  
the instrument interpolate between the sampled points it acquires. Interpolation  
affects the display only; mask testing, histograms, and automatic measurement  
results are based on acquired, not interpolated, data. There are three options for  
interpolation:  
H
Sin(x)/x interpolation computes record points using a curve-fit between the  
actual values acquired. The curve-fit assumes all the interpolated points fall  
along that curve. Sin(x)/x interpolation is particularly useful when acquiring  
more rounded waveforms, such as sine waves. Sin(x)/x interpolation may  
introduce some overshoot or undershoot in signals with fast rise times.  
H
H
Linear interpolation computes record points between actual acquired samples  
by using a straight-line-fit. The straight-line-fit assumes all the interpolated  
points fall in their appropriate point in time on that straight line. Linear  
interpolation is useful for many waveforms such as pulse trains.  
None turns interpolation off. Only points actually sampled appear in the  
displays of waveform records.  
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Displaying Waveforms  
To Set Display Styles  
Use the procedure that follows to become familiar with the display styles you  
can set.  
Overview  
To set display styles  
Related control elements and resources  
Prerequisites 1. The instrument must be powered up, with any waveform  
you want to display on screen.  
See page 3-24 for acquisition setup and  
page 3-48 for trigger setup.  
Access the 2. From the application menu bar, select Setup, and then  
Display setup  
dialog box  
select Display. See right.  
Set Interpolation mode  
Select normal 3. From the Display Setup dialog box (see right) , choose  
style, vectors,  
and interpola-  
tion  
Normal to select a display with no acquisition data  
persistence.  
Check for normal display  
Check for vectors  
Waveforms display with the new data from ongoing  
acquisitions replacing that data in the same time  
intervals/slots but acquired as part of the last, previous  
waveform.  
4. Check Vectors to turn on display lines between  
waveform dots; uncheck to display only dots.  
5. Select an Interpolation mode from the pulldown list.  
Choose from Sin(x)/x, Linear, or None.  
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Displaying Waveforms  
Overview  
To set display styles (cont.)  
Related control elements and resources  
Select a 6. From the the Setup Display dialog box (see right),  
persistence  
Mode  
choose:  
H
Infinite Persistence to make data persist until  
you change some control (such as scale factor)  
or explicitly clear the data. Waveform displays  
accumulate data as new waveform records  
acquire, resulting in a build up of data in all time  
slots.  
Set variable  
persistence time  
Access to virtual keyboard  
H
Variable Persistence to make data persist for a  
specified time. New waveform displays  
accumulate data as new waveform records  
acquire, but with continuous replacement of the  
oldest data.  
If you select Variable Persistence, set a time at  
which the oldest data is removed.  
Continue with 7. For more ways to customize the display, see the next  
procedure.  
the next  
procedure  
See To Customize Graticule and Waveforms on  
page 3-69.  
End of Procedure  
To Customize the  
Graticule and Waveforms  
Use the procedure that follows to become familiar with the display adjustments  
you can make.  
Overview  
Customizations you can make  
Related control elements and resources  
Prerequisites 1. Display the waveforms to be measured on screen.  
The waveform may be a channel, reference, or math  
waveform.  
See page 3-24 for acquisition setup and page  
3-48 for trigger setup.  
2. If the source to be measured is in the Mag1 or Mag2  
view, turn that view on.  
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Displaying Waveforms  
Overview  
Customizations you can make (cont.)  
Related control elements and resources  
Waveform Icon  
Change wave- 3. Right click on the waveform or its icon. See right.  
form color  
4. Choose Properties from the menu that pops up.  
or label  
5. Type a new name in the Waveform Label box. The  
instrument will use the new label to mark the selected  
waveform in the graticule area.  
6. Choose a color from the Color pulldown list. Click OK  
to dismiss the dialog.  
Color grade a 7. Right click on the channel waveform or its icon. See  
waveform  
right.  
Waveform Icon  
8. Choose Color Grade from the menu that pops up.  
Color grading a waveform is one of several instrument  
operations that uses a waveform database. There are  
four available, so no more than four waveforms can be  
color graded at the same time.  
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Displaying Waveforms  
Overview  
Customizations you can make (cont.)  
Related control elements and resources  
Reduce a wave- 9. Right click on the waveform or its icon. See right.  
form to its icon  
10. Choose Show from the menu that pops up to toggle the  
waveform between shown (checked) and hidden  
(unchecked).  
Tip. Hiding a waveform is useful when you temporarily want  
to remove the display of a waveform without turning it off.  
Hidden waveforms change their waveform icons (in the  
Waveform bar left of screen) as shown:  
Waveform shown  
Waveform hidden  
Change grati- 11. From the application menu bar, select Setup, and then  
cule style and  
color  
select Display. See right.  
12. Use the graticule controls to select a graticule style.  
13. Select the color of the screen from the Background  
pulldown list. Select the color of the graticule from the  
Foreground pulldown list.  
14. Click the  
box.  
button to close the Setup Display dialog  
For further  
assistance  
15. Click the  
icon in the the upper-right corner of  
the Display Setup dialog box, and then click any  
dialog-box control to pop up help on that control.  
16. Click the Help button in the Display Setup dialog box  
to access a context-sensitive overview of the display  
controls and their set up.  
See Accessing Online Help on page 3-167 for  
overview of the online help system.  
End of Procedure  
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Measuring Waveforms  
To assist you in analyzing the waveforms you acquire, the instrument comes  
equipped with cursors and automatic measurements. This section describes these  
tools and how you use them:  
H
Taking Automatic Measurements, on page 3--74, describes how you can set  
up the instrument to automatically measure and display a variety of  
waveform parameters. See Figure 3--18.  
H
H
Taking Cursor Measurements, on page 3--85, describes using cursors to make  
amplitude and time measurements on waveforms. See Figure 3--18.  
Optimizing Measurement Accuracy, on page 3--92, tells you how to run  
compensation routines and deskew channels to optimize the accuracy of your  
measurements.  
NOTE. You can also make graticule measurements, counting graticule divisions  
and multiplying them by the vertical or horizontal scales set for the waveform  
you are measuring.  
Graticule  
Readouts  
Cursors  
Measurement  
readouts  
Cursor  
readouts  
Figure 3-18: Graticule, cursor and automatic measurements  
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Measuring Waveforms  
Taking Automatic Measurements  
Why Use?  
This powerful and flexible tool provides automatic extraction of various  
parameters from the waveforms that this instrument acquires. Automated  
measurements quickly give you immediate, continuously updating, measurement  
results for a rich selection of waveform parameters, such as risetime or extinction  
ratio. You also can display statistics on how the measurement results vary as they  
continuously update. See Whats Excluded on page 3--76 for information on the  
??? indicator when measuring waveform parameters.  
Whats Measured?  
You get to choose:  
H
Most automatic measurements require both a source selection and a  
measurement selection. To quickly select a measurement, use the measure-  
ment toolbar to first set the waveform type, Pulse, RZ, or NRZ, and then  
select a category, Amplitude, Timing, or Area, in the pulldown lists of the  
toolbar. Next, click the icon of the measurement that you want to use to  
measure the selected waveform (or drag the icon to any waveform, selected  
or not, on screen to measure that waveform). The results appear in the  
measurements readout at the right of the screen. See the procedure that starts  
on page 3--80.  
H
H
Select from the extensive range of parameters this instrument can measure;  
for a list, see Appendix B: Automatic Measurements Supported. This section  
of the manual defines the supported measurements (selections) for each  
category.  
Feed the entire waveform to a measurement or limit the measurement to a  
segment of the waveform. By default, the instrument takes each automatic  
measurement over the entire waveform record, but you can use measurement  
gates to localize each measurement to the section of a waveform (see To  
Localize a Measurement on page 3--83).  
H
Select from these measurement sources: channel, reference, and math  
waveforms, and waveform databases 1 through 4.  
Whats Special?  
This instrument implements a robust automatic measurement system. Some of  
the features adding value to this system follow.  
Annotate Waveforms On Screen. You can turn on annotations that mark character-  
ization levels that each measurement uses to compute results. See Figure 3--19.  
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Measuring Waveforms  
Annotations indicate the waveform  
region determining measurement  
Figure 3-19: Measurement annotations on a waveform  
Use Databases as Sources. If you define the source you want to measure as a  
database in the Meas Setup dialog box, you can use the database of that  
waveform as source. The measurement you select operates on the accumulated  
waveform data (databases accumulate repetitive instances of a source waveform  
over time).  
For example, consider the Max measurement. Max will capture and update the  
maximum (most positive) value encountered. For a database source, the ongoing  
Max measurements can only result in a higher max value as the database  
accumulates ongoing acquisitions. This process causes the Max measurement  
readout to track max up but not down. In contrast, the Max measurement for a  
waveform source not included in a database will track variation up and down as  
new waveforms are acquired.  
Characterize Measurements Independently. To allow you control over how your  
waveform data is characterized by each measurement, the instrument lets you set  
the methods used independently for each measurement. See High/Low Tracking  
Method on page 3--77 and Reference Levels Method on page 3--79.  
See Statistics on Measurement Results. To see how any automatic measurement  
varies statistically, you can display a readout of the Min, Max, Mean, and  
Standard Deviation the measurement results. See step 6 on page 3--81 for  
instructions. See also the following topic for information about questionable  
measurements.  
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Measuring Waveforms  
Whats Excluded?  
The following exclusions apply when using automatic measurements:  
H
H
More than eight measurements at one time are not allowed.  
Except for Average Optical Power, all measurements of the category RZ or  
NRZ must be performed on a waveform database (see Use Databases as  
Sources on page 3--75). The Average Optical Power measurement cannot use  
a waveform database as its source.  
H
H
The Average Optical Power measurement cannot display Annotations (see  
page 3--74) and cannot use gates or user-defined High/Low methods (see  
page 3--77).  
If the waveform parameter that is to be automatically measured cannot be  
acquired (incorrect control setup, out-of-range input signals), this instrument  
displays the indicator ???.For example, if the instrument acquires less  
than a full waveform cycle, it cannot measure frequency or period and  
displays ???.  
Keys to Using  
The key points that follow describe operating considerations for setting up  
automatic measurements to obtain the best measurement results.  
Measurement Selection. The instrument takes automatic measurements of the  
following categories: Amplitude, Timing, and Area. Check Appendix B:  
Automatic Measurements Supported for a listing of the measurements that you  
can choose from in each signal type category.  
Number of Measurements. The instrument can take and update up to eight  
measurements at one time. You can apply measurements to any combination of  
sources (described below). You can take all eight measurements on C1, for  
example, or one measurement each on C1 -- C8.  
Measurement Sources. All channel, reference, and math waveforms can serve as  
sources for automatic measurements. You can also measure any of the four  
waveform databases that the instrument supports. You can specify a waveform as  
source in the Meas Setup dialog box even if the waveform is not displayed.  
Some measurements, such as Gain, Delay, and Phase, require two sources. For  
example, Gain would be used to measure an input from one measurement source  
(such as C1) with respect to an output in another source (such as C2).  
Databases as Sources Behavior. Consider the following operating behaviors  
regarding measurements and databases:  
H
When enabling a measurement, it will always measure the waveform  
database if the measurement source you choose is currently displayed as a  
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Measuring Waveforms  
waveform database. You can measure the waveform instead of its database if  
you turn off Use Wfm Database in the Meas setup dialog box.  
H
If you assign a database to a waveform already being used as a source for an  
automatic measurement, it will not automatically measure the waveform  
database; you must explicitly specify its use by turning on Use Wfm  
Database in the Meas Setup dialog box.  
High/Low Tracking. The levels that the automatic measurement system derives as  
the High (Top) or Low (Bottom) for a waveform influence the fidelity of  
amplitude and aberration measurements. For many of the automatic measure-  
ments supported, the instrument automatically determines these levels and  
disables all or some of the High/Low tracking method controls (for example,  
RMS). If the measurement you select has High/Low methods that are appropriate  
to adjust (or example, RISE time), the instrument automatically enables the  
method controls for your adjustment as shown below.  
Select among methods  
Check to use method you select;  
uncheck to enter level directly  
High/Low Tracking Method. Depending on which measurement you select, High,  
Low, or both, tracking will be enabled with their boxes checked as shown above.  
You can select among the several modes the instrument provides for determining  
these levels:  
H
Mode (of Histogram) sets the values statistically. Using a histogram, it  
selects the most common value either above or below the midpoint  
(depending on whether it is defining the high or low reference level). Since  
this statistical approach ignores short term aberrations (overshoot, ringing,  
and so on), Mode is the best setting for examining pulses. See Figure 3--20.  
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Measuring Waveforms  
High (min/max)  
High (mean)  
High (mode)  
Mid reference  
Low (mode)  
Low (mean)  
Low (min/max)  
Figure 3-20: High/Low tracking methods  
H
Mean (of Histogram) sets the values statistically. Using a histogram, it  
selects the mean or average value derived using all values either above or  
below the midpoint (depending on whether it is defining the high or low  
reference level). This setting is best for examining eye patterns and optical  
signals. See Figure 3--20.  
H
H
Min-max uses the highest and lowest values of the waveform record. This  
setting is best for examining waveforms that have no large, flat portions at a  
common value, such as sine waves and triangle waves almost any waveform  
except for pulses. See Figure 3--20.  
Auto switches between methods. Auto method first attempts to calculate the  
high and low values using the Mode method. Then, if the histogram does not  
show obvious consistent high and low levels, Auto method automatically  
switches to the Min/Max or Mean method.  
For example, the Mode histogram operating on a triangle wave would not  
find consistent high and low levels, so the instrument would switch to  
the Min/Max mode. Consistent high and low levels would be found on a  
square wave, so the Auto mode would use the Mode method.  
When setting High/Low method, be aware of these operating behaviors:  
H
H
H
The tracking settings are not global; that is, you can independently set the  
method used for each of Meas 1 -- Meas 8.  
You can turn off tracking for either or both the High and Low levels and  
enter them directly.  
Not all tracking methods are appropriate for all measurements. If you cannot  
set the tracking method, the controls will be disabled.  
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Measuring Waveforms  
Reference Levels Method. You can choose the method that the instrument uses to  
determine a second group of levels when taking time-related measurements.  
These levels are the High, Mid, and Low references. For example, the measure-  
ment system takes risetime from the waveform-edge segment that transitions  
from the Low to the High reference levels.  
The instrument provides the following calculation methods; refer to Figure 3--21  
as you read about each method:  
1. Relative Reference is calculated as percentage of the High/Low range.  
2. High Delta Reference is calculated as absolute values from the High Level.  
3. Low Delta Reference is calculated as absolute values from the Low Level.  
4. Absolute Reference is set by absolute values in user units.  
5. AOP (not shown) measures the Average Optical Power of the waveform and  
uses it as the Mid Ref level. See Pulse Crossings and Mid-reference Level  
AOP on page B--58 for more information.  
Reference level calculation methods  
High (50 mV)  
High reference  
90%  
50%  
10 mV  
50 mV  
90 mV  
50 mV  
40 mV  
0 mV  
Mid reference (0 mV)  
- 4 0 m V  
10%  
90 mV  
10 mV  
Low reference  
Low (-50 mV)  
Figure 3-21: Reference-level calculation methods  
The High and Low levels from which the reference levels are calculated in  
methods 1 -- 3 above are the levels established using the selected High/Low  
tracking method described in High/Low Tracking Method on page 3--77.  
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Measuring Waveforms  
The AOP method is the Average Optical Power reference level. This reference  
level selection is best used when taking the Optical Modulation Amplitude  
(OMA) measurement on a pulse waveform. (The AOP setting is ignored for  
NRZ waveforms.) This method is selected by default when measurement type is  
set to OMA. See the OMA measurement on page B--5.  
Default Methods. The waveform-characterization methods just coveredthe  
High/Low-tracking and the reference-level-calculation methods usedcan be set  
for each measurement and its waveform source in the Meas Setup dialog box. If  
you do not set the methods individually, the instrument uses its default character-  
ization methods.  
Use the procedure that follows to quickly take a measurement based on the  
default settings for High/Low method and for reference-level method.  
To Take Automatic  
Measurements  
Overview  
To take automatic measurements  
Related control elements and resources  
Prerequisites 1. Theinstrument must displaythewaveform tobemeasured  
on screen.  
See page 3-24 for acquisition setup and  
page 3-48 for trigger setup.  
Select the 2. Use the Vertical buttons to select the waveform to be  
waveform  
measured.  
The waveform may be a channel, reference, or math  
waveform.  
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Overview  
To take automatic measurements (cont.)  
Related control elements and resources  
Take Automatic 3. Select one of the signal (waveform) types and then  
measurements  
select a category from the measurement bar.  
4. Click the measurement you want in the measure-  
ment tool bar.  
5. Read the results in the measurements readout.  
Tip. To show the levels (see page 3-74) on which  
your measurement is based, turn on Annotations:  
Right click on measurement in the readout, and  
select Show Annotations from the menu as  
.
shown at right.  
To see statistics 6. Right click on any measurement readout to display its  
context menu.  
7. Select Show Statistics to display measurement  
statistics in the measurement readout. See Whats  
Excluded on page 3-76 for information about the ???  
indicator.  
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Overview  
To take automatic measurements (cont.)  
Related control elements and resources  
To measure a 8. From the application menu bar, select Setup, and then  
database  
select Measurement. See right.  
9. In the Meas Setup dialog box, make sure the  
measurement (one of Meas1 through Meas8) is  
selected.  
10. In the Source tab, check the Use Wfm Database option  
as shown below.  
Tip. If, at the time you first create a measurement, the  
measurement source you select is displayed as a  
waveform database, the database will automatically be  
measured. Uncheck the User Wfm Database option if  
you want to measure the waveform instead of the  
database.  
For more in- 11. Press the Help button in the Meas Setup dialog box to  
formation  
access the online help.  
12. See Appendix B: Automatic Measurements Reference,  
on page B-1 for a list of the measurements and their  
definitions.  
See page 3-167 to learn about using online help.  
End of Procedure  
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Measuring Waveforms  
To Localize a  
Measurement  
Use the procedure that follows to set gates on a measurement source, which  
forces the measurement to be taken over a segment of the waveform (otherwise,  
the entire waveform feeds the measurement).  
Overview  
To gate a measurement  
Related control elements and resources  
Prerequisites 1. Set up as from last procedure.  
See To Take an Automatic Measurement on  
page 3-24  
Access the 2. From the application menu bar, select Setup, and then  
gates  
select Measurement. See right.  
Access to virtual keyboard  
Enable and 3. Select the Region tab to expose the gate controls. Click  
position the  
gates  
to check the box as indicated at right to turn gating on  
and to display the gates on screen.  
4. If Annotations are not on, click the Annotations box, or  
the gates will not display.  
Vary to position gates  
Check to display gates  
5. Use the G1 (Gate1) and G2 spin controls (or click ands  
type in values-see right) to adjust the gates on screen  
such that the area to measure is between the gates.  
Tip. Values are entered as a % of the waveform,  
displayed from left to right. If no keyboard is installed,  
access the virtual keyboard and use the touch screen to  
enter values.  
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Measuring Waveforms  
Overview  
To gate a measurement (cont.)  
Related control elements and resources  
Gate G1  
Gate G2  
End of Procedure  
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Measuring Waveforms  
Taking Cursor Measurements  
Why Use?  
Use cursors to measure amplitude and time quickly and with more accuracy than  
when using graticule measurements. Because you position cursors wherever you  
want on the waveform, they are easier to localize to a waveform segment or  
feature than automatic measurements.  
Time or amplitude or both. Vertical cursors measure time or bits on screen;  
horizontal cursors measure amplitude: voltage, watts, rho, or ohms; and  
waveform cursors measure both. Table 3--6 expands on these definitions.  
Whats Measured?  
Table 3-6: Cursor functions (types)  
Cursor function  
Parameter measured  
Cursor readout  
Horizontal cursors measure amplitude (volts, watts). Each cursor  
measures with respect to:  
H
H
H
v1 = Level at Cursor 1 with respect to its source ground level  
v2 = Level at Cursor 2 with respect to its source ground level  
v = Level at Cursor 2 - Level at Cursor 1  
Horizontal cursors  
Level is cursor displacement from the source ground times the  
source volts/div. Note that the two cursors may have different  
sources and therefore can have different volts/div settings.  
Vertical cursors measure distance (time in seconds or bits). Each  
cursor measures with respect to:  
Trigger point  
H
H
H
H
t1 = Time at Cursor 1 with respect to the trigger point  
t2 = Time at Cursor 2 with respect to the trigger point  
t = Time at Cursor 2 - Time at Cursor 1  
Vertical cursors  
1/t = 1/(Time at Cursor 2 - Time at Cursor 1)  
Time is divisions of displacement of the cursor from its source trigger  
point times the source time/div. Note that the two cursors may have  
different sources and, therefore, can have different time base (Main,  
Mag1, Mag2) settings.  
Waveform cursors measure both voltage and time. Each cursor is,  
in effect, both a vertical and horizontal cursor. Neitherof thesepaired  
cursors can be moved off the waveform.  
Trigger point  
Note that sources can have different volts/div settings.  
Waveform cursors  
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Measuring Waveforms  
What Sources  
Can I Measure?  
Cursors can measure channel, reference, and math waveforms, as well as  
waveform databases. You may set the source of each cursor explicitly in the  
Cursor Setup dialog box.  
Keys to Using Cursors  
The key points that follow describe operating considerations for setting up cursors  
to obtain best measurement results.  
Cursor Types. The three cursor types are described in Table 3--6 on page 3--85.  
There are two cursors displayed for all types, Cursor 1 and Cursor 2; the cursor  
currently selected for adjustment is the solid cursor (bottom cursor in Fig-  
ure 3--22  
+ 3 divisions at 100 mV/div  
+ 3 divisions at 20 mV/div  
Figure 3-22: Horizontal cursors measure amplitudes  
Cursors are Display-Limited. You cannot move a cursor off screen. Also, if you  
resize waveforms, the cursors do not track. That is, a cursor stays at its screen  
position, ignoring changes to horizontal and vertical scale and position and to  
vertical offset. However, waveform cursors track the waveform point vertically;  
they work differently than vertical and horizontal cursors.  
Cursors Default to the Selected Waveform. Each cursor measures its source,  
defined in the Cursors Setup dialog box. Note the following behavior regarding  
source selection:  
H
When cursors are first turned on, the instrument automatically assigns them  
to use the waveform currently selected on screen as the source for each  
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cursor. Up to the time you turn cursors on, you can select a waveform on  
screen to use it as the source for the cursors.  
H
H
Once cursors are on, selecting a different waveform does not change the  
source the cursors measure. To change the source while cursors are on, you  
must change the source in the Cursors Setup dialog box.  
Turning cursors off restores the default cursor source assignment so that  
assignment again tracks the currently selected waveform.  
Cursors Can Treat Sources Independently. Each cursor can take a different,  
independent source, with each source having its own amplitude scale and time  
scale. Consider the example presented by Figure 3--22 on page 3--86:  
H
H
H
Cursor1 is set to measure channel 3 (C3), which is set to 100 mV/div, so the  
cursor readout v1 measures C3 relative to its ground as 3 divisions x  
100 mV/div, or about 300 mv.  
Cursor 2 is set to measure reference l (R1), which is set to 20 mV/div, so the  
cursor readout v2 measures R1 relative to its ground as 3 divisions x  
20 mV/div, or about 60 mv.  
Note that the value of each graticule division, relative to the delta readout, is  
not readily apparent because the delta-amplitude readout (v) must account  
for the different amplitude-scale settings of the sources. To do so, the v  
readout displays the results of v2 -- v1 (--60 mv -- 300 mv = --240 mv),  
automatically accounting for the different scales of the cursor sources.  
Time readouts behave similarly with regard to different sources with different  
time bases. Each cursor displays its time readout, t1 or t2, with respect to the  
time base of its source, and t is calculated as t2 -- t1, automatically accounting  
for any difference in the time base of each cursor source.  
NOTE. If a cursor readout does not seem correct, check the source of each cursor  
in the Cursor Setup dialog box. Each cursor readout relates to the amplitude and  
time base settings of their source.  
Vertical Cursors Measure from the Trigger Point. Remember that each vertical  
cursor measures the time from the trigger source to itself. This relationship is  
shown in Figure 3--23 on page 3--88.  
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Horizontal Ref = 0%  
First sampled point  
Trigger point of cursor  
source  
Cursor readout (tn) = Time to first point  
Horizontal divs x sec/div  
+
Cursor  
Figure 3-23: Components determining Time cursor readout values  
Note that a vertical cursor readout (t1 or t2) includes and varies directly with the  
time-to-first-point component, which varies directly with the horizontal position  
set for the time base used by the cursor-source waveform. To see the amount of  
time to the first point, press Horizontal Menu on the front panel and set  
Horizontal Ref to 0% in the dialog box that displays. Now the Horizontal  
position readout shows the time to first point, and subtracting this value from the  
cursor readout yields the cursor position on screen relative to first point. (You  
can find the horizontal readout both in the dialog box and in the control bar at  
the bottom of the screen.) The following relationships hold:  
Time to First Point = Horiz Position (when Horiz Ref Position is set to zero)  
t1 or t2 readouts = Time to First Point + Additional Time to Cursor  
Cursor Units Depend on Sources. A cursor that measures amplitude or time will  
read out in the units of its source as indicated in Table 3--7. Note mixed sources  
require the delta readouts to follow the units of the cursor 1 source.  
Table 3-7: Cursor units  
Cursors  
Horizontal  
Vertical  
Standard units1  
Readout names  
v1, v2, v  
volts, watts, rho, ohms  
seconds, bits  
t1, t2, t  
Waveform  
volts, watts, seconds, bits  
v1, v2, v, t1, t2, t  
1
If the v1 and v2 units do not match, the v readout defaults to the units used by the  
v1 readout; if the t1 and t2 units do not match, the t readout units defaults to t1  
readout units.  
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Measuring Waveforms  
To Take a Cursor  
Measurement  
Use the procedure that follows to take cursor measurements on waveforms.  
Overview  
To take cursor measurements  
Related control elements and resources  
Prerequisites 1. At least one waveform must be selected on screen. Or  
you can set cursor values directly using the procedure  
referenced at right.  
See To Set the Cursor Sources on page 3-90.  
Take cursor  
measurements  
2. Press the CURSORS button (see right). Press:  
H
H
H
once to display vertical bar cursors (shown below).  
twice to display horizontal bar cursors.  
a third time to display waveform-based cursors.  
3. Press the SELECT button to toggle selection between  
the two cursors. The active cursor is the solid cursor.  
4. Turn the General Purpose knob to position each cursor  
on the waveform to measure the feature that interests  
you.  
5. Read the results in the cursor readout.  
In the figure shown above, waveform cursors are  
used to measure the bit-time of the eye diagram.  
Tip. The cursor readout indicates the source time  
base and waveform for the selected cursor; in this  
case, the main time base, M1, and channel 1, C1.  
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Measuring Waveforms  
Overview  
To take cursor measurements (cont.)  
Related control elements and resources  
To reassign cur- 6. Press the Cursor button repeatedly to toggle through the  
sors  
cursor selections until the cursors are off. Then select a  
new waveform on screen.  
Tip. You can set the cursors source(s) directly using the  
procedure listed at right.  
See To Set the Cursor Sources on page 3-90.  
End of Procedure  
To Set the Cursor Sources  
You can target each cursor to the source it is to measure. (See Cursors Treat  
Sources Independently on page 3--87). To do so, use the procedure that follows.  
Overview  
To set the cursor sources  
Related control elements and resources  
Prerequisites 1. Display the waveforms to be measured on screen.  
The waveform may be a channel, reference, or math  
waveform.  
See page 3-24 for acquisition setup and  
page 3-48 for trigger setup.  
2. If the source to be measured is in the Mag1 or Mag2  
time base, turn that time base on.  
Display the Cur- 3. From the application menu bar, select Setup, and then  
sor Setup dia-  
log box  
select Cursors. See right.  
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Measuring Waveforms  
Overview  
To set the cursor sources (cont.)  
Related control elements and resources  
Click to access sources  
Select the cur- 4. From the pop-up list (see right) for each of Cursor 1 and  
sor sources  
Cursor 2, select a source:  
Select source from  
pop-up list  
H
To measure a single source, choose the same  
source for both cursors Main C1, for example.  
H
To measure two different sources in the same time  
base, make sure the time bases match Main  
C1 and Main C2, for example.  
Math & Ref sources  
appear if defined  
H
To measure two different sources in different time  
bases, select different waveforms and time  
bases Main C1 and Mag1 C2, for example.  
Mag1 & Mag2 sources  
appear if displayed  
Tip. References and Math waveforms are listed as  
sources only if defined and turned on. All sources listed  
for the Main time base are also listed for the Mag1 and  
Mag2 time bases if the time base views are displayed  
on screen.  
End of Procedure  
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Measuring Waveforms  
Optimizing Measurement Accuracy  
Why Use?  
The procedures given here will increase the accuracy of the measurements you  
take.  
Compensation  
This instrument can compensate itself and the sampling modules installed,  
optimizing the internal signal path used to acquire the waveforms you measure.  
Compensation optimizes the capability of the instrument to make accurate  
measurements based on the ambient temperature.  
NOTE. After first installing a sampling module(s) or moving a sampling module  
from one compartment to another, you should run compensation from the  
Utilities menu to ensure the instrument meets it specifications when reaching a  
stable equilibrium after power-up (normally 20 minutes is recommended).  
You must save the compensation results or they will be lost when the instrument  
is powered down.  
To Compensate the  
Instrument and Modules  
Use the following procedure to optimize the instrument for the current tempera-  
ture to enhance measurement results.  
Overview  
To perform a compensation  
Related control elements and resources  
Prerequisites 1. Instrument should have the sampling modules installed  
and be powered on. Allow a 20 minute warm up.  
See Install the Sampling Modules on page 1-10.  
Display the 2. From the application menu bar, select Utilities, and then  
Compensation  
dialog box  
select Compensation. See right.  
In the Compensation dialog box, the main instrument  
(mainframe) and sampling modules are listed.  
The temperature change from the last compensation is  
also listed. See below.  
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Measuring Waveforms  
Overview  
To perform a compensation (cont.)  
Related control elements and resources  
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Measuring Waveforms  
Overview  
To perform a compensation (cont.)  
Related control elements and resources  
Select the 3. Wait until the Status for all items you want to  
compensate changes from Warm Up to Comp Reqd or  
Pass.  
scope of the  
compensation  
4. In the Select Action fields, select Compensate.  
5. From the top pulldown list, select the target to  
compensate. Choose from:  
Click to select  
compensate  
H
All to select the main instrument and all its  
modules (default selection).  
Choose targets to  
compensate  
Enabled only if module  
selected as target  
H
H
Mainframe to select only the main instrument.  
Module to select an individual module for  
compensation.  
If you have selected Module as the target, also choose  
the channel to be compensated from the pulldown list of  
channels.  
Click to start  
compensation  
Run the 6. Click the Execute button to begin execution of the  
compensation.  
compensation  
Instructions to disconnect inputs and install dust  
covers on optical module channels and 50 Ω  
terminations on electrical module channels will  
appear on screen. Be sure to follow static  
precautions (see the user manual for your sampling  
module) when following these instructions.  
Note. Failing to install the 50 terminations can  
yield erroneous compensation failures or results.  
See Equipment Required on page 1 -20.  
The compensation may take several minutes to  
complete. Pass should appear as Status in the  
dialog box when compensation completes.  
If Fail appears as Status, rerun the compensation. If  
Fail status continues after rerunning compensation  
and you have allowed warm up to occur, the module  
or main instrument may need service.  
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Measuring Waveforms  
Overview  
To perform a compensation (cont.)  
Related control elements and resources  
Save the 7. In the Select Action fields, select Save.  
compensation  
8. Click the Execute button to save the new compensation  
results. The new compensation results will be lost when  
the instrument is powered down if they are not saved.  
The Storage destination for the compensation results is  
limited to the User area. The Factory settings cannot be  
overwritten.  
Recalling a 9. In the Select Action fields, select Recall.  
compensation  
10. In the Storage field, select the compensation to recall,  
User or Factory.  
User recalls the last saved user compensation. Factory  
recalls the compensation established at the factory.  
Note. Before proceeding, make sure you want to rewrite  
the compensation you just saved.  
11. Click the Execute button to recall the compensation  
results.  
Note. The Factory compensation should only be recalled  
to bring the instrument to a known state. Recalling the  
Factory compensation does not guarantee measurement  
accuracy.  
End of Procedure  
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Measuring Waveforms  
To Deskew Channels  
When making differential, common-mode, or other measurements, you may need  
to null out the propagation delay contributed by the input cabling between two or  
more channels. Use the following procedure to adjust the deskew between  
channels.  
NOTE. When deskew is applied between channels within the same sampling  
module, the time shift is accomplished by making a second waveform acquisi-  
tion. In this case, waveform sample points for the two channels are not acquired  
on the same trigger event. This means that if the input signals are eye patterns  
(multi-valued from one trigger event to the next), then math waveforms that  
depend on correlation between samples from the two channels will not operate  
as expected.  
For instance, the difference between two channels (C1--C2) will result in an eye  
pattern with a line of data points through the vertical center of the eye. If you  
intend to create an eye pattern with a math waveform between two channels in  
the same sampling module, deskew should be set to exactly zero. Skew must be  
eliminated with external accessories.  
When deskew is applied between channels in different sampling modules, the  
independent time base for each slot is programmed with a different delay value  
and the sample points are acquired on the same trigger event.  
Overview  
To deskew between channels  
Control elements and resources  
Prerequisites 1. Drive the channels with signals requiring deskew.  
Function  
generator  
2. Drive the trigger direct input with the function generator  
trigger output.  
3. Set the instrument to trigger on the slope of the  
waveform that matches that of the edges you want to  
deskew.  
Trigger  
output  
4. Display the signals on screen.  
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Measuring Waveforms  
Overview  
To deskew between channels (cont.)  
Control elements and resources  
Set up the 5. Set up the channel to be used as the reference channel:  
reference  
a
Push the channel numbered button under Vertical  
on the front panel.  
channel  
b
Use the Vertical SCALE knob and POSITION  
knobs to display the waveform edge to be  
deskewed to fill the screen vertically.  
6. Use the Horizontal SCALE knob and POSITION knobs  
to display the waveform edges to be deskewed to fill the  
screen horizontally.  
Deskew the 7. Set up the channel to be deskewed: repeat step 5 for  
channel  
the channel to be deskewed.  
8. Push Vertical MENU front panel button, and from the  
Vertical Setup dialog box, adjust the Deskew value (see  
right) to make the edges of the reference and the  
deskew channel coincide (or are as close as possible).  
9. If you cannot align the edges completely, try selecting  
the reference channel and adjusting its deskew.  
Deskew 10. If you need to, you can deskew additional channels:  
more channels  
11. Turn off the channel just deskewed, and leave the  
reference channel on.  
12. Set up the channel to be deskewed: repeat step 7 and  
step 8 for the new channel to be deskewed.  
13. Continue this process for as many channels as you want  
to deskew.  
14. Disconnect the deskew hookup.  
End of Procedure  
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Measuring Waveforms  
To Perform Dark-Level  
and User Wavelength Gain  
Compensations  
Performing a dark-level compensation maximizes the accuracy of the extinction  
ratio and other optical automatic measurements you take. Performing a User  
Wavelength Gain compensation optimizes an optical channel for your custom  
input signal.  
NOTE. Dark level compensation performs a subset of the module compensation  
process. It is designed to be fast so it can be performed frequently, just before  
measurements are taken. This compensation is not saved and are only valid for  
the selected bandwidth or filter path and the internal optical power meter.  
You should perform the procedure To Compensate the Instrument and Modules  
on page 3--92 to compensate all vertical bandwidth and filter selections.  
Use the following procedure to perform either compensation; this procedure  
applies only to optical modules.  
Overview  
To perform optical compensations  
Control elements and resources  
Prerequisites 1. The instrument must be installed with at least one  
optical sampling modules to be dark-level calibrated in  
place. The acquisition system should be set to run  
continuously.  
See the sampling-module User Manuals for  
sampling module installation.  
Select the 2. Use the Vertical buttons to select the channel to be  
waveform  
compensated.  
Access 3. From the application menu bar, click Setup, and then  
dark-level com-  
pensation  
click Vertical. See right.  
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Measuring Waveforms  
Overview  
To perform optical compensations (cont.)  
Control elements and resources  
Run the dark- 4. In Vert Setup dialog box, click the Dark Level button  
level compensa-  
tion  
under Compensation. See right. Follow the instructions  
on screen.  
5. Repeat steps 2 and 4 for any additional optical channels  
you want to compensate.  
Run the user If you want, you can can compensate an optical channel for  
wavelength gain a custom input signal:  
compensation  
6. In Vert Setup dialog box, click the User Wavelength  
Gain button under Compensation. See right. Follow the  
instructions on screen.  
7. In the User Wavelength Gain Compensation dialog box,  
set the wavelength and power of the signal to be  
applied to the channel. See right.  
H
User should have an optical signal attached to  
module input with a precisely known amount of  
optical power. An independently-calibrated average  
optical power meter is used to measure this power  
precisely. Then signal is connected to the 80C0X  
with the same fiber cables.  
8. Press the OK button to execute the compensation.  
9. Repeat steps 2, 6, and 7 for any additional optical  
channels you want to compensate.  
End of Procedure  
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Measuring Waveforms  
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Creating Math Waveforms  
Once you have acquired waveforms or taken measurements on waveforms, the  
instrument can mathematically combine them to create a waveform that supports  
your data-analysis task. For example, you can define a math waveform that  
combines waveforms mathematically (+, --, /, x). You can also integrate a single  
waveform into an integral math waveform as is shown below.  
Source waveform  
Math waveform  
Defining Math Waveforms  
This instrument supports mathematical combination and functional transforma-  
tions of waveforms that it acquires. Figure 3--24 shows this concept:  
Channel waveform  
(C2)  
Math expression  
(function(source))  
Math waveform  
(M1)  
Diff(C2)  
Figure 3-24: Functional transformation of an acquired waveform  
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Creating Math Waveforms  
Why Use?  
Create math waveforms to support the analysis of your channel and reference  
waveforms. By combining and transforming source waveforms and other data  
into math waveforms, you can derive the data view that your application  
requires. You can create math waveforms that result from:  
H
mathematical operations on one or several waveforms or measurements: add,  
subtract, multiply, and divide.  
H
function transforms of waveforms, such as integrating, differentiating, and so  
on.  
You can create up to eight math waveforms; see Keys to Using on page 3--103 for  
more examples.  
Some features of note follow:  
Whats Special?  
Functions. Powerful functions, such as integrate, differentiate, average, can be  
taken on single waveforms or more complicated expressions.  
Measurement Scalars. The results (scalars) from automatic measurements can be  
used in expressions. For example, you can use the measurement Mean on a  
waveform and subtract, from the original waveform, the scalar that results to  
define a new math waveform.  
Whats Excluded?  
Some operations that you cannot use with math waveforms follow:  
H
H
H
Math-on-Math. You cannot use math waveforms as sources for other math  
waveforms. For example if you have a math waveform defined as  
M1 = C1 -- C2, you cannot define a second math waveform as  
M2 = M1 + C3. You can however expand the second math waveform to  
M2 = C1 -- C2 + C3.  
Mag Time Base Expressions. Sources for math expressions must be sources  
associated with the Main time base. For example, M3 = C1 + C2 uses these  
sources as acquired and displayed by the Main time base, not by the Mag1 or  
Mag2 time base. You cannot create M3 = C1(Main) -- C2(Mag1). See Table  
3--8 on page 3--103.  
Waveform Databases as Sources. If you assign a channel to a waveform  
database and then use the channel in a math-waveform expression, the data  
currently acquired in the channel is used, not the data accumulated in the  
waveform database over time.  
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Creating Math Waveforms  
Keys to Using  
The key points that follow describe considerations for creating math waveforms  
that best supports your data-analysis tasks.  
How to Create. You create math waveforms when you create a math expression.  
You do so by applying numerical constants, math operators, and functions to  
operands, which can be channel, waveforms, reference waveforms, measure-  
ments (scalars), or fixed scalars. You can display and manipulate these derived  
math waveforms much like you can the channel and reference waveforms (see  
Operations on Math Waveforms on page 3--107).  
Some examples of typical math waveforms follow.  
Table 3-8: Math expressions and the math waveforms produced  
To...  
Enter this math expression...  
and get this math waveform...  
...normalize a waveform  
...  
...shifted and scaled to fit a std. template  
Source waveform  
Normalized math waveform  
1.05V  
1.00V  
0.95V  
(C1 - Meas1)/ Meas2,  
where  
1.6V  
C1 is waveform shown left  
Meas1 = Low of C1  
Meas2 = amplitude of C1  
CHAN1  
0.8V  
+0.05V  
0.00V  
-0.05V  
...simulate ac coupling and integrate  
...  
...DC component removed before integration  
Source waveform  
AC integration math waveform  
+3V  
Intg(C1-Meas1),  
where  
5.0 V  
C1 is waveform shown left  
Meas1 is set to take the Mean of C1  
CHAN1  
1.0V  
- 3 V  
Sources. Math Waveforms can incorporate the following sources:  
H
H
H
Channel waveforms  
Reference waveforms  
Measurement scalars (automated measurements) that measure channel or  
reference waveforms in any time base  
H
Fixed scalars that you enter as numerical constants in expressions  
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Creating Math Waveforms  
Source Dependencies. In general, math waveforms that include sources as  
operands are affected by updates to those sources:  
H
H
H
Shifts in amplitude or DC level of input sources that cause the source to clip  
also clip the waveform data supplied to the math waveform.  
Changes to the vertical offset setting for a channel source that clip its data  
also clip the waveform data supplied to the math waveform.  
Changes to the acquisition mode globally affects all input channel sources,  
thereby modifying any math waveforms using them. For example, with the  
acquisition mode set to Envelope, a C1 + C2 math waveform will receive  
enveloped channel 1 and channel 2 data and, therefore, will also be an  
envelope waveform.  
H
Clearing the data in a waveform source causes a baseline (zero-volt level) to  
be delivered to any math waveform that includes that source until the source  
receives new data.  
Time Base Dependencies. Selections for math-waveform sources (operands)  
consist of channel and reference waveforms that are acquired or defined and  
viewed in the main time base.  
The math waveforms derive their time base and record lengths from waveform  
sources. You cannot change them directly; you can only change them indirectly  
by changing the time base for the source.  
In case of sources having different record lengths, the math waveform created  
matches the shorter waveform, and the additional trailing data from the longer  
waveform is not used.  
You may also want to read the section about deskewing channels on page 3--96.  
Expression Syntax. You build math waveforms using the Define Math Waveform  
dialog box. To help you create valid math waveforms, this dialog box blocks  
illegal entries by disabling any dialog-box element that would create an invalid  
entry in the math waveform expression.  
The syntax that follows describes valid math expressions, which can be quite  
complex (in excess of 100 characters long):  
<Expression> := <UnaryExpression> | <BinaryExpression>  
<UnaryExpression> := <UnaryOperator> ( <Term> )  
| <UnaryOperator> ( <Expression> )  
<BinaryExpression> := <Term> <BinaryOperator> <Term>  
| <Scalar> <BinaryOperator> <Term>  
| <Term> <BinaryOperator> <Scalar>  
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Creating Math Waveforms  
<Term> := <Waveform> | ( <Expression> )  
<Scalar> := <Integer> | <Float> | <Meas-Result>  
<Waveform> := <ChannelWaveform> | <ReferenceWaveform>  
<ChannelWaveform> := C1 | C2 | C3 | C4 | C5 | C6 | C7 | C8  
<ReferenceWaveform> := R1 | R2 | R3 | R4 | R5 | R6 | R7 | R8  
<UnaryOperator> := Integrate | Differentiate | Average | Max | Min  
| Filter | Vmag | Exp | log | ln | sqrt  
<BinaryOperator> := + | - | / | *  
<Meas-Result> := meas1 | meas2 | meas3 | meas4 | meas5 | meas6 | meas7 | meas8  
Use the procedure that follows when defining a math waveform. Remember, you  
should first ensure that the sources you use exist. Channel sources will be  
acquired when used in a math expression, reference waveform sources should  
contain saved waveforms, and so on. These sources do not have to be displayed  
to be used.  
To Define a  
Math Waveform  
Overview  
To define a math waveform  
Related control elements & resources  
Prerequisites 1. All channel and reference waveforms and automatic  
measurement scalars that you will use in your math  
waveform must be available (channels and references  
contain data, measurement scalars are defined, and so  
on.)  
See sampling-module user manuals for sampling  
module installation. See page 3-24 for acquisition  
setup and page 3-48 for trigger setup in this  
manual.  
Note. If you use a channel that is not acquiring,  
including it in a math waveform that you turn on will  
implicitly cause it to be acquired.  
Display 2. Press the Vertical MATH button twice if it is unlit, once if  
lighted, to display the Define Math dialog box.  
the Math  
dialog box  
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Creating Math Waveforms  
Overview  
To define a math waveform (cont.)  
Related control elements & resources  
Select a math 3. Click the Math Waveform drop-down list in the dialog  
waveform  
box and select a one of the eight available math  
waveforms, M1 through M8. Be sure to click to check  
the On box, so that the waveform displays.  
Tip. If the waveform you select already exists, its math  
expression appears in the dialog box. You can still use  
the waveform by clicking the Clear button, which  
discards its previous math expression. Or repeat step 3  
to select another waveform.  
Build a math 4. Use the dialog box at right to define a math expression.  
expression  
See Table 3-8 on page 3-103 for expression examples;  
some guidelines for creating your expression follow:  
H
Sources C1 - C8, R1 - R8, and Meas1 -  
Meas8 should be set up before you use them  
(references and automated measurement scalars  
defined).  
H
Elements that appear grayed out cannot be  
selected because they would result in an illegal  
entry. For example, the sources are grayed out  
because a source was just entered. You must enter  
an operator before entering another source.  
H
H
Use the backspace button to remove the last entry;  
use the clear key to remove the entire expression  
and start over.  
Use parentheses to group terms in the expression  
to control execution order, for example,  
5*(C1 + C2).  
Apply a filter 5. Use the filter controls in the dialog box to apply a filter to  
the math waveform defined by the expression. Here are  
some guidelines:  
H
Num Avgs. Set the number of averages applied by  
the Avg( function. Only affect waveforms if the Avg(  
function is used.  
H
H
Filter Risetime. Set to limit risetime to improve TDR  
measurement results.  
Filter Mode. Choose Centered or Shifted for causal  
or noncausal filtering.  
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Creating Math Waveforms  
Overview  
To define a math waveform (cont.)  
Related control elements & resources  
Apply the 6. Once you have defined the math expression to your  
expression  
satisfaction, click the Apply button. Then click on the  
OK button to dismiss the dialog box. See To Use Math  
Waveforms on page 3-109 for more procedures.  
For more  
information  
7. Click the  
icon in the the upper-right corner of the  
Define Math dialog box, and then click any dialog-box  
control to pop up help on that control.  
8. Click the Help button in the Define Math dialog box to  
access context-sensitive overview on math waveforms.  
See Accessing Online Help on page 3-167 for  
overview of the online help system.  
End of Procedure  
Operations on Math Waveforms  
This instrument supports many of the same operations that it provides for  
channel (live) and reference waveforms. For example, you can measure math  
waveforms with cursors. This section introduces these operations:  
H
H
H
Vertical display scaling and positioning  
Taking automatic measurements  
Taking cursor measurements  
Why Use?  
Use math waveform operation, such as those listed above, to enhance the  
displaying, processing, and analyzing of math waveforms. For example, in  
addition to the operations listed, you can save math waveforms as references and  
make them the source of either of two onboard waveform data bases.  
Whats Excluded?  
Some operations allowed on channel waveforms are not allowed on math  
waveforms:  
H
Independent horizontal scaling. Each math waveform that you create derives  
its horizontal scale and position from the sources you include in its math  
expression. Horizontal controls will not operate with math waveforms.  
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Creating Math Waveforms  
You can adjust these controls for the source waveforms and your adjustments  
will reflect in the math waveform as the sources update. You can also  
magnify math waveforms using the Mag1 or Mag2 derived time bases.  
H
H
Independent vertical offset. You cannot adjust the offset for a math wave-  
form; you can adjust the offset of channel waveforms used as sources to a  
math waveform.  
Explicit gating of waveforms. The entire math waveform is used as input to  
the automatic measurement system.  
Keys to Using  
Basically, you use the same techniques to work with math waveforms that work  
with channel waveforms. The key points that follow describe operating  
considerations to take into account when using math waveforms.  
Source Considerations. In general, be aware that changes to source waveforms  
that you include as math-expression operands are reflected in the math wave-  
form. See Source Dependencies on page 3--104.  
Display Considerations. Turn on and off the display of math waveforms like you  
do channel and reference waveforms. Use the same front-panel controls  
(waveform selection buttons, vertical position and scale knobs) and application  
controls (waveform control bar elements at the bottom of the display; vertical  
setup menu). Mouse operation for positioning waveforms on screen work also.  
As is true for channel and reference waveforms, turning a math waveform on or  
off in any time base display, Main, Mag1, or Mag2, also turns it on or off in all  
the time bases.  
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Creating Math Waveforms  
To Use Math Waveforms  
The procedure that follows demonstrates some common operations you can  
perform on math waveforms:  
Overview  
To use math waveforms  
Related control elements & resources  
Prerequisites 1. The Math waveform must be defined and displayed. See  
the reference listed at right.  
See To Define Math Waveforms on page 3-105  
Select and dis- 2. Press the Vertical MATH button. The button of the  
play  
currently displayed and selected math waveform will  
light amber; the buttons of all other currently displayed  
math waveforms will light green. Math waveforms not  
displayed remain unlighted.  
3. Press any waveform button to make it the selected  
waveform. If the waveform was not displayed,  
operation is as follows:  
H
If the waveform you select is defined, it displays,  
otherwise..  
H
the Define Math dialog box displays so that you  
can define and turn on the waveform you just  
selected. (See To Define a Math Waveform on  
page 3-105 for a procedure for doing so.)  
Tip. You can also click the math waveform in the  
display, or its icon at the left of the display, to select it.  
Set scale and 4. Use the Vertical Scale and Position knobs to size and  
position  
position the waveform on the screen.  
Tip. You cant adjust the offset of a math waveform.  
However, adjustments of offset settings in the source  
waveforms will reflect in the math waveform as  
determined by its expression.  
Tip. You cant adjust horizontal scale, position, and  
sample density (resolution) of math waveforms. If  
adjusting these settings affect sources for a math  
waveform, the adjustment will be reflected in the math  
waveform.  
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Creating Math Waveforms  
Overview  
To use math waveforms (cont.)  
Related control elements & resources  
Take automatic  
measurements  
5. Press the Vertical MATH button, and use the  
numbered front-panel button to choose a math  
waveform from M1 - M8. (See right.)  
6. Select one of the signal types, such as Pulse, and  
then select a measurement category from the  
measurement bar.  
7. Click a measurement button. The instrument  
automatically takes the measurement on the  
waveform you selected in step 5.  
8. Read the results in the measurements readout.  
Tip. For more control of your measurement, go to  
the Setup menu (in the application menu bar) and  
select Measurements. Click the Help button in the  
Measurements Setup dialog box that displays for  
more information.  
.
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Creating Math Waveforms  
Overview  
To use math waveforms (cont.)  
Related control elements & resources  
Take cursor  
measurements  
9. Press the Vertical MATH button, and use the  
numbered front-panel button to choose a math  
waveform from M1 - M8. The button will light amber  
when you have chosen the waveform. (See figure at  
upper right.)  
10. Press the CURSORS button (see figure at lower  
right). Press:  
H
Once to display vertical bar cursors (shown  
below)  
H
H
A second time to display horizontal bar cursors  
A third time to display waveform-based cursors  
11. Press the SELECT button to toggle selection  
between the two cursors.  
12. Turn the knob to position each cursor on the math  
waveform to measure the feature that interests you.  
13. Read the results in cursor readout.  
In the figure shown above, waveform cursors are  
used to measure the V of the integral math  
waveform, which could be used to compute its  
area (svdt).  
End of Procedure  
For more information on taking automatic and cursor measurements of wave-  
forms, see Measuring Waveforms on page 3--73.  
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Creating Math Waveforms  
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Data Input and Output  
This section describes the input and output capabilities of your instrument.  
Specifically, it covers:  
H
H
H
H
H
Saving and Recalling Setups on page 3--113  
Saving and Recalling Waveforms on page 3--120  
Exporting Waveforms and Histograms on page 3--128  
Printing Waveforms on page 3--132.  
Remote Communication on page 3--139  
Signal processing  
& transformation  
system  
Acquisition  
system  
Output and  
storage  
User Interface  
and display  
Sampling  
module  
Trigger  
system  
Time base  
system  
Saving and Recalling Setups  
This instrument can save a number of different instrument setups for later recall,  
limited only by the space you have to store the setups.  
Save and recall different setups to switch from setup to setup without having to  
first manually record your settings and then manually set them. This capability is  
helpful when you want to:  
Why Use?  
H
H
H
save and recall a setup that optimizes the instrument for displaying and  
analyzing a certain signal.  
save a series of setups to help automate a procedure through recall of a  
sequence of saved setups as part of performance of the procedure.  
export a setup for sharing with a second instrument.  
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Data Input and Output  
Whats Special?  
Some features of note follow:  
Commenting. The Save-Setup and the Recall-Setup dialog boxes provide for  
including and viewing comments with your saved setups. That way, you can  
store information, readable upon recall, that describes each setup you save and its  
intended application.  
Virtual Keyboarding. If you do not have a keyboard connected, you can still enter  
comments and name setup files. The Save and Recall Setup dialog boxes include  
the Virtual Keyboard button, shown left. When you touch or click it, the  
instrument displays a virtual keyboard on screen that you can use with your  
mouse or the touch screen to enter the setup-path name, setup-file name, and  
comment.  
The instrument excludes the following items when saving setups:  
Whats Excluded?  
H
Waveforms in channels (C1-C8) or references (R1-R8). Control settings  
(scale, position, and so on) are saved but not the waveform data. Upon recall  
of the setup, the settings are applied, but the data is not restored.  
H
Waveforms in Math Waveforms (M1-M8). Control settings and the math  
expression are retained but not the waveform data. Upon setup recall, the  
recalled math waveform expressions will be applied, but there is no math  
waveform data to restore. Instead, a new math waveform will be generated  
based on the recalled expression.  
H
H
User Options that are stored in the Windows Registry. These include all  
options accessed by first selecting Utilities (menu bar), and then User  
Preferences (Utilities menu).  
Standard Masks. Standard masks are not stored with the setups. However, if  
your recalled setup includes display of a mask, recalling the setup will, in  
turn, display the mask. Also, masks you define are stored with the setups.  
The key points that follow describe operating considerations for setting up the  
saving and recalling of setups.  
Keys to Using  
All Settings are Retained. The instrument includes almost all instrument settings,  
with a few exceptions (such as user options) in the saved setup.  
Retaining Current Settings. Recalling a setup replaces the current setup with the  
recalled setup. If you do not want to lose your current setup, save it to its own  
setup file for later recall before you recall the new setup.  
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Data Input and Output  
Avoiding Setup and Waveform Mismatches. Saved setups may contain settings  
inappropriate for waveforms currently in your instrument. For example, you  
might have saved a setup that displayed a fiber channel mask, such as FC531, for  
testing channel 1. If later you display a gigabit ethernet signal in channel 1 and  
recall your saved setup, the FC531 mask will display.  
Avoiding Setup and Sampling Module Mismatches. Recall of a setup assumes that  
the sampling module appropriate to the recalled setup is installed. For example,  
recalling a setup that saved optical vertical-control settings requires that an  
optical sampling module be installed. If not, the instrument substitutes default  
settings for the affected vertical controls settings instead of recalled settings.  
Other examples of such mismatches include:  
H
Recalling a setup that includes TDR without the TDR-capable sampling  
module installed. You must have the TDR-capable module installed in the  
same compartment it was in when the setup was saved.  
H
Recalling a setup that includes a clock-recovery setup without the appropri-  
ate clock-recovery-capable sampling module installed. You must have the  
clock recovery-capable module installed in the same compartment as when  
the setup was saved.  
To Save Your Setup  
Use the procedure that follows to save a setup to the instrument hard disk, a  
floppy disk, or third-party storage device.  
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Data Input and Output  
Overview  
To save your setup  
Control elements & resources  
Prerequisites 1. The instrument must have appropriate sampling  
modules in place before powering on the instrument.  
2. Instrument must be powered up.  
H
See Sampling Module User Manuals for  
sampling module installation.  
3. Set up the instrument controls as you want them saved  
as part of a recallable setup.  
H
H
H
See Power On Instrument on page 1-13.  
See page 3-24 for acquisition setup.  
See page 3-48 for trigger setup.  
For help in making your setup, check the references at  
right and other sections in this chapter specific to the  
setup you wish to make.  
Display the 4. From the application menu bar, select File, and then  
select Save Setup. See illustration at right.  
Save Setup dia-  
log box  
The Save Setup dialog box allows for the entry of a file  
name, file type, and includes a field for adding your  
comments. See below.  
Name a 5. Use the Save in: drop-down list and buttons (see right)  
to navigate to the directory in which to save your setup.  
destination  
Tip. If you save the setup file in the MS Windows  
Startup directory, the saved preferences will be loaded  
with each MS Windows startup.  
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Data Input and Output  
Overview  
To save your setup (cont.)  
Control elements & resources  
Name your 6. Name your setup file by either:  
setup  
H
H
H
accepting the default file name that appears in the  
File name: text box.  
clicking in the File name text box and typing a new  
name, replacing the default file name.  
Access to virtual keyboard  
clicking an existing name in the file list (if any are  
listed). Data in existing file will be overwritten.  
Tip. If your instrument lacks a keyboard, touch or click  
on the virtual keyboard icon (indicated right) to display a  
virtual keyboard. You can use the mouse or touch  
screen with the virtual keyboard to type entries in the  
name fields and comments fields.  
7. If not selected, select *.stp in the Save as type list box  
as the type of file. (Setup files are always type *.stp).  
Tip. Only change the type if you want to temporarily see  
any other types of files in the current directory.  
Otherwise, leave it set at *.stp.  
Add a comment 8. Enter a useful comment about each setup you save.  
(optional)  
Write the comment such that it explains the purpose of  
the saved file when that file is later accessed (see right).  
Tip. Use comments frequently. The comment that you  
enter appears when you (or others) later select your  
setup in this dialog box or in the Recall Setup dialog  
box. In the first case, it might help you avoid overwriting  
a setup you wanted to keep; in the second case, it can  
help determine the purpose of the setups saved earlier.  
Save your setup 9. Click the Save button to save the setup file. To cancel  
without saving, click Cancel button.  
For more 10. For more help on saving setups, click the Help button  
information  
in the Setup dialog box to access contextual help on  
screen.  
See page 3-167 to learn about using online help.  
End of Procedure  
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Data Input and Output  
To Recall Your Setup  
Use the procedure that follows to recall a setup to the instrument. Remember that  
recalling a setup replaces the existing setup, which is lost.  
Overview  
To recall your setup  
Control elements & resources  
Prerequisites 1. The instrument should have appropriate sampling  
modules in place for the setup to be recalled. You must  
have access to a setup saved by the instrument.  
H
See Sampling Module User Manuals for  
sampling module installation.  
H
H
See Power On Instrument on page 1-13.  
See Keys to Using on page 3-114.  
Display the 2. From the application menu bar, select File, and then  
Recall Setup  
dialog box  
select Recall Setup. (See right.)  
The Recall Setup dialog box allows navigation to  
directories, lists setup files in the directory, and provides  
for selection of a setup file. Comments for selected files  
appear in the comment box. (See below.)  
Name a 3. Use the Look in: drop down list and buttons (see right)  
to navigate to the directory which contains a setup that  
you want to recall.  
destination  
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Data Input and Output  
Overview  
To recall your setup (cont.)  
Control elements & resources  
Select your 4. If not selected, select *.stp in the Save as type list box  
setup  
of file to include in the dialog box file listing. (Setup files  
are always type *.stp).  
Tip. Only change the type if you want to temporarily see  
any other types of files in the current directory.  
Otherwise, leave it set at *.stp.  
5. Choose your setup file by either:  
H
H
Clicking an existing name in the file list.  
Clicking in the File name field and typing a new  
name, replacing the default file name.  
Access to virtual keyboard  
Tip. If your instrument lacks a keyboard, touch or click  
on the icons as indicated right to display a virtual  
keyboard. You can use the mouse or touch screen with  
the virtual keyboard to type entries in the name fields  
and comments fields.  
View any in- 6. Read the comment associated with the setup you  
choose if any is present. It can contain information about  
using the setup you are about to restore (see right).  
cluded com-  
ment (optional)  
Tip. Selecting a file displays any comments that were  
entered when the setup was saved. Comments can help  
you ascertain the purpose of the setups saved earlier.  
Recall your 7. Click the Recall button to save the setup file. To cancel  
setup  
without recalling a setup, click the Cancel button.  
Tip. You can also recall the default setup from this  
dialog box; clicking the Default button recalls the the  
factory default setup.  
For more 8. For more help on recalling setups, click the Help  
information  
button in the dialog box to display contextual help on  
screen.  
See page 3-167 to learn about using online help.  
End of Procedure  
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Data Input and Output  
Saving and Recalling Waveforms  
This instrument can save any number of waveforms, limited only by the space  
you have to store them.  
Why Use?  
By saving a waveform, you can recall it at a later time for comparison, evalua-  
tion, and documentation. This capability is helpful when you want to:  
H
recall a waveform for further evaluation or comparison with other wave-  
forms.  
H
extend the waveform carrying capacity of the instrument. The instrument  
supports eight reference, eight channel, and eight math waveforms. If you  
want more than eight references, you can save the additional reference to  
disk for recall later.  
Whats Special?  
Some features of note follow:  
Commenting. The Save-Waveform dialog box and the Recall Waveform dialog  
box contain a comments field for including and reading comments with your  
saved waveforms. That way, you can store information, readable upon recall,  
describing each waveform that you save.  
Virtual Keyboarding. If you do not have a keyboard connected, you can still enter  
comments and name waveform files. The Save and Recall Setup Waveform  
dialog boxes include the Virtual Keyboard button shown left. When you touch or  
click it, the instrument displays a virtual keyboard on screen that you can use  
with your mouse or the touch screen to enter the waveform-path name, file name,  
and comment.  
Whats Excluded?  
You cannot recall into a channel or a math waveform. The instrument recalls  
each waveform into one of the reference waveform locations (R1-R8). Also, you  
cannot save and recall waveform databases.  
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Data Input and Output  
To Save Your Waveform  
Use the procedure that follows to save a waveform or waveforms to the  
instrument hard disk, a floppy disk, or third party storage device.  
Overview  
To save a waveform  
Control elements & resources  
Prerequisites 1. The instrument must have appropriate sampling  
modules in place before powering on the instrument.  
Instrument must be powered up.  
2. Make sure the waveform to be saved exists; that is, your  
source must be a channel, an active math waveform, or  
an active reference. Display the waveform in the  
timebase in which you want to save it, Main1, Mag1,  
and/or Mag2, or the waveform will not appear in the  
Save Waveform dialog box.  
H
See Sampling Module User Manuals for  
sampling module installation.  
H
H
See Power On Instrument on page 1-13.  
See page 3-24 for acquisition setup.  
H
H
See page 3-48 for trigger setup.  
For help in setup and acquiring waveforms, check the  
references at right.  
See page 3-57 for time base display.  
Display the 3. From the application menu bar, select File, and then  
select Save Waveform. See right.  
Save Waveform  
dialog box  
The Save Waveform dialog box lists all available  
waveforms for all displayed timebases, allows for  
browsing to destination directory (saving to file) or for  
selecting a reference (saving to one of R1-R8). It also  
includes a field for adding your comments. See below.  
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Data Input and Output  
Overview  
To save a waveform (cont.)  
Control elements & resources  
Select a 4. Navigate to the directory in which to store your  
destination  
waveform. You can:  
H
Save to a reference: Click to check Reference, and  
then use the pulldown list to select any reference  
(R1-R8). You can save to empty references or save  
over existing references. Skip to step 8 to finish.  
H
Save to a file: Click to check File(s) and continue  
with step 5 that follows.  
Select waveforms individually  
Select your 5. Select one or more waveform to save:  
waveform(s) to  
save  
H
H
H
Click a waveform in the tree view (see right). Note  
that only displayed timebases and their waveforms  
appear.  
Extend your selection, if desired, by holding down  
the control key and clicking additional waveforms,  
or...  
Select all waveforms in timebase  
Select all waveforms in a given timebase by  
clicking the timebase (for example, click Main).  
Tip. If your instrument lacks a keyboard, you cant use  
the control key to extend selections. However, you can  
touch or click individual waveforms or timebases to  
select them.  
Edit path and file name  
Select directory 6. Specify the directory and filename(s) in which to save  
and name file  
your waveform(s). If youve selected a single waveform,  
you can:  
H
H
H
Use the default name and directory appearing in  
the File Path field.  
Access to virtual keyboard  
Access to file system  
Click to access the file system (see right) and  
navigate to a new directory.  
Rename the file and/or change the directory by  
typing a new name and path into the File Path field.  
If youve selected multiple waveforms, the File Path field  
will change to Dir\Prefix. You can edit the path and the  
prefix used for the filenames as just described. All files  
will save into the same directory. The File Path field will  
change to Dir\Prefix.  
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Data Input and Output  
Overview  
To save a waveform (cont.)  
Control elements & resources  
Add a comment 7. For saves to files or to references, you can enter a  
(optional)  
useful comment about the each waveform you save.  
Write each comment such that it explains the purpose of  
the saved waveform when its waveform file is later  
accessed (see right).  
Tip. If you save multiple waveforms, the instrument  
saves your comment with all the resulting files, so make  
such a comment pertain to all the waveforms.  
Save your 8. Click the Save button to save the waveform file or  
waveform  
reference. To cancel without saving, click Cancel button.  
For more 9. For more help on saving waveforms, press the Help  
information  
button in the dialog box to access the contextual  
online help.  
See page 3-167 to learn about using online help.  
End of Procedure  
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Data Input and Output  
To Recall Your Waveform  
Use the procedure that follows to recall a waveform to a reference. You can only  
recall waveforms into references.  
NOTE. Reference waveforms do not recall because they are already instrument  
resident. You can copy a reference waveform to another reference: first display  
the reference to be copied, and then use the Save Waveform procedure to save it  
to another reference (R1-R8).  
Overview  
To recall a waveform  
Control elements & resources  
Prerequisites 1. The instrument must have appropriate sampling  
modules in place before powering on the instrument.  
Instrument must be powered up.  
H
H
See Sampling Module User Manuals for  
sampling module installation.  
See Power On Instrument on page 1-13.  
Display the Re- 2. From the application menu bar, select File, and then  
call Waveform  
dialog box  
select Recall Waveform. (See illustration at right.)  
The Recall Waveform dialog box allows navigation to  
directories, lists waveform files in the directory, and  
provides for selection of a waveform file. Comments for  
selected files appear in the comment box. (See below.)  
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Data Input and Output  
Overview  
To recall a waveform (cont.)  
Control elements & resources  
Name a 3. Use the Look in: drop down list and buttons (see right)  
to navigate to the directory which contains a waveform  
that you want to recall.  
destination  
Select your 4. If not selected, select *.wfm in the Files of type field to  
waveform  
force the dialog-box file listing to only include these  
types. Use *.wfm for waveforms.  
Tip. Only change the type if you want to temporarily see  
any other types of files in the current directory.  
Otherwise, leave it set at *.wfm.  
5. Choose your waveform file by either:  
H
H
Clicking an existing name in the file list.  
Access to virtual keyboard  
Clicking in the File name field and typing a new  
name, replacing the default file name.  
Tip. If your instrument lacks a keyboard, touch or click  
on the icons as indicated right to display a virtual  
keyboard. You can use the mouse or touch screen with  
the virtual keyboard to type entries in the File name and  
Files of type boxes.  
View any 6. Read the comment associated with the waveform file  
included com-  
ment (optional)  
you choose, if a comment is present. It can contain  
information that help you use the waveform you are  
about to restore (see right).  
Tip. Selecting a file displays any comments that were  
entered when the waveform was saved.  
Recall your 7. Click the Recall button to save the waveform file. To  
waveform  
cancel without recalling a waveform, click the Close  
button.  
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Data Input and Output  
Overview  
To recall a waveform (cont.)  
Control elements & resources  
For more 8. For more help on recalling waveforms, press the Help  
information  
button in the dialog box to access contextual online  
help.  
See page 3-167 to learn about using online help.  
End of Procedure  
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Data Input and Output  
To Clear References  
You can clear individual references of data individually or all at once. If a  
reference is listed as active and you are sure you do not want the data it contains,  
use the procedure that follows to clear it. You can clear any of the active  
references R1-R8.  
Overview  
To clear a reference  
Control elements & resources  
Display the 1. From the application menu bar, select Edit, and then  
Clear Refer-  
ences dialog  
box  
select Clear References. See illustration at right.  
Select Refs 2. Click to select the reference to clear. If you have a  
keyboard installed, you can hold down the control key  
and click to select multiple references for deletion. Click  
the Clear button to delete; click the Close button to  
dismiss the dialog box.  
End of Procedure  
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Data Input and Output  
Exporting Waveforms and Histograms  
This instrument also supports export of a waveform or histogram to a file. The  
instrument exports the data as comma-separated ASCII text.  
Why Use?  
By exporting a waveform or a histogram, you can use it with other analysis  
tools, such as spreadsheets or math-analysis applications.  
Keys to Using  
The key points that describe operating considerations for setting up the exporting  
of waveforms and histograms follow:  
H
Waveforms export as a series of comma-separated values (CSV), which are  
amplitudes without units. There is no timing information, but data is placed  
in the file in sequence from the first sample in the waveform record to the  
last.  
H
H
Histograms also export as a series of comma-separated values (CSV), which  
are values without units. One value is present for each bin in the histogram.  
Because the waveforms are exported as CSV, without timing and scaling  
information, the instrument does not import these waveforms directly. If you  
intend to recall a waveform later, save it (see the procedure To Save Your  
Waveform on page 3--121) instead of exporting it. You cannot import  
histograms.  
H
You may also choose to copy a waveform and paste directly into some  
applications such as Microsoft Word or Excel. If so, select your waveform,  
and then select Copy in the Edit menu.  
To Export Your Waveform  
The procedure to export waveforms is almost the same as the procedure to save a  
waveform. Use the procedure To Save Your Waveform on page 3--121 while  
observing the following differences:  
H
Select Export Waveform from the the File menu instead of Save waveform.  
The Export dialog box displays (see Figure 3--25 that follows).  
H
H
H
You can only select and export one waveform at a time.  
You cannot include comments with your exported waveform.  
Your exported waveform will contain the waveform data as a series of  
comma separated values (no timing information, but data is sequential).  
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Figure 3-25: Export dialog box  
To Export Your Histogram  
Use the process just described for exporting a waveform on page 3--128, select  
the Histogram button in the Export dialog box (see Figure 3--25). Also skip  
selecting a source. The instrument supports a single histogram, so the current  
histogram is automatically selected. If no histogram is enabled in the Hist Setup  
dialog box, the Histogram button will be disabled in the Export dialog box.  
To Use an Exported  
Waveform (or Histogram)  
How you use the exported waveform or histogram depends on your application.  
The following example is a simple application using a waveform; the procedure  
is general and may require adapting for your spreadsheet or other data-analysis  
tool.  
Overview  
To use exported waveforms  
Control elements & resources  
Prerequisites 1. MS Excel 97 running on a PC or on the instrument.  
2. Access to a waveform exported by the instrument.  
H
See To Export Your Waveform on  
page 3-128.  
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Overview  
To use exported waveforms (cont.)  
Control elements & resources  
Import the 3. In Excel, select Open from the File menu. Use the  
dialog box that pops up to navigate to the directory  
containing the file.  
waveform data  
4. In the dialog that displays, make the selections as  
shown right as you navigate through the Text Import  
Wizard. You must select delimiter as your data type,  
comma as the delimiter type, and General as your  
data type.  
Tip. This step assumes MS Excel 97; your tool may  
have similar import features for comma-separated da-  
ta. Check its documentation.  
Begin your 5. Click on the row number to select the entire row  
chart  
containing your imported waveform values (See  
illustration at right.)  
6. Select the Chart button from the toolbar (See  
illustration at right.) or from the Insert menu.  
Select the entire row  
Access the chart wizard  
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Overview  
To use exported waveforms (cont.)  
Control elements & resources  
Specify a 7. From the Chart Wizard, make sure Built In is checked.  
line-graph  
chart  
Then select the either Lines in the Standards Types  
tab or Smooth lines in the Custom Types tab. (See  
illustration at right.)  
Finish the 8. Click Next to step through the next two steps  
chart  
accepting the defaults settings at each step. Click the  
Finish button in step 4. You should have a waveform  
display similar to that show right.  
Tip. This procedure assumes MS Excel 97. You can  
likely specify titles, customize the treatment and  
labeling of the x and y axes, etc. in your data-analysis  
applicationeither as you create the chart or  
afterward. Use the help for your data-analysis  
application to determine if it has these capabilities  
and for instructions in using them.  
For more 9. For more help on exporting waveforms., press the  
information  
Help button in the dialog box to access contextual  
online help.  
See page 3-167 to learn about accessing online help.  
End of Procedure  
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Printing Waveforms  
You can print the display screen, including any waveforms displayed. Before  
doing so, you must install and set up your printer.  
To Print Waveforms  
To print the display and its waveforms, do the following steps:  
Overview  
To print waveforms  
Control elements & resources  
Prerequisites 1. Waveforms must be displayed on screen.  
2. Your printer must be accessible and configured  
properly.  
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H
H
See Acquiring Waveforms on page 3-3.  
See Triggering on page 3-39.  
See Displaying Waveforms on page  
3-53.  
H
See your printer instructions and/or the  
Windows Help. (See page 3-161 for  
information on accessing Window help.)  
Access the 3. Select the File menu from the application menu bar,  
Print dialog  
box  
and then select Print in the menu.  
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Overview To Print Waveforms (cont.)  
Control elements & resources  
Configure and 4. Configure your print job using the the standard  
Print  
Microsoft Windows Print dialog box that displays.  
Press the OK button to print your display.  
Tip. Access the printer instructions or the Windows  
Help system if you require more information on  
printing.  
End of Procedure  
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To Print Using  
Ink-saver Mode  
To conserve ink and improve print quality when printing images of waveform  
displays, you can use Ink-saver mode. Do the following steps:  
Overview  
To print using ink-saver mode  
Control elements & resources  
Prerequisites 1. Waveforms must be displayed on screen.  
2. Your Printer must be accessible and configured  
properly.  
H
H
H
See Acquiring Waveforms on page 3-3.  
See Triggering on page 3-39.  
See Displaying Waveforms on page  
3-53.  
H
See your printer instructions and/or the  
Windows Help. (See page 3-161 for  
information on accessing Window help.)  
Access the 3. Select the File menu from the application menu bar,  
Print dialog  
box  
and then select Page Setup in the menu.  
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Overview  
To print using ink-saver mode (cont.)  
Control elements & resources  
Set Ink-saver 4. In the Page Setup dialog box that displays, click  
mode  
Ink-saver Mode.  
5. Click OK to set the instrument to use Ink-saver mode,  
or click Print... to set up your print job and print the  
display.  
End of Procedure  
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Data Input and Output  
To Print to a File  
You can also print the instrument screen and its waveforms to a file. This  
instrument currently supports printing to BMP, JPEG, TIFF, PNG and Targa  
image-file formats.  
NOTE. Screen images saved using the PNG (Portable Network Graphics) format  
can consistently achieve compression ratios better than 10:1, and often better  
than 50:1 compared to a BMP screen image file. PNG is a lossless format  
similar to GIF format.  
Overview  
To print to a file  
Control elements & resources  
Access the 1. Select the File menu from the application menu bar,  
Print dialog  
box  
and then select Print in the menu.  
2. Click the Print to File box in the Print dialog box, and  
click OK.  
Select format 3. In the Print to File dialog box, navigate to the folder  
and save  
you want. Then type a name for your file in the File  
name box.  
4. In the Save as type menu, click the down-arrow and  
select a file image format from the drop-down menu.  
5. Click Save to place the instrument screen in the file  
and image format that you selected.  
Access to virtual keyboard  
Enter file name  
Tip. Access the printer instructions or the Windows  
Help system if you require more information on  
printing.  
Select the image format  
End of Procedure  
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Data Input and Output  
To  
Set High Color  
If the display screen printouts have missing information such as blacked-out  
readouts, your instrument may need to be set to a higher color setting. To do so,  
follow the steps below:  
Overview  
To set high color  
Control elements & resources  
Prerequisites 1. Waveforms must be displayed on screen.  
2. Your Printer must be accessible and configured  
properly.  
H
H
H
See Acquiring Waveforms on page 3-3.  
See Triggering on page 3-39.  
See Displaying Waveforms on page  
3-53.  
H
See your printer instructions and/or the  
Windows Help. (See page 3-161 for  
information on accessing Window help.)  
Access the 3. Click the minimize (-) button in the upper right corner  
Display Prop-  
erties dialog  
box  
of the UI application to expose the desktop.  
4. Right click the desktop, and select Properties from the  
menu that pops up.  
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Overview  
To set high color (cont.)  
Control elements & resources  
Select the Set- 5. In the Display Properties dialog box that displays, click  
tings Tab  
the Settings tab.  
Select and Set 6. Click the monitor 1 icon (if necessary) in the Settings  
High Color  
dialog box.  
7. Select High Color in the Colors list box.  
8. Click OK to apply changes. If a confirmation box  
appears, click its OK button.  
End of Procedure  
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NOTE. If you print the screen infrequently, you may want to return the colors  
setting to 256 colors except when printing. To return to 256 colors, repeat the  
procedure above, but select 256 colors in step 4.  
Remote Communication  
Remote communication is performed through the GPIB interface. Consult the  
online Programmer Guide for help with establishing remote communication and  
control of the instrument.  
To access the Programmer Guide, select Programmer Guide in the Help menu  
from the front screen.  
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Using Masks, Histograms, and Waveform Databases  
The instrument comes equipped with statistical tools to help you display, test,  
and evaluate waveforms. This section describes these tools and how you use  
them:  
H
Mask Testing Waveforms, on page 3--141, describes how you can use  
standard or user-defined masks to set up the instrument to automatically  
detect mask violations in communications and other waveforms.  
H
H
Taking Histograms, on page 3--154, describes how to take histograms to  
view the horizontal or vertical distribution of data on your waveforms.  
Using Waveform Databases, on page 3--159, describes how to accumulate a  
waveform into the database and use the waveform database to view the  
waveform data weighted with respect to how frequently it reoccurs in the  
database.  
Mask Testing Waveforms  
This section overviews the instrument features related to mask testing, including  
how to create, edit, delete, and activate masks. You can select a standard mask,  
edit a mask, or create an new mask from scratch.  
Why Use?  
Use mask testing to test your waveforms for time or amplitude violations. Mask  
testing will count waveform samples (called hits or violations) that occur within  
a specific area (the mask).  
Use the communications-standard masks that this instrument provides (SONET/  
SDH, Fiber Channel Optical and Electrical, and Ethernet) to test your signals, or  
define your own masks.  
Whats Special?  
Some mask testing features of note follow:  
Flexible Mask Editing. You can use the controls in Mask Setup dialog box to  
completely specify custom masks or edit existing masks, selecting, adding/delet-  
ing, and placing a vertices in user-defined (waveform source) units. For quick  
edits, you can use can use the mouse or touchscreen to drag to resize and  
reposition the masks directly on the screen.  
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Mask-Specific Autoset. You can set Autoset to either Auto or Manual in the Mask  
Setup dialog box. When set to Auto, the instrument automatically performs a  
standard, mask-specific autoset whenever you select a standard mask.  
Whats Excluded?  
GPIB editing. You cannot edit masks through the programmable interface  
(GPIB). You can, however, still create and/or delete entire masks through this  
interface.  
Concurrent Mask Tests. Only one mask standard (or user defined set) is active at  
any time. If you have a mask selected/enabled and then select a new mask, the  
new mask replaces the previous mask. You cannot test to multiple standards  
simultaneously.  
Keys to Using  
The key points that describe operating considerations for using and editing  
masks follow:  
Mask Standards and Masks. A mask standard contains one or more masks that,  
when applied against the waveforms for which they are intended, test the  
waveform for violations of an industry standard. The supported standards are  
listed in Table 3--9.  
Masks are numbered polygons that define an area within a mask standard (or  
within a user mask) in which to count waveform samples as hits.  
Table 3-9: Standard masks  
SONET/SDH  
Fiber channel  
Ethernet / Other  
Gigabit Ethernet  
10GBASE-X4 (Ethernet)  
10GBASE-W (Ethernet)  
10GBASE-R (Ethernet)  
Infiniband (Other)  
2GbE  
OC-1/STM-0 51.84 Mb/s  
OC-3/STM-1 155.52 Mb/s  
OC-9 466.56 Mb/s  
OC-12/STM-4 622.08 Mb/s  
OC-18933.12 Mb/s  
OC-24 1244.2 Mb/s  
OC-36 1866.2 Mb/s  
OC-48/STM-16 2488.3 Mb/s  
FEC2666  
FC133 Optical 132.8 Mb/s  
FC266 Optical 265.6 Mb/s  
FC531 Optical 531.2 Mb/s  
FC1063 Optical 1.0625 Gb/s  
FC2125  
FC4250  
FC133 Electrical 132.7 Mb/s  
FC266 Electrical 265.6 Mb/s  
FC531 Electrical 531.2 Mb/s  
FC1063 Electrical 1.0625 Gb/s  
10 GFC  
XAUI-Near  
XAUI-Far  
FEC11.10 Gb/s  
OC-192/STM-64  
FEC1066  
FEC1071  
OC-768/STM-256  
FEC4266  
FEC4302  
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Mask Counts. The instrument lists statistics for each mask (polygon) in the  
enabled standard (or user) in the Mask readout on the right side of the instrument  
screen. Each mask is listed by its number, with its count of hits, the number of  
hits common to all masks, and the total count of waveforms acquired.  
Mask Editing. Masks can be edited, in which case they become a User mask.  
Some tips on creating and using masks follow:  
H
When editing, locate one point along the left edge or right edge of the mask  
further left or further right than any other point. You can still create straight  
lines along the edge; just place one point further left of right than the others  
on the edge.  
H
H
The vertices numbers increase according to their order from left to right. The  
instrument reassigns numbers to vertices during mask creation or editing to  
hold to this rule.  
When adding new points to a mask, the instrument determines their location  
in the mask as follows (see Figure 3--26):  
a. Defines an imaginary line between the left-most vertex and right-most  
vertex in the mask.  
b. Defines all points above the imaginary line as the top of the mask; all  
points below as the bottom of the mask.  
c. Inserts new user-added points above the imaginary line into the top of  
the mask; inserts new user-added points below the imaginary line into  
the bottom.  
H
To create a mask with a concave area, create several masks to cover the same  
area. Data falling into two overlapping masks is counted only once as part of  
the total mask hits.  
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These points form  
the top of the mask  
Top/bottom dividing line  
(not displayed)  
Left-most point  
Right-most point  
These points form  
the bottom of the mask  
Figure 3-26: Creating a user mask  
Note in Figure 3--27 that a new vertex has been added to the mask shown in  
Figure 3--26. Since the point is added above the line, its added to the top.  
User added vertex  
Figure 3-27: Adding a new vertex  
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H
Masks are saved with setups, so you can save sets of masks by defining  
them, and then storing the instrument setup. Displayed masks are overwrit-  
ten when you recall a stored setup, select a standard mask, or initialize the  
instrument.  
To Mask Test a Waveform  
Use the procedure that follow to set up the instrument to mask test a waveform  
against a mask standard or user-defined mask set.  
Overview  
To mask test a waveform  
Related control elements & resources  
Prerequisites 1. The instrument must have at least one waveform turned  
on.  
See Displaying Waveforms on page 3-53 for  
information on displaying waveforms.  
Access the Mask 2. Select Mask from the Setup menu to display the Mask  
Setup dialog box  
Setup dialog box.  
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Overview  
To mask test a waveform (cont.)  
Related control elements & resources  
Select the mask 3. Select the waveform to bemask testedfrom thedrop-down  
source and turn on  
a mask  
list under Source.  
4. Use the Comm Standard drop-down list to select a  
standard or user-defined mask. See Table 3-9 on  
page 3-142 for a list of available standard masks.  
Selecting a communication standard or user-defined  
mask automatically:  
H
displays the mask on screen, and autosets for the  
mask, if Automatic is checked in the dialog box.  
H
automatically enables mask testing; uncheck  
Enable Mask Counts if you want to turn off mask  
counting.  
H
displays mask count statistics in the mask readout  
right of the display. A mask does not have to be  
displayed to have mask counting enabled.  
5. CheckUseWfm Database touse awaveform databaseas  
the waveform source.  
The Clear Data button resets all mask counts. In  
addition, if the source for mask testing is a waveform  
database, clicking this button clears the waveform  
database.  
Tip. Selecting a source that is currently displayed as a  
waveform database automatically enables mask testing  
on the database. To mask test the waveform instead of  
its database, uncheck the Use Wfm Database box.  
Adjust the mask 6. You can use the color pulldown list to change the color  
of the selected masks on screen.  
7. You can add or subtract from the masks on screen.  
Check On to turn on mask margins. Adjust the Margin  
percentage box control to increase (positive %s) or  
decrease the masks on screen.  
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Overview  
To mask test a waveform (cont.)  
Related control elements & resources  
Autoset the wave- 8. Click the Autoset button to perform a manual autoset on  
form to mask  
the mask-source waveform.  
Tip. You can choose to autoset the mask-source  
waveform to the mask anytime you select a new mask  
standard; just check Automatic option under Autoset.  
9. Select the HiLow Method used to determine the High  
and Low values when aligning the input signal to the  
masks.  
Mean sets the Mask Autoset to use the mean value of  
the High level (topline) and Low level (baseline), taken  
within the fixed eye aperture (center 20% of the eye), to  
align the input signal to the NRZ mask.  
Mode sets the Mask Autoset to use the High level  
(topline) and Low level (baseline), taken across one unit  
interval of the eye diagram, to align the input signal to  
the NRZ mask.  
Set Stop Action & 10. From the application menu bar, select Setup, and then  
start testing  
select Acquisition.  
11. In the Acq Setup dialog box (see right), check the  
Condition option under Stop After.  
12. In the Condition pulldown list, select a mask-related  
criteria, such as Mask Total Hits and set a count, such  
as 1, in the count box.  
These settings will stop acquisition when mask  
violations satisfy the criteria you set here. See below.  
13. Push the RUN/STOP front-panel button to restart  
acquisition, if stopped.  
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Overview  
To mask test a waveform (cont.)  
Related control elements & resources  
Restart testing 14. To restart after a Stop After condition occurs, push the  
front-panel CLEAR DATA front-panel button.  
Tip. If you want to acquire one, and only one, more  
waveform after the Stop After condition occurs, push  
the RUN/STOP front-panel button instead of CLEAR  
DATA.  
End of Procedure  
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To Edit a Mask  
When you edit a mask in an existing communications standard, the mask type  
switches from the selected standard to type User, and uses the masks from the  
Standard as a basis for editing. Use the procedure that follows.  
Overview  
To edit a mask  
Related control elements & resources  
Prerequisites 1. Theinstrument must haveat least onewaveform turnedon  
and the Mask Setup dialog box displayed.  
See Displaying Waveforms on page 3-53 for  
information on displaying waveforms.  
Select a mask 2. Next, you need to select and enable a standard mask  
set. To start with a standard mask, pull down the  
Comm Standard list and choose a standard mask. To  
create a mask from scratch or edit an existing  
user-defined mask, select User in the Comm Standard  
selection list.  
Open Mask 3. Click Mask Edit... to display the Mask Edit dialog box.  
Edit dialog box  
Note. The Mask Setup dialog box and Mask Edit dialog  
box are both within the Mask tab. Use the Edit Mask  
and End Mask Edit buttons to toggle back and forth  
between the two Mask dialog boxes.  
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Overview  
To edit a mask (cont.)  
Related control elements & resources  
Select a 4. Select a mask to edit from the Mask list. This section of  
the Mask Edit dialog box lists all masks available for edit  
and the number of vertices each mask has.  
mask to edit  
Add, edit, or delete 5. Once you have selected a mask, use the Vertex section  
mask vertices  
of the Mask Edit dialog to add, edit, or delete individual  
vertices. Use the Vertex Number box to select a vertex  
number for the selected mask.  
6. Use the Horizontal and Vertical box controls to set the  
horizontal and vertical positions of the selected vertex.  
Tip. You may also drag and drop vertices directly on the  
mask to new locations. Click on the mask on the  
graticule to select it. Vertices are designated with an X.  
7. Click Add to add a vertex to the selected mask. After  
clicking Add, click the location on the selected mask (in  
the graticule) where you want to the new vertex added.  
8. Click Delete to delete the selected vertex from the  
selected mask.  
Note. When you add or delete a vertex, the Mask list is  
updated to show the new number of vertices for each  
mask.  
9. Click End Mask Edit to close the Mask Edit dialog box  
and return to the Mask Setup dialog box.  
End of Procedure  
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Counting Masks  
Mask-counting statistics are displayed in the mask readout at the right-side of the  
display. Mask counting statistics are displayed as soon as you enable a mask, and  
stay visible even if the mask isnt displayed on screen.  
Mask number and hits count  
Total number of hits in all masks  
Total number of waveforms for all masks  
If mask counting is enabled, read the results as follows:  
H
Mask (n): Each mask in the standard is listed by number (Mask 1 for  
example) along side the number of hits in that mask.  
H
H
Total: Displays the total of all hits in all masks.  
#Wfms: Displays the number of waveforms that have been tested against the  
masks.  
To zero the counts for all masks, click Clear in the Mask Setup dialog box.  
NOTE. Executing Clear will clear not only the mask counts, but also the  
underlying waveform data. For example, if mask testing on a waveform database  
the database data is cleared and accumulation is restarted, and if mask testing  
on a waveform being averaged or enveloped, Clear restarts the averaging or  
enveloping.  
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To Create a New Mask  
Masks are created by connecting the points independently of the order they are  
entered. Points are connected by sorting the points in left-to-right order and  
grouping them across a diagonal from the left-most point to the right-most point.  
If two points share a horizontal position along either the left or right edge of the  
mask, the diagonal runs from the top left-most point to the bottom right-most  
point. Points below the diagonal form the bottom boundary of the mask; points  
above it form the top boundary. Use this procedure to create a new mask:  
Overview  
To create a new mask  
Related control elements & resources  
Prerequisites 1. The instrument must have at least one waveform turned  
on and the Mask Setup dialog box displayed.  
See Displaying Waveforms on page 3-53 for  
information on displaying waveforms.  
Select and display 2. To create a mask from scratch, select User in the Comm  
a user-defined  
mask  
Standard selection list.  
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Overview  
To create a new mask (cont.)  
Related control elements & resources  
Create a 3. Click Mask Edit to display the Mask Edit dialog box.  
new mask  
4. In Mask list, select the user-defined mask you wish to  
edit.  
5. Use the Vertex controls to add, position, and delete  
vertices on your new mask. You may also drag and drop  
vertices directly on the graticule display.  
6. Click End Mask Edit when you are finished creating your  
mask to apply all additions/changes and return to the  
Mask Setup dialog box.  
7. Read Helpful Hints (immediately following this  
procedure) for more information on creating masks.  
End of Procedure  
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Taking Histograms  
The instrument can display histograms constructed of waveform data. You can  
display both vertical (voltage) and horizontal (time) histograms, but only one at a  
time.  
Histogram box  
Histogram readout  
Histogram  
Figure 3-28: Vertical histogram view and statistics on data  
Use histogram statistics to analyze a range of data that you select.  
Some histogram features of note follow:  
Why Use?  
Whats Special?  
Flexible Histogram Editing. You can use the controls in Hist Setup dialog box to  
completely specify the histogram box on the waveform, in waveform units or as  
a percent of the graticule. For quick edits, you can use can use the mouse or  
touchscreen to drag to resize and reposition the box directly on the screen.  
Any Waveform or database as Source. Histograms can be taken on all channel,  
math, and reference waveforms. You can also take a histogram on any of the  
waveform databases that this instrument provides.  
Continuous Operation. The histogram that you set up can run, and its results can  
be displayed even if you turn off the display of the histogram or of the waveform  
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selected as its source. Histogram data is continuously accumulated and displayed  
until you explicitly turn it off or clear the waveform data of the histogram source.  
Whats Excluded?  
Histograms longer than 500 bins. Histograms are limited to the on screen  
resolution, limiting horizontal sizes of 500 bins.  
Multiple histograms. One histogram can be displayed on one source at a time.  
The source can be any waveform in any of the three Views, Main, Mag1, or  
Mag2.  
Keys to Using  
Histograms  
The following key points describe operating considerations for setting up the  
histograms so that they best support your data-analysis tasks.  
Histogram Counting Stays On. Once you check Enable Histogram in the  
Histogram Setup dialog, histogram counting starts and continues until you turn  
disable the histogram or clear the histogram counts. If the histogram is not  
displayed on the graticule but histogram statistics still appear on the display,  
histogram counting is still running.  
NOTE. Histogram counts are cleared when push Clear button in the Hist Setup  
dialog box or when you push CLEAR DATA on the front panel. Also, changing  
any acquisition control will implicitly clear all acquired data and the histogram  
count as well.  
Histogram Size. The maximum vertical histogram size is 400 bins. The maximum  
horizontal size is 500 bins.  
Recalling Setups. The histogram state is restored to what it was when the setup  
was saved.  
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To Take a Histogram  
Use the procedure that follows to quickly take a measurement based on the  
default settings for histograms.  
Overview  
To take a histogram  
Related control elements & resources  
Prerequisites 1. The instrument must have at least one waveform  
displayed to access the Hist Setup dialog box.  
See page 3-62 for waveform-display  
instructions if needed.  
Access the 2. Open the Hist Setup dialog box by selecting Histogram  
histogram  
in the Setup menu.  
Set, display, and 3. Use the Source pulldown list to select a waveform  
reset histogram  
source and type  
source for the histogram.  
4. Check Enable Histogram to start histogram counting,  
display the histogram on screen, and turn on the  
Histogram readout.  
5. Click the Vertical or Horizontal histogram option button  
of you choice. You can only display one type of  
histogram at a time.  
6. Check if you want the data taken on an accumulation of  
the source waveforms (a waveform database) instead of  
on the currently acquired waveform.  
7. Press Clear to reset the histogram count and to clear the  
data in the source waveform. Histograms track numbers  
of counts. Clicking Clear resets those counts to zero and  
begins counting from zero.  
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Overview  
To take a histogram (cont.)  
Related control elements & resources  
Set histogram dis- 8. Use the Histogram to turn on and off the display of the  
play options  
selected histogram (histogram counting remains  
enabled). Use the color list to select a color for the  
histogram. Select a value in the Size box to adjust the  
histogram display on screen.  
9. Select Linear to display histogram data linearly. Bin  
counts are scaled linearly by dividing the bin count by  
the maximum bin count.  
10. Select Logarithmic to display histogram data logarithmi-  
cally. Bin counts are scaled logarithmically. Logarithmic  
scaling provides better visual details for bins with low  
counts.  
Set histogram limit 11. Use the Top, Bottom, Left, and Right boxes to set the  
controls  
size and location of the histogram box. The histogram  
box selects the section of the waveform used for  
histograms.  
12. Select Absolute to use units based on the source  
waveform. Select % to display the histogram box as a  
percentage of the graticule. This display setting  
considers the top-left corner of the graticule to be 0,0  
and the bottom-right corner to be 100,100.  
Tip. It is quicker to use the mouse or touchscreen to  
drag to size the histogram box on screen, then fine tune  
the values if needed with the Limit Controls.  
End of Procedure  
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Using Masks, Histograms, and Waveform Databases  
Histogram  
Statistics  
After you check Enable Histogram in the Histogram Setup dialog box, histogram  
statistics appear on the right-hand side of the screen. The following table is a list  
of the available histogram statistics and a brief description of each.  
Table 3-10: Histogram statistics  
Name  
Description  
Mean  
The average of all acquired points within (or on) the histogram  
box.  
Median  
Half of all acquired points within (or on) the histogram box are less  
than and half are greater than this value.  
Standard Deviation  
Peak-to-Peak (Pk-Pk)  
The standard deviation (Root Mean Square (RMS) deviation) of all  
acquired points within (or on) the histogram box.  
The peak-to-peak value of the histogram. Vertical histograms  
display the amplitude of the highest nonzero bin minus the  
amplitude of the lowest nonzero bin. Horizontal histograms display  
the time of the rightmost nonzero bin minus the time of the  
leftmost nonzero bin.  
Mean1 StdDev(1σ) The percentage of points in the histogram which are within 1  
standard deviation of the histogram mean.  
Mean2 StdDev(2σ) The percentage of points in the histogram which are within 2  
standard deviations of the histogram mean.  
Mean3 StdDev(3σ) The percentage of points in the histogram which are within 3  
standard deviations of the histogram mean.  
Peak Hits  
Displays the number of points in the largest bin of the histogram.  
Displays the number of hits within or on the histogram box.  
# of Histogram Hits  
# of Waveforms  
Displays the number of waveforms that have contributed to the  
histogram.  
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Using Masks, Histograms, and Waveform Databases  
Using Waveform Databases  
A waveform database is a three-dimensional accumulation of a source waveform  
as it is repeatedly acquired. In addition to the standard vertical and horizontal  
dimensions, each waveform sample in a waveform database has a third dimen-  
sion of count. The count reflects the number of times a specific waveform point  
has been acquired or generated.  
Why Use?  
Use waveform databases for measurements, histogram calculations, mask  
testing, and generating a density-style graded display. Waveform databases may  
be automatically allocated for measurements, histograms, and mask testing.  
Whats Special?  
Some waveform database features of note follow:  
H
H
H
Waveform record length is not limited to 500 (horizontal waveform database  
dimension and number of horizontal display columns) when waveform  
databases are active. Record lengths can vary over the entire allowable range.  
To emphasize the data that occurs less frequently, you can toggle the Invert  
Color/Intensity control in the Waveform Database setup dialog box, which  
reverses the intensity/color assignments to each pixel in the database display.  
You can set any selected database to use a persistence mode to accumulate  
and display data. Infinite persistence mode continues displaying waveforms  
as they accumulate until the selected database is cleared manually or by a  
control change. Variable persistence mode keeps and displays accumulated  
data in the specified database until the user-specified waveform count is  
surpassed. Each waveform accumulated beyond the count removes the oldest  
waveform accumulated earlier in the database.  
Whats Excluded?  
The following operations are excluded:  
References as sources. Because references contain static data that does not  
update, they are not available as a waveform source for waveform databases.  
More than four waveform databases. More than four waveform databases cannot  
be created at one time. Note the following behaviors regarding waveform  
databases:  
H
There are four waveform databases; you can explicitly assign and reassign  
Database1 through Database4 to waveform sources in the Wfm Database  
dialog box.  
H
Once all databases are allocated, the only way to assign a new waveform is  
to change the waveform source of one of the databases in the same dialog  
box, which releases its existing source.  
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Using Masks, Histograms, and Waveform Databases  
H
If all four databases are assigned and you attempt to implicitly assign a  
waveform source to a database (for example, by right clicking a waveform  
icon in the Waveform bar and selecting color grading), the instrument will  
display a notice that no databases are available.  
NOTE. The above exclusion does not mean that a waveform database cannot be  
used by multiple systems or features. For example, you can use the same  
database as the source for a histogram, an automatic measurement, and a mask  
test.  
Interpolation or vector displays. Waveform database accumulation is always a dot  
mode accumulation; therefore, no interpolation or vectoring is performed.  
Keys to Using  
The key points that follow describe operating considerations for setting up a  
waveform database.  
Dimensions. Waveform database dimensions match those of the database source  
and are described as follows:  
H
H
H
Horizontal (columns): Always 500 columns, which is the maximum  
horizontal graticule view size. Columns are in horizontal units that match the  
horizontal units of the source.  
Vertical (rows): Always 402 rows, which is the maximum vertical graticule  
size plus one row each for overrange (OR) and underrange (UR). Rows are  
in vertical units that match the vertical units of the source.  
Count (weights or density): up to 32 bits.  
Display. When you assign a waveform database to a waveform source (using the  
Waveform Database Setup dialog box) you must explicitly turn on the waveform  
database display if you wish to see it on screen; otherwise, the waveform source  
displays using the default (vector) display. The waveform database still  
accumulates in the background and can be turned on later without clearing the  
database.  
Display Options. The Color, Intensity, and Invert controls determine whether the  
instrument displays its databases graded by color or intensity.  
H
H
H
Color: Different colors are used to indicate data-accumulation density.  
Intensity: Different shades of one color are used to indicate density.·  
Invert: When Invert is selected, colors and intensities that are indicating  
high data-accumulation counts toggle to indicate low counts. Inverting the  
colors or intensities can sometimes make the data that occurs least in the  
waveform database easier to see.  
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H
Grading Method: The Grading Method control determines the method by  
which database data (bin counts) are converted into display colors/intensi-  
ties.  
EMPH8 selects a curve-driven grading method that utilizes eight display  
colors/intensities. The curve is specified by the Emphasize Counts setting,  
see Emphasize Counts, below.  
EMPH7 selects a curve-driven grading method that utilizes seven display  
colors/intensities. The curve is specified by the Emphasize Counts setting,  
see Emphasize Counts, below.  
BIN8 selects a binary grading method that uses eight display colors/intensi-  
ties. This method assigns ranges of counts to colors/intensities by succes-  
sively halving the maximum bin count and assigning the resultant ranges in  
brightest-to-darkest color/intensity order. If the maximum bin count is less  
than the number of display colors, then a one-for-one mapping of counts to  
colors/intensities is used.  
BIN7 selects a binary grading method that uses eight display colors/intensi-  
ties. This method assigns ranges of counts to colors/intensities by succes-  
sively halving the maximum bin count and assigning the resultant ranges in  
brightest-to-darkest color/intensity order. If the maximum bin count is less  
than the number of display colors, then a one-for-one mapping of counts to  
colors/intensities is used.  
Emphasize Counts controls specify what range of counts you want empha-  
sized when EMPH7 or EMPH8 Grading is selected. The slide bar selects a  
percentage value; the entry box allows direct entry or the percentage value,  
where the lowest value, 0%, emphasizes bins with low counts and the  
highest value (100%) emphasizes bins with high counts.  
NOTE. Changes made to the display options affect all waveform databases.  
Persistence. You set the persistence controls independently for each waveform  
database the instrument supports.  
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To Set Up a Waveform  
Database  
To assign a waveform to one of the four waveform databases of the instrument,  
use the procedure that follows:  
Overview  
To set up a waveform database  
Related control elements & resources  
Prerequisites 1. Theinstrument must havea waveform displayed toenable  
the waveform database controls.  
See page 3-62 for information on displaying  
waveforms.  
Open the Wfm 2. Open the Waveform Database dialog box by selecting  
Database Setup  
dialog box  
Wfm Database in the Setup menu.  
Select the source 3. Use the Source pulldown list to select a waveform source  
and turn on the  
database  
for the waveform database. By default, the first available  
waveform is used as the waveform source unless you  
select a different source.  
4. Check On to begin accumulating into the waveform  
database.  
5. Check Display to turn on the display of the waveform  
database. Uncheckthisboxtodisplaythevectorwaveform  
selected as the source for the database.  
6. Click the Clear Data button to clear the data accumulated  
in the selected database. If the database is turned on, the  
data is cleared and data accumulation starts over.  
NOTE. An alternative method of turning on a waveform  
database for the selected waveform is by clicking the  
waveform database button in the toolbar. See right.  
See Figures 3 -29 and 3 -30 on next page to see what  
both normal and waveform database waveform data  
look like on the graticule.  
End of Procedure  
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As you can see in the illustrations below, the normal vector view of a waveform  
displays the waveform data in dot mode: the waveform display is updated with  
each acquisition to reflect the current data. In Fig 3--30, waveform database  
display has been turned on and you can see the waveform data accumulation is  
displayed all at once, with subsequent acquisition data being addedto the  
display as it is acquired.  
Figure 3-29: Normal vector view of a waveform  
Figure 3-30: Waveform database view of a waveform  
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To Customize the  
Database Display  
To change the display options of waveform database data on the graticule, use  
the procedure that follows:  
Overview  
To customize the database display  
Related control elements & resources  
Prerequisites 1. The instrument must have a waveform assigned to one of  
the waveform databases.  
See To Set Up a Waveform Database on  
page 3-162.  
Access the 2. Open the Waveform Database dialog box by selecting  
Wfm Database in the Setup menu.  
Wfm Database  
Setup dialog box  
Set Persistence 3. Choose a persistence mode.  
Infinite: Choose Infinite to continue displaying  
waveforms as they accumulate until the selected  
database is cleared manually or by a control change.  
Variable: Choose Variable to display accumulated data  
in the specified database until the user-specified  
waveform count is surpassed. Each waveform  
accumulated beyond the count removes the oldest  
waveform accumulated earlier in the database.  
Waveforms: For Variable persistence, use the  
Waveforms entry box (or the sliding control above it) to  
set the Waveforms count. The count applies to the  
currently selected database when Variable persistence  
mode is set. Enter values directly with this control using  
the up/down arrows, the pop-up keypad, or an  
externally connected keyboard.  
Samples: The Samples field is a readout sample count  
currently in effect for the currently selected database  
when Variable persistence mode is set. This count is not  
settable directly, but instead derives from the product  
two values: the current Waveforms setting in this dialog  
box and the setting for Record Length in the Horizontal  
Setup dialog box.  
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Overview  
To customize the database display (cont.)  
Related control elements & resources  
Set display options  
4. Choose from the following display options:  
Color: Choose color to draw the waveform database in  
colors that vary with how frequently each sample value  
occurs in the database.  
Invert: Choose this option to reverse the color or  
intensity assignments to each grading partition. Inverting  
the colors may make it easier to view the variations of  
color or intensities, and makes it easier to see  
frequencies or occurrences with smaller numbers of  
counts.  
Intensity: Choose Intensity to draw the waveform  
database with varying intensities that vary with how  
frequently each sample value occurs in the database.  
Grading Method: Select any one of four grading  
methods available from the pull down menu.  
Additional information about Grading Method is  
located on page 3-161.  
Emphasize Counts: If you select one of the two  
Emphasized grading methods, slide the Emphasize  
Counts percentage control to specify the range of counts  
you want emphasized.  
Note. The Display Options controls apply globally to all  
four databases that this instrument provides.  
Examples 5. See the following illustrations to see examples of  
waveform database data using different display options.  
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Overview  
To customize the database display (cont.)  
Related control elements & resources  
Notice the difference in intensities of the same  
data between these two illustrations. In the top  
illustration, this portion of data is lighter in  
intensity signalling it is least-occurring. In the  
illustration to the right, with Invert Color/Intensity  
turned on, this data appears much darker,  
allowing you to see the data more clearly.  
End of Procedure  
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Accessing Online Help  
This manual represents only part of the user assistance available to you the  
online help system, integrated as part of the instrument user interface, provides  
quick-to-access support for operating the instrument. This section describes the  
help system and how to access it.  
What’s Available?  
The instrument provides the following help resources online:  
H
H
H
H
H
H
H
H
Tool tips  
Whats This? Help  
Overview Help  
Topical index  
Getting Started Guide  
Measurements Center and Measurements Reference  
Setup procedures  
Programmers Guide  
NOTE. A PDF version of the Programmer Reference Guide is available on the  
Tektronix Web site (see Contacting in the Preface on page xiii. Go to the link for  
User Manuals and select the document name from the download selection list.  
Why Use?  
Use online help as your primary, always-on-hand, user information source for  
this instrument. Most of the information you need to operate this instrument and  
use it effectively is found in the online help, where you can quickly access it and  
display on your instrument screen.  
Keys to Using  
The key points that describe operating considerations for using the online and  
other documentation for this instrument follow:  
H
Use online help when you want to minimize interruption to your work flow.  
Often a tool tip or Whats This? Help, each of which is a pop--up of brief  
information in a bubble displayed on screen, gives you enough support to  
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Accessing Online Help  
continue your setup. Overview help is there when you need to probe more  
deeply into feature operation.  
H
Use the manuals to read instructions on putting the instrument into service,  
procedures on reinstalling its product software, listings of specifications, and  
overviews of features and their operation. See Documentation Map on page  
2--2 for an description of the documents for this instrument and their  
purposes.  
H
Use the online programmers guide, either displayed on the instrument  
screen, or on any windows-equipped PC, for support on operating the  
instrument from the GPIB.  
How to Use Online Help  
Use the procedure steps that follow to access contextual help and to learn how to  
search the help system for more information.  
Overview  
To use the online help  
Control elements & resources  
Prerequisites 1. The instrument must be powered up and running.  
H
See Installation, page 1-9.  
For a brief 2. Move your mouse pointer and let it rest over a control;  
that is, a menu name, a menu item, tool-bar button,  
tool-bar readout, etc.  
description of  
controls  
When you perform this step, the help system pops up a  
short definition or a label of the control. See right.  
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Overview  
For a more  
robust  
To use the online help (cont.)  
Control elements & resources  
3. Click the Whats This? button in the main display or in a  
dialog box. The button varies in form as shown at right.  
After clicking, the mouse pointer changes to the  
following icon:  
description  
4. Now click the control you want described. A bubble pops  
up describing the control. See below.  
Whats This? button for main display  
Whats This? button for dialog boxes  
For in depth, 5. Most dialog boxes, whether setup or other types, have a  
contextual  
overviews  
Help button as shown right. Click the button to open the  
help system with an overview of the dialog box thats  
currently displayed. See the following illustration.  
Click or touch here  
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Overview  
To use the online help (cont.)  
Control elements & resources  
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Accessing Online Help  
Overview  
To use the online help (cont.)  
Control elements & resources  
To dig deeper 6. You can search for in depth help using methods with  
which most users of PCs are familiar: from the  
application menu bar, select Help, and then select  
Contents & Index. See illustration at right.  
7. From the online help finder (see below), choose from the  
three tabs.  
8. Click the book icons to expose topic titles, and then  
click a topic to highlight it. Click the Display button  
to open the topic in a help window.  
.
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Accessing Online Help  
Overview  
To use the online help (cont.)  
Control elements & resources  
For instruction 9. You can display step-by-step setup instructions for  
procedures  
setups you want to make: From the application menu  
bar, select Help, and then select Help Contents and  
Index. See right. From the list of topics (book icons) that  
displays, double-click Setup Procedures and  
double-click Setup dialog procedures.  
10. Select a procedure from the list that displays. The  
procedure will display in a help window that is sized and  
located to minimize interference with the controls  
needed to perform it. See below.  
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Accessing Online Help  
Overview  
To use the online help (cont.)  
Control elements & resources  
To enable full- 11. If you cannot find the information in the Contents or  
text search  
Index tabs of the online finder, you may want to enable  
full text search: From the application menu bar, select  
Help, and then select Contents & Index. See illustration  
at right.  
12. From the online help finder (see below), choose the  
Find tab.  
13. Choose the method for word list generation and  
select next or finish. Once the word list generation  
finishes, future accesses of the find tab will  
immediately access a pane for searching with full  
.
text search without requiring the word to be  
regenerated.  
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Accessing Online Help  
Overview  
To use the online help (cont.)  
Control elements & resources  
Click to minimize to the toolbar  
To Access Op- 14. Click the minimize button to reduce the User Interface  
erating System  
Help  
Application to an icon on the operating system  
toolbar. See upper right.  
15. Click the Start button to pop up the Start menu, and  
then select Help from the menu. See lower right. The  
online help for the Windows operating system  
displays.  
16. When your done with the online help, you can dismiss  
it. To restore the user interface application to the  
screen, click its icon in the tool bar.  
Tip. To switch between online help and the  
application, you can hold down the ALT key while you  
press Tab repeatedly to alternate between bringing  
help to the front and the application.  
Click for  
Windows  
Help  
End of Procedure  
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Cleaning the Instrument  
Periodically you may need to clean the exterior of your instrument. To do so,  
follow the instructions in this section.  
WARNING. Before performing any procedure that follows, power down the  
instrument and disconnect it from line voltage.  
Exterior Cleaning  
CAUTION. To prevent getting moisture inside the instrument during external  
cleaning, use only enough liquid to dampen the cloth or applicator.  
Clean the exterior surfaces of the chassis with a dry lint-free cloth or a soft-  
bristle brush. If any dirt remains, use a cloth or swab dipped in a 75% isopropyl  
alcohol solution. Use a swab to clean narrow spaces around controls and  
connectors. Do not use abrasive compounds on any part of the chassis that may  
damage the chassis.  
Clean the On/Standby switch using a dampened cleaning towel. Do not spray or  
wet the switch directly.  
CAUTION. Avoid the use of chemical cleaning agents which might damage the  
plastics used in this instrument. Use a 75% isopropyl alcohol solution as a  
cleaner and wipe with a clean cloth dampened with deionized water. (Use only  
deionized water when cleaning the menu buttons or front-panel buttons.) Before  
using any other type of cleaner, consult your Tektronix Service Center or  
representative.  
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Cleaning the Instrument  
Flat Panel Display Cleaning  
The instrument display is a soft plastic display and must be treated with care  
during cleaning.  
CAUTION. Improper cleaning agents or methods can damage the flat panel  
display.  
Avoid using abrasive cleaners or commercial glass cleaners to clean the display  
surface.  
Avoid spraying liquids directly on the display surface.  
Avoid scrubbing the display with excessive force.  
Clean the flat panel display surface by gently rubbing the display with a  
clean-room wipe (such as Wypall Medium Duty Wipes, #05701, available from  
Kimberly-Clark Corporation).  
If the display is very dirty, moisten the wipe with distilled water or a 75%  
isopropyl alcohol solution and gently rub the display surface. Avoid using excess  
force or you may damage the plastic display surface.  
Optical Connector Cleaning  
When using optical modules, the measurement accuracy is increased (or  
maintained) by keeping the optical connectors clean. Its important to follow the  
procedures for cleaning optical connectors provided in the optical module user  
manual.  
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Appendix A: Specifications  
NOTE. This specification is for the instrument; there are also specifications  
associated with the optical and electrical modules. Please refer to the user  
manual that shipped with your module for those specifications.  
This appendix contains the specifications for the CSA8000B Communica-  
tions Signal Analyzer and the TDS8000B Digital Sampling Oscilloscope. All  
specifications are guaranteed unless noted as typical.Typical specifications are  
provided for your convenience but are not guaranteed. Specifications that are  
marked with the n symbol are checked in Performance Verification chapter of  
the service manual, an optional accessory.  
All specifications apply to the instrument and sampling modules. unless noted  
otherwise. To meet specifications, three conditions must first be met:  
H
H
H
The instrument must have been calibrated/adjusted at an ambient tempera-  
ture between +10 _C and +40 _C.  
The instrument must have been operating continuously for 20 minutes within  
the operating temperature range specified.  
The instrument must be in an environment with temperature, altitude,  
humidity, and vibration with the operating limits described in these  
specifications.  
NOTE. Sampling Interfacerefers to both the electrical sampling module  
compartments and the optical module compartments, unless otherwise specified.  
Table A-1: System - Signal acquisition  
Description  
Characteristics  
Number of input  
channels  
8 acquisition channels, maximum  
Number of small sam- 4 compartments, for a total of 8 channels1  
pling modules  
compartments  
Number of large sam- 2 compartments, for a total of 2 channels1  
pling modules  
compartments  
A-1  
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Appendix A: Specifications  
Table A-1: System - Signal acquisition (cont.)  
Description Characteristics  
Small Sampling Mod- Tekprobe-Sampling Level 3. Hot switching is not permitted on this  
ule Interface interface.  
Large Sampling Mod- Tekprobe-Sampling Level 3. Hot switching is not permitted on this  
ule Interface  
interface.  
1
Total actively-acquired channels 8.  
Table A-2: System - Timebase  
Description  
Characteristics  
Sampling rate  
DC-200 kHz maximum, dictated by trigger rate and actual holdoff  
setting. If trigger rate is less than the maximum, or the requested  
holdoff exceeds the minimum, the trigger rate and/or holdoff will dictate  
the sampling rate.  
Record length1  
20, 50, 100, 250, 500, 1,000, 2,000, or 4,000 samples.  
Horizontal scale  
range  
1 ps/div to 5 ms/div in 1, 2, 5 steps or 1 ps increments. Maximum  
record lengths apply at certain ranges (per table, below).  
Scale set to an integer multiple of: Maximum record length  
1 ps/div  
1000  
2000  
4000  
2 ps/div  
4 ps/div  
Horizontal position  
range  
50 ms maximum.  
Horizontal resolution 10 fs minimum  
Horizontal position  
setting resolution  
1 ps minimum  
Horizontal modes  
Two modes, Short Term Optimized and Locked to 10 MHz Reference.  
The 10 MHz reference may be internal or external.  
nTime internal ac-  
curacy, short term  
optimized mode2  
Strobe placement accuracy for a given horizontal interval and position  
on same strobe line per table below. (Contribution from 80E04  
sampling module is included in specification.)  
Range  
Time Interval Accuracy  
1 ps + 1% of interval  
8 ps + 0.1% of interval  
20 ps/div  
21 ps/div  
A-2  
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Appendix A: Specifications  
Table A-2: System - Timebase (cont.)  
Description  
Characteristics  
nTime internal ac-  
curacy, locked to in-  
ternal 10 MHz refer-  
ence mode2  
Strobe placement accuracy for a given horizontal interval and position  
on same strobe line per table below. Contribution from 80E04 sampling  
module is included in specification.  
Range  
Time Interval Accuracy  
1 ps + 1% of interval  
8 ps + 0.01% of interval  
20 ps/div  
21 ps/div  
Horizontal deskew  
range and resolution  
-500 ps to +100 ns on any individual channel in 1 ps increments.  
1
The total number of samples contained in a single acquired waveform record  
(memory length in IEEE 1057, 2.2.1).  
2
This is for 100 kHz trigger rate. The 80E04 sampling module is included in this  
specification.  
Table A-3: System - Trigger  
Description  
Characteristics  
Trigger sources  
External Direct Edge Trigger, External Prescaled Trigger, Internal Clock  
Trigger, and Clock Recovery (with appropriately equipped optical  
modules)  
Auto/normal mode  
Slope + or - select  
Normal mode: wait for trigger  
Auto mode: Trigger automatically generated after 100 ms time-out  
Edge + mode: Triggers on positive-slewing edge  
Edge - mode: Triggers on negative-slewing edge  
High frequency on/off High Frequency ON mode: Removes trigger hysteresis and improves  
select  
sensitivity. Should be used when trigger slew rate exceeds 1 V/ns.  
High Frequency OFF mode: Retains trigger hysteresis and improves  
noise rejection at low slew rates.  
Metastability Reject  
On/Off select  
Metastability Reject On mode: Upon detection of trigger and holdoff  
collision, time base will reject the sampled point.  
Metastability Reject Off mode: Allows metastable points caused by  
trigger/holdoff collisions to display.  
Gated Trigger  
5 V maximum. See the Gated Trigger Input descriptions, on beginning  
page A-8.  
Variable trigger hold Adjustable 5 s to 50 ms in 0.5 ns increments. When External  
off range and resolu- Prescaled Trigger mode is used, holdoff period applies to the Prescaled  
tion  
input divided by 8.  
A-3  
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Appendix A: Specifications  
Table A-3: System - Trigger (cont.)  
Description Characteristics  
External direct trigger Direct edge triggering on signal applied to dedicated front panel  
capabilities and  
conditions  
connector with Holdoff, Level Adjust, Auto/Normal, High Frequency  
On/Off, and Enhanced Triggering On/Off controls.  
External direct trigger specifications apply only under the condition that  
no other trigger signal is applied to respective connectors.  
Short term optimized mode and locked to internal 10 MHz reference  
specifications only apply under the condition that there is no external  
10 MHz reference applied to the front panel connector.  
External direct trigger 50 input resistance, DC coupled only  
input characteristics1  
External direct trigger  
input range  
1.5 V (DC + peak AC) maximum input voltage  
External direct trigger 1 Vpp  
maximum operating  
trigger signal2  
External direct trigger Adjustable between 1.0 V  
level range  
nExternal direct  
trigger sensitivity3  
100 mV, DC-3 GHz  
External direct  
trigger sensitivity  
50 mV typical, DC-4 GHz  
External direct trigger 1 mV  
level resolution  
nExternal direct  
trigger level accuracy  
50 mV + 0.10 x level  
nExternal direct  
trigger delay jitter,  
short term optimized  
mode maximum  
1.2 ps RMS + 10 ppm of horizontal position, or better  
External direct trigger 800 fs RMS + 5 ppm of horizontal position, typical  
delay jitter, short term  
optimized mode (typi-  
cal)  
nExternal direct  
2.5 ps RMS + 0.04 ppm of horizontal position, or better  
delay jitter, locked to  
internal 10 MHz refer-  
ence mode maximum  
External direct delay 1.6 ps RMS + 0.01 ppm of horizontal position, typical  
jitter, locked to inter-  
nal 10 MHz reference  
mode (typical)  
External direct trigger 167 ps, typical  
minimum pulse width  
A-4  
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Appendix A: Specifications  
Table A-3: System - Trigger (cont.)  
Description Characteristics  
External direct trigger Metastability Reject on: Zero, typical  
metastability  
External direct trigger Tekprobe-SMA, Levels 1 and 2. Hot switching is permitted on this real  
real time accessory  
interface  
time accessory interface.  
External prescaled  
trigger capabilities  
Prescaled triggering on signal applied to dedicated front panel  
connector with Holdoff, Auto/Normal, Metastability Reject On/Off.  
External prescaled trigger specifications apply only under the condition  
that no other trigger source is applied to respective connectors.  
Short term optimized mode and locked to internal 10 MHz reference  
specifications only apply under the condition that there is no external  
10 MHz reference applied to the front panel connector.  
External prescaled  
trigger input charac-  
teristics  
50 AC coupled input resistance; divide-by-eight prescaler ratio, fixed  
level zero volts  
External prescaled  
trigger absolute maxi-  
mum input  
2.5 Vpp  
nExternal prescaled The limits are as follows:  
trigger sensitivity  
Frequency range  
Sensitivity  
800 mVpp  
600 mVpp  
Sensitivity  
2-3 GHz  
3-10 GHz  
External prescaled  
trigger sensitivity (typ-  
ical)  
Frequency range  
10-12.5 GHz  
1000 mVpp, typical  
nExternal prescaled 1.3 ps RMS + 10 ppm of horizontal position, or better  
trigger delay jitter,  
Short term optimized  
mode maximum  
External prescaled  
trigger delay jitter,  
Short term optimized  
mode (Typical)  
0.9 ps RMS + 5 ppm of horizontal position, typical  
nExternal prescaled 2.5 ps RMS + 0.04 ppm of horizontal position, or better  
delay jitter, locked to  
internal 10 MHz refer-  
ence mode maximum  
External prescaled  
delay jitter, locked to  
internal 10 MHz refer-  
ence mode (Typical)  
1.6 ps RMS + 0.01 ppm of horizontal position, typical  
External prescaled  
trigger metastability  
Enhanced Triggering, Metastability Reject on: Zero, typical  
A-5  
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Appendix A: Specifications  
Table A-3: System - Trigger (cont.)  
Description  
Characteristics  
Internal clock trigger  
rates  
Rate selectable at 25, 50, 100, and 200 kHz internally and is provided  
to the trigger, to the TDR stimulus drives in small sampling module  
interfaces, and to the Internal Clock Out connector on the front panel.  
1
The input resistance at the external direct trigger input and the maximum input  
voltage.  
2
3
Maximum signal input for maintaining calibrated time base operation.  
Section 4.10.2 in IEEE standard number 1057. The minimum signal levels required  
for stable edge triggering of an acquisition.  
Table A-4: System - Environmental  
Description  
Characteristics  
Dynamics  
Random vibration (operating):  
0.22 g rms, from 5 to 500 Hz, 10 minutes each axis, (3 axis,  
30 minutes total).  
Random vibration (nonoperating):  
2.28 g rms, from 5 to 500 Hz, 10 minutes each axis, (3 axis,  
30 minutes total) non-operating.  
Atmospherics  
Temperature:  
Operating:  
10 °C to +40 °C  
0 °C to +35 °C for 80E0X modules on Tektronix part number  
012-1569-00 2-meter extender  
Nonoperating:  
- 2 2 °C to +60 °C  
Relative humidity:  
Operating: 20% to 80%, with a maximum wet bulb temperature  
of 29 °C at or below +40 °C (upper limits derates to 45% relative  
humidity at +40 °C, non-condensing)  
Nonoperating (no floppy disk in floppy drive): 5% to 90%, with a  
maximum wet bulb temperature of 29 °C at or below +60 °C (upper  
limits derates to 20% relative humidity at +60 °C, non-condensing)  
Altitude:  
Operating: 3,048 m (10,000 ft.)  
Nonoperating: 12,190 m (40,000 ft.)  
Electrostatic dis-  
charge susceptibility  
Up to 8 kV with no change to control settings, or impairment of normal  
operation  
Up to 15 kV with no damage that prevents recovery of normal operation  
A-6  
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Appendix A: Specifications  
Table A-5: Power consumption and cooling  
Specifications  
Characteristics  
Power requirements  
240 watts (fully loaded); 160 watts (mainframe alone with no modules)  
An example of a fully loadedmainframe for these characteristic loads  
has installed optical modules, electrical modules, and active probes  
comprised of 1x80C02-CR, 1x80C04-CR2, 3x80E04, 1x80A01, and  
7xP6209.  
There is typically a slight 10 W deviation in the dissipation for various  
line conditions ranging from 48 Hz through 400 Hz as well as operating  
ambient temperature.  
Source voltage and  
frequency  
Range for the line voltage needed to power the instrument within which  
the instrument meets its performance requirements.  
100-240 V RMS 10%, 50/60 Hz  
115 V RMS 10%, 400 Hz  
CAT II  
Fuse rating  
Current and voltage ratings and type of the fuse used to fuse the  
source line voltage.  
Two sizes can be used:  
(0.25 x 1.25 inch size): UL 198G & CSA C22.2, No. 59 Fast acting: 8  
Amp, 250 V; Tek p/n 159-0046-00, BUSSMAN p/n ABC-8, LITTLE-  
FUSE p/n 314008  
(5 x 20 mm size): IEC 127, sheet 1, fast acting F, high breaking  
capacity, 6.3 Amp, 250 V; Tek p/n none, BUSSMAN p/n GDA 6.3,  
LITTLEFUSE p/n 21606.3  
Cooling requirements Six fans with speed regulated by internal temperature sensors.  
A 2 inch (51 mm) clearance must be maintained on the left side, and  
right sides of the instrument, and a 0.75(19 mm) clearance must be  
maintained on the bottom of the instrument for forced air flow. It should  
never be operated on a bench with the feet removed, nor have any  
object placed nearby where it may be drawn against the air vents.  
No clearance is required on the front, back, and top.  
Table A-6: Display  
Specifications  
Characteristics  
Display type  
211.2 mm (wide) x 1.58.4 mm (high), 264 mm (10.4 inch) diagonal,  
liquid crystal active matrix color display (LCD).  
Display resolution  
Pixel pitch  
640 horizontal by 480 vertical pixels.  
Pixels are 0.33 mm (horizontal) and 0.33 mm (vertical)  
A-7  
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Appendix A: Specifications  
Table A-7: Ports  
Specifications  
Characteristics  
Video outputs  
Two 15-pin D-subminiature connectors on the rear  
panel. Useable to connect external monitors that  
provide a duplicate of the primary display and/or a  
second monitor on which to view other applications.  
Support at least the basic requirements of the PC99 specification.  
Parallel port  
(IEEE 1284)  
25-pin D-subminature connector on the rear panel. Supports the  
following modes:  
Standard mode, output only  
Bi-directional, PS/2 compatible  
Bi-directional Enhanced Parallel Port (IEEE 1284 standard, Mode 1  
or Mode 2, v1.7  
Bi-directional high speed Extended Capabilities Port (ECP)  
Serial port  
9-pin D-subminature serial-port connector using NS16C550 compatible  
UARTs supporting transfer speeds up to 115.2 kbits/sec.  
PS/2 Keyboard and  
Mouse Interface  
PS/2 compatible keyboard and mouse connectors.  
LAN interface  
RJ-45 LAN connector supporting 10 base-T and 100 base-T  
External audio jacks for MIC IN and LINE OUT  
External audio con-  
nectors  
USB interface  
One USB connector (the second USB is disabled because of internal  
use)  
GPIB interface  
Complies with IEEE 488.2  
Gated Trigger Input - A TTL logic 1 enables triggers to be accepted  
Logic Polarity  
A TTL logic 0 disables all triggering  
(Option GT equipped  
instruments only)  
A pull-up resistor is present to hold the input high (enable triggers)  
when no control signal is present.  
Gated Trigger Input -  
Maximum Non-de-  
struct Input Levels  
(Option GT equipped  
instruments only)  
5V maximum  
A-8  
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Appendix A: Specifications  
Table A-7: Ports (cont.)  
Specifications Characteristics  
Gated Trigger Input - 3 trigger cycles, where each cycle is defined as (holdoff time + trigger  
Enable-to-Acquire  
Delay  
(Option GT equipped  
instruments only)  
latency). For example:  
With holdoff set to its minimum 5 s setting, and a 2.500 GHz clock  
signal applied to the External Direct Trigger input (a period of 400 ps),  
the Enable-to-Acquire delay is approximated as 3 x (5 s + 0.0004 s)  
= 15.0012 s.  
The Enable-to-Acquire delay is the amount of time after the Gated  
Trigger has been enabled (the level goes from TTL LOW to HIGH)  
when the first valid sample is retained by the system as the beginning  
of the waveform record length. When the Gated Trigger is enabled and  
triggers begin to occur, the system will reject the first three samples to  
avoid system recovery conditions. Once the first three points have been  
discarded, then the next valid trigger cycle will be the first point of the  
record section.  
Gated Trigger Input - The system checks the status of the gated Trigger approximately once  
Maximum Disable per holdoff and re-arm cycle. If the Gated Trigger is disabled  
Time immediately after this system check, it will allow nominally a maximum  
(Option GT equipped time of (holdoff + trigger period) to elapsed before the checking for the  
instruments only)  
status of the Gated Trigger input, recognizing the disable condition, and  
halting any further sampling of the signal.  
Internal clock trigger  
out  
Square wave out from 50 . back termination synchronized to the  
TDR internal clock drive signal. Refer to Trigger System - Internal  
Clock.  
Typical performance into 50 termination:  
-0.20 to +0.20 V low level  
+0.90 to +1.10 V high level  
n
DC calibration  
DC voltage from low impedance drive, programmable to 1 mV over  
1.25 V range maximum. Accuracy is 0.2 mV + 0.1% into 50 Ω.  
output  
DC calibration output,  
typical  
Typical Accuracy is 0.2 mV + 0.1% into 50 Ω.  
External 10 MHz  
reference input  
5 V maximum  
Table A-8: Data storage  
Specifications  
Characteristics  
Floppy disk drive  
3.5 in floppy disk, 1.44 Mbyte, compatable with DOS 3.3, or later,  
format for storing reference waveforms, image files, and instrument  
setups.  
Hard disk drive ca-  
pacity  
20 Gbytes  
A-9  
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Appendix A: Specifications  
Table A-9: Mechanical  
Specifications  
Characteristics  
Construction material Chassis: Aluminum alloy  
Cosmetic covers: PC/ABS thermoplastic  
Front panel: Aluminum alloy with PC/thermoplastic overlay  
Module doors: Nickel plated stainless steel  
Bottom cover: Vinyl clad sheet metal  
Circuit boards: Glass-laminate.  
Cabinet: Aluminum.  
Weight  
19.5 kg (43.0 lb.) (no keyboard, no mouse, no top pouch, no power  
cord, and no modules or front shield installed  
22.0 kg (48.5 lb.) (keyboard, mouse, top pouch, power cord, front shield  
installed, and no modules installed)  
Overall Dimensions  
Height 343 mm (13.5 in.)  
Width 457 mm (18.0 in.)  
Depth 419 mm (16.5 in.)  
The dimensions do not include feet, rack mount kit, or protruding  
connectors.  
Overall mass, pack-  
aged product  
36.3 kg (80 lb. 1 oz.)  
Overall Dimensions,  
packaged product  
Height 622 mm (24.5 in.)  
Width 711 mm (28.0 in.)  
Depth 787 mm (31.0 in.)  
A-10  
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Appendix A: Specifications  
Certifications  
Table A-10: Certifications and compliances  
Category  
Standards or description  
EC Declaration of Conformity - Meets intent of Directive 89/336/EEC for Electromagnetic Compatibility when configured with  
EMC  
sampling head modules designed for use with this instrument as identified in this manual.  
Compliance was demonstrated to the following specifications as listed in the Official Journal of the  
European Union:  
EN 61326  
EMC Requirements for Electrical Equipment for Measurement, Control  
and Laboratory use.  
Class A Radiated and Conducted Emissions  
IEC 1000-4-2  
IEC 1000-4-3  
IEC 1000-4-4  
IEC 1000-4-5  
IEC 1000-4-6  
IEC 1000-4-11  
Performance Criterion B1,2  
Performance Criterion A1  
Performance Criterion B1  
Performance Criterion B1  
Performance Criterion A1  
Performance Criterion B1  
1
Performance Criteria C for USB keyboard and mouse. Note that operation of the  
USB keyboard and mouse can be restored by unplugging and then  
reconnecting the USB connector at the rear panel of the main instrument.  
2
Horizontal timing susceptibility of the optical sampling modules and their  
internal clock recovery trigger signals usually increase the horizontal timing  
jitter when external electromagnetic fields are applied. For fields up to 3 V/m,  
the increase in the horizontal high-frequency RMS jitter is typically less than  
3 ps RMS of jitter, added using the square-root-of-the-sum-of-the-squares  
method. An example follows:  
If an 80C01-CR operating in clock-recovery trigger mode exhibits 3.5 ps RMS of  
edge jitter, with no EMC field applied and for an ideal jitterless input, then for  
applied fields up to 3 V/m the edge jitter, degradation would typically result in a  
s
total RMS jitter of:  
2
2
Jitter 3.5ps + 3ps = 4.61ps  
EN 61000-3-2  
AC Power Harmonic Current Emissions  
Radiated emissions may exceed the levels specified in EN 61326 when this instrument is connected  
to a test object.  
Australia/New Zealand  
Declaration of Conformity -  
EMC  
Complies with EMC Framework per the following standard:  
AS/NZS 2064.1/2  
Class A Radiated and Conducted Emissions  
General EMC  
To ensure compliance with EMC requirements, only high quality shielded cables having a reliable,  
continuous outer shield (braid & foil) with full coverage, low impedance connections to shielded  
connector housings at both ends should be connected to this product.  
EC Declaration of Conformity - Compliance was demonstrated to the following specification as listed in the Official Journal of the  
Low Voltage  
European Union:  
Low Voltage Directive 73/23/EEC, amended by 93/68/EEC  
A-11  
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Appendix A: Specifications  
Table A-10: Certifications and compliances (cont.)  
Category  
Standards or description  
EN 61010-1/A2:1995  
Safety requirements for electrical equipment for measurement  
control and laboratory use.  
U.S. Nationally Recognized  
Testing Laboratory Listing,  
mainframe  
UL3111-1  
Standard for electrical measuring and test equipment.  
Canadian Certification,  
mainframe  
CAN/CSA C22.2 No. 1010.1 Safety requirements for electrical equipment for measurement,  
control, and laboratory use.  
Installation (Overvoltage)  
Category Description  
Terminals on this product may have different installation (overvoltage) category designations. The  
installation categories are:  
CAT III Distribution-level mains (usually permanently connected). Equipment at this level is  
typically in a fixed industrial location.  
CAT II Local-level mains (wall sockets). Equipment at this level includes appliances, portable  
tools, and similar products. Equipment is usually cord-connected.  
CAT I  
Secondary (signal level) or battery operated circuits of electronic equipment.  
Pollution Degree Descriptions  
A measure of the contaminates that could occur in the environment around and within a product.  
Typically the internal environment inside a product is considered to be the same as the external.  
Products should be used only in the environment for which they are rated.  
Pollution Degree 2  
Normally only dry, nonconductive pollution occurs. Occasionally a  
temporary conductivity that is caused by condensation must be  
expected. This location is a typical office/home environment.  
Temporary condensation occurs only when the product is out of  
service.  
Equipment Type  
Safety Class  
Test and measuring  
Class 1 (as defined in IEC 61010-1, Annex H) - grounded product  
Overvoltage Category II (as defined in IEC 61010-1, Annex J)  
Overvoltage Category  
Pollution Degree  
Pollution Degree 2 (as defined in IEC 61010-1). Note: Rated for indoor use only.  
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Appendix B: Automatic Measurements Reference  
This reference describes the automatic measurement system of this instrument.  
Automatic measurements support Pulse, Return-to-Zero (RZ), and Non-Return-  
to-Zero (NRZ) signals, providing measurements in three categories, Amplitude,  
Timing, and Area.  
This reference gathers reference information for automatic measurements.  
Specifically, it lists:  
H
A definition for each auto-measurement type (for example, risetime, period,  
and suppression ratio), organized according to the signal measured (Pulse,  
Return-to-Zero eye pattern, or Non-Return-to-Zero eye pattern):  
H
H
H
Pulse signals -- see Pulse Measurements on page B--2.  
Return-to-Zero eye patterns -- see RZ Measurements on page B--15.  
Non-Return-to-Zero eye patterns -- see RZ Measurements on page B--37.  
H
H
Descriptions of the reference parameters (levels and crossings) that the  
automatic measurement system uses when taking automatic measurements.  
See Measurement Reference Parameters and Methods on page B--56.  
Descriptions of the methods for tracking the High and Low values that the  
automatic measurement system uses when in taking automatic measure-  
ments. See High/Low Tracking Method on page 3--77.  
To learn about the controls that set up the automatic measurements, see the  
Tracking Methods section on page B--66 or Measurement Setup dialog box topic  
in the online help system.  
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Appendix B: Automatic Measurements Reference  
Pulse Measurements - Amplitude  
Table B--1 describes on page B--2 describes each pulse measurement in the  
amplitude category. See Table B--2 on page B--8 for timing category measure-  
ments; see Table B--3 on page B--14 for area category measurements.  
Table B-1: Pulse Measurements Amplitude  
Name  
Definition  
AC RMS  
The root-mean-square voltage, minus the DC component, of the waveform that is sampled  
within the measurement region.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.  
For best results with this measurement, optimize the vertical resolution before taking this  
measurement. See To Optimize the Vertical Resolution on page B-69.  
Amplitude  
The vertical difference between the High and Low of the signal. The method used to determine  
the High and the Low values can be controlled independently by the tracking method. See  
Tracking Methods on page B-66. Also see High/Low Tracking Method on page 3-77.  
Amplitude = High – Low  
Where High and Low are measured values.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
For best results with this measurement, optimize the vertical resolution before taking this  
measurement. See To Optimize the Vertical Resolution on page B-69.  
Average Optical Power  
(dBm)  
The true average component of an optical signal, expressed in decibels. This measurement  
results from the use of a hardware average-power monitor circuit rather than from the  
calculation of digitized waveform data.  
Note: Average optical power measurements return valid results only on channels that contain  
average power monitors. In general, all optical sampling module channels contain average  
power monitors.  
To determine Average Optical Power (dBm), this measurement simply converts average optical  
power (watts) to decibels using a log10 function, referenced to 1 mW. To see how average  
optical power in watts is determined, see the Average Optical Power (Watts) measurement on  
the following page.  
For best measurement results:  
H
Use a factory-calibrated wavelength. If using the USER wavelength setting, ensure that it  
is properly compensated by performing the User Wavelength Gain compensation found by  
clicking the Optical button in the Vertical Setup dialog box.  
H
Compensate the optical channel (found in the Utilities->Compensation dialog box). A  
portion of this overall optical channel compensation will correct for minor DC variances in  
the average power monitor.  
B-2  
CSA8000B & TDS8000B User Manual  
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Appendix B: Automatic Measurements Reference  
Table B-1: Pulse Measurements Amplitude (cont.)  
Name  
Definition  
Average Optical Power  
(watts)  
DC Signal current (DC amps)  
Average Optical Power (watts) =  
Conversion Gain (ampswatts)  
Where:  
H
H
DC Signal Current is the O/E-converter photo detector current in DC amps  
Conversion Gain is the O/E-converter photo detector gain in amps/watt  
Note: Average optical power measurements return valid results only on channels that contain  
average power monitors. In general, all optical sampling module channels contain average  
power monitors.  
To obtain accurate results, the O/E converter is calibrated at a fixed number of factory-calibrated  
wavelengths to determine the conversion gain of the O/E converter at each wavelength.  
For best average optical power measurement results:  
H
Use a factory-calibrated wavelength. If using the USER wavelength setting, ensure that it  
is properly compensated by performing the User Wavelength Gain compensation found by  
clicking the Optical button in the Vertical Setup dialog box.  
H
Compensate the optical channel, which corrects for minor DC variances in the average-  
power monitor as part of the compensation routine. To access, choose Compensation in  
the Utilities menu of the application.  
Cycle Mean  
The arithmetic mean of the waveform over the first cycle of the measurement region. The  
waveform cycle is determined at the crossings of the mid-reference level. See Measurement  
Reference Parameters and Methods on page B-56. Also see Reference Levels Method on  
page 3-79.  
The mid-reference level is adjustable and defaults to 50% of the pulse amplitude.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.  
For best results with this measurement, optimize the vertical resolution before taking this  
measurement. See To Optimize the Vertical Resolution on page B-69.  
Cycle RMS  
The root-mean-square amplitude of the waveform within the first period of the measurement  
region.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
For best results with this measurement, optimize the vertical resolution before taking this  
measurement. See To Optimize the Vertical Resolution on page B-69.  
B-3  
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Appendix B: Automatic Measurements Reference  
Table B-1: Pulse Measurements Amplitude (cont.)  
Name  
Definition  
Gain  
The amplitude gain between two waveforms. The measurement returns the ratio between the  
amplitudes measured within the measurement regions of the two sources.  
Amplitude1  
Gain =  
Amplitude2  
Where Amplitude1 and Amplitude2 are the Amplitude measurements of the two source  
waveforms. See Amplitude on page B-2.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2) of the two sources. See To Localize a Measurement on  
page 3-83.  
For best results with this measurement, optimize the vertical resolution before taking this  
measurement. See To Optimize the Vertical Resolution on page B-69.  
High  
The top reference level for a measured waveform. Several methods can be applied to the data  
sampled in the upper half of the waveform to determine the High value. You can use the  
Tracking Method control to select among them. See Tracking Methods on page B-66. Also see  
High/Low Tracking Method on page 3-77.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
For best results with this measurement, optimize the vertical resolution before taking this  
measurement. See To Optimize the Vertical Resolution on page B-69.  
Low  
The bottom reference level for a measured waveform. Several methods can be applied to the  
data sampled in the lower half of the waveform to determine the Low value, and you can use  
the Tracking Method control to select among them.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
For best results with this measurement, optimize the vertical resolution before taking this  
measurement. See To Optimize the Vertical Resolution on page B-69.  
Max  
The largest amplitude peak of the waveform over the measurement region.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
For best results with this measurement, optimize the vertical resolution before taking this  
measurement. See To Optimize the Vertical Resolution on page B-69.  
Mean  
The arithmetic mean of the waveform over the measurement region.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
For best results with this measurement, optimize the vertical resolution before taking this  
measurement. See To Optimize the Vertical Resolution on page B-69.  
B-4  
CSA8000B & TDS8000B User Manual  
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Appendix B: Automatic Measurements Reference  
Table B-1: Pulse Measurements Amplitude (cont.)  
Name Definition  
Mid  
The computation of the middle point between the maximum and minimum amplitude peaks of  
the waveform over the measurement region.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.  
For best results with this measurement, optimize the vertical resolution before taking this  
measurement. See To Optimize the Vertical Resolution on page B-69.  
Min  
The smallest amplitude value of the waveform over the measurement region.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
For best results with this measurement, optimize the vertical resolution before taking this  
measurement. See To Optimize the Vertical Resolution on page B-69.  
Optical Modulation  
Amplitude  
The difference between the average power levels of the logic 1, High, and the logic 0, Low, of  
the optical pulse signal. The levels are the Mean values of the logical levels sampled within an  
Aperture of the logical 1 and 0 regions of the pulse. The logical 1 and 0 time intervals are  
marked by the crossings of a reference level determined by the Average Optical Power (AOP) of  
the signal.  
Pulse OMA [watts] = P1 P0  
Where:  
H
P1 and P0 are the average power levels of the logical 1 and 0, determined within the  
respective apertures.  
H
The adjustable Aperture defaults to 20% center respectively of the logical 1 and  
logical 0 time intervals.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
For best measurement results:·  
Perform a vertical compensation. See Perform the Compensation on page1-20.  
Perform a Dark Level compensation before taking this measurement. See To Perform  
Dark-Level and User Wavelength Gain Compensations on page 3-98.  
B-5  
CSA8000B & TDS8000B User Manual  
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Appendix B: Automatic Measurements Reference  
Table B-1: Pulse Measurements Amplitude (cont.)  
Name  
Definition  
+Overshoot  
The ratio of the maximum peak to the signal amplitude over the measurement region,  
expressed as a percentage.  
(Max High)  
+ Overshoot = 100 ×  
(High Low)  
Where:  
H
H
Max is the signal maximum  
High and Low are the 100% and 0% reference levels  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
For best results with this measurement, optimize the vertical resolution before taking this  
measurement.  
-Overshoot  
The ratio of the minimum waveform value to the signal amplitude over the measurement region,  
expressed as a percentage.  
(Low Min)  
Overshoot = 100 ×  
(High Low)  
Where:  
H
H
Min is the signal minimum  
High and Low are the 100% and 0% signal reference levels.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
For best results with this measurement, optimize the vertical resolution before taking this  
measurement.  
B-6  
CSA8000B & TDS8000B User Manual  
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Appendix B: Automatic Measurements Reference  
Table B-1: Pulse Measurements Amplitude (cont.)  
Name Definition  
Peak-to-Peak Noise  
The maximum range of the waveform amplitude variance sampled within a fixed width vertical  
slice located at the center of the measurement region.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
See Use a Waveform Database on page B-69.  
For best results with this measurement. optimize the vertical resolution before taking this  
measurement. See To Optimize the Vertical Resolution on page B-69.  
Pk-Pk  
The absolute difference between the maximum and minimum amplitude values of the waveform  
in the measurement region. See example on page B-63.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
For best results with this measurement, optimize the vertical resolution before taking this  
measurement. See To Optimize the Vertical Resolution on page B-69.  
RMS  
The true root-mean-square value of the waveform over the measurement region.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
For best results with this measurement, optimize the vertical resolution before taking this  
measurement. See To Optimize the Vertical Resolution on page B-69.  
RMS Noise  
One standard deviation of the waveform amplitude variance, sampled within a fixed-width  
vertical slice located at the center of the measurement region.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
For best results with this measurement, optimize the vertical resolution before taking this  
measurement. See To Optimize the Vertical Resolution on page B-69.  
Signal-to-Noise Ratio  
The ratio of the signal amplitude to the noise level. The noise level is defined as one standard  
deviation of the waveform amplitude variance within a fixed width vertical slice located at the  
center of the measurement region.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
B-7  
CSA8000B & TDS8000B User Manual  
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Appendix B: Automatic Measurements Reference  
Pulse Measurements - Timing  
Table B--2 describes each pulse measurement in the timing category. See Table  
on B--1 on page B--2 for amplitude category measurements; see Table B--3 on  
page B--14 for area category measurements.  
Table B-2: Pulse Measurements - Timing  
Name  
Definition  
Burst width  
The time between the first and last crossings, either positive or negative, of the waveform at the  
mid-reference level in the measurement region. See Measurement Reference Parameters and  
Methods on page B-56 or in the online help. Also see Reference Levels Method on page 3-79.  
The mid-reference level is adjustable and defaults to 50% of the pulse amplitude.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.  
Cross+  
The time of the first positive crossing of the data sampled at the mid-reference level in the  
measurement region.  
Cross+ = Tcross  
Where Tcross is the horizontal coordinate of the first positive crossing. See Pulse Sources  
on page B-57.  
The mid-reference level is adjustable and defaults to 50% of the pulse amplitude.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). By default, searching is forward from the Start Gate for the first  
rising edge, but can be reversed, so that searching is backward from the Stop Gate.  
Cross-  
The time of the first negative crossing of the data sampled at the mid-reference level in the  
measurement region.  
Cross - = Tcross  
Where Tcross is the horizontal coordinate of the first negative crossing.  
The mid-reference level is adjustable and defaults to 50% of the pulse amplitude.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). By default, searching is forward from the Start Gate for the first  
falling edge, but can be reversed, so that searching is backward from the Stop Gate.  
B-8  
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Appendix B: Automatic Measurements Reference  
Table B-2: Pulse Measurements - Timing (cont.)  
Name Definition  
Delay  
The time interval between the crossings of the two mid-reference levels on the two sources of  
the measurement.  
Delay = Tcross(source1) Tcross(source2)  
Where Tcross is the first positive or negative crossing time at mid-reference level. See  
Pulse Crossings and Mid-reference Level on page B-58.  
The mid-reference levels are adjustable and default to 50% of the pulse amplitude.  
The slope can be selected to be the first positive, the first negative, or the first crossing (positive  
or negative) in the region.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2) of the two sources. By default, searching is forward from the  
Start Gate for each source, but can be reversed, so that searching is backward from the Stop  
Gate. Direction can be controlled independently for the two waveform sources. See To Localize  
a Measurement on page 3-83.  
+Duty Cycle  
The ratio (expressed as a percentage) of the first positive pulse width within the measurement  
region to the period of the signal. The time intervals are determined at mid-reference level.  
If Tcross1 is positive. then:  
(Tcross2 Tcross1)  
+ Duty Cycle = 100 ×  
(Tcross3 Tcross1)  
If Tcross1 is negative, then:  
(Tcross3 Tcross2)  
+ Duty Cycle = 100 ×  
(Tcross3 Tcross1)  
Tcross1, Tcross2 and Tcross3 are the times of the first three consecutive crossings at the  
mid-reference level.  
The mid-reference levels are adjustable and default to 50% of the pulse amplitude.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
See Measurement Reference Parameters and Methods on page B-56 or in the online help.  
B-9  
CSA8000B & TDS8000B User Manual  
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Appendix B: Automatic Measurements Reference  
Table B-2: Pulse Measurements - Timing (cont.)  
Name  
Definition  
-Duty Cycle  
The ratio (expressed as a percentage) of the first negative pulse width within the measurement  
region to the period of the signal. The time intervals are determined at mid-reference level.  
If Tcross1 is positive, then:  
(Tcross3 Tcross2)  
Duty Cycle = 100 ×  
(Tcross3 Tcross1)  
If Tcross1 is negative, then:  
(Tcross2 Tcross1)  
Duty Cycle = 100 ×  
(Tcross3 Tcross1)  
Tcross1, Tcross2 and Tcross3 are the times of the first three consecutive crossings at the  
mid-reference level.  
The mid-reference levels are adjustable and default to 50% of the pulse amplitude.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.  
Fall Time  
The time interval between times of the high reference level and the low reference level  
crossings on the negative slope of the pulse.  
RZ Fall Time = TcrossL TcrossH  
Where:  
H
H
TcrossL is the time of the crossing of the low reference level  
TcrossH is the time of crossing of the high reference level.  
The low reference and high reference levels are adjustable and default to 10% and 90% of the  
pulse amplitude. There are four Reference Level Calculation methods available for determining  
these reference levels. See Measurement Reference Parameters and Methods on page B-56 or  
in the online help and in Also see Reference Levels Method on page 3-79.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). By default, the algorithm searches forward from the Start Gate  
for the first falling edge, but the Direction of traversal can be reversed, so that the search will be  
backward from the Stop Gate. See To Localize a Measurement on page 3-83.  
Frequency  
The inverse of the Period of the signal.  
1
Frequency =  
(Tcross3 Tcross1)  
Where Tcross3 and Tcross1 are the times of the first two consecutive crossings on the  
same slope at the mid-reference level. See Pulse Crossings and Mid-reference Level on  
page B-58.  
The mid-reference level is adjustable and defaults to 50% of the pulse amplitude.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
B-10  
CSA8000B & TDS8000B User Manual  
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Appendix B: Automatic Measurements Reference  
Table B-2: Pulse Measurements - Timing (cont.)  
Name Definition  
Period  
The time interval between two consecutive crossings on the same slope of the signal at the  
mid-reference level.  
Period = Tcross3 Tcross1  
Where Tcross3 and Tcross1 are the times of the first two consecutive crossings on the  
same slope at the mid-reference level.  
The mid-reference level is adjustable and defaults to 50% of the pulse amplitude.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.  
See Measurement Reference Parameters and Methods on page B-56 or in the online help and  
also see Reference Levels Method on page 3-79.  
Phase  
Tcross1 of source2 Tcross1 of source1  
Tcross3 of source1 Tcross1 of source1  
Phase =  
360  
Where:  
H
H
Tcross1 of source1 is the time of the first crossing of either polarity on source 1.  
Tcross3 of source1 is the time of the next crossing on source 1of the same polarity as  
Tcross1.  
H
H
Tcross1 of source2 is the time of the first crossing of either polarity on source 2 after  
Tcross1 of source1  
All Tcrossings are at the mid-reference levels, which are adjustable and default to 50%  
of the pulse amplitude.  
If measurement gates are enabled, the measurement region is constrained between the Start  
Gate (G1) and Stop Gate (G2) of the sources.  
Pk-Pk Jitter  
The delta between the minimum and maximum of time crossings of data sampled at the at the  
mid-reference level.  
Pk-Pk Jitter = Tcrosspp  
Where Tcrosspp is the difference between the maximum crossing time and the minimum  
crossing time for a histogram of the Tcross values. Tcross is the horizontal coordinate of  
the first positive or negative crossing.  
The mid-reference level is adjustable and defaults to 50% of the pulse amplitude.  
The slope can be selected to be the first positive, the first negative, or the first crossing (positive  
or negative) in the region.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). By default, the algorithm searches forward from the Start Gate  
for the first specified edge, but the Direction of traversal can be reversed, so that the search will  
be backward from the Stop Gate.  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
See Use a Waveform Database on page B-70.  
B-11  
CSA8000B & TDS8000B User Manual  
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Appendix B: Automatic Measurements Reference  
Table B-2: Pulse Measurements - Timing (cont.)  
Name  
Definition  
Rise Time  
The time interval between the low-reference level and the high reference level crossings on the  
positive slope of the pulse.  
RZ Rise Time = TcrossH HcrossL  
Where:  
H
H
TcrossH is the time of crossing of the high reference level.  
TcrossL is the time of crossing of the low reference level.  
The low reference and high reference levels are adjustable and default to 10% and 90% of the  
pulse amplitude. There are four Reference Level Calculation methods available for determining  
these reference levels. See Measurement Reference Parameters and Methods on page B-56 or  
in the online help. Also see Reference Levels Method on page 3-79.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). By default the algorithm searches forward from the Start Gate  
for the first rising edge, but the Direction of traversal can be reversed, so that the search will be  
backward from the Stop Gate. See To Localize a Measurement on page 3-83.  
RMS Jitter  
The time variance on the time crossings of data sampled at the mid-reference level. RMS Jitter  
is defined as one standard deviation (σ) of that variance.  
RMS Jitter = Tcrossσ  
Where Tcrossσ is one standard deviation of the variance of crossing times for a histogram  
of the Tcross values. Tcross is the horizontal coordinate of the first positive or negative  
crossing.  
The mid-reference level is adjustable and defaults to 50% of the pulse amplitude.  
The slope can be selected to be the first positive, the first negative, or the first crossing (positive  
or negative) in the region.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). By default, the algorithm searches forward from the Start Gate  
for the first falling edge, but the Direction of traversal can be reversed, so that the search will be  
backward from the Stop Gate.  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
See Use a Waveform Database on page B-70.  
B-12  
CSA8000B & TDS8000B User Manual  
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Appendix B: Automatic Measurements Reference  
Table B-2: Pulse Measurements - Timing (cont.)  
Name Definition  
+Width  
The horizontal interval between the crossings of the rising and falling edges at the mid-refer-  
ence level of the first positive pulse in the measurement region.  
+Width = Tcross2 Tcross1  
Where Tcross1 and Tcross2 are the two consecutive horizontal crossings on the first  
positive pulse.  
The mid-reference level is adjustable and defaults to 50% of the pulse amplitude.  
See Measurement Reference Parameters and Methods on page B-56 or in the online help. Also  
see Reference Levels Method on page 3-79.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.  
-Width  
The horizontal interval between the crossings of the falling and rising edges at the mid-refer-  
ence level of the first negative pulse in the measurement region.  
-Width = Tcross2 Tcross1  
Where Tcross2 and Tcross1 are the two consecutive horizontal crossings on the first  
negative pulse.  
The mid-reference level is adjustable and defaults to 50% of the pulse amplitude.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
B-13  
CSA8000B & TDS8000B User Manual  
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Appendix B: Automatic Measurements Reference  
Pulse Measurement - Area  
Table B--3 describes each pulse measurement in the area category. See Table B--1  
on page B--2 amplitude-category measurements; see Table B--2 on page B--8  
for timing-category measurements.  
Table B-3: Pulse Measurements - Area  
Name  
Definition  
Area  
The area under the curve for the waveform within the measurement region. Area measured  
above ground is positive; area measured below ground is negative.  
over the measurement region  
Area = waveform(t) dt,  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.  
For best results, optimize the vertical resolution before taking this measurement. See To  
Optimize the Vertical Resolution on page B-69.  
Cycle Area  
The area under the curve for the first waveform period within the measurement region. Area  
measured above ground is positive; area measured below ground is negative.  
over the first waveform period within the  
measurement region.  
Area = waveform(t) dt,  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
For best results, optimize the vertical resolution before taking this measurement. See To  
Optimize the Vertical Resolution on page B-69.  
B-14  
CSA8000B & TDS8000B User Manual  
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Appendix B: Automatic Measurements Reference  
Return-to-Zero (RZ) Measurements - Amplitude  
Table B--4 describes each RZ measurement in the amplitude category. See Table  
on B--5 on page B--29 for timing category measurements; see Table B--6 on page  
B--36 for area category measurements.  
Table B-4: RZ Measurements - Amplitude  
Name  
Definition  
RZ AC RMS  
The root mean square amplitude, minus the DC component, of the waveform that is sampled  
within the measurement region.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
See Use a Waveform Database on page B-70.  
For best results with this measurement:  
H
Perform a Dark Level compensation before taking this measurement if the source of the  
measured waveform is an optical channel. See To Perform Dark-Level and User  
Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See To Optimize the  
Vertical Resolution on page B-69.  
RZ Amplitude  
The difference between the logical 1 level (High) and the logical 0 level (Low) of the RZ signal.  
Both High and Low levels are measured within the Eye Aperture.  
RZ Amplitude = High Low  
Where High and Low are the logical 1 and 0 levels.  
The Eye Aperture is adjustable and defaults to 5% of the RZ pulse width.  
See RZ Eye Aperture Parameters on B-62.  
If enabled, measurement gates, constrain the measurement region to the area between the  
Start Gate (G1) and Stop Gate (G2).  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
For best results with this measurement:  
H
Perform a Dark Level compensation before taking this measurement if the source of the  
measured waveform is an optical channel. See To Perform Dark-Level and User  
Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See To Optimize the  
Vertical Resolution on page B-69.  
B-15  
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Appendix B: Automatic Measurements Reference  
Table B-4: RZ Measurements - Amplitude (cont.)  
Name  
Definition  
RZ Average Optical  
Power (dBm)  
The true average component of an optical signal, expressed in decibels. This measurement  
results from the use of a hardware average power monitor circuit rather than from the  
calculation of digitized waveform data.  
Note: Average optical power measurements return valid results only on channels that contain  
average power monitors. In general, all optical sampling module channels contain average  
power monitors.  
To determine RZ Average Optical Power (dBm), this measurement simply converts average  
optical power (watts) to decibels using a log10 function referenced to 1mW. To determine  
average optical power in watts, see the RZ Average Optical Power (Watts) measurement below.  
For best average optical power measurement results:  
H
Use a factory-calibrated wavelength. If using the USER wavelength setting, ensure that it  
is properly compensated by performing the User Wavelength Gain compensation found by  
clicking the Optical button in the Vertical Setup dialog box.  
H
Compensate the optical channel, which corrects for minor DC variances in the average  
power monitor as part of the compensation routine. To access, choose Compensation in  
the Utilities menu of the application.  
RZ Average Optical  
Power (watts)  
DC Signal Current (DC amps)  
Average Optical Power (watts) =  
Conversion Gain (ampswatts)  
Where:  
H
H
DC Signal Current is the O/E-converter photo detector current in DC amps  
Conversion Gain is the O/E-converter photo detector gain in amps/watts  
Note: Average optical power measurements return valid results only on channels that contain  
average power monitors. In general, all optical sampling module channels contain average  
power monitors.  
To obtain accurate results, the O/E converter is calibrated at a fixed number of factory-calibrated  
wavelengths to determine the conversion gain of the O/E converter at each wavelength.  
For best average optical power measurement results:  
H
Use a factory-calibrated wavelength. If using the USER wavelength setting, ensure that it  
is properly compensated by performing the User Wavelength Gain compensation found by  
clicking the Optical button in the Vertical Setup dialog box.  
H
Compensate the optical channel, which corrects for minor DC variances in the average  
power monitor as part of the compensation routine. To access, choose Compensation in  
the Utilities menu of the application.  
B-16  
CSA8000B & TDS8000B User Manual  
Download from Www.Somanuals.com. All Manuals Search And Download.  
Appendix B: Automatic Measurements Reference  
Table B-4: RZ Measurements - Amplitude (cont.)  
Name Definition  
RZ Extinction Ratio  
The ratio of the average power levels of the logic 1 level (High) to the logic 0 level (Low) of an  
optical RZ signal. All level determinations are made within the RZ Eye Aperture.  
High  
RZ ExtRatio =  
Low  
Where High and Low are the logical 1 and 0 levels. See RZ Eye Aperture Parameters  
on B-62.  
The Eye Aperture is adjustable and defaults to 5% of the RZ pulse width.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.  
For best measurement results:  
H
Always perform a Dark Level compensation before taking this measurement. See To  
Perform Dark-Level and User Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See To Optimize the  
Vertical Resolution on page B-69.  
RZ Extinction Ratio (%)  
The ratio of the average power levels of the logic 0 level (Low) to the logic 1 level (High) of an  
optical RZ signal, expressed as a percentage. All level determinations are made within the RZ  
Eye Aperture.  
Low  
RZ ExtRatio [%] = 100 × Ꮛ Ꮠ  
High  
Where High and Low are the logical 1 and 0 levels.  
The Eye Aperture is adjustable and defaults to 5% of the RZ pulse width.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
For best measurement results:  
H
Always perform a Dark Level compensation before taking this measurement. See To  
Perform Dark-Level and User Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See To Optimize the  
Vertical Resolution on page B-69.  
B-17  
CSA8000B & TDS8000B User Manual  
Download from Www.Somanuals.com. All Manuals Search And Download.  
Appendix B: Automatic Measurements Reference  
Table B-4: RZ Measurements - Amplitude (cont.)  
Name  
Definition  
RZ Extinction Ratio (dB) The ratio of the average power levels of the logic 1 level (High) to the logic 0 level (Low) of an  
optical RZ signal, expressed in decibels, dB. All level determinations are made within the RZ  
Eye Aperture.  
High  
RZ ExtRatio [dB] = 10 × logᏋ Ꮠ  
Low  
Where High and Low are the logical 1 and 0 levels. See RZ Eye Aperture Parameters  
on B-62.  
The Eye Aperture is adjustable and defaults to 5% of the RZ pulse width.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
See Use a Waveform Database on page B-70.  
For best measurement results:  
H
Always perform a Dark Level compensation before taking this measurement. See To  
Perform Dark-Level and User Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See To Optimize the  
Vertical Resolution on page B-69.  
RZ Eye Height  
RZ Eye Height is a measure of how noise affects the vertical opening between the High and  
Low levels of an RZ pulse. The RZ pulse is sampled within the Eye Aperture, where the High  
and Low levels are determined as the mean of the histogram of the data distribution in the  
upper and lower half of the pulse, respectively. The noise levels are characterized by σhigh and  
σlow, the standard deviations from the mean for the High and Low levels.  
RZ Eye height = (High 3 * σhigh) (Low + 3 * σlow),  
Where High and Low are the logical 1 and 0 levels, and σhigh and σlow are the standard  
deviations.  
The Eye Aperture is adjustable and defaults to 5% of the RZ pulse width.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
For best results with this measurement:  
H
Perform a Dark Level compensation before taking this measurement if the source of the  
measured waveform is an optical channel. See To Perform Dark-Level and User  
Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See To Optimize the  
Vertical Resolution on page B-69.  
B-18  
CSA8000B & TDS8000B User Manual  
Download from Www.Somanuals.com. All Manuals Search And Download.  
Appendix B: Automatic Measurements Reference  
Table B-4: RZ Measurements - Amplitude (cont.)  
Name Definition  
RZ Eye Opening Factor  
RZ Eye Opening Factor is a measure of how noise affects the vertical opening between High  
and Low levels of an RZ pulse. The RZ pulse is sampled within the Eye Aperture, where the  
High and Low levels are determined as the mean of the histogram of the data distribution in the  
upper and lower half of the pulse, respectively. The noise levels are characterized by σhigh and  
σlow, the standard deviations from the mean for the High and Low levels.  
(
)
(
)
High σhigh Low + σlow  
RZ Eye Opening Factor = Ꮛ  
Where High and Low are the logical 1 and 0 levels, and σhigh and σlow are the standard  
(
)
High Low  
deviations. See RZ Eye Aperture Parameters on B-62.  
The Eye Aperture is adjustable and defaults to 5% of the RZ pulse width.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
See Use a Waveform Database on page B-70.  
For best results with this measurement:  
H
Perform a Dark Level compensation before taking this measurement if the source of the  
measured waveform is an optical channel. See To Perform Dark-Level and User  
Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See To Optimize the  
Vertical Resolution on page B-69.  
RZ Gain  
RZ Gain is a defined as the amplitude gain between two waveforms. The measurement returns  
the ratio between the amplitudes measured within the Eye Aperture of each of the waveforms.  
Ampl2  
RZ Gain =  
Ampl1  
Where Ampl1 and Ampl2 are the amplitudes of the two source waveforms.  
The Eye Aperture is adjustable and defaults to 5% of the RZ pulse width.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
For best results with this measurement:  
H
Perform a Dark Level compensation before taking this measurement if the source of the  
measured waveform is an optical channel. See To Perform Dark-Level and User  
Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See To Optimize the  
Vertical Resolution on page B-69.  
B-19  
CSA8000B & TDS8000B User Manual  
Download from Www.Somanuals.com. All Manuals Search And Download.  
Appendix B: Automatic Measurements Reference  
Table B-4: RZ Measurements - Amplitude (cont.)  
Name  
Definition  
RZ High  
The logical 1 level of the RZ signal. The data within the Eye Aperture is sampled, a histogram is  
built from the upper half of the RZ eye, and the mean of the histogram yields the High level.  
The Eye Aperture is adjustable and defaults to 5% of the RZ pulse width. See RZ Eye Aperture  
Parameters on B-62.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
See Use a Waveform Database on page B-70.  
For best results with this measurement:  
H
Perform a Dark Level compensation before taking this measurement if the source of the  
measured waveform is an optical channel. See To Perform Dark-Level and User  
Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See How to Optimize the  
Vertical Resolution on page B-70.  
RZ Low  
The logical 0 level of the RZ signal. The data within the Eye Aperture is sampled, a histogram is  
built from the lower half of the RZ eye, and the mean of the histogram yields the Low level.  
The Eye Aperture is adjustable and defaults to 5% of the RZ pulse width.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
For best results with this measurement:  
H
Perform a Dark Level compensation before taking this measurement if the source of the  
measured waveform is an optical channel. See To Perform Dark-Level and User  
Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See To Optimize the  
Vertical Resolution on page B-69.  
B-20  
CSA8000B & TDS8000B User Manual  
Download from Www.Somanuals.com. All Manuals Search And Download.  
Appendix B: Automatic Measurements Reference  
Table B-4: RZ Measurements - Amplitude (cont.)  
Name Definition  
RZ Max  
RZ Mean  
RZ Mid  
The maximum vertical value of the waveform that is sampled within the measurement region.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
When this measurement is turned on, it will automatically set the measurement system to use a  
waveform database if available.  
For best results with this measurement:  
H
Perform a Dark Level compensation before taking this measurement if the source of the  
measured waveform is an optical channel. See To Perform Dark-Level and User  
Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See To Optimize the  
Vertical Resolution on page B-69.  
The arithmetic mean of the waveform that is sampled within the measurement region.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.  
When this measurement is turned on, it will automatically set the measurement system to use a  
waveform database if available. See Use a Waveform Database on page B-70.  
For best results with this measurement:  
H
Perform a Dark Level compensation before taking this measurement if the source of the  
measured waveform is an optical channel. See To Perform Dark-Level and User  
Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See How to Optimize the  
Vertical Resolution on page B-70.  
The middle level between the Max and Min vertical values of the waveform that is sampled  
within the measurement region.  
(Max + Min)  
RZ Mid =  
2
Where Max and Min are the maximum and minimum measurements.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
When this measurement is turned on, it will automatically set the measurement system to use a  
waveform database if available.  
For best results with this measurement:  
H
Perform a Dark Level compensation before taking this measurement if the source of the  
measured waveform is an optical channel. See To Perform Dark-Level and User  
Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See To Optimize the  
Vertical Resolution on page B-69.  
B-21  
CSA8000B & TDS8000B User Manual  
Download from Www.Somanuals.com. All Manuals Search And Download.  
Appendix B: Automatic Measurements Reference  
Table B-4: RZ Measurements - Amplitude (cont.)  
Name  
Definition  
RZ Min  
The minimum vertical value of the waveform that is sampled within the measurement region.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
When this measurement is turned on, it will automatically set the measurement system to use a  
waveform database if available.  
For best results with this measurement:  
H
Perform a Dark Level compensation before taking this measurement if the source of the  
measured waveform is an optical channel. See To Perform Dark-Level and User  
Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See To Optimize the  
Vertical Resolution on page B-69.  
RZ Peak-to-Peak  
The difference between the Max and Min vertical values of the waveform that is sampled within  
the measurement region.  
RZ Peak-to-Peak = Max Min  
Where Max and Min are the maximum and minimum measurements.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.  
When this measurement is turned on, it will automatically set the measurement system to use a  
waveform database if available. See Use a Waveform Database on page B-70.  
For best results with this measurement:  
H
Perform a Dark Level compensation before taking this measurement if the source of the  
measured waveform is an optical channel. See To Perform Dark-Level and User  
Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See How to Optimize the  
Vertical Resolution on page B-70.  
B-22  
CSA8000B & TDS8000B User Manual  
Download from Www.Somanuals.com. All Manuals Search And Download.  
Appendix B: Automatic Measurements Reference  
Table B-4: RZ Measurements - Amplitude (cont.)  
Name Definition  
RZ Peak-to-Peak Noise  
The maximum range of the data distribution sampled within a fixed width vertical slice located at  
the center of the Eye Aperture at the High or Low levels. See RZ Eye Aperture Parameters  
on B-62.  
PkPk noise = Highpp or PkPk noise = Lowpp  
The Eye Aperture is adjustable and defaults to 5% of the RZ pulse width. The High or Low  
selection for Noise At control in the Measurement Setup dialog specifies that the measurement  
is to be performed on the logical 1 or 0 levels.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
For best results with this measurement:  
H
Perform a Dark Level compensation before taking this measurement if the source of the  
measured waveform is an optical channel. See To Perform Dark-Level and User  
Wavelength Gain Compensations on page 3-98.  
H
Perform Autoset or otherwise optimize the vertical resolution before this measurement, i.e.,  
increase the overall vertical size of the waveform (but without producing off-screen  
waveform points). See How to Optimize the Vertical Resolution on page B-70.  
B-23  
CSA8000B & TDS8000B User Manual  
Download from Www.Somanuals.com. All Manuals Search And Download.  
Appendix B: Automatic Measurements Reference  
Table B-4: RZ Measurements - Amplitude (cont.)  
Name  
Definition  
RZ Q Factor  
A figure of merit of an eye diagram, reporting the ratio between the amplitude of the RZ pulse to  
the total RMS noise on the High and Low levels. The RZ pulse is sampled within the Eye  
Aperture, where the High and Low levels are determined as the mean of the histogram of the  
data distribution in the upper and lower half of the pulse, respectively. The noise levels are  
characterized by σhigh and σlow, the standard deviations from the mean for the High and Low  
levels.  
(High Low)  
RZ Q Factor =  
(σhigh + σlow)  
Where:  
H
H
High and Low are the logical 1 and 0 levels.  
σhigh and σlow are the standard deviations.  
The Eye Aperture is adjustable and defaults to 5% of the RZ pulse width. See RZ Eye Aperture  
Parameters on B-62.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
See Use a Waveform Database on page B-70.  
For best results with this measurement:  
H
Perform a Dark Level compensation before taking this measurement if the source of the  
measured waveform is an optical channel. See To Perform Dark-Level and User  
Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See How to Optimize the  
Vertical Resolution on page B-70.  
RZ RMS  
The true root mean square of the waveform that is sampled within the measurement region.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
When this measurement is turned on, it will automatically set the measurement system to use a  
waveform database if available.  
For best results with this measurement:  
H
Perform a Dark Level compensation before taking this measurement if the source of the  
measured waveform is an optical channel. See To Perform Dark-Level and User  
Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See To Optimize the  
Vertical Resolution on page B-69.  
B-24  
CSA8000B & TDS8000B User Manual  
Download from Www.Somanuals.com. All Manuals Search And Download.  
Appendix B: Automatic Measurements Reference  
Table B-4: RZ Measurements - Amplitude (cont.)  
Name  
Definition  
RZ RMS Noise  
One standard deviation of the data distribution sampled within a fixed width vertical slice located  
at the center of the Eye Aperture at the High (logical 1) or Low (logical 0) levels.  
RMS noise = Highσ or RMS noise = Lowσ  
The Eye Aperture is adjustable and defaults to 5% of the RZ pulse width. The High or Low  
selection for Noise At control in the Measurement Setup dialog instructs the measurement to be  
performed on the logical 1 or 0 levels. See RZ Eye Aperture Parameters on B-62.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
See Use a Waveform Database on page B-70.  
For best results with this measurement:  
H
Perform a Dark Level compensation before taking this measurement if the source of the  
measured waveform is an optical channel. See To Perform Dark-Level and User  
Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See How to Optimize the  
Vertical Resolution on page B-70.  
RZ Signal-to-Noise Ratio The ratio of the RZ pulse amplitude to the noise on either the High (logical 1) or Low (logical 0)  
level. The data within the Eye Aperture is sampled, and the mean of the histogram yields the  
High and Low levels. The noise is defined as one standard deviation of the distribution within a  
fixed width vertical slice located at the center of the Eye Aperture.  
(High Low)  
Highσ  
(High Low)  
Lowσ  
SN Ratio =  
or  
SN Ratio =  
Where High and Low are the logical 1 and 0 levels. See RZ Eye Aperture Parameters  
on B-62.  
The Eye Aperture is adjustable and defaults to 5% of the RZ pulse width. The High or Low  
selection for Noise At control in the Measurement Setup dialog instructs the measurement to be  
performed on the logical 1 or 0 levels.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
For best results with this measurement, perform a Dark Level compensation before taking this  
measurement if the source of the measured waveform is an optical channel. See To Perform  
Dark-Level and User Wavelength Gain Compensations on page 3-98.  
B-25  
CSA8000B & TDS8000B User Manual  
Download from Www.Somanuals.com. All Manuals Search And Download.  
Appendix B: Automatic Measurements Reference  
Table B-4: RZ Measurements - Amplitude (cont.)  
Name  
Definition  
RZ Suppression Ratio  
The ratio of the average power level of the logic High to the Suppressed level measured  
between two consecutive RZ pulses. The RZ pulse is sampled within the Eye Aperture where  
the High is determined as the mean of the histogram of the data distribution in the upper half of  
the pulse. The same region is sampled to record the data distribution in the lower half of the  
pulse, data corresponding to the logical level 0. Similarly, data is sampled in an equivalent sized  
region placed at one-half bit interval offset from the Eye Aperture. The mean of the histogram of  
the data distribution between the peaks adjusted by subtracting the zero level histogram yields  
the Suppressed level.  
High  
RZ Suppression Ratio =  
(Suppress Low)  
Where:  
H
H
High and Low are the logical 1 and 0 levels  
Suppress is the mean of the histogram of the data within an Eye Aperture in the  
suppressed region  
The Eye Aperture is adjustable and defaults to 5% of the RZ pulse width. See RZ Eye Aperture  
Parameters on B-62.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). The region used for sampling the suppressed region is equal to  
the Eye Aperture and has no independent control. See To Localize a Measurement on  
page 3-83.  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
See Use a Waveform Database on page B-70.  
For best measurement results:  
H
Perform a Dark Level compensation before taking this measurement. See To Perform  
Dark-Level and User Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See How to Optimize the  
Vertical Resolution on page B-70.  
B-26  
CSA8000B & TDS8000B User Manual  
Download from Www.Somanuals.com. All Manuals Search And Download.  
Appendix B: Automatic Measurements Reference  
Table B-4: RZ Measurements - Amplitude (cont.)  
Name Definition  
RZ Suppression Ratio  
(%)  
The inverse ratio of the average power level of the logic High to the Suppressed level measured  
between two consecutive RZ pulses, with the result expressed in percentage. The RZ pulse is  
sampled within the Eye Aperture where the High is determined as the mean of the histogram of  
the data distribution in the upper half of the pulse. The same region is sampled to record the  
data distribution in the lower half of the pulse, data corresponding to the logical level 0.  
Similarly, data is sampled in an equivalent sized region placed at one-half bit interval offset from  
the Eye Aperture. The mean of the histogram of the data distribution between the peaks  
adjusted by subtracting the zero level histogram yields the Suppressed level.  
(Suppress Low)  
High  
RZ Suppression Ratio [%] = 100 × Ꮛ  
Where:  
H
H
High and Low are the logical 1 and 0 levels  
Suppress is the mean of the histogram of the data within an Eye Aperture in the  
suppressed region  
The Eye Aperture is adjustable and defaults to 5% of the RZ pulse width. See RZ Eye Aperture  
Parameters on B-62.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). The region used for sampling the suppressed region is equal to  
the Eye Aperture and has no independent control. See To Localize a Measurement on  
page 3-83.  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
See Use a Waveform Database on page B-70.  
For best measurement results:  
H
Perform a Dark Level compensation before taking this measurement. See To Perform  
Dark-Level and User Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See How to Optimize the  
Vertical Resolution on page B-70.  
B-27  
CSA8000B & TDS8000B User Manual  
Download from Www.Somanuals.com. All Manuals Search And Download.  
Appendix B: Automatic Measurements Reference  
Table B-4: RZ Measurements - Amplitude (cont.)  
Name  
Definition  
RZ Suppression Ratio  
(dB)  
The ratio of the average power level of the logic High to the Suppressed level measured  
between two consecutive RZ pulses, with the result expressed in decibels. The RZ pulse is  
sampled within the Eye Aperture where the High is determined as the mean of the histogram of  
the data distribution in the upper half of the pulse. The same region is sampled to record the  
data distribution in the lower half of the pulse, data corresponding to the logical level 0.  
Similarly, data is sampled in an equivalent sized region placed at one-half bit interval offset from  
the Eye Aperture. The mean of the histogram of the data distribution between the peaks  
adjusted by subtracting the zero level histogram yields the Suppressed level.  
High  
RZ Suppression Ratio [dB] = 10 × logᏋ  
Where:  
(Suppress Low)  
H
H
High and Low are the logical 1 and 0 levels  
Suppress is the mean of the histogram of the data within an Eye Aperture in the  
suppressed region  
The Eye Aperture is adjustable and defaults to 5% of the RZ pulse width. See RZ Eye Aperture  
Parameters on B-62.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). The region used for sampling the suppressed region is equal to  
the Eye Aperture and has no independent control. See To Localize a Measurement on  
page 3-83.  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
See Use a Waveform Database on page B-70.  
For best measurement results:  
H
Perform a Dark Level compensation before taking this measurement. See To Perform  
Dark-Level and User Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See How to Optimize the  
Vertical Resolution on page B-70.  
B-28  
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Appendix B: Automatic Measurements Reference  
Return-to-Zero (RZ) Measurements - Timing  
Table B--5 topic describes each RZ measurement in the timing category. See  
Table B--4 on page B--15 for amplitude category measurements; see Table B--6  
on page B--36 for area category measurements.  
Table B-5: RZ Measurements - Timing  
Name  
Definition  
RZ Bit Rate  
The inverse of the time interval between two consecutive rising or falling edges (i.e. the  
reciprocal of the Bit Time). The crossing times are computed as the mean of the histogram of  
the data slice at the mid-reference level. The choice of rising or falling edge is automatic based  
on the first slope encountered in the measurement region.  
1
RZ Bit Rate =  
(Tcross3 Tcross1)  
Where Tcross3 and Tcross1 are the mean of the histogram of the two consecutive  
crossings on the same type slope at the mid-reference level. See RZ Crossings on page  
B-61.  
The mid-reference level is adjustable and defaults to 50% of the RZ maximum pulse amplitude.  
See Mid-reference level on page B-69.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
See Use a Waveform Database on page B-70.  
RZ Bit Time  
The time interval between two consecutive rising or falling edges. The crossing times are  
computed as the mean of the histogram of the data slice at the mid-reference level. The choice  
of rising or falling edge is automatic based on the first slope encountered in the measurement  
region.  
RZ Bit Time = Tcross3 Tcross1  
Where Tcross3 and Tcross1 are the mean of the histogram of the two consecutive  
crossings on the same type slope at the mid-reference level.  
The mid-reference level is adjustable and defaults to 50% of the RZ maximum pulse amplitude.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
B-29  
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Appendix B: Automatic Measurements Reference  
Table B-5: RZ Measurements - Timing (cont.)  
Name  
Definition  
RZ Cross+  
The time of a positive crossing, defined as the mean of the histogram of the data sampled at  
the mid-reference level.  
Cross+ = Tcross  
Where Tcross is the mean of the histogram of a positive crossing. See RZ Crossings on  
page B-61.  
The mid-reference level is adjustable and defaults to 50% of the RZ maximum pulse amplitude.  
See Mid-reference level on page B-69.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). By default the algorithm searches forward from the Start Gate  
for the first rising edge, but the Direction of traversal can be reversed, so that the search will be  
backward from the Stop Gate. See To Localize a Measurement on page 3-83.  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
See Use a Waveform Database on page B-70.  
RZ Cross-  
The time of a negative crossing, defined as the mean of the histogram of the data sampled at  
the mid-reference level.  
Cross - = Tcross  
Where Tcross is the mean of the histogram of a negative crossing.  
The mid-reference level is adjustable and defaults to 50% of the RZ maximum pulse amplitude.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). By default, the algorithm searches forward from the Start Gate  
for the first falling edge, but the Direction of traversal can be reversed, so that the search will be  
backward from the Stop Gate.  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
B-30  
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Appendix B: Automatic Measurements Reference  
Table B-5: RZ Measurements - Timing (cont.)  
Name Definition  
RZ Delay  
The time interval between the crossings of the mid-reference levels on the two sources of the  
measurement. The crossing times are computed as the mean of the histogram of the data slice  
at the mid-reference level.  
RZ Delay = Tcross(source1) Tcross(source2)  
Where Tcross is the mean of the histogram of a positive or negative crossing at  
mid-reference level. See RZ Crossings on page B-61.  
The mid-reference level is adjustable and defaults to 50% of the RZ maximum pulse amplitude.  
See Mid-reference level on page B-69.  
The slope can be selected to be the first positive, the first negative, or the first crossing (positive  
or negative) in the region.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). By default, for each source, the algorithm searches forward from  
the Start Gate for the first rising or falling edge as defined by Slope, but the Direction of  
traversal can be reversed, so that the search will be backward from the Stop Gate. See To  
Localize a Measurement on page 3-83.  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
See Use a Waveform Database on page B-70.  
RZ +Duty Cycle  
The ratio of the RZ pulse width to the RZ bit time.  
If the first crossing is positive, then:  
(Tcross2 Tcross1)  
Duty Cycle =  
(Tcross3 Tcross1)  
If the first crossing is negative, then:  
(Tcross3 Tcross2)  
Duty Cycle =  
(Tcross3 Tcross1)  
Where Tcross1, Tcross2 and Tcross3 are the mean of the histogram of the first three  
consecutive crossings at the mid-reference level.  
The mid-reference level is adjustable and defaults to 50% of the RZ maximum pulse amplitude.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
B-31  
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Appendix B: Automatic Measurements Reference  
Table B-5: RZ Measurements - Timing (cont.)  
Name  
Definition  
RZ Eye Width  
The 3σ guarded delta between the rising and falling edge crossings.  
Eye Width = (Tcross2 3 * Tcross2σ) (Tcross1 + 3 * Tcross1σ)  
Where Tcross1 and Tcross2 are the mean of the histogram of the two crossings. See RZ  
Crossings on page B-61.  
The mid-reference level is adjustable and defaults to 50% of the RZ maximum pulse amplitude.  
See Mid-reference level on page B-69.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
See Use a Waveform Database on page B-70.  
RZ Fall Time  
RZ Fall Time characterizes the negative slope of the RZ pulse by computing the time interval  
between the mean crossings of the high reference level and the low reference level.  
RZ Fall Time = TcrossL - TcrossH  
Where:  
H
TcrossLRZFig_RefLevels>Second is the mean of the histogram of the crossing of the  
low reference level  
H
TcrossH is the mean of the histogram of the crossing of the high reference level. See  
RZ Measurement Reference Levels on page B-60.  
The adjustable low reference and high reference levels default to 20% and 80% of the RZ  
maximum pulse amplitude.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
B-32  
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Appendix B: Automatic Measurements Reference  
Table B-5: RZ Measurements - Timing (cont.)  
Name Definition  
Phase =  
RZ Phase  
Tcross1 of source2 Tcross1 of source1  
Tcross3 of source1 Tcross1 of source1  
360  
Where:  
H
H
H
H
Tcross1 of source1 is mean of the histogram at the time of the first crossing of either  
polarity on source 1. See RZ Crossings on page B-61.  
Tcross3 of source1 is the mean of the histogram at time of the next crossing on source  
1of the same polarity as Tcross1.  
Tcross1 of source2 is the mean of the histogram at the time of the first crossing of  
either polarity on source 2 after Tcross1 of source1.  
All Tcrossings are at the mid-reference levels, which are adjustable and defaults to  
50% of the RZ maximum pulse amplitude. See Mid-reference level on page B-69.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
See Use a Waveform Database on page B-70.  
RZ Pk-Pk Jitter  
The delta between the minimum and maximum of time crossings at the reference level, with the  
mean of the histogram being Tcross.  
Pk-PK Jitter = Tcrosspp  
The mid-reference level is adjustable and defaults to 50% of the RZ maximum pulse amplitude.  
The jitter measurement can be performed on the positive or negative slope.  
The slope can be selected to be the first positive, the first negative, or the first crossing (positive  
or negative) in the region.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). By default, the algorithm searches forward from the Start Gate  
for the first specified edge, but the Direction of traversal can be reversed, so that the search will  
be backward from the Stop Gate.  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
B-33  
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Appendix B: Automatic Measurements Reference  
Table B-5: RZ Measurements - Timing (cont.)  
Name  
Definition  
RZ Pulse Symmetry  
RZ Pulse Symmetry measures to what extent the RZ pulse is symmetrical around the peak at  
the mid-reference level. The pulse peak is the center of the interval, sized to Eye Aperture,  
which yields the maximum mean vertical value. See RZ Eye-Aperture Parameters on page  
B-62.  
(Tcross0 Tcross1)  
(Tcross2 Tcross1)  
RZ Pulse Symmetry [%] = 100 × Ꮛ  
Where:  
H
H
Tcross1 and Tcross2RZFig_CrossLevels>Second are the time crossings of the RZ  
pulse of the mid-reference level. See RZ Crossings on page B-61.  
Tcross0 is the time coordinate of the pulse peak.  
The mid-reference level is adjustable and defaults to 50% of the RZ maximum pulse amplitude.  
See Mid-reference level on page B-69.  
If gating is enabled, the measurement region is constrained between the Start Gate (G1) and  
Stop Gate (G2). See To Localize a Measurement on page 3-83.  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
See Use a Waveform Database on page B-70.  
RZ Rise Time  
RZ Rise Time characterizes the positive slope of the RZ pulse by computing the time interval  
between the mean crossings of the low reference level and the high reference level.  
RZ Rise Time = TcrossH - HcrossL  
Where:  
H
H
TcrossH is the mean of the histogram of the crossing of the high reference level  
TcrossL is the mean of the histogram of the crossing of the low reference level. See  
RZ Measurement Reference Levels on page B-60.  
The adjustable low reference and high reference levels default to 20% and 80% of the RZ  
maximum pulse amplitude.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
B-34  
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Appendix B: Automatic Measurements Reference  
Table B-5: RZ Measurements - Timing (cont.)  
Name Definition  
RZ RMS Jitter  
Jitter is the measure of time variance at the location where the signal crosses the mid-reference  
level. RMS Jitter is defined as one standard deviation (σ) of that variance. The mean of the  
histogram of the crossing data distribution is Tcross.  
RMS Jitter = Tcrossσ  
The mid-reference level is adjustable and defaults to 50% of the RZ maximum pulse amplitude.  
The jitter measurement can be performed on the positive or negative slope. See Mid-reference  
level on page B-69.  
The slope can be selected to be the first positive, the first negative, or the first crossing (positive  
or negative) in the region.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). By default, the algorithm searches forward from the Start Gate  
for the first specified edge, but the Direction of traversal can be reversed, so that the search will  
be backward from the Stop Gate. See To Localize a Measurement on page 3-83.  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
See Use a Waveform Database on page B-70.  
RZ +Width  
The time interval between the crossings of the rising and falling edges at the mid-reference  
level.  
+Width = Tcross2 Tcross1  
Where Tcross1 and Tcross2 are the mean of the histogram of the rising and falling  
crossings.  
The mid-reference level is adjustable and defaults to 50% of the RZ pulse amplitude.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
B-35  
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Appendix B: Automatic Measurements Reference  
Return-to-Zero (RZ) Measurements - Area  
Table B--6 describes each RZ measurement in the area category. See Table B--4  
on page B--15 for amplitude category measurements; see Table on B--5 on page  
B--29 for timing category measurements  
Table B-6: RZ Measurements -Area  
Name  
Definition  
RZ Area  
The area under the curve for the RZ waveform within the measurement region. Area measured  
above ground is positive; area measured below ground is negative.  
RZ Area = waveform(t) dt,  
If enabled, measurement gates constrain the measurement region to the area between the Start  
over the measurement region.  
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
See Use a Waveform Database on page B-70.  
For best results with this measurement:  
H
Perform a Dark Level compensation before taking this measurement if the source of the  
measured waveform is an optical channel. See To Perform Dark-Level and User  
Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See How to Optimize the  
Vertical Resolution on page B-70.  
RZ Cycle Area  
The area under the curve for the first RZ bit period. Area measured above ground is positive;  
area measured below ground is negative.  
RZ Area = waveform(t) dt  
Where the measurement region is from Start Gate (G1) to Stop Gate (G2), if measurement  
gates are enabled, or the first acquired RZ cycle.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
For best results with this measurement:  
H
Perform a Dark Level compensation before taking this measurement if the source of the  
measured waveform is an optical channel. See To Perform Dark-Level and User  
Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See To Optimize the  
Vertical Resolution on page B-69.  
B-36  
CSA8000B & TDS8000B User Manual  
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Appendix B: Automatic Measurements Reference  
Non-Return-to-Zero (NRZ) Measurements - Amplitude  
Table B--7 topic describes each NRZ measurement in the amplitude category. See  
Table B--8 on page B--50 for timing category measurements.; see Table B--9 on  
page B--55 for area category measurements.  
Table B-7: NRZ Measurements - Amplitude  
Name  
Definition  
NRZ AC RMS  
The root mean square amplitude, minus the DC component, of the selected waveform within  
the measurement region.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.  
When this measurement is turned on, it will automatically set the measurement system to use a  
waveform database if available. See Use a Waveform Database on page B-70.  
For best results with this measurement:  
H
Perform a Dark Level compensation before taking this measurement if the source of the  
measured waveform is an optical channel. See To Perform Dark-Level and User  
Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See How to Optimize the  
Vertical Resolution on page B-70.  
NRZ Amplitude  
The difference between the logical 1 level (High) and the logical 0 level (Low) of the NRZ signal.  
Both High and Low levels are measured within the Eye Aperture.  
NRZ Amplitude = High Low  
Where High and Low are the logical 1 and 0 levels.  
The Eye Aperture is adjustable and defaults to 20% of the NRZ bit time. See RZ Eye Aperture  
Parameters on B-62.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
For best results with this measurement:  
H
Perform a Dark Level compensation before taking this measurement if the source of the  
measured waveform is an optical channel. See To Perform Dark-Level and User  
Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See How to Optimize the  
Vertical Resolution on page B-70.  
B-37  
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Appendix B: Automatic Measurements Reference  
Table B-7: NRZ Measurements - Amplitude (cont.)  
Name  
Definition  
NRZ Average Optical  
Power (dBm)  
The true average component of an optical signal, expressed in decibels. This measurement  
results from the use of a hardware average power monitor circuit rather than from the  
calculation of digitized waveform data.  
Note: Average optical power measurements return valid results only on channels that contain  
average power monitors. In general, all optical sampling module channels contain average  
power monitors.  
To determine NRZ Average Optical Power (dBm), this measurement simply converts average  
optical power (watts) to decibels using a log10 function referenced to 1mW. To determine  
average optical power in watts, see the NRZ Average Optical Power (Watts) measurement. See  
below.  
For best average optical power measurement results:  
H
Use a factory-calibrated wavelength. If using the USER wavelength setting, ensure that it  
is properly compensated by performing the User Wavelength Gain compensation found by  
clicking the Optical button in the Vertical Setup dialog box.  
H
Compensate the optical channel, which corrects for minor DC variances in the average  
power monitor as part of the compensation routine. To access, choose Compensation in  
the Utilities menu of the application.  
NRZ Average Optical  
Power (watts)  
DC Signal Current (DC amps)  
Average Optical Power (watts) =  
Conversion Gain (ampswatts)  
where:  
H
H
DC Signal Current is the O/E-converter photo detector current in DC amps  
Conversion Gain is the O/E-converter photo detector gain in amps/watts  
Note: Average optical power measurements return valid results only on channels that contain  
average power monitors. In general, all optical sampling module channels contain average  
power monitors.  
To obtain accurate results, the O/E converter is calibrated at a fixed number of factory-calibrated  
wavelengths to determine the conversion gain of the O/E converter at each wavelength.  
For best average optical power measurement results:  
H
Use a factory-calibrated wavelength. If using the USER wavelength setting, ensure that it  
is properly compensated by performing the User Wavelength Gain compensation found by  
clicking the Optical button in the Vertical Setup dialog box.  
H
Compensate the optical channel, which corrects for minor DC variances in the average  
power monitor as part of the compensation routine. To access, choose Compensation in  
the Utilities menu of the application.  
B-38  
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Appendix B: Automatic Measurements Reference  
Table B-7: NRZ Measurements - Amplitude (cont.)  
Name Definition  
NRZ Crossing %  
The height of eye crossing as a percentage of eye height measured in the Eye Aperture.  
(Eye Cross Low)  
NRZ Crossing % = 100 ×  
(High Low)  
Where High and Low are the logical 1 and 0 levels, and EyeCross is the level at eye  
crossing. See NRZ Eye-Aperture Parameters on page B-65.  
The Eye Aperture is adjustable and defaults to 20% of the NRZ bit time. See RZ Eye Aperture  
Parameters on B-62.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
See Use a Waveform Database on page B-70  
For best results with this measurement:  
H
Perform a Dark Level compensation before taking this measurement if the source of the  
measured waveform is an optical channel. See To Perform Dark-Level and User  
Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See How to Optimize the  
Vertical Resolution on page B-70.  
NRZ Crossing Level  
The mean signal level at the eye crossing.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
When this measurement is turned on, it will automatically set the measurement system to use a  
waveform database if available.  
For best results with this measurement:  
H
Perform a Dark Level compensation before taking this measurement if the source of the  
measured waveform is an optical channel. See To Perform Dark-Level and User  
Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See To Optimize the  
Vertical Resolution on page B-69.  
B-39  
CSA8000B & TDS8000B User Manual  
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Appendix B: Automatic Measurements Reference  
Table B-7: NRZ Measurements - Amplitude (cont.)  
Name  
Definition  
NRZ Extinction Ratio  
The ratio of the average power levels of the logic 1 level (High) to the logic 0 level (Low) of an  
optical NRZ signal. All level determinations are made within the NRZ Eye Aperture.  
Low  
High  
NRZ ExtRatio = 100 × Ꮛ Ꮠ  
Where High and Low are the logical 1 and 0 levels.  
The Eye Aperture is adjustable and defaults to 20% of the NRZ bit time. See RZ Eye Aperture  
Parameters on B-62.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
See Use a Waveform Database on page B-70.  
For best measurement results:  
H
Perform a Dark Level compensation before taking this measurement. See To Perform  
Dark-Level and User Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See How to Optimize the  
Vertical Resolution on page B-70.  
NRZ Extinction Ratio (%) The ratio of the average power levels of the logic 0 level (Low) to the logic 1 level (High) of an  
optical NRZ signal, expressed as a percentage. All level determinations are made within the  
NRZ Eye Aperture.  
Low  
High  
NRZ ExtRatio [%] = 100 × Ꮛ Ꮠ  
Where High and Low are the logical 1 and 0 levels.  
The Eye Aperture is adjustable and defaults to 20% of the NRZ bit time.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
For best measurement results:  
H
Perform a Dark Level compensation before taking this measurement. See To Perform  
Dark-Level and Gain User Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See To Optimize the  
Vertical Resolution on page B-69.  
B-40  
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Appendix B: Automatic Measurements Reference  
Table B-7: NRZ Measurements - Amplitude (cont.)  
Name Definition  
NRZ Extinction Ratio  
(dB)  
The ratio of the average power levels of the logic 1 level (High) to the logic 0 level (Low) of an  
optical NRZ signal, expressed in decibels (dB). All level determinations are made within the  
NRZ Eye Aperture.  
High  
NRZ ExtRatio [dB] = 10 × logᏋ Ꮠ  
Low  
Where High and Low are the logical 1 and 0 levels. See RZ Eye Aperture Parameters  
on B-62.  
The Eye Aperture is adjustable and defaults to 20% of the NRZ bit time. See NRZ Eye-Aperture  
Parameters on page B-65.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.  
This measurement requires the use of a waveform database. When this measurement is turned  
or, it will automatically set the measurement system to use a waveform database if available.  
See Use a Waveform Database on page B-70.  
For best measurement results:  
H
Perform a Dark Level compensation before taking this measurement. See To Perform  
Dark-Level and User Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See How to Optimize the  
Vertical Resolution on page B-70.  
NRZ Eye Height  
A measure of how noise affects the vertical opening between the High and Low levels of an  
NRZ eye. The NRZ eye is sampled within the Eye Aperture, where the High and Low levels are  
determined as the mean of the histogram of the data distribution in the upper and lower half of  
the eye, respectively. The noise levels are characterized by σhigh and σlow, the standard  
deviations from the mean for the High and Low levels.  
NRZ Eye Height = (High 3 * σhigh) (Low + 3 * σlow)  
Where High and Low are the logical 1 and 0 levels, and σhigh and σlow are the standard  
deviations.  
The Eye Aperture is adjustable and defaults to 20% of the NRZ bit time. See RZ Eye Aperture  
Parameters on B-62.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
For best results with this measurement:  
H
Perform a Dark Level compensation before taking this measurement if the source of the  
measured waveform is an optical channel. See To Perform Dark-Level and User  
Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See To Optimize the  
Vertical Resolution on page B-69.  
B-41  
CSA8000B & TDS8000B User Manual  
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Appendix B: Automatic Measurements Reference  
Table B-7: NRZ Measurements - Amplitude (cont.)  
Name  
Definition  
NRZ Gain  
The amplitude gain between two waveforms. The measurement returns the ratio between the  
amplitudes measured within the Eye Aperture of each of the waveforms.  
Ampl2  
NRZ Gain =  
Ampl1  
Where Ampl1 and Ampl2 are the amplitudes of the two source waveforms. See NRZ  
Amplitude on page B-37.  
The Eye Aperture is adjustable and defaults to 20% of the NRZ bit time. See RZ Eye Aperture  
Parameters on B-62.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.  
When this measurement is turned on, it will automatically set the measurement system to use a  
waveform database if available. See Use a Waveform Database on page B-70.  
For best results with this measurement:  
H
Perform a Dark Level compensation before taking this measurement if the source of the  
measured waveform is an optical channel. See To Perform Dark-Level and User  
Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See How to Optimize the  
Vertical Resolution on page B-70.  
NRZ High  
The logical 1 of the NRZ signal. The data within the Eye Aperture is sampled, a histogram is  
built from the upper half of the NRZ eye, and the mean of the histogram yields the High level.  
The Eye Aperture is adjustable and defaults to 20% of the NRZ bit time.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
When this measurement is turned on, it will automatically set the measurement system to use a  
waveform database if available.  
For best results with this measurement:  
H
Perform a Dark Level compensation before taking this measurement if the source of the  
measured waveform is an optical channel. See To Perform Dark-Level and User  
Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See To Optimize the  
Vertical Resolution on page B-69.  
B-42  
CSA8000B & TDS8000B User Manual  
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Appendix B: Automatic Measurements Reference  
Table B-7: NRZ Measurements - Amplitude (cont.)  
Name Definition  
NRZ Low  
The logical 0 of the NRZ signal. The data within the Eye Aperture is sampled, a histogram is  
built from the lower half of the NRZ eye, and the mean of the histogram yields the Low level.  
The Eye Aperture is adjustable and defaults to 20% of the NRZ bit time. See RZ Eye Aperture  
Parameters on B-62.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.  
When this measurement is turned on, it will automatically set the measurement system to use a  
waveform database if available. See Use a Waveform Database on page B-70.  
For best results with this measurement:  
H
Perform a Dark Level compensation before taking this measurement if the source of the  
measured waveform is an optical channel. See To Perform Dark-Level and User  
Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See How to Optimize the  
Vertical Resolution on page B-70.  
NRZ Max  
The maximum vertical value of the waveform that is sampled within the measurement region.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
When this measurement is turned on, it will automatically set the measurement system to use a  
waveform database if available.  
For best results with this measurement:  
H
Perform a Dark Level compensation before taking this measurement if the source of the  
measured waveform is an optical channel. See To Perform Dark-Level and User  
Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See To Optimize the  
Vertical Resolution on page B-69.  
NRZ Mean  
The arithmetic mean of the selected waveform within the measurement region. See Defining  
and displaying waveforms on page 3-56.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
When this measurement is turned on, it will automatically set the measurement system to use a  
waveform database if available.  
For best results with this measurement:  
H
Perform a Dark Level compensation before taking this measurement if the source of the  
measured waveform is an optical channel. See To Perform Dark-Level and User  
Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See To Optimize the  
Vertical Resolution on page B-69.  
B-43  
CSA8000B & TDS8000B User Manual  
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Appendix B: Automatic Measurements Reference  
Table B-7: NRZ Measurements - Amplitude (cont.)  
Name  
Definition  
NRZ Mid  
The middle level between the Max and Min vertical values of the selected waveform within the  
measurement region.  
(Max + Min)  
NRZ Mid =  
2
Where Max and Min are the maximum and minimum measurements.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.  
When this measurement is turned on, it will automatically set the measurement system to use a  
waveform database if available. See Use a Waveform Database on page B-70.  
For best results with this measurement:  
H
Perform a Dark Level compensation before taking this measurement if the source of the  
measured waveform is an optical channel. See To Perform Dark-Level and User  
Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See How to Optimize the  
Vertical Resolution on page B-70.  
NRZ Min  
The minimum vertical value of the selected waveform the measurement region.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
When this measurement is turned on, it will automatically set the measurement system to use a  
waveform database if available.  
For best results with this measurement:  
H
Perform a Dark Level compensation before taking this measurement if the source of the  
measured waveform is an optical channel. See To Perform Dark-Level and User  
Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See To Optimize the  
Vertical Resolution on page B-69.  
B-44  
CSA8000B & TDS8000B User Manual  
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Appendix B: Automatic Measurements Reference  
Table B-7: NRZ Measurements - Amplitude (cont.)  
Name Definition  
NRZ +Overshoot  
The ratio of the maximum value of the measured signal to its amplitude, expressed as a  
percentage. The waveform is scanned for the maximum value within the measurement region,  
while the amplitude is measured in the Eye Aperture.  
(Max High)  
NRZ + Overshoot = 100 ×  
(High Low)  
Where Max is the signal maximum, and High and Low are the logical 1 and 0 levels. See  
NRZ Eye-Aperture Parameters on page B-65.  
The Eye Aperture is adjustable and defaults to 20% of the NRZ bit time. See RZ Eye Aperture  
Parameters on B-62.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.  
When this measurement is turned on, it will automatically set the measurement system to use a  
waveform database if available. See Use a Waveform Database on page B-70.  
For best results with this measurement:  
H
Perform a Dark Level compensation before taking this measurement if the source of the  
measured waveform is an optical channel. See To Perform Dark-Level and User  
Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See How to Optimize the  
Vertical Resolution on page B-70.  
NRZ -Overshoot  
The ratio of the minimum value of the measured signal to its amplitude, expressed as a  
percentage. The waveform is scanned for the minimum value within the measurement region,  
while the amplitude is measured in the Eye Aperture.  
(Low Min)  
NRZ Overshoot = 100 ×  
(High Low)  
Where Min is the signal minimum, and High and Low are the logical 1 and 0 levels.  
The Eye Aperture is adjustable and defaults to 20% of the NRZ bit time.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
When this measurement is turned on, it will automatically set the measurement system to use a  
waveform database if available.  
For best results with this measurement:  
H
Perform a Dark Level compensation before taking this measurement if the source of the  
measured waveform is an optical channel. See To Perform Dark-Level and User  
Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See To Optimize the  
Vertical Resolution on page B-69.  
B-45  
CSA8000B & TDS8000B User Manual  
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Appendix B: Automatic Measurements Reference  
Table B-7: NRZ Measurements - Amplitude (cont.)  
Name  
Definition  
NRZ Optical Modulation An approximation defined as the difference of the logical power 1 and 0 determined in a vertical  
Amplitude  
slice through the eye crossing. The levels are determined as the means of the histograms of the  
vertical data slice through the High (logical 1) and Low (logical 0) levels.  
NRZ OMA [watts] = P1 P0  
Where:  
H
P1 and P0 are the average power levels of the logical 1 and 0, determined at the eye  
crossing.  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database. If a  
waveform database is not available, no valid measurement results will be produced. See Use a  
Waveform Database on page B-70.  
NRZ Peak-to-Peak  
The difference between the Max and Min vertical values of the selected waveform within the  
measurement region. See Defining and displaying waveforms on page 3-56.  
NRZ Peak-to-Peak = Max Min  
Where Max and Min are the maximum and minimum measurements.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.  
When this measurement is turned on, it will automatically set the measurement system to use a  
waveform database if available. See Use a Waveform Database on page B-70.  
For best results with this measurement:  
H
Perform a Dark Level compensation before taking this measurement if the source of the  
measured waveform is an optical channel. See To Perform Dark-Level and User  
Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See How to Optimize the  
Vertical Resolution on page B-70.  
B-46  
CSA8000B & TDS8000B User Manual  
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Appendix B: Automatic Measurements Reference  
Table B-7: NRZ Measurements - Amplitude (cont.)  
Name Definition  
NRZ Peak-to-Peak Noise The maximum range of the amplitude variance sampled within a fixed width vertical slice  
located at the center of the Eye Aperture at the High or Low levels. See RZ Eye Aperture  
Parameters on B-62.  
PkPk noise = Highpp or PkPk noise = Lowpp  
The Eye Aperture is adjustable and defaults to 20% of the NRZ bit time. The High or Low  
selection for Noise At control in the Measurement Setup dialog instructs the measurement to be  
performed on the logical 1 or 0 levels. See To Localize a Measurement on page 3-83.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
For best results with this measurement:  
H
Perform a Dark Level compensation before taking this measurement if the source of the  
measured waveform is an optical channel. See To Perform Dark-Level and User  
Wavelength Gain Compensations on page 3-98.  
H
Perform Autoset or otherwise optimize the vertical resolution before this measurement, i.e.  
increase the overall vertical size of the waveform (but without producing off-screen  
waveform points). See To Optimize the Vertical Resolution on page B-69.  
B-47  
CSA8000B & TDS8000B User Manual  
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Appendix B: Automatic Measurements Reference  
Table B-7: NRZ Measurements - Amplitude (cont.)  
Name  
Definition  
NRZ Q Factor  
NRZ Q Factor is a figure of merit of an eye diagram, reporting the ratio between the amplitude  
of the NRZ eye to the total RMS noise on the High and Low levels. The NRZ eye is sampled  
within the Eye Aperture, where the High and Low levels are determined as the mean of the  
histogram of the data distribution in the upper and lower half of the eye, respectively. The noise  
levels are characterized by σhigh and σlow, the standard deviations from the mean for the High  
and Low levels.  
(High Low)  
NRZ Q Factor =  
(σhigh + σlow)  
Where High and Low are the logical 1 and 0 levels, and σhigh and σlow are the standard  
deviations. See RZ Eye Aperture Parameters on B-62.  
The Eye Aperture is adjustable and defaults to 20% of the NRZ bit time.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
See Use a Waveform Database on page B-70.  
For best results with this measurement:  
H
Perform a Dark Level compensation before taking this measurement if the source of the  
measured waveform is an optical channel. See To Perform Dark-Level and User  
Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See How to Optimize the  
Vertical Resolution on page B-70.  
NRZ RMS  
The true root mean square amplitude of the selected waveform within the measurement region.  
See Defining and displaying waveforms on page 3-56.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
When this measurement is turned on, it will automatically set the measurement system to use a  
waveform database if available.  
For best results with this measurement:  
H
Perform a Dark Level compensation before taking this measurement if the source of the  
measured waveform is an optical channel. See To Perform Dark-Level and User  
Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See To Optimize the  
Vertical Resolution on page B-69.  
B-48  
CSA8000B & TDS8000B User Manual  
Download from Www.Somanuals.com. All Manuals Search And Download.  
Appendix B: Automatic Measurements Reference  
Table B-7: NRZ Measurements - Amplitude (cont.)  
Name Definition  
NRZ RMS Noise  
One standard deviation of the amplitude variance sampled within a fixed width vertical slice  
located at the center of the Eye Aperture at the High (logical 1) or Low (logical 0) levels.  
RMS noise = Highσ or RMS noise = Lowσ  
The Eye Aperture is adjustable and defaults to 20% of the NRZ bit time. The High or Low  
selection for Noise At control in the Measurement Setup dialog instructs the measurement to be  
performed on the logical 1 or 0 levels. See RZ Eye Aperture Parameters on B-62.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
See Use a Waveform Database on page B-70.  
For best results with this measurement:  
H
Perform a Dark Level compensation before taking this measurement if the source of the  
measured waveform is an optical channel. See To Perform Dark-Level and User  
Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See How to Optimize the  
Vertical Resolution on page B-70.  
NRZ Signal-to-Noise  
Ratio  
NRZ Signal-to-Noise is the ratio of the NRZ eye amplitude to the noise on either the High  
(logical 1) or Low (logical 0) level. The data within the Eye Aperture is sampled, and the mean  
of the histogram yields the High and Low levels. The noise is defined as one standard deviation  
of the distribution within a fixed width vertical slice located at the center of the Eye Aperture.  
(High Low)  
Highσ  
(High Low)  
Lowσ  
SN Ratio =  
or  
SN Ratio =  
Where High and Low are the logical 1 and 0 levels. See RZ Eye Aperture Parameters  
on B-62.  
The Eye Aperture is adjustable and defaults to 20% of the NRZ bit time. The High or Low  
selection for Noise At control in the Measurement Setup dialog specifies that the measurement  
be performed on the logical 1 or 0 levels. See To Localize a Measurement on page 3-83.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
See Use a Waveform Database on page B-70.  
For best results with this measurement, perform a Dark Level compensation before taking this  
measurement if the source of the measured waveform is an optical channel. See To Perform  
Dark-Level and User Wavelength Gain Compensations on page 3-98.  
B-49  
CSA8000B & TDS8000B User Manual  
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Appendix B: Automatic Measurements Reference  
Non-Return-to-Zero (NRZ) Measurements - Timing  
Table B--8 topic describes each NRZ measurement in the timing category. See  
Table B--7 on page B--37 for amplitude category measurements.; see Table B--9  
on page B--55 for area category measurements.  
Table B-8: NRZ Measurements - Timing  
Name  
Definition  
NRZ Bit Rate  
The inverse of the time interval between two consecutive eye-crossing points. In other words, it  
is the reciprocal of the Bit Time.  
1
NRZ Bit Rate =  
(Tcross2 Tcross1)  
Where Tcross2 and Tcross1 are the mean of the histogram of the two consecutive eye  
crossings. See NRZ Crossings on page B-64.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
See Use a Waveform Database on page B-70.  
NRZ Bit Time  
NRZ Bit Time is measured as the time interval between two consecutive eye-crossing points.  
NRZ Bit Time = Tcross2 Tcross1  
Where Tcross2 and Tcross1 are the mean of the histogram of the two consecutive eye  
crossings.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
NRZ Crossing Time  
The horizontal position of the eye crossing. Data is sampled on a horizontal slice at the eye  
crossing, and the mean of the horizontal histogram returns the crossing time.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
B-50  
CSA8000B & TDS8000B User Manual  
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Appendix B: Automatic Measurements Reference  
Table B-8: NRZ Measurements - Timing (cont.)  
Name Definition  
NRZ Delay  
The time interval between the crossings of the mid-reference levels on the two sources of the  
measurement.  
NRZ Delay = Tcross(source1) Tcross(source2)  
Where Tcross is the positive or negative crossing time at mid-reference level.  
The mid-reference level is adjustable and defaults to 50% of the NRZ eye amplitude. See NRZ  
Crossings on page B-64.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.  
By default, for each source, the algorithm searches forward from the Start Gate, but the  
Direction of traversal can be reversed, so that the search will be backward from the Stop Gate.  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
NRZ Duty Cycle  
Distortion  
The ratio of the time interval between the points where the rising and the falling edges cross the  
mid-reference level and the NRZ bit time.  
(Trise Tfall)  
(Tcross2 Tcross1)  
NRZ Duty Cycle Distortion = fabsᏋ  
Where Tcross1 and Tcross2 are the mean of the histogram of the two consecutive eye  
crossings, and Trise and Tfall and the time points where the rising and falling edges cross  
the mid-reference level. See NRZ Crossings on page B-64.  
The mid-reference level is adjustable and defaults to 50% of the NRZ eye amplitude.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
See Use a Waveform Database on page B-70.  
NRZ Eye Width  
The 3σ guarded delta between two consecutive eye crossings.  
Eye Width = (Tcross2 3 * Tcross2σ) (Tcross1 + 3 * Tcross1σ)  
where Tcross1 and Tcross2 are the mean of the histogram of the two crossings.  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
B-51  
CSA8000B & TDS8000B User Manual  
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Appendix B: Automatic Measurements Reference  
Table B-8: NRZ Measurements - Timing (cont.)  
Name  
Definition  
NRZ Fall Time  
NRZ Fall Time characterizes the negative slope of the NRZ eye by computing the time interval  
between the mean crossings of the high reference level and the low reference level.  
RZ Fall Time = TcrossL - TcrossH  
Where TcrossL is the mean of the histogram of the crossing of the low reference level, and  
TcrossH is the mean of the histogram of the crossing of the high reference level. See NRZ  
Measurement Reference Levels on page B-63.  
The adjustable low reference and high reference levels default to 10% and 90% of the NRZ eye  
amplitude.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
See Use a Waveform Database on page B-70.  
NRZ Frequency  
NRZ Frequency is defined as half of the inverse of the time interval between two consecutive  
eye crossing points (i.e. the reciprocal of the Period). It would be the frequency of a digital  
signal of a 0-1-0-1stream.  
1
NRZ Frequency =  
(2 × (Tcross2 Tcross1))  
Where Tcross1 and Tcross2 are the mean of the histogram of the two crossings. See NRZ  
Crossings on page B-64.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
NRZ Period  
NRZ Period is twice the time interval between two consecutive eye-crossing points. It would be  
the period of a digital signal of a 0-1-0-1stream.  
NRZ Period = 2 * (Tcross2 Tcross1)  
Where Tcross1 and Tcross2 are the mean of the histogram of the two crossings of the eye  
diagram.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
B-52  
CSA8000B & TDS8000B User Manual  
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Appendix B: Automatic Measurements Reference  
Table B-8: NRZ Measurements - Timing (cont.)  
Name Definition  
Phase =  
NRZ Phase  
Tcross1 of source2 Tcross1 of source1  
Tcross3 of source1 Tcross1 of source1  
360  
Where:  
H
H
Tcross1 of source1 is the time of the first crossing of either polarity on source 1.  
Tcross3 of source1 is the time of next crossing on source 1of the same polarity as  
Tcross1.  
H
H
Tcross1 of source2 is the time of the first crossing of either polarity on source 2 after  
Tcross1 of source1.  
All Tcrossings are at the mid-reference level, which is adjustable and defaults to 50%  
of the NRZ eye amplitude. See NRZ Crossings on page B-64.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
See Use a Waveform Database on page B-70.  
NRZ Pk-Pk Jitter  
The delta between the minimum and maximum of time crossings, with the mean of the  
histogram being Tcross.  
Pk-PK Jitter = Tcrosspp  
The Jitter At control in the Measurement Setup dialog specifies whether the jitter is to be  
measured at the eye cross or at the mid-reference level. See To Localize a Measurement on  
page 3-83.  
The mid-reference level is adjustable and defaults to 50% of the eye amplitude.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
B-53  
CSA8000B & TDS8000B User Manual  
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Appendix B: Automatic Measurements Reference  
Table B-8: NRZ Measurements - Timing (cont.)  
Name  
Definition  
NRZ Rise Time  
Computes the time interval between the mean crossings of the low reference level and the high  
reference level to characterize the positive slope of the eye.  
NRZ Rise Time = TcrossH - HcrossL  
Where TcrossH is the mean of the histogram of the crossing of the high reference level,  
and TcrossL is the mean of the histogram of the crossing of the low reference level.  
The adjustable High and Low reference levels default to 10% and 90% of the NRZ eye  
amplitude. See NRZ Measurement Reference Levels on page B-63.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
See Use a Waveform Database on page B-70.  
NRZ RMS Jitter  
Jitter is the measure of time variance on the rising and falling edges at the NRZ eye crossing or  
at the mid-reference level. RMS Jitter is defined as one standard deviation (σ) of that variance.  
The mean of the histogram of the crossing data distribution is Tcross.  
RMS Jitter = Tcrossσ  
The Jitter At control in the Measurement Setup dialog specifies if the jitter is to be measured at  
the eye cross or at the mid-reference level. The mid-reference level is adjustable and defaults to  
50% of the eye amplitude. See To Localize a Measurement on page 3-83.  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2).  
This measurement requires the use of a waveform database. When this measurement is turned  
on, it will automatically set the measurement system to use a waveform database if available.  
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Appendix B: Automatic Measurements Reference  
Non-Return-to-Zero (NRZ) Measurements - Area  
Table B--9 topic describes each NRZ measurement in the area category. See  
Table B--7 on page B--37 for amplitude category measurements.; see Table B--8  
on page B--50 for timing category measurements.  
Table B-9: NRZ Measurements - Area  
Name  
Definition  
NRZ Area  
The area under the curve for the NRZ waveform within the measurement region. Area  
measured above ground is positive; area measured below ground is negative.  
over the measurement region.  
NRZ Area = waveform(t) dt,  
If enabled, measurement gates constrain the measurement region to the area between the Start  
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.  
When this measurement is turned on, it will automatically set the measurement system to use a  
waveform database if available. See Use a Waveform Database on page B-70.  
For best results with this measurement:  
H
Perform a Dark Level compensation before taking this measurement if the source of the  
measured waveform is an optical channel. See To Perform Dark-Level and User  
Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See To Optimize the  
Vertical Resolution on page B-69.  
NRZ Cycle Area  
The area under the curve for the first NRZ bit time within the measurement region. Area  
measured above ground is positive; area measured below ground is negative.  
over the first NRZ bit within the measurement region.  
NRZ Area = waveform(t) dt,  
When this measurement is turned on, it will automatically set the measurement system to use a  
waveform database if available.  
For best results with this measurement:  
H
Perform a Dark Level compensation before taking this measurement if the source of the  
measured waveform is an optical channel. See To Perform Dark-Level and User  
Wavelength Gain Compensations on page 3-98.  
H
Optimize the vertical resolution before taking this measurement. See To Optimize the  
Vertical Resolution on page B-69.  
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Measurement Reference Parameters and Methods  
This reference topic describes the reference parameters (levels and crossings)  
used in taking the measurements.  
All Sources  
Reference-Level  
Calculation Methods  
The methods available for calculating reference levels used in taking automatic  
measurement follow. The methods are shown using a pulse, but they also apply  
to RZ and NRZ waveforms.  
Reference level calculation methods  
High (50 mV)  
High reference  
90%  
50%  
10 mV  
50 mV  
90 mV  
50 mV  
40 mV  
0 mV  
Mid reference (0 mV)  
- 4 0 m V  
10%  
90 mV  
10 mV  
Low reference  
Low (-50 mV)  
1. Relative Reference is calculated as percentage of the High/Low range.  
2. High Delta Reference is calculated as the absolute values from the High Level.  
3. Low Delta Reference is calculated as absolute values from the Low Level.  
4. Absolute Reference is set by absolute values in user units.  
5. AOP (not shown) measures the Average Optical Power of the waveform and uses it  
as the Mid Ref level. See Pulse Crossings and Mid-reference Level AOP on page  
B-58 for more information.  
Figure B-1: Reference-level calculation methods  
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Measurement Reference Parameters and Methods  
Pulse Sources  
The automatic measurement system uses the following levels when measuring  
Pulse source waveforms. For the Pulse measurements, and their definitions that  
use the levels described here, see page B--2.  
Pulse Measurement  
Reference Levels  
High  
TcrossH  
High reference  
Low reference  
TcrossL  
Low  
Figure B-2: Pulse-reference levels  
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Measurement Reference Parameters and Methods  
Pulse Crossings and  
Mid-reference Level  
Mid-reference  
Tcross1  
Tcross2  
Tcross3  
Figure B-3: Pulse crossings and mid-reference level  
Pulse Crossings and  
Mid-reference Level (AOP)  
The following measurement parameters are normally used when measuring  
Optical Modulation Amplitude on a pulse. Crossings at the measured Average  
Optical Power level determine the positions of the eye apertures for the logical 1  
and logical 0 of the pulse (size set in the measurement Region control). The  
High, Power Logic 1, and Low, Power Logic 0 levels are determined as the mean  
values of the logical levels sampled within the eye aperture of the logical 1 and 0  
regions of the pulse.  
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Measurement Reference Parameters and Methods  
Eye aperature  
Power logic 1  
Average optical power  
Tcross3  
Tcross1 Tcross2  
Power logic 0  
Figure B-4: AOP pulse crossings and mid-reference level  
Overshoot Levels  
Max  
High  
Low  
Figure B-5: Overshoot levels  
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Measurement Reference Parameters and Methods  
RZ Sources  
The automatic measurement system uses the following levels when measuring  
RZ source waveforms. For the RZ measurements, and their definitions that use  
the levels described here, see page B--15.  
RZ Measurement  
Reference Levels  
The following levels are used when deriving measurements on RZ waveforms.  
TcrossH  
High reference  
TcrossL  
Low reference  
Figure B-6: RZ measurement reference levels  
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Measurement Reference Parameters and Methods  
RZ Crossings  
The following measurement parameters are used when deriving RZ measure-  
ments.  
Mid reference  
Tcross1  
Tcross3  
Tcross2  
Figure B-7: RZ crossings  
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Measurement Reference Parameters and Methods  
RZ Eye-Aperture  
Parameters  
The following parameters are used when deriving measurements on RZ  
waveforms.  
Eye aperture  
High  
Mid  
reference  
High reference  
Low reference  
Low  
Figure B-8: RZ eye-aperture parameters  
NRZ Sources  
The automatic measurement system uses the following levels when measuring  
NRZ source waveforms. For the NRZ measurements, and their definitions that  
use the levels described here, see page B--37.  
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Measurement Reference Parameters and Methods  
NRZ Measurement  
Reference Levels  
The following levels are used when deriving measurements on NRZ waveforms.  
High  
TcrossH  
High reference  
Low reference  
Low  
TcrossL  
Figure B-9: NRZ measurement reference levels  
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Measurement Reference Parameters and Methods  
NRZ Crossings  
The following measurement parameters are used when deriving NRZ measure-  
ments.  
Tcross  
Cross level  
Figure B-10: NRZ crossings  
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Measurement Reference Parameters and Methods  
NRZ Eye-Aperture  
Parameters  
The following parameters are used when deriving measurements on NRZ  
waveforms.  
High  
Eye aperture  
Low  
Figure B-11: NRZ eye-aperture parameters  
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Measurement Reference Parameters and Methods  
NRZ Overshoot Levels  
The following measurement parameters are used when deriving overshoot  
measurements on NRZ waveforms.  
Max  
High  
Low  
Figure B-12: NRZ overshoot levels  
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Measurement Reference Parameters and Methods  
NRZ Crossings (OMA)  
The following measurement parameters are used when approximating Optical  
Modulation Amplitude (OMA) on NRZ waveforms. As shown, OMA on NRZ  
waveforms is determined from the means of histograms of the data from level 1  
and level 0, taken on a vertical slice through the NRZ eye crossing. This method  
gives an approximation of Optical Modulation Amplitude of an NRZ waveform;  
Optical Modulations Amplitude measurements are primarily defined for Pulse  
signals.  
Vertical slice  
P1 (histogram at logic high)  
P1 (histogram at logic low)  
Figure B-13: NRZ Crossings (OMA)  
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Measurement Reference Parameters and Methods  
Tracking Methods  
This topic describes measurements methods tracking the High and Low values  
used in taking automatic measurements.  
The levels that the automatic measurement system derives as the High (Top) or  
Low (Bottom) for a waveform influence the fidelity of amplitude and aberration  
measurements. For many of the automatic measurements supported, the  
instrument automatically determines these levels and disables all or some of the  
High/Low tracking method controls (for example, for RMS). If the measurement  
you select has High/Low methods that are appropriate to adjust (or example,  
RISE time), the instrument automatically enables the method controls for your  
adjustment. The methods available are shown below:  
Mean (of Histogram) sets the values statistically. Using a histogram, it selects the mean or  
average value derived using all values either above or below the midpoint (depending on  
whether it is defining the high or low reference level). This setting is best for examining eye  
patterns and optical signals.  
Mean Tracking Method  
High  
Mid  
ref  
Low  
Min-max uses the highest and lowest values of the waveform record. This setting is best for  
examining waveforms that have no large, flat portions at a common value, such as sine waves  
and triangle waves - almost any waveform except for pulses.  
Min/Max Tracking Method  
High (Max)  
Mid ref  
Low (Min)  
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Measurement Reference Parameters and Methods  
Mode (of Histogram) sets the values statistically. Using a histogram, it selects the most common  
value either above or below the midpoint (depending on whether it is defining the high or low  
reference level). Since this statistical approach ignores short-term aberrations (overshoot,  
ringing, and so on), Mode is the best setting for examining pulses.  
Mode Tracking Method  
High  
Histogram high  
Mid  
ref  
Histogram low  
Low  
Auto switches between methods. Auto method first attempts to calculate the high and low  
values using the Mode method. Then, if the histogram does not show obvious consistent high  
and low levels, Auto method automatically switches to the Min/Max or Mean method.  
Mean Tracking Method  
Min/Max Tracking Method  
For example, the Mode histogram operating on a triangle wave would not find consistent high  
and low levels, so the instrument would switch to the Min/Max mode. Consistent high and low  
levels would be found on a square wave, so the Auto mode would use the Mode method.  
Mode Tracking Method  
Mid-reference Level  
The mid-reference level (adjustable from the Meas Setup dialog box) defaults to  
50% of the pulse amplitude. If measurement gates are enabled, the measurement  
region is the area between the Start Gate (G1) and Stop Gate (G2). By default,  
the algorithm searches forward from the Start Gate for the first rising edge, but  
the direction can be reversed from Meas. Setup dialog box, so that the search  
will be backward from the Stop Gate. See To Localize a Measurement on  
page 3--83.  
To Optimize the Vertical Resolution  
Optimizing vertical resolution improves the result this measurement produces.  
Try these methods:  
H
H
Execute Autoset (push AUTOSET on the front-panel).  
Adjust vertical scale (or increase input amplitude) to increase the overall  
vertical size of the waveform, while keeping the waveform on screen.  
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Measurement Reference Parameters and Methods  
Use a Waveform Database  
This measurement needs to be performed using a statistical (waveform) database.  
When one is specified, the instrument acquires or computes the targeted  
measurement source, then accumulates it into in the waveform database, and  
then takes the measurement on the database data. When you select the RZ or  
NRZ signal type, the instrument attempts to automatically allocate one of the  
four waveform databases it provides to your measurement source.  
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Glossary  
Accuracy  
The closeness of the indicated value to the true value.  
Acquisition  
The process of sampling signals from input channels, digitizing the samples  
into data points, and assembling the data points into a waveform record. The  
waveform record is stored in memory. The trigger marks time zero in that  
process.  
Active cursor  
The cursor that moves when you turn the general purpose knob. It is  
represented in the display by a solid line.  
Active (or Selected) view  
The view in multiple view displays that is currently targeted for adjustment  
by the horizontal controls. The front-panel button of the active view is  
always lit amber.  
Aliasing  
A false representation of a signal due to insufficient sampling of high  
frequencies or fast transitions. A condition that occurs when a sampling  
instrument digitizes at an effective sampling rate that is too slow to  
reproduce the input signal. The waveform displayed on screen may have a  
lower frequency than the actual input signal.  
Annotations  
Lines displayed on screen to indicate measurement reference levels and  
points that an automatic measurement is using to derive the measurement  
value.  
Attenuation  
The degree the amplitude of a signal is reduced when it passes through an  
attenuating device such as a probe or an external attenuator. That is, the ratio  
of the input measure to the output measure. For example, a 10X attenuator  
will attenuate, or reduce, the input voltage of a signal by a factor of 10.  
Automatic measurement  
An automatic measurement of a parameter and its numeric readout that the  
instrument takes and updates directly from a channel, math, or reference  
waveform in real time, without operator intervention.  
Automatic trigger mode  
A trigger mode that causes the instrument to automatically acquire if  
triggerable events are not detected within a specified time period.  
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Glossary  
Autoset  
A function of the instrument that attempts to automatically produce a stable  
waveform of usable size. Autoset sets up the acquisition controls based on the  
characteristics of the selected waveform. A successful autoset will produce a  
coherent and stable waveform display.  
Average acquisition mode  
In this mode, the instrument displays and updates a waveform that is the  
averaged result of several waveform acquisitions. Averaging reduces the  
apparent noise. The instrument acquires data as in sample mode and then  
averages it a user-specified number of averages.  
Average Optical Power (AOP)  
The time averaged measurement of the optical power over a much longer  
time period than the bit rate of the signal.  
Bandwidth  
The highest frequency signal the instrument can acquire with no more than  
3 dB (× .707) attenuation of the original (reference) signal.  
BER  
An acronym for Bit Error Ratio (or Rate). The principal measure of quality  
of a digital transmission system. BER is defined as:  
BER = Number of Errors/Total Number of Bits  
BER is usually expressed as a negative exponent. For example, a BER of  
10-7 means that 1 bit out of 107 bits is in error.  
BER floor  
A limiting of the bit-error-ratio in a digital system as a function of received  
power due to the presence of signal degradation mechanisms or noise.  
Bit error  
An incorrect bit. Also known as a coding violation.  
Channel  
An input that connects a signal or attaches a network or transmission line to  
sampling modules for acquisition of channel waveforms by the instrument.  
Channel/Probe deskew  
A relative time delay that is settable for a channel. Setting deskew lets you  
align signals to compensate for signals that may come in from cables of  
differing length.  
Channel icon  
The indicator on the left side of the display that points to the position around  
which the waveform contracts or expands when vertical scale is changed.  
This position is ground when offset is set to 0 V; otherwise, it is ground plus  
offset.  
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Glossary  
Channel number  
The number assigned to a specific signal input channel of an installed  
sampling module. Assignment of channel numbers is described in Maximum  
Configuration on page 1--11.  
Channel waveforms  
Waveforms resulting from signals input into sampling-module channels and  
digitized and acquired by the instrument. See Live Waveforms.  
Control knob  
see Knob  
Coupling  
The association of two or more circuits or systems in such a way that power  
or information can be transferred from one to the other. This instrument  
supports direct coupling only at its inputs; the user must provide any  
alternate coupling (ac, frequency filtering) externally.  
Cursors  
Any of three styles of paired markers that you can use to make measurements  
between two waveform locations. The instrument displays the values (expressed  
in vertical or horizontal units) of the position of each cursor and the distance  
between the two cursors.  
Delay time  
See Horizontal Delay.  
Digitizing  
The process of converting a continuous analog signal such as a waveform to a  
set of discrete numbers representing the amplitude of the signal at specific  
points in time. Digitizing is composed of two steps: sampling and quantizing.  
Display system  
The part of the instrument that displays the three graticules, one each for the  
Main, Mag1, and Mag2 time bases, the waveforms, and other display related  
elements (waveform labels, cursors, test masks, measurement annotations,  
etc.).  
Dragging  
The act of changing your selection either by clicking (mouse) or touching  
(touchscreen) a point on the screen and pulling across the screen while  
holding down the key (mouse) or maintaining contact with your finger  
(touchscreen).  
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Glossary  
Error detection  
Checking for errors in data transmission. A calculation is made on the data  
being sent and the results are sent along with it. The receiving station then  
performs the same calculation and compares its results with those sent. Each  
data signal conforms to specific rules of construction so that departures from  
this construction in the received signals can be detected. Any data detected  
as being in error is either deleted from the data delivered to the destination,  
with or without an indication that such deletion has taken place, or delivered  
to the destination together with an indication that it is in error.  
Error rate  
The ratio of the number of data units in error to the total number of data  
units.  
Edge trigger  
Triggering occurs when the instrument detects the source passing through a  
specified voltage level in a specified direction (the trigger slope). This  
instrument supports only edge triggering. All trigger sources must be  
external, except when using clock recovery (available as an option with  
optical sampling modules) or the internal clock.  
Envelope acquisition mode  
A mode in which the instrument acquires and displays a waveform that  
shows the variation extremes of several acquisitions.  
Equivalent-time sampling (ET)  
A sampling mode in which the instrument acquires signals over many  
repetitions of the event. This instrument uses a type of equivalent-time  
sampling called sequential equivalent-time sampling. See Sequential  
equivalent-time sampling.  
Extinction Ratio  
The ratio of two optical power levels of a digital signal generated by an  
optical source. P1 is the optical power level generated when the light source  
is high, and P2 is the power level generated when the light source is low.  
P1  
re =  
P2  
Gated measurements  
A feature that lets you limit automated measurements to a specified portion  
of the waveform. You define the area of interest using measurement gates.  
General-purpose knob  
The large front-panel knob on the upper-right corner of the front panel. You  
can use it to change the value of the control or element that currently has  
focus. It can adjust the cursors.  
GPIB (General Purpose Interface Bus)  
An interconnection bus and protocol that allows you to connect multiple  
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Glossary  
instruments in a network under the control of a controller. Also known as  
IEEE 488 bus. It transfers data with eight parallel data lines, five control  
lines, and three handshake lines.  
Graticule  
A grid on the display screen that creates the horizontal and vertical axes. You  
can use it to visually measure waveform parameters.  
Graticule labels  
Each graticule displays three labels. The upper and lower left labels indicate  
the amplitude level at each of the upper and lower boundaries of the graticule  
edges. These levels are based on the vertical scale and offset of the selected  
waveform. The lower right label is horizontal scale factor of the selected  
waveform expressed in units per division.  
High  
The value used as the 100% level in amplitude measurements, such as Peak  
and +Overshoot. See Levels Used in Taking Amplitude, Timing, and Area  
Measurements on page 3--79 for more details.  
HighRef  
The waveform high reference level, used in such measurements as fall time  
and rise time. Typically set to 90%. See Levels Used in Amplitude, Timing,  
and Area Measurements on page 3--79 for more details.  
Holdoff, trigger  
A specified amount of time after a trigger signal that elapses before the  
trigger circuit will accept another trigger signal. Trigger holdoff helps ensure  
a stable display.  
Horizontal Acquisition Window  
A common time window or range that is applied to all channels in parallel to  
determine the segment of an incoming signal that becomes the waveform  
record. Trigger and horizontal controls determine the duration of this  
window and its placement in the incoming signal.  
Horizontal bar cursors  
The two horizontal bars that you position to measure the amplitude  
parameters of a waveform. The instrument displays the value of both cursors  
with respect to ground and the amplitude value between the bars.  
Horizontal delay time  
The time between the trigger event and the acquisition of data. The time is  
set indirectly by the Horizontal reference setting and the horizontal position  
settings. See Horizontal Position and the Horizontal Reference on  
page 3--59.  
Horizontal reference point  
The point about which waveforms are expanded or contracted horizontally  
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Glossary  
when horizontal scale adjustments are made. The horizontal reference point  
remains anchored as the rest of the waveform grows or shrinks around it.  
Icon  
See Channel Icon.  
Initialize  
Setting the instrument to a completely known, default condition by pressing  
executing a Default Setup.  
Internal clock  
A trigger source that is synchronized to the internal clock, with a selectable  
repetition rate. It is most often used with TDR to synchronize the generation  
of TDR step pulses with subsequent acquisition.  
Interpolation  
The way the instrument calculates additional values to display when the  
acquired record length is less than 500 points. The instrument has three  
interpolation options: linear, sin(x)/x, or none.  
Linear interpolation calculates record points in a straight-line fit between the  
actual values acquired. Sin(x)/x computes record points in a curve fit between  
the actual values acquired. It assumes all the interpolated points fall in their  
appropriate point in time on that curve. None displays only the acquired data  
points.  
Knob  
A rotary control.  
Live Waveforms  
Waveforms that can update as the acquisition system acquires data. Channel  
waveforms are live waveforms; reference waveforms are not. Math  
waveforms are live if they contain live waveforms in their expressions:  
C1 + R1 defines a live math waveform; R1 + R2 does not.  
Low  
The value used as the 0% level in amplitude measurements, such as Peak and  
+Overshoot. See Levels Used in Taking Amplitude, Timing, and Area  
Measurements on page 3--79 for more details.  
LowRef  
The waveform low reference level. Used in fall and rise time calculations.  
Typically set to 10%. See Levels Used in Taking Amplitude, Timing, and  
Area Measurements on page 3--79 for more details.  
Math Waveform  
A waveform defined by a combination of one or more operands (channel  
waveforms, reference waveforms, and automatic measurement scalars). Math  
waveforms may also contain math operators and functions.  
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Glossary  
Measurement  
See Automatic Measurement.  
Measurement statistics  
The accumulation of a history of individual measurement readouts, showing  
the mean and standard deviation of a selected number of samples.  
Measurement updating  
The process of automatically adjusting the measurement parameters to reflect  
changes in the waveform targeted by an automatic measurement.  
MidRef  
The waveform middle reference level used in such measurements as Period  
and Duty Cycle. Typically set to 50%. See Levels Used in Taking Amplitude,  
Timing, and Area Measurements on page 3--79 for more details.  
Mid2Ref  
The middle reference level for a second waveform (or the second middle  
reference of the same waveform). Used in two waveform time measure-  
ments, such as the Delay and Phase measurements. See Levels Used in  
Taking Amplitude, Timing, and Area Measurements on page 3--79 for more  
details.  
Non--Return to Zero (NRZ)  
A waveform type for of a source to be measured.  
OMA (Optical Modulation Amplitude)  
The difference between the average power levels of the logic 1 level, High,  
and the logic 0 level, Low, of the optical pulse signal. The levels are the  
Means of the logical levels sampled within an Aperture of the logical 1 and 0  
regions of the pulse. The logical 1 and 0 time intervals are marked by the  
crossings of a reference level determined as the Average Optical Power  
(AOP) of the signal.  
Persistence  
The amount of time a data point remains displayed. There are three  
persistence modes available in the instrument: Variable, Infinite, and Color  
Grading.  
Pixel  
A visible point on the display. The instrument display is 640 pixels wide by  
480 pixels high.  
Pop-up menu  
A menu that displays when you right click an application element, such as a  
channel or its icon, a measurement or other readout. Usually provides quick  
access to settings related to the object clicked.  
Probe  
An instrument input device.  
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Glossary  
Quantizing  
The process of converting an analog input that has been sampled, such as a  
voltage, to a digital value.  
Return to Zero (RZ)  
A waveform type for of a source to be measured (see waveform types).  
Real-time sampling  
An alternate sampling mode where the instrument samples to completely fill  
a waveform record from a single trigger event. This instrument does not use  
real time sampling; it samples sequentially. See Sequential equivalent-time  
sampling on page Glossary--9.  
Record length  
The specified number of samples in a waveform.  
Reference memory  
Memory in an instrument used to store waveforms or settings. You can use  
that waveform data later for processing. The instrument saves the data even  
when the instrument is turned off or unplugged.  
Reference waveforms  
Waveforms that are static, not live (see live waveforms). Reference  
waveforms are channel or math waveforms that you save to references or to  
files in the instrument file system. Once saved, they do not update.  
Sample acquisition mode  
The instrument creates a record point by saving the first sample during each  
acquisition interval. That is the default mode of the acquisition.  
Sample interval  
The time interval between successive samples in a time base display. The  
time interval between successive samples represents equivalent time, not real  
time.  
Sampling  
The process of capturing an analog input, such as a voltage, at a discrete  
point in time and holding it constant so that it can be quantized.  
Select button  
A button that changes which of the two cursors is active.  
Selected waveform  
The waveform which is affected by vertical position and scale adjustments.  
One of the channel selector buttons lights amber to indicate the currently  
selected waveform.  
Glossary-8  
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Glossary  
Sequential equivalent-time sampling  
A type of equivalent-time sampling in which one sample is taken per  
acquisition, with each sample skewed incrementally with respect to an  
external trigger event. This instrument acquires using sequential equivalent-  
time sampling.  
Saved waveform  
A collection of sampled points that constitute a single waveform that is  
saved in any one on reference locations R1 - R8 or to the file system.  
Slope  
The direction at a point on a waveform. You can calculate the direction by  
computing the sign of the ratio of change in the vertical quantity (Y) to the  
change in the horizontal quantity. The two values are rising and falling.  
Time base  
The set of parameters that let you define the time and horizontal axis  
attributes of a waveform View. The time base determines when and how long  
to acquire record points.  
Trigger  
An event that marks time zero in the waveform record. It results in acquisi-  
tion of the waveform as specified by the time base.  
Trigger level  
The vertical level the trigger signal must cross to generate a trigger (on edge  
trigger mode).  
Uptime  
The number of hours the instrument has been powered on.  
Vertical bar cursors  
The two vertical bars you position to measure the time parameter of a  
waveform record. The instrument displays the value of both cursors with  
respect to the trigger and the time value between the bars.  
Vertical Acquisition Window  
The range of values the acquisition system can acquire. The maximum  
vertical size is set by the operating range of the sampling module installed,  
and that of any probe installed on the sampling module. For example, an  
80E00 sampling module set to its maximum 100mV/div scale yields a  
10-division vertical acquisition window of 1V.  
The vertical offset determines where in the operating range of the A/D  
converter (sampler) the signal is positioned relative to ground. Changing  
vertical position will simply change the space on the screen where the data is  
displayed.  
Glossary-9  
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Glossary  
View  
Any one of the three waveform displays the instrument provides: Main,  
Mag1, and Mag2. Each view has its own graticule and time base. The  
instrument always displays the Main view; the Mag1 and Mag2 views can be  
added and removed from the display using the View buttons on the front  
panel.  
Virtual keyboard  
A pop-up keyboard that lets you click to type characters for the control from  
which it is opened, such as in the vertical scale and offset controls found in  
the Control bar at the bottom of the display.  
Virtual keypad  
A pop-up pad that lets you enter specific numeric values for the control from  
which it is popped up.  
Waveform  
The visible representation of an input signal or combination of signals.  
Waveforms can be channel, reference, or math waveforms.  
Waveform cursors  
The cursor mode that presents two cursors you position to measure both the  
time and amplitude parameters of a waveform record. The instrument  
displays the time of both cursors with respect to the trigger and the time  
between the cursors. The instrument also displays the value of both cursors  
with respect to the waveform ground and between the cursors.  
Waveform database  
A collection of sequentially acquired waveforms.  
Waveform types  
Waveform types of the source to be measured can be Pulse, NRZ, and RZ.  
Each waveform type has a measurement category (Amplitude, Timing, or  
Area) that can be selected.  
WfmDB  
See Waveform database.  
Windows OS  
The underlying operating system on which this instrument runs.  
YT format  
The conventional display format. It shows the amplitude of a waveform  
record (on the vertical axis) as it varies over time (on the horizontal axis).  
Glossary-10  
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Index  
Automatic measurement, Glossary-1  
Automatic measurements, 3-74  
annotations, 3-74  
A
Accessories  
list, 1-41  
optional, 1-42  
standard, 1-41  
behavior with databases, 3-76  
categories for selection, 3-76  
database as source requirement/exclusion, 3-76  
databases as sources, 3-75  
dual waveform, 3-76  
Accuracy, Glossary-1  
Acquiring Waveforms, 3-3  
Acquisition, Glossary-1  
cycle, 3-29  
high/low tracking, 3-77  
methods for, 3-77  
horizontal delay, 3-28  
horizontal delay time with, Glossary-5  
how to start and stop, 3-26  
input channels and digitizers, 3-27  
modes for starting and stopping, 3-22  
overview, 3-27  
preventing aliasing, 3-23  
record, 3-28  
record length, 3-28  
sample interval, 3-28  
sampling (see Sampling), 3-27–3-29  
set Stop mode & action, 3-25  
time base, Glossary-9  
trigger point, 3-28  
how to localize (gates), 3-83  
how to take, 3-80  
independent characterization of, 3-75  
number available, 3-76  
reference level methods, 3-79  
sources available, 3-76  
statistics on, 3-75  
usage limitations, 3-76  
what’s measured, 3-74  
why use, 3-74  
Automatic Measurements Reference, B-1  
Automatic measurements reference  
All Sources, B-56  
calculation method, B-56  
Mid-reference Level, B-69  
NRZ Measurement Reference Levels, B-63  
NRZ Sources, B-62  
Pulse measurement reference levels, B-57, B-60,  
B-62  
Pulse Sources, B-57  
triggering, 3-39  
Acquisition control  
background, 3-27  
overview, 3-21  
Acquisition controls  
keys to using, 3-22  
vs. Display controls, 3-58  
why use, 3-21  
Acquisition mode  
RZ Measurement Reference Levels, B-60  
RZ Sources, B-60  
To Optimize the Vertical Resolution, B-69  
Tracking Methods, B-68  
Average, Glossary-2  
Envelope, Glossary-4  
Sample, Glossary-8  
Use a Waveform Database, B-70  
Automatic trigger mode, Glossary-1  
Autoset, 3-5, Glossary-2  
How to execute, 3-109  
how to execute, 3-11  
mask-specific, 3-142  
overview, 3-14  
Average acquisition mode, Glossary-2  
Acquisition modes  
description of, 3-22  
how to set, 3-24  
Acquisition settings, purpose, 3-21  
Active cursor, Glossary-1  
Address, Tektronix, xiii  
Aliasing, 3-23, Glossary-1  
AOP, average optical power, Glossary-2  
Annotations, Glossary-1  
Application toolbar, 3-127  
Attenuation, Glossary-1  
Attenuators, external, use of, 3-6  
Auto, trigger mode, 3-41  
B
Back up, procedure, 1-15  
Bandwidth, Glossary-2  
Index-1  
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Index  
Bar  
Controls  
initialize, Glossary-6  
knob, Glossary-6  
selected waveform, 3-7  
Controls bar, 2-7  
Coupling, Glossary-3  
CSA8000, description, 1-1  
Cursor, measurements, 3-853-87  
Cursor Measurements, how to set sources for, 3-90  
Cursor measurements  
Controls, 2-7  
Measurements, 2-7  
Menu, 2-7  
Readouts, 2-7  
Status, 2-7  
Tool, 2-7  
Waveform, 2-7  
BER, Glossary-2  
BER floor, Glossary-2  
Bit error, Glossary-2  
Brightness/Contrast adjustment, 1-15  
Button, SELECT, Glossary-8  
how to take, 3-89  
sources, 3-86  
whats measured, 3-85  
why use, 3-85  
Cursors, 3-85, Glossary-3  
constrained by the display, 3-86  
default measurement source, 3-86  
horizontal bars, Glossary-5  
measure horizontally from the trigger point, 3-87  
types, 3-86  
C
CD, instrument software, 1-3  
Certifications, for instrument, A-11  
Channel, Glossary-2  
icon, Glossary-2  
number, Glossary-3  
units and readout names, 3-88  
use with independent sources, 3-87  
vertical bars, Glossary-9  
waveform, Glossary-10  
waveforms, Glossary-3  
Channel icon, Glossary-2  
Channel-probe deskew, Glossary-2  
Channels  
what time cursors measure (illustration), 3-88  
in sampling modules, 3-27  
maximum configuration, 1-11  
shared horizontal window, 3-20  
shared parameters, illustrated, 3-20  
Cleaning, instrument, how to, 3-175  
Cleaning and inspection  
exterior, 3-175  
flat panel display, 3-176  
Cleaning optical connectors, 3-176  
Clipping, 3-6  
D
Dark-Level compensation, how to perform, 3-98  
Data, controlling input and output, 3-113  
Data Input and Output, 3-113  
Database, waveform, Glossary-10  
Databases, Waveform, 3-159  
Delay time, Glossary-3  
horizontal, Glossary-5  
Description  
Clock, internal, Glossary-6  
Clock recovery, 3-39  
trigger source, 3-42  
key features, 1-1  
product, 1-1  
Communication, remote, 3-139  
Compensation, 3-923-100  
how to perform, 3-92  
when installing/moving sampling modules, 1-10  
Configuration  
instrument, 1-9  
maximum channels available, 1-11  
software installation, 1-15  
Connectors  
Deskew, Glossary-2  
how to, 3-96  
Diagnostics  
procedure, 1-18  
system, 1-16  
Digitizing, Glossary-3  
process, defined, 3-273-29  
Display  
customizable attributes of, 3-66  
defined, 3-54  
elements of, 3-54  
flexible control, 3-55  
graticule, defined, 3-54  
DIRECT, 3-42, 3-44  
locations and purpose, 1-12  
PRESCALE, 3-42, 3-44  
Contacting Tektronix, xiii  
Index-2  
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Index  
horizontal reference, defined, 3-54  
horizontal scale readout, defined, 3-54  
how to customize, 3-69  
how to set style of, 3-68  
limit readouts, defined, 3-54  
mapMain & Mag views, 2-10  
mapMain view, 2-9  
mode  
Infinite Persistence, 3-67  
Normal, 3-67  
Variable Persistence, 3-67  
multiple views, 3-55  
preview field, defined, 3-54  
printing, 3-132  
keys to using, 3-56  
setting high color, 3-137  
system, Glossary-3  
time base views, defined, 3-54  
touchscreen, defined, 3-55  
customizing, 3-66  
ESD  
and sampling modules, 3-6  
and trigger source inputs, 3-43  
Exporting waveforms, 3-128  
Extinction ratio, Glossary-4  
F
Fiberchannel, standards supported, 3-142  
Firmware, upgrade, 1-4  
Flat panel display, cleaning, 3-176  
FrameScan Acquisition  
keys to using, 3-31  
usage limitations, 3-31  
FrameScan acquisition  
advantages, 3-30  
cycle, 3-31  
How to catch bit error, 3-36  
how works (illustrated), 3-32  
overview, 3-30  
waveform, 2-7  
why use, 3-55  
why use, 3-30  
Envelope, usage limitations, 3-31  
FrameScan Mode, How to acquire in, 3-33  
Front panel, map, 2-8  
zoom, 3-55  
Display controls  
purpose, 3-55  
vs. Acquisition controls, 3-58  
Display menu  
Dots, 3-67  
Vectors, 3-67  
Display screen, overview of, 3-53  
Display settings  
Horizontal position, 3-59  
horizontal reference, 3-59  
Displaying waveforms, 3-53  
Documentation  
Functional tests, procedure, 1-21  
G
Gamma control, 1-15  
Gated measurements, Glossary-4  
Gated Triggering, how to set, 3-50  
General purpose knob, Glossary-4  
Gigabit Ethernet, 3-142  
GPIB, Glossary-4  
online, 2-1  
online help system, 3-167  
Dots, 3-67  
Graticule, Glossary-5  
labels, Glossary-5  
one per view, 3-57  
Dots, Display menu, 3-67  
Dragging, mouse or touchscreen, Glossary-3  
H
Hardware and operating system, procedure, 1-38  
High, Glossary-5  
High frequency triggering, 3-45  
High/Low tracking, 3-77  
methods for, 3-77  
E
Edge trigger, Glossary-4  
Electrical modules, installation, 1-10  
Electrical sampling modules, specifications, where to  
find, A-1  
Envelope acquisition mode, Glossary-4  
Environmental requirements, installation, 1-9  
Equivalent time sampling, random, Glossary-4  
Error detection, Glossary-4  
HighRef, measurement level, Glossary-5  
Histograms  
continuous operation of, 3-154  
counting, 3-155  
editing features, 3-154  
in recalled setups, 3-155  
Error rate, Glossary-4  
Index-3  
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Index  
size, 3-155  
Inspection and cleaning  
exterior, 3-175  
flat panel display, 3-176  
Installation, 1-9  
supported statistics, table of, 3-158  
taking, 3-154  
to take, 3-156  
usage limitations, 3-155  
valid sources of, 3-154  
why use, 3-154  
Holdoff, triggering, 3-45  
usable limits, 3-46  
Holdoff, trigger, Glossary-5  
Bit error, to capture, 3-36  
Horizontal  
environmental requirements, 1-9  
incoming inspection procedure, 1-17  
sampling modules, 1-10  
compensation requirements, 1-10  
software installation, 1-15  
Instrument  
accessories list, 1-41  
acquisition overview, 2-6  
cleaning, 3-175  
functional model, 2-4  
installation, 1-9  
key features, 1-1  
models, 1-1  
optional accessories list, 1-42  
options list, 1-41  
Bar cursors, Glossary-5  
delay time, Glossary-5  
discussion of parameters, 3-17  
interrelation of parameters, 3-19  
position, 3-7  
scaling, 3-4  
set up procedure, 3-8  
time range (acquisition window), Glossary-5  
Horizontal Reference, usage limitations, 3-31  
Horizontal acquisition window, Glossary-5  
control set up, 3-10  
package contents, 1-7  
product description, 1-1  
standard accessories list, 1-41  
Interpolation, Glossary-6  
description of modes, 3-67  
Introduction, to this manual, xi  
what determines, 3-17  
Horizontal delay, defined, 3-28  
Horizontal position, relative to Horizontal Ref, 3-59  
Horizontal reference, relative to horizontal position,  
3-59  
K
Horizontal reference point, Glossary-5  
Horizontal scale, why use, 3-4  
Horizontal set up, purpose, 3-4  
Horizontal settings  
Keyboard, virtual, Glossary-10  
Keypad, virtual, Glossary-10  
Knob, Glossary-6  
general purpose, Glossary-4  
Trigger MAIN LEVEL, 3-40  
with channel waveforms, 3-58  
with math waveforms, 3-58  
with reference waveforms, 3-58  
L
Level, trigger, 3-40  
I
Linear interpolation, 3-67, Glossary-6  
Linearity, measurement errors, 3-6  
Live waveforms, Glossary-6  
Low, Glossary-6  
Image, ink-saver mode, 3-134  
Incoming inspection, 1-17  
perform compensation, 1-20  
perform diagnostics, 1-18  
LowRef, measurement level, Glossary-6  
perform hardware and operating system test, 1-38  
perform the functional tests, 1-21  
test equipment required by, 1-17  
Infinite Persistence, display mode, 3-67  
Initialize, Glossary-6  
Ink-saver mode, 3-134  
Input/Output (front panel), map, 2-11  
Input/Output (rear panel), map, 2-12  
M
Mag1 and Mag2, Views, 3-59  
Manuals  
part numbers, 1-41  
related, xii  
Index-4  
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Index  
Map  
acquisition process, 2-6  
documentation, 2-2  
Measurement level  
HighRef, Glossary-5  
LowRef, Glossary-6  
MidRef, Glossary-7  
MidRef2, Glossary-7  
Measurement Reference Parameters and Methods,  
B-56  
Measurements  
front panel, 2-8  
input/output (front panel), 2-11  
input/output (rear panel), 2-12  
system, 2-4  
user interface, 2-7  
waveform display, 2-9  
automatic, 3-74  
annotations, 3-74  
Mask testing, 3-141, 3-145  
autoset to a mask, 3-147  
clearing statistics counts, 3-151  
count statistics, 3-143  
databases as sources, 3-75  
independent characterization of, 3-75  
statistics on, 3-75  
creating a user mask (figure), 3-144  
definition of counts (statistics), 3-151  
editing description, 3-143  
flexible features of, 3-141  
stopping acquisition based on, 3-147  
supported standards, 3-142  
to create a mask, 3-152  
to edit a mask, 3-149  
whats measured, 3-74  
why use, 3-74  
cursor, 3-85  
sources, 3-86  
whats measured, 3-85  
why use, 3-85  
cursor types, 3-86  
cursors and the display, 3-86  
how to localize (gates), 3-83  
how to set sources for cursor, 3-90  
how to take, 3-80  
usage limitations, 3-142  
why use, 3-141  
Masks  
Fiberchannel standards supported, 3-142  
Gigabit Ethernet, 3-142  
SONET/SDH standards supported, 3-142  
Math waveform  
how to take cursor, 3-89  
tools for taking, 3-73  
Measurements (automatic), B-2, B-15, B-68  
for Pulse signals (definitions), B-2, B-8, B-14  
for RZ signals (definitions), B-15, B-29, B-36  
NRZ signals (definitions), B-37, B-50, B-55  
Reference, B-1  
defining (overview), 3-101  
how to define, 3-105  
how to use, 3-109  
operations on, 3-107  
Tracking methods, B-68  
Measurements bar, 2-7  
Measuring Waveforms, 3-73  
Menu, Pop up, Glossary-7  
Menu bar, 2-7  
Metastability reject triggering, 3-45  
MidRef, measurement level, Glossary-7  
MidRef2, measurement level, Glossary-7  
Mode, trigger, 3-41  
display considerations, 3-108  
source considerations, 3-108  
take automatic measurements on, 3-110  
take cursor measurements on, 3-111  
Math Waveforms  
how to create, 3-103  
sources for, 3-103  
Math waveforms, Glossary-6  
expression syntax for, 3-104  
overview, 3-101  
Models, instrument, 1-1  
Modes, sampling, 3-283-30  
Modules, sampling, supported, 1-4  
Mouse, operations equivalent with touchscreen, 3-60  
source dependencies of, 3-104  
time base dependencies of, 3-104  
usage limitations, 3-102, 3-107  
why use, 3-102  
N
Measurement  
Gated, Glossary-4  
Non-Return to Zero, Definition, Glossary-7  
Non-Return-to-Zero (NRZ) automatic measurements,  
B-37  
High, Glossary-5  
Low, Glossary-6  
Measurement accuracy, optimizing, 3-923-100  
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Index  
Amplitude-related, B-37  
Area-related, B-55  
Timing-related, B-50  
P
Package, shipping, contents of, 1-7  
Page setup, ink-saver, 3-134  
Peripherals, connection of, 1-12  
Persistence, waveform database, 3-159  
Persistence  
Normal  
display mode, 3-67  
trigger mode, 3-41  
NRZ measurements-amplitude, B-37  
NRZ measurements-area, B-55  
NRZ measurements-timing, B-50  
infinite, 3-67  
variable, 3-67  
Phone number, Tektronix, xiii  
Pixel, Glossary-7  
PNG file format, 3-136  
Pop up menu, Glossary-7  
Position  
O
Offset, vertical, 3-14  
OMA, optical modulation amplitude, Glossary-7  
On/Standby button, 1-13, 1-15  
Online, documentation, 2-1  
Online Help, 2-1, 2-2  
accessing, 3-167  
how to use, 3-168  
types available, 3-167  
Online help  
considerations for setting, 3-6  
horizontal, 3-7  
vertical, 3-6  
Power, applying & removing, 1-13, 1-15  
Preview mode, 3-55  
usage limitations, 3-55  
Printing  
to a file, 3-136  
waveforms, 3-132  
Probe, used on Trigger Direct input, 3-44  
Probe-channel deskew, Glossary-2  
Probes, Definition, Glossary-7  
Procedure  
displaying control descriptions, 3-168  
displaying overviews, 3-169  
for Windows, 3-174  
full-text search, 3-173  
keys to using, 3-167  
set up procedures, 3-172  
using the finder, 3-171  
why use, 3-167  
back up user files, 1-15  
Check the Package Contents, 1-7  
diagnostics, 1-18  
first-time power on, 1-13  
functional tests, 1-21  
hardware tests, 1-38  
Operating system, reinstall, 1-16  
Operation limitations  
automatic measurements, 3-76  
math waveforms, 3-102, 3-107  
Operational limitations  
Histograms, 3-155  
incoming inspection, 1-17  
operating system reinstall, 1-16  
operating system tests, 1-38  
running QAPlus/Win, 1-39  
To Autoset, 3-11  
To Clear References, 3-127  
To Compensate the Instrument and Modules, 3-92  
To Create a New Mask, 3-152  
To customize the database display, 3-164  
To Customize the Graticule & Waveforms, 3-69  
To Define a Math Waveform, 3-105  
To Deskew Channels, 3-96  
To Display Waveform in a MagView, 3-64  
To Display Waveform in the Main View, 3-62  
To Edit a Mask, 3-149  
Mask testing, 3-142  
preview mode, 3-55  
save and recall of setups, 3-114  
save and recall of waveforms, 3-120  
vertical offset, 3-5  
waveform databases, 3-159  
Optical modules  
incoming inspection, 1-25  
installation, 1-10  
Optical sampling modules, specifications, where to  
find, A-1  
Optional accessories list, 1-42  
Options, list, 1-41  
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Index  
To gated trigger, 3-50  
Recalling a setup, 3-113  
Recalling a waveform, 3-120  
Record  
To Localize a Measurement, 3-83  
To Mask Test a Waveform, 3-145  
To Perform Dark-Level and User Wavelength Gain  
Compensations, 3-98  
acquisition, shared by all channels, 3-20  
length, defined, 3-28  
Record length, Glossary-8  
Reference levels, methods for setting, 3-79  
Reference memory, Glossary-8  
Reference waveforms, Glossary-8  
how to clear, 3-127  
To Recall Your Setup, 3-118  
To Recall Your Waveform, 3-124  
To Reset the Instrument, 3-13  
To Save Your Setup, 3-115  
To Save Your Waveform, 3-121  
To Set Acquisition Modes, 3-24  
To Set Display Styles, 3-68  
To Set the Cursor Sources, 3-90  
To set up a waveform database, 3-162  
To Acquire in FrameScan mode, 3-33  
To Catch a Bit Error, 3-36  
To Set Up the Signal Input, 3-8  
To Start & Stop Acquisition, 3-26  
To Take a Histogram, 3-156  
To Take Automatic Measurements, 3-80, 3-89  
To trigger, 3-48  
Related Manuals, xii  
Release notes, software, 1-16  
Remote communication, 3-139  
Reset  
How to execute, 3-13  
of instrument, 3-13  
Return to Zero, Definition, Glossary-8  
Return-to-Zero (RZ) automatic measurements, B-36  
Amplitude-related, B-15  
Area-related, B-36  
Timing-related, B-29  
RZ measurements-amplitude, B-15  
RZ measurements-area, B-36  
RZ measurements-timing, B-29  
To Use an Exported Waveform, 3-129  
To Use Math Waveforms, 3-109  
To use online help, 3-168  
Procedures, in the online help, 3-172  
Product  
accessories list, 1-41  
S
description, 1-1  
functional model, 2-4  
Sample acquisition mode, Glossary-8  
Sample interval, Glossary-8  
defined, 3-28  
Sampling, Glossary-8  
modes, 3-283-30  
process, defined, 3-273-29  
process, illustrated, 3-283-29  
sequential equivalent-time, Glossary-9  
Sampling modules  
installation, 1-9  
options list, 1-41  
software, 1-3  
Product support, contact information, xiii  
Programmer guide, 2-2  
Propagation delay, deskew, 3-96  
Pulse automatic measurements, Area-related, B-14  
Pulse measurements-amplitude, B-2  
Pulse measurements-area, B-14  
Pulse measurements-timing, B-8  
caution-avoid damage, 3-6  
installation, 1-10  
installation compartments, 1-11  
external attenuators with, 3-6  
preventing overvoltage, 3-6  
keys to using, 3-5  
Q
selection, 3-5  
signal connection, 3-5  
QAPlus/Win application, 1-38  
Quantizing, Glossary-8  
specifications, where to find, A-1  
static concerns, 1-10  
supported, 1-4  
R
Save and recall of setups  
adding a comment, 3-117  
usage limitations, 3-114  
Range, vertical input, 3-14  
Readout display, 2-7  
Readouts, 2-7  
Readouts bar, 2-7  
Real time sampling, Glossary-8  
Index-7  
CSA8000B & TDS8000B User Manual  
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Index  
Save and recall of waveforms  
adding a comment, 3-123  
usage limitations, 3-120  
Save Mode, if Windows starts in, 1-16  
Saved waveform, saved, Glossary-9  
Saving a setup, 3-113  
Saving a waveform, 3-120  
Saving and recalling setups  
including comments, 3-114  
virtual keyboard with, 3-114  
why use, 3-113  
Saving and recalling waveforms  
including comments, 3-120  
virtual keyboard with, 3-120  
why use, 3-120  
Saving images, PNG format, 3-136  
Scale, considerations for setting, 3-6  
Screen printouts, change display, 3-137  
SELECT button, Glossary-8  
Selected cursor, Glossary-1  
Selected waveform, Glossary-8  
defined, 3-7  
environmental, A-6  
for instrument, A-1  
for sampling modules, where to find, A-1  
mechanical, A-10  
ports, A-8  
power consumption, A-7  
signal acquisition, A-1  
time base, A-2  
trigger, A-3  
specifications, A-1  
Standard, masks supported, 3-142  
Standard accessories, 1-41  
Statistics, for histograms, 3-158  
Status bar, 2-7  
System, diagnostics, 1-16  
System Rebuild CD, 1-3  
T
TDS8000, description, 1-1  
Technical support, contact information, xiii  
Tektronix  
contacting, xiii  
toll-free number, xiii  
Temperature compensation, 3-923-100  
Test equipment, for incoming inspection, 1-17  
Testing Waveforms, masks, histograms, and waveform  
databases, 3-141  
Time base, Glossary-9  
view, Glossary-10  
Tool bar, 2-7  
Touch screen, inoperable in Windows Safe mode, 1-16  
Touchscreen, operations equivalent with mouse, 3-60  
Tracking Methods (automatic measurement), B-68  
Trigger, Glossary-9  
Service support, contact information, xiii  
Setup  
recalling, 3-113  
saving, 3-113  
Setups  
how to recall, 3-118  
how to save, 3-115  
including comments with, 3-114  
purpose of saving/recalling, 3-113  
virtual keyboard with, 3-114  
Shipping package, contents of, 1-7  
Signal, connection and scaling overview, 3-4  
Signal conditioning, background, 3-13  
Sin(x)/x interpolation, 3-67, Glossary-6  
Slope, Glossary-9  
clock recovery source, 3-42  
DIRECT connector, 3-42, 3-44  
Edge, Glossary-4  
inputs, 3-42  
Level, Glossary-9  
level, 3-40  
modes, 3-41  
PRESCALE connector, 3-42, 3-44  
probe used to connect, 3-44  
slope, 3-40  
trigger, 3-40  
Software  
description, 1-16  
diagnostic (QAPlus/Win), 1-38, 1-39  
installation, 1-15  
release notes, 1-16  
System Rebuild CD, 1-3  
User Interface application, 1-3  
Windows, 1-3  
sources, 3-42  
SONET/SDH, standards supported, 3-142  
Sources, trigger, 3-42  
Specifications  
vs. untriggered displays (illustrated), 3-41  
Trigger inputs, usage limitations, 3-44  
Trigger MAIN LEVEL knob, 3-40  
Trigger point, defined, 3-28  
Trigger source, usage limitations, 3-44  
conditions for meeting, A-1  
cooling, A-7  
data storage, A-9  
display, A-7  
Index-8  
CSA8000B & TDS8000B User Manual  
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Index  
Triggering, 3-39, 3-1043-112  
based on application, 3-43  
edge, 3-403-52  
Vertical offset  
discussion of , 3-14  
illustrated, 3-15  
high frequency, 3-45  
holdoff, 3-45  
how to set, 3-48  
keys to using, 3-40  
metastability reject, 3-45  
overview (of process), 3-40  
overview of, 3-39  
usage limitations, 3-5  
Vertical position, illustrated, 3-15  
Vertical range, what determines, 3-14  
Vertical scale and offset, why use, 3-4  
Vertical set up, purpose, 3-4  
View  
graticule, 3-57  
Main & Mag, 2-10  
operations on selected, 3-57  
that magnify, 3-59  
purpose, 3-39  
why use, 3-39  
time base, Glossary-10  
using multiple, 3-57  
U
Views, multiple, 3-55  
Virtual keyboard, Glossary-10  
dialog box, 3-114, 3-120  
Virtual keypad, Glossary-10  
Update, software, 1-4  
Upgrade, firmware, 1-4  
URL, Tektronix, xiii  
Usable holdoff, 3-46  
User Interface  
Controls bar, 2-7  
map, 2-7  
Measurements bar, 2-7  
Menu bar, 2-7  
Readouts bar, 2-7  
readouts display, 2-7  
Status bar, 2-7  
Tool bar, 2-7  
W
Waveform  
Acquiring of, 3-3  
channel, Glossary-3  
cursors, Glossary-10  
database, Glossary-10  
databases, using, 3-159  
defined, Glossary-10  
display, 2-7  
Waveform bar, 2-7  
User Interface application, software, 1-3  
User manual  
overview of, 3-53  
main, 2-2  
sampling modules, 2-2  
User Wavelength compensation, how to perform, 3-98  
displayed fit to screen, 3-58  
displaying, 3-53  
exporting, 3-128  
how to display in a Mag View, 3-64  
how to display in Main View, 3-62  
how to recall, 3-124  
how to save, 3-121  
how to use an exported, 3-129  
printing, 3-132  
purpose of databases, 3-159  
recalling, 3-120  
saved, Glossary-9  
V
Variable Persistence, display mode, 3-67  
Vectors, 3-67  
Vectors, Display menu, 3-67  
Verification, incoming inspection procedure, 1-17  
Vertical  
Bar cursors, Glossary-9  
position, 3-6  
range (acquisition window), Glossary-9  
scaling, 3-4  
set up procedure, 3-8  
saving, 3-120  
selected, 3-7, Glossary-8  
Waveform display  
elements of, 3-54  
customizing, 3-66  
why use, 3-66  
Waveform bar, 2-7  
signal connection, 3-4  
Vertical acquisition window, Glossary-9  
control set up, 3-9  
overview, 3-14  
Vertical deskew, Glossary-2  
Index-9  
CSA8000B & TDS8000B User Manual  
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Index  
Waveform databases  
behavior with automatic measurements, 3-76  
dimensions of, 3-160  
BIN7, 3-161  
histograms on, 3-154  
including comments with, 3-120  
live, Glossary-6  
mask testing, 3-141  
math, Glossary-6  
BIN8, 3-161  
color, 3-160  
display, 3-160  
why use, 3-102  
measuring, 3-73  
display options, 3-160  
EMPH7, 3-161  
EMPH8, 3-161  
emphasize counts, 3-161  
intensity, 3-160  
invert, 3-160  
operations on all views, 3-58  
operations on selected, 3-56  
purpose of mask testing, 3-141  
purpose of saving/recalling, 3-120  
purpose of taking histograms of, 3-154  
Reference, Glossary-8  
persistence, 3-161  
testing and statistical tools, 3-141  
virtual keyboard with, 3-120  
Web site address, Tektronix, xiii  
WfmDB, Glossary-10  
special features, 3-159  
To customize display of, 3-164  
to set up, 3-162  
four database limit, 3-159  
usage limitations, 3-159  
vs. vector view (figure), 3-163  
why use, 3-159  
Window  
horizontal acquisition, Glossary-5  
vertical acquisition, Glossary-9  
Windows, 1-3  
with intensity display (figure), 3-165  
Waveform Display  
Safe mode, 1-16  
Windows OS, Glossary-10  
defining waveforms for, 3-56  
keys to using, 3-56  
Y
YT format, Glossary-10  
Waveform record, 3-28  
definition applied to all channels, 3-20  
illustrated, 3-29  
Waveforms  
control operation vs. selected, 3-57  
creating math, 3-101  
defining and displaying, 3-56  
Z
Zoom, fast access to, 3-55  
Index-10  
CSA8000B & TDS8000B User Manual  
Download from Www.Somanuals.com. All Manuals Search And Download.  
Download from Www.Somanuals.com. All Manuals Search And Download.  
Download from Www.Somanuals.com. All Manuals Search And Download.  

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