User Manual
CSA8000B Communications Signal Analyzer
TDS8000B Digital Sampling Oscilloscope
071-1099-03
This document applies to firmware version 2.0
and above.
www.tektronix.com
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WARRANTY
Tektronix warrants that the products that it manufactures and sells will be free from defects in materials and
workmanship for a period of one (1) year from the date of shipment. If this product proves defective during its
warranty period, Tektronix, at its option, will either repair the defective product without charge for parts and labor,
or provide a replacement in exchange for the defective product.
This warranty applies only to products returned to the designated Tektronix depot or the Tektronix authorized
representative from which the product was originally purchased. For products returned to other locations,
Customer will be assessed an applicable service charge. The preceding limitation shall not apply within the
European Economic Area, where products may be returned for warranty service to the nearest designated service
depot regardless of the place of purchase.
In order to obtain service under this warranty, Customer must provide the applicable office of Tektronix or its
authorized representative with notice of the defect before the expiration of the warranty period and make suitable
arrangements for the performance of service. Customer shall be responsible for packaging and shipping the
defective product to the service center designated by Tektronix or its representative, with shipping charges
prepaid. Tektronix or its representative shall pay for the return of the product to Customer. Customer shall be
responsible for paying any associated taxes or duties.
This warranty shall not apply to any defect, failure or damage caused by improper use or improper or inadequate
maintenance and care. Tektronix shall not be obligated to furnish service under this warranty:
a) to repair damage resulting from attempts by personnel other than Tektronix representatives to install, repair or
service the product;
b) to repair damage resulting from improper use or connection to incompatible equipment;
c) to repair any damage or malfunction caused by the use of non-Tektronix supplies or consumables;
d) to repair a product that has been modified or integrated with other products when the effect of such
modification or integration increases the time or difficulty of servicing the product; or
e) to repair damage or malfunction resulting from failure to perform user maintenance and cleaning at the
frequency and as prescribed in the user manual (if applicable).
THE ABOVE WARRANTIES ARE GIVEN BY TEKTRONIX WITH RESPECT TO THIS PRODUCT IN LIEU OF
ANY OTHER WARRANTIES, EXPRESS OR IMPLIED. TEKTRONIX AND ITS VENDORS DISCLAIM ANY
IMPLIED WARRANTIES OF MERCHANTABILITY OR FITNESS FOR A PARTICULAR PURPOSE. TEKTRONIX’
RESPONSIBILITY TO REPAIR OR REPLACE DEFECTIVE PRODUCTS IS THE SOLE AND EXCLUSIVE
REMEDY PROVIDED TO THE CUSTOMER FOR BREACH OF THIS WARRANTY. TEKTRONIX AND ITS
VENDORS WILL NOT BE LIABLE FOR ANY INDIRECT, SPECIAL, INCIDENTAL, OR CONSEQUENTIAL
DAMAGES IRRESPECTIVE OF WHETHER TEKTRONIX OR THE VENDOR HAS ADVANCE NOTICE OF THE
POSSIBILITY OF SUCH DAMAGES.
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Table of Contents
General Safety Summary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
ix
Preface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
About This Manual . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Related Manuals and Online Documents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Conventions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Contacting Tektronix . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
xi
xi
xii
xii
xiii
Getting Started
Product Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Models . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Key Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Product Software . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Firmware Upgrade . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Sampling Modules Supported . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
1--1
1-1
1-1
1-3
1-4
1-4
Check the Package Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
1--7
Installation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Check the Environmental Requirements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Install the Sampling Modules . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Connect the Peripherals . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Power On the Instrument . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Powering Off the Instrument . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Brightness and Contrast Adjustment (Gamma) . . . . . . . . . . . . . . . . . . . . . . . . .
Back Up User Files . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Software Installation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Software Release Notes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating System Reinstallation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
System Diagnostics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Windows Safe Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
1--9
1-9
1-10
1-12
1-13
1-15
1-15
1-15
1-15
1-16
1-16
1-16
1-16
1-16
Incoming Inspection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Assemble Equipment . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Perform the Diagnostics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Perform the Compensation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Perform the Functional Tests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Perform the Hardware and Operating System Tests (Windows 98 Only) . . . . .
1--17
1-17
1-18
1-20
1-21
1-38
Accessories and Options . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Accessories . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Standard . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Optional . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Options . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
1--41
1-41
1-41
1-42
1-43
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Table of Contents
Operating Basics
Operational Maps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Documentation Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
2--1
2--2
System Overview Maps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Functional Model Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Process Overview Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
2--4
2-4
2-6
User Interface Map -- Complete Control and Display . . . . . . . . . . . .
Front Panel Map -- Quick Access to Most Often Used Features . . . .
Display Map -- Single Graticule View . . . . . . . . . . . . . . . . . . . . . . . . .
Display Map -- Multiple Views . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Front Panel I/O Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Rear Panel I/O Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
2--7
2--8
2--9
2--10
2--11
2--12
Reference
Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
3--1
Acquiring Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Signal Connection and Scaling . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Why Use? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
What’s Special? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
What’s Excluded? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Keys to Using . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
To Set Up the Signal Input . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
To Autoset the Instrument . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
To Reset the Instrument . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Signal Conditioning Background . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Setting Acquisition Controls . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Why Use? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
What’s Special? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
What’s Excluded? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Keys to Using . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
To Set Acquisition Modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
To Start and Stop Acquisition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Acquisition Control Background . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Acquisition Hardware . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Sampling Process . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Sampling Modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Waveform Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Acquisition Cycle . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
FrameScan Acquisitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Why Use? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
What’s Special? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
What’s Excluded? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Keys to Using . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
To Acquire in FrameScan Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
To Catch a Bit Error . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
3--3
3-4
3-4
3-5
3-5
3-5
3-8
3-11
3-13
3-13
3-21
3-21
3-21
3-22
3-22
3-24
3-26
3-27
3-27
3-27
3-28
3-28
3-29
3-30
3-30
3-30
3-31
3-31
3-33
3-36
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Table of Contents
Triggering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
3--39
3-39
3-39
3-39
3-40
3-48
3-50
Edge Triggering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Why Use? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
What’s Special? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Keys to Using . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
To Trigger . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
To Use Gated Trigger . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Displaying Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Using the Waveform Display . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Why Use? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
What’s Special? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
What’s Excluded? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Keys to Using . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
To Display Waveforms in the Main Time Base View . . . . . . . . . . . . . . . .
To Display Waveforms in a Mag View . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Customizing the Display . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Why Use? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
What’s Special? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Keys to Using . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
To Set Display Styles . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
To Customize the Graticule and Waveforms . . . . . . . . . . . . . . . . . . . . . . .
3--53
3-53
3-55
3-55
3-55
3-56
3-62
3-64
3-66
3-66
3-66
3-66
3-68
3-69
Measuring Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Taking Automatic Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Why Use? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
What’s Measured? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
What’s Special? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
What’s Excluded? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Keys to Using . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
To Take Automatic Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
To Localize a Measurement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Taking Cursor Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Why Use? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
What’s Measured? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
What Sources Can I Measure? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Keys to Using Cursors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
To Take a Cursor Measurement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
To Set the Cursor Sources . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Optimizing Measurement Accuracy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Why Use? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Compensation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
To Compensate the Instrument and Modules . . . . . . . . . . . . . . . . . . . . . . .
To Perform Dark-Level and User Wavelength Gain Compensations . . . . .
3--73
3-74
3-74
3-74
3-74
3-76
3-76
3-80
3-83
3-85
3-85
3-85
3-86
3-86
3-89
3-90
3-92
3-92
3-92
3-92
3-98
Creating Math Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3--101
Defining Math Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Why Use? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
What’s Special? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
What’s Excluded? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Keys to Using . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
To Define a Math Waveform . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
3-101
3-102
3-102
3-102
3-103
3-105
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Table of Contents
Operations on Math Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Why Use? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
What’s Excluded? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Keys to Using . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
To Use Math Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
3-107
3-107
3-107
3-108
3-109
Data Input and Output . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3--113
Saving and Recalling Setups . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Why Use? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
What’s Special? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
What’s Excluded? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Keys to Using . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
To Save Your Setup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
To Recall Your Setup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Saving and Recalling Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Why Use? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
What’s Special? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
What’s Excluded? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
To Save Your Waveform . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
To Recall Your Waveform . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
To Clear References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Exporting Waveforms and Histograms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Why Use? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Keys to Using . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
To Export Your Waveform . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
To Export Your Histogram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
To Use an Exported Waveform (or Histogram) . . . . . . . . . . . . . . . . . . . . .
Printing Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Remote Communication . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
3-113
3-113
3-114
3-114
3-114
3-115
3-118
3-120
3-120
3-120
3-120
3-121
3-124
3-127
3-128
3-128
3-128
3-128
3-129
3-129
3-132
3-139
Using Masks, Histograms, and Waveform Databases . . . . . . . . . . . . 3--141
Mask Testing Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Why Use? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
What’s Special? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
What’s Excluded? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Keys to Using . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
To Mask Test a Waveform . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
To Edit a Mask . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Counting Masks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
To Create a New Mask . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Taking Histograms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Why Use? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
What’s Special? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
What’s Excluded? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Keys to Using Histograms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
To Take a Histogram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Histogram Statistics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
3-141
3-141
3-141
3-142
3-142
3-145
3-149
3-151
3-152
3-154
3-154
3-154
3-155
3-155
3-156
3-158
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Using Waveform Databases . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
3-159
3-159
3-159
3-159
3-160
3-162
3-164
Why Use? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
What’s Special? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
What’s Excluded? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Keys to Using . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
To Set Up a Waveform Database . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
To Customize the Database Display . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Accessing Online Help . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3--167
What’s Available? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Why Use? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Keys to Using . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
How to Use Online Help . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
3-167
3-167
3-167
3-168
Cleaning the Instrument . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3--175
Exterior Cleaning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Flat Panel Display Cleaning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Optical Connector Cleaning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
3-175
3-176
3-176
Appendices
Appendix A: Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Certifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
A--1
A-11
Appendix B: Automatic Measurements Reference . . . . . . . . . . . . . .
Pulse Measurements - Amplitude . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Pulse Measurements - Timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Pulse Measurement - Area . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Return-to-Zero (RZ) Measurements - Amplitude . . . . . . . . . . . . . . . . . . . . . . .
Return-to-Zero (RZ) Measurements - Timing . . . . . . . . . . . . . . . . . . . . . . . . . .
Return-to-Zero (RZ) Measurements - Area . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Non-Return-to-Zero (NRZ) Measurements - Amplitude . . . . . . . . . . . . . . . . .
Non-Return-to-Zero (NRZ) Measurements - Timing . . . . . . . . . . . . . . . . . . . .
Non-Return-to-Zero (NRZ) Measurements - Area . . . . . . . . . . . . . . . . . . . . . .
B--1
B-2
B-8
B-14
B-15
B-29
B-36
B-37
B-50
B-55
Measurement Reference Parameters and Methods . . . . . . . . . . . . . .
All Sources . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Pulse Sources . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
RZ Sources . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
NRZ Sources . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Tracking Methods . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Mid-reference Level . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
To Optimize the Vertical Resolution . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Use a Waveform Database . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
B--56
B-56
B-57
B-60
B-62
B-68
B-69
B-69
B-70
Glossary
Index
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List of Figures
Figure 1--1: Compartments for sampling modules . . . . . . . . . . . . . . .
Figure 1--2: Maximum inputs in three configurations . . . . . . . . . . . .
Figure 1--3: Locations of peripheral connectors on rear panel . . . . .
1--11
1--11
1--12
Figure 1--4: Line fuse and power cord connector locations,
rear panel . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
1--13
1--14
1--20
1--23
1--23
1--26
1--27
1--28
1--29
1--30
1--31
1--32
1--33
1--34
1--35
1--36
1--37
Figure 1--5: On/Standby switch location . . . . . . . . . . . . . . . . . . . . . . .
Figure 1--6: Compensation dialog box . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 1--7: Hookup for electrical functional tests . . . . . . . . . . . . . . .
Figure 1--8: Channel button location . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 1--9: Channel button location . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 1--10: Optical channel verification . . . . . . . . . . . . . . . . . . . . . .
Figure 1--11: Hookup for the time base tests . . . . . . . . . . . . . . . . . . . .
Figure 1--12: Channel button location . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 1--13: Main time base verification . . . . . . . . . . . . . . . . . . . . . .
Figure 1--14: Mag time base verification . . . . . . . . . . . . . . . . . . . . . . .
Figure 1--15: Channel button location . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 1--16: Hookup for the gated trigger tests . . . . . . . . . . . . . . . . .
Figure 1--17: Signal triggered . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 1--18: Signal not triggered (signal frozen) . . . . . . . . . . . . . . . .
Figure 1--19: Signal not triggered (no signal) . . . . . . . . . . . . . . . . . . .
Figure 1--20: Signal triggered . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 3--1: Acquisition and display controls . . . . . . . . . . . . . . . . . . .
Figure 3--2: Setting vertical scale and position of input channels . . .
3--4
3--15
Figure 3--3: Varying offset positions vertical acquisition
window on waveform amplitude . . . . . . . . . . . . . . . . . . . . . . . . . .
3--17
3--18
Figure 3--4: Horizontal acquisition window definition . . . . . . . . . . .
Figure 3--5: Common trigger, record length, and acquisition
rate for all channels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
3--20
3--23
3--27
3--28
3--29
Figure 3--6: Aliasing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 3--7: Channel configuration . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 3--8: Digital acquisition — sampling and digitizing . . . . . . . .
Figure 3--9: The waveform record and its defining parameters . . . .
Figure 3--10: How FrameScan acquisition works (scanning on
a 127-bit PRBS shown) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
3--32
3--41
Figure 3--11: Slope and level define the trigger event . . . . . . . . . . . . .
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Figure 3--12: Triggered versus untriggered displays . . . . . . . . . . . . .
3--41
3--42
3--46
3--47
3--54
Figure 3--13: Trigger inputs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 3--14: Holdoff adjustment can prevent false triggers . . . . . . .
Figure 3--15: Trigger to End Of Record Time (EORT) . . . . . . . . . . .
Figure 3--16: Display elements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 3--17: Horizontal position includes time to Horizontal
Reference . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
3--59
3--73
3--75
3--78
3--79
3--86
Figure 3--18: Graticule, cursor and automatic measurements . . . . .
Figure 3--19: Measurement annotations on a waveform . . . . . . . . . .
Figure 3--20: High/Low tracking methods . . . . . . . . . . . . . . . . . . . . . .
Figure 3--21: Reference-level calculation methods . . . . . . . . . . . . . . .
Figure 3--22: Horizontal cursors measure amplitudes . . . . . . . . . . . .
Figure 3--23: Components determining Time cursor readout
values . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
3--88
Figure 3--24: Functional transformation of an acquired
waveform . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3--101
Figure 3--25: Export dialog box . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3--129
Figure 3--26: Creating a user mask . . . . . . . . . . . . . . . . . . . . . . . . . . . 3--144
Figure 3--27: Adding a new vertex . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3--144
Figure 3--28: Vertical histogram view and statistics on data . . . . . . . 3--154
Figure 3--29: Normal vector view of a waveform . . . . . . . . . . . . . . . . 3--163
Figure 3--30: Waveform database view of a waveform . . . . . . . . . . . . 3--163
Figure B--1: Reference-level calculation methods . . . . . . . . . . . . . . . .
Figure B--2: Pulse-reference levels . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure B--3: Pulse crossings and mid-reference level . . . . . . . . . . . . .
Figure B--4: AOP pulse crossings and mid-reference level . . . . . . . .
Figure B--5: Overshoot levels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure B--6: RZ measurement reference levels . . . . . . . . . . . . . . . . . .
Figure B--7: RZ crossings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure B--8: RZ eye--aperture parameters . . . . . . . . . . . . . . . . . . . . . .
Figure B--9: NRZ measurement reference levels . . . . . . . . . . . . . . . . .
Figure B--10: NRZ crossings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure B--11: NRZ eye-aperture parameters . . . . . . . . . . . . . . . . . . . .
Figure B--12: NRZ overshoot levels . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure B--13: NRZ Crossings (OMA) . . . . . . . . . . . . . . . . . . . . . . . . . .
B--56
B--57
B--58
B--59
B--59
B--60
B--61
B--62
B--63
B--64
B--65
B--66
B--67
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Table of Contents
List of Tables
Table 1--1: Additional accessory connection information . . . . . . . . .
Table 1--2: Line fuses . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Table 1--3: Standard accessories . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Table 1--4: Optional accessories . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
1--13
1--13
1--41
1--42
Table 3--1: Application-based triggering . . . . . . . . . . . . . . . . . . . . . .
Table 3--2: Defining and displaying waveforms . . . . . . . . . . . . . . . . .
3--43
3--56
Table 3--3: Operations performed based on the selected
waveform . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
3--57
3--61
3--66
3--85
3--88
Table 3--4: Equivalent mouse and touchscreen operations . . . . . . . .
Table 3--5: Customizable display attributes . . . . . . . . . . . . . . . . . . . .
Table 3--6: Cursor functions (types) . . . . . . . . . . . . . . . . . . . . . . . . . .
Table 3--7: Cursor units . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Table 3--8: Math expressions and the math waveforms produced . . 3--103
Table 3--9: Standard masks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3--142
Table 3--10: Histogram statistics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3--158
Table A--1: System -- Signal acquisition . . . . . . . . . . . . . . . . . . . . . . .
Table A--2: System -- Timebase . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
T a b l e A -- 3 : S y s t e m -- T r i g g e r . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Table A--4: System -- Environmental . . . . . . . . . . . . . . . . . . . . . . . . . .
Table A--5: Power consumption and cooling . . . . . . . . . . . . . . . . . . .
T a b l e A -- 6 : D i s p l a y . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
T a b l e A -- 7 : P o r t s . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Table A--8: Data storage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Table A--9: Mechanical . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Table A--10: Certifications and compliances . . . . . . . . . . . . . . . . . . .
A--1
A--2
A -- 3
A--6
A--7
A -- 7
A -- 8
A--9
A--10
A--11
Table B--1: Pulse Measurements — Amplitude . . . . . . . . . . . . . . . . .
Table B--2: Pulse Measurements -- Timing . . . . . . . . . . . . . . . . . . . . .
Table B--3: Pulse Measurements -- Area . . . . . . . . . . . . . . . . . . . . . . .
Table B--4: RZ Measurements -- Amplitude . . . . . . . . . . . . . . . . . . . .
Table B--5: RZ Measurements -- Timing . . . . . . . . . . . . . . . . . . . . . . .
Table B--6: RZ Measurements --Area . . . . . . . . . . . . . . . . . . . . . . . . .
Table B--7: NRZ Measurements -- Amplitude . . . . . . . . . . . . . . . . . .
Table B--8: NRZ Measurements -- Timing . . . . . . . . . . . . . . . . . . . . .
Table B--9: NRZ Measurements -- Area . . . . . . . . . . . . . . . . . . . . . . .
B--2
B--8
B--14
B--15
B--29
B--36
B--37
B--50
B--55
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General Safety Summary
Review the following safety precautions to avoid injury and prevent damage to
this product or any products connected to it. To avoid potential hazards, use this
product only as specified.
Only qualified personnel should perform service procedures.
While using this product, you may need to access other parts of the system. Read
the General Safety Summary in other system manuals for warnings and cautions
related to operating the system.
To Avoid Fire or
Personal Injury
Use Proper Power Cord. Use only the power cord specified for this product and
certified for the country of use.
Connect and Disconnect Properly. Do not connect or disconnect probes or test
leads while they are connected to a voltage source.
Ground the Product. This product is grounded through the grounding conductor
of the power cord. To avoid electric shock, the grounding conductor must be
connected to earth ground. Before making connections to the input or output
terminals of the product, ensure that the product is properly grounded.
Observe All Terminal Ratings. To avoid fire or shock hazard, observe all ratings
and markings on the product. Consult the product manual for further ratings
information before making connections to the product.
Do not apply a potential to any terminal, including the common terminal, that
exceeds the maximum rating of that terminal.
Do Not Operate Without Covers. Do not operate this product with covers or panels
removed.
Use Proper Fuse. Use only the fuse type and rating specified for this product.
Avoid Exposed Circuitry. Do not touch exposed connections and components
when power is present.
Wear Eye Protection. Wear eye protection if exposure to high-intensity rays or
laser radiation exists.
Do Not Operate With Suspected Failures. If you suspect there is damage to this
product, have it inspected by qualified service personnel.
Do Not Operate in Wet/Damp Conditions.
Do Not Operate in an Explosive Atmosphere.
Keep Product Surfaces Clean and Dry.
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General Safety Summary
Provide Proper Ventilation. Refer to the manual’s installation instructions for
details on installing the product so it has proper ventilation.
Symbols and Terms
Terms in this Manual. These terms may appear in this manual:
WARNING. Warning statements identify conditions or practices that could result
in injury or loss of life.
CAUTION. Caution statements identify conditions or practices that could result in
damage to this product or other property.
Terms on the Product. These terms may appear on the product:
DANGER indicates an injury hazard immediately accessible as you read the
marking.
WARNING indicates an injury hazard not immediately accessible as you read the
marking.
CAUTION indicates a hazard to property including the product.
Symbols on the Product. The following symbols may appear on the product:
Protective Ground
(Earth) Terminal
CAUTION
Refer to Manual
WARNING
High Voltage
Mains Connected
ON (Power)
Mains Disconnected
OFF (Power)
Standby
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Preface
This is the user manual for the CSA8000B Communications Signal Analyzer and
TDS8000B Digital Sampling Oscilloscope. It covers the following information:
H
H
H
Describes the capabilities of the instrument: how to install it and reinstall its
software
Explains how to operate the instrument: how to control acquisition of,
processing of, and input/output of information
Lists the specifications and accessories of the instrument
About This Manual
This manual is composed of the following chapters:
H
Getting Started shows you how to configure and install your instrument and
provides an incoming inspection procedure.
H
Operating Basics uses maps to describe the various interfaces for controlling
the instrument, including the front panel and the software user interface.
These maps provide overviews of the product and its functions from several
viewpoints.
H
Reference comprises an encyclopedia of topics (see Overview on page 3--1)
that describe the instrument interface and features, and that give background
and basic information on how to use them. (The online help onboard the
instrument application describes the interface, features, and their usage in
more detail; detailed descriptions of all programming commands are found
in the online CSA8000 & TDS8000 Programmer Guide manual.)
H
Appendices provides additional information including the specifications and
automatic measurement definitions.
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Preface
Related Manuals and Online Documents
This manual is part of a document set of standard-accessory manuals and online
documentation; this manual mainly focuses on installation and background
needed to use the product features. See the following list for other documents
supporting instrument operation and service. (Manual part numbers are listed in
Table 1--3 on page 1--41.)
Manual name
Description
CSA8000 & TDS8000 Online Help
An online help system, integrated with the User Interface application that ships with this
product.
CSA8000B & TDS8000B References
A quick reference to major features of the instrument and how they operate.
CSA8000 & TDS8000 Programmer Guide Part of the online help system this guide comprises an alphabetical listing of the
programming commands and other information related to controlling the instrument over
the GPIB. This is an online document.
Electrical Sampling Modules User Manual The user manual for the electrical sampling modules. Included as a PDF file on the
product software CD or the PDF file can be downloaded from the Tektronix website.
80C00 Series Optical Sampling Modules
User Manual
The user manual for the optical sampling modules. Included as a PDF file on the product
software CD or the PDF file can be downloaded from the Tektronix website.
80A01 Trigger Prescale Limiting Preamplifi- The user manual for the 80A01 Trigger Prescale Limiting Preamplifier Module. Included
er Module User Manual
as a standard accessory if you ordered this module with this instrument. Shipped in the
module package, not the main instrument package.
80A02 EOS/ESD Protection Module
Instructions
The instructions for the 80A02 EOS/ESD Protection Module. Included as a standard
accessory if you ordered this module with this instrument. Shipped in the module
package, not the main instrument package.
CSA8000 & TDS8000 Service Manual
Describes how to service the instrument to the module level. This optional manual must
be ordered separately.
For more information on how the product documentation relates to the
instrument operating interfaces and features, see Documentation Map on
page 2--2.
Conventions
This manual uses the terms vertical acquisition window and horizontal acquisi-
tion window throughout this section and elsewhere. These terms refer to the
vertical and horizontal range of the acquisition window, which defines the
segment of the input signal that the acquisition system acquires.
The terms do not refer to any operating system windows that you might display
on screen.
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Preface
Contacting Tektronix
Phone
1-800-833-9200*
Address
Tektronix, Inc.
Department or name (if known)
14200 SW Karl Braun Drive
P.O. Box 500
Beaverton, OR 97077
USA
Web site
www.tektronix.com
Sales support
Service support
Technical support
1-800-833-9200, select option 1*
1-800-833-9200, select option 2*
Email: techsupport@tektronix.com
1-800-833-9200, select option 3*
6:00 a.m. - 5:00 p.m. Pacific time
*
This phone number is toll free in North America. After office hours, please leave a
voice mail message.
Outside North America, contact a Tektronix sales office or distributor; see the
Tektronix web site for a list of offices.
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Preface
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Product Description
This chapter describes your instrument, which is either the CSA8000B Commu-
nications Signal Analyzer or the TDS8000B Digital Sampling Oscilloscope, and
its options. Following this description are four sections:
H
Check the Package Contents, on page 1--7, shows you how to verify that you
have received all of the parts of your instrument.
H
Installation, on page 1--9, shows you how to configure and install the
instrument, as well as how to reinstall the system software included with the
product.
H
H
Incoming Inspection, on page 1--17, provides a procedure for verifying basic
operation and functionality.
Accessories and Options, on page 1--41, lists the instrument options
available and the standard and optional accessories for this product.
Models
This manual supports two very similar instruments:
H
H
The CSA8000B Communications Signal Analyzer.
The TDS8000B Digital Sampling Oscilloscope.
Differences between the two instruments will be called out when necessary;
otherwise, the material applies to both instruments. The word “instrument” refers
to either product.
Key Features
The instrument is a high-speed, precision sampling system that finds use in
validation and conformance testing and impedance verification for:
H
high-performance semiconductor/computer applications, such as semicon-
ductor testing, TDR characterization of circuit boards, IC packages and
cables, and high-speed serial digital data communications.
H
high-performance communications applications, such as design evaluation
and manufacturing test of datacom and telecom components, transceiver
subassemblies, and transmission systems.
The instrument includes a user interface that runs on the Microsoft Windows
operating system as a windowed application. You operate the instrument using
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Product Description
front-panel controls with the mouse and keyboard or with the touch screen. The
installed Windows operating system (MS Windows 98 or MS Windows 2000) is
dependent on the purchase date or product upgrade status.
Key features include:
H
industry-leading waveform acquisition and measurement rate, with Sample,
Envelope, and Average acquisition modes.
H
support for up to six sampling modules (two large and four small modules)
for a maximum configuration of ten inputs. (Up to eight inputs can be active
at a time. See Maximum Configuration on page 1--11).
H
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supports integrated optical signal pick-off and clock recovery enabling
accurate triggering on optical communication-signals.
support for optical modules with several integrated, selectable reference
receivers, which eliminates the need for a multitude of add-on reference
receivers.
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full programmability, with an extensive GPIB-command set and a message-
based interface.
true differential TDR, with fast step (35 psec reflected risetime) when used
with a TDR-capable sampling module.
industry-leading trigger bandwidth (12+ GHz) when using the built-in-
prescaler.
support of both telecom (SONET and SDH) and datacom (Fibre Channel,
Infiniband, and Gigabit Ethernet) optical communication standards.
powerful built-in measurement capability, including histograms, mask
testing, and automatic measurements.
automatic measurements operate on Pulses, RZ eye patterns, and NRZ eye
patterns.
DC to 65 GHz optical bandwidth; DC to 65 GHz electrical bandwidth, with
up to 12.5 GHz triggering.
NOTE. Bandwidth is determined by the specific modules that are installed.
H
H
FrameScan acquisition for isolating data-dependent failures during confor-
mance/performance testing and for examining very low-level repetitive
signals.
support for optical conformance testing of SONET/SDH signals (including
the various forward error correction rates for these telecom rates) from
155 Mbps to 43 Gb/s, 1 and 10 Gb/s FibreChannel signals, 10.52 Gb/s
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FibreChannel signals, and 1, 2, and 10 Gigabit FibreChannel signals as well
as 2.5 Gb/s Infiniband signals.
NOTE. Support for conformance testing rates is determined by the specific
modules that are installed.
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high precision time base with two modes of operation, locked and short-term
jitter-optimized
negligible long-term jitter degradation (<0.1 ppm), which substantially
improves the ability to view signals that are delayed far from the trigger
point without distortion.
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improved short-term and long-term trigger jitter.
a gated trigger option (Option GT) that lets you disable or enable (gate)
triggering based on a TTL signal you connect to the instrument rear panel.
H
H
the GT feature also allows you to use recirculating buffers as part of your test
setup to simulate the effects of very long optical links that are typical of
undersea cables and other long terrestrial links.
analysis and connectivity tools enable the instrument to be controlled from a
variety of local and remote environments and to share data with other
commercially available analysis programs.
H
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pre-defined, built-in masks in addition to the user-defined masks.
a large 10-inch color display that supports color grading of waveform data to
show sample density.
H
an intuitive UI (User Interface), with built-in online help displayable on
screen.
Product Software
The instrument includes the following software:
H
MS Windows comes preinstalled on the instrument. MS Windows is the
operating system on which the user-interface application of this instrument
runs. The OS Rebuild CDs include the software needed to rebuild the
instrument operating system if that becomes necessary.
H
The User Interface (UI) Application (product software) comes preinstalled on
the instrument. This UI application complements the hardware controls of
the front panel, allowing complete set up of all instrument features. The
Product Software CD includes the UI Application for use if reinstalling the
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Product Description
product software becomes necessary. See Software Installation on
page 1--15.
New versions of the software may become available at our web site. See
Contacting Tektronix on page xiii in Preface.
Firmware Upgrade
Tektronix may offer firmware upgrade kits for the instrument. Contact your
Tektronix service representative for more information (see Contacting Tektronix
on page xiii).
Sampling Modules Supported
This product can use the following optical and electrical sampling modules listed
below. These modules, which plug into the instrument, are more fully described
in their respective user manuals. These manuals were shipped with those
sampling modules that were ordered with this product.
The sampling modules listed here were available at the time this manual was
published; see your Tektronix product catalog for current offerings.
Optical Sampling Modules.
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80C01 -- 622/2488/9953 Mb/s, 12.5/20 GHz optical module.
Clock Recovery (622/2488 Mb/s) added with option CR.
80C02 -- 9.953 Gb/s, 20/30 GHz optical module.
Clock Recovery (9.953 Gb/s) added with option CR.
80C03 -- 1.063/1.250/2.488/2.500 Gb/s amplified optical module.
Clock Recovery for all rates added with option CR.
This module has been superseded by the 80C07B.
H
80C04 -- 9.953/10.3125 Gb/s, 20/30 GHz optical module.
Clock Recovery (9.953 Gb/s) added with option CR1.
Clock Recovery (9.953 Gb/s and 10.66 Gb/s) added with option CR2.
This module has been superseded by the 80C11.
H
H
80C05 -- 9.953 Gb/s, 20/30/40 GHz optical module for 10/40 Gb/s NRZ.
This module has been superseded by the 80C10.
80C06 -- 55 GHz optical module for 40 Gb/s RZ and NRZ telecom.
This module has been superseded by the 80C10.
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Product Description
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80C07 -- 155/622/2488 Mb/s amplified optical module.
Clock Recovery for all rates added with option CR1.
This module has been superseded by the 80C07B.
80C07B -- 155/622/1063/1250/2125/2488/2500 Mb/s amplified optical
module. (The module is limited to five receivers configured at the time of
order.)
Clock Recovery for all rates (plus 2666 Mb/s) added with option CR1.
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80C08 -- 9.953/10.31 Gb/s Multi-rate amplified optical module.
Clock Recovery (9.953 and 10.3125 Gb/s) added with option CR1.
This module has been superseded by the 80C08C.
80C08B -- 9.953/10.31/10.52 Gb/s Multi-rate amplified optical module.
Clock Recovery (9.953 and 10.3125 Gb/s) added with option CR1.
FibreChannel Clock Recovery (10.3125 and 10.51875 Gb/s) added with
option CR2.
This module has been superseded by the 80C08C.
H
80C08C -- 9.953/10.31/10.52/11.10 Gb/s Multi-rate amplified optical
module.
Clock Recovery (9.953 and 10.3125 Gb/s) added with option CR1. Clock
Recovery (10.3125 and 10.51875 Gb/s) added with option CR2.
Continuous-rate clock recovery added with CR4.
H
80C09 -- 9.953/10.71 Gb/s Multi-rate optical module.
Clock Recovery (9.953 and 10.709 Gb/s) added with option CR1.
This module has been superseded by the 80C11.
H
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80C10 -- 65 GHz optical module for 40 Gb/s RZ and NRZ telecom.
80C11 -- 9.953/10.31/10.52/10.66/10.71//11.10 Gb/s Multi-rate amplified
optical module.
Clock Recovery (9.953 Gb/s) added with option CR1.
Clock Recovery (9.953 and 10.66 Gb/s) added with option CR2.
Clock Recovery (9.953 and 10.71 Gb/s) added with option CR3.
Continuous-rate clock recovery added with CR4.
Electrical Sampling Modules.
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80E01 -- A single-channel, 50 GHz sampling module
80E02 -- A dual-channel, 12.5 GHz, 50 Ω, sampling module with low noise
80E03 -- A dual-channel, 20 GHz sampling module. This model provides the
same features as 80E04, but without the TDR step generators.
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H
H
80E04 -- A dual-channel, 20 GHz TDR sampling module. The TDR step
generator provides 35 ps reflected step risetime. Voltage polarity can be
reversed on either step to provide true differential TDR.
80E06 -- A single-channel, 70+ GHz sampling module. This model provides
very high performance bandwidth for general-purpose characterization of
high speed devices and circuits.
Other Modules.
H
80A01 Trigger Prescale Limiting Preamplifier Module -- A single-channel
module providing 8-14 GHz AC coupled 50 Ω limiting preamplification. It
increases the sensitivity of the prescale trigger input of the 8000 Series
instruments to ≤200 mVpk-pk
.
H
80A02 EOS/ESD Protection Module -- A module that protects the sensitive
input stage of instruments (such as the sampling bridge of Tektronix
electrical TDR sampling modules) from damage due to electro-overstress
(EOS) and electro static discharge (ESD) from the device under test (DUT).
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Check the Package Contents
Verify that you have received all of the parts of your instrument. You should
verify that you have:
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H
the main instrument.
all the standard accessories for the main instrument. Standard accessories are
listed in Table 1--3 on page 1--41.
H
H
the correct power cords for your geographical area.
the OS Rebuild CDs and Product Software CD that include an installation
copy of the software installed on the instrument and all files needed to
rebuild your instrument operating system if necessary. Store the CDs in a
safe location where you can easily retrieve them for maintenance purposes.
NOTE. Keep the certificate of authenticity that accompanies the product-software
CD.
H
the 8000 Series Demo Applications Software CD that includes an installa-
tion copy of the software. This CD, which is a separate CD from the
Oscilloscope software, includes the TDR Impedance Measuring application,
which implements the TDR calibration procedures specified by the
IPC-TM-650 test methodology, and the Fast NRZ application, which allows
you to improve throughput for when eye-pattern mask testing.
NOTE. New versions of the product and/or demo application software may
become available at our web sit. See Contacting Tektronix on page xiii.
Remember to fill out and send in the customer registration card. The registration
card is packaged in an envelope in the shipping package.
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Check the Package Contents
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Installation
This section covers installation of the instrument, addressing the following
topics:
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Check the Environment Requirements on page 1--9
Install the Sampling Modules on page 1--10
Connect the Peripherals on page 1--12
Power On the Instrument on page 1--13
Powering Off the Instrument on page 1--15
Brightness and Contrast Adjustment (Gamma) on page 1--15
Back Up User Files on page 1--15
The basic operating software is already installed on the hard disk. If reinstalla-
tion of software becomes necessary, see the following topic:
H
Software Installation on page 1--15
Check the Environmental Requirements
Read this section before attempting any installation procedures. This section
describes site considerations, power requirements, and ground connections for
your instrument.
Site Considerations
The instrument is designed to operate on a bench or on a cart in the normal
position (on the bottom feet). For proper cooling, at least two inches (5.1 cm) of
clearance is recommended on the rear and sides of the instrument.
You can also operate the instrument while it rests upright on its rear feet. If you
operate the instrument while it is resting on the rear feet, make sure that you
properly route any cables coming out of the rear of the instrument to avoid
damaging them.
CAUTION. Keep the bottom of the instrument clear of obstructions to ensure
proper cooling.
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Installation
Operating Requirements
Rackmount Requirements
Specifications in Appendix A list the operating requirements for the instrument.
Power source and temperature, humidity, and altitude are listed.
If this instrument is rackmounted, see the TDS8000 & CSA8000 Rackmount
Instructions for additional site considerations or operating requirements. This
document ships with the Option 1R (rackmount kit).
Install the Sampling Modules
CAUTION. Do not install or remove any sampling modules while the instrument is
powered on.
Always power the instrument down before attempting to remove or insert any
sampling module.
CAUTION. Sampling modules are inherently vulnerable to static damage. Always
observe static-safe procedures and cautions as outlined in your sampling module
user manual.
Check Your Sampling
Module Manual(s)
Read the appropriate sampling module user manual for instructions on how to
install your sampling modules, and then install them as outlined. (Sampling
modules do not ship preinstalled.)
NOTE. After first installing a sampling module(s) or after moving a sampling
module from one compartment to another, you should run compensation from the
Utilities menu to ensure the instrument meets it specifications. You must run a
compensation (accessed from the Utilities menu) whenever the extender
configuration is changed from that present at the last compensation. In short, if
you install or remove an 80E00 extender, run a compensation. If you exchange a
extender for one of a different length, run a compensation. For instructions on
running a compensation, see Optimizing Measurement Accuracy on page 3--92.
Figure 1--1 shows compartments for both large and small sampling modules,
along with the plug-in connector for the ESD wrist strap that you must use while
installing or removing these modules.
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Installation
Large-module compartments (2)
Small-module compartments (4)
Connect ESD wrist strap here
Figure 1-1: Compartments for sampling modules
Maximum Configuration
You can install up to two large sampling modules and four small modules for a
total of 10 inputs. Of these 10 inputs, only eight inputs can be active at one time
(see Figure 1--2, top two configurations). Also, note that installing a single large
module in either compartment disables the first small-module compartment (see
note). This configuration (see Figure 1--2, bottom configuration) limits the input
count to seven—one from the large, six from the small compartments.
NOTE. Power is still provided to this small slot, which does allow an 80A01 to
be functional in this slot even when a large module is installed.
CH 1
CH 2
Eight channels: Two large modules and
three small modules
1
N.A.
N.A.
CH 3
CH 4
CH 5
CH 6
CH 7
CH 8
N.A.
N.A.
Eight channels: No large and four
small modules
CH 1
CH 2
CH 3
CH 4
CH 5
CH 6
CH 7
CH 8
CH 1/N.A.
CH 2/N.A.
Seven channels: One large module,
installed in either compartment, and
three small modules
N.A.
N.A.
CH 3
CH 4
CH 5
CH 6
CH 7
CH 8
1
Not Available
Figure 1-2: Maximum inputs in three configurations
Install probes, cables, and other connection accessories to your sampling
modules as appropriate for your application and sampling module. Again,
consult your sampling-module and connection-accessory manuals. Continue with
the next section after installing the sampling modules.
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Installation
Connect the Peripherals
The peripheral connections are mostly the same as those you would make on a
personal computer. The connection points are shown in Figure 1--3. See
Table 1--1 on page 1--13 for additional connection information.
WARNING. Before installing peripheral accessories to connectors (mouse, keyboard,
etc.), power down the instrument. See Powering Off the Instrument on page 1--15.
Monitor.............
Printer......................
RS-232.................
Network.............................
1
PS2 mouse .......................
1
PS2 keyboard ................
USB................................
Audio line out.......................
Audio line in........................
Removable hard drive.....................
CD drive.........................
GPIB...........
Monitor....................
2
Card slot ...........
(only available with Option GT)
Gated trigger...........
1
2
Product ships with a USB keyboard that plugs into the USB port and a USB mouse that plugs into the back of the keyboard
PCMCIA card readers are not available on the following products: CSA8000B SN B020338 and above, TDS8000B SN B020346 and above.
Product software version 2.0 (or greater) does not support PCMCIA readers.
Figure 1-3: Locations of peripheral connectors on rear panel
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Installation
Table 1-1: Additional accessory connection information
Item
Description
Monitor
If you use a non-standard monitor, you may need to change the
the Windows display settings to achieve the proper resolution
for your monitor.
Printer
Other
Connect the printer to the EPP (enhanced parallel port)
connector directly. If your printer has a DB-25 connector, use
the adapter cable that came with your printer to connect to the
EPP connector. For information on printer usage, see Printing
Waveforms on page 3-126.
Refer to the Application release notes on your System Rebuild
CD for possible additional accessory installation information
not covered in this manual.
Power On the Instrument
Follow these steps to power on the instrument for the first time.
1. Check that the line fuses are correct for your application. Both fuses must be
the same rating and type. Fuse types require a unique cap and fuseholder. See
Table 1--2 and Figure 1--4.
Table 1-2: Line fuses
Cap & fuseholder
part number
200-2264-00
200-2265-00
Fuse type
Rating
Fuse part number
0.25 x 1.250 inch
5 x 20 mm
8 A, fast blow, 250 V
159-0046-00
6.3 A, fast blow, 250 V 159-0381-00
Power switch
AC power
Fuses
Figure 1-4: Line fuse and power cord connector locations, rear panel
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Installation
CAUTION. Connect the keyboard, mouse, and other accessories before applying
power to the product. Connecting the accessories after powering on the
instrument can damage the accessories. Two exceptions are the USB keyboard
and mouse that ships with the instrument. Both can be plugged or unplugged
without first turning power off.
2. Connect the keyboard and mouse, observing the caution above. Note that the
instrument ships with a USB keyboard, which plugs into the USB port (see
Figure 1--3 on page 1--12 for location) and a USB mouse, which plugs into
the back of the USB keyboard.
NOTE. Connection of the keyboard and mouse is optional. You can operate most
features without them, using the front-panel controls and the touchscreen.
3. Connect the power cord.
4. If you have an external monitor, connect the power cord and power on the
monitor.
5. Turn the Power switch on at the rear panel. (See Figure 1--4 on page 1--13 for
switch location.)
6. Push the On/Standby switch to power on the instrument (see Figure 1--5 for
the switch location).
Switch
Figure 1-5: On/Standby switch location
7. Wait for the boot routine and low-level self test to complete.
8. Follow any instructions on the screen.
The internal setup software will automatically configure your instrument and
install all required devices, depending on the installed accessories.
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Installation
Powering Off the Instrument
The instrument has a built-in soft power-down function that safely powers down
the instrument when you push the On/Standby button. You do not need to close
the UI application or Windows before using the On/Standby button.
To completely remove power to the instrument, first soft power-down the
instrument using the On/Standby button, and then set the power switch on the
rear panel to off.
Brightness and Contrast Adjustment (Gamma)
Although this instrument is set for optimal Gamma display before shipping, you
can adjust it to suit your preferences. If you wish to do so, use the Display
settings located in the Windows Control Panel.
Back Up User Files
You should back up your user files on a regular basis. Use the Windows Back Up
tool to back up files stored on the hard disk. The Back Up tool is located in the
System Tools folder in the Accessories folder.
1. Minimize the UI application by clicking the minimize (--) button in the
upper-right corner on screen.
2. Click Start in the Task bar to pop up the Start menu.
3. Select Programs > Accessories > System Tools > Backup in the Start menu.
4. Use the backup tool that displays to select your back-up media and to select
the files and folders that you want to back up. Use the Windows online help
for information on using the Backup tool. You can back up to the floppy
drive or to a networked storage device over the ethernet port (rear panel).
5. You can restore the UI application to the screen by clicking its button in the
Windows Task bar.
Software Installation
This section describes how to install the software found on the CSA8000 &
TDS8000 OS Restore and Product Software CDs that accompany this product.
The instrument ships with the product software installed, so only perform these
procedures if reinstallation becomes necessary.
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Installation
Description
There are two sets of CDs that ship with this instrument:
H
OS Rebuild CD. This 2-disk set contains the operating system for the
instrument. This CD set, which can be used to rebuild the instrument hard
drive, includes the Windows operating system installation.
H
Product Software CD. The product software, or UI application, complements
the hardware controls of the front panel, allowing complete set up of all
instrument features. The Product Software CD includes software allowing
you to reinstall the product software without having to rebuild the entire
operating system.
Software Release Notes
Read the software release notes README.TXT ASCII file if present on the
Product Software CD before performing any installation procedures. This file
contains additional installation and operation information that supercedes other
product documentation.
To view the README.TXT file, open the Notepad Windows accessory and open
the file on the CD. After installation, you can also read the copy from a directory
on the product:
C:\Programs Files\TDSCSA8000\System
Operating System
Reinstallation
If it becomes necessary to reinstall the Windows operating system, use the CDs
and instructions provided with your Windows Operating System Rebuild kit
(shipped with your instrument).
This process will return the hard disk to the its original condition present when
the instrument shipped.
NOTE. All data and programs you may have installed will be lost when reinstal-
ling the Windows Operating System.
System Diagnostics
Windows Safe Mode
In case of instrument problems, you may wish to run the system diagnostics. If
so, see the procedure Perform the Diagnostics, on page 1--18.
If the instrument is turned off before the operating system boots, or if you’ve
installed a third-party product with a driver incompatible with instrument start
up, Windows will open in Safe mode. The touchscreen will be inoperable;
therefore, you must install the standard-accessory mouse and keyboard to operate
the instrument.
When you have finished investigating and removed any barrier to Windows
start-up, you can reboot. If the instrument no longer boots to Safe mode, you can
remove the keyboard and mouse if desired.
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Incoming Inspection
This section contains instructions for performing an incoming inspection of this
instrument. Performance of an incoming inspection is not required to put the
instrument in service.
These instructions verify that the instrument is operating correctly after
shipment, but do not check product specifications. An incoming inspection
includes the following parts:
H
H
H
Perform the Diagnostics on page 1--18 runs the internal diagnostics.
Perform a Compensation on page 1--20 runs the self compensation routine.
Perform the Functional Tests on page 1--21 uses the DC CALIBRATION
OUTPUT and the INTERNAL CLOCK OUTPUT connectors to verify that
the instrument is functioning.
H
Perform the Hardware and Operating System Tests (Windows 98 only) on
page 1--38 uses a software program called QAPlus/Win to verify instrument
hardware and the MS Windows 98 operating system is functioning.
QAPlus/Win is only available on instruments using the MS Windows 98
operating system. Instruments using the MS Windows 2000 operating
system do not include QAPlus/Win software.
NOTE. The procedures that follow contain instructions based on the menus and
controls supported by the version 1.5 release and later of the instrument
firmware. The procedures will work for earlier versions of software, but the
control and menu names may vary slightly.
If the instrument fails any test within this section, it may need service. To contact
Tektronix for service, see Contacting Tektronix on page xiii of Preface.
Make sure you have put the instrument into service as detailed in Installation
starting on page 1--9. Then assemble the following test equipment and proceed
with the procedures that follow.
Assemble Equipment
To complete the incoming inspections procedures requires the following test
equipment:
H
H
One SMA cable, such as Tektronix part number 174-1427-00.
One 50 Ω BNC cable, such as Tektronix part number 174-1341-00.
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H
H
One SMA 10X attenuator, such as Tektronix part number 015-1003-00.
One or more (quantity to match number of electrical channels to compen-
sate) 50 Ω terminators, such as Tektronix part number 015-1022-01
H
H
One 50 Ω terminator cap, such as Tektronix part number 011-0049-02
One 80E00-series electrical sampling modules installed as outlined in its
User manual.
H
One 80C00-series optical sampling module installed as outlined in its User
manual (optional; test only if purchased with/for your instrument).
H
H
Mouse
Keyboard
Perform the Diagnostics
The instrument Diagnostics use internal routines to confirm basic functionality
and proper adjustment.
None
Equipment required
Prerequisites
First, all sampling modules to be diagnosed must be installed as
outlined in their user manuals.
Second, power on the instrument and allow a 20 minute warm-up
before doing this procedure.
1. Set up the instrument: From the application menu bar, select Utilities, and
then select Diagnostics. The Diagnostics dialog box displays. See below.
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2. Select a diagnostics suite:
a. In the dialog box, click the Subsystem Level tab.
b. Select the all the entries by clicking the first entry Control Proc and
dragging down to select the rest. All entries should be highlighted as
shown above.
c. In the Run box, leave Loop and Halt on Failure unchecked.
3. Verify that the diagnostic suite passes:
a. Click the Run button to execute the diagnostics.
b. The diagnostics may take several minutes to complete. Verify that Pass
appears as Status in the dialog box when the diagnostics complete.
c. If instead an error number appears as Status, rerun the diagnostics. If
Fail status continues after rerunning diagnostics and you have allowed
warm up to occur, the module or main instrument may need service.
4. Close the diagnostic dialog box.
End of Procedure
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Perform the Compensation
This procedure uses internal routines to verify that the instrument compensates
properly.
For sampling modules:
Equipment required
H
50 Ω terminations on all electrical module channels (Tektronix
part number 015-1022-xx).
H
Dust covers on all optical module channels.
The sampling modules ship from Tektronix with the proper termina-
tions and dust covers installed.
Prerequisites
First, all sampling modules to be compensated must be installed as
outlined in their user manuals.
Second, power on the instrument and allow a 20 minute warm-up
before doing this procedure.
1. Run the compensation routines:
a. From the application menu bar, select Utilities, and then select Com-
pensation.
In the Compensation dialog box, the main instrument (mainframe) and
sampling modules are listed. The temperature change from the last
compensation is also listed. See Figure 1--6.
Click to select compensate
Choose all as targets
Click to start compensation
Figure 1-6: Compensation dialog box
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b. Wait until the Status for all items you wish to compensate changes from
Warm Up to Pass, Fail, or Comp Req’d.
c. Under Select Action, click the Compensate option button.
d. From the top pulldown list, choose All (default selection) to select the
main instrument and all its modules as targets to compensate.
e. Click the Execute button to begin the compensation.
f. Follow the instructions to disconnect inputs and install terminations that
will appear on screen; be sure to follow static precautions (see the user
manual for your sampling module) when following these instructions.
NOTE. Failing to install the 50 Ω terminations on electrical inputs can yield
erroneous compensation failures or results.
2. Verify that the compensation routines pass:
a. The compensation may take several minutes to complete. Verify that
Pass appears as Status for the main instrument and for all sampling
modules listed in the Compensation dialog box when compensation
completes.
b. If instead Fail appears as Status, rerun the compensation. If Fail status
continues after rerunning compensation and you have allowed warm up
to occur, the module or main instrument may need service.
c. If you want to save the compensation constants generated by this
compensation, click the Save option button under Select Action. Click
the Execute button to save the compensation.
3. Close the compensation dialog box.
End of Procedure
Perform the Functional Tests
These procedures use the DC CALIBRATION OUTPUT and the INTERNAL
CLOCK OUTPUT connectors to further verify that the instrument functions
properly. An SMA cable and a 10x attenuator are required to do these test
procedures.
The purpose of these procedures is to confirm that the instrument functions
properly. The equipment required is intentionally kept to a minimum.
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STOP. These procedures verify functions; that is, they verify that the instrument
features operate. They do not verify that they operate within limits; therefore, do
not interpret any quantities cited (such as “about five horizontal divisions”) as
limits.
STOP. DO NOT make changes to the front-panel settings that are not called out
in the procedures. Each verification procedure will require you to set the
instrument to default settings before verifying functions. If you make changes to
these settings, other than those called out in the procedure, you may obtain
invalid results. In this case, go back to step 1 and repeat the procedure.
Verify Electrical Input
Channels
Install the test hookup and preset the instrument controls:
Equipment
required
One SMA cable, such as Tektronix part number 174-1427-00.
Prerequisites
At least one electrical (80E00 series) sampling module must be
installed as outlined in its user manual.
1. Initialize the instrument: Push the front-panel DEFAULT SETUP button,
and click Yes in the confirmation dialog box.
2. Set the Trigger System: In the UI application toolbar, select Internal Clock
from the Trig list box as shown below.
3. Hook up the signal source: Connect the SMA cable from the DC CALIBRA-
TION output to the channel input that you want to test as shown in
Figure 1--7.
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CSA8000/TDS8000
SMA cable from DC calibration
output to 80E00 C3 input
Figure 1-7: Hookup for electrical functional tests
4. Set the DC CALIBRATOR OUTPUT:
a. Push the Vertical MENU front-panel button. This displays the Vert
Setup dialog box.
NOTE. When an optical module is installed, the optical setup dialog box displays
by default. Click the Basic button to display the basic dialog box.
b. Enter a level of 200 mV in the DC CAL box.
c. Push the Vertical MENU front-panel button again to dismiss the Vert
Setup dialog box.
5. Select the channel to test: Push the channel button for the channel you want
to test. The button lights and the channel display comes on. See Figure 1--8.
Channel
buttons
Figure 1-8: Channel button location
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6. Verify that the channel is operational: Confirm that the following statements
are true:
H
H
The vertical scale readout for the channel under test shows a setting of
100 mV, and a DC level is at about 2 divisions above center screen.
The front-panel vertical POSITION knob (for the channel you are
testing) moves the DC level up and down the screen when rotated.
Return the DC level to 2 divisions above center screen before continuing.
H
Turning the vertical SCALE knob to 50 mV changes the amplitude of
the DC level to about 4 divisions above center screen, and returning the
knob to 100 mV returns the amplitude to about 2 divisions above center
screen.
7. Verify that the channel acquires in all acquisition modes: Push the
front-panel Acquisition MENU button to display the Acq setup dialog box.
Click each of the three acquisition modes, and confirm that the following
statements are true:
H
H
H
Sample mode displays an actively acquiring waveform on-screen. (Note
that there is a small amount of noise present on the DC level).
Average mode displays an actively acquiring waveform on-screen with
the noise reduced.
Envelope mode displays an actively acquiring waveform on-screen with
the upper and lower extremes of the noise displayed.
8. Close Acquisition setup dialog box: Push the Acquisition MENU button to
close the Acq setup dialog box.
9. Verify the DC accuracy compensation: Do the following substeps:
a. Select Measurement from the Setup menu. In the Meas Setup dialog box
that displays:
H
Select as Source the channel under test. For example, select Main C3
for channel 3.
H
H
Select Meas1.
Set the Select Meas menu to Pulse > Amplitude > Mean.
b. Push the Vertical MENU front-panel button to switch to the Vert Setup
dialog box.
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c. Set the Vertical Scale, Vertical Offset, and DC Calibration Output to the
levels shown in the first row of the table that follows.
d. In Measurement readout on screen, verify that the Mean measurement
for the channel under test falls within the limits given in the table.
e. Repeat steps c and d for each row in the table.
Vertical Scale
(mV/div)
Vertical Offset DC CAL Output
Limits
(mV)
-1000.0
0.0
(mV)
-1000.0
-450
0
Minimum (mV) Maximum (mV)
100
100
100
100
100
-1009.0
-461.0
- 2 . 0
-991.0
-439.0
2.0
0.0
0.0
450
439.0
991.0
461.0
1009.0
1000.0
1000.0
10. Test all channels: Repeat steps 3 through 9 until all electrical input channels
are verified.
11. Remove the test hookup: Disconnect the SMA cable from the channel input
and the DC CALIBRATION output.
Verify Optical Input
Channels
After verifying the electrical channels and if you have an 80C00 Series Sampling
Module installed, you can now verify its optical channels. This verification is
done without an input signal.
Equipment
required
None.
Prerequisites
At least one optical (80C00 series) sampling module must be installed
as outlined in its user manual.
1. Initialize the instrument: Push the front-panel DEFAULT SETUP button,
and click Yes in the confirmation dialog box.
2. Set the Trigger System: In the UI application toolbar, select Internal Clock
from the Trig list box as shown below.
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3. Select the channel to test: Push the channel button for the channel you want
to test. The button lights amber and the channel displays. See Figure 1--9.
Channel
buttons
Figure 1-9: Channel button location
4. Verify that the channel is operational: Confirm that the following statements
are true.
H
A baseline trace displays at about center screen (see Figure 1--10 on page
1--27) and the vertical scale readout for the channel under test shows a
setting as follows:
H
80C01, 80C02, 80C04, 80C09, and 80C11: 1 mW
80C03: 100 ꢀW
80C05: 3 mW
80C06: 6 mW
80C07, and 80C07B: 100 ꢀW
80C08, 80C08B, and 80C08C: 200 ꢀW
80C10: 3 mW
H
H
Turning the front-panel Vertical POSITION knob (for the channel you
are testing) moves the signal up and down the screen. Return the
baseline trace to center screen before continuing.
Turning the front-panel Vertical OFFSET knob counterclockwise offsets
the baseline towards the bottom of the screen; turning the knob
clockwise offsets the baseline towards the top of the screen, and
returning the knob to 0.000 offset returns the baseline to center screen.
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NOTE. If the position knob was set to 0.000, you can confirm this in the Vertical
menu (use Basic button in the dialog box).
Baseline
Vertical offset
Control bar
Vertical offset
setting
Figure 1-10: Optical channel verification
5. Verify that the channel acquires in all acquisition modes: Push the
front-panel button Acquisition MENU to display the Acq Setup dialog box.
Click each of the three acquisition modes and confirm that the following
statements are true:
H
H
H
Sample mode displays an actively acquiring waveform on-screen. (Note
that there may be a small amount of noise present on the baseline level).
Average mode displays an actively acquiring waveform on-screen with
any noise present reduced.
Envelope mode displays an actively acquiring waveform on-screen with
the upper and lower extremes of the noise displayed.
6. Close Acquisition setup dialog box: Push the Acquisition MENU button to
close the Acq setup dialog box.
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7. Test all channels: Repeat steps 3 through 5 until all optical input channels
are verified.
Verify the
Time Bases Work
After verifying the channels, you can now verify that the time bases function.
This verification is done using a front-panel signal.
Equipment
required
One SMA cable, such as Tektronix part number 174-1427-00.
One 10x SMA attenuator, such as Tektronix 015-1003-00.
One electrical (80E00-series) sampling module.
None
Prerequisites
1. Initialize the instrument: Push the front-panel DEFAULT SETUP button,
and click Yes in the confirmation dialog box.
2. Hook up the signal source: Connect the SMA cable from the Internal Clock
output through a 10x attenuator to the 80E00 sampling module input
channel 3 as shown in Figure 1--11.
CSA8000/TDS8000
SMA cable from
INTERNAL CLOCK
output to 80E00 C3 input
10x attenuator
Figure 1-11: Hookup for the time base tests
3. Set up the instrument:
a. Push the Trigger MENU front-panel button to display the Trig Setup
dialog box.
b. Click Internal Clock under Trigger Source in the Trig Setup dialog
box. The Internal Clock rate should be set to 200kHz.
c. Push the Trigger MENU front-panel button again to dismiss the Trig
Setup dialog box.
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d. Push the channel button for the channel you connected to in step 2. See
Figure 1--12 on page 1--29. The button lights and the channel display
comes on.
e. Turn the Vertical SCALE knob to set the vertical scale to 20 mV/div.
The channel scale readout is displayed in the Control bar at the bottom
of the graticule.
Channel
buttons
Figure 1-12: Channel button location
4. Set the time base: Set the Horizontal SCALE to 1 ꢀs/div. The horizontal
scale readout is displayed in the Control bar at the bottom of the graticule.
a. Set the display for Normal and Show Vectors (enable). See To Set
Display Styles on page 3--68.
b. Rotate vertical OFFSET knob counterclockwise so that the base of the
square wave is about 2 divisions below the center graticule.
NOTE. Otherwise, no vertical trace will be seen for rise and fall.
5. Verify that the Main time base operates: Confirm the following statements
are true:
H
One period of the internal clock signal (a square wave) is about five
horizontal divisions on-screen. See Figure 1--13 on page 1--30.
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NOTE. At some temperatures, there may be extraneous data points after the first
half cycle when viewing the front-panel Internal Clock output (as is done in this
step). This behavior may also occur when viewing multiple cycles in TDR mode.
In both cases, this behavior is normal.
H
Rotating the Horizontal SCALE knob clockwise expands the waveform
on-screen (more horizontal divisions per waveform period), counter-
clockwise rotation contracts it, and returning the horizontal scale to
1 ꢀs/div returns the period to about five divisions. Leave the time base
set to 1 ꢀs/div.
H
The horizontal POSITION knob positions the signal left and right
on-screen when rotated.
NOTE. The signal will not move past the minimum position setting.
s
Internal clock
signal
Control bar
Vertical scale
setting
Horizontal
scale setting
Figure 1-13: Main time base verification
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6. Set up the Mag1 time base:
a. Push the Horizontal View MAG1 button on the front panel. The Mag1
time base view will display under the Main time base view.
b. Set the Horizontal SCALE to 1 ꢀs/div. The horizontal scale readout is
displayed in the Control bar at the bottom of the graticule and is now
reading out the scale of the Mag1 time base view.
7. Verify that the Mag1 time base operates: Confirm the following statements.
H
The brackets on the Main View waveform (top graticule) are a full-
screen width apart (10 divisions). See Figure 1--14 on page the 1--31.
H
One period of the internal clock signal (a square wave) in the Mag view
(bottom graticule) is about five horizontal divisions on-screen. (Matches
the waveform in the top graticule.) See Figure 1--14.
H
Rotating the Horizontal SCALE knob clockwise to 500 ns/div expands
the waveform in the bottom graticule to double the period (about
10-horizontal divisions per waveform period) and returning the
Horizontal SCALE knob to 1 ꢀs/div returns the period to about five
divisions. Leave the Horizontal Scale set to 1 us/div.
Left mag time base
marker
Right mag time base
marker
Main time base view
Mag time base view
Figure 1-14: Mag time base verification
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8. Verify that the Mag2 time base operates:
a. Push the Mag1 button to remove the display of the Mag1 time base.
b. Perform steps 6 and 7, but use the Mag2 button instead of the Mag1.
This test verifies that the Gated Trigger (GT Option) is functional. This test is
done using a front-panel signal and a rear-panel TTL connection.
Perform Gated Trigger
Test
Equipment
required
One 50 Ω BNC cable, such as Tektronix part number 174-1341-00
One SMA cable, such as Tektronix part number 174-1427-00
One 50 Ω terminator cap, such as Tektronix part number 011-0049-02.
One SMA 10X attenuator (20 dB attenuator), SMA connector, such as
Tektronix part number 015-1003-00
One electrical (80E00-series) sampling modules.
Prerequisites
This test applies only to instruments that include option GT.
1. Initialize the instrument: Push the front-panel DEFAULT SETUP button,
and click Yes in the confirmation dialog box.
2. Push the channel 3 button to select it. The button lights and the channel
display comes on. See Figure 1--15.
Channel
buttons
Figure 1-15: Channel button location
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3. Hook up the signal source: Connect the SMA cable from the Internal Clock
output through a 10x attenuator to 80E00 sampling module input channel 3
as shown in Figure 1--16. Connect BNC cable to External Gate input at rear
panel.
Rear panel
CSA8000/TDS8000
TRIGGER
GATE (TTL)
SMA cable from
INTERNAL CLOCK
output to 80E00 C3 input
10x attenuator
BNC cable attached to TRIGGER
GATE (TTL) on the rear panel.
Figure 1-16: Hookup for the gated trigger tests
4. Set up the instrument:
a. Push the Trigger MENU front-panel button to display the Trig Setup
dialog box.
b. Click Internal Clock under Trigger Source in the Trig Setup dialog
box. The Internal Clock rate should be set to 200kHz.
c. Verify that the Gated Trigger option in Enhanced Triggering section is
selected (check box is checked). See To Use Gated Trigger, step 4 on
page 3--51.
d. Turn the Vertical SCALE knob to set the vertical scale to 50 mV/div.
The channel scale readout is displayed in the Control bar at the bottom
of the graticule.
5. Set the time base: Set the Horizontal SCALE to 2 ꢀs/div. The horizontal
scale readout is displayed in the Control bar at the bottom of the graticule.
6. Set the display for Normal and Show Vectors (enable). See To Set Display
Styles on page 3--68.
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7. Push the Horizontal MENU button, the Mode in All Timebases must be set
to Lock to Int. 10 MHz.
8. Verify that Triggering occurs: Verify signal is triggered with waveform
on-screen. See Figure 1--17 on page 1--34.
Triggered signal indicator
Internal
clock
signal
Control
bar
Vertical scale
setting
Horizontal
scale setting
Figure 1-17: Signal triggered
9. Disable trigger: Install 50 Ω terminator cap to the end of the cable that is
attached to the rear-panel gated trigger BNC. See Figure 1--16 on page 1--33.
10. Verify that the Gated Trigger functions: Verify signal is not triggered (gate
disabled). Signal freezes on the screen above to indicate triggering has
stopped. See Figure 1--18 on page 1--35. Note the Not Trigd indication at the
top of the window.
a. Push the CLEAR DATA button.
b. Verify signal is not triggered with no waveform on-screen (see Fig-
ure 1--19 on page 1--36). Note the Not Trigd indication at the top of the
window.
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Untriggered signal indicator
Control
bar
Vertical scale setting
Horizontal scale setting
Figure 1-18: Signal not triggered (signal frozen)
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Untriggered signal indicator
Control
bar
Vertical scale
setting
Horizontal
scale setting
Figure 1-19: Signal not triggered (no signal)
11. Verify that the Gated Trigger function is enabled: Disconnect 50 Ω
terminator cap from the end of the cable. Verify signal is triggered (gate
enabled) with waveform on-screen. See Figure 1--20 on page 1--37.
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Triggered signal indicator
Internal
clock
signal
Control
bar
Vertical scale setting
Horizontal scale setting
Figure 1-20: Signal triggered
12. Disconnect the test hook up.
End of Functional Test Procedures
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Perform the Hardware and Operating System Tests (Windows 98 Only)
NOTE. The procedures in this section only apply to instruments using the
MS Windows 98 operating system. Instruments using the MS Windows 2000
operating system do not include the QAPlus/Win software.
These procedures verify the instrument hardware functions. A diagnostics
program called QAPlus/Win is used to make the verifications. No equipment is
required.
QA+Win32 is a comprehensive software application used to check and verify the
operation of the PC hardware in the main instrument. This procedure uses
QA+Win32 to verify the instrument hardware. To run QA+Win32, you must
have either a working keyboard or a working mouse or other pointing device and
have Windows 98 running.
QA+Win32
CAUTION. Before running the QA+Win32 tests, be aware of the following
problems and work-arounds.
H
The QA+Win32 discrete memory test fails if the system being tested
contains more than 16 megabytes of RAM.
Since your product ships with more than 16 megabytes of RAM, please
follow the procedure for Checking the Hardware and Operating System on
page 1--39.
NOTE. Do not run the memory test from the Memory icon.
H
The QA+Win32 hard drive test may report an incorrect number of tracks and
cylinders for your hard drive.
This is an internal mapping problem, but has no effect on the results of the
test. Bad sectors on your hard drive are still found and marked.
H
The QA+Win32 keyboard test does not respond correctly to keys used by
Windows 98.
Keyboards made for use with Windows contain two or three keys specific to
that operating system. These are usually located on either side of the space
bar. QA+Win32 does not trap these keys when performing the keyboard test.
Do not press them.
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Incoming Inspection
Checking the Cooling Fan
Operation
Power on the instrument and visually inspect the left side panel of the instrument
to verify that all six cooling fans are rotating.
Equipment
required
None
Prerequisites
The instrument must be powered on and running.
To perform a minimal check of the hardware and Windows 98 operating system
of this instrument, perform this procedure to run QA+Win32 diagnostics from
the Windows 98 Start menu.
Checking the Hardware
and Operating System
Equipment
required
None
Prerequisites
A mouse and keyboard must be connected to the instrument and it
must be powered on.
1. Push the RUN/STOP front-panel button to stop acquisition.
2. Use CTRL-ALT-DEL to close the TDS/CSA8000 application.
3. Click Start, then select Programs, and then Sykes Diagnostics in the Start
Menu. Finally, click QA+Win32.
NOTE. You may experience a delay before the program starts.
4. Click Tools on the menu bar, then click Customize Test...
5. Click Default and exit this dialog by clicking OK.
6. Select and execute the following tests individually by clicking on the test
buttons (see the illustration on page 1--40) one at a time (see note) and
clicking Start:
a. COM Ports
b. LPT Ports
c. System Board
d. System Info
e. USB
f. Video
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Incoming Inspection
NOTE. A test button is not highlighted until you select it. As you select the button
for each test (tool tip appears when you point to the button), a highlight box
appears around the button. When you click Start, the button blinks until the test
is complete and the highlight box changes color to indicate the test is complete.
Follow any instructions appearing on the screen.
7. Check test results in scrollable results listing in the Test Results window of
the QAPlus test window. All tests should pass.
8. Close the QA+Win32 diagnostics by selecting Exit in the File menu or click
the Control Box (X) in upper right corner.
9. You can restart the TDS/CSA8000 product software application by clicking
Start, then selecting Restart from the Shutdown Windows dialog box.
End of Procedure
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Accessories and Options
This section lists the standard and optional accessories, as well as the product
options available for the instrument at the time this manual was published.
Accessories
Table 1--3 lists the standard accessories that ship with the instrument.
Standard
NOTE. The standard accessories that ship with any instrument modules are not
listed here. Each instrument module ships in its own package. Consult the user
documentation of the module for a list of accessories.
Table 1-3: Standard accessories
Item
H
Part number
Certificate of Traceable Calibration for product at initial shipment Not orderable
H
Business reply card
Not orderable
119-6297-00
119-6298-00
200-4519-00
016-1441-00
119-6107-00
006-3415-04
Not orderable
071-1099-xx
071-1096-xx
Not orderable
H
1 Windows compatible keyboard
1 Windows compatible mouse
1 Instrument front cover
H
H
H
1 Accessory pouch
H
2 Touchscreen styluses
H
1 ESD wrist strap with 6 foot coiled cord
CSA8000 & TDS8000 Online Help (part of application software)
CSA8000B & TDS8000B User Manual
CSA8000 & TDS8000 Reference
H
H
H
H
CSA8000 & TDS8000 Programmer Online Guide (part of
application software)
H
Oscilloscope Analysis and Connectivity Made Easy (manual and 020-2449-xx
CD with connectivity examples)
H
H
H
H
CSA8000 & TDS8000 Series Windows 2000 OS Restore Kit
CSA8000 & TDS8000 Series Product Software Kit
8000 Series Demo Applications Software CD
Power cord
020-2526-xx
020-2527-xx
020-2480-xx
Order by option
number
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Accessories and Options
Optional
The following accessories are orderable for use with the instrument at the time
this manual was originally published. Consult a current Tektronix catalog for
additions, changes, and details.
Table 1-4: Optional accessories
Item
H
Part number
80A02
80A02 EOS/ESD Protection module
Sampling Module Extender (1 meter)
Sampling Module Extender (2 meter)
3.5 Male to 3.5 Female SMA
H
012-1568-00
012-1569-00
015-0552-00
015-0553-00
015-1001-00
015-1002-00
015-1003-00
015-1014-00
H
H
H
Slip-on SMA connector
H
2X Attenuator (SMA Male-to-Female)
5X Attenuator (SMA Male-to-Female)
10X Attenuator (SMA Male-to-Female)
Power Divider
H
H
H
H
BNC Female 75 Ω to 50 Ω Type N Minimum Loss Attenuator 131-0112-00
H
P6209 4 GHz Active FET Probe
P6150 9 GHz Passive Probe
Replacement hard disk drive
P6209
H
P6150
H
119-6241-00
071-0438-xx
H
CSA8000 Series Communications Signal Analyzers
TDS8000 Series Digital Sampling Oscilloscopes
Service Manual
H
Calibration Step Generator
067-1338-00
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Accessories and Options
Options
The following options can be ordered for the instrument:
H
H
Option 1K: Cart
Option 1R: Rack Mount Kit (includes hardware and instructions for
converting to rackmount configuration)
H
H
Option GT: Gated Trigger option.
International Power Cords Options:
H
H
H
H
H
H
Option A1 -- Universal Euro 220 V, 50 Hz
Option A2 -- UK 240 V, 50 Hz
Option A3 -- Australian 240 V, 50 Hz
Option A5 -- Switzerland 220 V, 50 Hz
Option AC -- China 220 V, 50 Hz
Option A99 -- No power cord shipped
H
Service offerings:
H
H
H
H
H
H
H
Option C3: Three years of calibration services
Option C5: Five years of calibration services
Option D1: Calibration data report
Option D3: Test Data for calibration services in Option C3
Option D5: Test Data for calibration services in Option C5
Option R3: Repair warranty extended to cover three years
Option R5: Repair warranty extended to cover five years
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Operational Maps
This chapter acquaints you with how the instrument functions and operates. It
consists of several maps that describe the system, its operation, and its documen-
tation:
H
H
H
H
Documentation Map, on page 2--2, lists the documentation that supports the
instrument.
System Overview Maps on page 2--4, describe the high-level operating blocks
and operating cycle of the instrument.
User-Interface Map, on page 2--7, describes the elements of the User Interface
(UI) application, which provides complete control of the instrument.
Front-Panel Map, on page 2--8, describes the elements, such as control
buttons, of the instrument front panel and cross references information
relevant to each element.
H
H
Display Maps, on pages 2--9 and 2--10, describe elements and operation of
single-graticule and multiple-graticule displays.
I/O Maps, on pages 2--11 and 2--12, describe front and rear input/output ports
and peripherals on the front and rear panels.
Tutorial procedures are available online, as part of the online help. To display,
select the Setup Procedures from the UI application Help menu.
For information on configuring and installing your instrument, refer to
Chapter 1, Getting Started.
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Documentation Map
This instrument ships with documents individually tailored to address different
aspects or parts of the product features and interface. The table below cross
references each document to the instrument features and interfaces it supports.
To read about...
Refer to these documents:
Description
Standard accessories or packing list
Graphical packing list
The graphical packing list is one of the items you
should find when you open the instrument box. It
shows all items as they are packaged in the box.
Additionally, all standard accessories are listed on
page 1-41 of this manual.
Installation, Specification, & Operation
(overviews)
Main User Manual
Reference Manual
CD booklets
Read the Reference for a quick overview of
instrument features and their usage.
Read the User Manual for general information
about your instrument — procedures on how to put
it into service, specifications of its performance,
maps of its user interface controls, overviews and
background on its features.
Specific installation information for both the
operating system (OS) and product software is
located in each of the CD booklets accompanying
the CDs.
For more detailed usage information, see Online
Help System, below.
All about Sampling Modules
Electrical, Optical, or Other
Modules User Manual
Read these manuals for complete information
about the sampling modules you purchased —
how to install them in the instrument, how to use
them, and how to protect them from ESD.
The user manual for Electrical and Optical
Modules are provided on the product software CD
as PDF files. These are also available for
download on the Tektronix Web site. Other module
user manuals are provided with the module.
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Documentation Map
To read about...
Refer to these documents:
Description
Access online help from the instrument for
context-sensitive information on virtually all
controls and elements on screen.
In Depth Operation and UI Help
Online Help System
Online help includes a setup guide of procedures
for applying all instrument functions. See
Accessing Online Help on page 3-167.
Access this online guide from the instrument from
its Help menu. Quickly find the syntax for any
command, and copy the command if desired.
Read about communication, error handling, and
other information on GPIB usage.
Online Programmers Guide
GPIB Commands
<Space>
<NR3>
?
Information about other products is available on
the Tektronix website. See Contacting Tektronix for
information on how to access our website.
Analysis and Connectivity Tools
Oscilloscope Analysis and
Connectivity Made Easy
TekVISA Programming
VXIplug&play Driver Help
TekVISA Excel Toolbar Help
These documents help you use various connectiv-
ity and analysis tools that you can install. See
Analysis and Connectivity Support in the
instrument online help (described above) for more
information. Note that earlier instrument models
(TDS8000 and CSA8000) did not ship with these
tools.
You may also want to obtain the optional service manual for this product if you
carry out self-service or performance test this instrument. See Optional
Accessories on page 1--42.
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System Overview Maps
The instrument and its sampling modules comprise a highly capable waveform
acquisition, test, and measurement system. The following model provides
background information on its operation, which, in turn, may provide you insight
on how the instrument can be used.
Functional Model Map
Modular Sampling
Specialization
Signal Processing Display, I/O,
& Storage
User Interface
& Waveform Display
Digital Signal Acquisition
& Transformation
Channel
Channel
Channel
Input modules
Page 3-5
Chan 1-8
Acquisition
system
S P & T
systems
Page 3-53
CH1..8
Page 3-21
Page 3-14
Pages
3-73,
Ref 1-8
3-101,
3-141
Clock recovery
options only
Trigger
system
Timebase
system
Math 1-8
External trigger
inputs
Page 3-39
Page
3-101,
3-53
Gated trigger
TTL input
(option GT )
The model comprises five high-level subsystems or processes (embodying a
variety of hardware and software functions):
H
Modular Sampling Specialization System. Allows you to choose modules
to begin tailoring your waveform acquisition based on the types of signals
you want to acquire: electrical or optical; with clock recovery or without,
with bandwidth filter or not. Provides cost-effective solution for users
needing very high bandwidth with superb time resolution on repetitive
waveforms. Sampling modules determine the size of the vertical acquisition
window for each channel.
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System Overview Maps
H
Digital Signal Acquisition System. Acquires a waveform record from each
signal you apply to each channel using the following subsystems:
H
Acquisition System. Sets vertical offset for the vertical acquisition
window for each channel. Performs the actual A/D conversion and
storing of digitized samples. Also performs post A/D sample-based
corrections to compensate for non-linearities of various analog circuits.
H
Trigger System. Recognizes a specific event of interest on the input
trigger signal and informs the Timebase of the trigger event’s occurrence,
gating the taking of a sample after a controlled, incremental delay (see
page 3--17). The trigger event is defined as time zero for the waveform
record, which means that all samples are displayed relative to this point.
There is no internal trigger pick off from the channels; rather, a trigger
signal must be obtained through the external trigger inputs, from the
system clock, or from the clock recovery when available from optical
modules equipped with clock recovery.
For those CSA8000B and TDS8000B instruments equipped with the
Gated Trigger option (Option GT), the system allows triggering to be
enabled and disabled (gated) based on a TTL signal at a rear-panel input.
See the To Use Gated Trigger section on page 3--51 for more informa-
tion.
H
Timebase System. Tells the Acquisition system to take a sample (i.e.
convert from analog to digital) at some specific time relative to the
trigger (or clock) event. In more general terms, synchronizes the
capturing of digital samples in the Acquisition system to the trigger
events generated from the Trigger system.
H
H
Signal Processing Transformation System. Performs a variety of trans-
formations or operations, beginning with the most fundamental data
elements in the system, the channel waveforms. Waveform math operations,
automatic measurements, and histogram generation are examples.
Display, Input/Output, Storage Systems. Provides display control. Sets the
vertical scale and position of the display, which controls how much of the
vertical acquisition window appears on screen. Provides output (and
sometimes input) of instrument-data elements in a form suitable to the user.
The process overview that follows describes each step in the top-level cycle of
instrument operation.
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System Overview Maps
Process Overview Map
Process overview
Process block description
1. The instrument starts in the idle state; it enters this state
upon power up, upon receiving most control setting changes,
or upon finishing acquisition tasks.
Idling...
Reset
Abort
Power On
Yes
1
Stop
condition?
2. When you toggle its RUN/STOP control to RUN, the
instrument implements its setup based on the current
control settings (upon start up, these are default or last
setup depending on user-set preferences).
No
Implement
setup
3. The instrument then begins waiting for a trigger. No sampling
takes place until triggering criteria are met or a free-run
trigger is forced (Auto-trigger mode only). The instrument
accepts trigger.
Wait for trigger/
accept trigger
4. The instrument then waits a delay time, that is, it delays
taking a sample until a specified time elapses, where:
Delay time = Horizontal Pos. + Ch. Deskew + N sample intervals
Wait Delay time
In the above calculation, N = Current sample count - 1
For example, if taking the 6th sample in the waveform record,
5 sample intervals are added.
Add one
sample interval
to Delay time
5. The instrument takes one sample for each waveform record
(channel) for each active (on) timebase. This instrument
sequentially samples: one sample is taken per trigger for
each active channel in each displayed timebase.
Take 1 sample
per active
channel
6. If averaging or enveloping is on, each record becomes part of
a multi-acquisition record that these modes produce (see
page 3-22). The process loops back to step 3 above to
acquire additional records until the number of acquisitions
required for the acquisition mode currently set are processed,
and then processing continues as for step 8 below.
Waveform
record
complete?
No
7. If FrameScan mode is on, the acquisition process is
modified. See FrameScan Acquisitions on page 3-30 for
information on how FrameScan works.
Yes
8. At this point the acquisition record is in channel acquisition
memory and is available to the instrument for measurement
of its parameters, display, output, and so on.
Waveform
available
The instrument then checks for user-specified stop condition
and either returns to its idle state or continues at step 3,
according to what it finds.
1
Note: if acquiring when powered down, the oscilloscope may skip the
idle state and resume acquisition starting with step 3.
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User Interface Map - Complete Control and Display
Menu Bar: Access to data I/O,
printing, online help system,
and set-up functions
Status Bar. Trigger status
and waveform count
Tool Bar: Handy access to
key features, including the
setup dialogs, acquisition
modes, triggering modes,
and online help
Measurements Bar: Quick
access to automated
measurements by signal type
and category; click
Readout Bar. Toggle
individual readouts on and
off by clicking its button
A Readout. Right click
any readout to display a
short-cut menu providing
handy access to
often-used setup controls
and properties for the
feature associated with
the readout
measurement buttons to
measure the selected waveform
Display: Live, reference, and
math waveforms display here,
along with cursors, masks,
etc. to analyze them
Waveform Bar: Access to
waveform selection (click),
waveform position (drag),
and waveform properties
(right-click)
Readouts: Display up
to five readouts in this
area, selectable from
the Readout Bar
Controls Bar: Quick access
to waveforms and timebases
for display, and to their scale,
offset, and position controls
for adjustment
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Front Panel Map - Quick Access to Most Often Used Features
Turn knob to adjust most control fields in setup dialogs.
Press the Select button to switch among fields. Press the
Fine button to toggle between normal and fine adjustment.
Press to start and stop acquisition or clear
all channel waveforms at once. Page 3-26.
Press a Menu button to quickly access the setup dialog for
its control group for more detailed set up.
Press to display measurement cursors and set the knob
and Fine (adjust) and Select buttons to control them.
Page 3- 89.
Press to quickly return to instrument-default
control settings. Page 3-13.
Press to automatically set up the instrument controls
based on selected channels. Page 3-11.
Press to access print dialog for
printing the display. Page 3-131.
Press to display the cluster of Setup Dialogs
for comprehensive set up of the instrument.
Press to toggle the touch screen on and off. Use the
touch screen to control UI when you haven’t installed a
mouse. Page 3-60.
Select a waveform type, Channel,
Reference, or Math, to display or adjust on
screen (selected button lights). Page 3-62.
Press to display and select a waveform not yet displayed;
press to select among displayed waveforms;
press again to turn a selected waveform off.
Button lights indicate displayed and selected waveforms.
Page 3-62.
Press to display and select a time base view not
selected, or to select among displayed views;
press selected timebase again to toggle it off
(except Main which is always on). Page 3-64.
Turn knobs to vertically scale, position, and
offset selected waveform. Page 3-8.
Turn knobs to Horizontally scale, position,
and set record length of selected waveform.
Page 3-10.
Use controls to set trigger level and lights
to monitor trigger state. Page 3-48.
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Display Map - Single Graticule View
Drag cursors to measure
waveforms on screen.
Drag the Horizontal Reference to move
the point around which horizontal scaling
expands and contracts the waveforms.
Drag the Waveform Icon vertically
to position waveform.
Right click on a waveform or its
icon for handy access to often
used setup controls and properties.
Drag ground reference icon to add
offset to a waveform.
Drag across the waveform area to
zoom the boxed waveform segment
to full screen width.
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Display Map - Multiple Views
Drag the markers to enclose
the portion of waveform to
appear in Mag 2 View.
Drag the markers to enclose
the portion of waveform to
appear in Mag 1 View.
MAIN View
Drag the border between
graticules to vertically size
Main, Mag1, and Mag2
Views.
Mag
Mag
View
View
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Front Panel I/O Map
Floppy disk drive accessible
from Windows 98
Compartments for large
modules, up to two channels
INTERNAL CLOCK OUTPUT
DC CALIBRATION OUTPUT
Compartments for small
modules, up to eight channels
EXTERNAL 10 MHZ REFERENCE INPUT
ANTISTATIC CONNECTION for
wrist strap, 1 MΩ to ground
TRIGGER
TRIGGER
DIRECT
input
TRIGGER
PROBE
PRESCALE
input
POWER
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Rear Panel I/O Map
Removable hard disk drive to provide
individual environment for each user or to
secure data, press to release
CDROM drive accessible from
Windows, press to open
USB connector for mouse or
keyboard and mouse
PS-2 connectors for mouse and keyboard
Upper VGA port to connect a second
monitor for side-by-side display
Lower VGA port to connect a
monitor for oscilloscope display
Parallel port (Centronics) to
connect printer or other device
GPIB port to connect to controller
RJ-45 connector to connect to network
COM1 serial port
Card Bus slots for two PCMCIA type-1
cards, two type-2 cards, or one type-3
1
card
TRIGGER GATE (TTL)
1
PCMCIA card readers are not available on the following products: CSA8000B SN B020338 and above,
TDS8000B SN B020346 and above. Product software version 2.0 (or greater) does not support PCMCIA readers.
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Overview
This chapter describes how the many features of the instrument operate. Please
note the following points on using this chapter:
H
Each section in this chapter provides background information needed to
operate the instrument effectively as well as the higher-level procedures for
accessing and using the features. These procedures emphasize using the front
panel when possible.
H
Lower-level, detailed usage procedures are in the online help system.
The table that follows lists the sections in this chapter.
Section
Description
Page no.
3-3
Acquiring Waveforms
Triggering
Provides an overview of capturing signals and digitizing them into waveforms
Provides an overview of the instrument trigger features and their use
Provides an overview of display operation
3-39
Displaying Waveforms
Measuring Waveforms
3-53
Provides an overview of the the cursors and automatic measurements tools this
instrument provides and how to use them
3-73
Creating Math Waveforms
Data Input and Output
Provides an overview of how you can mathematically combine acquired waveforms and
measurement scalars to create a math waveform that supports your data-analysis task
3-101
Provides an overview of the input and output capabilities of your instrument
3-113
3-141
Using Masks, Histograms,
and Waveform Databases
Provides an overview of the statistical tools this instrument provides and how to use
them: mask testing, histograms, and waveform databases
Accessing Online Help
Provides an overview of the help system, which is integrated as part of the instrument
user interface, and describes how to access it
3-167
3-175
Cleaning the Instrument
Provides instructions on how to clean the exterior of the instrument and its touch screen
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Acquiring Waveforms
Before you can display, measure, or analyze a waveform, you must acquire it
from a signal. This instrument comes equipped with the features you need for
capturing your waveforms. The following topics provide an overview of captur-
ing signals and digitizing them into waveform records:
H
Signal Connection and Scaling: How to connect signals to the instrument
channels; how to offset channels and position and scale the time bases for
acquiring waveforms; how to scale and position waveforms in the display.
H
H
H
Setting Acquisition Controls: How to choose the appropriate acquisition mode
for acquiring your waveforms; how to start and stop acquisition.
Acquisition Control Background: Information describing the data-sampling
and acquisition processes.
FrameScan Acquisitions: How to use FrameScan acquisition to help analyze
pattern-dependent failures in high bit-rate communications signals.
Signal processing
& transformation
system
Acquisition
system
Output and
storage
User Interface
and display
Sampling
module
Trigger
system
Time base
system
NOTE. This section describes how the vertical and horizontal controls define the
acquisition of live, channel waveforms. These controls also define how all
waveforms are displayed, both live and derived waveforms (math and reference
waveforms). The following sections cover display-related usage:
H
H
Displaying Waveforms on page 3--53.
Creating Math Waveforms on page 3--101.
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Acquiring Waveforms
Signal Connection and Scaling
This section presents an overview of the instrument features related to setting up
the input signal for digitizing and acquisition. It addresses the following topics:
H
Where to find information for installing sampling modules and connecting
input signals
H
H
How to turn on channels and adjust their vertical scale, position, and offset
How to set the horizontal scale, position, and record length of the Main (time
base) View
NOTE. Terminology: This manual uses the terms vertical acquisition window and
horizontal acquisition window. These terms refer to the vertical and horizontal
range of the acquisition window, which defines the segment of the input signal
that the acquisition system acquires. The terms do not refer to any windows or
display windows on screen. See Conventions on page xii.
Vertical
offset
Vertical
position
Vertical
scale
Sampling
module
Acquisition
system
Display
system
Horizontal Horizontal Horizontal
scale
position
record
length
Figure 3-1: Acquisition and display controls
Why Use?
Use signal conditioning and scaling controls to ensure the instrument acquires
the data that you want to display, measure, or otherwise process. To ensure the
best possible data for further processing, you do the following:
H
Set vertical scale to adjust the waveform size on screen. You can set vertical
offset to shift the vertical acquisition window up or down on the signal to
capture the portion you want.
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H
Set horizontal scale to control the time duration of the horizontal acquisition
window to capture as much as you want of the input signal(s). To control
where in the input signal (data stream) that the horizontal acquisition
window acquires, you set horizontal position to delay the window relative to
a trigger to capture the waveform portion you want. To increase or decrease
the resolution between sample points, change the record length.
For more background on the acquisition window concepts, see Signal Condition-
ing Background on page 3--13.
What’s Special?
A Versatile Autoset. Autoset can be defined to set up for a waveform edge, period,
or an eye/bit pattern. Pushing the Autoset button automatically sets up the
instrument controls for a usable display based on the property you choose and
the characteristics of the input signal. Autoset is much faster and easier than a
manual control-by-control setup. You can also reset the instrument to its factory
default settings by pushing the Default Setup button.
What’s Excluded?
The vertical offset cannot be adjusted for any reference waveform, because a
reference waveform is a static, saved waveform, and offset adjusts the acquisi-
tion hardware for acquiring live waveforms. Also, TDR waveforms, if displayed
in rho or ohm units, cannot be adjusted for vertical offset.
The vertical offset of a math waveform cannot be adjusted directly. You can
adjust the offset of waveform sources (waveforms included in the math
expression) for the math waveform if the sources are live waveforms.
Keys to Using
The key points that follow describe operating considerations for setting up input
scaling, offset, and position to properly acquire your waveforms.
Sampling Modules Selection and Signal Connection. Select the sampling module,
optical or electrical, that best fits your sampling task, whether it is connecting to
a fiber or electrical cable to test a digital data stream, or to a test fixture through
SMA cables to characterize a device. The connection to the sampling module
depends on your application.
Tektronix provides 80E00-series (electrical) and 80C00-series (optical) sampling
modules for this instrument; you can read about any sampling module and its
connections in the sampling-module user manual(s) that shipped with your
product. (Insert your sampling-module user manual(s) in Appendix C at the back
of this manual for ready reference.) You can also check your Tektronix catalog
for connection accessories that may support your application.
Up to eight acquisition channels are available, depending on the sampling
modules installed. Each channel can be displayed as a waveform or can
contribute waveform data to other waveforms (math and reference waveforms,
for example).
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CAUTION. Install sampling modules before applying power and before connect-
ing them to the signals you want to test. See your sampling-module user manual
for instructions.
CAUTION. Sampling modules are inherently vulnerable to static damage. Always
observe static-safe procedures and cautions as outlined in your sampling-module
user manual.
Coupling Concerns. Electrical sampling modules provide only straight-DC
coupling to their sampling circuits, with no protection. All modules specify a
maximum vertical nondestructive range that limits signals to small levels,
typically about 2 to 3 volts (DC + ACpk-pk). (See Specifications in the user
manual for your sampling module for exact limits.) Do not exceed the limit, even
momentarily, as the input channel may be damaged.
All modules also specify a dynamic range that, if exceeded, could cause
acquisition and measurement errors due to nonlinearity. Do not exceed this limit.
(See Specifications in the user manual for your sampling module for exact
limits.)
NOTE. Optical sampling modules may have dynamic range exceeded without
obvious visual indications onscreen because the photo detector and/or filters
used may not necessarily be able to pass through overloaded signals to the
sampler.
Use external attenuators if necessary to prevent exceeding the limits just
described. Note that there are no hardware bandwidth filters in most sampling
modules or in the instrument. (Some optical sampling modules have bandwidth
filters settable from the Vertical Setup menu of the instrument. See the user
manual for your optical sampling module for more information.)
Scaling, Offset, and Positioning Considerations. These key controls determine the
portion of the input signal presented to the acquisition system:
H
Set the vertical offset to display the features of interest on your waveform
and avoid clipping. (See Note that follows.) Adjust the display control
Vertical Scale to control the portion of the vertical window displayed on
screen; adjust the display control Vertical Position to position the waveform
on screen. Note that vertical offset affects the vertical acquisition window,
but vertical scale and position do not. These last two controls are display
controls only. Vertical Acquisition Window Considerations on page 3--14
describes the vertical acquisition window.
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Clipped
H
Set horizontal scale, position, and resolution (record length) so that the
acquired waveform record includes the signal attributes of interest with good
sampling density on the waveform. The settings you make define the
horizontal acquisition window, described in Horizontal Acquisition Window
Considerations on page 3--17. (“Good sample density” might be at least
five samples on each waveform transition when acquiring for timing
measurements. The trade off for increased sample density is increased time
to acquire.)
NOTE. Waveform data outside the vertical acquisition window is clipped; that is,
the data is limited to the minimum and/or maximum boundaries of the vertical
acquisition window. This limiting can cause inaccuracies in amplitude-related
measurements. See Vertical Acquisition Window Considerations on page 3--14.
Trigger and Display. Set basic trigger controls to gate waveform acquisition, and
use the display to interactively set scale, position, and offset waveforms. See the
sections Triggering on page 3--39 and Displaying Waveforms on page 3--53.
Selected Waveform. Many of the controls of this instrument, especially the
vertical controls, operate on the selected waveform. The instrument applies all
actions that only affect one waveform at a time, such as applying a changes to
the vertical control settings, to the selected waveform.
NOTE. You can select a channel waveform, a math waveform, or a reference
waveform. The procedures here describe how to select and set up channel
waveforms for acquisition. See Displaying Waveforms on page 3--53 for
information regarding using the controls for adjusting display of reference and
math waveforms.
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Flexible Control Access. The product provides multiple methods for adjusting
acquisition controls. This manual focuses on basic setup through the front panel,
and the use of the User Interface (UI) Application displayed full screen. See the
display maps, beginning on page 2--9, for UI alternatives to controlling vertical
and horizontal setup. The online help system also documents the UI.
To Set Up the Signal Input
Use the procedure that follows when setting up the instrument to scale and
position input signals for acquisition.
CAUTION. Sampling modules are inherently vulnerable to static damage. Always
observe static-safe procedures and cautions as outlined in your sampling-module
user manual.
Overview
To set the signal input
Related control elements and resources
Prerequisites 1. The instrument must be installed with sampling modules
in place. The acquisition system should be set to run
continuously.
See the sampling-module user manuals for sampling
module installation. See page 3-24 for acquisition
setup and page 3-48 for trigger setup in this manual.
Also, an appropriate trigger signal must be routed to the
instrument and triggering must be set up.
Connect the 2. Connect to the signal to be acquired using proper
input signal
probing/connecting techniques. See the user manual for
the sampling module you have chosen.
Note: For more details on controlling vertical setup,
push the Vertical MENU button to display the Vertical
Setup dialog box, and then click its HELP button.
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Overview
To set the signal input (cont.)
Related control elements and resources
3. Push the channel button (turns amber) to assign
the waveform buttons, 1 - 8, to operate on
channel waveforms. Push a waveform button to
select the signal channel (it displays).
Select the input
signal channel
A waveform button lights when its channel is on:
H
When on but not selected, its button is lighted
green.
H
When on and selected, its button is lighted
amber.
Hint. To select one of the channels already
displayed, you can use a mouse and click its trace
or its reference indicator to select it.
Set the vertical 4. Use the Vertical Offset knob to adjust the selected
acquisition
window
waveform on screen. Use the Vertical Scale and
Position knobs to adjust the display.
Positioned vertically
Scaled vertically
Offset vertically
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Overview
To set the signal input (cont.)
Related control elements and resources
Set the
5. Push the View Main button to make sure the main time
base view is selected. Use horizontal knobs to scale and
position the waveform on screen and to set sample
resolution.
horizontal
acquisition
window
Scaled horizontally
Positioned horizontally
The Resolution knob sets the record length. (See
discussion on page 3-19.)
Push Set to 50% if required to stabilize display.
Continue with 6. To finish the acquisition setup, you must set the
the acquisition
setup
acquisition mode and start the acquisition.
See To Set Up Acquisition Controls on page 3-24.
For more help 7. For more information on the controls described in this
procedure, push the Vertical or Horizontal MENU
button. Click the HELP button in the setup dialog box
that displays.
End of Procedure
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To Autoset the Instrument
With an input signal connected, use the procedure that follows to autoset based
on the characteristics of the input signal. Autoset operates on the selected
channel only.
Overview
To autoset
Control elements and resources
Prerequisites 1. The instrument must be installed with sampling modules
in place. Signals must be connected to channels. A
triggering source must be provided.
2. At least one channel must be turned on (its front-panel
button lighted).
See the sampling-module user manuals for help with
installing sampling modules. See page 3-48 in this
manual for trigger setup information.
Execute 3. Push the Autoset button to to execute an autoset on the
selected waveform.
If you use Autoset when one or more channels are
displayed, the instrument uses the selected channel for
horizontal scaling. Vertically, all channels in use are
individually scaled.
Note. Autoset can execute on live waveforms (either
channel or math) in the Main time base.
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Overview
To autoset (cont.)
Control elements and resources
Define 4. Click Define Autoset in the Utilities menu to display
the Autoset properties dialog box. To change the autoset
criteria, select from:
H
H
H
Edge to setup the default autoset for instrument to
acquire the waveform data such that the center
20% of the record contains a rising edge.
Period to setup the default autoset for instrument
to acquire the waveform data such that the record
contains 2 or 3 periods.
NRZ Eye to setup the default autoset for instru-
ment to acquire the waveform data as follows:
H
one bit (two eye crossings) is displayed over
about 7.5 horizontal divisions, centered on the
screen.
H
the high/low values are displayed over about 6
vertical divisions, also centered on screen.
H
RZ Eye Pattern to setup the default autoset for
instrument to acquire the waveform data as follows:
H
three rise/fall edges are displayed over the
center 6 horizontal divisions, with the first
rising edge placed near the 20% horizontal
location (second division).
H
amplitude (the high/low values) is displayed
over the center 5 vertical divisions.
Click OK to set Autoset to use the current criteria. To
execute, push the Autoset button.
For More 5. For more information on the controls described in this
Information
procedure, push/click the HELP button in any dialog
box or select Help Contents and Index in the Help
menu.
End of Procedure
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NOTE. Autoset sets the vertical position to zero and adjusts the vertical offset to
center the signal in the display.
If a standard mask is active for the selected waveform, Autoset adjusts the
selected waveform record to match the mask, if possible. Autoset adjusts the
vertical scale and offset, horizontal scale, position, and reference parameters as
required for the mask standard.
To Reset the Instrument
You may want to revert to the factory default setup; if so, use the following
procedure to reset the instrument:
Overview
To reset to factory defaults
Control elements and resources
Prerequisites 1. The instrument is powered on and running.
See Power On Instrument on page 1-13.
Execute 2. Push the Default Setup button.
End of Procedure
Signal Conditioning
Background
This section contains background information that can help you more effectively
set up the acquisition window of each channel.
Input. This instrument samples sequentially, in order to provide superior
bandwidth and time resolution. Sequential sampling systems sample the input
without scaling it (they have a fixed dynamic range); therefore, input protection
and dynamic range are necessarily limited.
CAUTION. Do not overdrive the inputs. Also observe static-safe procedures and
cautions as outlined in the sampling-module user manual. Sampling modules are
very sensitive to ESD.
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Autoset Considerations. Autoset acquires samples from the input signal and
attempts to take the following actions based on the input data:
H
H
H
Evaluate the amplitude range of the input signals and offset of the vertical
acquisition window to acquire the signal without clipping.
Set the trigger level to the approximate midlevel of the trigger signal being
applied (either an external trigger or a clock-recovery trigger).
Evaluate the signal transitions and set the horizontal scale to produce a
waveform display based on the Autoset mode selected: Edge, Period, or
Bit/Eye Pattern.
Sometimes Autoset cannot produce a correct display due to the nature of the
input signal; if so, you may have to adjust the scale, trigger, and acquisition
controls manually. Some conditions that can cause Autoset to fail are:
H
H
H
H
H
H
no signal present.
signals with extreme or variable duty cycles.
signals with multiple or unstable signal periods.
signals with too low amplitude.
no recognizable trigger signal.
no eye diagram waveform present when autosetting in Bit/Eye Pattern
autoset mode.
Vertical Acquisition Window Considerations. The size of the vertical acquisition
window is determined by the operating range of the the sampling module and
any probe connected to it. The vertical offset determines where the vertical
window is positioned relative to ground. Parts of the signal amplitude that fall
within the vertical window are acquired; parts outside (if any) are not (they are
clipped).
As an example, consider that a basic 80E00-series sampling module, with a
maximum 100 mV/div scale, covers 1 volt over 10 divisions. Changing the
vertical scale setting only changes how much of the vertical window displays on
screen; changing vertical position simply changes the space on the screen where
the data is displayed.
You can set the vertical scale, position, and offset of each channel independently
of other channels.
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The vertical scale and position controls do not affect the vertical acquisition
window, rather they adjust the display system to display the waveform as
follows:
H
The vertical scale (per division) setting determines the portion of the vertical
acquisition window that appears in the graticule, allowing you to scale it to
contain all of the window or only part. Figure 3--2 shows two vertical
acquisition windows that contain the entire waveform, but only one window
contains the entire waveform in the graticule on screen.
a. Volts/Div setting determines the size of the display graticule within the vertical
acquisition window (scale set to 50 mv/div.)
+0.50 volt
Vertical window
+0.25 volt
C1
Graticule
-0.25 volt
-0.50 volt
b. Vertical position can change location of display graticule within 5 divisions
(position set to --4 divisions)
+0.50 volt
+0.45 volt
Vertical window
Graticule
C1
-0.05 volt
-0.5 volt
Figure 3-2: Setting vertical scale and position of input channels
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NOTE. Amplitude-related automatic measurements (for example, peak-to-peak
and RMS) will be accurate for vertical windows like those shown in
Figure 3--2 a and b on page 3--15 because neither waveform is clipped (that is,
both waveforms are acquired). But if the signal amplitude were to extend outside
the vertical acquisition window, the data acquired becomes clipped. Clipped
data causes inaccurate results if used in amplitude-related automatic measure-
ments. Clipping also causes inaccurate amplitude values in waveforms that are
stored or exported for use in other programs.
H
The vertical position adjusts the display of the graticule relative to the
vertical acquisition window (position is a display control). Figure 3--2 b
shows how vertical position moves the waveform graticule vertically in the
vertical acquisition window to place the acquired waveform in the graticule
display. Position does not determine what data is acquired as does vertical
offset.
The vertical offset control affects the vertical acquisition window and the
displayed waveform as follows:
H
The vertical range (window) is always centered around the offset value that
is set. Vertical offset is the voltage level at middle of the vertical acquisition
window. With no (zero) offset (see Figure 3--3), that voltage level is zero
(ground).
H
As you vary vertical offset, the middle voltage level moves relative to zero.
This moves the vertical acquisition window up and down on the waveform.
With input signals that are smaller than the window, it appears the waveform
moves in the window. Actually, a larger signal shows what really happens:
the offset moves the middle of the vertical acquisition window up and down
on input signal. Figure 3--3 shows how offset moves the acquisition window
to control the portion of the waveform amplitude the window captured.
H
Applying a negative offset moves the vertical range down relative to the DC
level of the input signal, moving the waveform up on the display. Likewise,
applying a positive offset moves the vertical range up, moving the waveform
down on the display. See Figure 3--3.
NOTE. On screen, the channel icon in the waveform bar points to the offset value
around which the vertical acquisition window is centered. The offset value
pointed to is relative to the ground reference icon. Both icons are shown in
Figure 3--3.
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Vertical window = 1 V peak-to-peak (fixed by sampling module used)
Acquisition window shifts
positive to capture overshoot
Offset +300 mV
(Near waveform top level)
C1
C1
C1
Offset 0.0 V
(At waveform ground reference)
Offset -300 mV
(Waveform bottom level)
Acquisition window shifts
negative to capture preshoot
Figure 3-3: Varying offset positions vertical acquisition window on waveform
amplitude
NOTE. Measurements use the entire portion of the waveform that the vertical
window captures, not only the portion displayed on screen. Also, waveforms
exported or saved (from the File menu or over the GPIB) contain data from the
entire vertical window, not just the on-screen portion.
Horizontal Acquisition Window Considerations.You define the horizontal
acquisition window, that is, you set several parameters that determine the
segment of an incoming signal that becomes the waveform record when
acquired. (For background, please read Waveform Record on page 3--28.) These
common parameters specify a common horizontal acquisition window that is
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applied to all channels in parallel. (See Independent vs. Shared Window on
page 3--20.) These parameters are:
H
The external trigger signal that you input and set the trigger system to
recognize determines the point relative to the input waveform that triggers
the instrument.
H
H
The horizontal position you set determines the horizontal delay from the
trigger point to the first sample point in the acquisition window.
The horizontal scale you set, and the requirement that all waveforms fit
within the 10 horizontal-division display, determines the horizontal duration
of the window relative to any waveform, allowing you to scale it to contain a
waveform edge, a cycle, or several cycles.
Horizontal position
Sample interval
First sampled and
digitized point
Trigger event on
Ext. trigger signal
Horizontal
acquisition
Horizontal
window
delay
Time of first point
Figure 3-4: Horizontal acquisition window definition
H
The record length (along with the horizontal scale) you set for the 10-divi-
sion window determines the sample interval (horizontal point spacing or
resolution) on the waveform.
NOTE. The horizontal position controls the distance to the Horizontal Reference
to indirectly set the time to the first sampled point. See Horizontal Position and
the Horizontal Reference on page 3--59 for a discussion of this relationship.
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Horizontal Scale vs. Record Length vs. Sample Interval vs. Resolution. These
parameters all relate to each other and specify the horizontal acquisition window.
Because the horizontal acquisition window must fit in the 10 horizontal division
display, for most cases, you just set the duration of the horizontal acquisition
window (10 divs x the scale setting) as described in (1) below. By also setting a
record length in samples, you indirectly set the resolution/sample interval/sample
rate for the horizontal acquisition window (waveform record). The relationships
between these horizontal elements follow:
1. Time Duration (seconds) = 10 divs (window size) x Horizontal Scale
(sec/div)
2. Time Duration (seconds) = Sample Interval (seconds/sample) x Record
Length (samples),
where:
Time Duration is the horizontal acquisition window time duration
3. Sample Interval (sec/sample) = Resolution (sec/sample) = 1/Sample Rate
(samples/sec)
In (2) above, note that it is Sample Interval that varies indirectly to accommodate
the window time duration (and its scale setting) and the Record Length setting as
these later two elements can be set by you. These elements behave as follows:
H
If Record Length or Time Duration vary, Sample Interval varies to accom-
modate, up to highest sample rate/lowest sample interval/highest resolution.
H
If you set faster Horizontal Scale settings, decreasing Time Duration, and the
Sample Interval reaches its lower limit, the horizontal scale becomes limited
to a setting compatible with the record length and the lower limit of the
sample interval.
H
If you attempt to set longer Record Lengths and the Sample Interval reaches
it lower limit, Time Duration remains constant and the record length
becomes limited. The equation becomes:
Maximum Record Length = Time Duration ÷ Min Sample Interval
For example, at 1 ps/div and 10 divisions, the record length must be no more
than 1000 points:
Max Rec Length 1000 samples = (10 divs x 1ps/div) ÷ 0.01 ps/sample
Max Rec Length = 1000 samples
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NOTE. Resolution and the equivalent elements, sample interval and sample rate
(see equation 3 above), are not settable directly, but are derived. You can,
however, check the resolution at anytime in the resolution readout (push the
Horizontal Menu button). Also note, that the Resolution knob actually adjusts
the record length to increase sample density (detail).
Independent vs. Shared Window. For a given time base, the instrument applies the
same horizontal acquisition window to all channels from which it acquires data.
Unlike the vertical acquisition window that you set independently for each
channel, the same time/division, resolution (record length), and horizontal delay
(from the same trigger point) that you set for a time base, apply to all channels in
that time base. In other words, one trigger, from a single trigger source, will
locate a common horizontal acquisition window on all active channels, which
you can shift by setting the horizontal position control.
The horizontal acquisition window determines the waveform records extracted
from all signals present at all active channels and math waveforms. You can
think of the horizontal acquisition window as cutting across any input signals
present in the input channels to extract the same slice of time into waveform
records. See Figure 3--5.
Ch1 record
Common record start
point and record length
Common trigger
Ch2 record
Common horizontal
delay
Ch3 record
Ch4 record
Figure 3-5: Common trigger, record length, and acquisition rate for all channels
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Setting Acquisition Controls
This section overviews the instrument acquisition features—those that start and
stop acquisitions and those that control how the instrument processes the data as
it is acquired (just sampled, or averaged or enveloped). Special features, keys to
using, and operation controls are covered.
Vertical
offset
Acquisition
mode
Acquisition
system
Sampling
module
Time bases
Horizontal
scale
Horizontal
position
Record
length
Why Use?
Use the acquisition controls to optimize and tailor the acquisition of your
waveforms. The mode controls described here operate on the data as the
instrument acquires it—perhaps to reduce noise in the waveform record or to
capture a record of min/max values for each data point in the waveform record.
The acquisition controls also let you start and stop acquisition, as well as take
certain actions after acquisition stops, such as to print the acquired waveform.
What’s Special?
Stop After Options. You can set the condition upon which acquisition stops, such
as after a number of acquisitions or a number of mask hits you specify. You can
set the instrument to save waveforms or print the screen to a file or printer.
FrameScan Acquisition. You can alter the normal acquisition cycle to produce a
waveform record suitable for acquiring and analyzing Pseudo-Random Bit
Streams (PRBS’s), which are contained within a repeating data frame. See
FrameScan Acquisitions on page 3--30 for more information on using FrameScan
acquisitions.
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What’s Excluded?
Envelope acquisition mode can not be used with FrameScan acquisitions; you
must use Sample or Average modes.
Keys to Using
The key points that follow describe operating considerations for setting up the
acquisition system so the waveforms acquired best fit your requirements.
Acquisition Modes. Consider the mode you want to use to acquire data:
H
H
Sample - the instrument does no post-processing of acquired samples.
Average - the instrument processes the number of waveforms you specify
into the acquired waveform, creating a running exponential average of the
input signal.
H
Envelope - the instrument retains the running minimum (Min) and maximum
(Max) values in adjacent sample intervals continuously, as subsequent
waveforms are acquired, creating an envelope of all waveforms acquired for
that channel.
Acquiring and displaying a noisy square wave signal illustrates the difference
between the three modes. Note how Average reduces the noise while Envelope
captures its extremes:
Sample
Average
Envelope
Acquisition Control. Also, consider how you want to control acquisition; you
have two main options, either settable from the Acquisition Setup dialog box
(push Acquisition MENU to display):
H
Run/Stop Button Only - sets the instrument to start and stop the acquisition
only when you use the Run/Stop button, which is available on the front
panel, on the application toolbar, and in the Acquisition Setup dialog box. If
toggled to Run, acquisition will start if a valid trigger occurs. If toggled to
Stop, acquisition stops immediately.
H
Condition - in addition to Run/Stop Button, which can always stop
acquisition, the stop-after control provides additional conditions you can
select from to stop an acquisition. See step 4, Set the Stop Mode and Action,
on page 3--25, or access the online help in the Acquisition Setup dialog box
for more information.
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Global Controls. Like the horizontal controls, the acquisition controls apply to all
active channels. For example, channel 1 cannot acquire in Sample mode while
channel 2 acquires in Envelope mode; you cannot stop channel 8 from acquiring
(if turned on) while other channels continue to acquire. Unlike horizontal
controls, acquisition settings extend across time bases: you cannot set a different
sample mode for channels acquired in the Mag1 time base; the sample mode you
set extends across the Main, Mag1 and Mag2 time bases.
Preventing Aliasing. Under certain conditions, a waveform may be aliased on
screen. Read the following description about aliasing and the suggestions for
preventing it.
When a waveform aliases, it appears on screen with a frequency lower than that
of the input signal or it appears unstable even though the TRIG’D light is lit.
Aliasing occurs because the instrument sample interval is too long to construct
an accurate waveform record. (See Figure 3--6.)
Actual high-frequency waveform
Apparent low-frequency
waveform due to aliasing
Sampled points
Figure 3-6: Aliasing
Methods to Check and Eliminate Aliasing. To quickly check for aliasing, slowly
adjust the horizontal scale to a faster time per division setting. If the shape of the
displayed waveform changes drastically or becomes stable at a faster time base
setting, your waveform was probably aliased. You can also try pressing the
AUTOSET button to eliminate aliasing.
To avoid aliasing, be sure to set resolution so that the instrument samples the
input signal at a rate more than twice as fast as the highest frequency component.
For example, a signal with frequency components of 500 MHz would need to be
sampled with a sample interval less than 1 nanosecond to represent it accurately
and to avoid aliasing.
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Acquiring Waveforms
To Set Acquisition Modes
Use the procedure that follows to set the data-acquisition mode and specify
acquisition start and stop methods. For more detailed information, display online
help when performing the procedure.
Overview
To set acquisitions modes
Control elements and resources
Prerequisites 1. Instrument must be installed with sampling modules in
place before powering on the instrument. Instrument
must be powered up, with horizontal and vertical
controls setup. Triggering should also be set up.
See the sampling-module user manuals for sampling
module installation. See page 3-48 for trigger setup.
To select an 2. Push the Acquisition MENU button to display the Acq
Setup dialog box.
Acquisition mode
Select the 3. Click an option button to select the acquisition mode;
choose from the following modes:
Acquisition mode
H
H
H
Sample
Average
Envelope
For Average mode only, enter the number of samples to
to average in the Average box.
Set a
sample count
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Acquiring Waveforms
Overview
To set acquisitions modes (cont.)
Control elements and resources
Set the Stop 4. Under Stop After, click one of the following options:
mode and action
H
H
Run/Stop Button Only
Condition
5. If you selected Condition, choose a condition from the
drop-down list, such as Number of Acquisitions or
Mask Total Hits, to stop on. If the condition requires a
count (count box is enabled), enter a count.
6. Select a Stop After action from the drop-down list box.
Choose from the following actions:
H
H
H
H
None
Print Screen to File
Print Screen to Printer
Save all Waveforms
Enter a filename for saving to if you’ve selected Print to
File or Save all Waveforms.
7. Click to check Ring Bell if you want audio notice when
acquisition stops.
Start acquisition 8. Push the RUN/STOP front-panel button to begin
acquiring.
See To Start and Stop Acquisition on page 3-26.
End of Procedure
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Acquiring Waveforms
To Start and
Stop Acquisition
Use the procedure that follows to start and stop acquisition.
Overview
To start and stop acquisition
Control elements and resources
Prerequisites 1. Instrument must be installed with sampling modules in
place before powering on the instrument. Instrument
must be powered up, with horizontal and vertical
controls set up. Triggering should also be set up.
See sampling-module user manuals for sampling
module installation. See page 3-24 for acquisition
setup and page 3-48 for trigger setup in this manual.
To start 2. Make sure all the channels to be acquired are turned on
acquiring
(use the channel buttons; see page 3-9 if needed).
Then push the RUN/STOP button to begin acquiring.
To stop 3. Push the RUN/STOP button to stop acquisition.
acquiring
Acquisition will also stop when acquisition finishes if a
selected stop condition is satisfied (see step 4 on
page 3-25) or if triggering ceases while in Normal
trigger mode.
To clear an 4. Push the Acquisition CLEAR DATA button to discard the
acquisition
acquired data in all channels.
For more 5. For more information on the controls described in this
information
procedure, push the Acquisition MENU button. Click the
HELP button in the setup dialog box that displays.
Also, see references listed at right.
See To Set Up Acquisition Modes on page 3-24.
End of Procedure
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Acquiring Waveforms
Acquisition Control Background
This section contains background information on the data sampling and
acquisition process that can help you more effectively setup the acquisition
window of each channel. This section:
H
H
H
describes the acquisition hardware.
defines the sampling process, sampling modes, and the waveform record.
describes the acquisition cycle in Normal and FrameScan modes.
Acquisition Hardware
Before a signal can be acquired, it must pass through the input channel where it
is sampled and digitized. Each channel has a dedicated sampler and digitizer as
shown in Figure 3--7; each channel can produce a stream of digital data from
which waveform records can be extracted. See Signal Connection and Scaling on
page 3--4 for further description of scaling, positioning, and DC offsetting of
channels.
Number of channels depends on sampling modules installed
Sampler
Digitizer
CH 1
CH 2
Sampler
Digitizer
Sampling module
Instrument
Sampler
Digitizer
CH 3
CH n
Sampler
Digitizer
Sampling module
Instrument
Figure 3-7: Channel configuration
Sampling Process
Acquisition is the process of sampling an analog input signal of an input
channel, converting it into digital data, and assembling it into a waveform
record, which is then stored in acquisition memory. Sampling, then, is the
process that provides one sample per trigger event and, when taken from
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Acquiring Waveforms
repeated trigger events, also provides the digitized signal data from which the
instrument assembles the waveform record (see Figure 3--9 on page 3--29). The
signal parts within the vertical range of the sampler are digitized. See
Figure 3--8.
+0.5 V
0 V
+0.5 V
0 V 0 V
- 0 . 5 V
0 V
- 0 . 5 V
Digital values
Input signal
Sampled points
Figure 3-8: Digital acquisition — sampling and digitizing
Sampling Modes
The instrument acquisition system can process the data as it is acquired,
averaging or enveloping the waveform data to produce enhanced waveform
records. Once the waveform record exists (enhanced or not), you can use the
post-processing capabilities of the instrument to further process that record:
perform measurements, waveform math, mask tests, and so on. Refer to Keys to
Using on page 3--22 for description of all three acquisition modes.
Waveform Record
While sampling the input signal provides the data that makes up the waveform
record for any given channel, the instrument builds the waveform record through
use of some common parameters (“common” means they affect the waveforms in
all channels).
Figure 3--9 shows how these common parameters define the waveform record; as
shown in the figure, they define where in the data stream data is taken and how
much data is taken. Locate the following parameters in the figure:
H
Sample Interval. The precise time between sample points taken during
acquisition.
H
H
Record Length. The number of samples required to fill a waveform record.
Trigger Point. The trigger point marks the time zero in a waveform record.
All waveform samples are located in time with respect to the trigger point.
H
Horizontal Delay. The time lapse from the trigger point to the first sample
taken (first point in the waveform record). It is set indirectly by setting the
horizontal position (see Horizontal Position and the Horizontal Reference on
page 3--59).
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Acquiring Waveforms
Sample interval
First sampled and
digitized point
Waveform record acquired
over many acquisitions,
1 sample per acquisition
Recurring trigger events
from trigger signal
Record length
Horizontal delay
Figure 3-9: The waveform record and its defining parameters
As Figure 3--9 shows, the instrument acquires points in order from left to right,
with each point from a separate trigger event, and delayed from that event by:
horizontal delay + (sample interval x (sample number -- 1))
When all the points in the waveform record have been sampled and digitized, the
waveform record is in acquisition memory and becomes available for display (or
use in math waveforms, storing, exporting, and elsewhere). See Acquisition
Cycle, which follows.
For a control-oriented discussion of the waveform record, see:
H
H
Horizontal Acquisition Window Considerations on page 3--17.
Horizontal Scale vs. Record Length vs. Sample Interval vs. Resolution on
page 3--19.
The process of building a record is a subpart the acquisition cycle, which
describes how the instrument cycles through recognizing a trigger, taking a
sample and processing it according to sample mode, and adding it to a waveform
record. This manual describes the normal acquisition cycle in Process Overview
Map on page 2--6. Note the following points regarding acquisition cycles:
Acquisition Cycle
H
A waveform record exists, either on display or as an icon on the waveform
bar, until it is replaced by a more recent acquisition or until you clear the
record. The process of clearing waveform records is described on page 3--26.
H
Choose the FrameScan cycle when you want to test for anomalies in
Pseudo-Random Bit Streams. See FrameScan Acquisitions on page 3--30.
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Acquiring Waveforms
FrameScan Acquisitions
This instrument can modify its normal acquisition process to help you analyze
pattern-dependent failures in high bit-rate communications signals.
Why Use?
FrameScan acquisitions allow detailed display and analysis of individual,
complete waveforms or of the bit sequences leading up to a failure. This ability
to identify the specific patterns that caused the failures makes using FrameScan
mode superior to traditional methods. Traditional methods include:
H
creating an eye diagram, which is a statistical representation of signal, using
clock-triggered sampling oscilloscope.
H
bit-error testing to find the total number of errors in a frame.
These methods are time consuming to use and neither can examine in detail the
pattern driving the failure.
What’s Special?
FrameScan acquisition mode offers the following advantages.
Breakthrough time base stability. Timing accuracy varies no more than 0.1 part
per million from trigger event to data point, providing the stability needed to
examine signals of almost any length for pattern-dependent failures.
Flexible set-up support. Set bit rates manually or set a bit rate based on a
communication standard. Then set the horizontal scale manually or invoke a
custom autoset: Bit/Eye-Pattern Autoset, if you have set an independent bit rate,
or Standard-Mask Autoset, if you set bit rate based on a communication
standard.
Identification and analysis of pattern-dependent failures. FrameScan acquisition,
when used with mask testing and Stop After condition acquisition, can automati-
cally determine the bit at which a pattern-dependent failure occurred.
Improved noise resolution on low-power communication signals. The instrument
can use Average acquisition mode on Eye diagrams when acquiring using
FrameScan mode. Averaging provides the noise resolution that the examination
of many of today’s low-power communication signals can require. FrameScan
mode results in sequentially acquired data which can be averaged; normal eye
diagrams acquire data randomly and cannot be averaged. Compare the noise of
the waveforms that follow. The right waveform is averaged; the left is not.
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Acquiring Waveforms
What’s Excluded?
The instrument must be in Average or Sample acquisition modes; FrameScan
excludes Envelope acquisition mode.
Keys to Using
The key points that follow describe FrameScan mode operating behavior and
provide background to help you to use this feature.
Determine Start Bit and Scan Bits. You need to know the bit in the bit stream at
which you want to start the scan, the appropriate horizontal scale, the starting
horizontal position, and the total number of bits for the desired FrameScan cycle.
How FrameScan Mode Acquires. FrameScan mode alters the normal acquisition
sequence in order to scan a pseudo-random bit sequence (PRBS) or another
repetitive bit stream to acquire one bit at time in the same sequence found in the
bit stream:
H
Triggering is synchronous with the bit streams (framing signal) of the
communication signal you want to scan, which results in the acquisition of a
single sample prior the scanning of the next bit. You must supply an external
trigger source that is synchronous with the frame; possible sources are
external frame trigger/sync signals from a pattern generator or from a BERT
(Bit Error Rate Tester).
H
Acquisition operates in a scanning mode, where:
a. horizontal position is set to acquire the first bit, which the acquisition
system acquires as a subframe (see Figure 3--10 on page 3--32).
b. horizontal position is incremented one-bit period (1/bit rate), and then
the acquisition system acquires the second bit as a subframe. The
duration of each subframe acquisition is set to provide about a 20%
overlap between frames.
c. This sequence of incrementing, and then acquiring the next bit,
continues until the instrument acquires the number of bits you specify
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Acquiring Waveforms
for the frame, or until acquisition stops due to a specific test condition,
such as the failure of a mask test.
The resulting horizontally skewed FrameScan acquisitions display successive
individual bits acquired in increasing time order. FrameScan acquisitions can
continue through an entire frame of data if needed to help you to uncover faulty
bit sequences leading up to pattern-dependent failures.
Subframe 1
Subframe 3
Subframe 5
Subframe 2
Subframe 4
∆h
∆h
∆h
∆h
+
+
+
+
=
Subframe 1
Notes:
∆h is the horizontal position change = one bit period (=1/bit-rate)
Subframe 2
Subframe 3
Subframe 4
Subframe 5
Accumulated
acquisitions
Subframe acquisition duration is 40% greater than the bit period
Figure 3-10: How FrameScan acquisition works (scanning on a 127-bit PRBS
shown)
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Acquiring Waveforms
To Acquire in
FrameScan Mode
Use the procedure that follows to set up the instrument to acquire in FrameScan
mode.
Overview
To acquire in FrameScan mode
Control elements and resources
Prerequisites 1. The instrument must have an appropriate sampling
module in place before powering on the instrument.
Instrument must be powered up.
2. The signal to be scanned must be input to a channel
and an appropriate external framing signal must be
applied to the trigger input.
H
See sampling-module user manuals for
sampling module installation.
H
See page 3-24 for acquisition setup and
page 3-48 for trigger setup in this manual.
3. The acquisition mode must be set to Sample or
Average. Envelope cannot be used with FrameScan
acquisitions.
4. The vertical and horizontal controls and triggering must
be set to acquire the signal.
Access the 5. From the application menu bar, select Setup, and then
FrameScan
controls
select Horizontal. See right.
Set the frame 6. In the Horz Setup dialog box, click the Units Bits option
duration
button.
Check for bits units
7. Enter the total number of bits you wish to scan (the
frame duration) in the Scan Bits box. You must always
set this parameter manually.
Tip. You can set Units to Seconds if you prefer, but
Bits usually makes the set up and use of FrameScan
acquisition easier.
Enter bits to be scanned
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Acquiring Waveforms
Overview
To acquire in FrameScan mode (cont.)
Control elements and resources
Set the bit rate 8. Set the horizontal scale so one acquisition record is
equal to one bit. Use one of the two methods that follow:
Select a comm.
standard, or...
H
Automatic: If your signal to be scanned matches a
communications standard, select it from the Comm
Standard list. Choosing a standard sets the bit rate
and start bit; otherwise, if you know the bit rate, you
can set the bit rate manually using the Bit Rate
box.
Set the bit rate
manually
Set to 1/8 bit
per division
H
Manual: Adjust the Scale control to a setting that
results in a display of both edges of the bit. For
example, setting 1/8 of a bit per division (0.125
bits/div) yields 1 bit in 8 divisions, which fits nicely
on screen.
Set the starting 9. Set the initial horizontal position to the first bit you want
horizontal posi-
tion
First set the
start bit, ...
to acquire. Use one of the two methods that follow:
H
Automatic: Enter your desired start bit location, and
then check the Auto Position box to enable the
instrument to set the position as near as possible to
match the bit specified in the Start Bit box.
and then enable
Auto Position
H
Manual: Adjust the Position control to align the
start of a bit to desired location in the frame.
Or set manually
Tip. The latter method is useful when you need to
manually align a bit or waveform to a mask on the
display.
Enable 10. In the dialog box, click to check the FrameScan
Enabled box. See right.
Check to
start scan
FrameScan
11. To restart the scan at the first bit at any time, click the
Reset button.
Click to
restart scan
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Acquiring Waveforms
Overview
To acquire in FrameScan mode (cont.)
Control elements and resources
Set a display 12. If you want to display the frame-scanned acquisition as
mode
an eye diagram, set one of the following display modes:
H
Select Infinite Persistence or Variable Persis-
tence in the Display Setup dialog box (from the
application menu bar, select Setup, and then
select Display).
H
Right click the waveform icon (left side of the
screen in the waveform bar) of the waveform being
scanned and select Color Grade in the menu.
For more 13. For more help on FrameScan acquisitions, click the
information
Help button in the Setup dialog box to access
contextual help on screen.
See page 3-167 to learn about using online help.
End of Procedure
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Acquiring Waveforms
To Catch a Bit Error
FrameScan Acquisition, when coupled with mask testing, provides the tool you
need to capture a defective bit and examine the pattern leading up to it.
Overview
To catch a bit error
Control elements and resources
Prerequisites 1. The instrument should be set up per the previous
procedure.
2. Pause the acquisition system (push the Run/Stop
button on the front-panel).
H
See To Acquire in FrameScan Mode
page 3-33.
3. Infinite persistence and color grading display modes
should be off if turned on in the previous procedure.
Enable 4. From the application menu bar, select Setup, and then
select Mask. (See right.)
mask testing
5. Use the Mask Setup dialog box to set up for mask
testing as you would for nonFrameScan acquisitions.
See Using Mask Testing on page 3-141 for information
about using Mask testing. Be sure to enable the mask.
Tip. If you selected a communication standard when you
set the FrameScan bit rate (see step 8 on page 3-34),
the same standard will be preselected in the Mask
Setup dialog box.
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Acquiring Waveforms
Overview
To catch a bit error (cont.)
Control elements and resources
Set conditional 6. From the application menu bar, select Setup, and then
acquisition and
start testing
select Acquire.
7. In the Acq Setup dialog box (see right), check the
Condition option under Stop After.
8. In the Condition pulldown list, select Mask Total Hits
and set a count of one in the count box. These settings
will stop acquisition on a violation of any of the masked
areas on screen. See below.
For more 9. For more help on using FrameScan acquisitions, click
information
the Help button in the Horz Setup dialog box to
display contextual help on screen.
See page 3-167 to learn about using online help.
End of Procedure
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Acquiring Waveforms
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Triggering
To properly acquire waveforms — to sample a signal and assemble it into a
waveform record — you need to set up the instrument trigger conditions. This
section provides an overview of the instrument trigger features and their use.
Signal processing
& transformation
system
Acquisition
system
Output and
storage
User Interface
and display
Sampling
module
Trigger
system
Time base
system
Edge Triggering
The instrument supports direct-edge triggering, which triggers as described in
Keys to Using on page 3--40. You must provide an external trigger source, except
when using clock-recovery triggering from an optical sampling module equipped
with the clock-recovery option or using the internal clock (as when TDR testing).
Why Use?
Use triggering controls to control the acquisition window, so that the instrument
acquires the waveform data you want. The trigger event, when synchronized to
the input signal, defines the horizontal acquisition window. By choosing the
trigger event and adjusting the horizontal position (delay between trigger event
and the horizontal reference point) you control the location in the data stream
(the input signal) from which the waveform record is taken.
What’s Special?
Clock Recovery. If you use optical sampling modules that include a clock-recov-
ery option, you can use this recovered clock to trigger the instrument for specific
DATA rates and formats that are compatible with the specific CR option in the
optical module. Also, if you use optical sampling modules that support
continuous-rate clock recovery, you can specify any custom clock-recovery rate
within the range supported by the module. Refer to Sampling Modules Supported
on page 1--4 to see those modules that support continuous-rate clock recovery.
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Triggering
Gated Triggering. For instruments equipped with Option GT, the system allows
triggering to be enabled and disabled (gated) based on a TTL signal at a rear
panel input. See To Use Gated Trigger on page 3--50.
Keys to Using
The key points that follow describe operating considerations for setting up to
trigger on your waveforms.
Triggering Process. When a trigger event occurs, the instrument acquires a
sample in the process of building a waveform record. The trigger event
establishes the time-zero point in the waveform record and all samples are
measured with respect to that event.
The trigger event starts waveform acquisition. A trigger event occurs when the
trigger source (the signal that the trigger circuit monitors) passes through a
specified voltage level in a specified direction (the trigger slope). When a trigger
event occurs, the instrument acquires one sample of the input signal. When the
next trigger event occurs, the instrument acquires the next sample. This process
continues until the entire record is filled with acquired samples. Without a
trigger, the instrument does not acquire any samples. See Figure 3--9 on
page 3--29. This behavior differs from that of real time acquisition systems,
which can acquire a complete waveform record from a single trigger event.
Triggering is Global. The instrument uses the trigger event to acquire across all
active channels. This same trigger is also common across all time bases currently
active (one or more of Main, Mag1 and Mag2).
Edge-Trigger Type. This instrument supports edge triggering only, in which edge
triggers gate a series of acquisitions.
The slope control determines whether the instrument recognizes the trigger point
on the rising or the falling edge of a signal. See Figure 3--11. You can set the
trigger slope from the toolbar at the top of the display or in the Trigger Setup
dialog box.
The level control determines where on that edge the trigger point occurs. The
instrument lets you set the trigger level from the front panel with the Trigger
LEVEL knob.
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Triggering
Positive-going edge
Negative-going edge
Trigger level
can be adjusted
vertically.
Trigger slope can be positive or negative, with
trigger point occurring on the slope specified.
Figure 3-11: Slope and level define the trigger event
Trigger Modes. The trigger modes control the behavior of the instrument when
not triggered:
H
Normal mode sets the instrument to acquire a waveform only when
triggered. Normal mode does not acquire data if triggering stops, rather the
last waveform records acquired remains “frozen” on the display (if the
channels containing them are displayed). If no last waveform exists, none is
displayed. See Figure 3--12, Normal trigger mode.
H
Auto mode sets the instrument to acquire a waveform even if a trigger event
does not occur. Auto mode uses a timer that starts after trigger rearm. If the
trigger circuit does not detect a trigger after this timeout (about 100 ms), it
auto triggers, forcing enough trigger events to acquire all active channels. In
the case of repetitive acquisitions in automatic trigger mode, waveform
samples are acquired, but at different places in the data stream (synchroniza-
tion is lost). See Figure 3--12, Automatic trigger mode. If you do not apply a
signal to any channel displayed, a baseline is displayed for that channel.
Triggered waveform
Untriggered waveforms
Normal trigger mode
Automatic trigger mode
Figure 3-12: Triggered versus untriggered displays
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Triggering
Trigger Sources. The trigger source provides the signal that the trigger system
monitors. The source can be:
H
the internal clock of the instrument (TDR clock rate), with user-selectable
clock frequencies. The Internal Clock Out connector supplies a replica of the
internal clock at the instrument front panel. See Figure 3--13 on page 3--42.
H
an external signal coupled to one of the trigger input connectors (see
Figure 3--13) on the front panel:
H
External Direct, DC coupled and usable with signals up to at least
3.0 GHz
H
External Prescale, divided by 8 and usable with signals up to at least
12.5 GHz
NOTE. The upper limit is determined by signal input level; this is enhanced by
the optional accessory 80A01.
H
an internal clock-recovery trigger provided by an optical sampling module
equipped with a clock-recovery option. Clock recovery is user-selectable for
triggering rates that depend on the sampling module used; for example,
either 622 Mbps (OC-12/STM-4 standards) or 2.488 Gbps (OC-48/STM-16
standards) for the 80C01-CR Optical Sampling Module.
Some optical sampling modules support continuous-rate clock recovery. If
you have such a module installed, a user-defined custom clock recovery rate
is selectable from the Trigger Source Setup menu.
Internal clock output
Trigger
prescale
input
Trigger
direct
input
Trigger
probe
power
Figure 3-13: Trigger inputs
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Triggering
Use a trigger source that is synchronized with the signal you are sampling and
displaying. Selection of your trigger source depends on your application, as
shown in Table 3--1.
Table 3-1: Application-based triggering
Application
Source to use
Communications (optical)
serial NRZ data signals
Set source to Clock Recovery, set the clock-recovery type, and
use an optical sampling module equipped with a clock-recovery
option supporting the specific data rate of the serial optical
signal.
A custom clock recovery rate can be defined by the user if the
optical module supports a continuous-rate clock recovery. Refer
to Sampling Modules Supported on page 1-4 to see those
modules that support continuous-rate clock recovery.
TDR measurement using an
electrical sampling module
equipped with TDR
Set source to Internal Clock to use the internal clock of the
instrument (TDR clock), and select the appropriate clock
frequency. Disconnect any signal connected to the External
10MHz Reference Input when using the Internal clock.
Measurements on systems
Set source to External Direct or External Prescaler as
with a synchronized pretrigger appropriate (see Trigger Source Connectors) and connect the
signal pretrigger signal.
Any application requiring that Set source to External Direct or External Prescaler as
the input signal provide the
trigger
appropriate (see Trigger Source Connectors). Use a signal
splitter or power divider to couple to both the Ext Direct or
Prescaler input and the input channel, so that the sampled
signal is also the trigger signal.
Any application requiring that Set source to External Direct, and use a Tektronix probe as
you probe the trigger source
described in Probe-to-Trigger Source Connection on
page 3-44.
Any application requiring that Set source to External Direct, and use a TTL connection to
you perform special measure- trigger gate as described in To Use Gated Trigger on
ments using gated trigger.
page 3-50.
Trigger Source and ESD. Observe static precautions when coupling trigger
sources to this instrument.
CAUTION. Electrostatic-static damage can permanently degrade and damage the
inputs to this instrument, its sampling modules, and accessory probes. You must
take proper precautions; please read your sampling module user manual for
more information.
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Triggering
Trigger Source Connectors. External triggers can be connected to either the
Trigger DIRECT or Trigger PRESCALE connectors on the front panel (see
Figure 3--13):
H
Signals connected to the PRESCALE connector are divided by eight and
then fed to the trigger circuits.
H
Signals connected to the DIRECT connector are fed directly to the trigger
circuitry. The signal is DC coupled and can be up to 3.0 GHz.
When using a given trigger source, you should disconnect any other trigger
source from the front panel to ensure specified performance. Specifically:
H
Do not connect a signal to the Trigger Direct or Trigger Prescale front-panel
connector unless you’ve selected that input as the trigger source.
H
Do not connect a signal to the External 10 MHz Reference front-panel
connector unless you have selected that input as the timebase mode in the
Horizontal setup dialog box.
Probe-to-Trigger Source Connection. You can connect probes, such as the P6207
and P6209, to the Trigger DIRECT input connector of the instrument. Observe
all static precautions outlined in the documentation for the probe you choose
while following these steps:
H
H
H
Connect the probe-power connector to the TEKPROBE-SMA compatible
probe (Level 1 or 2 only).
Connect the probe signal connector (probe must have an SMA connector) to
the Trigger DIRECT source input (not the PRESCALE source input).
Connect the probe input to the signal that is to supply the trigger source.
The probe you attach preconditions the trigger signal for its input just as other
probes do for the vertical inputs. More specifically, a probe attached to the Trigger
DIRECT input may affect trigger-level range, resolution, and units as follows:
H
H
Trigger-level units will match those of the probe.
The trigger level for probes that have offset control is adjusted by changing
the offset of the connected probe and is limited by the range, resolution, and
offset characteristics of the probe.
H
When a connected probe is removed and a different probe installed, the
instrument attempts to keep the same absolute trigger level as the current
trigger-level setting.
Note that the probe parameters (range, resolution, offset scale, and units) that are
relevant to the trigger circuit affect the Trigger Level control.
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Triggering
Gated Trigger Connector (Option GT equipped). You can attach a BNC cable to the
External Gate input at rear panel (TTL connection). Two conditions must be
satisfied to get a stable display of waveform data:
H
The channel and trigger must be otherwise triggerable without the trigger
gate.
H
The gating signal must be at a TTL high; the triggering system enabled and
the instrument will acquire.
Note that the function of the trigger gate is to selectively exclude data from
acquisition by means of gating the trigger on and off, and it need not be
synchronized with either channel or trigger. See procedure on page 3--50 for
more information on setting up gated trigger.
Enhanced Triggering. These features (see note) can help stabilize triggering and
perform special measurements:
H
High Frequency Triggering. When you enable the High Frequency
triggering control, the instrument increases trigger sensitivity of the trigger
circuit by decreasing hysteresis (a transition or noise band), allowing
triggering on higher frequency signals.
H
Metastability Reject. When you enable Metastability Reject, the instrument
replaces the acquired sample with a null sample if it detects a potential
metastable condition. A metastable condition occurs when both the trigger
input signal and the holdoff-generated enable signal arrive at the internal
trigger recognizer at virtually the same time.
H
Gated Triggering. When you enable the Gated trigger control, the trigger
and the External Gate input are applied to the instrument through what is in
effect an AND function. Gated triggering is applied to acquire and to mask
test or otherwise characterize signals like those found in extremely long
transmission carriers, such as undersea communication fibres. Since long
fibres are difficult to test, user-supplied test fixtures are used to repeat the
test signal through a short loop of the cable to simulate traveling longer
distances along its entire length. The signal is picked off and connected to
the instrument.
NOTE. Gated trigger is available only when ordered as Option GT at the time the
instrument ships.
Adjusting Holdoff. Trigger holdoff can help stabilize triggering. When you adjust
holdoff, the instrument changes the time it waits before rearming its trigger
circuit after acquiring a sample. Before rearming, trigger circuitry cannot
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Triggering
recognize when the next trigger conditions are satisfied and cannot generate the
next trigger event. When instrument is triggering on undesired events
(Figure 3--14, top waveform), you adjust holdoff to obtain stable triggering.
Holdoff
Holdoff
Holdoff
Trigger level
Indicates trigger points
Holdoff
Holdoff
Holdoff
Holdoff
Trigger level
At the longer holdoff time for the top waveform, triggering occurs at valid, but undesired, trigger
events. With a shorter holdoff set for the bottom waveform, triggers all occur on the first pulse in the
burst, which results in a stable display.
Figure 3-14: Holdoff adjustment can prevent false triggers
Usable Holdoff. The holdoff time the instrument can use varies within limits. The
maximum holdoff the instrument can achieve is the 50 ms specified in Specifica-
tion on page Table A--3 on page A--3.
The minimum holdoff used depends on hardware constraints, which do not
change, and certain control settings, which you can control:
H
The instrument hardware constrains the minimum usable holdoff time to the
greater of the trigger-to-end-of-record time or 5 ꢀs.
H
The trigger-to-end-of-record time (EORT) is the time from the trigger event
to the last sample in the waveform record and is calculated as:
EORT = Horiz. Position + (1 -- 0.01 x Horiz. Ref.) x Time/Div x 10
divisions) + Channel Deskew
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For example:
EORT = 6 ꢀs + (1--0.1(.5) x 1 ꢀs/div x 10 div + 0
= 6 ꢀs + 5 ꢀ = 11 ꢀs, when:
Horizontal position = 6 ꢀs
Horizontal Ref = 50%
Time/Division = 1 ꢀs/div
Channel Deskew = 0 (set to minimum)
In this example, because 11 ꢀs is greater than 5 ꢀs, the current control settings
determine the minimum usable holdoff the instrument can use.
Trigger point
EORT
Time to EORT
Horizontal position
Horizontal
delay
(19 ns min.)
Time
zero
Time of first point
Horizontal
reference point
Time of last point
(EORT)
Figure 3-15: Trigger to End Of Record Time (EORT)
Requested vs Actual Holdoff. The instrument operates with two holdoff values:
H
Requested -- the last value requested in the Trigger Setup dialog box. You
can set times from 5 ꢀs - 50 ms, but the time requested becomes the actual
time used only if it meets the requirements just described for Actual.
Otherwise, the holdoff-time value requested is held for later use as described
for Actual.
H
Actual -- in effect the holdoff time; that is, the time the instrument is using or
will use when acquiring data. The instrument uses it when the minimum
usable holdoff (determined as described in Usable Holdoff, on page 3--46) is
greater than the requested value. The instrument retains and changes to the
requested value if the user changes control settings such that the requested
value exceeds the minimum usable holdoff. Actual values can range from
5 ꢀs -- 55 ms.
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Triggering
To Trigger
Use the procedure that follows when setting up the instrument to trigger
acquisitions.
Overview
To trigger
Control elements and resources
Prerequisites 1. The instrument must be installed with sampling modules
in place. Acquisition system should be set to Run, and
the vertical and horizontal controls should be set
appropriately for the signal to be acquired.
See Sampling Module User Manuals for sampling module
installation. See page 3-24 of this manual for acquisition
setup.
Apply a trigger 2. Connect the signal to be triggered on using proper
signal
probing/connecting techniques for your application.
Typical approaches include using:
H
External Trigger, Direct or Prescale. Portion of the
input signal coupled to the appropriate input (see
right) using a power divider on input signal.
H
H
Internal Clock. No external trigger required.
Clock Recovery. Recovered clock signal obtained
from those optical sampling modules supporting
clock recovery (connection internal through the
sampling module; no external trigger connection
required).
A custom clock recovery rate can be defined by the
user if the optical module supports a continuous-
rate clock recovery. Refer to Sampling Modules
Supported on page 1-4 to see those modules that
support continuous-rate clock recovery.
See Table 3-1 on page 3-43 for more information.
Note. When using any of the above sources, disconnect
any signal connected to the other source trigger and
clock sources. See External 10MHz Reference Input
when using the Internal clock).
Source Menu
Select source, 3. Click the Trig Source menu, and select the trigger
slope, and
level
Slope button
source to match your trigger signal in the pull-down
menu (upper right corner of display).
4. Click the Slope button to toggle to the trigger slope you
want, positive or negative.
5. Adjust the trigger level using the (Set Level to) 50% button
or the Level list box as show at right, or using those on
the front panel, shown in step 7.
Level Controls
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Triggering
Overview
To trigger (cont.)
Control elements and resources
Verify 6. When the instrument is triggered, the word Triggered is
displayed in the toolbar on screen. You can use also the
trigger lights to verify triggering status as follows:
triggering
H
READY lights when the instrument acquisition
system is running but the trigger system is not
receiving valid trigger events. This includes when
auto triggering in absence of a trigger.
H
H
TRIG’D lights when the instrument acquisition
system is running and the trigger system is
triggered.
READY and TRIG’D are always off if acquisition is
stopped.
Trigger Menu button
Other trigger 7. If you need to change the trigger mode or other settings,
parameters
push the Trigger MENU button to display the Trig Setup
dialog box. From there, you can:
H
H
Switch between Auto and Normal trigger modes
If you have trouble triggering, you can adjust
holdoff, which may help. For assistance with this
control, see step 8.
H
You may on occasion want to turn off metastable
rejection; again, see step 8 for more information.
For more 8. Press the Help button in the Trig Setup dialog box to
information
access the online assistance specific to triggering
commands. You can also read about key trigger
features in Keys to Using on page 3-40.
See page 3-167 for information on online help.
End of Procedure
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Triggering
To Use Gated Trigger
Use the procedure that follows when setting up the instrument to use the gated
trigger. Gated trigger is only available with Option GT installed.
Overview
To use gated trigger
Control elements and resources
Prerequisites 1. The Acquisition system should be set to Run, and the
vertical and horizontal controls should be set appropri-
ately for the signal to be acquired.
2. Trigger on your input signal. Use the procedure To
Trigger on page 3-48 as needed.
See Sampling Module User Manuals for sampling module
installation. See page 3-24 of this manual for acquisition
setup.
Note that you must supply the input signal and the TTL
gating signal to the appropriate instrument inputs. The
instrument does not control or generate these signals.
Access the 3. From the application menu bar, select Setup, and then
Setup trigger
dialog box
select Trigger. See right. You also can select this menu
by pushing the Trigger MENU button.
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Overview
To use gated trigger (Cont.)
Control elements and resources
Enable gated 4. In the Enhanced Triggering options section of the dialog
triggering
box, check Gated Trigger.
Check to
enable
5. Attach an appropriate TTL-gating signal to the
TRIGGER GATE (TTL) rear-panel connector. Operation
is as follows:
Complete set up
TRIGGER
GATE (TTL)
H
Triggering system will be disabled when the gating
signal is a TTL low, and instrument will not acquire.
H
The triggering system will be enabled when the
gating signal is a TTL high, and the instrument will
acquire.
H
There is an internal pull -up on the Gated Trigger
input such that if no drive signal is supplied or if the
input is left unconnected, triggering will be enabled
even if the Gated Trigger is selected in the Trig
Setup dialog box.
For more 6. Press the Help button in the Trig Setup dialog box to
information
access the online assistance specific to triggering
commands. You can also read about key trigger
features in Keys to Using on page 3-40.
See page 3-167 for information on online help.
End of Procedure
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Triggering
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Displaying Waveforms
To make use of the waveforms you acquire, you will often want to display them.
This instrument includes a flexible, customizable display that you can control to
examine and analyze acquired waveforms. This section presents an overview of
display operation in the topics Using the Waveform Display and Customizing the
Display.
Signal processing
& transformation
system
Acquisition
system
Output and
storage
User Interface
and display
Sampling
module
Trigger
system
Time base
system
Using the Waveform Display
The waveform display (see Figure 3--16) is part of the User Interface (UI)
application. The UI takes up the entire screen of the instrument and the
waveform display takes most of the UI. Some terms that are useful in discussing
the waveform display follow.
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Displaying Waveforms
(2) Graticule
(5) Horizontal reference
(6) Preview mode indicator
(3) Upper limit of graticule
(selected waveform)
(7) Main view
(1) Waveform display
(3) Lower limit of graticule
(selected waveform)
(7) Mag1 view
(4) Horizontal scale readout (selected waveform)
Figure 3-16: Display elements
(1) Waveform display: the area where the waveforms appear. The display
comprises the time bases and graticules, the waveforms, masks, histograms, and
readouts.
(2) Graticule: a grid marking the display area of a view. Each graticule is
associated with its time base.
(3) Upper and lower amplitude-limits readouts: the upper and lower boundary level
of the graticule for the selected waveform.
(4) Horizontal-scale readout: the horizontal scale of the selected waveform.
(5) Horizontal reference: a control that you can position to set the point around
which channel waveforms expand and contract horizontally on screen as you
change the Horizontal Scale control.
(6) Preview: a status field that indicates when all waveforms are being previewed
(that is, displaying an approximation of the waveforms as they will appear when
acquisition completes). This indicator may appear when you alter acquisition
controls.
(7) Main, Mag1, and Mag2 views: selectable objects displaying on screen in the
display, each with its own display of any waveform that is currently turned on. A
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Displaying Waveforms
view is a representation of a signal on an associated time base—the Main time
base with the Main view, which is always displayed, or one of the two Mag
views, each with its own time base and graticule. The display of the Mag views
can be turned on or off. You can display up to three views on screen (Main plus
Mag1 and Mag2) at the same time.
Touchscreen (not shown): a feature that lets you touch controls on screen to
operate the instrument. See Mouse and Touchscreen Operation on page 3--60.
Why Use?
Use display features and controls to view, test, measure, and otherwise analyze
your waveforms.
What’s Special?
This instrument provides a robust display. Some features of note follow.
Flexible Display Control. Front-panel knobs and buttons support quick access to
the most often used adjustments—those that display, position, and scale
waveforms. Mouse, keyboard, and touchscreen interfaces support complete setup
of all the display parameters.
Multiple Time base Views. Three views, Main, plus Mag1 and Mag2, can be
displayed simultaneously, each with its own time base. Live waveforms are
acquired independently in each time base (C1 in Main is a different waveform
than C1 in Mag1 or Mag2).
All the displayed waveforms appear in each view that you display: if C1 and M1
are displayed in Main, they also appear in Mag1 and Mag2 if you display those
views. Reference waveforms will appear in all views as well, but, since they
have a static time base setting (the time base setting with which they were
saved), they will be identical in all views.
Fast Access to Zoom. Waveform inspection has never been easier. Just click and
drag a box around the feature of interest and it zooms horizontally to fill the
screen, reacquired at a higher resolution.
Preview Mode. The instrument automatically uses a preview display when control
changes initiate reacquisition of waveform data. A preview display shows how
the waveforms will look when acquisition completes. When the instrument
finishes the processing of state changes, it removes the preview and displays the
actual waveforms.
What’s Excluded?
Previewing of changes does not occur when the acquisition system is stopped;
the data will not update on screen until acquisition is restarted.
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Displaying Waveforms
Keys to Using
The key points that follow describe operating considerations for setting up the
instrument time base views so that they best support your data-analysis tasks.
Waveform Display. In general, the method of displaying a waveform is to define
the waveform, and then turn it on. Table 3--2 summarizes this process as it
applies to the different waveforms.
Table 3-2: Defining and displaying waveforms
Waveform1
To define:
To turn on:
Channel:
C1 - C8
Install sampling modules in the instrument
compartments.
Push the Vertical CH button, and then push one of
the numbered buttons 1 - 8.
Reference: R1 - R8
Define an active reference waveform by:
Defining a reference waveform as is described at left
turns on its display.
H
saving a channel, reference, or math waveform
to one of locations R1 - R8.
After a waveform is defined, use the Vertical REF
button with the waveform number buttons to turn the
waveform on and off.
H
recalling a waveform previously saved to a file
into one of locations R1 - R8.
Both of these operations can be performed from the
File menu.
Math:
M1 - M8 Define a math waveform using existing sources
(channel and reference waveforms, and measure-
ment scalar values).
When defining a math waveform, you turn it on in
the Define Math dialog box.
After the waveform is defined, use the Vertical
MATH button with the waveform number buttons to
turn the waveform on and off.
This operation can be performed by selecting the
Edit menu and then selecting Define Math.
1
The waveform number buttons affect C1-C8, R1-R8, or M1-M8, depending on the Vertical Source button you push CH,
REF, or MATH.
Operations on Selected Waveforms. In general, the method of adjusting (vertically
scaling, offsetting, position, and so on) is from the front panel: select the
waveform using the Vertical source and waveform selection buttons, and then
adjust it using the Vertical Scale, Offset, and Position knobs.
Table 3--3 on page 3--57 summarizes operations you can perform for the three
waveform types.
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Displaying Waveforms
Table 3-3: Operations performed based on the selected waveform
Control function
Waveform supports? Operating notes
Ref
Ch
Math
Vertical Scale
Yes
Yes
Yes
If more than one time base is displayed, these controls adjust the
selected channel waveform in all time bases.
Vertical Position
Vertical Offset
Yes
Yes
Yes
Yes
Yes
Yes
No
No
No
No
Yes
No
No
No
No
Vertical offset is unavailable for channel waveforms displayed with rho
or ohm units.
Horizontal Scale
Horizontal Position
Horizontal Record Length
All channel waveforms are adjusted globally in the selected time base.
Math waveforms are not adjusted because their horizontal parameters
are derived from their sources. Reference waveforms are not adjusted
because they have fixed horizontal parameters determined at the time
the waveform was saved.
Automatic Source Selection
for Automatic Measurements
Yes
Yes
Yes
Yes
Yes
No
Yes
Yes
No
Measurements, if selected from Measurements toolbar, use the
selected waveform as the measurement target.
Automatic Target Selection for
Cursors
If cursors are off, pushing the Cursor button on the front panel turns
cursors on with the selected waveform as their target.
Quick Horizontal Scale Adjust
(Zoom)
Dragging a box around a portion of the selected waveform adjusts
horizontal scale to fill the screen with the boxed portion (see
Quick-adjust the time base on page 3-63).
Graticules. One graticule is displayed for the Main time base, and an additional
graticule is displayed for each Mag time base that you turn on. Figure 3--16 on
page 3--54 shows the elements of the time base graticules; the elements are the
same for each time base displayed.
Using Multiple Views. The methods of displaying (turning on) and selecting any
time base view follow:
H
Turn the view on: Press the Mag1 or Mag2 front-panel button once to turn on
the Mag1 or Mag2 time base. The Main view is always (displayed); you
cannot turn it off. Turning on a time base makes it active (selects it for
adjustment).
H
H
Select among displayed views: Press any time base view button to make it
the active, selected time base. The button of the selected view is always lit
amber.
Turn off the selected Mag view: Once selected, press the Mag1 or Mag2
button to turn off the time base. The Main time base becomes the selected
time base.
Operations on the Selected Time Base View. The method of adjusting (horizontal
scaling and positioning, setting resolution/record length, and so on) is from the
front panel: select the time base using the Horizontal time base selection buttons,
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Displaying Waveforms
and then adjust it using the Horizontal Scale, Resolution, and Position knobs.
Only channel waveforms can have their horizontal parameters set directly.
Table 3--3 shows how horizontal operations relate to the waveform types; the key
points to remember follow:
H
H
H
H
As Table 3--3 shows, horizontal operations affect all channel waveforms, but
in the selected view only. For example, you can select each time base in turn
and set one horizontal scale for all channel waveforms in the Main view,
another horizontal scale for those in the Mag1 view, and a third for those in
the Mag2 view.
The instrument displays a reference waveform with horizontal settings in
effect at the time it was saved. You cannot adjust these settings; the
instrument disables the horizontal controls when you select a reference
waveform. See Saving and Recalling Waveforms on page 3--120 for more
information on reference waveforms.
The instrument displays a math waveform with the horizontal settings
derived from its math expression. You cannot change these directly; the
instrument disables the horizontal controls when you select a math wave-
form. See Creating Math Waveforms on page 3--101 for more information on
math waveforms.
All waveforms in each time base are displayed fit-to-screen; that is, within
the full 10 horizontal divisions that the graticule provides.
Waveform Operations that Cross Time Base Views. Unlike the horizontal controls
just described, some controls apply to all time base views:
H
H
Turning a waveform on or off in any view displays or removes it from all
views.
Selecting a waveform in any view makes it the selected waveform in all
views; for example, select C1 in Main, and then select Mag1. C1 is the
selected waveform in Mag1. Turn on Mag2, and Mag2 displays on screen
with C1 selected.
H
Vertical adjustments on a waveform in any time base adjust the waveform in
all time bases.
Display Controls vs. Acquisition Controls. For channel waveforms, the vertical
offset control and the horizontal controls you set adjust the instrument acquisi-
tion parameters. See the following descriptions for more information:
H
H
Vertical Acquisition Window Considerations on page 3--14
Horizontal Acquisition Window Considerations on page 3--17
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Displaying Waveforms
Mag1 and Mag2 are Magnifying Timebases. The Mag1 and Mag2 time bases are so
named because they cannot be set to a more coarse (slower) horizontal scale than
that of the Main. When set to a more fine (faster) horizontal scale, they can be
thought of as magnifying a segment of the Main time base. In short:
H
H
each Mag time base scale sets the size of an aperture on the Main time base.
each Mag time base position setting locates the aperture within the Main
time base.
H
each Mag time base graticule displays, across its full horizontal width
(10 divisions), the contents of the aperture.
See To Display Waveforms in a Mag View on page 3--64 for a procedure that
demonstrates this operating characteristic.
Horizontal Position and the Horizontal Reference. The time values you set for
horizontal position are from the trigger point to the horizontal reference point.
This is not the time from the trigger point to the start of the waveform record
unless you set the horizontal reference to 0%. See Figure 3--17.
Trigger point
50 ms max.
Horizontal position
Horizontal
delay
(19 ns min.)
Time
zero
Time of first point
Horizontal
reference point
Time of last point
Figure 3-17: Horizontal position includes time to Horizontal Reference
NOTE. The time from the trigger to the time of the first point sampled is the
horizontal delay. Note that horizontal delay is set indirectly by the horizontal
position and horizontal reference settings:
Time of first point = Horizontal Position - (10 divs x horizontal scale in sec/div x Horizontal
Reference / 100)
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Displaying Waveforms
Horizontal Units. You can specify the time values in seconds, bits or distance
from the Horizontal Setup dialog box. When you select Distance as the timebase
units, the timebase scale and position controls and the readouts use (appear with)
distance units. You can select from meters, feet, or inches as your distance unit.
The timing measurement results remain as seconds.
The dialog box also provides a Dielectric Const(ant) and Prop(agation) Velocity
controls with which you can select either the effective dielectric constant of the
device under test or its propagation velocity (they interact, so set one or the
other). Distance units and these other two controls are useful when doing TDR
measurements and testing. You may want to turn on distance units and set the
dielectric constant or propagation velocity when making such measurements.
The formula is:
D = v◽T
where:
D = distance per division
co
DielectricConst
v◽ = propogation velocity, =
Ꭹ
co = speed of light in a vacuum, = 2.997925 e8 metersፒs
time per division
T =
Velocity of Propagation (vp) is a measure of how fast a signal travels in that
transmission line.
DielectricConst is the relative effective dielectric constant of the propagation
media.
Mouse and Touchscreen Operation. This instrument ships with a mouse and
keyboard to give you more options for instrument control. However, for some
installations, you might not have sufficient work space to install the mouse or
keyboard. For most operations, you can use the touchscreen instead.
Table 3--4 lists some operations and the mouse/touchscreen equivalents. The
instrument ships with two styluses. Using a stylus can make it easier to perform
touchscreen operations.
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Displaying Waveforms
Table 3-4: Equivalent mouse and touchscreen operations
Operations
Mouse
Stylus or finger
Select waveforms
Left click object on screen
Touch object on screen
Push toolbar and dialog box buttons
Display menus and select menu items
Activate list boxes
Position cursors on screen, draw a zoom
box
Left click and drag
Right click object
Touch and drag
Display a pop up menu for a channel or a
readout
Touch and hold (don’t move stylus)
Type a value in a list box
Click the keyboard icon to pop up the
virtual keyboard; click to type in the value
Touch the keyboard icon to pop up the
virtual keyboard; touch to type in the value
you want (or use the peripheral keyboard if you want
installed)
Display a tool tip
Rest pointer over UI button or label
None
Touch the appropriate button (see below),
and then touch a control in the UI application
Display What’s This Help
Click the appropriate button (see below),
and then click a control in the UI application
main screen button
dialog box button
main screen button
dialog box button
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Displaying Waveforms
To Display Waveforms in
the Main Time Base View
Use the procedure that follows to become familiar with the display adjustments
you can make.
Overview
To control the Main view
Related control elements and resources
Prerequisites 1. The instrument must be installed with sampling modules
in place.
2. The acquisition system should be set to run
continuously.
See the sampling Module user manuals for sampling
module installation. See page 3-24 for acquisition
setup and page 3-48 for trigger setup in this manual.
3. Also, an appropriate trigger signal must be applied to
the instrument and triggering must be set up.
4. Push a Vertical Source button (turns amber) to
assign the numbered buttons 1-8 to operate on
channel, reference, or math waveforms. Push a
numbered button 1-8 to select the waveform (it
displays).
Set the vertical
display
parameters
A waveform button lights when its waveform is on:
H
Lighted green: waveform is on but not
selected
H
Lighted amber: waveform is on and selected
Hint. Step 4 assumes any reference or math
waveforms you select are defined. See Table 3-2
on page 3-56 if you need help defining these
waveforms.
5. Use the Vertical knobs to achieve a good display
of each waveform you select.
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Displaying Waveforms
Overview
To control the Main view (cont.)
Related control elements and resources
Set the horizon-
tal display
parameters
6. Push the View Main button to make sure the Main time
base view is selected. Use the Horizontal knobs to scale
and position the waveform on screen and to set sample
resolution.
Positioned Horizontally
Scaled Horizontally
The Resolution knob sets the record length. (See
discussion on page 3-19.)
Push the Set to 50% button if required to stabilize
display.
Horizontal reference
Adjust the 7. To adjust the point around which the waveforms
Horizontal
Reference
expand and contract, click the Horizontal reference
and drag it left or right on screen.
Move the Horizontal reference along the horizontal
axis until it aligns to the point on the waveform you
want to be stationary on screen.
8. Release the Horizontal reference, and then adjust the
Horizontal Scale knob.
Quick-adjust 9. To quickly rescale a portion of a channel waveform so
the time base
(Zoom)
it expands to fill the 10 divisions on screen. Click on
the screen and drag a box around the portion of the
waveform you want to zoom.
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Displaying Waveforms
Overview
To control the Main view (cont.)
Related control elements and resources
Explore the 10. The next procedure describes how to set up and
Mag time base
controls
control the Mag time bases.
See To Display Waveforms in a Mag View on page 3-64.
End of Procedure
To Display Waveforms
in a Mag View
Use the procedure that follows to become familiar with the display adjustments
you can make when using the Mag 1 and Mag 2 time base views.
Overview
To control a Mag view
Related control elements and resources
Prerequisites 1. Set up as from the last procedure. See right.
See To Display Waveforms in the Main Timebase
on page 3-62.
Turn on a Mag 2. Push the Mag1 or Mag2 View button (turns
view
amber) to display a Mag view. (See right.)
A numbered button lights when its waveform is
on:
H
H
Lighted green: view is on but not selected
Lighted amber: view is on and selected
Tip. Drag the divider bar between the two views to
adjust the display height between them. See the
figure in step 3.
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Displaying Waveforms
Overview
Set horizontal
display
To control a Mag view (cont.)
Related control elements and resources
3. Use the Horizontal knobs (see right) to achieve a good
display of the waveform in the Mag time base.
parameters
Time base settings for Channel waveforms will be
adjusted as you use the controls; the controls will be
inoperable if you have a reference or a math waveform
selected.
Note that the Mag1 markers enclose a segment of Main
view that appears across the 10 division width of the
Mag view. See below.
Portion magnified in the Mag1 time base view
Main
Divider
bar
Mag
For more 4. Press the Horizontal Menu front-panel button. Click
information
the
icon in the the upper-right corner of the Horiz
Setup dialog box, and then click any dialog-box
control to pop up help on that control.
See Accessing Online Help on page 3-167 for an
overview of the online help system.
5. Click the Help button in the Horiz Setup dialog box to
access a context-sensitive overview on the horizontal
controls and their set up.
End of Procedure
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Displaying Waveforms
Customizing the Display
Why Use?
Use the display customizing features this instrument provides to present the
display elements—color, graticule style, waveform representation, and so
on—according to your preferences.
Color grading. You can select color grading of a waveform so that its data color
or intensity reflects the frequency of occurrence of the data.
What’s Special?
The key points that follow describe operating considerations for setting up the
the display system so that it presents waveforms and other display elements.
Keys to Using
Display Settings. Table 3--5 lists display attributes that you can set and where
they are accessed.
Table 3-5: Customizable display attributes
Display attribute
Access
Options
Menu name1
Entry
User Preferences2
Utility
Graticule Style
Display Mode
Choose from Full, Grid, Cross-hair, and Frame styles.
Setup
Utility
Setup
Utility
Display
User Preferences2
Display
Choose from Normal, Infinite Persistence, and Variable Persistence
Modes.
User Preferences2
Show Vectors
(normal display
mode only)
Choose No to display each waveform as a series of dots.
Choose Yes to display vectors or lines between the dots.
Setup
Display
Shortcut
Utilities
Utility
Properties
Waveform Label
Waveform Color
Enter a new label for the waveform you have selected.
Waveform Prop’s
Waveform Prop’s
Properties
Shortcut
Setup
Cursor Colors
Graticule Colors
Histogram Color
Mask Color
Cursors
Choose from six different colors for each waveform; choose from 16
different colors for a cursor, graticule, histogram, or mask.
Setup
Display
Setup
Histogram
Setup
Mask Test
Waveform Color
Grading
Shortcut
Color Grading
Choose to display a waveform with its data color graded based on its
frequency of occurrence. See Color grade a waveform on page 3-70.
Virtual Keyboard
Utility
User Preferences
Choose from alphabetic or QWERTY styles.
1
Except for “Shortcut,” the Menu Names refer to the menus found in the Menu bar at the top of the instrument screen. The
shortcut menu for a waveform can be displayed by right clicking on a displayed waveform or on its icon, which is
displayed in the waveform bar (left of the graticule).
2
Available only on instrument running the MS Windows 98 Operating System.
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Displaying Waveforms
Normal and Persistence Displays. Use display persistence to control how
waveform data ages:
H
Normal style displays waveforms without persistence: each new waveform
record replaces the previously acquired record for a channel. You can choose
to display normal waveforms as vectors, which displays lines between the
record points, or dots (vectors off) which displays the record points only.
You can also choose an interpolation mode. See Interpolation below.
H
H
Variable Persistence style accumulates the waveform-record points on screen
and displays them for a specific time interval. The oldest waveform data
continuously fades from the display as new waveform records acquire.
Infinite Persistence style accumulates the data record points until you change
some control (such as scale factor) or explicitly clear the data, causing the
display to be erased. Waveform data builds up as new data records acquire.
Persistence style applies to all waveforms, except for channel waveforms and
reference waveforms displayed with color or intensity grading.
Interpolation. For record lengths of less than 500 points, you can choose to have
the instrument interpolate between the sampled points it acquires. Interpolation
affects the display only; mask testing, histograms, and automatic measurement
results are based on acquired, not interpolated, data. There are three options for
interpolation:
H
Sin(x)/x interpolation computes record points using a curve-fit between the
actual values acquired. The curve-fit assumes all the interpolated points fall
along that curve. Sin(x)/x interpolation is particularly useful when acquiring
more rounded waveforms, such as sine waves. Sin(x)/x interpolation may
introduce some overshoot or undershoot in signals with fast rise times.
H
H
Linear interpolation computes record points between actual acquired samples
by using a straight-line-fit. The straight-line-fit assumes all the interpolated
points fall in their appropriate point in time on that straight line. Linear
interpolation is useful for many waveforms such as pulse trains.
None turns interpolation off. Only points actually sampled appear in the
displays of waveform records.
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Displaying Waveforms
To Set Display Styles
Use the procedure that follows to become familiar with the display styles you
can set.
Overview
To set display styles
Related control elements and resources
Prerequisites 1. The instrument must be powered up, with any waveform
you want to display on screen.
See page 3-24 for acquisition setup and
page 3-48 for trigger setup.
Access the 2. From the application menu bar, select Setup, and then
Display setup
dialog box
select Display. See right.
Set Interpolation mode
Select normal 3. From the Display Setup dialog box (see right) , choose
style, vectors,
and interpola-
tion
Normal to select a display with no acquisition data
persistence.
Check for normal display
Check for vectors
Waveforms display with the new data from ongoing
acquisitions replacing that data in the same time
intervals/slots but acquired as part of the last, previous
waveform.
4. Check Vectors to turn on display lines between
waveform dots; uncheck to display only dots.
5. Select an Interpolation mode from the pulldown list.
Choose from Sin(x)/x, Linear, or None.
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Displaying Waveforms
Overview
To set display styles (cont.)
Related control elements and resources
Select a 6. From the the Setup Display dialog box (see right),
persistence
Mode
choose:
H
Infinite Persistence to make data persist until
you change some control (such as scale factor)
or explicitly clear the data. Waveform displays
accumulate data as new waveform records
acquire, resulting in a build up of data in all time
slots.
Set variable
persistence time
Access to virtual keyboard
H
Variable Persistence to make data persist for a
specified time. New waveform displays
accumulate data as new waveform records
acquire, but with continuous replacement of the
oldest data.
If you select Variable Persistence, set a time at
which the oldest data is removed.
Continue with 7. For more ways to customize the display, see the next
procedure.
the next
procedure
See To Customize Graticule and Waveforms on
page 3-69.
End of Procedure
To Customize the
Graticule and Waveforms
Use the procedure that follows to become familiar with the display adjustments
you can make.
Overview
Customizations you can make
Related control elements and resources
Prerequisites 1. Display the waveforms to be measured on screen.
The waveform may be a channel, reference, or math
waveform.
See page 3-24 for acquisition setup and page
3-48 for trigger setup.
2. If the source to be measured is in the Mag1 or Mag2
view, turn that view on.
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Displaying Waveforms
Overview
Customizations you can make (cont.)
Related control elements and resources
Waveform Icon
Change wave- 3. Right click on the waveform or its icon. See right.
form color
4. Choose Properties from the menu that pops up.
or label
5. Type a new name in the Waveform Label box. The
instrument will use the new label to mark the selected
waveform in the graticule area.
6. Choose a color from the Color pulldown list. Click OK
to dismiss the dialog.
Color grade a 7. Right click on the channel waveform or its icon. See
waveform
right.
Waveform Icon
8. Choose Color Grade from the menu that pops up.
Color grading a waveform is one of several instrument
operations that uses a waveform database. There are
four available, so no more than four waveforms can be
color graded at the same time.
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Displaying Waveforms
Overview
Customizations you can make (cont.)
Related control elements and resources
Reduce a wave- 9. Right click on the waveform or its icon. See right.
form to its icon
10. Choose Show from the menu that pops up to toggle the
waveform between shown (checked) and hidden
(unchecked).
Tip. Hiding a waveform is useful when you temporarily want
to remove the display of a waveform without turning it off.
Hidden waveforms change their waveform icons (in the
Waveform bar left of screen) as shown:
Waveform shown
Waveform hidden
Change grati- 11. From the application menu bar, select Setup, and then
cule style and
color
select Display. See right.
12. Use the graticule controls to select a graticule style.
13. Select the color of the screen from the Background
pulldown list. Select the color of the graticule from the
Foreground pulldown list.
14. Click the
box.
button to close the Setup Display dialog
For further
assistance
15. Click the
icon in the the upper-right corner of
the Display Setup dialog box, and then click any
dialog-box control to pop up help on that control.
16. Click the Help button in the Display Setup dialog box
to access a context-sensitive overview of the display
controls and their set up.
See Accessing Online Help on page 3-167 for
overview of the online help system.
End of Procedure
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Displaying Waveforms
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Measuring Waveforms
To assist you in analyzing the waveforms you acquire, the instrument comes
equipped with cursors and automatic measurements. This section describes these
tools and how you use them:
H
Taking Automatic Measurements, on page 3--74, describes how you can set
up the instrument to automatically measure and display a variety of
waveform parameters. See Figure 3--18.
H
H
Taking Cursor Measurements, on page 3--85, describes using cursors to make
amplitude and time measurements on waveforms. See Figure 3--18.
Optimizing Measurement Accuracy, on page 3--92, tells you how to run
compensation routines and deskew channels to optimize the accuracy of your
measurements.
NOTE. You can also make graticule measurements, counting graticule divisions
and multiplying them by the vertical or horizontal scales set for the waveform
you are measuring.
Graticule
Readouts
Cursors
Measurement
readouts
Cursor
readouts
Figure 3-18: Graticule, cursor and automatic measurements
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Measuring Waveforms
Taking Automatic Measurements
Why Use?
This powerful and flexible tool provides automatic extraction of various
parameters from the waveforms that this instrument acquires. Automated
measurements quickly give you immediate, continuously updating, measurement
results for a rich selection of waveform parameters, such as risetime or extinction
ratio. You also can display statistics on how the measurement results vary as they
continuously update. See What’s Excluded on page 3--76 for information on the
??? indicator when measuring waveform parameters.
What’s Measured?
You get to choose:
H
Most automatic measurements require both a source selection and a
measurement selection. To quickly select a measurement, use the measure-
ment toolbar to first set the waveform type, Pulse, RZ, or NRZ, and then
select a category, Amplitude, Timing, or Area, in the pulldown lists of the
toolbar. Next, click the icon of the measurement that you want to use to
measure the selected waveform (or drag the icon to any waveform, selected
or not, on screen to measure that waveform). The results appear in the
measurements readout at the right of the screen. See the procedure that starts
on page 3--80.
H
H
Select from the extensive range of parameters this instrument can measure;
for a list, see Appendix B: Automatic Measurements Supported. This section
of the manual defines the supported measurements (selections) for each
category.
Feed the entire waveform to a measurement or limit the measurement to a
segment of the waveform. By default, the instrument takes each automatic
measurement over the entire waveform record, but you can use measurement
gates to localize each measurement to the section of a waveform (see To
Localize a Measurement on page 3--83).
H
Select from these measurement sources: channel, reference, and math
waveforms, and waveform databases 1 through 4.
What’s Special?
This instrument implements a robust automatic measurement system. Some of
the features adding value to this system follow.
Annotate Waveforms On Screen. You can turn on annotations that mark character-
ization levels that each measurement uses to compute results. See Figure 3--19.
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Measuring Waveforms
Annotations indicate the waveform
region determining measurement
Figure 3-19: Measurement annotations on a waveform
Use Databases as Sources. If you define the source you want to measure as a
database in the Meas Setup dialog box, you can use the database of that
waveform as source. The measurement you select operates on the accumulated
waveform data (databases accumulate repetitive instances of a source waveform
over time).
For example, consider the Max measurement. Max will capture and update the
maximum (most positive) value encountered. For a database source, the ongoing
Max measurements can only result in a higher max value as the database
accumulates ongoing acquisitions. This process causes the Max measurement
readout to track max up but not down. In contrast, the Max measurement for a
waveform source not included in a database will track variation up and down as
new waveforms are acquired.
Characterize Measurements Independently. To allow you control over how your
waveform data is characterized by each measurement, the instrument lets you set
the methods used independently for each measurement. See High/Low Tracking
Method on page 3--77 and Reference Levels Method on page 3--79.
See Statistics on Measurement Results. To see how any automatic measurement
varies statistically, you can display a readout of the Min, Max, Mean, and
Standard Deviation the measurement results. See step 6 on page 3--81 for
instructions. See also the following topic for information about questionable
measurements.
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Measuring Waveforms
What’s Excluded?
The following exclusions apply when using automatic measurements:
H
H
More than eight measurements at one time are not allowed.
Except for Average Optical Power, all measurements of the category RZ or
NRZ must be performed on a waveform database (see Use Databases as
Sources on page 3--75). The Average Optical Power measurement cannot use
a waveform database as its source.
H
H
The Average Optical Power measurement cannot display Annotations (see
page 3--74) and cannot use gates or user-defined High/Low methods (see
page 3--77).
If the waveform parameter that is to be automatically measured cannot be
acquired (incorrect control setup, out-of-range input signals), this instrument
displays the indicator “???.” For example, if the instrument acquires less
than a full waveform cycle, it cannot measure frequency or period and
displays ???.
Keys to Using
The key points that follow describe operating considerations for setting up
automatic measurements to obtain the best measurement results.
Measurement Selection. The instrument takes automatic measurements of the
following categories: Amplitude, Timing, and Area. Check Appendix B:
Automatic Measurements Supported for a listing of the measurements that you
can choose from in each signal type category.
Number of Measurements. The instrument can take and update up to eight
measurements at one time. You can apply measurements to any combination of
sources (described below). You can take all eight measurements on C1, for
example, or one measurement each on C1 -- C8.
Measurement Sources. All channel, reference, and math waveforms can serve as
sources for automatic measurements. You can also measure any of the four
waveform databases that the instrument supports. You can specify a waveform as
source in the Meas Setup dialog box even if the waveform is not displayed.
Some measurements, such as Gain, Delay, and Phase, require two sources. For
example, Gain would be used to measure an input from one measurement source
(such as C1) with respect to an output in another source (such as C2).
Databases as Sources Behavior. Consider the following operating behaviors
regarding measurements and databases:
H
When enabling a measurement, it will always measure the waveform
database if the measurement source you choose is currently displayed as a
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Measuring Waveforms
waveform database. You can measure the waveform instead of its database if
you turn off Use Wfm Database in the Meas setup dialog box.
H
If you assign a database to a waveform already being used as a source for an
automatic measurement, it will not automatically measure the waveform
database; you must explicitly specify its use by turning on Use Wfm
Database in the Meas Setup dialog box.
High/Low Tracking. The levels that the automatic measurement system derives as
the High (Top) or Low (Bottom) for a waveform influence the fidelity of
amplitude and aberration measurements. For many of the automatic measure-
ments supported, the instrument automatically determines these levels and
disables all or some of the High/Low tracking method controls (for example,
RMS). If the measurement you select has High/Low methods that are appropriate
to adjust (or example, RISE time), the instrument automatically enables the
method controls for your adjustment as shown below.
Select among methods
Check to use method you select;
uncheck to enter level directly
High/Low Tracking Method. Depending on which measurement you select, High,
Low, or both, tracking will be enabled with their boxes checked as shown above.
You can select among the several modes the instrument provides for determining
these levels:
H
Mode (of Histogram) sets the values statistically. Using a histogram, it
selects the most common value either above or below the midpoint
(depending on whether it is defining the high or low reference level). Since
this statistical approach ignores short term aberrations (overshoot, ringing,
and so on), Mode is the best setting for examining pulses. See Figure 3--20.
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Measuring Waveforms
High (min/max)
High (mean)
High (mode)
Mid reference
Low (mode)
Low (mean)
Low (min/max)
Figure 3-20: High/Low tracking methods
H
Mean (of Histogram) sets the values statistically. Using a histogram, it
selects the mean or average value derived using all values either above or
below the midpoint (depending on whether it is defining the high or low
reference level). This setting is best for examining eye patterns and optical
signals. See Figure 3--20.
H
H
Min-max uses the highest and lowest values of the waveform record. This
setting is best for examining waveforms that have no large, flat portions at a
common value, such as sine waves and triangle waves — almost any waveform
except for pulses. See Figure 3--20.
Auto switches between methods. Auto method first attempts to calculate the
high and low values using the Mode method. Then, if the histogram does not
show obvious consistent high and low levels, Auto method automatically
switches to the Min/Max or Mean method.
For example, the Mode histogram operating on a triangle wave would not
find consistent high and low levels, so the instrument would switch to
the Min/Max mode. Consistent high and low levels would be found on a
square wave, so the Auto mode would use the Mode method.
When setting High/Low method, be aware of these operating behaviors:
H
H
H
The tracking settings are not global; that is, you can independently set the
method used for each of Meas 1 -- Meas 8.
You can turn off tracking for either or both the High and Low levels and
enter them directly.
Not all tracking methods are appropriate for all measurements. If you cannot
set the tracking method, the controls will be disabled.
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Measuring Waveforms
Reference Levels Method. You can choose the method that the instrument uses to
determine a second group of levels when taking time-related measurements.
These levels are the High, Mid, and Low references. For example, the measure-
ment system takes risetime from the waveform-edge segment that transitions
from the Low to the High reference levels.
The instrument provides the following calculation methods; refer to Figure 3--21
as you read about each method:
1. Relative Reference is calculated as percentage of the High/Low range.
2. High Delta Reference is calculated as absolute values from the High Level.
3. Low Delta Reference is calculated as absolute values from the Low Level.
4. Absolute Reference is set by absolute values in user units.
5. AOP (not shown) measures the Average Optical Power of the waveform and
uses it as the Mid Ref level. See Pulse Crossings and Mid-reference Level
AOP on page B--58 for more information.
Reference level calculation methods
High (50 mV)
High reference
90%
50%
10 mV
50 mV
90 mV
50 mV
40 mV
0 mV
Mid reference (0 mV)
- 4 0 m V
10%
90 mV
10 mV
Low reference
Low (-50 mV)
Figure 3-21: Reference-level calculation methods
The High and Low levels from which the reference levels are calculated in
methods 1 -- 3 above are the levels established using the selected High/Low
tracking method described in High/Low Tracking Method on page 3--77.
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Measuring Waveforms
The AOP method is the Average Optical Power reference level. This reference
level selection is best used when taking the Optical Modulation Amplitude
(OMA) measurement on a pulse waveform. (The AOP setting is ignored for
NRZ waveforms.) This method is selected by default when measurement type is
set to OMA. See the OMA measurement on page B--5.
Default Methods. The waveform-characterization methods just covered—the
High/Low-tracking and the reference-level-calculation methods used—can be set
for each measurement and its waveform source in the Meas Setup dialog box. If
you do not set the methods individually, the instrument uses its default character-
ization methods.
Use the procedure that follows to quickly take a measurement based on the
default settings for High/Low method and for reference-level method.
To Take Automatic
Measurements
Overview
To take automatic measurements
Related control elements and resources
Prerequisites 1. Theinstrument must displaythewaveform tobemeasured
on screen.
See page 3-24 for acquisition setup and
page 3-48 for trigger setup.
Select the 2. Use the Vertical buttons to select the waveform to be
waveform
measured.
The waveform may be a channel, reference, or math
waveform.
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Measuring Waveforms
Overview
To take automatic measurements (cont.)
Related control elements and resources
Take Automatic 3. Select one of the signal (waveform) types and then
measurements
select a category from the measurement bar.
4. Click the measurement you want in the measure-
ment tool bar.
5. Read the results in the measurements readout.
Tip. To show the levels (see page 3-74) on which
your measurement is based, turn on Annotations:
Right click on measurement in the readout, and
select Show Annotations from the menu as
.
shown at right.
To see statistics 6. Right click on any measurement readout to display its
context menu.
7. Select Show Statistics to display measurement
statistics in the measurement readout. See What’s
Excluded on page 3-76 for information about the ???
indicator.
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Measuring Waveforms
Overview
To take automatic measurements (cont.)
Related control elements and resources
To measure a 8. From the application menu bar, select Setup, and then
database
select Measurement. See right.
9. In the Meas Setup dialog box, make sure the
measurement (one of Meas1 through Meas8) is
selected.
10. In the Source tab, check the Use Wfm Database option
as shown below.
Tip. If, at the time you first create a measurement, the
measurement source you select is displayed as a
waveform database, the database will automatically be
measured. Uncheck the User Wfm Database option if
you want to measure the waveform instead of the
database.
For more in- 11. Press the Help button in the Meas Setup dialog box to
formation
access the online help.
12. See Appendix B: Automatic Measurements Reference,
on page B-1 for a list of the measurements and their
definitions.
See page 3-167 to learn about using online help.
End of Procedure
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Measuring Waveforms
To Localize a
Measurement
Use the procedure that follows to set gates on a measurement source, which
forces the measurement to be taken over a segment of the waveform (otherwise,
the entire waveform feeds the measurement).
Overview
To gate a measurement
Related control elements and resources
Prerequisites 1. Set up as from last procedure.
See To Take an Automatic Measurement on
page 3-24
Access the 2. From the application menu bar, select Setup, and then
gates
select Measurement. See right.
Access to virtual keyboard
Enable and 3. Select the Region tab to expose the gate controls. Click
position the
gates
to check the box as indicated at right to turn gating on
and to display the gates on screen.
4. If Annotations are not on, click the Annotations box, or
the gates will not display.
Vary to position gates
Check to display gates
5. Use the G1 (Gate1) and G2 spin controls (or click ands
type in values-see right) to adjust the gates on screen
such that the area to measure is between the gates.
Tip. Values are entered as a % of the waveform,
displayed from left to right. If no keyboard is installed,
access the virtual keyboard and use the touch screen to
enter values.
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Measuring Waveforms
Overview
To gate a measurement (cont.)
Related control elements and resources
Gate G1
Gate G2
End of Procedure
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Measuring Waveforms
Taking Cursor Measurements
Why Use?
Use cursors to measure amplitude and time quickly and with more accuracy than
when using graticule measurements. Because you position cursors wherever you
want on the waveform, they are easier to localize to a waveform segment or
feature than automatic measurements.
Time or amplitude or both. Vertical cursors measure time or bits on screen;
horizontal cursors measure amplitude: voltage, watts, rho, or ohms; and
waveform cursors measure both. Table 3--6 expands on these definitions.
What’s Measured?
Table 3-6: Cursor functions (types)
Cursor function
Parameter measured
Cursor readout
Horizontal cursors measure amplitude (volts, watts). Each cursor
measures with respect to:
H
H
H
v1 = Level at Cursor 1 with respect to its source ground level
v2 = Level at Cursor 2 with respect to its source ground level
∆v = Level at Cursor 2 - Level at Cursor 1
Horizontal cursors
Level is cursor displacement from the source ground times the
source volts/div. Note that the two cursors may have different
sources and therefore can have different volts/div settings.
Vertical cursors measure distance (time in seconds or bits). Each
cursor measures with respect to:
Trigger point
H
H
H
H
t1 = Time at Cursor 1 with respect to the trigger point
t2 = Time at Cursor 2 with respect to the trigger point
∆t = Time at Cursor 2 - Time at Cursor 1
Vertical cursors
1/∆t = 1/(Time at Cursor 2 - Time at Cursor 1)
Time is divisions of displacement of the cursor from its source trigger
point times the source time/div. Note that the two cursors may have
different sources and, therefore, can have different time base (Main,
Mag1, Mag2) settings.
Waveform cursors measure both voltage and time. Each cursor is,
in effect, both a vertical and horizontal cursor. Neitherof thesepaired
cursors can be moved off the waveform.
Trigger point
Note that sources can have different volts/div settings.
Waveform cursors
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Measuring Waveforms
What Sources
Can I Measure?
Cursors can measure channel, reference, and math waveforms, as well as
waveform databases. You may set the source of each cursor explicitly in the
Cursor Setup dialog box.
Keys to Using Cursors
The key points that follow describe operating considerations for setting up cursors
to obtain best measurement results.
Cursor Types. The three cursor types are described in Table 3--6 on page 3--85.
There are two cursors displayed for all types, Cursor 1 and Cursor 2; the cursor
currently selected for adjustment is the solid cursor (bottom cursor in Fig-
ure 3--22
+ 3 divisions at 100 mV/div
+ 3 divisions at 20 mV/div
Figure 3-22: Horizontal cursors measure amplitudes
Cursors are Display-Limited. You cannot move a cursor off screen. Also, if you
resize waveforms, the cursors do not track. That is, a cursor stays at its screen
position, ignoring changes to horizontal and vertical scale and position and to
vertical offset. However, waveform cursors track the waveform point vertically;
they work differently than vertical and horizontal cursors.
Cursors Default to the Selected Waveform. Each cursor measures its source,
defined in the Cursors Setup dialog box. Note the following behavior regarding
source selection:
H
When cursors are first turned on, the instrument automatically assigns them
to use the waveform currently selected on screen as the source for each
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Measuring Waveforms
cursor. Up to the time you turn cursors on, you can select a waveform on
screen to use it as the source for the cursors.
H
H
Once cursors are on, selecting a different waveform does not change the
source the cursors measure. To change the source while cursors are on, you
must change the source in the Cursors Setup dialog box.
Turning cursors off restores the default cursor source assignment so that
assignment again tracks the currently selected waveform.
Cursors Can Treat Sources Independently. Each cursor can take a different,
independent source, with each source having its own amplitude scale and time
scale. Consider the example presented by Figure 3--22 on page 3--86:
H
H
H
Cursor1 is set to measure channel 3 (C3), which is set to 100 mV/div, so the
cursor readout v1 measures C3 relative to its ground as 3 divisions x
100 mV/div, or about 300 mv.
Cursor 2 is set to measure reference l (R1), which is set to 20 mV/div, so the
cursor readout v2 measures R1 relative to its ground as 3 divisions x
20 mV/div, or about 60 mv.
Note that the value of each graticule division, relative to the delta readout, is
not readily apparent because the delta-amplitude readout (∆v) must account
for the different amplitude-scale settings of the sources. To do so, the ∆v
readout displays the results of v2 -- v1 (--60 mv -- 300 mv = --240 mv),
automatically accounting for the different scales of the cursor sources.
Time readouts behave similarly with regard to different sources with different
time bases. Each cursor displays its time readout, t1 or t2, with respect to the
time base of its source, and ∆t is calculated as t2 -- t1, automatically accounting
for any difference in the time base of each cursor source.
NOTE. If a cursor readout does not seem correct, check the source of each cursor
in the Cursor Setup dialog box. Each cursor readout relates to the amplitude and
time base settings of their source.
Vertical Cursors Measure from the Trigger Point. Remember that each vertical
cursor measures the time from the trigger source to itself. This relationship is
shown in Figure 3--23 on page 3--88.
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Measuring Waveforms
Horizontal Ref = 0%
First sampled point
Trigger point of cursor
source
Cursor readout (tn) = Time to first point
Horizontal divs x sec/div
+
Cursor
Figure 3-23: Components determining Time cursor readout values
Note that a vertical cursor readout (t1 or t2) includes and varies directly with the
time-to-first-point component, which varies directly with the horizontal position
set for the time base used by the cursor-source waveform. To see the amount of
time to the first point, press Horizontal Menu on the front panel and set
Horizontal Ref to 0% in the dialog box that displays. Now the Horizontal
position readout shows the time to first point, and subtracting this value from the
cursor readout yields the cursor position on screen relative to first point. (You
can find the horizontal readout both in the dialog box and in the control bar at
the bottom of the screen.) The following relationships hold:
Time to First Point = Horiz Position (when Horiz Ref Position is set to zero)
t1 or t2 readouts = Time to First Point + Additional Time to Cursor
Cursor Units Depend on Sources. A cursor that measures amplitude or time will
read out in the units of its source as indicated in Table 3--7. Note mixed sources
require the delta readouts to follow the units of the cursor 1 source.
Table 3-7: Cursor units
Cursors
Horizontal
Vertical
Standard units1
Readout names
v1, v2, ∆v
volts, watts, rho, ohms
seconds, bits
t1, t2, ∆t
Waveform
volts, watts, seconds, bits
v1, v2, ∆v, t1, t2, ∆t
1
If the v1 and v2 units do not match, the ∆v readout defaults to the units used by the
v1 readout; if the t1 and t2 units do not match, the ∆t readout units defaults to t1
readout units.
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Measuring Waveforms
To Take a Cursor
Measurement
Use the procedure that follows to take cursor measurements on waveforms.
Overview
To take cursor measurements
Related control elements and resources
Prerequisites 1. At least one waveform must be selected on screen. Or
you can set cursor values directly using the procedure
referenced at right.
See To Set the Cursor Sources on page 3-90.
Take cursor
measurements
2. Press the CURSORS button (see right). Press:
H
H
H
once to display vertical bar cursors (shown below).
twice to display horizontal bar cursors.
a third time to display waveform-based cursors.
3. Press the SELECT button to toggle selection between
the two cursors. The active cursor is the solid cursor.
4. Turn the General Purpose knob to position each cursor
on the waveform to measure the feature that interests
you.
5. Read the results in the cursor readout.
In the figure shown above, waveform cursors are
used to measure the bit-time of the eye diagram.
Tip. The cursor readout indicates the source time
base and waveform for the selected cursor; in this
case, the main time base, M1, and channel 1, C1.
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Measuring Waveforms
Overview
To take cursor measurements (cont.)
Related control elements and resources
To reassign cur- 6. Press the Cursor button repeatedly to toggle through the
sors
cursor selections until the cursors are off. Then select a
new waveform on screen.
Tip. You can set the cursors source(s) directly using the
procedure listed at right.
See To Set the Cursor Sources on page 3-90.
End of Procedure
To Set the Cursor Sources
You can target each cursor to the source it is to measure. (See Cursors Treat
Sources Independently on page 3--87). To do so, use the procedure that follows.
Overview
To set the cursor sources
Related control elements and resources
Prerequisites 1. Display the waveforms to be measured on screen.
The waveform may be a channel, reference, or math
waveform.
See page 3-24 for acquisition setup and
page 3-48 for trigger setup.
2. If the source to be measured is in the Mag1 or Mag2
time base, turn that time base on.
Display the Cur- 3. From the application menu bar, select Setup, and then
sor Setup dia-
log box
select Cursors. See right.
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Measuring Waveforms
Overview
To set the cursor sources (cont.)
Related control elements and resources
Click to access sources
Select the cur- 4. From the pop-up list (see right) for each of Cursor 1 and
sor sources
Cursor 2, select a source:
Select source from
pop-up list
H
To measure a single source, choose the same
source for both cursors — Main C1, for example.
H
To measure two different sources in the same time
base, make sure the time bases match — Main
C1 and Main C2, for example.
Math & Ref sources
appear if defined
H
To measure two different sources in different time
bases, select different waveforms and time
bases — Main C1 and Mag1 C2, for example.
Mag1 & Mag2 sources
appear if displayed
Tip. References and Math waveforms are listed as
sources only if defined and turned on. All sources listed
for the Main time base are also listed for the Mag1 and
Mag2 time bases if the time base views are displayed
on screen.
End of Procedure
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Measuring Waveforms
Optimizing Measurement Accuracy
Why Use?
The procedures given here will increase the accuracy of the measurements you
take.
Compensation
This instrument can compensate itself and the sampling modules installed,
optimizing the internal signal path used to acquire the waveforms you measure.
Compensation optimizes the capability of the instrument to make accurate
measurements based on the ambient temperature.
NOTE. After first installing a sampling module(s) or moving a sampling module
from one compartment to another, you should run compensation from the
Utilities menu to ensure the instrument meets it specifications when reaching a
stable equilibrium after power-up (normally 20 minutes is recommended).
You must save the compensation results or they will be lost when the instrument
is powered down.
To Compensate the
Instrument and Modules
Use the following procedure to optimize the instrument for the current tempera-
ture to enhance measurement results.
Overview
To perform a compensation
Related control elements and resources
Prerequisites 1. Instrument should have the sampling modules installed
and be powered on. Allow a 20 minute warm up.
See Install the Sampling Modules on page 1-10.
Display the 2. From the application menu bar, select Utilities, and then
Compensation
dialog box
select Compensation. See right.
In the Compensation dialog box, the main instrument
(mainframe) and sampling modules are listed.
The temperature change from the last compensation is
also listed. See below.
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Measuring Waveforms
Overview
To perform a compensation (cont.)
Related control elements and resources
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Measuring Waveforms
Overview
To perform a compensation (cont.)
Related control elements and resources
Select the 3. Wait until the Status for all items you want to
compensate changes from Warm Up to Comp Req’d or
Pass.
scope of the
compensation
4. In the Select Action fields, select Compensate.
5. From the top pulldown list, select the target to
compensate. Choose from:
Click to select
compensate
H
All to select the main instrument and all its
modules (default selection).
Choose targets to
compensate
Enabled only if module
selected as target
H
H
Mainframe to select only the main instrument.
Module to select an individual module for
compensation.
If you have selected Module as the target, also choose
the channel to be compensated from the pulldown list of
channels.
Click to start
compensation
Run the 6. Click the Execute button to begin execution of the
compensation.
compensation
Instructions to disconnect inputs and install dust
covers on optical module channels and 50 Ω
terminations on electrical module channels will
appear on screen. Be sure to follow static
precautions (see the user manual for your sampling
module) when following these instructions.
Note. Failing to install the 50 Ω terminations can
yield erroneous compensation failures or results.
See Equipment Required on page 1 -20.
The compensation may take several minutes to
complete. Pass should appear as Status in the
dialog box when compensation completes.
If Fail appears as Status, rerun the compensation. If
Fail status continues after rerunning compensation
and you have allowed warm up to occur, the module
or main instrument may need service.
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Measuring Waveforms
Overview
To perform a compensation (cont.)
Related control elements and resources
Save the 7. In the Select Action fields, select Save.
compensation
8. Click the Execute button to save the new compensation
results. The new compensation results will be lost when
the instrument is powered down if they are not saved.
The Storage destination for the compensation results is
limited to the User area. The Factory settings cannot be
overwritten.
Recalling a 9. In the Select Action fields, select Recall.
compensation
10. In the Storage field, select the compensation to recall,
User or Factory.
User recalls the last saved user compensation. Factory
recalls the compensation established at the factory.
Note. Before proceeding, make sure you want to rewrite
the compensation you just saved.
11. Click the Execute button to recall the compensation
results.
Note. The Factory compensation should only be recalled
to bring the instrument to a known state. Recalling the
Factory compensation does not guarantee measurement
accuracy.
End of Procedure
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Measuring Waveforms
To Deskew Channels
When making differential, common-mode, or other measurements, you may need
to null out the propagation delay contributed by the input cabling between two or
more channels. Use the following procedure to adjust the deskew between
channels.
NOTE. When deskew is applied between channels within the same sampling
module, the time shift is accomplished by making a second waveform acquisi-
tion. In this case, waveform sample points for the two channels are not acquired
on the same trigger event. This means that if the input signals are eye patterns
(multi-valued from one trigger event to the next), then math waveforms that
depend on correlation between samples from the two channels will not operate
as expected.
For instance, the difference between two channels (C1--C2) will result in an eye
pattern with a line of data points through the vertical center of the eye. If you
intend to create an eye pattern with a math waveform between two channels in
the same sampling module, deskew should be set to exactly zero. Skew must be
eliminated with external accessories.
When deskew is applied between channels in different sampling modules, the
independent time base for each slot is programmed with a different delay value
and the sample points are acquired on the same trigger event.
Overview
To deskew between channels
Control elements and resources
Prerequisites 1. Drive the channels with signals requiring deskew.
Function
generator
2. Drive the trigger direct input with the function generator
trigger output.
3. Set the instrument to trigger on the slope of the
waveform that matches that of the edges you want to
deskew.
Trigger
output
4. Display the signals on screen.
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Measuring Waveforms
Overview
To deskew between channels (cont.)
Control elements and resources
Set up the 5. Set up the channel to be used as the reference channel:
reference
a
Push the channel numbered button under Vertical
on the front panel.
channel
b
Use the Vertical SCALE knob and POSITION
knobs to display the waveform edge to be
deskewed to fill the screen vertically.
6. Use the Horizontal SCALE knob and POSITION knobs
to display the waveform edges to be deskewed to fill the
screen horizontally.
Deskew the 7. Set up the channel to be deskewed: repeat step 5 for
channel
the channel to be deskewed.
8. Push Vertical MENU front panel button, and from the
Vertical Setup dialog box, adjust the Deskew value (see
right) to make the edges of the reference and the
deskew channel coincide (or are as close as possible).
9. If you cannot align the edges completely, try selecting
the reference channel and adjusting its deskew.
Deskew 10. If you need to, you can deskew additional channels:
more channels
11. Turn off the channel just deskewed, and leave the
reference channel on.
12. Set up the channel to be deskewed: repeat step 7 and
step 8 for the new channel to be deskewed.
13. Continue this process for as many channels as you want
to deskew.
14. Disconnect the deskew hookup.
End of Procedure
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Measuring Waveforms
To Perform Dark-Level
and User Wavelength Gain
Compensations
Performing a dark-level compensation maximizes the accuracy of the extinction
ratio and other optical automatic measurements you take. Performing a User
Wavelength Gain compensation optimizes an optical channel for your custom
input signal.
NOTE. Dark level compensation performs a subset of the module compensation
process. It is designed to be fast so it can be performed frequently, just before
measurements are taken. This compensation is not saved and are only valid for
the selected bandwidth or filter path and the internal optical power meter.
You should perform the procedure To Compensate the Instrument and Modules
on page 3--92 to compensate all vertical bandwidth and filter selections.
Use the following procedure to perform either compensation; this procedure
applies only to optical modules.
Overview
To perform optical compensations
Control elements and resources
Prerequisites 1. The instrument must be installed with at least one
optical sampling modules to be dark-level calibrated in
place. The acquisition system should be set to run
continuously.
See the sampling-module User Manuals for
sampling module installation.
Select the 2. Use the Vertical buttons to select the channel to be
waveform
compensated.
Access 3. From the application menu bar, click Setup, and then
dark-level com-
pensation
click Vertical. See right.
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Measuring Waveforms
Overview
To perform optical compensations (cont.)
Control elements and resources
Run the dark- 4. In Vert Setup dialog box, click the Dark Level button
level compensa-
tion
under Compensation. See right. Follow the instructions
on screen.
5. Repeat steps 2 and 4 for any additional optical channels
you want to compensate.
Run the user If you want, you can can compensate an optical channel for
wavelength gain a custom input signal:
compensation
6. In Vert Setup dialog box, click the User Wavelength
Gain button under Compensation. See right. Follow the
instructions on screen.
7. In the User Wavelength Gain Compensation dialog box,
set the wavelength and power of the signal to be
applied to the channel. See right.
H
User should have an optical signal attached to
module input with a precisely known amount of
optical power. An independently-calibrated average
optical power meter is used to measure this power
precisely. Then signal is connected to the 80C0X
with the same fiber cables.
8. Press the OK button to execute the compensation.
9. Repeat steps 2, 6, and 7 for any additional optical
channels you want to compensate.
End of Procedure
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Measuring Waveforms
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Creating Math Waveforms
Once you have acquired waveforms or taken measurements on waveforms, the
instrument can mathematically combine them to create a waveform that supports
your data-analysis task. For example, you can define a math waveform that
combines waveforms mathematically (+, --, /, x). You can also integrate a single
waveform into an integral math waveform as is shown below.
Source waveform
Math waveform
Defining Math Waveforms
This instrument supports mathematical combination and functional transforma-
tions of waveforms that it acquires. Figure 3--24 shows this concept:
Channel waveform
(C2)
Math expression
(function(source))
Math waveform
(M1)
Diff(C2)
Figure 3-24: Functional transformation of an acquired waveform
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Creating Math Waveforms
Why Use?
Create math waveforms to support the analysis of your channel and reference
waveforms. By combining and transforming source waveforms and other data
into math waveforms, you can derive the data view that your application
requires. You can create math waveforms that result from:
H
mathematical operations on one or several waveforms or measurements: add,
subtract, multiply, and divide.
H
function transforms of waveforms, such as integrating, differentiating, and so
on.
You can create up to eight math waveforms; see Keys to Using on page 3--103 for
more examples.
Some features of note follow:
What’s Special?
Functions. Powerful functions, such as integrate, differentiate, average, can be
taken on single waveforms or more complicated expressions.
Measurement Scalars. The results (scalars) from automatic measurements can be
used in expressions. For example, you can use the measurement Mean on a
waveform and subtract, from the original waveform, the scalar that results to
define a new math waveform.
What’s Excluded?
Some operations that you cannot use with math waveforms follow:
H
H
H
Math-on-Math. You cannot use math waveforms as sources for other math
waveforms. For example if you have a math waveform defined as
M1 = C1 -- C2, you cannot define a second math waveform as
M2 = M1 + C3. You can however expand the second math waveform to
M2 = C1 -- C2 + C3.
Mag Time Base Expressions. Sources for math expressions must be sources
associated with the Main time base. For example, M3 = C1 + C2 uses these
sources as acquired and displayed by the Main time base, not by the Mag1 or
Mag2 time base. You cannot create M3 = C1(Main) -- C2(Mag1). See Table
3--8 on page 3--103.
Waveform Databases as Sources. If you assign a channel to a waveform
database and then use the channel in a math-waveform expression, the data
currently acquired in the channel is used, not the data accumulated in the
waveform database over time.
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Creating Math Waveforms
Keys to Using
The key points that follow describe considerations for creating math waveforms
that best supports your data-analysis tasks.
How to Create. You create math waveforms when you create a math expression.
You do so by applying numerical constants, math operators, and functions to
operands, which can be channel, waveforms, reference waveforms, measure-
ments (scalars), or fixed scalars. You can display and manipulate these derived
math waveforms much like you can the channel and reference waveforms (see
Operations on Math Waveforms on page 3--107).
Some examples of typical math waveforms follow.
Table 3-8: Math expressions and the math waveforms produced
To...
Enter this math expression...
and get this math waveform...
...normalize a waveform
...
...shifted and scaled to fit a std. template
Source waveform
Normalized math waveform
1.05V
1.00V
0.95V
(C1 - Meas1)/ Meas2,
where
1.6V
C1 is waveform shown left
Meas1 = Low of C1
Meas2 = amplitude of C1
CHAN1
0.8V
+0.05V
0.00V
-0.05V
...simulate ac coupling and integrate
...
...DC component removed before integration
Source waveform
AC integration math waveform
+3V
Intg(C1-Meas1),
where
5.0 V
C1 is waveform shown left
Meas1 is set to take the Mean of C1
CHAN1
1.0V
- 3 V
Sources. Math Waveforms can incorporate the following sources:
H
H
H
Channel waveforms
Reference waveforms
Measurement scalars (automated measurements) that measure channel or
reference waveforms in any time base
H
Fixed scalars that you enter as numerical constants in expressions
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Creating Math Waveforms
Source Dependencies. In general, math waveforms that include sources as
operands are affected by updates to those sources:
H
H
H
Shifts in amplitude or DC level of input sources that cause the source to clip
also clip the waveform data supplied to the math waveform.
Changes to the vertical offset setting for a channel source that clip its data
also clip the waveform data supplied to the math waveform.
Changes to the acquisition mode globally affects all input channel sources,
thereby modifying any math waveforms using them. For example, with the
acquisition mode set to Envelope, a C1 + C2 math waveform will receive
enveloped channel 1 and channel 2 data and, therefore, will also be an
envelope waveform.
H
Clearing the data in a waveform source causes a baseline (zero-volt level) to
be delivered to any math waveform that includes that source until the source
receives new data.
Time Base Dependencies. Selections for math-waveform sources (operands)
consist of channel and reference waveforms that are acquired or defined and
viewed in the main time base.
The math waveforms derive their time base and record lengths from waveform
sources. You cannot change them directly; you can only change them indirectly
by changing the time base for the source.
In case of sources having different record lengths, the math waveform created
matches the shorter waveform, and the additional trailing data from the longer
waveform is not used.
You may also want to read the section about deskewing channels on page 3--96.
Expression Syntax. You build math waveforms using the Define Math Waveform
dialog box. To help you create valid math waveforms, this dialog box blocks
illegal entries by disabling any dialog-box element that would create an invalid
entry in the math waveform expression.
The syntax that follows describes valid math expressions, which can be quite
complex (in excess of 100 characters long):
<Expression> := <UnaryExpression> | <BinaryExpression>
<UnaryExpression> := <UnaryOperator> ( <Term> )
| <UnaryOperator> ( <Expression> )
<BinaryExpression> := <Term> <BinaryOperator> <Term>
| <Scalar> <BinaryOperator> <Term>
| <Term> <BinaryOperator> <Scalar>
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Creating Math Waveforms
<Term> := <Waveform> | ( <Expression> )
<Scalar> := <Integer> | <Float> | <Meas-Result>
<Waveform> := <ChannelWaveform> | <ReferenceWaveform>
<ChannelWaveform> := C1 | C2 | C3 | C4 | C5 | C6 | C7 | C8
<ReferenceWaveform> := R1 | R2 | R3 | R4 | R5 | R6 | R7 | R8
<UnaryOperator> := Integrate | Differentiate | Average | Max | Min
| Filter | Vmag | Exp | log | ln | sqrt
<BinaryOperator> := + | - | / | *
<Meas-Result> := meas1 | meas2 | meas3 | meas4 | meas5 | meas6 | meas7 | meas8
Use the procedure that follows when defining a math waveform. Remember, you
should first ensure that the sources you use exist. Channel sources will be
acquired when used in a math expression, reference waveform sources should
contain saved waveforms, and so on. These sources do not have to be displayed
to be used.
To Define a
Math Waveform
Overview
To define a math waveform
Related control elements & resources
Prerequisites 1. All channel and reference waveforms and automatic
measurement scalars that you will use in your math
waveform must be available (channels and references
contain data, measurement scalars are defined, and so
on.)
See sampling-module user manuals for sampling
module installation. See page 3-24 for acquisition
setup and page 3-48 for trigger setup in this
manual.
Note. If you use a channel that is not acquiring,
including it in a math waveform that you turn on will
implicitly cause it to be acquired.
Display 2. Press the Vertical MATH button twice if it is unlit, once if
lighted, to display the Define Math dialog box.
the Math
dialog box
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Creating Math Waveforms
Overview
To define a math waveform (cont.)
Related control elements & resources
Select a math 3. Click the Math Waveform drop-down list in the dialog
waveform
box and select a one of the eight available math
waveforms, M1 through M8. Be sure to click to check
the On box, so that the waveform displays.
Tip. If the waveform you select already exists, its math
expression appears in the dialog box. You can still use
the waveform by clicking the Clear button, which
discards its previous math expression. Or repeat step 3
to select another waveform.
Build a math 4. Use the dialog box at right to define a math expression.
expression
See Table 3-8 on page 3-103 for expression examples;
some guidelines for creating your expression follow:
H
Sources — C1 - C8, R1 - R8, and Meas1 -
Meas8 — should be set up before you use them
(references and automated measurement scalars
defined).
H
Elements that appear grayed out cannot be
selected because they would result in an illegal
entry. For example, the sources are grayed out
because a source was just entered. You must enter
an operator before entering another source.
H
H
Use the backspace button to remove the last entry;
use the clear key to remove the entire expression
and start over.
Use parentheses to group terms in the expression
to control execution order, for example,
5*(C1 + C2).
Apply a filter 5. Use the filter controls in the dialog box to apply a filter to
the math waveform defined by the expression. Here are
some guidelines:
H
Num Avgs. Set the number of averages applied by
the Avg( function. Only affect waveforms if the Avg(
function is used.
H
H
Filter Risetime. Set to limit risetime to improve TDR
measurement results.
Filter Mode. Choose Centered or Shifted for causal
or noncausal filtering.
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Creating Math Waveforms
Overview
To define a math waveform (cont.)
Related control elements & resources
Apply the 6. Once you have defined the math expression to your
expression
satisfaction, click the Apply button. Then click on the
OK button to dismiss the dialog box. See To Use Math
Waveforms on page 3-109 for more procedures.
For more
information
7. Click the
icon in the the upper-right corner of the
Define Math dialog box, and then click any dialog-box
control to pop up help on that control.
8. Click the Help button in the Define Math dialog box to
access context-sensitive overview on math waveforms.
See Accessing Online Help on page 3-167 for
overview of the online help system.
End of Procedure
Operations on Math Waveforms
This instrument supports many of the same operations that it provides for
channel (live) and reference waveforms. For example, you can measure math
waveforms with cursors. This section introduces these operations:
H
H
H
Vertical display scaling and positioning
Taking automatic measurements
Taking cursor measurements
Why Use?
Use math waveform operation, such as those listed above, to enhance the
displaying, processing, and analyzing of math waveforms. For example, in
addition to the operations listed, you can save math waveforms as references and
make them the source of either of two onboard waveform data bases.
What’s Excluded?
Some operations allowed on channel waveforms are not allowed on math
waveforms:
H
Independent horizontal scaling. Each math waveform that you create derives
its horizontal scale and position from the sources you include in its math
expression. Horizontal controls will not operate with math waveforms.
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Creating Math Waveforms
You can adjust these controls for the source waveforms and your adjustments
will reflect in the math waveform as the sources update. You can also
magnify math waveforms using the Mag1 or Mag2 derived time bases.
H
H
Independent vertical offset. You cannot adjust the offset for a math wave-
form; you can adjust the offset of channel waveforms used as sources to a
math waveform.
Explicit gating of waveforms. The entire math waveform is used as input to
the automatic measurement system.
Keys to Using
Basically, you use the same techniques to work with math waveforms that work
with channel waveforms. The key points that follow describe operating
considerations to take into account when using math waveforms.
Source Considerations. In general, be aware that changes to source waveforms
that you include as math-expression operands are reflected in the math wave-
form. See Source Dependencies on page 3--104.
Display Considerations. Turn on and off the display of math waveforms like you
do channel and reference waveforms. Use the same front-panel controls
(waveform selection buttons, vertical position and scale knobs) and application
controls (waveform control bar elements at the bottom of the display; vertical
setup menu). Mouse operation for positioning waveforms on screen work also.
As is true for channel and reference waveforms, turning a math waveform on or
off in any time base display, Main, Mag1, or Mag2, also turns it on or off in all
the time bases.
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Creating Math Waveforms
To Use Math Waveforms
The procedure that follows demonstrates some common operations you can
perform on math waveforms:
Overview
To use math waveforms
Related control elements & resources
Prerequisites 1. The Math waveform must be defined and displayed. See
the reference listed at right.
See To Define Math Waveforms on page 3-105
Select and dis- 2. Press the Vertical MATH button. The button of the
play
currently displayed and selected math waveform will
light amber; the buttons of all other currently displayed
math waveforms will light green. Math waveforms not
displayed remain unlighted.
3. Press any waveform button to make it the selected
waveform. If the waveform was not displayed,
operation is as follows:
H
If the waveform you select is defined, it displays,
otherwise..
H
the Define Math dialog box displays so that you
can define and turn on the waveform you just
selected. (See To Define a Math Waveform on
page 3-105 for a procedure for doing so.)
Tip. You can also click the math waveform in the
display, or its icon at the left of the display, to select it.
Set scale and 4. Use the Vertical Scale and Position knobs to size and
position
position the waveform on the screen.
Tip. You can’t adjust the offset of a math waveform.
However, adjustments of offset settings in the source
waveforms will reflect in the math waveform as
determined by its expression.
Tip. You can’t adjust horizontal scale, position, and
sample density (resolution) of math waveforms. If
adjusting these settings affect sources for a math
waveform, the adjustment will be reflected in the math
waveform.
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Creating Math Waveforms
Overview
To use math waveforms (cont.)
Related control elements & resources
Take automatic
measurements
5. Press the Vertical MATH button, and use the
numbered front-panel button to choose a math
waveform from M1 - M8. (See right.)
6. Select one of the signal types, such as Pulse, and
then select a measurement category from the
measurement bar.
7. Click a measurement button. The instrument
automatically takes the measurement on the
waveform you selected in step 5.
8. Read the results in the measurements readout.
Tip. For more control of your measurement, go to
the Setup menu (in the application menu bar) and
select Measurements. Click the Help button in the
Measurements Setup dialog box that displays for
more information.
.
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Creating Math Waveforms
Overview
To use math waveforms (cont.)
Related control elements & resources
Take cursor
measurements
9. Press the Vertical MATH button, and use the
numbered front-panel button to choose a math
waveform from M1 - M8. The button will light amber
when you have chosen the waveform. (See figure at
upper right.)
10. Press the CURSORS button (see figure at lower
right). Press:
H
Once to display vertical bar cursors (shown
below)
H
H
A second time to display horizontal bar cursors
A third time to display waveform-based cursors
11. Press the SELECT button to toggle selection
between the two cursors.
12. Turn the knob to position each cursor on the math
waveform to measure the feature that interests you.
13. Read the results in cursor readout.
In the figure shown above, waveform cursors are
used to measure the V of the integral math
waveform, which could be used to compute its
area (svdt).
End of Procedure
For more information on taking automatic and cursor measurements of wave-
forms, see Measuring Waveforms on page 3--73.
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Creating Math Waveforms
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Data Input and Output
This section describes the input and output capabilities of your instrument.
Specifically, it covers:
H
H
H
H
H
Saving and Recalling Setups on page 3--113
Saving and Recalling Waveforms on page 3--120
Exporting Waveforms and Histograms on page 3--128
Printing Waveforms on page 3--132.
Remote Communication on page 3--139
Signal processing
& transformation
system
Acquisition
system
Output and
storage
User Interface
and display
Sampling
module
Trigger
system
Time base
system
Saving and Recalling Setups
This instrument can save a number of different instrument setups for later recall,
limited only by the space you have to store the setups.
Save and recall different setups to switch from setup to setup without having to
first manually record your settings and then manually set them. This capability is
helpful when you want to:
Why Use?
H
H
H
save and recall a setup that optimizes the instrument for displaying and
analyzing a certain signal.
save a series of setups to help automate a procedure through recall of a
sequence of saved setups as part of performance of the procedure.
export a setup for sharing with a second instrument.
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Data Input and Output
What’s Special?
Some features of note follow:
Commenting. The Save-Setup and the Recall-Setup dialog boxes provide for
including and viewing comments with your saved setups. That way, you can
store information, readable upon recall, that describes each setup you save and its
intended application.
Virtual Keyboarding. If you do not have a keyboard connected, you can still enter
comments and name setup files. The Save and Recall Setup dialog boxes include
the Virtual Keyboard button, shown left. When you touch or click it, the
instrument displays a virtual keyboard on screen that you can use with your
mouse or the touch screen to enter the setup-path name, setup-file name, and
comment.
The instrument excludes the following items when saving setups:
What’s Excluded?
H
Waveforms in channels (C1-C8) or references (R1-R8). Control settings
(scale, position, and so on) are saved but not the waveform data. Upon recall
of the setup, the settings are applied, but the data is not restored.
H
Waveforms in Math Waveforms (M1-M8). Control settings and the math
expression are retained but not the waveform data. Upon setup recall, the
recalled math waveform expressions will be applied, but there is no math
waveform data to restore. Instead, a new math waveform will be generated
based on the recalled expression.
H
H
User Options that are stored in the Windows Registry. These include all
options accessed by first selecting Utilities (menu bar), and then User
Preferences (Utilities menu).
Standard Masks. Standard masks are not stored with the setups. However, if
your recalled setup includes display of a mask, recalling the setup will, in
turn, display the mask. Also, masks you define are stored with the setups.
The key points that follow describe operating considerations for setting up the
saving and recalling of setups.
Keys to Using
All Settings are Retained. The instrument includes almost all instrument settings,
with a few exceptions (such as user options) in the saved setup.
Retaining Current Settings. Recalling a setup replaces the current setup with the
recalled setup. If you do not want to lose your current setup, save it to its own
setup file for later recall before you recall the new setup.
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Data Input and Output
Avoiding Setup and Waveform Mismatches. Saved setups may contain settings
inappropriate for waveforms currently in your instrument. For example, you
might have saved a setup that displayed a fiber channel mask, such as FC531, for
testing channel 1. If later you display a gigabit ethernet signal in channel 1 and
recall your saved setup, the FC531 mask will display.
Avoiding Setup and Sampling Module Mismatches. Recall of a setup assumes that
the sampling module appropriate to the recalled setup is installed. For example,
recalling a setup that saved optical vertical-control settings requires that an
optical sampling module be installed. If not, the instrument substitutes default
settings for the affected vertical controls settings instead of recalled settings.
Other examples of such mismatches include:
H
Recalling a setup that includes TDR without the TDR-capable sampling
module installed. You must have the TDR-capable module installed in the
same compartment it was in when the setup was saved.
H
Recalling a setup that includes a clock-recovery setup without the appropri-
ate clock-recovery-capable sampling module installed. You must have the
clock recovery-capable module installed in the same compartment as when
the setup was saved.
To Save Your Setup
Use the procedure that follows to save a setup to the instrument hard disk, a
floppy disk, or third-party storage device.
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Data Input and Output
Overview
To save your setup
Control elements & resources
Prerequisites 1. The instrument must have appropriate sampling
modules in place before powering on the instrument.
2. Instrument must be powered up.
H
See Sampling Module User Manuals for
sampling module installation.
3. Set up the instrument controls as you want them saved
as part of a recallable setup.
H
H
H
See Power On Instrument on page 1-13.
See page 3-24 for acquisition setup.
See page 3-48 for trigger setup.
For help in making your setup, check the references at
right and other sections in this chapter specific to the
setup you wish to make.
Display the 4. From the application menu bar, select File, and then
select Save Setup. See illustration at right.
Save Setup dia-
log box
The Save Setup dialog box allows for the entry of a file
name, file type, and includes a field for adding your
comments. See below.
Name a 5. Use the Save in: drop-down list and buttons (see right)
to navigate to the directory in which to save your setup.
destination
Tip. If you save the setup file in the MS Windows
Startup directory, the saved preferences will be loaded
with each MS Windows startup.
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Data Input and Output
Overview
To save your setup (cont.)
Control elements & resources
Name your 6. Name your setup file by either:
setup
H
H
H
accepting the default file name that appears in the
File name: text box.
clicking in the File name text box and typing a new
name, replacing the default file name.
Access to virtual keyboard
clicking an existing name in the file list (if any are
listed). Data in existing file will be overwritten.
Tip. If your instrument lacks a keyboard, touch or click
on the virtual keyboard icon (indicated right) to display a
virtual keyboard. You can use the mouse or touch
screen with the virtual keyboard to type entries in the
name fields and comments fields.
7. If not selected, select *.stp in the Save as type list box
as the type of file. (Setup files are always type *.stp).
Tip. Only change the type if you want to temporarily see
any other types of files in the current directory.
Otherwise, leave it set at *.stp.
Add a comment 8. Enter a useful comment about each setup you save.
(optional)
Write the comment such that it explains the purpose of
the saved file when that file is later accessed (see right).
Tip. Use comments frequently. The comment that you
enter appears when you (or others) later select your
setup in this dialog box or in the Recall Setup dialog
box. In the first case, it might help you avoid overwriting
a setup you wanted to keep; in the second case, it can
help determine the purpose of the setups saved earlier.
Save your setup 9. Click the Save button to save the setup file. To cancel
without saving, click Cancel button.
For more 10. For more help on saving setups, click the Help button
information
in the Setup dialog box to access contextual help on
screen.
See page 3-167 to learn about using online help.
End of Procedure
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Data Input and Output
To Recall Your Setup
Use the procedure that follows to recall a setup to the instrument. Remember that
recalling a setup replaces the existing setup, which is lost.
Overview
To recall your setup
Control elements & resources
Prerequisites 1. The instrument should have appropriate sampling
modules in place for the setup to be recalled. You must
have access to a setup saved by the instrument.
H
See Sampling Module User Manuals for
sampling module installation.
H
H
See Power On Instrument on page 1-13.
See Keys to Using on page 3-114.
Display the 2. From the application menu bar, select File, and then
Recall Setup
dialog box
select Recall Setup. (See right.)
The Recall Setup dialog box allows navigation to
directories, lists setup files in the directory, and provides
for selection of a setup file. Comments for selected files
appear in the comment box. (See below.)
Name a 3. Use the Look in: drop down list and buttons (see right)
to navigate to the directory which contains a setup that
you want to recall.
destination
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Data Input and Output
Overview
To recall your setup (cont.)
Control elements & resources
Select your 4. If not selected, select *.stp in the Save as type list box
setup
of file to include in the dialog box file listing. (Setup files
are always type *.stp).
Tip. Only change the type if you want to temporarily see
any other types of files in the current directory.
Otherwise, leave it set at *.stp.
5. Choose your setup file by either:
H
H
Clicking an existing name in the file list.
Clicking in the File name field and typing a new
name, replacing the default file name.
Access to virtual keyboard
Tip. If your instrument lacks a keyboard, touch or click
on the icons as indicated right to display a virtual
keyboard. You can use the mouse or touch screen with
the virtual keyboard to type entries in the name fields
and comments fields.
View any in- 6. Read the comment associated with the setup you
choose if any is present. It can contain information about
using the setup you are about to restore (see right).
cluded com-
ment (optional)
Tip. Selecting a file displays any comments that were
entered when the setup was saved. Comments can help
you ascertain the purpose of the setups saved earlier.
Recall your 7. Click the Recall button to save the setup file. To cancel
setup
without recalling a setup, click the Cancel button.
Tip. You can also recall the default setup from this
dialog box; clicking the Default button recalls the the
factory default setup.
For more 8. For more help on recalling setups, click the Help
information
button in the dialog box to display contextual help on
screen.
See page 3-167 to learn about using online help.
End of Procedure
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Data Input and Output
Saving and Recalling Waveforms
This instrument can save any number of waveforms, limited only by the space
you have to store them.
Why Use?
By saving a waveform, you can recall it at a later time for comparison, evalua-
tion, and documentation. This capability is helpful when you want to:
H
recall a waveform for further evaluation or comparison with other wave-
forms.
H
extend the waveform carrying capacity of the instrument. The instrument
supports eight reference, eight channel, and eight math waveforms. If you
want more than eight references, you can save the additional reference to
disk for recall later.
What’s Special?
Some features of note follow:
Commenting. The Save-Waveform dialog box and the Recall Waveform dialog
box contain a comments field for including and reading comments with your
saved waveforms. That way, you can store information, readable upon recall,
describing each waveform that you save.
Virtual Keyboarding. If you do not have a keyboard connected, you can still enter
comments and name waveform files. The Save and Recall Setup Waveform
dialog boxes include the Virtual Keyboard button shown left. When you touch or
click it, the instrument displays a virtual keyboard on screen that you can use
with your mouse or the touch screen to enter the waveform-path name, file name,
and comment.
What’s Excluded?
You cannot recall into a channel or a math waveform. The instrument recalls
each waveform into one of the reference waveform locations (R1-R8). Also, you
cannot save and recall waveform databases.
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Data Input and Output
To Save Your Waveform
Use the procedure that follows to save a waveform or waveforms to the
instrument hard disk, a floppy disk, or third party storage device.
Overview
To save a waveform
Control elements & resources
Prerequisites 1. The instrument must have appropriate sampling
modules in place before powering on the instrument.
Instrument must be powered up.
2. Make sure the waveform to be saved exists; that is, your
source must be a channel, an active math waveform, or
an active reference. Display the waveform in the
timebase in which you want to save it, Main1, Mag1,
and/or Mag2, or the waveform will not appear in the
Save Waveform dialog box.
H
See Sampling Module User Manuals for
sampling module installation.
H
H
See Power On Instrument on page 1-13.
See page 3-24 for acquisition setup.
H
H
See page 3-48 for trigger setup.
For help in setup and acquiring waveforms, check the
references at right.
See page 3-57 for time base display.
Display the 3. From the application menu bar, select File, and then
select Save Waveform. See right.
Save Waveform
dialog box
The Save Waveform dialog box lists all available
waveforms for all displayed timebases, allows for
browsing to destination directory (saving to file) or for
selecting a reference (saving to one of R1-R8). It also
includes a field for adding your comments. See below.
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Data Input and Output
Overview
To save a waveform (cont.)
Control elements & resources
Select a 4. Navigate to the directory in which to store your
destination
waveform. You can:
H
Save to a reference: Click to check Reference, and
then use the pulldown list to select any reference
(R1-R8). You can save to empty references or save
over existing references. Skip to step 8 to finish.
H
Save to a file: Click to check File(s) and continue
with step 5 that follows.
Select waveforms individually
Select your 5. Select one or more waveform to save:
waveform(s) to
save
H
H
H
Click a waveform in the tree view (see right). Note
that only displayed timebases and their waveforms
appear.
Extend your selection, if desired, by holding down
the control key and clicking additional waveforms,
or...
Select all waveforms in timebase
Select all waveforms in a given timebase by
clicking the timebase (for example, click Main).
Tip. If your instrument lacks a keyboard, you can’t use
the control key to extend selections. However, you can
touch or click individual waveforms or timebases to
select them.
Edit path and file name
Select directory 6. Specify the directory and filename(s) in which to save
and name file
your waveform(s). If you’ve selected a single waveform,
you can:
H
H
H
Use the default name and directory appearing in
the File Path field.
Access to virtual keyboard
Access to file system
Click to access the file system (see right) and
navigate to a new directory.
Rename the file and/or change the directory by
typing a new name and path into the File Path field.
If you’ve selected multiple waveforms, the File Path field
will change to Dir\Prefix. You can edit the path and the
prefix used for the filenames as just described. All files
will save into the same directory. The File Path field will
change to Dir\Prefix.
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Data Input and Output
Overview
To save a waveform (cont.)
Control elements & resources
Add a comment 7. For saves to files or to references, you can enter a
(optional)
useful comment about the each waveform you save.
Write each comment such that it explains the purpose of
the saved waveform when its waveform file is later
accessed (see right).
Tip. If you save multiple waveforms, the instrument
saves your comment with all the resulting files, so make
such a comment pertain to all the waveforms.
Save your 8. Click the Save button to save the waveform file or
waveform
reference. To cancel without saving, click Cancel button.
For more 9. For more help on saving waveforms, press the Help
information
button in the dialog box to access the contextual
online help.
See page 3-167 to learn about using online help.
End of Procedure
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Data Input and Output
To Recall Your Waveform
Use the procedure that follows to recall a waveform to a reference. You can only
recall waveforms into references.
NOTE. Reference waveforms do not recall because they are already instrument
resident. You can copy a reference waveform to another reference: first display
the reference to be copied, and then use the Save Waveform procedure to save it
to another reference (R1-R8).
Overview
To recall a waveform
Control elements & resources
Prerequisites 1. The instrument must have appropriate sampling
modules in place before powering on the instrument.
Instrument must be powered up.
H
H
See Sampling Module User Manuals for
sampling module installation.
See Power On Instrument on page 1-13.
Display the Re- 2. From the application menu bar, select File, and then
call Waveform
dialog box
select Recall Waveform. (See illustration at right.)
The Recall Waveform dialog box allows navigation to
directories, lists waveform files in the directory, and
provides for selection of a waveform file. Comments for
selected files appear in the comment box. (See below.)
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Data Input and Output
Overview
To recall a waveform (cont.)
Control elements & resources
Name a 3. Use the Look in: drop down list and buttons (see right)
to navigate to the directory which contains a waveform
that you want to recall.
destination
Select your 4. If not selected, select *.wfm in the Files of type field to
waveform
force the dialog-box file listing to only include these
types. Use *.wfm for waveforms.
Tip. Only change the type if you want to temporarily see
any other types of files in the current directory.
Otherwise, leave it set at *.wfm.
5. Choose your waveform file by either:
H
H
Clicking an existing name in the file list.
Access to virtual keyboard
Clicking in the File name field and typing a new
name, replacing the default file name.
Tip. If your instrument lacks a keyboard, touch or click
on the icons as indicated right to display a virtual
keyboard. You can use the mouse or touch screen with
the virtual keyboard to type entries in the File name and
Files of type boxes.
View any 6. Read the comment associated with the waveform file
included com-
ment (optional)
you choose, if a comment is present. It can contain
information that help you use the waveform you are
about to restore (see right).
Tip. Selecting a file displays any comments that were
entered when the waveform was saved.
Recall your 7. Click the Recall button to save the waveform file. To
waveform
cancel without recalling a waveform, click the Close
button.
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Data Input and Output
Overview
To recall a waveform (cont.)
Control elements & resources
For more 8. For more help on recalling waveforms, press the Help
information
button in the dialog box to access contextual online
help.
See page 3-167 to learn about using online help.
End of Procedure
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Data Input and Output
To Clear References
You can clear individual references of data individually or all at once. If a
reference is listed as active and you are sure you do not want the data it contains,
use the procedure that follows to clear it. You can clear any of the active
references R1-R8.
Overview
To clear a reference
Control elements & resources
Display the 1. From the application menu bar, select Edit, and then
Clear Refer-
ences dialog
box
select Clear References. See illustration at right.
Select Refs 2. Click to select the reference to clear. If you have a
keyboard installed, you can hold down the control key
and click to select multiple references for deletion. Click
the Clear button to delete; click the Close button to
dismiss the dialog box.
End of Procedure
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Data Input and Output
Exporting Waveforms and Histograms
This instrument also supports export of a waveform or histogram to a file. The
instrument exports the data as comma-separated ASCII text.
Why Use?
By exporting a waveform or a histogram, you can use it with other analysis
tools, such as spreadsheets or math-analysis applications.
Keys to Using
The key points that describe operating considerations for setting up the exporting
of waveforms and histograms follow:
H
Waveforms export as a series of comma-separated values (CSV), which are
amplitudes without units. There is no timing information, but data is placed
in the file in sequence from the first sample in the waveform record to the
last.
H
H
Histograms also export as a series of comma-separated values (CSV), which
are values without units. One value is present for each bin in the histogram.
Because the waveforms are exported as CSV, without timing and scaling
information, the instrument does not import these waveforms directly. If you
intend to recall a waveform later, save it (see the procedure To Save Your
Waveform on page 3--121) instead of exporting it. You cannot import
histograms.
H
You may also choose to copy a waveform and paste directly into some
applications such as Microsoft Word or Excel. If so, select your waveform,
and then select Copy in the Edit menu.
To Export Your Waveform
The procedure to export waveforms is almost the same as the procedure to save a
waveform. Use the procedure To Save Your Waveform on page 3--121 while
observing the following differences:
H
Select Export Waveform from the the File menu instead of Save waveform.
The Export dialog box displays (see Figure 3--25 that follows).
H
H
H
You can only select and export one waveform at a time.
You cannot include comments with your exported waveform.
Your exported waveform will contain the waveform data as a series of
comma separated values (no timing information, but data is sequential).
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Data Input and Output
Figure 3-25: Export dialog box
To Export Your Histogram
Use the process just described for exporting a waveform on page 3--128, select
the Histogram button in the Export dialog box (see Figure 3--25). Also skip
selecting a source. The instrument supports a single histogram, so the current
histogram is automatically selected. If no histogram is enabled in the Hist Setup
dialog box, the Histogram button will be disabled in the Export dialog box.
To Use an Exported
Waveform (or Histogram)
How you use the exported waveform or histogram depends on your application.
The following example is a simple application using a waveform; the procedure
is general and may require adapting for your spreadsheet or other data-analysis
tool.
Overview
To use exported waveforms
Control elements & resources
Prerequisites 1. MS Excel 97 running on a PC or on the instrument.
2. Access to a waveform exported by the instrument.
H
See To Export Your Waveform on
page 3-128.
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Data Input and Output
Overview
To use exported waveforms (cont.)
Control elements & resources
Import the 3. In Excel, select Open from the File menu. Use the
dialog box that pops up to navigate to the directory
containing the file.
waveform data
4. In the dialog that displays, make the selections as
shown right as you navigate through the Text Import
Wizard. You must select delimiter as your data type,
comma as the delimiter type, and General as your
data type.
Tip. This step assumes MS Excel 97; your tool may
have similar import features for comma-separated da-
ta. Check its documentation.
Begin your 5. Click on the row number to select the entire row
chart
containing your imported waveform values (See
illustration at right.)
6. Select the Chart button from the toolbar (See
illustration at right.) or from the Insert menu.
Select the entire row
Access the chart wizard
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Data Input and Output
Overview
To use exported waveforms (cont.)
Control elements & resources
Specify a 7. From the Chart Wizard, make sure Built In is checked.
line-graph
chart
Then select the either Lines in the Standards Types
tab or Smooth lines in the Custom Types tab. (See
illustration at right.)
Finish the 8. Click Next to step through the next two steps
chart
accepting the defaults settings at each step. Click the
Finish button in step 4. You should have a waveform
display similar to that show right.
Tip. This procedure assumes MS Excel 97. You can
likely specify titles, customize the treatment and
labeling of the x and y axes, etc. in your data-analysis
application—either as you create the chart or
afterward. Use the help for your data-analysis
application to determine if it has these capabilities
and for instructions in using them.
For more 9. For more help on exporting waveforms., press the
information
Help button in the dialog box to access contextual
online help.
See page 3-167 to learn about accessing online help.
End of Procedure
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Data Input and Output
Printing Waveforms
You can print the display screen, including any waveforms displayed. Before
doing so, you must install and set up your printer.
To Print Waveforms
To print the display and its waveforms, do the following steps:
Overview
To print waveforms
Control elements & resources
Prerequisites 1. Waveforms must be displayed on screen.
2. Your printer must be accessible and configured
properly.
H
H
H
See Acquiring Waveforms on page 3-3.
See Triggering on page 3-39.
See Displaying Waveforms on page
3-53.
H
See your printer instructions and/or the
Windows Help. (See page 3-161 for
information on accessing Window help.)
Access the 3. Select the File menu from the application menu bar,
Print dialog
box
and then select Print in the menu.
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Data Input and Output
Overview To Print Waveforms (cont.)
Control elements & resources
Configure and 4. Configure your print job using the the standard
Print
Microsoft Windows Print dialog box that displays.
Press the OK button to print your display.
Tip. Access the printer instructions or the Windows
Help system if you require more information on
printing.
End of Procedure
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Data Input and Output
To Print Using
Ink-saver Mode
To conserve ink and improve print quality when printing images of waveform
displays, you can use Ink-saver mode. Do the following steps:
Overview
To print using ink-saver mode
Control elements & resources
Prerequisites 1. Waveforms must be displayed on screen.
2. Your Printer must be accessible and configured
properly.
H
H
H
See Acquiring Waveforms on page 3-3.
See Triggering on page 3-39.
See Displaying Waveforms on page
3-53.
H
See your printer instructions and/or the
Windows Help. (See page 3-161 for
information on accessing Window help.)
Access the 3. Select the File menu from the application menu bar,
Print dialog
box
and then select Page Setup in the menu.
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Data Input and Output
Overview
To print using ink-saver mode (cont.)
Control elements & resources
Set Ink-saver 4. In the Page Setup dialog box that displays, click
mode
Ink-saver Mode.
5. Click OK to set the instrument to use Ink-saver mode,
or click Print... to set up your print job and print the
display.
End of Procedure
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Data Input and Output
To Print to a File
You can also print the instrument screen and its waveforms to a file. This
instrument currently supports printing to BMP, JPEG, TIFF, PNG and Targa
image-file formats.
NOTE. Screen images saved using the PNG (Portable Network Graphics) format
can consistently achieve compression ratios better than 10:1, and often better
than 50:1 compared to a BMP screen image file. PNG is a lossless format
similar to GIF format.
Overview
To print to a file
Control elements & resources
Access the 1. Select the File menu from the application menu bar,
Print dialog
box
and then select Print in the menu.
2. Click the Print to File box in the Print dialog box, and
click OK.
Select format 3. In the Print to File dialog box, navigate to the folder
and save
you want. Then type a name for your file in the File
name box.
4. In the Save as type menu, click the down-arrow and
select a file image format from the drop-down menu.
5. Click Save to place the instrument screen in the file
and image format that you selected.
Access to virtual keyboard
Enter file name
Tip. Access the printer instructions or the Windows
Help system if you require more information on
printing.
Select the image format
End of Procedure
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Data Input and Output
To
Set High Color
If the display screen printouts have missing information such as blacked-out
readouts, your instrument may need to be set to a higher color setting. To do so,
follow the steps below:
Overview
To set high color
Control elements & resources
Prerequisites 1. Waveforms must be displayed on screen.
2. Your Printer must be accessible and configured
properly.
H
H
H
See Acquiring Waveforms on page 3-3.
See Triggering on page 3-39.
See Displaying Waveforms on page
3-53.
H
See your printer instructions and/or the
Windows Help. (See page 3-161 for
information on accessing Window help.)
Access the 3. Click the minimize (-) button in the upper right corner
Display Prop-
erties dialog
box
of the UI application to expose the desktop.
4. Right click the desktop, and select Properties from the
menu that pops up.
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Data Input and Output
Overview
To set high color (cont.)
Control elements & resources
Select the Set- 5. In the Display Properties dialog box that displays, click
tings Tab
the Settings tab.
Select and Set 6. Click the monitor 1 icon (if necessary) in the Settings
High Color
dialog box.
7. Select High Color in the Colors list box.
8. Click OK to apply changes. If a confirmation box
appears, click its OK button.
End of Procedure
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Data Input and Output
NOTE. If you print the screen infrequently, you may want to return the colors
setting to 256 colors except when printing. To return to 256 colors, repeat the
procedure above, but select 256 colors in step 4.
Remote Communication
Remote communication is performed through the GPIB interface. Consult the
online Programmer Guide for help with establishing remote communication and
control of the instrument.
To access the Programmer Guide, select Programmer Guide in the Help menu
from the front screen.
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Data Input and Output
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Using Masks, Histograms, and Waveform Databases
The instrument comes equipped with statistical tools to help you display, test,
and evaluate waveforms. This section describes these tools and how you use
them:
H
Mask Testing Waveforms, on page 3--141, describes how you can use
standard or user-defined masks to set up the instrument to automatically
detect mask violations in communications and other waveforms.
H
H
Taking Histograms, on page 3--154, describes how to take histograms to
view the horizontal or vertical distribution of data on your waveforms.
Using Waveform Databases, on page 3--159, describes how to accumulate a
waveform into the database and use the waveform database to view the
waveform data weighted with respect to how frequently it reoccurs in the
database.
Mask Testing Waveforms
This section overviews the instrument features related to mask testing, including
how to create, edit, delete, and activate masks. You can select a standard mask,
edit a mask, or create an new mask from scratch.
Why Use?
Use mask testing to test your waveforms for time or amplitude violations. Mask
testing will count waveform samples (called hits or violations) that occur within
a specific area (the mask).
Use the communications-standard masks that this instrument provides (SONET/
SDH, Fiber Channel Optical and Electrical, and Ethernet) to test your signals, or
define your own masks.
What’s Special?
Some mask testing features of note follow:
Flexible Mask Editing. You can use the controls in Mask Setup dialog box to
completely specify custom masks or edit existing masks, selecting, adding/delet-
ing, and placing a vertices in user-defined (waveform source) units. For quick
edits, you can use can use the mouse or touchscreen to drag to resize and
reposition the masks directly on the screen.
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Mask-Specific Autoset. You can set Autoset to either Auto or Manual in the Mask
Setup dialog box. When set to Auto, the instrument automatically performs a
standard, mask-specific autoset whenever you select a standard mask.
What’s Excluded?
GPIB editing. You cannot edit masks through the programmable interface
(GPIB). You can, however, still create and/or delete entire masks through this
interface.
Concurrent Mask Tests. Only one mask standard (or user defined set) is active at
any time. If you have a mask selected/enabled and then select a new mask, the
new mask replaces the previous mask. You cannot test to multiple standards
simultaneously.
Keys to Using
The key points that describe operating considerations for using and editing
masks follow:
Mask Standards and Masks. A mask standard contains one or more masks that,
when applied against the waveforms for which they are intended, test the
waveform for violations of an industry standard. The supported standards are
listed in Table 3--9.
Masks are numbered polygons that define an area within a mask standard (or
within a user mask) in which to count waveform samples as hits.
Table 3-9: Standard masks
SONET/SDH
Fiber channel
Ethernet / Other
Gigabit Ethernet
10GBASE-X4 (Ethernet)
10GBASE-W (Ethernet)
10GBASE-R (Ethernet)
Infiniband (Other)
2GbE
OC-1/STM-0 51.84 Mb/s
OC-3/STM-1 155.52 Mb/s
OC-9 466.56 Mb/s
OC-12/STM-4 622.08 Mb/s
OC-18933.12 Mb/s
OC-24 1244.2 Mb/s
OC-36 1866.2 Mb/s
OC-48/STM-16 2488.3 Mb/s
FEC2666
FC133 Optical 132.8 Mb/s
FC266 Optical 265.6 Mb/s
FC531 Optical 531.2 Mb/s
FC1063 Optical 1.0625 Gb/s
FC2125
FC4250
FC133 Electrical 132.7 Mb/s
FC266 Electrical 265.6 Mb/s
FC531 Electrical 531.2 Mb/s
FC1063 Electrical 1.0625 Gb/s
10 GFC
XAUI-Near
XAUI-Far
FEC11.10 Gb/s
OC-192/STM-64
FEC1066
FEC1071
OC-768/STM-256
FEC4266
FEC4302
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Using Masks, Histograms, and Waveform Databases
Mask Counts. The instrument lists statistics for each mask (polygon) in the
enabled standard (or user) in the Mask readout on the right side of the instrument
screen. Each mask is listed by its number, with its count of hits, the number of
hits common to all masks, and the total count of waveforms acquired.
Mask Editing. Masks can be edited, in which case they become a User mask.
Some tips on creating and using masks follow:
H
When editing, locate one point along the left edge or right edge of the mask
further left or further right than any other point. You can still create straight
lines along the edge; just place one point further left of right than the others
on the edge.
H
H
The vertices numbers increase according to their order from left to right. The
instrument reassigns numbers to vertices during mask creation or editing to
hold to this rule.
When adding new points to a mask, the instrument determines their location
in the mask as follows (see Figure 3--26):
a. Defines an imaginary line between the left-most vertex and right-most
vertex in the mask.
b. Defines all points above the imaginary line as the top of the mask; all
points below as the bottom of the mask.
c. Inserts new user-added points above the imaginary line into the top of
the mask; inserts new user-added points below the imaginary line into
the bottom.
H
To create a mask with a concave area, create several masks to cover the same
area. Data falling into two overlapping masks is counted only once as part of
the total mask hits.
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These points form
the top of the mask
Top/bottom dividing line
(not displayed)
Left-most point
Right-most point
These points form
the bottom of the mask
Figure 3-26: Creating a user mask
Note in Figure 3--27 that a new vertex has been added to the mask shown in
Figure 3--26. Since the point is added above the line, it’s added to the top.
User added vertex
Figure 3-27: Adding a new vertex
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H
Masks are saved with setups, so you can save sets of masks by defining
them, and then storing the instrument setup. Displayed masks are overwrit-
ten when you recall a stored setup, select a standard mask, or initialize the
instrument.
To Mask Test a Waveform
Use the procedure that follow to set up the instrument to mask test a waveform
against a mask standard or user-defined mask set.
Overview
To mask test a waveform
Related control elements & resources
Prerequisites 1. The instrument must have at least one waveform turned
on.
See Displaying Waveforms on page 3-53 for
information on displaying waveforms.
Access the Mask 2. Select Mask from the Setup menu to display the Mask
Setup dialog box
Setup dialog box.
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Overview
To mask test a waveform (cont.)
Related control elements & resources
Select the mask 3. Select the waveform to bemask testedfrom thedrop-down
source and turn on
a mask
list under Source.
4. Use the Comm Standard drop-down list to select a
standard or user-defined mask. See Table 3-9 on
page 3-142 for a list of available standard masks.
Selecting a communication standard or user-defined
mask automatically:
H
displays the mask on screen, and autosets for the
mask, if Automatic is checked in the dialog box.
H
automatically enables mask testing; uncheck
Enable Mask Counts if you want to turn off mask
counting.
H
displays mask count statistics in the mask readout
right of the display. A mask does not have to be
displayed to have mask counting enabled.
5. CheckUseWfm Database touse awaveform databaseas
the waveform source.
The Clear Data button resets all mask counts. In
addition, if the source for mask testing is a waveform
database, clicking this button clears the waveform
database.
Tip. Selecting a source that is currently displayed as a
waveform database automatically enables mask testing
on the database. To mask test the waveform instead of
its database, uncheck the Use Wfm Database box.
Adjust the mask 6. You can use the color pulldown list to change the color
of the selected masks on screen.
7. You can add or subtract from the masks on screen.
Check On to turn on mask margins. Adjust the Margin
percentage box control to increase (positive %’s) or
decrease the masks on screen.
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Overview
To mask test a waveform (cont.)
Related control elements & resources
Autoset the wave- 8. Click the Autoset button to perform a manual autoset on
form to mask
the mask-source waveform.
Tip. You can choose to autoset the mask-source
waveform to the mask anytime you select a new mask
standard; just check Automatic option under Autoset.
9. Select the HiLow Method used to determine the High
and Low values when aligning the input signal to the
masks.
Mean sets the Mask Autoset to use the mean value of
the High level (topline) and Low level (baseline), taken
within the fixed eye aperture (center 20% of the eye), to
align the input signal to the NRZ mask.
Mode sets the Mask Autoset to use the High level
(topline) and Low level (baseline), taken across one unit
interval of the eye diagram, to align the input signal to
the NRZ mask.
Set Stop Action & 10. From the application menu bar, select Setup, and then
start testing
select Acquisition.
11. In the Acq Setup dialog box (see right), check the
Condition option under Stop After.
12. In the Condition pulldown list, select a mask-related
criteria, such as Mask Total Hits and set a count, such
as 1, in the count box.
These settings will stop acquisition when mask
violations satisfy the criteria you set here. See below.
13. Push the RUN/STOP front-panel button to restart
acquisition, if stopped.
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Overview
To mask test a waveform (cont.)
Related control elements & resources
Restart testing 14. To restart after a Stop After condition occurs, push the
front-panel CLEAR DATA front-panel button.
Tip. If you want to acquire one, and only one, more
waveform after the Stop After condition occurs, push
the RUN/STOP front-panel button instead of CLEAR
DATA.
End of Procedure
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Using Masks, Histograms, and Waveform Databases
To Edit a Mask
When you edit a mask in an existing communications standard, the mask type
switches from the selected standard to type User, and uses the masks from the
Standard as a basis for editing. Use the procedure that follows.
Overview
To edit a mask
Related control elements & resources
Prerequisites 1. Theinstrument must haveat least onewaveform turnedon
and the Mask Setup dialog box displayed.
See Displaying Waveforms on page 3-53 for
information on displaying waveforms.
Select a mask 2. Next, you need to select and enable a standard mask
set. To start with a standard mask, pull down the
Comm Standard list and choose a standard mask. To
create a mask from scratch or edit an existing
user-defined mask, select User in the Comm Standard
selection list.
Open Mask 3. Click Mask Edit... to display the Mask Edit dialog box.
Edit dialog box
Note. The Mask Setup dialog box and Mask Edit dialog
box are both within the Mask tab. Use the Edit Mask
and End Mask Edit buttons to toggle back and forth
between the two Mask dialog boxes.
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Overview
To edit a mask (cont.)
Related control elements & resources
Select a 4. Select a mask to edit from the Mask list. This section of
the Mask Edit dialog box lists all masks available for edit
and the number of vertices each mask has.
mask to edit
Add, edit, or delete 5. Once you have selected a mask, use the Vertex section
mask vertices
of the Mask Edit dialog to add, edit, or delete individual
vertices. Use the Vertex Number box to select a vertex
number for the selected mask.
6. Use the Horizontal and Vertical box controls to set the
horizontal and vertical positions of the selected vertex.
Tip. You may also drag and drop vertices directly on the
mask to new locations. Click on the mask on the
graticule to select it. Vertices are designated with an X.
7. Click Add to add a vertex to the selected mask. After
clicking Add, click the location on the selected mask (in
the graticule) where you want to the new vertex added.
8. Click Delete to delete the selected vertex from the
selected mask.
Note. When you add or delete a vertex, the Mask list is
updated to show the new number of vertices for each
mask.
9. Click End Mask Edit to close the Mask Edit dialog box
and return to the Mask Setup dialog box.
End of Procedure
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Using Masks, Histograms, and Waveform Databases
Counting Masks
Mask-counting statistics are displayed in the mask readout at the right-side of the
display. Mask counting statistics are displayed as soon as you enable a mask, and
stay visible even if the mask isn’t displayed on screen.
Mask number and hits count
Total number of hits in all masks
Total number of waveforms for all masks
If mask counting is enabled, read the results as follows:
H
Mask (n): Each mask in the standard is listed by number (Mask 1 for
example) along side the number of hits in that mask.
H
H
Total: Displays the total of all hits in all masks.
#Wfms: Displays the number of waveforms that have been tested against the
masks.
To zero the counts for all masks, click Clear in the Mask Setup dialog box.
NOTE. Executing Clear will clear not only the mask counts, but also the
underlying waveform data. For example, if mask testing on a waveform database
the database data is cleared and accumulation is restarted, and if mask testing
on a waveform being averaged or enveloped, Clear restarts the averaging or
enveloping.
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Using Masks, Histograms, and Waveform Databases
To Create a New Mask
Masks are created by connecting the points independently of the order they are
entered. Points are connected by sorting the points in left-to-right order and
grouping them across a diagonal from the left-most point to the right-most point.
If two points share a horizontal position along either the left or right edge of the
mask, the diagonal runs from the top left-most point to the bottom right-most
point. Points below the diagonal form the bottom boundary of the mask; points
above it form the top boundary. Use this procedure to create a new mask:
Overview
To create a new mask
Related control elements & resources
Prerequisites 1. The instrument must have at least one waveform turned
on and the Mask Setup dialog box displayed.
See Displaying Waveforms on page 3-53 for
information on displaying waveforms.
Select and display 2. To create a mask from scratch, select User in the Comm
a user-defined
mask
Standard selection list.
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Overview
To create a new mask (cont.)
Related control elements & resources
Create a 3. Click Mask Edit to display the Mask Edit dialog box.
new mask
4. In Mask list, select the user-defined mask you wish to
edit.
5. Use the Vertex controls to add, position, and delete
vertices on your new mask. You may also drag and drop
vertices directly on the graticule display.
6. Click End Mask Edit when you are finished creating your
mask to apply all additions/changes and return to the
Mask Setup dialog box.
7. Read Helpful Hints (immediately following this
procedure) for more information on creating masks.
End of Procedure
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Using Masks, Histograms, and Waveform Databases
Taking Histograms
The instrument can display histograms constructed of waveform data. You can
display both vertical (voltage) and horizontal (time) histograms, but only one at a
time.
Histogram box
Histogram readout
Histogram
Figure 3-28: Vertical histogram view and statistics on data
Use histogram statistics to analyze a range of data that you select.
Some histogram features of note follow:
Why Use?
What’s Special?
Flexible Histogram Editing. You can use the controls in Hist Setup dialog box to
completely specify the histogram box on the waveform, in waveform units or as
a percent of the graticule. For quick edits, you can use can use the mouse or
touchscreen to drag to resize and reposition the box directly on the screen.
Any Waveform or database as Source. Histograms can be taken on all channel,
math, and reference waveforms. You can also take a histogram on any of the
waveform databases that this instrument provides.
Continuous Operation. The histogram that you set up can run, and its results can
be displayed even if you turn off the display of the histogram or of the waveform
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selected as its source. Histogram data is continuously accumulated and displayed
until you explicitly turn it off or clear the waveform data of the histogram source.
What’s Excluded?
Histograms longer than 500 bins. Histograms are limited to the on screen
resolution, limiting horizontal sizes of 500 bins.
Multiple histograms. One histogram can be displayed on one source at a time.
The source can be any waveform in any of the three Views, Main, Mag1, or
Mag2.
Keys to Using
Histograms
The following key points describe operating considerations for setting up the
histograms so that they best support your data-analysis tasks.
Histogram Counting Stays On. Once you check Enable Histogram in the
Histogram Setup dialog, histogram counting starts and continues until you turn
disable the histogram or clear the histogram counts. If the histogram is not
displayed on the graticule but histogram statistics still appear on the display,
histogram counting is still running.
NOTE. Histogram counts are cleared when push Clear button in the Hist Setup
dialog box or when you push CLEAR DATA on the front panel. Also, changing
any acquisition control will implicitly clear all acquired data and the histogram
count as well.
Histogram Size. The maximum vertical histogram size is 400 bins. The maximum
horizontal size is 500 bins.
Recalling Setups. The histogram state is restored to what it was when the setup
was saved.
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Using Masks, Histograms, and Waveform Databases
To Take a Histogram
Use the procedure that follows to quickly take a measurement based on the
default settings for histograms.
Overview
To take a histogram
Related control elements & resources
Prerequisites 1. The instrument must have at least one waveform
displayed to access the Hist Setup dialog box.
See page 3-62 for waveform-display
instructions if needed.
Access the 2. Open the Hist Setup dialog box by selecting Histogram
histogram
in the Setup menu.
Set, display, and 3. Use the Source pulldown list to select a waveform
reset histogram
source and type
source for the histogram.
4. Check Enable Histogram to start histogram counting,
display the histogram on screen, and turn on the
Histogram readout.
5. Click the Vertical or Horizontal histogram option button
of you choice. You can only display one type of
histogram at a time.
6. Check if you want the data taken on an accumulation of
the source waveforms (a waveform database) instead of
on the currently acquired waveform.
7. Press Clear to reset the histogram count and to clear the
data in the source waveform. Histograms track numbers
of counts. Clicking Clear resets those counts to zero and
begins counting from zero.
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Using Masks, Histograms, and Waveform Databases
Overview
To take a histogram (cont.)
Related control elements & resources
Set histogram dis- 8. Use the Histogram to turn on and off the display of the
play options
selected histogram (histogram counting remains
enabled). Use the color list to select a color for the
histogram. Select a value in the Size box to adjust the
histogram display on screen.
9. Select Linear to display histogram data linearly. Bin
counts are scaled linearly by dividing the bin count by
the maximum bin count.
10. Select Logarithmic to display histogram data logarithmi-
cally. Bin counts are scaled logarithmically. Logarithmic
scaling provides better visual details for bins with low
counts.
Set histogram limit 11. Use the Top, Bottom, Left, and Right boxes to set the
controls
size and location of the histogram box. The histogram
box selects the section of the waveform used for
histograms.
12. Select Absolute to use units based on the source
waveform. Select % to display the histogram box as a
percentage of the graticule. This display setting
considers the top-left corner of the graticule to be 0,0
and the bottom-right corner to be 100,100.
Tip. It is quicker to use the mouse or touchscreen to
drag to size the histogram box on screen, then fine tune
the values if needed with the Limit Controls.
End of Procedure
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Using Masks, Histograms, and Waveform Databases
Histogram
Statistics
After you check Enable Histogram in the Histogram Setup dialog box, histogram
statistics appear on the right-hand side of the screen. The following table is a list
of the available histogram statistics and a brief description of each.
Table 3-10: Histogram statistics
Name
Description
Mean
The average of all acquired points within (or on) the histogram
box.
Median
Half of all acquired points within (or on) the histogram box are less
than and half are greater than this value.
Standard Deviation
Peak-to-Peak (Pk-Pk)
The standard deviation (Root Mean Square (RMS) deviation) of all
acquired points within (or on) the histogram box.
The peak-to-peak value of the histogram. Vertical histograms
display the amplitude of the highest nonzero bin minus the
amplitude of the lowest nonzero bin. Horizontal histograms display
the time of the rightmost nonzero bin minus the time of the
leftmost nonzero bin.
Meanᐔ1 StdDev(ꢀᐔ1σ) The percentage of points in the histogram which are within 1
standard deviation of the histogram mean.
Meanᐔ2 StdDev(ꢀᐔ2σ) The percentage of points in the histogram which are within 2
standard deviations of the histogram mean.
Meanᐔ3 StdDev(ꢀᐔ3σ) The percentage of points in the histogram which are within 3
standard deviations of the histogram mean.
Peak Hits
Displays the number of points in the largest bin of the histogram.
Displays the number of hits within or on the histogram box.
# of Histogram Hits
# of Waveforms
Displays the number of waveforms that have contributed to the
histogram.
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Using Masks, Histograms, and Waveform Databases
Using Waveform Databases
A waveform database is a three-dimensional accumulation of a source waveform
as it is repeatedly acquired. In addition to the standard vertical and horizontal
dimensions, each waveform sample in a waveform database has a third dimen-
sion of count. The count reflects the number of times a specific waveform point
has been acquired or generated.
Why Use?
Use waveform databases for measurements, histogram calculations, mask
testing, and generating a density-style graded display. Waveform databases may
be automatically allocated for measurements, histograms, and mask testing.
What’s Special?
Some waveform database features of note follow:
H
H
H
Waveform record length is not limited to 500 (horizontal waveform database
dimension and number of horizontal display columns) when waveform
databases are active. Record lengths can vary over the entire allowable range.
To emphasize the data that occurs less frequently, you can toggle the Invert
Color/Intensity control in the Waveform Database setup dialog box, which
reverses the intensity/color assignments to each pixel in the database display.
You can set any selected database to use a persistence mode to accumulate
and display data. Infinite persistence mode continues displaying waveforms
as they accumulate until the selected database is cleared manually or by a
control change. Variable persistence mode keeps and displays accumulated
data in the specified database until the user-specified waveform count is
surpassed. Each waveform accumulated beyond the count removes the oldest
waveform accumulated earlier in the database.
What’s Excluded?
The following operations are excluded:
References as sources. Because references contain static data that does not
update, they are not available as a waveform source for waveform databases.
More than four waveform databases. More than four waveform databases cannot
be created at one time. Note the following behaviors regarding waveform
databases:
H
There are four waveform databases; you can explicitly assign and reassign
Database1 through Database4 to waveform sources in the Wfm Database
dialog box.
H
Once all databases are allocated, the only way to assign a new waveform is
to change the waveform source of one of the databases in the same dialog
box, which releases its existing source.
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Using Masks, Histograms, and Waveform Databases
H
If all four databases are assigned and you attempt to implicitly assign a
waveform source to a database (for example, by right clicking a waveform
icon in the Waveform bar and selecting color grading), the instrument will
display a notice that no databases are available.
NOTE. The above exclusion does not mean that a waveform database cannot be
used by multiple systems or features. For example, you can use the same
database as the source for a histogram, an automatic measurement, and a mask
test.
Interpolation or vector displays. Waveform database accumulation is always a dot
mode accumulation; therefore, no interpolation or vectoring is performed.
Keys to Using
The key points that follow describe operating considerations for setting up a
waveform database.
Dimensions. Waveform database dimensions match those of the database source
and are described as follows:
H
H
H
Horizontal (columns): Always 500 columns, which is the maximum
horizontal graticule view size. Columns are in horizontal units that match the
horizontal units of the source.
Vertical (rows): Always 402 rows, which is the maximum vertical graticule
size plus one row each for overrange (OR) and underrange (UR). Rows are
in vertical units that match the vertical units of the source.
Count (weights or density): up to 32 bits.
Display. When you assign a waveform database to a waveform source (using the
Waveform Database Setup dialog box) you must explicitly turn on the waveform
database display if you wish to see it on screen; otherwise, the waveform source
displays using the default (vector) display. The waveform database still
accumulates in the background and can be turned on later without clearing the
database.
Display Options. The Color, Intensity, and Invert controls determine whether the
instrument displays its databases graded by color or intensity.
H
H
H
Color: Different colors are used to indicate data-accumulation density.
Intensity: Different shades of one color are used to indicate density.·
Invert: When Invert is selected, colors and intensities that are indicating
high data-accumulation counts toggle to indicate low counts. Inverting the
colors or intensities can sometimes make the data that occurs least in the
waveform database easier to see.
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Using Masks, Histograms, and Waveform Databases
H
Grading Method: The Grading Method control determines the method by
which database data (bin counts) are converted into display colors/intensi-
ties.
EMPH8 selects a curve-driven grading method that utilizes eight display
colors/intensities. The curve is specified by the Emphasize Counts setting,
see Emphasize Counts, below.
EMPH7 selects a curve-driven grading method that utilizes seven display
colors/intensities. The curve is specified by the Emphasize Counts setting,
see Emphasize Counts, below.
BIN8 selects a binary grading method that uses eight display colors/intensi-
ties. This method assigns ranges of counts to colors/intensities by succes-
sively halving the maximum bin count and assigning the resultant ranges in
brightest-to-darkest color/intensity order. If the maximum bin count is less
than the number of display colors, then a one-for-one mapping of counts to
colors/intensities is used.
BIN7 selects a binary grading method that uses eight display colors/intensi-
ties. This method assigns ranges of counts to colors/intensities by succes-
sively halving the maximum bin count and assigning the resultant ranges in
brightest-to-darkest color/intensity order. If the maximum bin count is less
than the number of display colors, then a one-for-one mapping of counts to
colors/intensities is used.
Emphasize Counts controls specify what range of counts you want empha-
sized when EMPH7 or EMPH8 Grading is selected. The slide bar selects a
percentage value; the entry box allows direct entry or the percentage value,
where the lowest value, 0%, emphasizes bins with low counts and the
highest value (100%) emphasizes bins with high counts.
NOTE. Changes made to the display options affect all waveform databases.
Persistence. You set the persistence controls independently for each waveform
database the instrument supports.
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Using Masks, Histograms, and Waveform Databases
To Set Up a Waveform
Database
To assign a waveform to one of the four waveform databases of the instrument,
use the procedure that follows:
Overview
To set up a waveform database
Related control elements & resources
Prerequisites 1. Theinstrument must havea waveform displayed toenable
the waveform database controls.
See page 3-62 for information on displaying
waveforms.
Open the Wfm 2. Open the Waveform Database dialog box by selecting
Database Setup
dialog box
Wfm Database in the Setup menu.
Select the source 3. Use the Source pulldown list to select a waveform source
and turn on the
database
for the waveform database. By default, the first available
waveform is used as the waveform source unless you
select a different source.
4. Check On to begin accumulating into the waveform
database.
5. Check Display to turn on the display of the waveform
database. Uncheckthisboxtodisplaythevectorwaveform
selected as the source for the database.
6. Click the Clear Data button to clear the data accumulated
in the selected database. If the database is turned on, the
data is cleared and data accumulation starts over.
NOTE. An alternative method of turning on a waveform
database for the selected waveform is by clicking the
waveform database button in the toolbar. See right.
See Figures 3 -29 and 3 -30 on next page to see what
both normal and waveform database waveform data
look like on the graticule.
End of Procedure
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Using Masks, Histograms, and Waveform Databases
As you can see in the illustrations below, the normal vector view of a waveform
displays the waveform data in dot mode: the waveform display is updated with
each acquisition to reflect the current data. In Fig 3--30, waveform database
display has been turned on and you can see the waveform data accumulation is
displayed all at once, with subsequent acquisition data being “added” to the
display as it is acquired.
Figure 3-29: Normal vector view of a waveform
Figure 3-30: Waveform database view of a waveform
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Using Masks, Histograms, and Waveform Databases
To Customize the
Database Display
To change the display options of waveform database data on the graticule, use
the procedure that follows:
Overview
To customize the database display
Related control elements & resources
Prerequisites 1. The instrument must have a waveform assigned to one of
the waveform databases.
See To Set Up a Waveform Database on
page 3-162.
Access the 2. Open the Waveform Database dialog box by selecting
Wfm Database in the Setup menu.
Wfm Database
Setup dialog box
Set Persistence 3. Choose a persistence mode.
Infinite: Choose Infinite to continue displaying
waveforms as they accumulate until the selected
database is cleared manually or by a control change.
Variable: Choose Variable to display accumulated data
in the specified database until the user-specified
waveform count is surpassed. Each waveform
accumulated beyond the count removes the oldest
waveform accumulated earlier in the database.
Waveforms: For Variable persistence, use the
Waveforms entry box (or the sliding control above it) to
set the Waveforms count. The count applies to the
currently selected database when Variable persistence
mode is set. Enter values directly with this control using
the up/down arrows, the pop-up keypad, or an
externally connected keyboard.
Samples: The Samples field is a readout sample count
currently in effect for the currently selected database
when Variable persistence mode is set. This count is not
settable directly, but instead derives from the product
two values: the current Waveforms setting in this dialog
box and the setting for Record Length in the Horizontal
Setup dialog box.
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Overview
To customize the database display (cont.)
Related control elements & resources
Set display options
4. Choose from the following display options:
Color: Choose color to draw the waveform database in
colors that vary with how frequently each sample value
occurs in the database.
Invert: Choose this option to reverse the color or
intensity assignments to each grading partition. Inverting
the colors may make it easier to view the variations of
color or intensities, and makes it easier to see
frequencies or occurrences with smaller numbers of
counts.
Intensity: Choose Intensity to draw the waveform
database with varying intensities that vary with how
frequently each sample value occurs in the database.
Grading Method: Select any one of four grading
methods available from the pull down menu.
Additional information about Grading Method is
located on page 3-161.
Emphasize Counts: If you select one of the two
Emphasized grading methods, slide the Emphasize
Counts percentage control to specify the range of counts
you want emphasized.
Note. The Display Options controls apply globally to all
four databases that this instrument provides.
Examples 5. See the following illustrations to see examples of
waveform database data using different display options.
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Overview
To customize the database display (cont.)
Related control elements & resources
Notice the difference in intensities of the same
data between these two illustrations. In the top
illustration, this portion of data is lighter in
intensity signalling it is least-occurring. In the
illustration to the right, with Invert Color/Intensity
turned on, this data appears much darker,
allowing you to see the data more clearly.
End of Procedure
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Accessing Online Help
This manual represents only part of the user assistance available to you — the
online help system, integrated as part of the instrument user interface, provides
quick-to-access support for operating the instrument. This section describes the
help system and how to access it.
What’s Available?
The instrument provides the following help resources online:
H
H
H
H
H
H
H
H
Tool tips
What’s This? Help
Overview Help
Topical index
Getting Started Guide
Measurements Center and Measurements Reference
Setup procedures
Programmers Guide
NOTE. A PDF version of the Programmer Reference Guide is available on the
Tektronix Web site (see Contacting in the Preface on page xiii. Go to the link for
User Manuals and select the document name from the download selection list.
Why Use?
Use online help as your primary, always-on-hand, user information source for
this instrument. Most of the information you need to operate this instrument and
use it effectively is found in the online help, where you can quickly access it and
display on your instrument screen.
Keys to Using
The key points that describe operating considerations for using the online and
other documentation for this instrument follow:
H
Use online help when you want to minimize interruption to your work flow.
Often a tool tip or What’s This? Help, each of which is a pop--up of brief
information in a bubble displayed on screen, gives you enough support to
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Accessing Online Help
continue your setup. Overview help is there when you need to probe more
deeply into feature operation.
H
Use the manuals to read instructions on putting the instrument into service,
procedures on reinstalling its product software, listings of specifications, and
overviews of features and their operation. See Documentation Map on page
2--2 for an description of the documents for this instrument and their
purposes.
H
Use the online programmers guide, either displayed on the instrument
screen, or on any windows-equipped PC, for support on operating the
instrument from the GPIB.
How to Use Online Help
Use the procedure steps that follow to access contextual help and to learn how to
search the help system for more information.
Overview
To use the online help
Control elements & resources
Prerequisites 1. The instrument must be powered up and running.
H
See Installation, page 1-9.
For a brief 2. Move your mouse pointer and let it rest over a control;
that is, a menu name, a menu item, tool-bar button,
tool-bar readout, etc.
description of
controls
When you perform this step, the help system pops up a
short definition or a label of the control. See right.
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Accessing Online Help
Overview
For a more
robust
To use the online help (cont.)
Control elements & resources
3. Click the What’s This? button in the main display or in a
dialog box. The button varies in form as shown at right.
After clicking, the mouse pointer changes to the
following icon:
description
4. Now click the control you want described. A bubble pops
up describing the control. See below.
What’s This? button for main display
What’s This? button for dialog boxes
For in depth, 5. Most dialog boxes, whether setup or other types, have a
contextual
overviews
Help button as shown right. Click the button to open the
help system with an overview of the dialog box that’s
currently displayed. See the following illustration.
Click or touch here
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Accessing Online Help
Overview
To use the online help (cont.)
Control elements & resources
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Accessing Online Help
Overview
To use the online help (cont.)
Control elements & resources
To dig deeper 6. You can search for in depth help using methods with
which most users of PCs are familiar: from the
application menu bar, select Help, and then select
Contents & Index. See illustration at right.
7. From the online help finder (see below), choose from the
three tabs.
8. Click the book icons to expose topic titles, and then
click a topic to highlight it. Click the Display button
to open the topic in a help window.
.
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Accessing Online Help
Overview
To use the online help (cont.)
Control elements & resources
For instruction 9. You can display step-by-step setup instructions for
procedures
setups you want to make: From the application menu
bar, select Help, and then select Help Contents and
Index. See right. From the list of topics (book icons) that
displays, double-click Setup Procedures and
double-click Setup dialog procedures.
10. Select a procedure from the list that displays. The
procedure will display in a help window that is sized and
located to minimize interference with the controls
needed to perform it. See below.
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Accessing Online Help
Overview
To use the online help (cont.)
Control elements & resources
To enable full- 11. If you cannot find the information in the Contents or
text search
Index tabs of the online finder, you may want to enable
full text search: From the application menu bar, select
Help, and then select Contents & Index. See illustration
at right.
12. From the online help finder (see below), choose the
Find tab.
13. Choose the method for word list generation and
select next or finish. Once the word list generation
finishes, future accesses of the find tab will
immediately access a pane for searching with full
.
text search without requiring the word to be
regenerated.
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Accessing Online Help
Overview
To use the online help (cont.)
Control elements & resources
Click to minimize to the toolbar
To Access Op- 14. Click the minimize button to reduce the User Interface
erating System
Help
Application to an icon on the operating system
toolbar. See upper right.
15. Click the Start button to pop up the Start menu, and
then select Help from the menu. See lower right. The
online help for the Windows operating system
displays.
16. When your done with the online help, you can dismiss
it. To restore the user interface application to the
screen, click its icon in the tool bar.
Tip. To switch between online help and the
application, you can hold down the ALT key while you
press Tab repeatedly to alternate between bringing
help to the front and the application.
Click for
Windows
Help
End of Procedure
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Cleaning the Instrument
Periodically you may need to clean the exterior of your instrument. To do so,
follow the instructions in this section.
WARNING. Before performing any procedure that follows, power down the
instrument and disconnect it from line voltage.
Exterior Cleaning
CAUTION. To prevent getting moisture inside the instrument during external
cleaning, use only enough liquid to dampen the cloth or applicator.
Clean the exterior surfaces of the chassis with a dry lint-free cloth or a soft-
bristle brush. If any dirt remains, use a cloth or swab dipped in a 75% isopropyl
alcohol solution. Use a swab to clean narrow spaces around controls and
connectors. Do not use abrasive compounds on any part of the chassis that may
damage the chassis.
Clean the On/Standby switch using a dampened cleaning towel. Do not spray or
wet the switch directly.
CAUTION. Avoid the use of chemical cleaning agents which might damage the
plastics used in this instrument. Use a 75% isopropyl alcohol solution as a
cleaner and wipe with a clean cloth dampened with deionized water. (Use only
deionized water when cleaning the menu buttons or front-panel buttons.) Before
using any other type of cleaner, consult your Tektronix Service Center or
representative.
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Cleaning the Instrument
Flat Panel Display Cleaning
The instrument display is a soft plastic display and must be treated with care
during cleaning.
CAUTION. Improper cleaning agents or methods can damage the flat panel
display.
Avoid using abrasive cleaners or commercial glass cleaners to clean the display
surface.
Avoid spraying liquids directly on the display surface.
Avoid scrubbing the display with excessive force.
Clean the flat panel display surface by gently rubbing the display with a
clean-room wipe (such as Wypall Medium Duty Wipes, #05701, available from
Kimberly-Clark Corporation).
If the display is very dirty, moisten the wipe with distilled water or a 75%
isopropyl alcohol solution and gently rub the display surface. Avoid using excess
force or you may damage the plastic display surface.
Optical Connector Cleaning
When using optical modules, the measurement accuracy is increased (or
maintained) by keeping the optical connectors clean. It’s important to follow the
procedures for cleaning optical connectors provided in the optical module user
manual.
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Appendix A: Specifications
NOTE. This specification is for the instrument; there are also specifications
associated with the optical and electrical modules. Please refer to the user
manual that shipped with your module for those specifications.
This appendix contains the specifications for the CSA8000B Communica-
tions Signal Analyzer and the TDS8000B Digital Sampling Oscilloscope. All
specifications are guaranteed unless noted as “typical.” Typical specifications are
provided for your convenience but are not guaranteed. Specifications that are
marked with the n symbol are checked in Performance Verification chapter of
the service manual, an optional accessory.
All specifications apply to the instrument and sampling modules. unless noted
otherwise. To meet specifications, three conditions must first be met:
H
H
H
The instrument must have been calibrated/adjusted at an ambient tempera-
ture between +10 _C and +40 _C.
The instrument must have been operating continuously for 20 minutes within
the operating temperature range specified.
The instrument must be in an environment with temperature, altitude,
humidity, and vibration with the operating limits described in these
specifications.
NOTE. “Sampling Interface” refers to both the electrical sampling module
compartments and the optical module compartments, unless otherwise specified.
Table A-1: System - Signal acquisition
Description
Characteristics
Number of input
channels
8 acquisition channels, maximum
Number of small sam- 4 compartments, for a total of 8 channels1
pling modules
compartments
Number of large sam- 2 compartments, for a total of 2 channels1
pling modules
compartments
A-1
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Appendix A: Specifications
Table A-1: System - Signal acquisition (cont.)
Description Characteristics
Small Sampling Mod- Tekprobe-Sampling Level 3. Hot switching is not permitted on this
ule Interface interface.
Large Sampling Mod- Tekprobe-Sampling Level 3. Hot switching is not permitted on this
ule Interface
interface.
1
Total actively-acquired channels ≤ 8.
Table A-2: System - Timebase
Description
Characteristics
Sampling rate
DC-200 kHz maximum, dictated by trigger rate and actual holdoff
setting. If trigger rate is less than the maximum, or the requested
holdoff exceeds the minimum, the trigger rate and/or holdoff will dictate
the sampling rate.
Record length1
20, 50, 100, 250, 500, 1,000, 2,000, or 4,000 samples.
Horizontal scale
range
1 ps/div to 5 ms/div in 1, 2, 5 steps or 1 ps increments. Maximum
record lengths apply at certain ranges (per table, below).
Scale set to an integer multiple of: Maximum record length
1 ps/div
1000
2000
4000
2 ps/div
4 ps/div
Horizontal position
range
50 ms maximum.
Horizontal resolution 10 fs minimum
Horizontal position
setting resolution
1 ps minimum
Horizontal modes
Two modes, Short Term Optimized and Locked to 10 MHz Reference.
The 10 MHz reference may be internal or external.
nTime internal ac-
curacy, short term
optimized mode2
Strobe placement accuracy for a given horizontal interval and position
on same strobe line per table below. (Contribution from 80E04
sampling module is included in specification.)
Range
Time Interval Accuracy
1 ps + 1% of interval
8 ps + 0.1% of interval
≤ 20 ps/div
≥ 21 ps/div
A-2
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Appendix A: Specifications
Table A-2: System - Timebase (cont.)
Description
Characteristics
nTime internal ac-
curacy, locked to in-
ternal 10 MHz refer-
ence mode2
Strobe placement accuracy for a given horizontal interval and position
on same strobe line per table below. Contribution from 80E04 sampling
module is included in specification.
Range
Time Interval Accuracy
1 ps + 1% of interval
8 ps + 0.01% of interval
≤ 20 ps/div
≥ 21 ps/div
Horizontal deskew
range and resolution
-500 ps to +100 ns on any individual channel in 1 ps increments.
1
The total number of samples contained in a single acquired waveform record
(memory length in IEEE 1057, 2.2.1).
2
This is for ≤ 100 kHz trigger rate. The 80E04 sampling module is included in this
specification.
Table A-3: System - Trigger
Description
Characteristics
Trigger sources
External Direct Edge Trigger, External Prescaled Trigger, Internal Clock
Trigger, and Clock Recovery (with appropriately equipped optical
modules)
Auto/normal mode
Slope + or - select
Normal mode: wait for trigger
Auto mode: Trigger automatically generated after 100 ms time-out
Edge + mode: Triggers on positive-slewing edge
Edge - mode: Triggers on negative-slewing edge
High frequency on/off High Frequency ON mode: Removes trigger hysteresis and improves
select
sensitivity. Should be used when trigger slew rate exceeds 1 V/ns.
High Frequency OFF mode: Retains trigger hysteresis and improves
noise rejection at low slew rates.
Metastability Reject
On/Off select
Metastability Reject On mode: Upon detection of trigger and holdoff
collision, time base will reject the sampled point.
Metastability Reject Off mode: Allows metastable points caused by
trigger/holdoff collisions to display.
Gated Trigger
5 V maximum. See the Gated Trigger Input descriptions, on beginning
page A-8.
Variable trigger hold Adjustable 5 ꢀs to 50 ms in 0.5 ns increments. When External
off range and resolu- Prescaled Trigger mode is used, holdoff period applies to the Prescaled
tion
input divided by 8.
A-3
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Appendix A: Specifications
Table A-3: System - Trigger (cont.)
Description Characteristics
External direct trigger Direct edge triggering on signal applied to dedicated front panel
capabilities and
conditions
connector with Holdoff, Level Adjust, Auto/Normal, High Frequency
On/Off, and Enhanced Triggering On/Off controls.
External direct trigger specifications apply only under the condition that
no other trigger signal is applied to respective connectors.
Short term optimized mode and locked to internal 10 MHz reference
specifications only apply under the condition that there is no external
10 MHz reference applied to the front panel connector.
External direct trigger 50 Ω input resistance, DC coupled only
input characteristics1
External direct trigger
input range
1.5 V (DC + peak AC) maximum input voltage
External direct trigger 1 Vpp
maximum operating
trigger signal2
External direct trigger Adjustable between 1.0 V
level range
nExternal direct
trigger sensitivity3
100 mV, DC-3 GHz
External direct
trigger sensitivity
50 mV typical, DC-4 GHz
External direct trigger 1 mV
level resolution
nExternal direct
trigger level accuracy
50 mV + 0.10 x level
nExternal direct
trigger delay jitter,
short term optimized
mode maximum
1.2 ps RMS + 10 ppm of horizontal position, or better
External direct trigger 800 fs RMS + 5 ppm of horizontal position, typical
delay jitter, short term
optimized mode (typi-
cal)
nExternal direct
2.5 ps RMS + 0.04 ppm of horizontal position, or better
delay jitter, locked to
internal 10 MHz refer-
ence mode maximum
External direct delay 1.6 ps RMS + 0.01 ppm of horizontal position, typical
jitter, locked to inter-
nal 10 MHz reference
mode (typical)
External direct trigger 167 ps, typical
minimum pulse width
A-4
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Appendix A: Specifications
Table A-3: System - Trigger (cont.)
Description Characteristics
External direct trigger Metastability Reject on: Zero, typical
metastability
External direct trigger Tekprobe-SMA, Levels 1 and 2. Hot switching is permitted on this real
real time accessory
interface
time accessory interface.
External prescaled
trigger capabilities
Prescaled triggering on signal applied to dedicated front panel
connector with Holdoff, Auto/Normal, Metastability Reject On/Off.
External prescaled trigger specifications apply only under the condition
that no other trigger source is applied to respective connectors.
Short term optimized mode and locked to internal 10 MHz reference
specifications only apply under the condition that there is no external
10 MHz reference applied to the front panel connector.
External prescaled
trigger input charac-
teristics
50 Ω AC coupled input resistance; divide-by-eight prescaler ratio, fixed
level zero volts
External prescaled
trigger absolute maxi-
mum input
2.5 Vpp
nExternal prescaled The limits are as follows:
trigger sensitivity
Frequency range
Sensitivity
800 mVpp
600 mVpp
Sensitivity
2-3 GHz
3-10 GHz
External prescaled
trigger sensitivity (typ-
ical)
Frequency range
10-12.5 GHz
1000 mVpp, typical
nExternal prescaled 1.3 ps RMS + 10 ppm of horizontal position, or better
trigger delay jitter,
Short term optimized
mode maximum
External prescaled
trigger delay jitter,
Short term optimized
mode (Typical)
0.9 ps RMS + 5 ppm of horizontal position, typical
nExternal prescaled 2.5 ps RMS + 0.04 ppm of horizontal position, or better
delay jitter, locked to
internal 10 MHz refer-
ence mode maximum
External prescaled
delay jitter, locked to
internal 10 MHz refer-
ence mode (Typical)
1.6 ps RMS + 0.01 ppm of horizontal position, typical
External prescaled
trigger metastability
Enhanced Triggering, Metastability Reject on: Zero, typical
A-5
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Appendix A: Specifications
Table A-3: System - Trigger (cont.)
Description
Characteristics
Internal clock trigger
rates
Rate selectable at 25, 50, 100, and 200 kHz internally and is provided
to the trigger, to the TDR stimulus drives in small sampling module
interfaces, and to the Internal Clock Out connector on the front panel.
1
The input resistance at the external direct trigger input and the maximum input
voltage.
2
3
Maximum signal input for maintaining calibrated time base operation.
Section 4.10.2 in IEEE standard number 1057. The minimum signal levels required
for stable edge triggering of an acquisition.
Table A-4: System - Environmental
Description
Characteristics
Dynamics
Random vibration (operating):
0.22 g rms, from 5 to 500 Hz, 10 minutes each axis, (3 axis,
30 minutes total).
Random vibration (nonoperating):
2.28 g rms, from 5 to 500 Hz, 10 minutes each axis, (3 axis,
30 minutes total) non-operating.
Atmospherics
Temperature:
Operating:
10 °C to +40 °C
0 °C to +35 °C for 80E0X modules on Tektronix part number
012-1569-00 2-meter extender
Nonoperating:
- 2 2 °C to +60 °C
Relative humidity:
Operating: 20% to 80%, with a maximum wet bulb temperature
of 29 °C at or below +40 °C (upper limits derates to 45% relative
humidity at +40 °C, non-condensing)
Nonoperating (no floppy disk in floppy drive): 5% to 90%, with a
maximum wet bulb temperature of 29 °C at or below +60 °C (upper
limits derates to 20% relative humidity at +60 °C, non-condensing)
Altitude:
Operating: 3,048 m (10,000 ft.)
Nonoperating: 12,190 m (40,000 ft.)
Electrostatic dis-
charge susceptibility
Up to 8 kV with no change to control settings, or impairment of normal
operation
Up to 15 kV with no damage that prevents recovery of normal operation
A-6
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Appendix A: Specifications
Table A-5: Power consumption and cooling
Specifications
Characteristics
Power requirements
240 watts (fully loaded); 160 watts (mainframe alone with no modules)
An example of a “fully loaded” mainframe for these characteristic loads
has installed optical modules, electrical modules, and active probes
comprised of 1x80C02-CR, 1x80C04-CR2, 3x80E04, 1x80A01, and
7xP6209.
There is typically a slight 10 W deviation in the dissipation for various
line conditions ranging from 48 Hz through 400 Hz as well as operating
ambient temperature.
Source voltage and
frequency
Range for the line voltage needed to power the instrument within which
the instrument meets its performance requirements.
100-240 V RMS 10%, 50/60 Hz
115 V RMS 10%, 400 Hz
CAT II
Fuse rating
Current and voltage ratings and type of the fuse used to fuse the
source line voltage.
Two sizes can be used:
(0.25 x 1.25 inch size): UL 198G & CSA C22.2, No. 59 Fast acting: 8
Amp, 250 V; Tek p/n 159-0046-00, BUSSMAN p/n ABC-8, LITTLE-
FUSE p/n 314008
(5 x 20 mm size): IEC 127, sheet 1, fast acting “F”, high breaking
capacity, 6.3 Amp, 250 V; Tek p/n none, BUSSMAN p/n GDA 6.3,
LITTLEFUSE p/n 21606.3
Cooling requirements Six fans with speed regulated by internal temperature sensors.
A 2 inch (51 mm) clearance must be maintained on the left side, and
right sides of the instrument, and a 0.75” (19 mm) clearance must be
maintained on the bottom of the instrument for forced air flow. It should
never be operated on a bench with the feet removed, nor have any
object placed nearby where it may be drawn against the air vents.
No clearance is required on the front, back, and top.
Table A-6: Display
Specifications
Characteristics
Display type
211.2 mm (wide) x 1.58.4 mm (high), 264 mm (10.4 inch) diagonal,
liquid crystal active matrix color display (LCD).
Display resolution
Pixel pitch
640 horizontal by 480 vertical pixels.
Pixels are 0.33 mm (horizontal) and 0.33 mm (vertical)
A-7
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Appendix A: Specifications
Table A-7: Ports
Specifications
Characteristics
Video outputs
Two 15-pin D-subminiature connectors on the rear
panel. Useable to connect external monitors that
provide a duplicate of the primary display and/or a
second monitor on which to view other applications.
Support at least the basic requirements of the PC99 specification.
Parallel port
(IEEE 1284)
25-pin D-subminature connector on the rear panel. Supports the
following modes:
Standard mode, output only
Bi-directional, PS/2 compatible
Bi-directional Enhanced Parallel Port (IEEE 1284 standard, Mode 1
or Mode 2, v1.7
Bi-directional high speed Extended Capabilities Port (ECP)
Serial port
9-pin D-subminature serial-port connector using NS16C550 compatible
UARTs supporting transfer speeds up to 115.2 kbits/sec.
PS/2 Keyboard and
Mouse Interface
PS/2 compatible keyboard and mouse connectors.
LAN interface
RJ-45 LAN connector supporting 10 base-T and 100 base-T
External audio jacks for MIC IN and LINE OUT
External audio con-
nectors
USB interface
One USB connector (the second USB is disabled because of internal
use)
GPIB interface
Complies with IEEE 488.2
Gated Trigger Input - A TTL logic 1 enables triggers to be accepted
Logic Polarity
A TTL logic 0 disables all triggering
(Option GT equipped
instruments only)
A pull-up resistor is present to hold the input high (enable triggers)
when no control signal is present.
Gated Trigger Input -
Maximum Non-de-
struct Input Levels
(Option GT equipped
instruments only)
5V maximum
A-8
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Appendix A: Specifications
Table A-7: Ports (cont.)
Specifications Characteristics
Gated Trigger Input - 3 trigger cycles, where each cycle is defined as (holdoff time + trigger
Enable-to-Acquire
Delay
(Option GT equipped
instruments only)
latency). For example:
With holdoff set to its minimum 5 ꢀs setting, and a 2.500 GHz clock
signal applied to the External Direct Trigger input (a period of 400 ps),
the Enable-to-Acquire delay is approximated as 3 x (5 ꢀs + 0.0004 ꢀs)
= 15.0012 ꢀs.
The Enable-to-Acquire delay is the amount of time after the Gated
Trigger has been enabled (the level goes from TTL LOW to HIGH)
when the first valid sample is retained by the system as the beginning
of the waveform record length. When the Gated Trigger is enabled and
triggers begin to occur, the system will reject the first three samples to
avoid system recovery conditions. Once the first three points have been
discarded, then the next valid trigger cycle will be the first point of the
record section.
Gated Trigger Input - The system checks the status of the gated Trigger approximately once
Maximum Disable per holdoff and re-arm cycle. If the Gated Trigger is disabled
Time immediately after this system check, it will allow nominally a maximum
(Option GT equipped time of (holdoff + trigger period) to elapsed before the checking for the
instruments only)
status of the Gated Trigger input, recognizing the disable condition, and
halting any further sampling of the signal.
Internal clock trigger
out
Square wave out from 50 Ω. back termination synchronized to the
TDR internal clock drive signal. Refer to Trigger System - Internal
Clock.
Typical performance into 50 Ω termination:
-0.20 to +0.20 V low level
+0.90 to +1.10 V high level
n
DC calibration
DC voltage from low impedance drive, programmable to 1 mV over
1.25 V range maximum. Accuracy is 0.2 mV + 0.1% into 50 Ω.
output
DC calibration output,
typical
Typical Accuracy is 0.2 mV + 0.1% into 50 Ω.
External 10 MHz
reference input
5 V maximum
Table A-8: Data storage
Specifications
Characteristics
Floppy disk drive
3.5 in floppy disk, 1.44 Mbyte, compatable with DOS 3.3, or later,
format for storing reference waveforms, image files, and instrument
setups.
Hard disk drive ca-
pacity
≥ 20 Gbytes
A-9
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Appendix A: Specifications
Table A-9: Mechanical
Specifications
Characteristics
Construction material Chassis: Aluminum alloy
Cosmetic covers: PC/ABS thermoplastic
Front panel: Aluminum alloy with PC/thermoplastic overlay
Module doors: Nickel plated stainless steel
Bottom cover: Vinyl clad sheet metal
Circuit boards: Glass-laminate.
Cabinet: Aluminum.
Weight
19.5 kg (43.0 lb.) (no keyboard, no mouse, no top pouch, no power
cord, and no modules or front shield installed
22.0 kg (48.5 lb.) (keyboard, mouse, top pouch, power cord, front shield
installed, and no modules installed)
Overall Dimensions
Height 343 mm (13.5 in.)
Width 457 mm (18.0 in.)
Depth 419 mm (16.5 in.)
The dimensions do not include feet, rack mount kit, or protruding
connectors.
Overall mass, pack-
aged product
36.3 kg (80 lb. 1 oz.)
Overall Dimensions,
packaged product
Height 622 mm (24.5 in.)
Width 711 mm (28.0 in.)
Depth 787 mm (31.0 in.)
A-10
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Appendix A: Specifications
Certifications
Table A-10: Certifications and compliances
Category
Standards or description
EC Declaration of Conformity - Meets intent of Directive 89/336/EEC for Electromagnetic Compatibility when configured with
EMC
sampling head modules designed for use with this instrument as identified in this manual.
Compliance was demonstrated to the following specifications as listed in the Official Journal of the
European Union:
EN 61326
EMC Requirements for Electrical Equipment for Measurement, Control
and Laboratory use.
Class A Radiated and Conducted Emissions
IEC 1000-4-2
IEC 1000-4-3
IEC 1000-4-4
IEC 1000-4-5
IEC 1000-4-6
IEC 1000-4-11
Performance Criterion B1,2
Performance Criterion A1
Performance Criterion B1
Performance Criterion B1
Performance Criterion A1
Performance Criterion B1
1
Performance Criteria C for USB keyboard and mouse. Note that operation of the
USB keyboard and mouse can be restored by unplugging and then
reconnecting the USB connector at the rear panel of the main instrument.
2
Horizontal timing susceptibility of the optical sampling modules and their
internal clock recovery trigger signals usually increase the horizontal timing
jitter when external electromagnetic fields are applied. For fields up to 3 V/m,
the increase in the horizontal high-frequency RMS jitter is typically less than
3 ps RMS of jitter, added using the square-root-of-the-sum-of-the-squares
method. An example follows:
If an 80C01-CR operating in clock-recovery trigger mode exhibits 3.5 ps RMS of
edge jitter, with no EMC field applied and for an ideal jitterless input, then for
applied fields up to 3 V/m the edge jitter, degradation would typically result in a
s
total RMS jitter of:
2
2
Ꭹ
Jitter ≤ 3.5ps + 3ps = 4.61ps
EN 61000-3-2
AC Power Harmonic Current Emissions
Radiated emissions may exceed the levels specified in EN 61326 when this instrument is connected
to a test object.
Australia/New Zealand
Declaration of Conformity -
EMC
Complies with EMC Framework per the following standard:
AS/NZS 2064.1/2
Class A Radiated and Conducted Emissions
General EMC
To ensure compliance with EMC requirements, only high quality shielded cables having a reliable,
continuous outer shield (braid & foil) with full coverage, low impedance connections to shielded
connector housings at both ends should be connected to this product.
EC Declaration of Conformity - Compliance was demonstrated to the following specification as listed in the Official Journal of the
Low Voltage
European Union:
Low Voltage Directive 73/23/EEC, amended by 93/68/EEC
A-11
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Appendix A: Specifications
Table A-10: Certifications and compliances (cont.)
Category
Standards or description
EN 61010-1/A2:1995
Safety requirements for electrical equipment for measurement
control and laboratory use.
U.S. Nationally Recognized
Testing Laboratory Listing,
mainframe
UL3111-1
Standard for electrical measuring and test equipment.
Canadian Certification,
mainframe
CAN/CSA C22.2 No. 1010.1 Safety requirements for electrical equipment for measurement,
control, and laboratory use.
Installation (Overvoltage)
Category Description
Terminals on this product may have different installation (overvoltage) category designations. The
installation categories are:
CAT III Distribution-level mains (usually permanently connected). Equipment at this level is
typically in a fixed industrial location.
CAT II Local-level mains (wall sockets). Equipment at this level includes appliances, portable
tools, and similar products. Equipment is usually cord-connected.
CAT I
Secondary (signal level) or battery operated circuits of electronic equipment.
Pollution Degree Descriptions
A measure of the contaminates that could occur in the environment around and within a product.
Typically the internal environment inside a product is considered to be the same as the external.
Products should be used only in the environment for which they are rated.
Pollution Degree 2
Normally only dry, nonconductive pollution occurs. Occasionally a
temporary conductivity that is caused by condensation must be
expected. This location is a typical office/home environment.
Temporary condensation occurs only when the product is out of
service.
Equipment Type
Safety Class
Test and measuring
Class 1 (as defined in IEC 61010-1, Annex H) - grounded product
Overvoltage Category II (as defined in IEC 61010-1, Annex J)
Overvoltage Category
Pollution Degree
Pollution Degree 2 (as defined in IEC 61010-1). Note: Rated for indoor use only.
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Appendix B: Automatic Measurements Reference
This reference describes the automatic measurement system of this instrument.
Automatic measurements support Pulse, Return-to-Zero (RZ), and Non-Return-
to-Zero (NRZ) signals, providing measurements in three categories, Amplitude,
Timing, and Area.
This reference gathers reference information for automatic measurements.
Specifically, it lists:
H
A definition for each auto-measurement type (for example, risetime, period,
and suppression ratio), organized according to the signal measured (Pulse,
Return-to-Zero eye pattern, or Non-Return-to-Zero eye pattern):
H
H
H
Pulse signals -- see Pulse Measurements on page B--2.
Return-to-Zero eye patterns -- see RZ Measurements on page B--15.
Non-Return-to-Zero eye patterns -- see RZ Measurements on page B--37.
H
H
Descriptions of the reference parameters (levels and crossings) that the
automatic measurement system uses when taking automatic measurements.
See Measurement Reference Parameters and Methods on page B--56.
Descriptions of the methods for tracking the High and Low values that the
automatic measurement system uses when in taking automatic measure-
ments. See High/Low Tracking Method on page 3--77.
To learn about the controls that set up the automatic measurements, see the
Tracking Methods section on page B--66 or Measurement Setup dialog box topic
in the online help system.
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Appendix B: Automatic Measurements Reference
Pulse Measurements - Amplitude
Table B--1 describes on page B--2 describes each pulse measurement in the
amplitude category. See Table B--2 on page B--8 for timing category measure-
ments; see Table B--3 on page B--14 for area category measurements.
Table B-1: Pulse Measurements — Amplitude
Name
Definition
AC RMS
The root-mean-square voltage, minus the DC component, of the waveform that is sampled
within the measurement region.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.
For best results with this measurement, optimize the vertical resolution before taking this
measurement. See To Optimize the Vertical Resolution on page B-69.
Amplitude
The vertical difference between the High and Low of the signal. The method used to determine
the High and the Low values can be controlled independently by the tracking method. See
Tracking Methods on page B-66. Also see High/Low Tracking Method on page 3-77.
Amplitude = High – Low
Where High and Low are measured values.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
For best results with this measurement, optimize the vertical resolution before taking this
measurement. See To Optimize the Vertical Resolution on page B-69.
Average Optical Power
(dBm)
The true average component of an optical signal, expressed in decibels. This measurement
results from the use of a hardware average-power monitor circuit rather than from the
calculation of digitized waveform data.
Note: Average optical power measurements return valid results only on channels that contain
average power monitors. In general, all optical sampling module channels contain average
power monitors.
To determine Average Optical Power (dBm), this measurement simply converts average optical
power (watts) to decibels using a log10 function, referenced to 1 mW. To see how average
optical power in watts is determined, see the Average Optical Power (Watts) measurement on
the following page.
For best measurement results:
H
Use a factory-calibrated wavelength. If using the USER wavelength setting, ensure that it
is properly compensated by performing the User Wavelength Gain compensation found by
clicking the Optical button in the Vertical Setup dialog box.
H
Compensate the optical channel (found in the Utilities->Compensation dialog box). A
portion of this overall optical channel compensation will correct for minor DC variances in
the average power monitor.
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Appendix B: Automatic Measurements Reference
Table B-1: Pulse Measurements — Amplitude (cont.)
Name
Definition
Average Optical Power
(watts)
DC Signal current (DC amps)
Average Optical Power (watts) =
Conversion Gain (ampsፒwatts)
Where:
H
H
DC Signal Current is the O/E-converter photo detector current in DC amps
Conversion Gain is the O/E-converter photo detector gain in amps/watt
Note: Average optical power measurements return valid results only on channels that contain
average power monitors. In general, all optical sampling module channels contain average
power monitors.
To obtain accurate results, the O/E converter is calibrated at a fixed number of factory-calibrated
wavelengths to determine the conversion gain of the O/E converter at each wavelength.
For best average optical power measurement results:
H
Use a factory-calibrated wavelength. If using the USER wavelength setting, ensure that it
is properly compensated by performing the User Wavelength Gain compensation found by
clicking the Optical button in the Vertical Setup dialog box.
H
Compensate the optical channel, which corrects for minor DC variances in the average-
power monitor as part of the compensation routine. To access, choose Compensation in
the Utilities menu of the application.
Cycle Mean
The arithmetic mean of the waveform over the first cycle of the measurement region. The
waveform cycle is determined at the crossings of the mid-reference level. See Measurement
Reference Parameters and Methods on page B-56. Also see Reference Levels Method on
page 3-79.
The mid-reference level is adjustable and defaults to 50% of the pulse amplitude.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.
For best results with this measurement, optimize the vertical resolution before taking this
measurement. See To Optimize the Vertical Resolution on page B-69.
Cycle RMS
The root-mean-square amplitude of the waveform within the first period of the measurement
region.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
For best results with this measurement, optimize the vertical resolution before taking this
measurement. See To Optimize the Vertical Resolution on page B-69.
B-3
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Appendix B: Automatic Measurements Reference
Table B-1: Pulse Measurements — Amplitude (cont.)
Name
Definition
Gain
The amplitude gain between two waveforms. The measurement returns the ratio between the
amplitudes measured within the measurement regions of the two sources.
Amplitude1
Gain =
Amplitude2
Where Amplitude1 and Amplitude2 are the Amplitude measurements of the two source
waveforms. See Amplitude on page B-2.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2) of the two sources. See To Localize a Measurement on
page 3-83.
For best results with this measurement, optimize the vertical resolution before taking this
measurement. See To Optimize the Vertical Resolution on page B-69.
High
The top reference level for a measured waveform. Several methods can be applied to the data
sampled in the upper half of the waveform to determine the High value. You can use the
Tracking Method control to select among them. See Tracking Methods on page B-66. Also see
High/Low Tracking Method on page 3-77.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
For best results with this measurement, optimize the vertical resolution before taking this
measurement. See To Optimize the Vertical Resolution on page B-69.
Low
The bottom reference level for a measured waveform. Several methods can be applied to the
data sampled in the lower half of the waveform to determine the Low value, and you can use
the Tracking Method control to select among them.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
For best results with this measurement, optimize the vertical resolution before taking this
measurement. See To Optimize the Vertical Resolution on page B-69.
Max
The largest amplitude peak of the waveform over the measurement region.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
For best results with this measurement, optimize the vertical resolution before taking this
measurement. See To Optimize the Vertical Resolution on page B-69.
Mean
The arithmetic mean of the waveform over the measurement region.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
For best results with this measurement, optimize the vertical resolution before taking this
measurement. See To Optimize the Vertical Resolution on page B-69.
B-4
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Appendix B: Automatic Measurements Reference
Table B-1: Pulse Measurements — Amplitude (cont.)
Name Definition
Mid
The computation of the middle point between the maximum and minimum amplitude peaks of
the waveform over the measurement region.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.
For best results with this measurement, optimize the vertical resolution before taking this
measurement. See To Optimize the Vertical Resolution on page B-69.
Min
The smallest amplitude value of the waveform over the measurement region.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
For best results with this measurement, optimize the vertical resolution before taking this
measurement. See To Optimize the Vertical Resolution on page B-69.
Optical Modulation
Amplitude
The difference between the average power levels of the logic 1, High, and the logic 0, Low, of
the optical pulse signal. The levels are the Mean values of the logical levels sampled within an
Aperture of the logical 1 and 0 regions of the pulse. The logical 1 and 0 time intervals are
marked by the crossings of a reference level determined by the Average Optical Power (AOP) of
the signal.
Pulse OMA [watts] = P1 − P0
Where:
H
P1 and P0 are the average power levels of the logical 1 and 0, determined within the
respective apertures.
H
The adjustable Aperture defaults to 20% center respectively of the logical 1 and
logical 0 time intervals.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
For best measurement results:·
Perform a vertical compensation. See Perform the Compensation on page1-20.
Perform a Dark Level compensation before taking this measurement. See To Perform
Dark-Level and User Wavelength Gain Compensations on page 3-98.
B-5
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Appendix B: Automatic Measurements Reference
Table B-1: Pulse Measurements — Amplitude (cont.)
Name
Definition
+Overshoot
The ratio of the maximum peak to the signal amplitude over the measurement region,
expressed as a percentage.
(Max − High)
+ Overshoot = 100 ×
(High − Low)
Where:
H
H
Max is the signal maximum
High and Low are the 100% and 0% reference levels
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
For best results with this measurement, optimize the vertical resolution before taking this
measurement.
-Overshoot
The ratio of the minimum waveform value to the signal amplitude over the measurement region,
expressed as a percentage.
(Low − Min)
− Overshoot = 100 ×
(High − Low)
Where:
H
H
Min is the signal minimum
High and Low are the 100% and 0% signal reference levels.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
For best results with this measurement, optimize the vertical resolution before taking this
measurement.
B-6
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Appendix B: Automatic Measurements Reference
Table B-1: Pulse Measurements — Amplitude (cont.)
Name Definition
Peak-to-Peak Noise
The maximum range of the waveform amplitude variance sampled within a fixed width vertical
slice located at the center of the measurement region.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
See Use a Waveform Database on page B-69.
For best results with this measurement. optimize the vertical resolution before taking this
measurement. See To Optimize the Vertical Resolution on page B-69.
Pk-Pk
The absolute difference between the maximum and minimum amplitude values of the waveform
in the measurement region. See example on page B-63.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
For best results with this measurement, optimize the vertical resolution before taking this
measurement. See To Optimize the Vertical Resolution on page B-69.
RMS
The true root-mean-square value of the waveform over the measurement region.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
For best results with this measurement, optimize the vertical resolution before taking this
measurement. See To Optimize the Vertical Resolution on page B-69.
RMS Noise
One standard deviation of the waveform amplitude variance, sampled within a fixed-width
vertical slice located at the center of the measurement region.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
For best results with this measurement, optimize the vertical resolution before taking this
measurement. See To Optimize the Vertical Resolution on page B-69.
Signal-to-Noise Ratio
The ratio of the signal amplitude to the noise level. The noise level is defined as one standard
deviation of the waveform amplitude variance within a fixed width vertical slice located at the
center of the measurement region.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
B-7
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Appendix B: Automatic Measurements Reference
Pulse Measurements - Timing
Table B--2 describes each pulse measurement in the timing category. See Table
on B--1 on page B--2 for amplitude category measurements; see Table B--3 on
page B--14 for area category measurements.
Table B-2: Pulse Measurements - Timing
Name
Definition
Burst width
The time between the first and last crossings, either positive or negative, of the waveform at the
mid-reference level in the measurement region. See Measurement Reference Parameters and
Methods on page B-56 or in the online help. Also see Reference Levels Method on page 3-79.
The mid-reference level is adjustable and defaults to 50% of the pulse amplitude.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.
Cross+
The time of the first positive crossing of the data sampled at the mid-reference level in the
measurement region.
Cross+ = Tcross
Where Tcross is the horizontal coordinate of the first positive crossing. See Pulse Sources
on page B-57.
The mid-reference level is adjustable and defaults to 50% of the pulse amplitude.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). By default, searching is forward from the Start Gate for the first
rising edge, but can be reversed, so that searching is backward from the Stop Gate.
Cross-
The time of the first negative crossing of the data sampled at the mid-reference level in the
measurement region.
Cross - = Tcross
Where Tcross is the horizontal coordinate of the first negative crossing.
The mid-reference level is adjustable and defaults to 50% of the pulse amplitude.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). By default, searching is forward from the Start Gate for the first
falling edge, but can be reversed, so that searching is backward from the Stop Gate.
B-8
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Appendix B: Automatic Measurements Reference
Table B-2: Pulse Measurements - Timing (cont.)
Name Definition
Delay
The time interval between the crossings of the two mid-reference levels on the two sources of
the measurement.
Delay = Tcross(source1) – Tcross(source2)
Where Tcross is the first positive or negative crossing time at mid-reference level. See
Pulse Crossings and Mid-reference Level on page B-58.
The mid-reference levels are adjustable and default to 50% of the pulse amplitude.
The slope can be selected to be the first positive, the first negative, or the first crossing (positive
or negative) in the region.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2) of the two sources. By default, searching is forward from the
Start Gate for each source, but can be reversed, so that searching is backward from the Stop
Gate. Direction can be controlled independently for the two waveform sources. See To Localize
a Measurement on page 3-83.
+Duty Cycle
The ratio (expressed as a percentage) of the first positive pulse width within the measurement
region to the period of the signal. The time intervals are determined at mid-reference level.
If Tcross1 is positive. then:
(Tcross2 − Tcross1)
+ Duty Cycle = 100 ×
(Tcross3 − Tcross1)
If Tcross1 is negative, then:
(Tcross3 − Tcross2)
+ Duty Cycle = 100 ×
(Tcross3 − Tcross1)
Tcross1, Tcross2 and Tcross3 are the times of the first three consecutive crossings at the
mid-reference level.
The mid-reference levels are adjustable and default to 50% of the pulse amplitude.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
See Measurement Reference Parameters and Methods on page B-56 or in the online help.
B-9
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Appendix B: Automatic Measurements Reference
Table B-2: Pulse Measurements - Timing (cont.)
Name
Definition
-Duty Cycle
The ratio (expressed as a percentage) of the first negative pulse width within the measurement
region to the period of the signal. The time intervals are determined at mid-reference level.
If Tcross1 is positive, then:
(Tcross3 − Tcross2)
− Duty Cycle = 100 ×
(Tcross3 − Tcross1)
If Tcross1 is negative, then:
(Tcross2 − Tcross1)
− Duty Cycle = 100 ×
(Tcross3 − Tcross1)
Tcross1, Tcross2 and Tcross3 are the times of the first three consecutive crossings at the
mid-reference level.
The mid-reference levels are adjustable and default to 50% of the pulse amplitude.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.
Fall Time
The time interval between times of the high reference level and the low reference level
crossings on the negative slope of the pulse.
RZ Fall Time = TcrossL – TcrossH
Where:
H
H
TcrossL is the time of the crossing of the low reference level
TcrossH is the time of crossing of the high reference level.
The low reference and high reference levels are adjustable and default to 10% and 90% of the
pulse amplitude. There are four Reference Level Calculation methods available for determining
these reference levels. See Measurement Reference Parameters and Methods on page B-56 or
in the online help and in Also see Reference Levels Method on page 3-79.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). By default, the algorithm searches forward from the Start Gate
for the first falling edge, but the Direction of traversal can be reversed, so that the search will be
backward from the Stop Gate. See To Localize a Measurement on page 3-83.
Frequency
The inverse of the Period of the signal.
1
Frequency =
(Tcross3 − Tcross1)
Where Tcross3 and Tcross1 are the times of the first two consecutive crossings on the
same slope at the mid-reference level. See Pulse Crossings and Mid-reference Level on
page B-58.
The mid-reference level is adjustable and defaults to 50% of the pulse amplitude.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
B-10
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Appendix B: Automatic Measurements Reference
Table B-2: Pulse Measurements - Timing (cont.)
Name Definition
Period
The time interval between two consecutive crossings on the same slope of the signal at the
mid-reference level.
Period = Tcross3 – Tcross1
Where Tcross3 and Tcross1 are the times of the first two consecutive crossings on the
same slope at the mid-reference level.
The mid-reference level is adjustable and defaults to 50% of the pulse amplitude.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.
See Measurement Reference Parameters and Methods on page B-56 or in the online help and
also see Reference Levels Method on page 3-79.
Phase
Tcross1 of source2 − Tcross1 of source1
Tcross3 of source1 − Tcross1 of source1
Phase =
⋅ 360
Where:
H
H
Tcross1 of source1 is the time of the first crossing of either polarity on source 1.
Tcross3 of source1 is the time of the next crossing on source 1of the same polarity as
Tcross1.
H
H
Tcross1 of source2 is the time of the first crossing of either polarity on source 2 after
Tcross1 of source1
All Tcrossings are at the mid-reference levels, which are adjustable and default to 50%
of the pulse amplitude.
If measurement gates are enabled, the measurement region is constrained between the Start
Gate (G1) and Stop Gate (G2) of the sources.
Pk-Pk Jitter
The delta between the minimum and maximum of time crossings of data sampled at the at the
mid-reference level.
Pk-Pk Jitter = Tcrosspp
Where Tcrosspp is the difference between the maximum crossing time and the minimum
crossing time for a histogram of the Tcross values. Tcross is the horizontal coordinate of
the first positive or negative crossing.
The mid-reference level is adjustable and defaults to 50% of the pulse amplitude.
The slope can be selected to be the first positive, the first negative, or the first crossing (positive
or negative) in the region.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). By default, the algorithm searches forward from the Start Gate
for the first specified edge, but the Direction of traversal can be reversed, so that the search will
be backward from the Stop Gate.
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
See Use a Waveform Database on page B-70.
B-11
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Appendix B: Automatic Measurements Reference
Table B-2: Pulse Measurements - Timing (cont.)
Name
Definition
Rise Time
The time interval between the low-reference level and the high reference level crossings on the
positive slope of the pulse.
RZ Rise Time = TcrossH – HcrossL
Where:
H
H
TcrossH is the time of crossing of the high reference level.
TcrossL is the time of crossing of the low reference level.
The low reference and high reference levels are adjustable and default to 10% and 90% of the
pulse amplitude. There are four Reference Level Calculation methods available for determining
these reference levels. See Measurement Reference Parameters and Methods on page B-56 or
in the online help. Also see Reference Levels Method on page 3-79.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). By default the algorithm searches forward from the Start Gate
for the first rising edge, but the Direction of traversal can be reversed, so that the search will be
backward from the Stop Gate. See To Localize a Measurement on page 3-83.
RMS Jitter
The time variance on the time crossings of data sampled at the mid-reference level. RMS Jitter
is defined as one standard deviation (σ) of that variance.
RMS Jitter = Tcrossσ
Where Tcrossσ is one standard deviation of the variance of crossing times for a histogram
of the Tcross values. Tcross is the horizontal coordinate of the first positive or negative
crossing.
The mid-reference level is adjustable and defaults to 50% of the pulse amplitude.
The slope can be selected to be the first positive, the first negative, or the first crossing (positive
or negative) in the region.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). By default, the algorithm searches forward from the Start Gate
for the first falling edge, but the Direction of traversal can be reversed, so that the search will be
backward from the Stop Gate.
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
See Use a Waveform Database on page B-70.
B-12
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Appendix B: Automatic Measurements Reference
Table B-2: Pulse Measurements - Timing (cont.)
Name Definition
+Width
The horizontal interval between the crossings of the rising and falling edges at the mid-refer-
ence level of the first positive pulse in the measurement region.
+Width = Tcross2 – Tcross1
Where Tcross1 and Tcross2 are the two consecutive horizontal crossings on the first
positive pulse.
The mid-reference level is adjustable and defaults to 50% of the pulse amplitude.
See Measurement Reference Parameters and Methods on page B-56 or in the online help. Also
see Reference Levels Method on page 3-79.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.
-Width
The horizontal interval between the crossings of the falling and rising edges at the mid-refer-
ence level of the first negative pulse in the measurement region.
-Width = Tcross2 – Tcross1
Where Tcross2 and Tcross1 are the two consecutive horizontal crossings on the first
negative pulse.
The mid-reference level is adjustable and defaults to 50% of the pulse amplitude.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
B-13
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Appendix B: Automatic Measurements Reference
Pulse Measurement - Area
Table B--3 describes each pulse measurement in the area category. See Table B--1
on page B--2 amplitude-category measurements; see Table B--2 on page B--8
for timing-category measurements.
Table B-3: Pulse Measurements - Area
Name
Definition
Area
The area under the curve for the waveform within the measurement region. Area measured
above ground is positive; area measured below ground is negative.
over the measurement region
ጺ
Area = waveform(t) dt,
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.
For best results, optimize the vertical resolution before taking this measurement. See To
Optimize the Vertical Resolution on page B-69.
Cycle Area
The area under the curve for the first waveform period within the measurement region. Area
measured above ground is positive; area measured below ground is negative.
over the first waveform period within the
measurement region.
Area = ጺwaveform(t) dt,
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
For best results, optimize the vertical resolution before taking this measurement. See To
Optimize the Vertical Resolution on page B-69.
B-14
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Appendix B: Automatic Measurements Reference
Return-to-Zero (RZ) Measurements - Amplitude
Table B--4 describes each RZ measurement in the amplitude category. See Table
on B--5 on page B--29 for timing category measurements; see Table B--6 on page
B--36 for area category measurements.
Table B-4: RZ Measurements - Amplitude
Name
Definition
RZ AC RMS
The root mean square amplitude, minus the DC component, of the waveform that is sampled
within the measurement region.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
See Use a Waveform Database on page B-70.
For best results with this measurement:
H
Perform a Dark Level compensation before taking this measurement if the source of the
measured waveform is an optical channel. See To Perform Dark-Level and User
Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See To Optimize the
Vertical Resolution on page B-69.
RZ Amplitude
The difference between the logical 1 level (High) and the logical 0 level (Low) of the RZ signal.
Both High and Low levels are measured within the Eye Aperture.
RZ Amplitude = High – Low
Where High and Low are the logical 1 and 0 levels.
The Eye Aperture is adjustable and defaults to 5% of the RZ pulse width.
See RZ Eye Aperture Parameters on B-62.
If enabled, measurement gates, constrain the measurement region to the area between the
Start Gate (G1) and Stop Gate (G2).
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
For best results with this measurement:
H
Perform a Dark Level compensation before taking this measurement if the source of the
measured waveform is an optical channel. See To Perform Dark-Level and User
Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See To Optimize the
Vertical Resolution on page B-69.
B-15
CSA8000B & TDS8000B User Manual
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Appendix B: Automatic Measurements Reference
Table B-4: RZ Measurements - Amplitude (cont.)
Name
Definition
RZ Average Optical
Power (dBm)
The true average component of an optical signal, expressed in decibels. This measurement
results from the use of a hardware average power monitor circuit rather than from the
calculation of digitized waveform data.
Note: Average optical power measurements return valid results only on channels that contain
average power monitors. In general, all optical sampling module channels contain average
power monitors.
To determine RZ Average Optical Power (dBm), this measurement simply converts average
optical power (watts) to decibels using a log10 function referenced to 1mW. To determine
average optical power in watts, see the RZ Average Optical Power (Watts) measurement below.
For best average optical power measurement results:
H
Use a factory-calibrated wavelength. If using the USER wavelength setting, ensure that it
is properly compensated by performing the User Wavelength Gain compensation found by
clicking the Optical button in the Vertical Setup dialog box.
H
Compensate the optical channel, which corrects for minor DC variances in the average
power monitor as part of the compensation routine. To access, choose Compensation in
the Utilities menu of the application.
RZ Average Optical
Power (watts)
DC Signal Current (DC amps)
Average Optical Power (watts) =
Conversion Gain (ampsፒwatts)
Where:
H
H
DC Signal Current is the O/E-converter photo detector current in DC amps
Conversion Gain is the O/E-converter photo detector gain in amps/watts
Note: Average optical power measurements return valid results only on channels that contain
average power monitors. In general, all optical sampling module channels contain average
power monitors.
To obtain accurate results, the O/E converter is calibrated at a fixed number of factory-calibrated
wavelengths to determine the conversion gain of the O/E converter at each wavelength.
For best average optical power measurement results:
H
Use a factory-calibrated wavelength. If using the USER wavelength setting, ensure that it
is properly compensated by performing the User Wavelength Gain compensation found by
clicking the Optical button in the Vertical Setup dialog box.
H
Compensate the optical channel, which corrects for minor DC variances in the average
power monitor as part of the compensation routine. To access, choose Compensation in
the Utilities menu of the application.
B-16
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Appendix B: Automatic Measurements Reference
Table B-4: RZ Measurements - Amplitude (cont.)
Name Definition
RZ Extinction Ratio
The ratio of the average power levels of the logic 1 level (High) to the logic 0 level (Low) of an
optical RZ signal. All level determinations are made within the RZ Eye Aperture.
High
RZ ExtRatio =
Low
Where High and Low are the logical 1 and 0 levels. See RZ Eye Aperture Parameters
on B-62.
The Eye Aperture is adjustable and defaults to 5% of the RZ pulse width.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.
For best measurement results:
H
Always perform a Dark Level compensation before taking this measurement. See To
Perform Dark-Level and User Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See To Optimize the
Vertical Resolution on page B-69.
RZ Extinction Ratio (%)
The ratio of the average power levels of the logic 0 level (Low) to the logic 1 level (High) of an
optical RZ signal, expressed as a percentage. All level determinations are made within the RZ
Eye Aperture.
Low
RZ ExtRatio [%] = 100 × Ꮛ Ꮠ
High
Where High and Low are the logical 1 and 0 levels.
The Eye Aperture is adjustable and defaults to 5% of the RZ pulse width.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
For best measurement results:
H
Always perform a Dark Level compensation before taking this measurement. See To
Perform Dark-Level and User Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See To Optimize the
Vertical Resolution on page B-69.
B-17
CSA8000B & TDS8000B User Manual
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Appendix B: Automatic Measurements Reference
Table B-4: RZ Measurements - Amplitude (cont.)
Name
Definition
RZ Extinction Ratio (dB) The ratio of the average power levels of the logic 1 level (High) to the logic 0 level (Low) of an
optical RZ signal, expressed in decibels, dB. All level determinations are made within the RZ
Eye Aperture.
High
RZ ExtRatio [dB] = 10 × logᏋ Ꮠ
Low
Where High and Low are the logical 1 and 0 levels. See RZ Eye Aperture Parameters
on B-62.
The Eye Aperture is adjustable and defaults to 5% of the RZ pulse width.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
See Use a Waveform Database on page B-70.
For best measurement results:
H
Always perform a Dark Level compensation before taking this measurement. See To
Perform Dark-Level and User Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See To Optimize the
Vertical Resolution on page B-69.
RZ Eye Height
RZ Eye Height is a measure of how noise affects the vertical opening between the High and
Low levels of an RZ pulse. The RZ pulse is sampled within the Eye Aperture, where the High
and Low levels are determined as the mean of the histogram of the data distribution in the
upper and lower half of the pulse, respectively. The noise levels are characterized by σhigh and
σlow, the standard deviations from the mean for the High and Low levels.
RZ Eye height = (High – 3 * σhigh) – (Low + 3 * σlow),
Where High and Low are the logical 1 and 0 levels, and σhigh and σlow are the standard
deviations.
The Eye Aperture is adjustable and defaults to 5% of the RZ pulse width.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
For best results with this measurement:
H
Perform a Dark Level compensation before taking this measurement if the source of the
measured waveform is an optical channel. See To Perform Dark-Level and User
Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See To Optimize the
Vertical Resolution on page B-69.
B-18
CSA8000B & TDS8000B User Manual
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Appendix B: Automatic Measurements Reference
Table B-4: RZ Measurements - Amplitude (cont.)
Name Definition
RZ Eye Opening Factor
RZ Eye Opening Factor is a measure of how noise affects the vertical opening between High
and Low levels of an RZ pulse. The RZ pulse is sampled within the Eye Aperture, where the
High and Low levels are determined as the mean of the histogram of the data distribution in the
upper and lower half of the pulse, respectively. The noise levels are characterized by σhigh and
σlow, the standard deviations from the mean for the High and Low levels.
(
)
(
)
High − σhigh − Low + σlow
RZ Eye Opening Factor = Ꮛ
Ꮠ
Where High and Low are the logical 1 and 0 levels, and σhigh and σlow are the standard
(
)
High − Low
deviations. See RZ Eye Aperture Parameters on B-62.
The Eye Aperture is adjustable and defaults to 5% of the RZ pulse width.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
See Use a Waveform Database on page B-70.
For best results with this measurement:
H
Perform a Dark Level compensation before taking this measurement if the source of the
measured waveform is an optical channel. See To Perform Dark-Level and User
Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See To Optimize the
Vertical Resolution on page B-69.
RZ Gain
RZ Gain is a defined as the amplitude gain between two waveforms. The measurement returns
the ratio between the amplitudes measured within the Eye Aperture of each of the waveforms.
Ampl2
RZ Gain =
Ampl1
Where Ampl1 and Ampl2 are the amplitudes of the two source waveforms.
The Eye Aperture is adjustable and defaults to 5% of the RZ pulse width.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
For best results with this measurement:
H
Perform a Dark Level compensation before taking this measurement if the source of the
measured waveform is an optical channel. See To Perform Dark-Level and User
Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See To Optimize the
Vertical Resolution on page B-69.
B-19
CSA8000B & TDS8000B User Manual
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Appendix B: Automatic Measurements Reference
Table B-4: RZ Measurements - Amplitude (cont.)
Name
Definition
RZ High
The logical 1 level of the RZ signal. The data within the Eye Aperture is sampled, a histogram is
built from the upper half of the RZ eye, and the mean of the histogram yields the High level.
The Eye Aperture is adjustable and defaults to 5% of the RZ pulse width. See RZ Eye Aperture
Parameters on B-62.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
See Use a Waveform Database on page B-70.
For best results with this measurement:
H
Perform a Dark Level compensation before taking this measurement if the source of the
measured waveform is an optical channel. See To Perform Dark-Level and User
Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See How to Optimize the
Vertical Resolution on page B-70.
RZ Low
The logical 0 level of the RZ signal. The data within the Eye Aperture is sampled, a histogram is
built from the lower half of the RZ eye, and the mean of the histogram yields the Low level.
The Eye Aperture is adjustable and defaults to 5% of the RZ pulse width.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
For best results with this measurement:
H
Perform a Dark Level compensation before taking this measurement if the source of the
measured waveform is an optical channel. See To Perform Dark-Level and User
Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See To Optimize the
Vertical Resolution on page B-69.
B-20
CSA8000B & TDS8000B User Manual
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Appendix B: Automatic Measurements Reference
Table B-4: RZ Measurements - Amplitude (cont.)
Name Definition
RZ Max
RZ Mean
RZ Mid
The maximum vertical value of the waveform that is sampled within the measurement region.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
When this measurement is turned on, it will automatically set the measurement system to use a
waveform database if available.
For best results with this measurement:
H
Perform a Dark Level compensation before taking this measurement if the source of the
measured waveform is an optical channel. See To Perform Dark-Level and User
Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See To Optimize the
Vertical Resolution on page B-69.
The arithmetic mean of the waveform that is sampled within the measurement region.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.
When this measurement is turned on, it will automatically set the measurement system to use a
waveform database if available. See Use a Waveform Database on page B-70.
For best results with this measurement:
H
Perform a Dark Level compensation before taking this measurement if the source of the
measured waveform is an optical channel. See To Perform Dark-Level and User
Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See How to Optimize the
Vertical Resolution on page B-70.
The middle level between the Max and Min vertical values of the waveform that is sampled
within the measurement region.
(Max + Min)
RZ Mid =
2
Where Max and Min are the maximum and minimum measurements.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
When this measurement is turned on, it will automatically set the measurement system to use a
waveform database if available.
For best results with this measurement:
H
Perform a Dark Level compensation before taking this measurement if the source of the
measured waveform is an optical channel. See To Perform Dark-Level and User
Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See To Optimize the
Vertical Resolution on page B-69.
B-21
CSA8000B & TDS8000B User Manual
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Appendix B: Automatic Measurements Reference
Table B-4: RZ Measurements - Amplitude (cont.)
Name
Definition
RZ Min
The minimum vertical value of the waveform that is sampled within the measurement region.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
When this measurement is turned on, it will automatically set the measurement system to use a
waveform database if available.
For best results with this measurement:
H
Perform a Dark Level compensation before taking this measurement if the source of the
measured waveform is an optical channel. See To Perform Dark-Level and User
Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See To Optimize the
Vertical Resolution on page B-69.
RZ Peak-to-Peak
The difference between the Max and Min vertical values of the waveform that is sampled within
the measurement region.
RZ Peak-to-Peak = Max – Min
Where Max and Min are the maximum and minimum measurements.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.
When this measurement is turned on, it will automatically set the measurement system to use a
waveform database if available. See Use a Waveform Database on page B-70.
For best results with this measurement:
H
Perform a Dark Level compensation before taking this measurement if the source of the
measured waveform is an optical channel. See To Perform Dark-Level and User
Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See How to Optimize the
Vertical Resolution on page B-70.
B-22
CSA8000B & TDS8000B User Manual
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Appendix B: Automatic Measurements Reference
Table B-4: RZ Measurements - Amplitude (cont.)
Name Definition
RZ Peak-to-Peak Noise
The maximum range of the data distribution sampled within a fixed width vertical slice located at
the center of the Eye Aperture at the High or Low levels. See RZ Eye Aperture Parameters
on B-62.
PkPk noise = Highpp or PkPk noise = Lowpp
The Eye Aperture is adjustable and defaults to 5% of the RZ pulse width. The High or Low
selection for Noise At control in the Measurement Setup dialog specifies that the measurement
is to be performed on the logical 1 or 0 levels.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
For best results with this measurement:
H
Perform a Dark Level compensation before taking this measurement if the source of the
measured waveform is an optical channel. See To Perform Dark-Level and User
Wavelength Gain Compensations on page 3-98.
H
Perform Autoset or otherwise optimize the vertical resolution before this measurement, i.e.,
increase the overall vertical size of the waveform (but without producing off-screen
waveform points). See How to Optimize the Vertical Resolution on page B-70.
B-23
CSA8000B & TDS8000B User Manual
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Appendix B: Automatic Measurements Reference
Table B-4: RZ Measurements - Amplitude (cont.)
Name
Definition
RZ Q Factor
A figure of merit of an eye diagram, reporting the ratio between the amplitude of the RZ pulse to
the total RMS noise on the High and Low levels. The RZ pulse is sampled within the Eye
Aperture, where the High and Low levels are determined as the mean of the histogram of the
data distribution in the upper and lower half of the pulse, respectively. The noise levels are
characterized by σhigh and σlow, the standard deviations from the mean for the High and Low
levels.
(High − Low)
RZ Q Factor =
(σhigh + σlow)
Where:
H
H
High and Low are the logical 1 and 0 levels.
σhigh and σlow are the standard deviations.
The Eye Aperture is adjustable and defaults to 5% of the RZ pulse width. See RZ Eye Aperture
Parameters on B-62.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
See Use a Waveform Database on page B-70.
For best results with this measurement:
H
Perform a Dark Level compensation before taking this measurement if the source of the
measured waveform is an optical channel. See To Perform Dark-Level and User
Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See How to Optimize the
Vertical Resolution on page B-70.
RZ RMS
The true root mean square of the waveform that is sampled within the measurement region.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
When this measurement is turned on, it will automatically set the measurement system to use a
waveform database if available.
For best results with this measurement:
H
Perform a Dark Level compensation before taking this measurement if the source of the
measured waveform is an optical channel. See To Perform Dark-Level and User
Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See To Optimize the
Vertical Resolution on page B-69.
B-24
CSA8000B & TDS8000B User Manual
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Appendix B: Automatic Measurements Reference
Table B-4: RZ Measurements - Amplitude (cont.)
Name
Definition
RZ RMS Noise
One standard deviation of the data distribution sampled within a fixed width vertical slice located
at the center of the Eye Aperture at the High (logical 1) or Low (logical 0) levels.
RMS noise = Highσ or RMS noise = Lowσ
The Eye Aperture is adjustable and defaults to 5% of the RZ pulse width. The High or Low
selection for Noise At control in the Measurement Setup dialog instructs the measurement to be
performed on the logical 1 or 0 levels. See RZ Eye Aperture Parameters on B-62.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
See Use a Waveform Database on page B-70.
For best results with this measurement:
H
Perform a Dark Level compensation before taking this measurement if the source of the
measured waveform is an optical channel. See To Perform Dark-Level and User
Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See How to Optimize the
Vertical Resolution on page B-70.
RZ Signal-to-Noise Ratio The ratio of the RZ pulse amplitude to the noise on either the High (logical 1) or Low (logical 0)
level. The data within the Eye Aperture is sampled, and the mean of the histogram yields the
High and Low levels. The noise is defined as one standard deviation of the distribution within a
fixed width vertical slice located at the center of the Eye Aperture.
(High − Low)
Highσ
(High − Low)
Lowσ
SፒN Ratio =
or
SፒN Ratio =
Where High and Low are the logical 1 and 0 levels. See RZ Eye Aperture Parameters
on B-62.
The Eye Aperture is adjustable and defaults to 5% of the RZ pulse width. The High or Low
selection for Noise At control in the Measurement Setup dialog instructs the measurement to be
performed on the logical 1 or 0 levels.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
For best results with this measurement, perform a Dark Level compensation before taking this
measurement if the source of the measured waveform is an optical channel. See To Perform
Dark-Level and User Wavelength Gain Compensations on page 3-98.
B-25
CSA8000B & TDS8000B User Manual
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Appendix B: Automatic Measurements Reference
Table B-4: RZ Measurements - Amplitude (cont.)
Name
Definition
RZ Suppression Ratio
The ratio of the average power level of the logic High to the Suppressed level measured
between two consecutive RZ pulses. The RZ pulse is sampled within the Eye Aperture where
the High is determined as the mean of the histogram of the data distribution in the upper half of
the pulse. The same region is sampled to record the data distribution in the lower half of the
pulse, data corresponding to the logical level 0. Similarly, data is sampled in an equivalent sized
region placed at one-half bit interval offset from the Eye Aperture. The mean of the histogram of
the data distribution between the peaks adjusted by subtracting the zero level histogram yields
the Suppressed level.
High
RZ Suppression Ratio =
(Suppress − Low)
Where:
H
H
High and Low are the logical 1 and 0 levels
Suppress is the mean of the histogram of the data within an Eye Aperture in the
suppressed region
The Eye Aperture is adjustable and defaults to 5% of the RZ pulse width. See RZ Eye Aperture
Parameters on B-62.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). The region used for sampling the suppressed region is equal to
the Eye Aperture and has no independent control. See To Localize a Measurement on
page 3-83.
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
See Use a Waveform Database on page B-70.
For best measurement results:
H
Perform a Dark Level compensation before taking this measurement. See To Perform
Dark-Level and User Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See How to Optimize the
Vertical Resolution on page B-70.
B-26
CSA8000B & TDS8000B User Manual
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Appendix B: Automatic Measurements Reference
Table B-4: RZ Measurements - Amplitude (cont.)
Name Definition
RZ Suppression Ratio
(%)
The inverse ratio of the average power level of the logic High to the Suppressed level measured
between two consecutive RZ pulses, with the result expressed in percentage. The RZ pulse is
sampled within the Eye Aperture where the High is determined as the mean of the histogram of
the data distribution in the upper half of the pulse. The same region is sampled to record the
data distribution in the lower half of the pulse, data corresponding to the logical level 0.
Similarly, data is sampled in an equivalent sized region placed at one-half bit interval offset from
the Eye Aperture. The mean of the histogram of the data distribution between the peaks
adjusted by subtracting the zero level histogram yields the Suppressed level.
(Suppress − Low)
High
RZ Suppression Ratio [%] = 100 × Ꮛ
Where:
Ꮠ
H
H
High and Low are the logical 1 and 0 levels
Suppress is the mean of the histogram of the data within an Eye Aperture in the
suppressed region
The Eye Aperture is adjustable and defaults to 5% of the RZ pulse width. See RZ Eye Aperture
Parameters on B-62.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). The region used for sampling the suppressed region is equal to
the Eye Aperture and has no independent control. See To Localize a Measurement on
page 3-83.
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
See Use a Waveform Database on page B-70.
For best measurement results:
H
Perform a Dark Level compensation before taking this measurement. See To Perform
Dark-Level and User Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See How to Optimize the
Vertical Resolution on page B-70.
B-27
CSA8000B & TDS8000B User Manual
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Appendix B: Automatic Measurements Reference
Table B-4: RZ Measurements - Amplitude (cont.)
Name
Definition
RZ Suppression Ratio
(dB)
The ratio of the average power level of the logic High to the Suppressed level measured
between two consecutive RZ pulses, with the result expressed in decibels. The RZ pulse is
sampled within the Eye Aperture where the High is determined as the mean of the histogram of
the data distribution in the upper half of the pulse. The same region is sampled to record the
data distribution in the lower half of the pulse, data corresponding to the logical level 0.
Similarly, data is sampled in an equivalent sized region placed at one-half bit interval offset from
the Eye Aperture. The mean of the histogram of the data distribution between the peaks
adjusted by subtracting the zero level histogram yields the Suppressed level.
High
RZ Suppression Ratio [dB] = 10 × logᏋ
Where:
Ꮠ
(Suppress − Low)
H
H
High and Low are the logical 1 and 0 levels
Suppress is the mean of the histogram of the data within an Eye Aperture in the
suppressed region
The Eye Aperture is adjustable and defaults to 5% of the RZ pulse width. See RZ Eye Aperture
Parameters on B-62.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). The region used for sampling the suppressed region is equal to
the Eye Aperture and has no independent control. See To Localize a Measurement on
page 3-83.
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
See Use a Waveform Database on page B-70.
For best measurement results:
H
Perform a Dark Level compensation before taking this measurement. See To Perform
Dark-Level and User Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See How to Optimize the
Vertical Resolution on page B-70.
B-28
CSA8000B & TDS8000B User Manual
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Appendix B: Automatic Measurements Reference
Return-to-Zero (RZ) Measurements - Timing
Table B--5 topic describes each RZ measurement in the timing category. See
Table B--4 on page B--15 for amplitude category measurements; see Table B--6
on page B--36 for area category measurements.
Table B-5: RZ Measurements - Timing
Name
Definition
RZ Bit Rate
The inverse of the time interval between two consecutive rising or falling edges (i.e. the
reciprocal of the Bit Time). The crossing times are computed as the mean of the histogram of
the data slice at the mid-reference level. The choice of rising or falling edge is automatic based
on the first slope encountered in the measurement region.
1
RZ Bit Rate =
(Tcross3 − Tcross1)
Where Tcross3 and Tcross1 are the mean of the histogram of the two consecutive
crossings on the same type slope at the mid-reference level. See RZ Crossings on page
B-61.
The mid-reference level is adjustable and defaults to 50% of the RZ maximum pulse amplitude.
See Mid-reference level on page B-69.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
See Use a Waveform Database on page B-70.
RZ Bit Time
The time interval between two consecutive rising or falling edges. The crossing times are
computed as the mean of the histogram of the data slice at the mid-reference level. The choice
of rising or falling edge is automatic based on the first slope encountered in the measurement
region.
RZ Bit Time = Tcross3 – Tcross1
Where Tcross3 and Tcross1 are the mean of the histogram of the two consecutive
crossings on the same type slope at the mid-reference level.
The mid-reference level is adjustable and defaults to 50% of the RZ maximum pulse amplitude.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
B-29
CSA8000B & TDS8000B User Manual
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Appendix B: Automatic Measurements Reference
Table B-5: RZ Measurements - Timing (cont.)
Name
Definition
RZ Cross+
The time of a positive crossing, defined as the mean of the histogram of the data sampled at
the mid-reference level.
Cross+ = Tcross
Where Tcross is the mean of the histogram of a positive crossing. See RZ Crossings on
page B-61.
The mid-reference level is adjustable and defaults to 50% of the RZ maximum pulse amplitude.
See Mid-reference level on page B-69.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). By default the algorithm searches forward from the Start Gate
for the first rising edge, but the Direction of traversal can be reversed, so that the search will be
backward from the Stop Gate. See To Localize a Measurement on page 3-83.
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
See Use a Waveform Database on page B-70.
RZ Cross-
The time of a negative crossing, defined as the mean of the histogram of the data sampled at
the mid-reference level.
Cross - = Tcross
Where Tcross is the mean of the histogram of a negative crossing.
The mid-reference level is adjustable and defaults to 50% of the RZ maximum pulse amplitude.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). By default, the algorithm searches forward from the Start Gate
for the first falling edge, but the Direction of traversal can be reversed, so that the search will be
backward from the Stop Gate.
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
B-30
CSA8000B & TDS8000B User Manual
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Appendix B: Automatic Measurements Reference
Table B-5: RZ Measurements - Timing (cont.)
Name Definition
RZ Delay
The time interval between the crossings of the mid-reference levels on the two sources of the
measurement. The crossing times are computed as the mean of the histogram of the data slice
at the mid-reference level.
RZ Delay = Tcross(source1) – Tcross(source2)
Where Tcross is the mean of the histogram of a positive or negative crossing at
mid-reference level. See RZ Crossings on page B-61.
The mid-reference level is adjustable and defaults to 50% of the RZ maximum pulse amplitude.
See Mid-reference level on page B-69.
The slope can be selected to be the first positive, the first negative, or the first crossing (positive
or negative) in the region.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). By default, for each source, the algorithm searches forward from
the Start Gate for the first rising or falling edge as defined by Slope, but the Direction of
traversal can be reversed, so that the search will be backward from the Stop Gate. See To
Localize a Measurement on page 3-83.
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
See Use a Waveform Database on page B-70.
RZ +Duty Cycle
The ratio of the RZ pulse width to the RZ bit time.
If the first crossing is positive, then:
(Tcross2 − Tcross1)
Duty Cycle =
(Tcross3 − Tcross1)
If the first crossing is negative, then:
(Tcross3 − Tcross2)
Duty Cycle =
(Tcross3 − Tcross1)
Where Tcross1, Tcross2 and Tcross3 are the mean of the histogram of the first three
consecutive crossings at the mid-reference level.
The mid-reference level is adjustable and defaults to 50% of the RZ maximum pulse amplitude.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
B-31
CSA8000B & TDS8000B User Manual
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Appendix B: Automatic Measurements Reference
Table B-5: RZ Measurements - Timing (cont.)
Name
Definition
RZ Eye Width
The 3σ guarded delta between the rising and falling edge crossings.
Eye Width = (Tcross2 – 3 * Tcross2σ) – (Tcross1 + 3 * Tcross1σ)
Where Tcross1 and Tcross2 are the mean of the histogram of the two crossings. See RZ
Crossings on page B-61.
The mid-reference level is adjustable and defaults to 50% of the RZ maximum pulse amplitude.
See Mid-reference level on page B-69.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
See Use a Waveform Database on page B-70.
RZ Fall Time
RZ Fall Time characterizes the negative slope of the RZ pulse by computing the time interval
between the mean crossings of the high reference level and the low reference level.
RZ Fall Time = TcrossL - TcrossH
Where:
H
TcrossLRZFig_RefLevels>Second is the mean of the histogram of the crossing of the
low reference level
H
TcrossH is the mean of the histogram of the crossing of the high reference level. See
RZ Measurement Reference Levels on page B-60.
The adjustable low reference and high reference levels default to 20% and 80% of the RZ
maximum pulse amplitude.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
B-32
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Appendix B: Automatic Measurements Reference
Table B-5: RZ Measurements - Timing (cont.)
Name Definition
Phase =
RZ Phase
Tcross1 of source2 − Tcross1 of source1
Tcross3 of source1 − Tcross1 of source1
⋅ 360
Where:
H
H
H
H
Tcross1 of source1 is mean of the histogram at the time of the first crossing of either
polarity on source 1. See RZ Crossings on page B-61.
Tcross3 of source1 is the mean of the histogram at time of the next crossing on source
1of the same polarity as Tcross1.
Tcross1 of source2 is the mean of the histogram at the time of the first crossing of
either polarity on source 2 after Tcross1 of source1.
All Tcrossings are at the mid-reference levels, which are adjustable and defaults to
50% of the RZ maximum pulse amplitude. See Mid-reference level on page B-69.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
See Use a Waveform Database on page B-70.
RZ Pk-Pk Jitter
The delta between the minimum and maximum of time crossings at the reference level, with the
mean of the histogram being Tcross.
Pk-PK Jitter = Tcrosspp
The mid-reference level is adjustable and defaults to 50% of the RZ maximum pulse amplitude.
The jitter measurement can be performed on the positive or negative slope.
The slope can be selected to be the first positive, the first negative, or the first crossing (positive
or negative) in the region.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). By default, the algorithm searches forward from the Start Gate
for the first specified edge, but the Direction of traversal can be reversed, so that the search will
be backward from the Stop Gate.
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
B-33
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Appendix B: Automatic Measurements Reference
Table B-5: RZ Measurements - Timing (cont.)
Name
Definition
RZ Pulse Symmetry
RZ Pulse Symmetry measures to what extent the RZ pulse is symmetrical around the peak at
the mid-reference level. The pulse peak is the center of the interval, sized to Eye Aperture,
which yields the maximum mean vertical value. See RZ Eye-Aperture Parameters on page
B-62.
(Tcross0 − Tcross1)
(Tcross2 − Tcross1)
RZ Pulse Symmetry [%] = 100 × Ꮛ
Ꮠ
Where:
H
H
Tcross1 and Tcross2RZFig_CrossLevels>Second are the time crossings of the RZ
pulse of the mid-reference level. See RZ Crossings on page B-61.
Tcross0 is the time coordinate of the pulse peak.
The mid-reference level is adjustable and defaults to 50% of the RZ maximum pulse amplitude.
See Mid-reference level on page B-69.
If gating is enabled, the measurement region is constrained between the Start Gate (G1) and
Stop Gate (G2). See To Localize a Measurement on page 3-83.
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
See Use a Waveform Database on page B-70.
RZ Rise Time
RZ Rise Time characterizes the positive slope of the RZ pulse by computing the time interval
between the mean crossings of the low reference level and the high reference level.
RZ Rise Time = TcrossH - HcrossL
Where:
H
H
TcrossH is the mean of the histogram of the crossing of the high reference level
TcrossL is the mean of the histogram of the crossing of the low reference level. See
RZ Measurement Reference Levels on page B-60.
The adjustable low reference and high reference levels default to 20% and 80% of the RZ
maximum pulse amplitude.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
B-34
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Appendix B: Automatic Measurements Reference
Table B-5: RZ Measurements - Timing (cont.)
Name Definition
RZ RMS Jitter
Jitter is the measure of time variance at the location where the signal crosses the mid-reference
level. RMS Jitter is defined as one standard deviation (σ) of that variance. The mean of the
histogram of the crossing data distribution is Tcross.
RMS Jitter = Tcrossσ
The mid-reference level is adjustable and defaults to 50% of the RZ maximum pulse amplitude.
The jitter measurement can be performed on the positive or negative slope. See Mid-reference
level on page B-69.
The slope can be selected to be the first positive, the first negative, or the first crossing (positive
or negative) in the region.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). By default, the algorithm searches forward from the Start Gate
for the first specified edge, but the Direction of traversal can be reversed, so that the search will
be backward from the Stop Gate. See To Localize a Measurement on page 3-83.
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
See Use a Waveform Database on page B-70.
RZ +Width
The time interval between the crossings of the rising and falling edges at the mid-reference
level.
+Width = Tcross2 – Tcross1
Where Tcross1 and Tcross2 are the mean of the histogram of the rising and falling
crossings.
The mid-reference level is adjustable and defaults to 50% of the RZ pulse amplitude.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
B-35
CSA8000B & TDS8000B User Manual
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Appendix B: Automatic Measurements Reference
Return-to-Zero (RZ) Measurements - Area
Table B--6 describes each RZ measurement in the area category. See Table B--4
on page B--15 for amplitude category measurements; see Table on B--5 on page
B--29 for timing category measurements
Table B-6: RZ Measurements -Area
Name
Definition
RZ Area
The area under the curve for the RZ waveform within the measurement region. Area measured
above ground is positive; area measured below ground is negative.
RZ Area = ጺwaveform(t) dt,
If enabled, measurement gates constrain the measurement region to the area between the Start
over the measurement region.
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
See Use a Waveform Database on page B-70.
For best results with this measurement:
H
Perform a Dark Level compensation before taking this measurement if the source of the
measured waveform is an optical channel. See To Perform Dark-Level and User
Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See How to Optimize the
Vertical Resolution on page B-70.
RZ Cycle Area
The area under the curve for the first RZ bit period. Area measured above ground is positive;
area measured below ground is negative.
RZ Area = ጺwaveform(t) dt
Where the measurement region is from Start Gate (G1) to Stop Gate (G2), if measurement
gates are enabled, or the first acquired RZ cycle.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
For best results with this measurement:
H
Perform a Dark Level compensation before taking this measurement if the source of the
measured waveform is an optical channel. See To Perform Dark-Level and User
Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See To Optimize the
Vertical Resolution on page B-69.
B-36
CSA8000B & TDS8000B User Manual
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Appendix B: Automatic Measurements Reference
Non-Return-to-Zero (NRZ) Measurements - Amplitude
Table B--7 topic describes each NRZ measurement in the amplitude category. See
Table B--8 on page B--50 for timing category measurements.; see Table B--9 on
page B--55 for area category measurements.
Table B-7: NRZ Measurements - Amplitude
Name
Definition
NRZ AC RMS
The root mean square amplitude, minus the DC component, of the selected waveform within
the measurement region.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.
When this measurement is turned on, it will automatically set the measurement system to use a
waveform database if available. See Use a Waveform Database on page B-70.
For best results with this measurement:
H
Perform a Dark Level compensation before taking this measurement if the source of the
measured waveform is an optical channel. See To Perform Dark-Level and User
Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See How to Optimize the
Vertical Resolution on page B-70.
NRZ Amplitude
The difference between the logical 1 level (High) and the logical 0 level (Low) of the NRZ signal.
Both High and Low levels are measured within the Eye Aperture.
NRZ Amplitude = High – Low
Where High and Low are the logical 1 and 0 levels.
The Eye Aperture is adjustable and defaults to 20% of the NRZ bit time. See RZ Eye Aperture
Parameters on B-62.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
For best results with this measurement:
H
Perform a Dark Level compensation before taking this measurement if the source of the
measured waveform is an optical channel. See To Perform Dark-Level and User
Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See How to Optimize the
Vertical Resolution on page B-70.
B-37
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Appendix B: Automatic Measurements Reference
Table B-7: NRZ Measurements - Amplitude (cont.)
Name
Definition
NRZ Average Optical
Power (dBm)
The true average component of an optical signal, expressed in decibels. This measurement
results from the use of a hardware average power monitor circuit rather than from the
calculation of digitized waveform data.
Note: Average optical power measurements return valid results only on channels that contain
average power monitors. In general, all optical sampling module channels contain average
power monitors.
To determine NRZ Average Optical Power (dBm), this measurement simply converts average
optical power (watts) to decibels using a log10 function referenced to 1mW. To determine
average optical power in watts, see the NRZ Average Optical Power (Watts) measurement. See
below.
For best average optical power measurement results:
H
Use a factory-calibrated wavelength. If using the USER wavelength setting, ensure that it
is properly compensated by performing the User Wavelength Gain compensation found by
clicking the Optical button in the Vertical Setup dialog box.
H
Compensate the optical channel, which corrects for minor DC variances in the average
power monitor as part of the compensation routine. To access, choose Compensation in
the Utilities menu of the application.
NRZ Average Optical
Power (watts)
DC Signal Current (DC amps)
Average Optical Power (watts) =
Conversion Gain (ampsፒwatts)
where:
H
H
DC Signal Current is the O/E-converter photo detector current in DC amps
Conversion Gain is the O/E-converter photo detector gain in amps/watts
Note: Average optical power measurements return valid results only on channels that contain
average power monitors. In general, all optical sampling module channels contain average
power monitors.
To obtain accurate results, the O/E converter is calibrated at a fixed number of factory-calibrated
wavelengths to determine the conversion gain of the O/E converter at each wavelength.
For best average optical power measurement results:
H
Use a factory-calibrated wavelength. If using the USER wavelength setting, ensure that it
is properly compensated by performing the User Wavelength Gain compensation found by
clicking the Optical button in the Vertical Setup dialog box.
H
Compensate the optical channel, which corrects for minor DC variances in the average
power monitor as part of the compensation routine. To access, choose Compensation in
the Utilities menu of the application.
B-38
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Appendix B: Automatic Measurements Reference
Table B-7: NRZ Measurements - Amplitude (cont.)
Name Definition
NRZ Crossing %
The height of eye crossing as a percentage of eye height measured in the Eye Aperture.
(Eye Cross − Low)
NRZ Crossing % = 100 ×
(High − Low)
Where High and Low are the logical 1 and 0 levels, and EyeCross is the level at eye
crossing. See NRZ Eye-Aperture Parameters on page B-65.
The Eye Aperture is adjustable and defaults to 20% of the NRZ bit time. See RZ Eye Aperture
Parameters on B-62.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
See Use a Waveform Database on page B-70
For best results with this measurement:
H
Perform a Dark Level compensation before taking this measurement if the source of the
measured waveform is an optical channel. See To Perform Dark-Level and User
Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See How to Optimize the
Vertical Resolution on page B-70.
NRZ Crossing Level
The mean signal level at the eye crossing.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
When this measurement is turned on, it will automatically set the measurement system to use a
waveform database if available.
For best results with this measurement:
H
Perform a Dark Level compensation before taking this measurement if the source of the
measured waveform is an optical channel. See To Perform Dark-Level and User
Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See To Optimize the
Vertical Resolution on page B-69.
B-39
CSA8000B & TDS8000B User Manual
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Appendix B: Automatic Measurements Reference
Table B-7: NRZ Measurements - Amplitude (cont.)
Name
Definition
NRZ Extinction Ratio
The ratio of the average power levels of the logic 1 level (High) to the logic 0 level (Low) of an
optical NRZ signal. All level determinations are made within the NRZ Eye Aperture.
Low
High
NRZ ExtRatio = 100 × Ꮛ Ꮠ
Where High and Low are the logical 1 and 0 levels.
The Eye Aperture is adjustable and defaults to 20% of the NRZ bit time. See RZ Eye Aperture
Parameters on B-62.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
See Use a Waveform Database on page B-70.
For best measurement results:
H
Perform a Dark Level compensation before taking this measurement. See To Perform
Dark-Level and User Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See How to Optimize the
Vertical Resolution on page B-70.
NRZ Extinction Ratio (%) The ratio of the average power levels of the logic 0 level (Low) to the logic 1 level (High) of an
optical NRZ signal, expressed as a percentage. All level determinations are made within the
NRZ Eye Aperture.
Low
High
NRZ ExtRatio [%] = 100 × Ꮛ Ꮠ
Where High and Low are the logical 1 and 0 levels.
The Eye Aperture is adjustable and defaults to 20% of the NRZ bit time.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
For best measurement results:
H
Perform a Dark Level compensation before taking this measurement. See To Perform
Dark-Level and Gain User Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See To Optimize the
Vertical Resolution on page B-69.
B-40
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Appendix B: Automatic Measurements Reference
Table B-7: NRZ Measurements - Amplitude (cont.)
Name Definition
NRZ Extinction Ratio
(dB)
The ratio of the average power levels of the logic 1 level (High) to the logic 0 level (Low) of an
optical NRZ signal, expressed in decibels (dB). All level determinations are made within the
NRZ Eye Aperture.
High
NRZ ExtRatio [dB] = 10 × logᏋ Ꮠ
Low
Where High and Low are the logical 1 and 0 levels. See RZ Eye Aperture Parameters
on B-62.
The Eye Aperture is adjustable and defaults to 20% of the NRZ bit time. See NRZ Eye-Aperture
Parameters on page B-65.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.
This measurement requires the use of a waveform database. When this measurement is turned
or, it will automatically set the measurement system to use a waveform database if available.
See Use a Waveform Database on page B-70.
For best measurement results:
H
Perform a Dark Level compensation before taking this measurement. See To Perform
Dark-Level and User Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See How to Optimize the
Vertical Resolution on page B-70.
NRZ Eye Height
A measure of how noise affects the vertical opening between the High and Low levels of an
NRZ eye. The NRZ eye is sampled within the Eye Aperture, where the High and Low levels are
determined as the mean of the histogram of the data distribution in the upper and lower half of
the eye, respectively. The noise levels are characterized by σhigh and σlow, the standard
deviations from the mean for the High and Low levels.
NRZ Eye Height = (High – 3 * σhigh) – (Low + 3 * σlow)
Where High and Low are the logical 1 and 0 levels, and σhigh and σlow are the standard
deviations.
The Eye Aperture is adjustable and defaults to 20% of the NRZ bit time. See RZ Eye Aperture
Parameters on B-62.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
For best results with this measurement:
H
Perform a Dark Level compensation before taking this measurement if the source of the
measured waveform is an optical channel. See To Perform Dark-Level and User
Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See To Optimize the
Vertical Resolution on page B-69.
B-41
CSA8000B & TDS8000B User Manual
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Appendix B: Automatic Measurements Reference
Table B-7: NRZ Measurements - Amplitude (cont.)
Name
Definition
NRZ Gain
The amplitude gain between two waveforms. The measurement returns the ratio between the
amplitudes measured within the Eye Aperture of each of the waveforms.
Ampl2
NRZ Gain =
Ampl1
Where Ampl1 and Ampl2 are the amplitudes of the two source waveforms. See NRZ
Amplitude on page B-37.
The Eye Aperture is adjustable and defaults to 20% of the NRZ bit time. See RZ Eye Aperture
Parameters on B-62.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.
When this measurement is turned on, it will automatically set the measurement system to use a
waveform database if available. See Use a Waveform Database on page B-70.
For best results with this measurement:
H
Perform a Dark Level compensation before taking this measurement if the source of the
measured waveform is an optical channel. See To Perform Dark-Level and User
Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See How to Optimize the
Vertical Resolution on page B-70.
NRZ High
The logical 1 of the NRZ signal. The data within the Eye Aperture is sampled, a histogram is
built from the upper half of the NRZ eye, and the mean of the histogram yields the High level.
The Eye Aperture is adjustable and defaults to 20% of the NRZ bit time.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
When this measurement is turned on, it will automatically set the measurement system to use a
waveform database if available.
For best results with this measurement:
H
Perform a Dark Level compensation before taking this measurement if the source of the
measured waveform is an optical channel. See To Perform Dark-Level and User
Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See To Optimize the
Vertical Resolution on page B-69.
B-42
CSA8000B & TDS8000B User Manual
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Appendix B: Automatic Measurements Reference
Table B-7: NRZ Measurements - Amplitude (cont.)
Name Definition
NRZ Low
The logical 0 of the NRZ signal. The data within the Eye Aperture is sampled, a histogram is
built from the lower half of the NRZ eye, and the mean of the histogram yields the Low level.
The Eye Aperture is adjustable and defaults to 20% of the NRZ bit time. See RZ Eye Aperture
Parameters on B-62.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.
When this measurement is turned on, it will automatically set the measurement system to use a
waveform database if available. See Use a Waveform Database on page B-70.
For best results with this measurement:
H
Perform a Dark Level compensation before taking this measurement if the source of the
measured waveform is an optical channel. See To Perform Dark-Level and User
Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See How to Optimize the
Vertical Resolution on page B-70.
NRZ Max
The maximum vertical value of the waveform that is sampled within the measurement region.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
When this measurement is turned on, it will automatically set the measurement system to use a
waveform database if available.
For best results with this measurement:
H
Perform a Dark Level compensation before taking this measurement if the source of the
measured waveform is an optical channel. See To Perform Dark-Level and User
Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See To Optimize the
Vertical Resolution on page B-69.
NRZ Mean
The arithmetic mean of the selected waveform within the measurement region. See Defining
and displaying waveforms on page 3-56.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
When this measurement is turned on, it will automatically set the measurement system to use a
waveform database if available.
For best results with this measurement:
H
Perform a Dark Level compensation before taking this measurement if the source of the
measured waveform is an optical channel. See To Perform Dark-Level and User
Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See To Optimize the
Vertical Resolution on page B-69.
B-43
CSA8000B & TDS8000B User Manual
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Appendix B: Automatic Measurements Reference
Table B-7: NRZ Measurements - Amplitude (cont.)
Name
Definition
NRZ Mid
The middle level between the Max and Min vertical values of the selected waveform within the
measurement region.
(Max + Min)
NRZ Mid =
2
Where Max and Min are the maximum and minimum measurements.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.
When this measurement is turned on, it will automatically set the measurement system to use a
waveform database if available. See Use a Waveform Database on page B-70.
For best results with this measurement:
H
Perform a Dark Level compensation before taking this measurement if the source of the
measured waveform is an optical channel. See To Perform Dark-Level and User
Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See How to Optimize the
Vertical Resolution on page B-70.
NRZ Min
The minimum vertical value of the selected waveform the measurement region.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
When this measurement is turned on, it will automatically set the measurement system to use a
waveform database if available.
For best results with this measurement:
H
Perform a Dark Level compensation before taking this measurement if the source of the
measured waveform is an optical channel. See To Perform Dark-Level and User
Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See To Optimize the
Vertical Resolution on page B-69.
B-44
CSA8000B & TDS8000B User Manual
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Appendix B: Automatic Measurements Reference
Table B-7: NRZ Measurements - Amplitude (cont.)
Name Definition
NRZ +Overshoot
The ratio of the maximum value of the measured signal to its amplitude, expressed as a
percentage. The waveform is scanned for the maximum value within the measurement region,
while the amplitude is measured in the Eye Aperture.
(Max − High)
NRZ + Overshoot = 100 ×
(High − Low)
Where Max is the signal maximum, and High and Low are the logical 1 and 0 levels. See
NRZ Eye-Aperture Parameters on page B-65.
The Eye Aperture is adjustable and defaults to 20% of the NRZ bit time. See RZ Eye Aperture
Parameters on B-62.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.
When this measurement is turned on, it will automatically set the measurement system to use a
waveform database if available. See Use a Waveform Database on page B-70.
For best results with this measurement:
H
Perform a Dark Level compensation before taking this measurement if the source of the
measured waveform is an optical channel. See To Perform Dark-Level and User
Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See How to Optimize the
Vertical Resolution on page B-70.
NRZ -Overshoot
The ratio of the minimum value of the measured signal to its amplitude, expressed as a
percentage. The waveform is scanned for the minimum value within the measurement region,
while the amplitude is measured in the Eye Aperture.
(Low − Min)
NRZ − Overshoot = 100 ×
(High − Low)
Where Min is the signal minimum, and High and Low are the logical 1 and 0 levels.
The Eye Aperture is adjustable and defaults to 20% of the NRZ bit time.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
When this measurement is turned on, it will automatically set the measurement system to use a
waveform database if available.
For best results with this measurement:
H
Perform a Dark Level compensation before taking this measurement if the source of the
measured waveform is an optical channel. See To Perform Dark-Level and User
Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See To Optimize the
Vertical Resolution on page B-69.
B-45
CSA8000B & TDS8000B User Manual
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Appendix B: Automatic Measurements Reference
Table B-7: NRZ Measurements - Amplitude (cont.)
Name
Definition
NRZ Optical Modulation An approximation defined as the difference of the logical power 1 and 0 determined in a vertical
Amplitude
slice through the eye crossing. The levels are determined as the means of the histograms of the
vertical data slice through the High (logical 1) and Low (logical 0) levels.
NRZ OMA [watts] = P1 − P0
Where:
H
P1 and P0 are the average power levels of the logical 1 and 0, determined at the eye
crossing.
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database. If a
waveform database is not available, no valid measurement results will be produced. See Use a
Waveform Database on page B-70.
NRZ Peak-to-Peak
The difference between the Max and Min vertical values of the selected waveform within the
measurement region. See Defining and displaying waveforms on page 3-56.
NRZ Peak-to-Peak = Max – Min
Where Max and Min are the maximum and minimum measurements.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.
When this measurement is turned on, it will automatically set the measurement system to use a
waveform database if available. See Use a Waveform Database on page B-70.
For best results with this measurement:
H
Perform a Dark Level compensation before taking this measurement if the source of the
measured waveform is an optical channel. See To Perform Dark-Level and User
Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See How to Optimize the
Vertical Resolution on page B-70.
B-46
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Appendix B: Automatic Measurements Reference
Table B-7: NRZ Measurements - Amplitude (cont.)
Name Definition
NRZ Peak-to-Peak Noise The maximum range of the amplitude variance sampled within a fixed width vertical slice
located at the center of the Eye Aperture at the High or Low levels. See RZ Eye Aperture
Parameters on B-62.
PkPk noise = Highpp or PkPk noise = Lowpp
The Eye Aperture is adjustable and defaults to 20% of the NRZ bit time. The High or Low
selection for Noise At control in the Measurement Setup dialog instructs the measurement to be
performed on the logical 1 or 0 levels. See To Localize a Measurement on page 3-83.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
For best results with this measurement:
H
Perform a Dark Level compensation before taking this measurement if the source of the
measured waveform is an optical channel. See To Perform Dark-Level and User
Wavelength Gain Compensations on page 3-98.
H
Perform Autoset or otherwise optimize the vertical resolution before this measurement, i.e.
increase the overall vertical size of the waveform (but without producing off-screen
waveform points). See To Optimize the Vertical Resolution on page B-69.
B-47
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Appendix B: Automatic Measurements Reference
Table B-7: NRZ Measurements - Amplitude (cont.)
Name
Definition
NRZ Q Factor
NRZ Q Factor is a figure of merit of an eye diagram, reporting the ratio between the amplitude
of the NRZ eye to the total RMS noise on the High and Low levels. The NRZ eye is sampled
within the Eye Aperture, where the High and Low levels are determined as the mean of the
histogram of the data distribution in the upper and lower half of the eye, respectively. The noise
levels are characterized by σhigh and σlow, the standard deviations from the mean for the High
and Low levels.
(High − Low)
NRZ Q Factor =
(σhigh + σlow)
Where High and Low are the logical 1 and 0 levels, and σhigh and σlow are the standard
deviations. See RZ Eye Aperture Parameters on B-62.
The Eye Aperture is adjustable and defaults to 20% of the NRZ bit time.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
See Use a Waveform Database on page B-70.
For best results with this measurement:
H
Perform a Dark Level compensation before taking this measurement if the source of the
measured waveform is an optical channel. See To Perform Dark-Level and User
Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See How to Optimize the
Vertical Resolution on page B-70.
NRZ RMS
The true root mean square amplitude of the selected waveform within the measurement region.
See Defining and displaying waveforms on page 3-56.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
When this measurement is turned on, it will automatically set the measurement system to use a
waveform database if available.
For best results with this measurement:
H
Perform a Dark Level compensation before taking this measurement if the source of the
measured waveform is an optical channel. See To Perform Dark-Level and User
Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See To Optimize the
Vertical Resolution on page B-69.
B-48
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Appendix B: Automatic Measurements Reference
Table B-7: NRZ Measurements - Amplitude (cont.)
Name Definition
NRZ RMS Noise
One standard deviation of the amplitude variance sampled within a fixed width vertical slice
located at the center of the Eye Aperture at the High (logical 1) or Low (logical 0) levels.
RMS noise = Highσ or RMS noise = Lowσ
The Eye Aperture is adjustable and defaults to 20% of the NRZ bit time. The High or Low
selection for Noise At control in the Measurement Setup dialog instructs the measurement to be
performed on the logical 1 or 0 levels. See RZ Eye Aperture Parameters on B-62.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
See Use a Waveform Database on page B-70.
For best results with this measurement:
H
Perform a Dark Level compensation before taking this measurement if the source of the
measured waveform is an optical channel. See To Perform Dark-Level and User
Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See How to Optimize the
Vertical Resolution on page B-70.
NRZ Signal-to-Noise
Ratio
NRZ Signal-to-Noise is the ratio of the NRZ eye amplitude to the noise on either the High
(logical 1) or Low (logical 0) level. The data within the Eye Aperture is sampled, and the mean
of the histogram yields the High and Low levels. The noise is defined as one standard deviation
of the distribution within a fixed width vertical slice located at the center of the Eye Aperture.
(High − Low)
Highσ
(High − Low)
Lowσ
SፒN Ratio =
or
SፒN Ratio =
Where High and Low are the logical 1 and 0 levels. See RZ Eye Aperture Parameters
on B-62.
The Eye Aperture is adjustable and defaults to 20% of the NRZ bit time. The High or Low
selection for Noise At control in the Measurement Setup dialog specifies that the measurement
be performed on the logical 1 or 0 levels. See To Localize a Measurement on page 3-83.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
See Use a Waveform Database on page B-70.
For best results with this measurement, perform a Dark Level compensation before taking this
measurement if the source of the measured waveform is an optical channel. See To Perform
Dark-Level and User Wavelength Gain Compensations on page 3-98.
B-49
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Appendix B: Automatic Measurements Reference
Non-Return-to-Zero (NRZ) Measurements - Timing
Table B--8 topic describes each NRZ measurement in the timing category. See
Table B--7 on page B--37 for amplitude category measurements.; see Table B--9
on page B--55 for area category measurements.
Table B-8: NRZ Measurements - Timing
Name
Definition
NRZ Bit Rate
The inverse of the time interval between two consecutive eye-crossing points. In other words, it
is the reciprocal of the Bit Time.
1
NRZ Bit Rate =
(Tcross2 − Tcross1)
Where Tcross2 and Tcross1 are the mean of the histogram of the two consecutive eye
crossings. See NRZ Crossings on page B-64.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
See Use a Waveform Database on page B-70.
NRZ Bit Time
NRZ Bit Time is measured as the time interval between two consecutive eye-crossing points.
NRZ Bit Time = Tcross2 – Tcross1
Where Tcross2 and Tcross1 are the mean of the histogram of the two consecutive eye
crossings.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
NRZ Crossing Time
The horizontal position of the eye crossing. Data is sampled on a horizontal slice at the eye
crossing, and the mean of the horizontal histogram returns the crossing time.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
B-50
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Appendix B: Automatic Measurements Reference
Table B-8: NRZ Measurements - Timing (cont.)
Name Definition
NRZ Delay
The time interval between the crossings of the mid-reference levels on the two sources of the
measurement.
NRZ Delay = Tcross(source1) – Tcross(source2)
Where Tcross is the positive or negative crossing time at mid-reference level.
The mid-reference level is adjustable and defaults to 50% of the NRZ eye amplitude. See NRZ
Crossings on page B-64.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.
By default, for each source, the algorithm searches forward from the Start Gate, but the
Direction of traversal can be reversed, so that the search will be backward from the Stop Gate.
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
NRZ Duty Cycle
Distortion
The ratio of the time interval between the points where the rising and the falling edges cross the
mid-reference level and the NRZ bit time.
(Trise − Tfall)
(Tcross2 − Tcross1)
NRZ Duty Cycle Distortion = fabsᏋ
Ꮠ
Where Tcross1 and Tcross2 are the mean of the histogram of the two consecutive eye
crossings, and Trise and Tfall and the time points where the rising and falling edges cross
the mid-reference level. See NRZ Crossings on page B-64.
The mid-reference level is adjustable and defaults to 50% of the NRZ eye amplitude.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
See Use a Waveform Database on page B-70.
NRZ Eye Width
The 3σ guarded delta between two consecutive eye crossings.
Eye Width = (Tcross2 – 3 * Tcross2σ) – (Tcross1 + 3 * Tcross1σ)
where Tcross1 and Tcross2 are the mean of the histogram of the two crossings.
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
B-51
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Appendix B: Automatic Measurements Reference
Table B-8: NRZ Measurements - Timing (cont.)
Name
Definition
NRZ Fall Time
NRZ Fall Time characterizes the negative slope of the NRZ eye by computing the time interval
between the mean crossings of the high reference level and the low reference level.
RZ Fall Time = TcrossL - TcrossH
Where TcrossL is the mean of the histogram of the crossing of the low reference level, and
TcrossH is the mean of the histogram of the crossing of the high reference level. See NRZ
Measurement Reference Levels on page B-63.
The adjustable low reference and high reference levels default to 10% and 90% of the NRZ eye
amplitude.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
See Use a Waveform Database on page B-70.
NRZ Frequency
NRZ Frequency is defined as half of the inverse of the time interval between two consecutive
eye crossing points (i.e. the reciprocal of the Period). It would be the frequency of a digital
signal of a 0-1-0-1… stream.
1
NRZ Frequency =
(2 × (Tcross2 − Tcross1))
Where Tcross1 and Tcross2 are the mean of the histogram of the two crossings. See NRZ
Crossings on page B-64.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
NRZ Period
NRZ Period is twice the time interval between two consecutive eye-crossing points. It would be
the period of a digital signal of a 0-1-0-1… stream.
NRZ Period = 2 * (Tcross2 – Tcross1)
Where Tcross1 and Tcross2 are the mean of the histogram of the two crossings of the eye
diagram.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
B-52
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Appendix B: Automatic Measurements Reference
Table B-8: NRZ Measurements - Timing (cont.)
Name Definition
Phase =
NRZ Phase
Tcross1 of source2 − Tcross1 of source1
Tcross3 of source1 − Tcross1 of source1
⋅ 360
Where:
H
H
Tcross1 of source1 is the time of the first crossing of either polarity on source 1.
Tcross3 of source1 is the time of next crossing on source 1of the same polarity as
Tcross1.
H
H
Tcross1 of source2 is the time of the first crossing of either polarity on source 2 after
Tcross1 of source1.
All Tcrossings are at the mid-reference level, which is adjustable and defaults to 50%
of the NRZ eye amplitude. See NRZ Crossings on page B-64.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
See Use a Waveform Database on page B-70.
NRZ Pk-Pk Jitter
The delta between the minimum and maximum of time crossings, with the mean of the
histogram being Tcross.
Pk-PK Jitter = Tcrosspp
The Jitter At control in the Measurement Setup dialog specifies whether the jitter is to be
measured at the eye cross or at the mid-reference level. See To Localize a Measurement on
page 3-83.
The mid-reference level is adjustable and defaults to 50% of the eye amplitude.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
B-53
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Appendix B: Automatic Measurements Reference
Table B-8: NRZ Measurements - Timing (cont.)
Name
Definition
NRZ Rise Time
Computes the time interval between the mean crossings of the low reference level and the high
reference level to characterize the positive slope of the eye.
NRZ Rise Time = TcrossH - HcrossL
Where TcrossH is the mean of the histogram of the crossing of the high reference level,
and TcrossL is the mean of the histogram of the crossing of the low reference level.
The adjustable High and Low reference levels default to 10% and 90% of the NRZ eye
amplitude. See NRZ Measurement Reference Levels on page B-63.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
See Use a Waveform Database on page B-70.
NRZ RMS Jitter
Jitter is the measure of time variance on the rising and falling edges at the NRZ eye crossing or
at the mid-reference level. RMS Jitter is defined as one standard deviation (σ) of that variance.
The mean of the histogram of the crossing data distribution is Tcross.
RMS Jitter = Tcrossσ
The Jitter At control in the Measurement Setup dialog specifies if the jitter is to be measured at
the eye cross or at the mid-reference level. The mid-reference level is adjustable and defaults to
50% of the eye amplitude. See To Localize a Measurement on page 3-83.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automatically set the measurement system to use a waveform database if available.
B-54
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Appendix B: Automatic Measurements Reference
Non-Return-to-Zero (NRZ) Measurements - Area
Table B--9 topic describes each NRZ measurement in the area category. See
Table B--7 on page B--37 for amplitude category measurements.; see Table B--8
on page B--50 for timing category measurements.
Table B-9: NRZ Measurements - Area
Name
Definition
NRZ Area
The area under the curve for the NRZ waveform within the measurement region. Area
measured above ground is positive; area measured below ground is negative.
over the measurement region.
NRZ Area = ጺwaveform(t) dt,
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-83.
When this measurement is turned on, it will automatically set the measurement system to use a
waveform database if available. See Use a Waveform Database on page B-70.
For best results with this measurement:
H
Perform a Dark Level compensation before taking this measurement if the source of the
measured waveform is an optical channel. See To Perform Dark-Level and User
Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See To Optimize the
Vertical Resolution on page B-69.
NRZ Cycle Area
The area under the curve for the first NRZ bit time within the measurement region. Area
measured above ground is positive; area measured below ground is negative.
over the first NRZ bit within the measurement region.
NRZ Area = ጺwaveform(t) dt,
When this measurement is turned on, it will automatically set the measurement system to use a
waveform database if available.
For best results with this measurement:
H
Perform a Dark Level compensation before taking this measurement if the source of the
measured waveform is an optical channel. See To Perform Dark-Level and User
Wavelength Gain Compensations on page 3-98.
H
Optimize the vertical resolution before taking this measurement. See To Optimize the
Vertical Resolution on page B-69.
B-55
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Measurement Reference Parameters and Methods
This reference topic describes the reference parameters (levels and crossings)
used in taking the measurements.
All Sources
Reference-Level
Calculation Methods
The methods available for calculating reference levels used in taking automatic
measurement follow. The methods are shown using a pulse, but they also apply
to RZ and NRZ waveforms.
Reference level calculation methods
High (50 mV)
High reference
90%
50%
10 mV
50 mV
90 mV
50 mV
40 mV
0 mV
Mid reference (0 mV)
- 4 0 m V
10%
90 mV
10 mV
Low reference
Low (-50 mV)
1. Relative Reference is calculated as percentage of the High/Low range.
2. High Delta Reference is calculated as the absolute values from the High Level.
3. Low Delta Reference is calculated as absolute values from the Low Level.
4. Absolute Reference is set by absolute values in user units.
5. AOP (not shown) measures the Average Optical Power of the waveform and uses it
as the Mid Ref level. See Pulse Crossings and Mid-reference Level AOP on page
B-58 for more information.
Figure B-1: Reference-level calculation methods
B-56
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Measurement Reference Parameters and Methods
Pulse Sources
The automatic measurement system uses the following levels when measuring
Pulse source waveforms. For the Pulse measurements, and their definitions that
use the levels described here, see page B--2.
Pulse Measurement
Reference Levels
High
TcrossH
High reference
Low reference
TcrossL
Low
Figure B-2: Pulse-reference levels
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Measurement Reference Parameters and Methods
Pulse Crossings and
Mid-reference Level
Mid-reference
Tcross1
Tcross2
Tcross3
Figure B-3: Pulse crossings and mid-reference level
Pulse Crossings and
Mid-reference Level (AOP)
The following measurement parameters are normally used when measuring
Optical Modulation Amplitude on a pulse. Crossings at the measured Average
Optical Power level determine the positions of the eye apertures for the logical 1
and logical 0 of the pulse (size set in the measurement Region control). The
High, Power Logic 1, and Low, Power Logic 0 levels are determined as the mean
values of the logical levels sampled within the eye aperture of the logical 1 and 0
regions of the pulse.
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Measurement Reference Parameters and Methods
Eye aperature
Power logic 1
Average optical power
Tcross3
Tcross1 Tcross2
Power logic 0
Figure B-4: AOP pulse crossings and mid-reference level
Overshoot Levels
Max
High
Low
Figure B-5: Overshoot levels
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Measurement Reference Parameters and Methods
RZ Sources
The automatic measurement system uses the following levels when measuring
RZ source waveforms. For the RZ measurements, and their definitions that use
the levels described here, see page B--15.
RZ Measurement
Reference Levels
The following levels are used when deriving measurements on RZ waveforms.
TcrossH
High reference
TcrossL
Low reference
Figure B-6: RZ measurement reference levels
B-60
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Measurement Reference Parameters and Methods
RZ Crossings
The following measurement parameters are used when deriving RZ measure-
ments.
Mid reference
Tcross1
Tcross3
Tcross2
Figure B-7: RZ crossings
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Measurement Reference Parameters and Methods
RZ Eye-Aperture
Parameters
The following parameters are used when deriving measurements on RZ
waveforms.
Eye aperture
High
Mid
reference
High reference
Low reference
Low
Figure B-8: RZ eye-aperture parameters
NRZ Sources
The automatic measurement system uses the following levels when measuring
NRZ source waveforms. For the NRZ measurements, and their definitions that
use the levels described here, see page B--37.
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Measurement Reference Parameters and Methods
NRZ Measurement
Reference Levels
The following levels are used when deriving measurements on NRZ waveforms.
High
TcrossH
High reference
Low reference
Low
TcrossL
Figure B-9: NRZ measurement reference levels
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Measurement Reference Parameters and Methods
NRZ Crossings
The following measurement parameters are used when deriving NRZ measure-
ments.
Tcross
Cross level
Figure B-10: NRZ crossings
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Measurement Reference Parameters and Methods
NRZ Eye-Aperture
Parameters
The following parameters are used when deriving measurements on NRZ
waveforms.
High
Eye aperture
Low
Figure B-11: NRZ eye-aperture parameters
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Measurement Reference Parameters and Methods
NRZ Overshoot Levels
The following measurement parameters are used when deriving overshoot
measurements on NRZ waveforms.
Max
High
Low
Figure B-12: NRZ overshoot levels
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Measurement Reference Parameters and Methods
NRZ Crossings (OMA)
The following measurement parameters are used when approximating Optical
Modulation Amplitude (OMA) on NRZ waveforms. As shown, OMA on NRZ
waveforms is determined from the means of histograms of the data from level 1
and level 0, taken on a vertical slice through the NRZ eye crossing. This method
gives an approximation of Optical Modulation Amplitude of an NRZ waveform;
Optical Modulations Amplitude measurements are primarily defined for Pulse
signals.
Vertical slice
P1 (histogram at logic high)
P1 (histogram at logic low)
Figure B-13: NRZ Crossings (OMA)
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Measurement Reference Parameters and Methods
Tracking Methods
This topic describes measurements methods tracking the High and Low values
used in taking automatic measurements.
The levels that the automatic measurement system derives as the High (Top) or
Low (Bottom) for a waveform influence the fidelity of amplitude and aberration
measurements. For many of the automatic measurements supported, the
instrument automatically determines these levels and disables all or some of the
High/Low tracking method controls (for example, for RMS). If the measurement
you select has High/Low methods that are appropriate to adjust (or example,
RISE time), the instrument automatically enables the method controls for your
adjustment. The methods available are shown below:
Mean (of Histogram) sets the values statistically. Using a histogram, it selects the mean or
average value derived using all values either above or below the midpoint (depending on
whether it is defining the high or low reference level). This setting is best for examining eye
patterns and optical signals.
Mean Tracking Method
High
Mid
ref
Low
Min-max uses the highest and lowest values of the waveform record. This setting is best for
examining waveforms that have no large, flat portions at a common value, such as sine waves
and triangle waves - almost any waveform except for pulses.
Min/Max Tracking Method
High (Max)
Mid ref
Low (Min)
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Measurement Reference Parameters and Methods
Mode (of Histogram) sets the values statistically. Using a histogram, it selects the most common
value either above or below the midpoint (depending on whether it is defining the high or low
reference level). Since this statistical approach ignores short-term aberrations (overshoot,
ringing, and so on), Mode is the best setting for examining pulses.
Mode Tracking Method
High
Histogram high
Mid
ref
Histogram low
Low
Auto switches between methods. Auto method first attempts to calculate the high and low
values using the Mode method. Then, if the histogram does not show obvious consistent high
and low levels, Auto method automatically switches to the Min/Max or Mean method.
Mean Tracking Method
Min/Max Tracking Method
For example, the Mode histogram operating on a triangle wave would not find consistent high
and low levels, so the instrument would switch to the Min/Max mode. Consistent high and low
levels would be found on a square wave, so the Auto mode would use the Mode method.
Mode Tracking Method
Mid-reference Level
The mid-reference level (adjustable from the Meas Setup dialog box) defaults to
50% of the pulse amplitude. If measurement gates are enabled, the measurement
region is the area between the Start Gate (G1) and Stop Gate (G2). By default,
the algorithm searches forward from the Start Gate for the first rising edge, but
the direction can be reversed from Meas. Setup dialog box, so that the search
will be backward from the Stop Gate. See To Localize a Measurement on
page 3--83.
To Optimize the Vertical Resolution
Optimizing vertical resolution improves the result this measurement produces.
Try these methods:
H
H
Execute Autoset (push AUTOSET on the front-panel).
Adjust vertical scale (or increase input amplitude) to increase the overall
vertical size of the waveform, while keeping the waveform on screen.
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Measurement Reference Parameters and Methods
Use a Waveform Database
This measurement needs to be performed using a statistical (waveform) database.
When one is specified, the instrument acquires or computes the targeted
measurement source, then accumulates it into in the waveform database, and
then takes the measurement on the database data. When you select the RZ or
NRZ signal type, the instrument attempts to automatically allocate one of the
four waveform databases it provides to your measurement source.
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Glossary
Accuracy
The closeness of the indicated value to the true value.
Acquisition
The process of sampling signals from input channels, digitizing the samples
into data points, and assembling the data points into a waveform record. The
waveform record is stored in memory. The trigger marks time zero in that
process.
Active cursor
The cursor that moves when you turn the general purpose knob. It is
represented in the display by a solid line.
Active (or Selected) view
The view in multiple view displays that is currently targeted for adjustment
by the horizontal controls. The front-panel button of the active view is
always lit amber.
Aliasing
A false representation of a signal due to insufficient sampling of high
frequencies or fast transitions. A condition that occurs when a sampling
instrument digitizes at an effective sampling rate that is too slow to
reproduce the input signal. The waveform displayed on screen may have a
lower frequency than the actual input signal.
Annotations
Lines displayed on screen to indicate measurement reference levels and
points that an automatic measurement is using to derive the measurement
value.
Attenuation
The degree the amplitude of a signal is reduced when it passes through an
attenuating device such as a probe or an external attenuator. That is, the ratio
of the input measure to the output measure. For example, a 10X attenuator
will attenuate, or reduce, the input voltage of a signal by a factor of 10.
Automatic measurement
An automatic measurement of a parameter and its numeric readout that the
instrument takes and updates directly from a channel, math, or reference
waveform in real time, without operator intervention.
Automatic trigger mode
A trigger mode that causes the instrument to automatically acquire if
triggerable events are not detected within a specified time period.
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Autoset
A function of the instrument that attempts to automatically produce a stable
waveform of usable size. Autoset sets up the acquisition controls based on the
characteristics of the selected waveform. A successful autoset will produce a
coherent and stable waveform display.
Average acquisition mode
In this mode, the instrument displays and updates a waveform that is the
averaged result of several waveform acquisitions. Averaging reduces the
apparent noise. The instrument acquires data as in sample mode and then
averages it a user-specified number of averages.
Average Optical Power (AOP)
The time averaged measurement of the optical power over a much longer
time period than the bit rate of the signal.
Bandwidth
The highest frequency signal the instrument can acquire with no more than
3 dB (× .707) attenuation of the original (reference) signal.
BER
An acronym for Bit Error Ratio (or Rate). The principal measure of quality
of a digital transmission system. BER is defined as:
BER = Number of Errors/Total Number of Bits
BER is usually expressed as a negative exponent. For example, a BER of
10-7 means that 1 bit out of 107 bits is in error.
BER floor
A limiting of the bit-error-ratio in a digital system as a function of received
power due to the presence of signal degradation mechanisms or noise.
Bit error
An incorrect bit. Also known as a coding violation.
Channel
An input that connects a signal or attaches a network or transmission line to
sampling modules for acquisition of channel waveforms by the instrument.
Channel/Probe deskew
A relative time delay that is settable for a channel. Setting deskew lets you
align signals to compensate for signals that may come in from cables of
differing length.
Channel icon
The indicator on the left side of the display that points to the position around
which the waveform contracts or expands when vertical scale is changed.
This position is ground when offset is set to 0 V; otherwise, it is ground plus
offset.
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Glossary
Channel number
The number assigned to a specific signal input channel of an installed
sampling module. Assignment of channel numbers is described in Maximum
Configuration on page 1--11.
Channel waveforms
Waveforms resulting from signals input into sampling-module channels and
digitized and acquired by the instrument. See Live Waveforms.
Control knob
see Knob
Coupling
The association of two or more circuits or systems in such a way that power
or information can be transferred from one to the other. This instrument
supports direct coupling only at its inputs; the user must provide any
alternate coupling (ac, frequency filtering) externally.
Cursors
Any of three styles of paired markers that you can use to make measurements
between two waveform locations. The instrument displays the values (expressed
in vertical or horizontal units) of the position of each cursor and the distance
between the two cursors.
Delay time
See Horizontal Delay.
Digitizing
The process of converting a continuous analog signal such as a waveform to a
set of discrete numbers representing the amplitude of the signal at specific
points in time. Digitizing is composed of two steps: sampling and quantizing.
Display system
The part of the instrument that displays the three graticules, one each for the
Main, Mag1, and Mag2 time bases, the waveforms, and other display related
elements (waveform labels, cursors, test masks, measurement annotations,
etc.).
Dragging
The act of changing your selection either by clicking (mouse) or touching
(touchscreen) a point on the screen and pulling across the screen while
holding down the key (mouse) or maintaining contact with your finger
(touchscreen).
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Glossary
Error detection
Checking for errors in data transmission. A calculation is made on the data
being sent and the results are sent along with it. The receiving station then
performs the same calculation and compares its results with those sent. Each
data signal conforms to specific rules of construction so that departures from
this construction in the received signals can be detected. Any data detected
as being in error is either deleted from the data delivered to the destination,
with or without an indication that such deletion has taken place, or delivered
to the destination together with an indication that it is in error.
Error rate
The ratio of the number of data units in error to the total number of data
units.
Edge trigger
Triggering occurs when the instrument detects the source passing through a
specified voltage level in a specified direction (the trigger slope). This
instrument supports only edge triggering. All trigger sources must be
external, except when using clock recovery (available as an option with
optical sampling modules) or the internal clock.
Envelope acquisition mode
A mode in which the instrument acquires and displays a waveform that
shows the variation extremes of several acquisitions.
Equivalent-time sampling (ET)
A sampling mode in which the instrument acquires signals over many
repetitions of the event. This instrument uses a type of equivalent-time
sampling called sequential equivalent-time sampling. See Sequential
equivalent-time sampling.
Extinction Ratio
The ratio of two optical power levels of a digital signal generated by an
optical source. P1 is the optical power level generated when the light source
is high, and P2 is the power level generated when the light source is low.
P1
re =
P2
Gated measurements
A feature that lets you limit automated measurements to a specified portion
of the waveform. You define the area of interest using measurement gates.
General-purpose knob
The large front-panel knob on the upper-right corner of the front panel. You
can use it to change the value of the control or element that currently has
focus. It can adjust the cursors.
GPIB (General Purpose Interface Bus)
An interconnection bus and protocol that allows you to connect multiple
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Glossary
instruments in a network under the control of a controller. Also known as
IEEE 488 bus. It transfers data with eight parallel data lines, five control
lines, and three handshake lines.
Graticule
A grid on the display screen that creates the horizontal and vertical axes. You
can use it to visually measure waveform parameters.
Graticule labels
Each graticule displays three labels. The upper and lower left labels indicate
the amplitude level at each of the upper and lower boundaries of the graticule
edges. These levels are based on the vertical scale and offset of the selected
waveform. The lower right label is horizontal scale factor of the selected
waveform expressed in units per division.
High
The value used as the 100% level in amplitude measurements, such as Peak
and +Overshoot. See Levels Used in Taking Amplitude, Timing, and Area
Measurements on page 3--79 for more details.
HighRef
The waveform high reference level, used in such measurements as fall time
and rise time. Typically set to 90%. See Levels Used in Amplitude, Timing,
and Area Measurements on page 3--79 for more details.
Holdoff, trigger
A specified amount of time after a trigger signal that elapses before the
trigger circuit will accept another trigger signal. Trigger holdoff helps ensure
a stable display.
Horizontal Acquisition Window
A common time window or range that is applied to all channels in parallel to
determine the segment of an incoming signal that becomes the waveform
record. Trigger and horizontal controls determine the duration of this
window and its placement in the incoming signal.
Horizontal bar cursors
The two horizontal bars that you position to measure the amplitude
parameters of a waveform. The instrument displays the value of both cursors
with respect to ground and the amplitude value between the bars.
Horizontal delay time
The time between the trigger event and the acquisition of data. The time is
set indirectly by the Horizontal reference setting and the horizontal position
settings. See Horizontal Position and the Horizontal Reference on
page 3--59.
Horizontal reference point
The point about which waveforms are expanded or contracted horizontally
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when horizontal scale adjustments are made. The horizontal reference point
remains anchored as the rest of the waveform grows or shrinks around it.
Icon
See Channel Icon.
Initialize
Setting the instrument to a completely known, default condition by pressing
executing a Default Setup.
Internal clock
A trigger source that is synchronized to the internal clock, with a selectable
repetition rate. It is most often used with TDR to synchronize the generation
of TDR step pulses with subsequent acquisition.
Interpolation
The way the instrument calculates additional values to display when the
acquired record length is less than 500 points. The instrument has three
interpolation options: linear, sin(x)/x, or none.
Linear interpolation calculates record points in a straight-line fit between the
actual values acquired. Sin(x)/x computes record points in a curve fit between
the actual values acquired. It assumes all the interpolated points fall in their
appropriate point in time on that curve. None displays only the acquired data
points.
Knob
A rotary control.
Live Waveforms
Waveforms that can update as the acquisition system acquires data. Channel
waveforms are live waveforms; reference waveforms are not. Math
waveforms are live if they contain live waveforms in their expressions:
C1 + R1 defines a live math waveform; R1 + R2 does not.
Low
The value used as the 0% level in amplitude measurements, such as Peak and
+Overshoot. See Levels Used in Taking Amplitude, Timing, and Area
Measurements on page 3--79 for more details.
LowRef
The waveform low reference level. Used in fall and rise time calculations.
Typically set to 10%. See Levels Used in Taking Amplitude, Timing, and
Area Measurements on page 3--79 for more details.
Math Waveform
A waveform defined by a combination of one or more operands (channel
waveforms, reference waveforms, and automatic measurement scalars). Math
waveforms may also contain math operators and functions.
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Measurement
See Automatic Measurement.
Measurement statistics
The accumulation of a history of individual measurement readouts, showing
the mean and standard deviation of a selected number of samples.
Measurement updating
The process of automatically adjusting the measurement parameters to reflect
changes in the waveform targeted by an automatic measurement.
MidRef
The waveform middle reference level used in such measurements as Period
and Duty Cycle. Typically set to 50%. See Levels Used in Taking Amplitude,
Timing, and Area Measurements on page 3--79 for more details.
Mid2Ref
The middle reference level for a second waveform (or the second middle
reference of the same waveform). Used in two waveform time measure-
ments, such as the Delay and Phase measurements. See Levels Used in
Taking Amplitude, Timing, and Area Measurements on page 3--79 for more
details.
Non--Return to Zero (NRZ)
A waveform type for of a source to be measured.
OMA (Optical Modulation Amplitude)
The difference between the average power levels of the logic 1 level, High,
and the logic 0 level, Low, of the optical pulse signal. The levels are the
Means of the logical levels sampled within an Aperture of the logical 1 and 0
regions of the pulse. The logical 1 and 0 time intervals are marked by the
crossings of a reference level determined as the Average Optical Power
(AOP) of the signal.
Persistence
The amount of time a data point remains displayed. There are three
persistence modes available in the instrument: Variable, Infinite, and Color
Grading.
Pixel
A visible point on the display. The instrument display is 640 pixels wide by
480 pixels high.
Pop-up menu
A menu that displays when you right click an application element, such as a
channel or its icon, a measurement or other readout. Usually provides quick
access to settings related to the object clicked.
Probe
An instrument input device.
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Quantizing
The process of converting an analog input that has been sampled, such as a
voltage, to a digital value.
Return to Zero (RZ)
A waveform type for of a source to be measured (see waveform types).
Real-time sampling
An alternate sampling mode where the instrument samples to completely fill
a waveform record from a single trigger event. This instrument does not use
real time sampling; it samples sequentially. See Sequential equivalent-time
sampling on page Glossary--9.
Record length
The specified number of samples in a waveform.
Reference memory
Memory in an instrument used to store waveforms or settings. You can use
that waveform data later for processing. The instrument saves the data even
when the instrument is turned off or unplugged.
Reference waveforms
Waveforms that are static, not live (see live waveforms). Reference
waveforms are channel or math waveforms that you save to references or to
files in the instrument file system. Once saved, they do not update.
Sample acquisition mode
The instrument creates a record point by saving the first sample during each
acquisition interval. That is the default mode of the acquisition.
Sample interval
The time interval between successive samples in a time base display. The
time interval between successive samples represents equivalent time, not real
time.
Sampling
The process of capturing an analog input, such as a voltage, at a discrete
point in time and holding it constant so that it can be quantized.
Select button
A button that changes which of the two cursors is active.
Selected waveform
The waveform which is affected by vertical position and scale adjustments.
One of the channel selector buttons lights amber to indicate the currently
selected waveform.
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Glossary
Sequential equivalent-time sampling
A type of equivalent-time sampling in which one sample is taken per
acquisition, with each sample skewed incrementally with respect to an
external trigger event. This instrument acquires using sequential equivalent-
time sampling.
Saved waveform
A collection of sampled points that constitute a single waveform that is
saved in any one on reference locations R1 - R8 or to the file system.
Slope
The direction at a point on a waveform. You can calculate the direction by
computing the sign of the ratio of change in the vertical quantity (Y) to the
change in the horizontal quantity. The two values are rising and falling.
Time base
The set of parameters that let you define the time and horizontal axis
attributes of a waveform View. The time base determines when and how long
to acquire record points.
Trigger
An event that marks time zero in the waveform record. It results in acquisi-
tion of the waveform as specified by the time base.
Trigger level
The vertical level the trigger signal must cross to generate a trigger (on edge
trigger mode).
Uptime
The number of hours the instrument has been powered on.
Vertical bar cursors
The two vertical bars you position to measure the time parameter of a
waveform record. The instrument displays the value of both cursors with
respect to the trigger and the time value between the bars.
Vertical Acquisition Window
The range of values the acquisition system can acquire. The maximum
vertical size is set by the operating range of the sampling module installed,
and that of any probe installed on the sampling module. For example, an
80E00 sampling module set to its maximum 100mV/div scale yields a
10-division vertical acquisition window of 1V.
The vertical offset determines where in the operating range of the A/D
converter (sampler) the signal is positioned relative to ground. Changing
vertical position will simply change the space on the screen where the data is
displayed.
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Glossary
View
Any one of the three waveform displays the instrument provides: Main,
Mag1, and Mag2. Each view has its own graticule and time base. The
instrument always displays the Main view; the Mag1 and Mag2 views can be
added and removed from the display using the View buttons on the front
panel.
Virtual keyboard
A pop-up keyboard that lets you click to type characters for the control from
which it is opened, such as in the vertical scale and offset controls found in
the Control bar at the bottom of the display.
Virtual keypad
A pop-up pad that lets you enter specific numeric values for the control from
which it is popped up.
Waveform
The visible representation of an input signal or combination of signals.
Waveforms can be channel, reference, or math waveforms.
Waveform cursors
The cursor mode that presents two cursors you position to measure both the
time and amplitude parameters of a waveform record. The instrument
displays the time of both cursors with respect to the trigger and the time
between the cursors. The instrument also displays the value of both cursors
with respect to the waveform ground and between the cursors.
Waveform database
A collection of sequentially acquired waveforms.
Waveform types
Waveform types of the source to be measured can be Pulse, NRZ, and RZ.
Each waveform type has a measurement category (Amplitude, Timing, or
Area) that can be selected.
WfmDB
See Waveform database.
Windows OS
The underlying operating system on which this instrument runs.
YT format
The conventional display format. It shows the amplitude of a waveform
record (on the vertical axis) as it varies over time (on the horizontal axis).
Glossary-10
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Index
Automatic measurement, Glossary-1
Automatic measurements, 3-74
annotations, 3-74
A
Accessories
list, 1-41
optional, 1-42
standard, 1-41
behavior with databases, 3-76
categories for selection, 3-76
database as source requirement/exclusion, 3-76
databases as sources, 3-75
dual waveform, 3-76
Accuracy, Glossary-1
Acquiring Waveforms, 3-3
Acquisition, Glossary-1
cycle, 3-29
high/low tracking, 3-77
methods for, 3-77
horizontal delay, 3-28
horizontal delay time with, Glossary-5
how to start and stop, 3-26
input channels and digitizers, 3-27
modes for starting and stopping, 3-22
overview, 3-27
preventing aliasing, 3-23
record, 3-28
record length, 3-28
sample interval, 3-28
sampling (see Sampling), 3-27–3-29
set Stop mode & action, 3-25
time base, Glossary-9
trigger point, 3-28
how to localize (gates), 3-83
how to take, 3-80
independent characterization of, 3-75
number available, 3-76
reference level methods, 3-79
sources available, 3-76
statistics on, 3-75
usage limitations, 3-76
what’s measured, 3-74
why use, 3-74
Automatic Measurements Reference, B-1
Automatic measurements reference
All Sources, B-56
calculation method, B-56
Mid-reference Level, B-69
NRZ Measurement Reference Levels, B-63
NRZ Sources, B-62
Pulse measurement reference levels, B-57, B-60,
B-62
Pulse Sources, B-57
triggering, 3-39
Acquisition control
background, 3-27
overview, 3-21
Acquisition controls
keys to using, 3-22
vs. Display controls, 3-58
why use, 3-21
Acquisition mode
RZ Measurement Reference Levels, B-60
RZ Sources, B-60
To Optimize the Vertical Resolution, B-69
Tracking Methods, B-68
Average, Glossary-2
Envelope, Glossary-4
Sample, Glossary-8
Use a Waveform Database, B-70
Automatic trigger mode, Glossary-1
Autoset, 3-5, Glossary-2
How to execute, 3-109
how to execute, 3-11
mask-specific, 3-142
overview, 3-14
Average acquisition mode, Glossary-2
Acquisition modes
description of, 3-22
how to set, 3-24
Acquisition settings, purpose, 3-21
Active cursor, Glossary-1
Address, Tektronix, xiii
Aliasing, 3-23, Glossary-1
AOP, average optical power, Glossary-2
Annotations, Glossary-1
Application toolbar, 3-127
Attenuation, Glossary-1
Attenuators, external, use of, 3-6
Auto, trigger mode, 3-41
B
Back up, procedure, 1-15
Bandwidth, Glossary-2
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Index
Bar
Controls
initialize, Glossary-6
knob, Glossary-6
selected waveform, 3-7
Controls bar, 2-7
Coupling, Glossary-3
CSA8000, description, 1-1
Cursor, measurements, 3-85–3-87
Cursor Measurements, how to set sources for, 3-90
Cursor measurements
Controls, 2-7
Measurements, 2-7
Menu, 2-7
Readouts, 2-7
Status, 2-7
Tool, 2-7
Waveform, 2-7
BER, Glossary-2
BER floor, Glossary-2
Bit error, Glossary-2
Brightness/Contrast adjustment, 1-15
Button, SELECT, Glossary-8
how to take, 3-89
sources, 3-86
what’s measured, 3-85
why use, 3-85
Cursors, 3-85, Glossary-3
constrained by the display, 3-86
default measurement source, 3-86
horizontal bars, Glossary-5
measure horizontally from the trigger point, 3-87
types, 3-86
C
CD, instrument software, 1-3
Certifications, for instrument, A-11
Channel, Glossary-2
icon, Glossary-2
number, Glossary-3
units and readout names, 3-88
use with independent sources, 3-87
vertical bars, Glossary-9
waveform, Glossary-10
waveforms, Glossary-3
Channel icon, Glossary-2
Channel-probe deskew, Glossary-2
Channels
what time cursors measure (illustration), 3-88
in sampling modules, 3-27
maximum configuration, 1-11
shared horizontal window, 3-20
shared parameters, illustrated, 3-20
Cleaning, instrument, how to, 3-175
Cleaning and inspection
exterior, 3-175
flat panel display, 3-176
Cleaning optical connectors, 3-176
Clipping, 3-6
D
Dark-Level compensation, how to perform, 3-98
Data, controlling input and output, 3-113
Data Input and Output, 3-113
Database, waveform, Glossary-10
Databases, Waveform, 3-159
Delay time, Glossary-3
horizontal, Glossary-5
Description
Clock, internal, Glossary-6
Clock recovery, 3-39
trigger source, 3-42
key features, 1-1
product, 1-1
Communication, remote, 3-139
Compensation, 3-92–3-100
how to perform, 3-92
when installing/moving sampling modules, 1-10
Configuration
instrument, 1-9
maximum channels available, 1-11
software installation, 1-15
Connectors
Deskew, Glossary-2
how to, 3-96
Diagnostics
procedure, 1-18
system, 1-16
Digitizing, Glossary-3
process, defined, 3-27–3-29
Display
customizable attributes of, 3-66
defined, 3-54
elements of, 3-54
flexible control, 3-55
graticule, defined, 3-54
DIRECT, 3-42, 3-44
locations and purpose, 1-12
PRESCALE, 3-42, 3-44
Contacting Tektronix, xiii
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horizontal reference, defined, 3-54
horizontal scale readout, defined, 3-54
how to customize, 3-69
how to set style of, 3-68
limit readouts, defined, 3-54
map—Main & Mag views, 2-10
map—Main view, 2-9
mode
Infinite Persistence, 3-67
Normal, 3-67
Variable Persistence, 3-67
multiple views, 3-55
preview field, defined, 3-54
printing, 3-132
keys to using, 3-56
setting high color, 3-137
system, Glossary-3
time base views, defined, 3-54
touchscreen, defined, 3-55
customizing, 3-66
ESD
and sampling modules, 3-6
and trigger source inputs, 3-43
Exporting waveforms, 3-128
Extinction ratio, Glossary-4
F
Fiberchannel, standards supported, 3-142
Firmware, upgrade, 1-4
Flat panel display, cleaning, 3-176
FrameScan Acquisition
keys to using, 3-31
usage limitations, 3-31
FrameScan acquisition
advantages, 3-30
cycle, 3-31
How to catch bit error, 3-36
how works (illustrated), 3-32
overview, 3-30
waveform, 2-7
why use, 3-55
why use, 3-30
Envelope, usage limitations, 3-31
FrameScan Mode, How to acquire in, 3-33
Front panel, map, 2-8
zoom, 3-55
Display controls
purpose, 3-55
vs. Acquisition controls, 3-58
Display menu
Dots, 3-67
Vectors, 3-67
Display screen, overview of, 3-53
Display settings
Horizontal position, 3-59
horizontal reference, 3-59
Displaying waveforms, 3-53
Documentation
Functional tests, procedure, 1-21
G
Gamma control, 1-15
Gated measurements, Glossary-4
Gated Triggering, how to set, 3-50
General purpose knob, Glossary-4
Gigabit Ethernet, 3-142
GPIB, Glossary-4
online, 2-1
online help system, 3-167
Dots, 3-67
Graticule, Glossary-5
labels, Glossary-5
one per view, 3-57
Dots, Display menu, 3-67
Dragging, mouse or touchscreen, Glossary-3
H
Hardware and operating system, procedure, 1-38
High, Glossary-5
High frequency triggering, 3-45
High/Low tracking, 3-77
methods for, 3-77
E
Edge trigger, Glossary-4
Electrical modules, installation, 1-10
Electrical sampling modules, specifications, where to
find, A-1
Envelope acquisition mode, Glossary-4
Environmental requirements, installation, 1-9
Equivalent time sampling, random, Glossary-4
Error detection, Glossary-4
HighRef, measurement level, Glossary-5
Histograms
continuous operation of, 3-154
counting, 3-155
editing features, 3-154
in recalled setups, 3-155
Error rate, Glossary-4
Index-3
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Index
size, 3-155
Inspection and cleaning
exterior, 3-175
flat panel display, 3-176
Installation, 1-9
supported statistics, table of, 3-158
taking, 3-154
to take, 3-156
usage limitations, 3-155
valid sources of, 3-154
why use, 3-154
Holdoff, triggering, 3-45
usable limits, 3-46
Holdoff, trigger, Glossary-5
Bit error, to capture, 3-36
Horizontal
environmental requirements, 1-9
incoming inspection procedure, 1-17
sampling modules, 1-10
compensation requirements, 1-10
software installation, 1-15
Instrument
accessories list, 1-41
acquisition overview, 2-6
cleaning, 3-175
functional model, 2-4
installation, 1-9
key features, 1-1
models, 1-1
optional accessories list, 1-42
options list, 1-41
Bar cursors, Glossary-5
delay time, Glossary-5
discussion of parameters, 3-17
interrelation of parameters, 3-19
position, 3-7
scaling, 3-4
set up procedure, 3-8
time range (acquisition window), Glossary-5
Horizontal Reference, usage limitations, 3-31
Horizontal acquisition window, Glossary-5
control set up, 3-10
package contents, 1-7
product description, 1-1
standard accessories list, 1-41
Interpolation, Glossary-6
description of modes, 3-67
Introduction, to this manual, xi
what determines, 3-17
Horizontal delay, defined, 3-28
Horizontal position, relative to Horizontal Ref, 3-59
Horizontal reference, relative to horizontal position,
3-59
K
Horizontal reference point, Glossary-5
Horizontal scale, why use, 3-4
Horizontal set up, purpose, 3-4
Horizontal settings
Keyboard, virtual, Glossary-10
Keypad, virtual, Glossary-10
Knob, Glossary-6
general purpose, Glossary-4
Trigger MAIN LEVEL, 3-40
with channel waveforms, 3-58
with math waveforms, 3-58
with reference waveforms, 3-58
L
Level, trigger, 3-40
I
Linear interpolation, 3-67, Glossary-6
Linearity, measurement errors, 3-6
Live waveforms, Glossary-6
Low, Glossary-6
Image, ink-saver mode, 3-134
Incoming inspection, 1-17
perform compensation, 1-20
perform diagnostics, 1-18
LowRef, measurement level, Glossary-6
perform hardware and operating system test, 1-38
perform the functional tests, 1-21
test equipment required by, 1-17
Infinite Persistence, display mode, 3-67
Initialize, Glossary-6
Ink-saver mode, 3-134
Input/Output (front panel), map, 2-11
Input/Output (rear panel), map, 2-12
M
Mag1 and Mag2, Views, 3-59
Manuals
part numbers, 1-41
related, xii
Index-4
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Index
Map
acquisition process, 2-6
documentation, 2-2
Measurement level
HighRef, Glossary-5
LowRef, Glossary-6
MidRef, Glossary-7
MidRef2, Glossary-7
Measurement Reference Parameters and Methods,
B-56
Measurements
front panel, 2-8
input/output (front panel), 2-11
input/output (rear panel), 2-12
system, 2-4
user interface, 2-7
waveform display, 2-9
automatic, 3-74
annotations, 3-74
Mask testing, 3-141, 3-145
autoset to a mask, 3-147
clearing statistics counts, 3-151
count statistics, 3-143
databases as sources, 3-75
independent characterization of, 3-75
statistics on, 3-75
creating a user mask (figure), 3-144
definition of counts (statistics), 3-151
editing description, 3-143
flexible features of, 3-141
stopping acquisition based on, 3-147
supported standards, 3-142
to create a mask, 3-152
to edit a mask, 3-149
what’s measured, 3-74
why use, 3-74
cursor, 3-85
sources, 3-86
what’s measured, 3-85
why use, 3-85
cursor types, 3-86
cursors and the display, 3-86
how to localize (gates), 3-83
how to set sources for cursor, 3-90
how to take, 3-80
usage limitations, 3-142
why use, 3-141
Masks
Fiberchannel standards supported, 3-142
Gigabit Ethernet, 3-142
SONET/SDH standards supported, 3-142
Math waveform
how to take cursor, 3-89
tools for taking, 3-73
Measurements (automatic), B-2, B-15, B-68
for Pulse signals (definitions), B-2, B-8, B-14
for RZ signals (definitions), B-15, B-29, B-36
NRZ signals (definitions), B-37, B-50, B-55
Reference, B-1
defining (overview), 3-101
how to define, 3-105
how to use, 3-109
operations on, 3-107
Tracking methods, B-68
Measurements bar, 2-7
Measuring Waveforms, 3-73
Menu, Pop up, Glossary-7
Menu bar, 2-7
Metastability reject triggering, 3-45
MidRef, measurement level, Glossary-7
MidRef2, measurement level, Glossary-7
Mode, trigger, 3-41
display considerations, 3-108
source considerations, 3-108
take automatic measurements on, 3-110
take cursor measurements on, 3-111
Math Waveforms
how to create, 3-103
sources for, 3-103
Math waveforms, Glossary-6
expression syntax for, 3-104
overview, 3-101
Models, instrument, 1-1
Modes, sampling, 3-28–3-30
Modules, sampling, supported, 1-4
Mouse, operations equivalent with touchscreen, 3-60
source dependencies of, 3-104
time base dependencies of, 3-104
usage limitations, 3-102, 3-107
why use, 3-102
N
Measurement
Gated, Glossary-4
Non-Return to Zero, Definition, Glossary-7
Non-Return-to-Zero (NRZ) automatic measurements,
B-37
High, Glossary-5
Low, Glossary-6
Measurement accuracy, optimizing, 3-92–3-100
Index-5
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Index
Amplitude-related, B-37
Area-related, B-55
Timing-related, B-50
P
Package, shipping, contents of, 1-7
Page setup, ink-saver, 3-134
Peripherals, connection of, 1-12
Persistence, waveform database, 3-159
Persistence
Normal
display mode, 3-67
trigger mode, 3-41
NRZ measurements-amplitude, B-37
NRZ measurements-area, B-55
NRZ measurements-timing, B-50
infinite, 3-67
variable, 3-67
Phone number, Tektronix, xiii
Pixel, Glossary-7
PNG file format, 3-136
Pop up menu, Glossary-7
Position
O
Offset, vertical, 3-14
OMA, optical modulation amplitude, Glossary-7
On/Standby button, 1-13, 1-15
Online, documentation, 2-1
Online Help, 2-1, 2-2
accessing, 3-167
how to use, 3-168
types available, 3-167
Online help
considerations for setting, 3-6
horizontal, 3-7
vertical, 3-6
Power, applying & removing, 1-13, 1-15
Preview mode, 3-55
usage limitations, 3-55
Printing
to a file, 3-136
waveforms, 3-132
Probe, used on Trigger Direct input, 3-44
Probe-channel deskew, Glossary-2
Probes, Definition, Glossary-7
Procedure
displaying control descriptions, 3-168
displaying overviews, 3-169
for Windows, 3-174
full-text search, 3-173
keys to using, 3-167
set up procedures, 3-172
using the finder, 3-171
why use, 3-167
back up user files, 1-15
Check the Package Contents, 1-7
diagnostics, 1-18
first-time power on, 1-13
functional tests, 1-21
hardware tests, 1-38
Operating system, reinstall, 1-16
Operation limitations
automatic measurements, 3-76
math waveforms, 3-102, 3-107
Operational limitations
Histograms, 3-155
incoming inspection, 1-17
operating system reinstall, 1-16
operating system tests, 1-38
running QAPlus/Win, 1-39
To Autoset, 3-11
To Clear References, 3-127
To Compensate the Instrument and Modules, 3-92
To Create a New Mask, 3-152
To customize the database display, 3-164
To Customize the Graticule & Waveforms, 3-69
To Define a Math Waveform, 3-105
To Deskew Channels, 3-96
To Display Waveform in a MagView, 3-64
To Display Waveform in the Main View, 3-62
To Edit a Mask, 3-149
Mask testing, 3-142
preview mode, 3-55
save and recall of setups, 3-114
save and recall of waveforms, 3-120
vertical offset, 3-5
waveform databases, 3-159
Optical modules
incoming inspection, 1-25
installation, 1-10
Optical sampling modules, specifications, where to
find, A-1
Optional accessories list, 1-42
Options, list, 1-41
Index-6
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Index
To gated trigger, 3-50
Recalling a setup, 3-113
Recalling a waveform, 3-120
Record
To Localize a Measurement, 3-83
To Mask Test a Waveform, 3-145
To Perform Dark-Level and User Wavelength Gain
Compensations, 3-98
acquisition, shared by all channels, 3-20
length, defined, 3-28
Record length, Glossary-8
Reference levels, methods for setting, 3-79
Reference memory, Glossary-8
Reference waveforms, Glossary-8
how to clear, 3-127
To Recall Your Setup, 3-118
To Recall Your Waveform, 3-124
To Reset the Instrument, 3-13
To Save Your Setup, 3-115
To Save Your Waveform, 3-121
To Set Acquisition Modes, 3-24
To Set Display Styles, 3-68
To Set the Cursor Sources, 3-90
To set up a waveform database, 3-162
To Acquire in FrameScan mode, 3-33
To Catch a Bit Error, 3-36
To Set Up the Signal Input, 3-8
To Start & Stop Acquisition, 3-26
To Take a Histogram, 3-156
To Take Automatic Measurements, 3-80, 3-89
To trigger, 3-48
Related Manuals, xii
Release notes, software, 1-16
Remote communication, 3-139
Reset
How to execute, 3-13
of instrument, 3-13
Return to Zero, Definition, Glossary-8
Return-to-Zero (RZ) automatic measurements, B-36
Amplitude-related, B-15
Area-related, B-36
Timing-related, B-29
RZ measurements-amplitude, B-15
RZ measurements-area, B-36
RZ measurements-timing, B-29
To Use an Exported Waveform, 3-129
To Use Math Waveforms, 3-109
To use online help, 3-168
Procedures, in the online help, 3-172
Product
accessories list, 1-41
S
description, 1-1
functional model, 2-4
Sample acquisition mode, Glossary-8
Sample interval, Glossary-8
defined, 3-28
Sampling, Glossary-8
modes, 3-28–3-30
process, defined, 3-27–3-29
process, illustrated, 3-28–3-29
sequential equivalent-time, Glossary-9
Sampling modules
installation, 1-9
options list, 1-41
software, 1-3
Product support, contact information, xiii
Programmer guide, 2-2
Propagation delay, deskew, 3-96
Pulse automatic measurements, Area-related, B-14
Pulse measurements-amplitude, B-2
Pulse measurements-area, B-14
Pulse measurements-timing, B-8
caution-avoid damage, 3-6
installation, 1-10
installation compartments, 1-11
external attenuators with, 3-6
preventing overvoltage, 3-6
keys to using, 3-5
Q
selection, 3-5
signal connection, 3-5
QAPlus/Win application, 1-38
Quantizing, Glossary-8
specifications, where to find, A-1
static concerns, 1-10
supported, 1-4
R
Save and recall of setups
adding a comment, 3-117
usage limitations, 3-114
Range, vertical input, 3-14
Readout display, 2-7
Readouts, 2-7
Readouts bar, 2-7
Real time sampling, Glossary-8
Index-7
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Save and recall of waveforms
adding a comment, 3-123
usage limitations, 3-120
Save Mode, if Windows starts in, 1-16
Saved waveform, saved, Glossary-9
Saving a setup, 3-113
Saving a waveform, 3-120
Saving and recalling setups
including comments, 3-114
virtual keyboard with, 3-114
why use, 3-113
Saving and recalling waveforms
including comments, 3-120
virtual keyboard with, 3-120
why use, 3-120
Saving images, PNG format, 3-136
Scale, considerations for setting, 3-6
Screen printouts, change display, 3-137
SELECT button, Glossary-8
Selected cursor, Glossary-1
Selected waveform, Glossary-8
defined, 3-7
environmental, A-6
for instrument, A-1
for sampling modules, where to find, A-1
mechanical, A-10
ports, A-8
power consumption, A-7
signal acquisition, A-1
time base, A-2
trigger, A-3
specifications, A-1
Standard, masks supported, 3-142
Standard accessories, 1-41
Statistics, for histograms, 3-158
Status bar, 2-7
System, diagnostics, 1-16
System Rebuild CD, 1-3
T
TDS8000, description, 1-1
Technical support, contact information, xiii
Tektronix
contacting, xiii
toll-free number, xiii
Temperature compensation, 3-92–3-100
Test equipment, for incoming inspection, 1-17
Testing Waveforms, masks, histograms, and waveform
databases, 3-141
Time base, Glossary-9
view, Glossary-10
Tool bar, 2-7
Touch screen, inoperable in Windows Safe mode, 1-16
Touchscreen, operations equivalent with mouse, 3-60
Tracking Methods (automatic measurement), B-68
Trigger, Glossary-9
Service support, contact information, xiii
Setup
recalling, 3-113
saving, 3-113
Setups
how to recall, 3-118
how to save, 3-115
including comments with, 3-114
purpose of saving/recalling, 3-113
virtual keyboard with, 3-114
Shipping package, contents of, 1-7
Signal, connection and scaling overview, 3-4
Signal conditioning, background, 3-13
Sin(x)/x interpolation, 3-67, Glossary-6
Slope, Glossary-9
clock recovery source, 3-42
DIRECT connector, 3-42, 3-44
Edge, Glossary-4
inputs, 3-42
Level, Glossary-9
level, 3-40
modes, 3-41
PRESCALE connector, 3-42, 3-44
probe used to connect, 3-44
slope, 3-40
trigger, 3-40
Software
description, 1-16
diagnostic (QAPlus/Win), 1-38, 1-39
installation, 1-15
release notes, 1-16
System Rebuild CD, 1-3
User Interface application, 1-3
Windows, 1-3
sources, 3-42
SONET/SDH, standards supported, 3-142
Sources, trigger, 3-42
Specifications
vs. untriggered displays (illustrated), 3-41
Trigger inputs, usage limitations, 3-44
Trigger MAIN LEVEL knob, 3-40
Trigger point, defined, 3-28
Trigger source, usage limitations, 3-44
conditions for meeting, A-1
cooling, A-7
data storage, A-9
display, A-7
Index-8
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Index
Triggering, 3-39, 3-104–3-112
based on application, 3-43
edge, 3-40–3-52
Vertical offset
discussion of , 3-14
illustrated, 3-15
high frequency, 3-45
holdoff, 3-45
how to set, 3-48
keys to using, 3-40
metastability reject, 3-45
overview (of process), 3-40
overview of, 3-39
usage limitations, 3-5
Vertical position, illustrated, 3-15
Vertical range, what determines, 3-14
Vertical scale and offset, why use, 3-4
Vertical set up, purpose, 3-4
View
graticule, 3-57
Main & Mag, 2-10
operations on selected, 3-57
that magnify, 3-59
purpose, 3-39
why use, 3-39
time base, Glossary-10
using multiple, 3-57
U
Views, multiple, 3-55
Virtual keyboard, Glossary-10
dialog box, 3-114, 3-120
Virtual keypad, Glossary-10
Update, software, 1-4
Upgrade, firmware, 1-4
URL, Tektronix, xiii
Usable holdoff, 3-46
User Interface
Controls bar, 2-7
map, 2-7
Measurements bar, 2-7
Menu bar, 2-7
Readouts bar, 2-7
readouts display, 2-7
Status bar, 2-7
Tool bar, 2-7
W
Waveform
Acquiring of, 3-3
channel, Glossary-3
cursors, Glossary-10
database, Glossary-10
databases, using, 3-159
defined, Glossary-10
display, 2-7
Waveform bar, 2-7
User Interface application, software, 1-3
User manual
overview of, 3-53
main, 2-2
sampling modules, 2-2
User Wavelength compensation, how to perform, 3-98
displayed fit to screen, 3-58
displaying, 3-53
exporting, 3-128
how to display in a Mag View, 3-64
how to display in Main View, 3-62
how to recall, 3-124
how to save, 3-121
how to use an exported, 3-129
printing, 3-132
purpose of databases, 3-159
recalling, 3-120
saved, Glossary-9
V
Variable Persistence, display mode, 3-67
Vectors, 3-67
Vectors, Display menu, 3-67
Verification, incoming inspection procedure, 1-17
Vertical
Bar cursors, Glossary-9
position, 3-6
range (acquisition window), Glossary-9
scaling, 3-4
set up procedure, 3-8
saving, 3-120
selected, 3-7, Glossary-8
Waveform display
elements of, 3-54
customizing, 3-66
why use, 3-66
Waveform bar, 2-7
signal connection, 3-4
Vertical acquisition window, Glossary-9
control set up, 3-9
overview, 3-14
Vertical deskew, Glossary-2
Index-9
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Index
Waveform databases
behavior with automatic measurements, 3-76
dimensions of, 3-160
BIN7, 3-161
histograms on, 3-154
including comments with, 3-120
live, Glossary-6
mask testing, 3-141
math, Glossary-6
BIN8, 3-161
color, 3-160
display, 3-160
why use, 3-102
measuring, 3-73
display options, 3-160
EMPH7, 3-161
EMPH8, 3-161
emphasize counts, 3-161
intensity, 3-160
invert, 3-160
operations on all views, 3-58
operations on selected, 3-56
purpose of mask testing, 3-141
purpose of saving/recalling, 3-120
purpose of taking histograms of, 3-154
Reference, Glossary-8
persistence, 3-161
testing and statistical tools, 3-141
virtual keyboard with, 3-120
Web site address, Tektronix, xiii
WfmDB, Glossary-10
special features, 3-159
To customize display of, 3-164
to set up, 3-162
four database limit, 3-159
usage limitations, 3-159
vs. vector view (figure), 3-163
why use, 3-159
Window
horizontal acquisition, Glossary-5
vertical acquisition, Glossary-9
Windows, 1-3
with intensity display (figure), 3-165
Waveform Display
Safe mode, 1-16
Windows OS, Glossary-10
defining waveforms for, 3-56
keys to using, 3-56
Y
YT format, Glossary-10
Waveform record, 3-28
definition applied to all channels, 3-20
illustrated, 3-29
Waveforms
control operation vs. selected, 3-57
creating math, 3-101
defining and displaying, 3-56
Z
Zoom, fast access to, 3-55
Index-10
CSA8000B & TDS8000B User Manual
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Download from Www.Somanuals.com. All Manuals Search And Download.
Download from Www.Somanuals.com. All Manuals Search And Download.
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